Electron microscope
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Description
The broken lines shown are for illustrative purposes only and form no part of the claimed design.
Claims
We claim the ornamental design for an electron microscope, as shown and described.
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Patent History
Patent number: D638046
Type: Grant
Filed: Jul 29, 2010
Date of Patent: May 17, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Hiroyuki Noda (Kokubunji), Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiro Nemoto (Hitachiota), Kiyoshi Sasagawa (Honjo)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/366,697
Type: Grant
Filed: Jul 29, 2010
Date of Patent: May 17, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Hiroyuki Noda (Kokubunji), Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiro Nemoto (Hitachiota), Kiyoshi Sasagawa (Honjo)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/366,697
Classifications
Current U.S. Class:
Microscope (D16/131)