Spectrum analyzer
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Description
The file of this patent contains at least one drawing/photograph executed in color. Copies of this patent with color drawing(s)/photograph(s) will be provided by the Office upon request and payment of the necessary fee.
The broken line gridded portion forms part of the claimed design.
The broken lines outside the gridded area depict portions of the spectrum analyzer which form no part of the claimed design.
The broken line text forms no part of the claimed design.
Claims
The ornamental design for a spectrum analyzer, as shown and described.
Referenced Cited
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Patent History
Patent number: D991813
Type: Grant
Filed: Oct 25, 2022
Date of Patent: Jul 11, 2023
Assignees: YOKOGAWA ELECTRIC CORPORATION (Tokyo), YOKOGAWA TEST & MEASUREMENT CORPORATION (Tokyo)
Inventors: Daisuke Sato (Tokyo), Gentarou Ishihara (Tokyo), Ayako Kouno (Musashino)
Primary Examiner: George D. Kirschbaum
Assistant Examiner: Lillian Windham
Application Number: 29/857,716
Type: Grant
Filed: Oct 25, 2022
Date of Patent: Jul 11, 2023
Assignees: YOKOGAWA ELECTRIC CORPORATION (Tokyo), YOKOGAWA TEST & MEASUREMENT CORPORATION (Tokyo)
Inventors: Daisuke Sato (Tokyo), Gentarou Ishihara (Tokyo), Ayako Kouno (Musashino)
Primary Examiner: George D. Kirschbaum
Assistant Examiner: Lillian Windham
Application Number: 29/857,716
Classifications
Current U.S. Class:
Chemical (12) (D10/81)