Abstract: Methods and apparatus for managing and optimizing data storage devices that include non-volatile memory (NVM) are described. One such method involves deriving a hint for one or more logical block addresses (LBAs) of a storage device based on information received from a host device and/or physical characteristics of the storage device, such as LBAs that are invalidated together; grouping the LBAs into one or more clusters of LBAs based on the derived hint and a statistical analysis of the physical characteristics of the storage devices; allocating available physical block addresses (PBAs) in the storage device to one of the LBAs based on the one or more clusters of LBAs to achieve optimization of a data storage device.

Abstract: Fast verification of data integrity of non-volatile memory cells is disclosed. In one aspect, an estimate is made of a bit error rate (BER) associated with the data to be verified without fully decoding the data. If the estimated BER is below a threshold, then the storage system reports that the data meets a data integrity criterion. If the estimated BER is above the threshold, the storage system may decode the data to determine a BER and report whether the data meets the data integrity criterion based on the determined BER. The estimate of the BER may be based on a syndrome weight of the data, a BER of an XOR codeword formed from multiple codewords of the data, or a BER of a sample of the data. Hence, considerable time and power are saved verifying data integrity, at least when the data is not fully decoded.

Abstract: A storage system has a volatile memory, a non-volatile memory, and a controller. The controller of the storage system can implement various mechanisms for improving random read performance. These mechanisms include improved read prediction cache management, using a pattern length for read prediction, and a time-based enhancement for read prediction. Each of these mechanisms can be used alone on in combination with some or all of the other mechanisms.

Abstract: A non-volatile storage system includes a memory controller connected to an integrated memory assembly. The integrated memory assembly includes a memory die comprising non-volatile memory cells and a control die bonded to the memory die. The memory controller provides data to the control die for storage on the memory die. Data is initially stored on the memory die as single bit per memory cell data to increase the performance of the programming process. Subsequently, the control die performs an adaptive folding process which comprises reading the single bit per memory cell data from the memory die, adaptively performing one of multiple decoding options, and programming the data back to the memory die as multiple bit per memory cell data.

Abstract: A control circuit on a control die compensates for interference caused by adjacent memory cells on target memory cells on a memory die. The compensation may be based on the data states of the adjacent memory cells. Data latches may be used to store data states of the memory cells. However, reading the target memory cells can over-write the data states of the adjacent memory cells in the data latches. The control die may store data state information for the adjacent memory cells prior to sensing the target memory cells (e.g., prior to a decoding error of a codeword in the target cells). Saving the data state information on the control die reduces storage requirements of the memory die and alleviates the need to sense the adjacent memory cells again if decoding the codeword in the target memory cells fails.

Abstract: A method and apparatus for calibrating read threshold for cells of a target wordline (WL) that may be conducted on a die, in a controller connected to a memory die, or both. Voltage values of one or more adjacent WL cells are read, and based on the voltage values of the adjacent cells, cells of the target WL are grouped. A read threshold calibration is carried out on each group. The calibration thresholds are then used for read operations on the cells of each distinct group of the target WL.

Abstract: A memory includes, in one embodiment, one or more storage elements; read/write circuitry; and compressed bit circuitry. The read/write circuitry is configured to read a set of hard bits from the one or more storage elements, and sense a set of soft bits while reading the set of hard bits from the one or more storage elements, the set of soft bits having a first fixed size, and the set of soft bits indicating a reliability of the set of hard bits. The compressed soft bit circuitry is configured to generate, with a fixed size soft bit lossy compression algorithm, a fixed size compressed soft bits by compressing the set of soft bits, the fixed size compressed soft bits having a second fixed size that is smaller than the first fixed size, and output the fixed size compressed soft bits to a memory-to-controller bus.

Abstract: A non-volatile memory system comprises an integrated memory assembly in communication with a memory controller. The integrated memory assembly comprises a memory die bonded to a control die with bond pads. The control die includes one or more control circuits for controlling the operation of the memory die. The one or more control circuits are configured to receive data to be programmed into the memory die, select a number of parity bits, encode the data to add error correction information and form a codeword that includes the number of parity bits, shape the codeword, and program the shaped codeword into the memory die.

Abstract: A controller utilizes dual sense bin balancing (DSBB) to adjust a read level between memory states of an array of NAND flash memory cells. One or more iterations of DSBB may be performed to provide a read level. Each iteration of the DSBB includes performing a first sense read, performing a second sense read, determining a read error, and adjusting the initial read level. The first sense read is performed at a first offset of an initial read level of memory cells. The second sense read is performed at a second offset of the initial read level of memory cells. A read error is determined from the first sense read and the second sense read. The read level is adjusted by the read error. A read of the randomized data pattern is conducted with the adjusted read level of a last iteration of the DSBB.

Abstract: Calibration of soft bit reference levels in a non-volatile memory system is disclosed. A set of memory cells are sensed at a hard bit reference level and test soft bit reference levels. The test soft bit reference levels are grouped around the hard bit reference level. A metric is determined for the test soft bit reference levels. Bins are defined based on the hard bit reference level and the set of test soft bit reference levels. A metric may be determined for each of the bins. The new soft bit reference levels are determined based on the metric. In one aspect, the metric is how many memory cells have a value for a physical parameter within each bin. The soft bit reference levels may be established based on a target percentage for the bins. In one aspect, the metric is how many unsatisfied counters are within each bin.

