Abstract: Concentration by cytology personnel, i.e. users, is induced during scanning and marking of cytology slides, by electronic recognition of parsed voice inputs that are spoken by the users, electronic generation of selected voice output alerts that are heard by the users, and electronic processing of the voice inputs and voice outputs, for semi-automatic development of a cytology report.

Abstract: A confocal microscope apparatus has a confocal scanner for scanning a sample with shifting a focal position of a light beam in a direction perpendicular to an optical axis, a moving mechanism for moving the focal position of the light beam in an optical axis direction, a camera for picking up an image of the sample with the light beam, and a movement control unit for controlling the moving mechanism to move the focal position of the light beam by a predetermined distance in the optical axis direction for every vertical synchronizing signal of the camera in synchronization with the vertical synchronizing signal. A high-speed three-dimensional image can be displayed in such that while measuring the sample, two or more slice images in such an arrangement on a common screen that their positions relative to the sample enables to be grasped.

Abstract: An auto focusing method and apparatus for determining a focusing evaluation value, comparing the focusing evaluation value with an acceptance level of a preset focusing evaluation value, and iteratively focusing, while widening the depth of focus, when the focusing evaluation value is lower than the acceptance level.

Abstract: A confocal microscope apparatus has a confocal scanner for scanning a sample with shifting a focal position of a light beam in a direction perpendicular to an optical axis, a moving mechanism for moving the focal position of the light beam in an optical axis direction, a camera for picking up an image of the sample with the light beam, and a movement control unit for controlling the moving mechanism to move the focal position of the light beam by a predetermined distance in the optical axis direction for every vertical synchronizing signal of the camera in synchronization with the vertical synchronizing signal. A high-speed three-dimensional image can be displayed in such that while measuring the sample, two or more slice images in such an arrangement on a common screen that their positions relative to the sample enables to be grasped.

Abstract: When irradiating a sample with light from a light source through an object lens, discretely changing a relative position between a beam condensing position of the object lens and the sample in an optical axis direction of the converging beam, obtaining light intensity information from the sample at each relative position, extracting plural pieces of light intensity information from a light intensity information group, estimating a maximum value on a change curve adaptive to the plural pieces of extracted light intensity information and the relative position for the maximum value, and obtaining the estimated maximum value of the light intensity information and relative position as brightness information and height information, these information about the sample can be continuously obtained by discretely performing an iterative operation on the relative position between a beam condensing position of the object lens and the sample in an optical axis direction of the converging beam.

Abstract: The invention relates to a method for optically detecting at least one entity which is arranged on a substrate. The at least one entity is scanned with a measuring volume using at least one radiation source and a confocal optic. During a scanning process an auxiliary focus is generated by means of at least one second radiation source and a second optic. Radiation generated by the first radiation source is collimated by a first optic and radiation generated by the second radiation source is collimated by a second optic. A retroreflection from the auxiliary focus is detected by at least one detector and is used to measuring the position of an interface and, thus, for indirectly positioning the measuring volume. The position of the auxiliary focus relative to the measuring volume is adjustable in a defined manner.

Abstract: The invention provides a multiphoton-excitation-type examination apparatus that efficiently generates a multiphoton-excitation effect, that makes the measurement head compact, and that can be easily adjusted when the measurement head is replaced. The multiphoton-excitation-type examination apparatus comprises a laser light source that oscillates ultrashort pulsed laser light; an optical fiber that transmits the ultrashort pulsed laser light from the laser light source; a support member; a measurement head supported on the support member so as to be movable upwards and downwards and at an angle, and having an optical system that irradiates a specimen with the ultrashort pulsed laser light transmitted by the optical fiber that measures fluorescence or reflected light coming from the specimen; and a dispersion-compensating member, in the measurement head, that compensates for group velocity dispersion of the ultrashort pulsed laser light irradiated onto the specimen.

Abstract: This invention provides a method of measuring semiconductor pattern dimensions capable of realizing a stable and highly precise pattern dimension measurement technique even when the pattern cross-sectional shapes are changed and making the calculation amount relatively small to reduce the calculation time.

Abstract: A microscope system according to the present invention comprises a stage on which a specimen is placed, an image forming optical system that forms an image of the specimen placed on the stage, an image-capturing device that captures the image of the specimen formed by the image forming optical system, a focused position detection device that detects a focused position for the specimen based upon the specimen image captured by the image-capturing device and a focused position storage device that stores in memory the focused position detected by the focused position detection device. The focused position detection device sets a search range centered around the focused position stored in memory at the focused position storage device and detects the focused position anew by causing the stage and the image forming optical system to move relative to each other over the search range thus set each time a focusing operation is executed.

