Probe microscope
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Description
Claims
The ornamental design for a probe microscope, as shown and described.
Referenced Cited
Patent History
Patent number: D973745
Type: Grant
Filed: Feb 24, 2022
Date of Patent: Dec 27, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/828,202
Type: Grant
Filed: Feb 24, 2022
Date of Patent: Dec 27, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/828,202
Classifications
Current U.S. Class:
Microscope (D16/131)