Substrate for spectroscopic analysis

- HAMAMATSU PHOTONICS K.K.
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Description

1. Substrate for spectroscopic analysis

1.1 : Perspective

1.2 : Front

1.3 : Back

1.4 : Top

1.5 : Bottom

1.6 : Left

1.7 : Right

1.8 : SECTIONAL VIEW

1.9 : SECTIONAL VIEW

1.10 : PERSPECTIVE VIEW WITHOUT THE COVER PART

The broken line showing the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.

The dot-dash broken lines define the bounds of the claimed design and form no part thereof.

Claims

The ornamental design for a substrate for spectroscopic analysis, as shown and described.

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Patent History
Patent number: D838002
Type: Grant
Filed: Sep 30, 2016
Date of Patent: Jan 8, 2019
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Yoshihiro Maruyama (Hamamatsu), Mitsuhiro Ito (Hamamatsu), Toshiyuki Nagata (Hamamatsu), Hisashi Takamori (Hamamatsu)
Primary Examiner: Richard E Chilcot
Application Number: 35/502,705
Classifications
Current U.S. Class: Slide Or Reagent Sheet Type (D24/225)