Abstract: A knife edge is disposed at a height corresponding to a section on which a sectional image (light intensity distribution) is picked up in such a manner as to intercept a part of the section of the laser light. The knife edge is irradiated with the laser light, and the sectional image of the laser light is enlarged with an image forming optics, and is picked up by a CCD. While picking up the sectional image in this manner, focusing of the image forming optics is performed. Next, the knife edge is retracted from the optical path of the laser light, the laser light is allowed to enter the CCD via the image forming optics, and the sectional image of the laser light is picked up.

Abstract: Compact design is achieved to minimize blocking of the field of view of a stereomicroscope apparatus. Furthermore, astigmatism is decreased to produce a high-quality image. An optical-scanning microscope apparatus includes a light source, a light-transmitting member for transmitting light from the light source, an apparatus main body for illuminating a subject with the light transmitted by the light-transmitting member, and a photodetector for detecting return light returning from the subject via the apparatus main body and the light-transmitting member.

Abstract: A system for measuring radiation at a peak wavelength that is radiated from a probe tip of a near-field scanning optical microscope (NSOM) probe used for laser machining, including: a laser source; the NSOM probe; a coupling substrate that is substantially transmissive to the peak wavelength; an NSOM mount to controllably hold the probe and the coupling substrate; an NSOM probe monitor coupled to the mount; an NSOM controller; and a photodetector optically coupled to the substrate. Light is coupled into the probe. The mount includes a Z motion stage. The probe monitor determines the distance between the probe tip and the coupling substrate. The controller is coupled to the probe monitor and the motion stage. It controls the distance between the probe tip and the coupling substrate such that radiation is coupled from the probe tip into the coupling substrate. The photodetector measures the power of this radiation.

Abstract: An imaging apparatus with an autofocus mechanism for obtaining focused images. The apparatus comprises: an objective lens, a focus controller for altering a distance between the objective lens and a sample, an object finder for finding objects of interest within the sample, for example cells, and a light intensity measurement unit which measures light intensity levels of the thus identified objects of interest. The focus control alters the sample-objective distance to maximize the light intensity levels being measured, thereby to arrive at a focus position. Objects of interest may be identified by filtering out large objects and optionally by masking out background regions. The apparatus is useful for microscopy and particularly for fluorescent imaging in which light levels are low and noise is often high.

Abstract: The invention comprises a robotic microscope system and methods that allow high through-put analysis biological materials, particularly living cells, and allows precise return to and re-imaging of the same field (e.g., the same cell) that has been imaged earlier. This capability enables experiments and testing hypotheses that deal with causality over time intervals which are not possible with conventional microscopy methods.

Abstract: An automatic focal point sensing device includes an image sensor on which an optical image is projected and which photoelectrically converts the image pixel by pixel to generate image data, a first calculation circuit which generates more than one pixel block, each pixel block being the sum of consecutive pixel data items, calculates one of the sum of the differences between signal levels of two adjacent pixel blocks and the sum of the square of each of the differences of two adjacent pixel blocks as a contrast value, and which determines more than one contrast value by changing a combination of pixel data items contained in each pixel block, and a second calculation circuit for calculating the sum of the contrast values determined by the first calculation circuit as an evaluation value and determining the degree of focusing on the basis of the evaluation value.

Abstract: A Precision Optical Intracellular Near Field Imaging/Spectroscopy Technology (POINT/NANOPOINT) is a high-resolution instrument for analyzing and comparing molecular characteristics of cells. A nanosensor array is provided which is capable of imaging inner regions of living cells without destroying its natural environment and providing new information about molecular makeup of cells. The POINT probe collects data from high-resolution imagery, providing an imaging tool for investigating cells at sub-cellular and molecular levels. Data are then incorporated into a signature facilitating molecular analysis of diseases. The POINT probe non-invasively penetrates cell membranes to image insides of intact cells allowing the POINT probe to collect data without destroying cell structures. The probe provides cellular imaging to enable the viewing of both imaging and spectroscopy of internal regions of cells. The POINT system may be attached to existing microscopes to achieve a very high resolution.

Abstract: Control system for a microscope with a sensor unit, an evaluating unit and at least one drive unit, the sensor unit having at least one movement sensor, is fixed to the microscope and is aligned with the head of the microscope of the user for detecting head movements of the latter. The evaluating unit is constructed for calculating the data received by the sensor unit and for transmitting a control signal to the at least one drive unit, and the at least one drive unit is constructed for driving means set up for adjusting at least one physical characteristic of the microscope.

Abstract: The invention relates to a method of recording an image of an object (103) using an electronic camera (102), one or more light sources (104), and means for light distribution (105), where light emitted from the light sources (104) is distributed to illuminate the object (103), light being reflected to the camera (102). In the light distribution, an integrating cavity (106) is used to whose inner side (107) a light reflecting coating has been applied, and which is provided with first and second openings (109, 110). The camera (102) is placed in alignment with the first opening (109) so that the optical axis of the camera extends through the first and second openings (109, 110). The object (103) is received in the second opening (110), and the interior of the integrating cavity is illuminated using the one or more light sources (104). The invention also relates to an apparatus for performing the method.

