Electron microscope

- Jeol Ltd.
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Description

FIG. 1 is a perspective view of an electron microscope as viewed from the top, front and right side, showing our new design;

FIG. 2 is a perspective view thereof in an alternate position;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a top view thereof;

FIG. 6 is a bottom view thereof;

FIG. 7 is a right side view thereof; and,

FIG. 8 is a left side view thereof.

The broken lines are for illustrative purposes only and form no part of the claimed invention.

Claims

The ornamental design for an electron microscope, as shown and described.

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Patent History
Patent number: D697118
Type: Grant
Filed: Sep 28, 2012
Date of Patent: Jan 7, 2014
Assignee: Jeol Ltd.
Inventors: Kiyoyuki Okuyama (Yamagata), Reiichi Ishikura (Tokyo), Norikazu Shoji (Hamura)
Primary Examiner: Paula Greene
Application Number: 29/433,351
Classifications
Current U.S. Class: Microscope (D16/131)