Abstract: The present invention relates to methods for the synthesis and purification of cyclic nucleotide derivatives. The present invention provides a method for separating a cyclic nucleotide derivative from a mixture resulting from a chemical reaction to produce a cyclic nucleotide derivative from a cyclic nucleotide. In one embodiment, this mixture may comprise a cyclic nucleotide derivative, a pyridine solvent, and at least one of an alkyl carboxylic acid, an alkyl acid halide, or an alkyl carboxylic acid anhydride. In another embodiment, this mixture may comprise a cyclic nucleotide derivative and at least one of an alkyl carboxylic acid, an alkyl acid halide, or an alkyl carboxylic acid anhydride.

Abstract: For an automatic defect inspection of an edge exposure area of a wafer, an optical unit supplies a light beam onto the edge portion of a wafer and a detection unit detects light reflected from the edge portion. The detection unit converts the detected light into an electrical signal to transmit the electrical signal to a processing unit. The processing unit analyzes the electrical signal to measure the reflectivity of the edge portion, compares the measured reflectivity with a reference reflectivity, and calculates the width of the edge exposure area. The processing unit compares the calculated width with a reference width to detect any defect in the edge exposure area.

Abstract: In a method and an apparatus for inspecting defects on a substrate using a light beam, a light source irradiates light beams having different wavelengths onto the substrate. A detector detects first lights scattered from a surface of the substrate and second lights scattered from impurities on the substrate by irradiation of the light beams. An operation unit compares first intensities of the first lights with second intensities of the second lights in order to produce differential values therebetween, and selects a wavelength corresponding to a maximum value of the differential values. An inspection process for inspecting the defects on the substrate is performed using a light beam having the selected wavelength.

Abstract: The present invention provides a remote-controlled in-pile creep test system used in in-pile creep tests for measuring and determining mechanical properties of nuclear materials irradiated in research reactors.

Abstract: The present invention relates to methods of production of the completely post-translationally modified protein by combination of cell-free protein synthesis and cell-free co- and post-translational modification. Previous cell-free protein synthesis system has only been capable of producing partially post-translationally modified protein but the present invention employs a co- and post-translational modification machinery that produces completely post-translationally modified protein.

Abstract: A wavelength-division-multiplexing system is disclosed and includes: a semiconductor-amplification section for amplifying each inputted channel with amplification factors corresponding to the compensation signals received therein; a multiplexer for multiplexing a plurality of channels inputted from the semiconductor-amplification section and outputting the multiplexed signals; an optical-detection section for splitting a part of the multiplexed optical signals inputted from the multiplexer, demultiplexing the split optical signals into a plurality of channels, converting each of the demultiplexed channels into corresponding electric signals, and outputting the electric signals; and, a control section calculating the pertinent intensity deviations by comparing each intensity of the electric signals inputted from the optical-detection section with a preset reference intensity and outputting compensation signals for compensating the intensity deviation of each channel to the semiconductor-amplification section.

Abstract: The present invention provides a remote-controlled in-pile creep test system used in in-pile creep tests for measuring and determining mechanical properties of nuclear materials irradiated in research reactors.

Abstract: A condenser of a condensing-type clothes dryer includes a plurality of condensing ducts provided in a middle portion of a circulation duct, the condensing ducts condensing air being circulated there-through after being discharged from a drum; and a plurality of cooling fins provided to be in contact with an outer surface of the condensing ducts, wherein an interval or a pitch of the cooling fins is different partially according to a flow rate of air blown from a cooling fan for a heat-exchange with air flowing through the condensing duct. At this time, the pitch or interval of the cooling fins is narrow at a portion where air blown from the cooling fan flows fast, and the pitch or internal of the cooling fins is wide at a portion where air blown from the cooling fan flows slowly.

Abstract: Disclosed is a method for manufacturing a tapered optical waveguide through which waveguides of different sizes are connected with each other optically. In the method, a photo-resist pattern having an inclined profile is formed on the core layer by means of a gray-scale mask, then the profile of the tapered waveguide can be precisely controlled by controlling the profile of the photo-resist pattern and the etching-selection ratio between the photo-resist and the core layer.

Abstract: A cathode ray tube is mounted with a reinforcing band for improving landing stability of electron beams and howling of shadow mask and reinforcing an explosion-proof function.

Abstract: Disclosed herein is a drying machine. The drying machine comprises supporting members mounted on a base, and motor fixing brackets each including an insert part, through which a motor is inserted, and first and second supporting legs extending downwardly from the opposite ends of the insert part, the first and second supporting legs being engaged with the supporting members, whereby any vibration of the motor is prevented and attachment/detachment of the motor is easy and convenient.

