Patents Examined by Vinh P. Nguyen
  • Patent number: 11578925
    Abstract: A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a probe head of the probe within an interior cavity of the shroud, while permitting a second portion of the probe head to extend out of the shroud. The shroud further includes a fluid outlet passageway configured to permit a heat-transfer fluid to pass from a probe-head end of the interior cavity, through the interior cavity of the shroud, and out of the shroud through an access portion of the shroud. The fluid inlet conduit enters the shroud through the access portion of the shroud, extends through the interior cavity of the shroud, and is configured to introduce the heat-transfer fluid to the probe-head end of the interior cavity.
    Type: Grant
    Filed: November 12, 2020
    Date of Patent: February 14, 2023
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, David Thomas Engquist, Sam J. Strickling
  • Patent number: 11579186
    Abstract: A burn-in board management system includes a production burn-in apparatus and a burn-in board status computer. The production burn-in apparatus is configured to test a plurality of integrated circuit devices mounted in slots of a burn-in board and comprising a first controller configured to generate a first burn-in board status map, wherein the first controller is further configured to suspend the burn-in board when the first burn-in board status map of the burn-in board demonstrates that more than a threshold percentage of the slots of the burn-in board are determined to be malfunctioned. The burn-in board status computer is communicably connected with the first controller of the production burn-in apparatus and configured to receive the first burn-in board status map.
    Type: Grant
    Filed: June 17, 2021
    Date of Patent: February 14, 2023
    Assignee: NANYA TECHNOLOGY CORPORATION
    Inventor: Cheng-Sung Lai
  • Patent number: 11572780
    Abstract: Impedance is used to determine the performance of paraffin inhibitors in oil containing paraffin. The method and system can use a specially designed impedance cell having a cell constant of less than 1 cm?1. Further, the method can include obtaining at least impedance measurements above the wax appearance temperature (WAT) for an oil sample treated with a paraffin inhibitor and an oil sample not treated, and impedance measurements below the WAT for the treated oil sample and the untreated oil sample. Thereafter, the impedance measurements are correlated to determine paraffin inhibitor performance.
    Type: Grant
    Filed: April 27, 2020
    Date of Patent: February 7, 2023
    Assignee: The University of Tulsa
    Inventors: Marc Tappert, Dale Teeters
  • Patent number: 11573207
    Abstract: An object perspective detector including an electric field sensing module, a signal processing module, a battery module, an analog digital conversion module, a human-machine interface analysis module and a radio transmission module. The electric field sensing module is electrically connected to the signal processing module to form a loop. The electric field sensing module which receives electric field intensity changes to generate electric signals, can be an antenna of capacitor medium, convenient for changing the detection space.
    Type: Grant
    Filed: April 8, 2019
    Date of Patent: February 7, 2023
    Inventors: Tzu-How Chu, Pi-Pai Chang
  • Patent number: 11573072
    Abstract: Systems and methods are provided for determining a position of a magnet. The systems and methods utilize a first sensor located at a first sensor position and arranged to measure at least two components of a magnetic field produced by the magnet, a second sensor located at a second sensor position and arranged to measure at least two components of the magnetic field produced by the magnet, and processing circuitry operatively connected to the first and second sensors to receive signals derived from signals outputted by the first and second sensors. A field angle is calculated from a first differential field of a first field dimension and a second differential field of a second field dimension orthogonal to the first field dimension. The first and second differential fields are calculated based on signals outputted by the first and second sensors.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: February 7, 2023
    Assignee: Analog Devices International Unlimited Company
    Inventor: Jochen Schmitt
  • Patent number: 11567119
    Abstract: A stand-alone active thermal interposer device for use in testing a system-in-package device under test (DUT), the active thermal interposer device includes a body layer having a first surface and a second surface, wherein the first surface is operable to be disposed adjacent to a cold plate, and a plurality of heating zones defined across a second surface of the body layer, the plurality of heating zones operable to be controlled by a thermal controller to selectively heat and maintain respective temperatures thereof, the plurality of heating zones operable to heat a plurality of areas of the DUT when the second surface of the body layer is disposed adjacent to an interface surface of the DUT during testing of the DUT.
    Type: Grant
    Filed: November 19, 2021
    Date of Patent: January 31, 2023
    Assignee: Advantest Test Solutions, Inc.
    Inventors: Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Gregory Cruzan, Karthik Ranganathan, Todd Berk, Ian Williams, Mohammad Ghazvini, Thomas Jones
  • Patent number: 11566949
    Abstract: The present invention relates to a method and device for measuring the temperature in power resistors based on the measurement of the high-frequency circuit parameters of said resistor. The present invention excludes the use of thermocouples, dedicated temperature sensors or thermo chambers.
    Type: Grant
    Filed: August 8, 2018
    Date of Patent: January 31, 2023
    Assignee: I.R.C.A. S.P.A. INDUSTRIA RESISTENZE CORAZZATE E AFFINI
    Inventors: Federico Zoppas, Nicola Moret, Antonio De Moliner, Michele Peterle, Michele Midrio, Antonio Affanni
  • Patent number: 11561243
    Abstract: A wafer test device and methods of assembling a wafer test device involve a first laminate structure, and a second laminate structure arranged to interface with a microcircuit of the wafer. The wafer test device includes a compliant layer between the first laminate structure and the second laminate structure. The compliant layer includes an elastomer that exhibits compliance within a limited range of movement.
