Spectrum analyzer

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

The file of this patent contains at least one drawing/photograph executed in color. Copies of this patent with color drawing(s)/photograph(s) will be provided by the Office upon request and payment of the necessary fee.

FIG. 1 is a front view of a spectrum analyzer showing our new design;

FIG. 2 is a right side view thereof, the left side view being a mirror image; and,

FIG. 3 is a top view thereof.

The broken line gridded portion forms part of the claimed design.

The broken lines outside the gridded area depict portions of the spectrum analyzer which form no part of the claimed design.

The broken line text forms no part of the claimed design.

Claims

The ornamental design for a spectrum analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
D251366 March 20, 1979 Bathiany et al.
4244024 January 6, 1981 Marzalek et al.
4253152 February 24, 1981 Holdaway
4257104 March 17, 1981 Martin et al.
4264958 April 28, 1981 Rowell, Jr. et al.
4350953 September 21, 1982 Best et al.
D282351 January 28, 1986 Nord et al.
4578640 March 25, 1986 Crooke et al.
4695833 September 22, 1987 Ogura et al.
4800378 January 24, 1989 Putrow
4821030 April 11, 1989 Batson
4924175 May 8, 1990 Clinton
4972138 November 20, 1990 Bush
5025411 June 18, 1991 Tallman
5177560 January 5, 1993 Stimple et al.
D335093 April 27, 1993 Holmen et al.
5321420 June 14, 1994 Rezek et al.
5396444 March 7, 1995 Cannon et al.
5434954 July 18, 1995 Kawauchi
D367821 March 12, 1996 Fischer
D377319 January 14, 1997 Amano et al.
5631667 May 20, 1997 Cadwell
D420607 February 15, 2000 Wrisley
6112593 September 5, 2000 Aoki
6140812 October 31, 2000 Russell
6195617 February 27, 2001 Miller
D460371 July 16, 2002 Wrisley et al.
D460703 July 23, 2002 Wrisley et al.
6437552 August 20, 2002 Sekel et al.
6731104 May 4, 2004 Yang
6774890 August 10, 2004 Engholm
D499658 December 14, 2004 Wrisley
D501414 February 1, 2005 Graef et al.
6856127 February 15, 2005 Ramesh
D504078 April 19, 2005 Graef et al.
D504079 April 19, 2005 Wrisley
D504080 April 19, 2005 Wrisley
D504341 April 26, 2005 Graef et al.
D514004 January 31, 2006 Wrisley
6982550 January 3, 2006 Cannon
D556066 November 27, 2007 Hoang et al.
7459898 December 2, 2008 Woodings
7911466 March 22, 2011 Iwashita
8195413 June 5, 2012 Freidhof
D663636 July 17, 2012 Dobyns et al.
8521457 August 27, 2013 Patel
8576231 November 5, 2013 Woodings
9234927 January 12, 2016 Franz
9367166 June 14, 2016 Kremin
9459290 October 4, 2016 Johnson
9546927 January 17, 2017 Hayashi
D787961 May 30, 2017 Umezawa
9646395 May 9, 2017 Ben-Oni
D820127 June 12, 2018 Kreitzer et al.
D820129 June 12, 2018 Kreitzer
D845797 April 16, 2019 Ruoss
D909899 February 9, 2021 Clayton
D955246 June 21, 2022 Carney
11415602 August 16, 2022 Schaefer
20030062906 April 3, 2003 Anderson
20030219086 November 27, 2003 LeCheminant et al.
20040095381 May 20, 2004 McDowell
20040164984 August 26, 2004 Pickerd
20040167727 August 26, 2004 Pickerd
20070027675 February 1, 2007 Hertz
20080231256 September 25, 2008 Cox
20080278143 November 13, 2008 Cox
20130006570 January 3, 2013 Kaplan
20190162764 May 30, 2019 Barsumian et al.
20210325437 October 21, 2021 Jones
Patent History
Patent number: D991813
Type: Grant
Filed: Oct 25, 2022
Date of Patent: Jul 11, 2023
Assignees: YOKOGAWA ELECTRIC CORPORATION (Tokyo), YOKOGAWA TEST & MEASUREMENT CORPORATION (Tokyo)
Inventors: Daisuke Sato (Tokyo), Gentarou Ishihara (Tokyo), Ayako Kouno (Musashino)
Primary Examiner: George D. Kirschbaum
Assistant Examiner: Lillian Windham
Application Number: 29/857,716
Classifications
Current U.S. Class: Chemical (12) (D10/81)