Probe microscope
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Description
The broken lines form no part of the claimed design.
Claims
The ornamental design for a probe microscope, as shown and described.
Referenced Cited
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Patent History
Patent number: D724128
Type: Grant
Filed: Dec 20, 2013
Date of Patent: Mar 10, 2015
Assignee: Shimadzu Corporation (Kyoto)
Inventors: Hiroshi Muraoka (Kyoto), Masato Hirade (Kyoto)
Primary Examiner: Paula Greene
Application Number: 29/477,220
Type: Grant
Filed: Dec 20, 2013
Date of Patent: Mar 10, 2015
Assignee: Shimadzu Corporation (Kyoto)
Inventors: Hiroshi Muraoka (Kyoto), Masato Hirade (Kyoto)
Primary Examiner: Paula Greene
Application Number: 29/477,220
Classifications
Current U.S. Class:
Microscope (D16/131)