Thermometer for semiconductor manufacturing apparatus

Description

FIG. 1 is a front, top and right-side perspective view of a thermometer for semiconductor manufacturing apparatus showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a rear elevational view thereof;

FIG. 8 is an enlarged left side elevational view thereof;

FIG. 9 is an enlarged right side elevational view thereof;

FIG. 10 is an enlarged view taken from the double-dotted line box labeled FIG. 10 in FIG. 2 thereof;

FIG. 11 is an enlarged view taken from the double-dotted line box labeled FIG. 11 in FIG. 2 thereof; and,

FIG. 12 is an enlarged view taken from the double-dotted line box labeled FIG. 12 in FIG. 2.

The double-dotted broken lines in FIGS. 2, 10, 11, and 12 show the periphery of the enlarged views and form no part of the claimed design.

Claims

The ornamental design for a thermometer for semiconductor manufacturing apparatus, as shown and described.