Probe microscope

- Shimadzu Corporation
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Description

FIG. 1 is a perspective view of a probe microscope showing our new design;

FIG. 2 is another perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof; and,

FIG. 8 is a bottom view thereof.

The broken lines form no part of the claimed design.

Claims

The ornamental design for a probe microscope, as shown and described.

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Patent History
Patent number: D724128
Type: Grant
Filed: Dec 20, 2013
Date of Patent: Mar 10, 2015
Assignee: Shimadzu Corporation (Kyoto)
Inventors: Hiroshi Muraoka (Kyoto), Masato Hirade (Kyoto)
Primary Examiner: Paula Greene
Application Number: 29/477,220
Classifications
Current U.S. Class: Microscope (D16/131)