Probe microscope
Latest SHIMADZU CORPORATION Patents:
- Method, system and program for processing mass spectrometry data
- Mass spectrometer
- Transfer system and automatic analysis system
- Mass spectrometer with charge up determiner using ion intensity signal
- Analytical operation assisting device and non-transitory computer readable medium recording analytical operation assisting program
Description
Claims
The ornamental design for a probe microscope, as shown and described.
Referenced Cited
Patent History
Patent number: D973745
Type: Grant
Filed: Feb 24, 2022
Date of Patent: Dec 27, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/828,202
Type: Grant
Filed: Feb 24, 2022
Date of Patent: Dec 27, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/828,202
Classifications
Current U.S. Class:
Microscope (D16/131)