Probe microscope

- SHIMADZU CORPORATION
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Description

FIG. 1 is a perspective view of a probe microscope showing my new design;

FIG. 2 is another perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof; and,

FIG. 8 is a bottom view thereof.

Claims

The ornamental design for a probe microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D608810 January 26, 2010 Stoiakine
D626579 November 2, 2010 Oonuma
D632323 February 8, 2011 Oonuma
D687475 August 6, 2013 Oonuma
D724128 March 10, 2015 Muraoka
D887295 June 16, 2020 Carney
D933730 October 19, 2021 Kang
D956120 June 28, 2022 Takegawa
Patent History
Patent number: D973745
Type: Grant
Filed: Feb 24, 2022
Date of Patent: Dec 27, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/828,202
Classifications
Current U.S. Class: Microscope (D16/131)