Analysis system

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Description

FIG. 1 is a front perspective view of an analysis system;

FIG. 2 is a rear view of the analysis system;

FIG. 3 is a top view of the analysis system;

FIG. 4 is a bottom view of the analysis system;

FIG. 5 is a back perspective view of the analysis system;

FIG. 6 is a second front perspective view of the analysis system;

FIG. 7 is a first side view of the analysis system; and,

FIG. 8 is a second side view of the analysis system.

The broken lines in the drawings illustrate portions of the analysis system that form no part of the claimed design.

Claims

The ornamental design for an analysis system as shown and described.

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Patent History
Patent number: D1057200
Type: Grant
Filed: Feb 3, 2023
Date of Patent: Jan 7, 2025
Assignee: Becton, Dickinson and Company (Franklin Lakes, NJ)
Inventors: Raymond Brasil Cota (San Jose, CA), Jamie Ryan Moskwa (San Jose, CA), Germin Hanna Zaki (Sunnyvale, CA), Jrhung Taylor Tsai (Alameda, CA), Yasaman Daghighi (Oakland, CA), Timothy Zheng Zhu (San Jose, CA)
Primary Examiner: T Chase Nelson
Assistant Examiner: Kelly L Gross
Application Number: 29/883,846
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)