Abstract: The MAC frame in a wireless communication system includes a terminal ID allocated to each of multiple terminals. At least one connection ID is allocated to each terminal having the terminal ID, and sub-carrier allocation information is allocated to each connection having the connection ID. The sub-carrier allocation information includes a sub-carrier allocation status for each sub-carrier, and the number of allocated information bits for each sub-carrier. The sub-carrier allocation status and the number of allocated information bits for each sub-carrier can be allocated, by sub-carriers, to the sub-carrier allocation information using a same number of bits; or the information on the sub-carrier allocation status is first allocated to the sub-carrier allocation information and the number of allocated information bits for each sub-carrier is allocated.

Abstract: The method for controlling a hybrid air conditioning system of a direct coupled motor-driven hybrid electric vehicle includes detecting operating conditions of the air conditioning system; and controlling the hybrid air conditioning system. The hybrid air conditioning system includes a mechanical air conditioner driven by an engine and an electric air conditioner driven by electric power of a battery.

Abstract: A method and apparatus for detecting contaminants in an ion-implanted wafer by annealing and activating the ion-implanted wafer by heating or charging or both, and measuring the thermal wave absorbance generated from the activated wafer.

Abstract: A clothes dryer and a cooling passage structure for cooling a condenser thereof is disclosed, which includes front and rear inhalation holes provided at a cabinet of the clothes dryer; and a guide duct provided to connect a condenser to a cooling fan, for forming a flow passage of an external air flown through the front and rear inhalation holes. At this time, the guide duct is provided such that an outlet side of the condenser exhausting the external air is connected to an inlet side of the cooling, fan inhaling the external air after passing through the condenser. The outlet side of the condenser exhausting the external air after passing through the condenser is opposite to the inlet side of the cooling fan inhaling the external air. Also, if the cooling fan is composed of a sirocco fan, which is provided such that the external air passing through the cooling fan is discharged to the rear side of the cabinet.

Abstract: A method for monitoring an ion implanter includes positioning a substrate behind an interceptor for intercepting a portion of an ion beam to be irradiated toward the substrate, irradiating a first ion beam toward the substrate to form a first shadow on the substrate, rotating the substrate about a central axis of the substrate, irradiating a second ion beam toward the substrate to form a second shadow on the substrate, and measuring a dosage of ions implanted into the substrate to monitor whether the rotation of the substrate has been normally performed. Preferably, a dosage of ions implanted into the substrate is calculated from a thermal wave value of the substrate and whether the rotation of the substrate has been normally performed is monitored by comparing the thermal wave value corresponding to the first shadow with a reference thermal wave value.

Abstract: An apparatus for measuring contamination of a semiconductor substrate includes a chuck for loading a substrate, a position detection means for recognizing a front surface of the loaded substrate to obtain position data of a portion of the substrate to be measured, a first driving part for moving the chuck in accordance with the position data to measure a rear portion of the substrate, and a surface measurement means disposed under the chuck for selectively measuring metal contamination of the substrate at the rear portion of the substrate. In operation, the substrate is loaded onto a chuck, position data of a portion of the substrate to be measured is obtained by recognizing patterns formed on the substrate, the substrate is then moved in accordance with the position data to measure a rear portion of the substrate, and metal contamination is selectively measured at the rear portion of the substrate.

Abstract: A method of measuring a concentration of a material includes irradiating an infrared light onto a substrate having a layer including a first material and dopants, wherein the infrared light is partially absorbed by and partially transmitted through the substrate including the layer. Intensities of the infrared light absorbed in the first material and the dopants are computed according to light wave numbers by utilizing a difference between intensities of the infrared light before and after transmitting the substrate and layer and by utilizing a difference between intensities of the infrared light absorbed in the substrate and layer and absorbed in only the substrate. Concentrations of the dopants are obtained by utilizing a ratio of light wave number regions corresponding to predetermined intensities of infrared light absorbed in the dopants relative to light wave number regions corresponding to the predetermined intensity of infrared light absorbed in the first material.

Abstract: The present invention discloses a semiconductor memory device and a method of generating a block selection signal for the semiconductor memory device. The semiconductor memory device includes 2n groups comprised of m memory cell array blocks and each of the memory cell array blocks has (2k+a) word lines. The semiconductor memory device further includes a first block selection signal generating circuit for generating first block selection signals for selecting one group of the 2n groups by decoding a n-bit row address, a second block selection signal generating circuit for generating second block selection signals for selecting one memory cell array block in every group by decoding a l-bit row address, and a third block selection signal generating circuit for generating third block selection signals for selecting one memory cell array block out of (m×2n) memory cell array blocks by receiving the first block selection signals and the second block selection signals.

Abstract: A heat sink for electronic devices, and circuit board and plasma display panel assembly, each equipped with the heat sink. The heat sink for electronic devices, and circuit board and PDP assembly each equipped with the heat sink includes a base portion fixedly attached to a circuit board, a contact portion fixedly and tightly brought into contact with one or more electronic devices, and a plurality of heat radiation fins each extended from the contact portion to a certain distance. A heat radiation fin distant from the base portion has a width shorter than of a heat radiation fin nearer to the base portion.