Abstract: An information storage device is provided. The information storage device may be a magnetic random access memory (MRAM) device including a resistive cross point array of spin dependent tunneling (SDT) junctions or magnetic memory elements, with word lines extending along rows of the SDT junctions and bit lines extending along the columns of the SDT junctions. The present design includes a plurality of heating elements connected in series with associated magnetic memory elements, each heating element comprising a diode. Voltage applied to a magnetic memory element and associated heating element causes reverse current to flow through the diode, thereby producing heat from the diode and heating the magnetic memory element, thereby facilitating the write function of the device.

Abstract: The present invention provides a magnetic memory device that includes a magnetic memory cell switchable between two states by the application of a magnetic field wherein the magnetic field for such switching is dependent in part on a memory cell temperature. The device further includes at least one heater element proximate to the magnetic memory cell and series connected with the magnetic memory cell for heating of the magnetic memory cell. The device also includes a circuit for selectively applying the electrical current through the at least one heater element so as to heat the cell and facilitate cell state-switching.

Abstract: A soft-reference three conductor magnetic memory storage device is disclosed. In a particular embodiment, there are a plurality of parallel electrically conductive first sense/write conductors and a plurality of parallel electrically conductive second sense conductors. The first sense/write and second sense conductors may provide a cross point array. Soft-reference magnetic memory cells are provided in electrical contact with and located at each intersection. In addition there are a plurality of parallel electrically conductive third write column conductors substantially proximate to and electrically isolated from the second sense conductors. Sense magnetic fields orient the soft-reference layer but do not alter the data stored within the cell. An associated method of use is also provided.

Abstract: An embodiment includes a resistance change sensor. The resistance change sensor includes a first input connected to a first resistance and a second input connected to a second resistance. The sensor further includes a resistance detector for sensing a resistive change in at least one of the first resistance and the second resistance.

Abstract: An MRAM memory array includes a set of memory cell strings wherein each memory cell string has a voltage divider input, a bit-sense output, a voltage divider ground, and a bit-sense output control, a shared switched voltage line that is capable of applying a voltage to the voltage divider inputs of the memory cell strings in the set, a common bit-sense line operatively coupled to the bit-sense outputs of the memory cell strings, a bit-sense output control line that is capable of selectively connecting the bit-sense output of a memory cell string to the common bit-sense line, and a ground operatively coupled to the voltage divider grounds of the voltage divider grounds.

Abstract: The invention includes a parallel processor. The parallel processor includes a plurality of non-volatile memory cells. The parallel processor additionally includes a plurality of processor elements. At least one non-volatile memory cell corresponds with each of the processor elements. The processor elements each access data from at least one corresponding non-volatile memory cell. The processor elements perform processing on the data. The non-volatile memory cells can include magnetic memory cells.

Abstract: This invention provides a controlled temperature, thermal-assisted magnetic memory device. In a particular embodiment, there is an array of SVM cells, each characterized by an alterable orientation of magnetization and including a material wherein the coercivity is decreased upon an increase in temperature. In addition, at least one reference SVM (RSVM) cell substantially similar to and in close proximity to the SVM cells of the array is provided. A provided feedback control temperature controller receives a feedback voltage from the reference SVM cell, corresponding to temperature, and adjusts power applied to the RSVM cell and SVM cell. An associated method of use is further provided.

Abstract: Embodiments of the present invention provide a resistive cross point memory. The resistive cross point memory comprises an array of memory cells and a read circuit. The read circuit is configured to sense a resistance through a memory cell in the array of memory cells to obtain a sense result and calibrate the read circuit based on the sensed result. The read circuit comprises an up/down counter that provides a calibration value to the read circuit.

Abstract: A method of performing a thermally assisted write operation on a selected two conductor spin valve memory (SVM) cell having a material wherein the coercivity is decreased upon an increase in temperature. In a particular embodiment, a first write magnetic field is established by a first write current flowing from a first voltage potential to a second voltage potential as applied to the first conductor. A second write magnetic field is established by a second write current flowing from a third voltage potential to a fourth voltage potential as applied to the second conductor. The voltage potential of the first conductor is greater than the voltage potential of the second conductor. As a result, a third current, flows from the first conductor through the SVM cell to the second conductor. The SVM cell has an internal resistance such that the flowing current generates heat within the SVM cell. As the SVM cell is self heated, the coercivity of the SVM cell falls below the combined write magnetic fields.

Abstract: This invention provides a 1R1D block architecture magnetic memory device. In a particular embodiment, a cross-point array of resistive devices is provided. Each resistive device is paired with an isolation device. A feedback controlled control circuit is coupled to the cross-point array. The control circuit establishes an equi-potential setting within the cross-point array, and recognizes a change in current when a selected resistive device within the cross-point array is asserted to a reference state. An associated method of use is further provided.