    Type: Grant
    Filed: September 12, 2019
    Date of Patent: January 24, 2023
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: David Audette, Grant Wagner, Marc Knox, Dennis Conti
  • Patent number: 11555871
    Abstract: A method of detecting a biological sample includes the following steps. A magnetic sensor chip is provided, wherein the magnetic sensor chip includes a substrate and a magnetic sensing layer located on the substrate. Probes are connected to the magnetic sensor chip. A sample solution containing biological samples labeled with a first marker is provided on the magnetic sensor chip, so that the biological samples labeled with the first marker are hybridized with the probes. Magnetic beads labeled with a second marker are provided on the magnetic sensor chip, so that the magnetic beads labeled with the second marker are bound onto the biological samples labeled with the first marker. A signal sensed by the magnetic sensing layer is detected by a magnetic sensor.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: January 17, 2023
    Assignee: Industrial Technology Research Institute
    Inventors: Cheng-Tai Chen, Shih-Ya Chen, Yi-Chen Liu, Ching-Fang Lu, Chia-Chen Chang, Erh-Fang Lee
  • Patent number: 11549968
    Abstract: A probing system includes a chuck configured to support a device under test (DUT); and a manipulator disposed above the chuck and including a first probe protruding from the manipulator toward the chuck, wherein the first probe includes a temperature-sensing device for sensing a temperature adjacent to a front surface of the DUT. A probing device includes a chuck; a DUT disposed over the chuck; a manipulator disposed above the DUT, wherein the manipulator includes a first probe protruding from the manipulator toward the DUT and including a temperature-sensing device for sensing a temperature, the DUT is moved toward the manipulator for sensing a temperature of the DUT by the first probe.
    Type: Grant
    Filed: February 23, 2021
    Date of Patent: January 10, 2023
    Assignee: TECAT TECHNOLOGIES (SUZHOU) LIMITED
    Inventor: Choon Leong Lou
  • Patent number: 11543455
    Abstract: A circuit measuring device and a method thereof are provided. A voltage source supplies a common voltage such that a calibration current having a preset current value flows from a current-voltage converter to a final test machine. The current-voltage converter converts the calibration current into a calibration voltage. At this time, a voltage sensing component senses a voltage between an input terminal and an output terminal of the current-voltage converter to output sensed calibration data. The current-voltage converter converts a tested current outputted by a tested circuit into a tested voltage. At this time, the voltage sensing component senses the voltage between the input terminal and the output terminal of the current-voltage converter to output actual sensed data. When the final test machine determines that a difference between the sensed calibration data and the actual sensed data is larger than a threshold, the tested circuit is adjusted.
    Type: Grant
    Filed: March 18, 2021
    Date of Patent: January 3, 2023
    Assignee: ANPEC ELECTRONICS CORPORATION
    Inventors: Chuang-Shun Xu, Ming-Hung Chang, Wen-Yen Chen
  • Patent number: 11543460
    Abstract: Provided are a battery state measuring method and battery management system, which predict a time point when charging capacity of a battery is to be relatively abruptly reduced. The battery state measuring method includes: monitoring a change of at least one precursor related to the charging capacity of the battery with respect to a number of charging cycles undergone by the battery; and predicting that an abrupt reduction in the charging capacity of the battery is imminent when the change of the at least one precursor follows at least one pre-configured pattern of the battery that has undergone a critical number of charging cycles.
    Type: Grant
    Filed: September 11, 2020
    Date of Patent: January 3, 2023
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Samarth Agarwal, Subramanian Swernath Brahmadathan, Krishnan S Hariharan, Seongho Han, Anshul Kaushik, Rajkumar Subhash Patil
  • Patent number: 11543439
    Abstract: The current detection circuit includes a signal amplification branch, a first voltage branch, a second voltage branch and a first feedback circuit branch. The first feedback branch generates a feedback signal according to the first voltage generated by the first voltage branch, the second voltage and the first reference voltage generated by the second voltage branch. The signal amplification branch generates a first amplified voltage according to the first voltage and the feedback signal, and generates a second amplified voltage according to the second voltage and the feedback signal. The first voltage branch generates a first voltage and a first output voltage according to the first input voltage and the first amplified voltage. The second voltage branch generates a second voltage and a second output voltage according to the second input voltage and the second amplified voltage.
    Type: Grant
    Filed: May 25, 2022
    Date of Patent: January 3, 2023
    Assignee: Halo Microelectronics Co., Ltd.
