Electron microscope
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Description
The broken lines are for illustrative purposes only and form no part of the claimed invention.
Claims
The ornamental design for an electron microscope, as shown and described.
Referenced Cited
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Patent History
Patent number: D697118
Type: Grant
Filed: Sep 28, 2012
Date of Patent: Jan 7, 2014
Assignee: Jeol Ltd.
Inventors: Kiyoyuki Okuyama (Yamagata), Reiichi Ishikura (Tokyo), Norikazu Shoji (Hamura)
Primary Examiner: Paula Greene
Application Number: 29/433,351
Type: Grant
Filed: Sep 28, 2012
Date of Patent: Jan 7, 2014
Assignee: Jeol Ltd.
Inventors: Kiyoyuki Okuyama (Yamagata), Reiichi Ishikura (Tokyo), Norikazu Shoji (Hamura)
Primary Examiner: Paula Greene
Application Number: 29/433,351
Classifications
Current U.S. Class:
Microscope (D16/131)