Abstract: An array of light-sensitive sensors utilizes bipolar phototransistors that are formed of multiple amorphous semiconductor layers, such as silicon. In the preferred embodiment, the bipolar transistors are open base devices. In this preferred embodiment, the holes that are generated by reception of incoming photons to a particular open base phototransistor provide current injection to the base region of the phototransistor. The collector region is preferably an intrinsic amorphous silicon layer. The phototransistors may be operated in either an integrating mode in which bipolar current is integrated or a static mode in which a light-responsive voltage is monitored.

Abstract: A magnetoresistive solid-state storage device (MRAM) employs error correction coding (ECC) to form ECC encoded stored data. In a read operation, parametric values are obtained from storage cells 16 of the device and compared to ranges to establish logical bit values, together with erasure information. The erasure information identifies symbols 206 in a block of ECC encoded data 204 which, from the parametric evaluation, are suspected to be affected by physical failures of the storage cells 16. Where the position of suspected failed symbols 206 is known from this erasure information, the ability of a decoder 22 to perform ECC decoding is substantially enhanced.

Abstract: A resistive cross point memory cell array comprising a plurality of word lines, a plurality of bit lines, a plurality of cross points formed by the word lines and the bit lines, and a plurality of memory cells, each of the memory cells being located at a different one of the cross points, wherein a first bit line comprises a distributed series diode along an entire length of the bit line such that each of the associated memory cells located along the first bit line is coupled between the distributed series diode and an associated word line.

Abstract: A method and apparatus are disclosed for adjusting the offset voltage of a circuit. In one embodiment, the method comprises: supplying reference and supply voltages to the circuit, controlling a voltage across a memory element to be approximately equal to the reference voltage, comparing the current through the memory element to a predetermined value, and adjusting an offset voltage of the circuit, where the offset may remain substantially constant despite changes in the supply voltage.

Abstract: The invention includes an apparatus and a method for minimizing power supply sensitivity of a differential amplifier. The apparatus includes a current source providing a differential amplifier bias current to a common source node of the differential amplifier. A voltage sensor senses variations of a power supply associated with the current source. Variations sensed by the voltage sensor control a magnitude of the differential amplifier bias current. The method includes a current source providing the source current. A voltage potential of the common source node is sensed. The current source is adjusted depending upon the sensed voltage potential of the common source node, thereby adjusting a magnitude of the source current.

Abstract: A gain stage in a sense amplifier receives an input signal representing a stored value and senses if the input signal is less than or not less than a reference signal and generates an output signal indicative of a first state when the input signal is less than the reference signal and an output signal indicative of a second state when the input signal is not less than the reference signal. The gain stage further comprises an integrated latch configured to latch the output signal in either the first or second state. Additionally, a controller operates a sense amplifier having multiple operating modes. Sample mode switch logic causes the sense amplifier to sample a first voltage applied to the sense amplifier's input and hold and compare mode switch logic causes the sense amplifier to hold the first voltage for comparison with a second voltage applied to the sense amplifier's input.

Abstract: A memory device includes a first layer of MRAM memory cells arranged in accordance with an MRAM architecture, a second layer of MRAM memory cells that is fabricated over the first layer of MRAM memory cells, and a common connection associated with the first layer of MRAM memory cells and the second layer of MRAM memory cells that facilitates operation of the memory device. The method of fabricating the memory device includes fabricating a first layer of MRAM memory cells arranged in accordance with an MRAM architecture, fabricating a second layer of MRAM memory cells over the first layer of MRAM memory cells, and fabricating a common connection associated with the first layer of MRAM memory cells and the second layer of MRAM memory cells that facilitates operation of the memory device.

Abstract: An MRAM memory array includes a set of memory cell strings wherein each memory cell string has a voltage divider input, a bit-sense output, a voltage divider ground, and a bit-sense output control, a shared switched voltage line that is capable of applying a voltage to the voltage divider inputs of the memory cell strings in the set, a common bit-sense line operatively coupled to the bit-sense outputs of the memory cell strings, a bit-sense output control line that is capable of selectively connecting the bit-sense output of a memory cell string to the common bit-sense line, and a ground operatively coupled to the voltage divider grounds of the voltage divider grounds.

Abstract: Programming of a programmable resistive memory device includes supplying programming power to the device; generating feedback as to when the device has been programmed; and removing the programming power when the feedback indicates that the device has been programmed.

Abstract: Disclosed herein are systems and devices having memories with reference-initiated sequential sensing. In one embodiment, a reference-initiated sequential sensing method comprises: forming a first attribute measurement associated with a stored data value in a first memory element; using the first memory element to determine a decision threshold; comparing the first attribute measurement to the decision threshold to determine the stored data value in the first memory element; forming a subsequent attribute measurement associated with a stored data value in a subsequent memory element; and comparing the subsequent attribute value to the decision threshold to determine a data value stored in the subsequent memory element.