    Inventor: Kinwai Chew
  • Patent number: 11543229
    Abstract: The present disclosure relates to measuring misalignment between layers of a semiconductor device. In one embodiment, a device includes a first conductive layer; a second conductive layer; one or more first electrodes embedded in the first conductive layer; one or more second electrodes embedded in the second conductive layer; a sensing circuit connected to the one or more first electrodes; and a plurality of time-varying signal sources connected to the one or more second electrodes, wherein the one or more first electrodes and the one or more second electrodes form at least a portion of a bridge structure that exhibits an electrical property that varies as a function of misalignment of the first conductive layer and the second conductive layer in an in-plane direction.
    Type: Grant
    Filed: April 8, 2021
    Date of Patent: January 3, 2023
    Assignee: INVENSENSE, INC.
    Inventors: Ilya Gurin, Leonardo Baldasarre
  • Patent number: 11543304
    Abstract: A temperature measurement system for determining a performance of a smoke generating device includes a temperature measuring device. The temperature measuring device includes an elongated carrier and a number of thermal sensors disposed within the elongated carrier. The elongated carrier is configured to be inserted into an elongated chamber of the smoke generating device. Each of the thermal sensors includes a sensing end exposed on an outer surface of the elongated carrier. When the elongated carrier is inserted into the elongated chamber, the sensing ends respectively detect a temperature of a number of heating members of the smoke generating device.
    Type: Grant
    Filed: June 19, 2019
    Date of Patent: January 3, 2023
    Assignee: Goldtek Technology Co., Ltd.
    Inventors: Kuan-Ting Liao, Chih-Feng Liou, Kuo-Lin Chien, Huang-Lin Chen
  • Patent number: 11531059
    Abstract: A control method is provided and used to place a target object on a test platform in a cabin of a testing device, to sense the temperature of the target object by a temperature response structure, and then to receive temperature signals of the temperature response structure by a controller, where the controller can regulate the pressure inside the cabin to control the air pressure of the cabin, so that the target object can still maintain good heat dissipation under high power consumption.
    Type: Grant
    Filed: February 8, 2021
    Date of Patent: December 20, 2022
    Assignee: SILICONWARE PRECISION INDUSTRIES CO., LTD.
    Inventors: Chao-Ming Tu, Chih-Ming Yang, Wen-Chin Liang, Cheng-Shao Chen, Yung-Ming Wang
  • Patent number: 11531057
    Abstract: The present disclosure relates to a through-silicon via (TSV) crack detecting apparatus, a detecting method, and a fabricating method of the semiconductor device. The TSV crack detecting apparatus includes a test TSV, a conductive liner, a second dielectric liner, a first contact, and a second contact. The test TSV is disposed within a semiconductor substrate, including a conductive channel and a first dielectric liner for isolating the conductive channel and the semiconductor substrate. The conductive liner surrounds the first dielectric liner. The second dielectric liner surrounds the conductive liner. The first contact is connected to the conductive channel. The second contact is connected to the conductive liner. A voltage difference between the first contact and the second contact is used to determine whether a TSV within a predetermined range to the test TSV has a crack based on a conductive state between the first contact and the second contact.
    Type: Grant
    Filed: December 1, 2020
    Date of Patent: December 20, 2022
    Assignee: Changxin Memory Technologies, Inc.
    Inventors: You-Hsien Lin, Chih-Wei Chang
  • Patent number: 11519944
    Abstract: A voltage differential testing circuit can include a first positive line configured to connect to a positive voltage source, and a first negative line configured to connect to a negative voltage source. The circuit can include a plurality of components arranged and configured to output an output voltage when a voltage differential between a positive voltage line and a negative voltage line is within a voltage range.
    Type: Grant
    Filed: December 11, 2020
    Date of Patent: December 6, 2022
    Assignee: Hamilton Sundstrand Corporation
    Inventor: Gordon Elliott Winer
  • Patent number: 11519755
    Abstract: Example capacitive-sensing rotary encoders and methods are disclosed herein. An example apparatus includes a rotary encoder structured to be mounted to a motor, the rotary encoder including a plurality of circumferential capacitive sensor arrays, each of the plurality of capacitive sensor arrays having an output representing a binary bit of a rotary encoder output, the rotary encoder output changing as a conductor rotates responsive to a rotatable shaft of the motor relative to the rotary encoder.
    Type: Grant
    Filed: May 7, 2020
    Date of Patent: December 6, 2022
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Lichang Cheng, Jun Zhang, Rujun Ji
  • Patent number: 11506686
    Abstract: Embodiments of the present disclosure use a customizable ganged waveguide that comprises a top metal plate and a bottom metal plate with trenches that come together in a way so as to form waveguide channels. The waveguide assembly of the present invention also comprises a waveguide adapter affixed to a first end of the ganged waveguide and operable to conduct the signal to a tester. Further, it comprises an air barrier affixed to a second end of the ganged waveguide to prevent air from flowing from the ganged waveguide to a printed circuit board connected at the second end. Finally, it comprises a tuning plate comprising double ridge slots configured to allow maximal signal to be transferred to the printed circuit board from the ganged waveguide.
    Type: Grant
    Filed: July 1, 2020
    Date of Patent: November 22, 2022
    Assignee: Advantest Corporation
    Inventors: Roger McAleenan, YuChang Liu