Abstract: A storage system and sorting-based method for random read command prediction in a multi-queue system are provided. In one embodiment, a method for command prediction is performed in a storage system comprising a memory and being in communication with a host. The method comprises receiving a read command sequence from the host, wherein read commands in the read command sequence originate from a plurality of command queues in the host such that read commands in the read command sequence received from the host are out of order; sorting read commands in the read command sequence received from the host based on logical block addresses; and predicting a next read command from the sorted read commands. Other embodiments are provided.

Abstract: Read reference levels are calibrated by calibrating integration times. An integration time is the length of time for which the charge on a sense node is allowed to change while the memory cell is being sensed. Calibrating the integration time is much faster than calibrating the reference voltage itself. This is due, in part, to reducing the number of different reference voltages that need to be applied during calibration. Calibrating the integration time may use different test integration times for a given read reference voltage, thereby reducing the number of read reference voltages. Hence, calibrating the integration time(s) is very efficient timewise. Also, power consumption may be reduced.

Abstract: A storage system and method for direct quad-level cell (QLC) programming are provided. In one example, a controller of the storage system is configured to create codewords for lower, middle, and upper pages of data; program the codewords in the memory of the storage system using a triple-level cell programming operation; read the programming of the codewords for the lower, middle, and upper pages of data in the memory; create a codeword for a top page of data; and program the codeword in the memory.

Abstract: A memory controller including, in one implementation, a memory interface and a control circuit. The memory interface is configured to receive a punctured codeword read from a non-volatile memory. The control circuit is configured to determine error probability values for a plurality of check nodes associated with a punctured bit included in the punctured codeword. The control circuit is also configured to determine an error probability value for the punctured bit based on the error probability values for the plurality of check nodes associated with the punctured bit and a variable degree associated with the punctured bit. The control circuit is further configured to determine a log likelihood ratio (LLR) value for the punctured bit based on the error probability value for the punctured bit. The control circuit is also configured to decode the punctured codeword using the LLR value for the punctured bit.

Abstract: Power regulation in an integrated memory assembly having control semiconductor dies and memory semiconductor is disclosed herein. A master control die regulates power usage by the integrated memory assembly. Each control die reports information about its expected power usage to the master control die. The master control die determines a plan that meets a power criterion for the integrated memory assembly. The plan may maximize the power usage in each time period, while staying within a power budget. The plan can include selecting which of the memory dies perform a memory operation (or phase of a memory operation) during a given time period. The master control die may send a die scheduling plan to each of the other control dies. Each die scheduling plan indicates when memory operations and/or phases of memory operations are to be performed.

Abstract: A method and apparatus for obtaining data from a memory, estimating a probability of data values of the obtained data based on at least one of a source log-likelihood ratio and a channel log-likelihood ratio, wherein each bit in the obtained data has an associated log-likelihood ratio, determining at least one data pattern parameter for the data and performing a decoding process using the at least one data pattern parameters to determine a decoded data set.

Abstract: Calibration of soft bit reference levels in a non-volatile memory system is disclosed. A set of memory cells are sensed at a hard bit reference level and test soft bit reference levels. The test soft bit reference levels are grouped around the hard bit reference level. A metric is determined for the test soft bit reference levels. Bins are defined based on the hard bit reference level and the set of test soft bit reference levels. A metric may be determined for each of the bins. The new soft bit reference levels are determined based on the metric. In one aspect, the metric is how many memory cells have a value for a physical parameter within each bin. The soft bit reference levels may be established based on a target percentage for the bins. In one aspect, the metric is how many unsatisfied counters are within each bin.

Abstract: A method and apparatus for obtaining data from a memory, estimating a probability of data values of the obtained data based on at least one of a source log-likelihood ratio and a channel log-likelihood ratio, wherein each bit in the obtained data has an associated log-likelihood ratio, determining at least one data pattern parameter for the data and performing a decoding process using the at least one data pattern parameters to determine a decoded data set.

Abstract: A method for calibrating read threshold voltages includes receiving, from at least one memory die, a number of page bits corresponding to a number of read operations performed on a page associated with the at least one memory die. The method further includes determining voltage bins for each bit of the number of page bits. The method further includes determining, for each voltage bin, a bit error rate. The method further includes adjusting read threshold voltages associated with the at least one memory die using the bite error rate for each voltage bin.

Abstract: The disclosure relates in some aspects to on-chip processing circuitry formed within the die of a non-volatile (NVM) array to perform data searches. In some aspects, the die includes components configured to sense wordlines of stored data in the NVM array by applying voltages on the wordlines serially, and then search for an input data pattern within the serially-sensed wordlines. In some examples, the components of the die include latches and circuits configured to perform bitwise latch logic search operations. In other examples, the search components are configured with under-the-array or next-to-the-array dedicated search circuitry that uses registers and/or random access memory (RAM). Other aspects relate to a separate controller device for controlling the on-chip NVM search operations. For example, the controller may determine whether to search for data using search components of the NVM die or processors of the controller based, e.g., on a degree of fragmentation of data.