Electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

The broken lines shown are for illustrative purposes only and form no part of the claimed design.

Claims

We claim the ornamental design for an electron microscope, as shown and described.

Referenced Cited
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Patent History
Patent number: D638046
Type: Grant
Filed: Jul 29, 2010
Date of Patent: May 17, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Hiroyuki Noda (Kokubunji), Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiro Nemoto (Hitachiota), Kiyoshi Sasagawa (Honjo)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/366,697
Classifications
Current U.S. Class: Microscope (D16/131)