Abstract: An imaging system on which a calibration method is practiced includes: a light source; a substrate for supporting an object; a patterning mask that generates a substantially periodic spatial pattern on the object; a phase shifter that adjusts the relative position of the patterning mask and object to shift the position of the pattern on the object; a detector that detects images of the object; and an analyzer that analyzes at least three images of the object, each of which represents a different spatial shift of the pattern, the analyzer being configured to remove the spatial pattern from the images to generate an optically sectioned image of the object. The calibration method includes: calibrating the position of the mask relative to the substrate via a phase-voltage technique; calibrating the position of the mask relative to the substrate via a merit function technique; and operating the calibrated imaging system.

Abstract: A semiconductor wafer inspection system and method is provided which uses a multiple element arrangement, such as an offset fly lens array. The preferred embodiment uses a laser to transmit light energy toward a beam expander, which expands the light energy to create an illumination field. An offset fly lens array converts light energy from the illumination field into an offset pattern of illumination spots. A lensing arrangement, including a first lens, a transmitter/reflector, an objective, and a Mag tube imparts light energy onto the specimen and passes the light energy toward a pinhole mask. The pinhole mask is mechanically aligned with the offset fly lens array. Light energy passing through each pinhole in the pinhole mask is directed toward a relay lens, which guides light energy onto a sensor. The offset fly lens array corresponds to the pinhole mask.

Abstract: A method and apparatus (10) for determining a best focus position of an object (30) relative to a reference position (e.g., axis A) of a dark-field optical imaging system (20), with an effective focusing range up to 10 times of the depth of field of the system. The method includes the steps of first forming a dark-field image of the object at different focus positions (zm). Each dark-field image has a corresponding image intensity distribution with an average intensity and a variance of intensity. The next step is forming a set of contrast values by calculating a contrast value (Cm) for each dark-field image based on the variance and the average intensity. The last step is determining the best focus position by fitting a Lorentzian function to the set of contrast values plotted as a function of the different focus positions and identifying the focus position associated with the maximum contract value (Cmax).

Abstract: An apparatus for inspecting a semiconductor wafer includes a vertically movable chuck plate for holding said semiconductor wafer, a first light source for illuminating an area on the wafer, a main imaging camera for detecting light scattered from the surface of the wafer and a main imaging lens for imaging the illuminated area of the wafer onto the camera. The apparatus additionally includes an auto-focus system for maintaining the wafer within the depth of field of the lens focal point. The auto-focus system comprises a second light source with associated optics, a linear position sensor with associated optics for detecting light from the second light source that is reflected off the illuminated area of the wafer, circuitry for converting the light detected by the sensor into an output voltage which is proportional to the relative vertical position of the illuminated area of the wafer.

Abstract: An apparatus and method for measuring optically the position or angle of a variety of objects or arrays of objects, including cantilevers in scanning probe microscopy, micromechanical biological and chemical sensors and the sample or a probe in surface profilometry. The invention involves the use of one or more diffractive optical elements, including diffraction gratings and holograms, combined with conventional optical elements, to form a plurality of light beams, each with a selectable shape and intensity, from a single light source, reflect the beams off mechanical objects and process the reflected beams, all to the end of measuring the position of such objects with a high degree of precision. The invention may also be used to effect mechanical changes in such objects.

Abstract: An object image data obtained by image taking by an image taking device, while a distance between a stage, on which an object is placed, and the image taking device is varied, is captured by a focus processing device at each predetermined timing. The focus processing device retrieves contrast data indicating a maximum value from the captured respective object image data, and stores the object image data in the image information memory. The object image data of the contrast data indicating the maximum value is read from the image information memory, and outputted and displayed on a display section.

Abstract: A scanning laser microscope is configured to include: a scanner unit for performing two-dimensional scanning on a specimen using a light beam; a photodetector unit for detecting a light from the specimen; an A/D converter for converting an output signal from the photodetector unit into a digital signal; a CPU for controlling the scanner unit and generating image data of the specimen from the digital signal output from the A/D converter; a display unit for displaying the image data; an external device for outputting an external signal; and a data storage unit, connected to the external device, for recording the time when the external signal is output. With the configuration, the data stored in the data storage unit can be read by the CPU.

Abstract: In a confocal laser microscope, a confocal image and a non-confocal image of an observation target are generated from light reflected by the observation target, and the confocal image and non-confocal image are displayed side by side on the same screen.

Abstract: An autofocus system according to the present invention comprises: a light source; a focusing illumination optical system that forms an optical image generated with light from the light source on a target object through an objective lens; a focusing image forming optical system that receives through the objective lens reflected light generated as the optical image is reflected off the target object and forms a reflected image of the optical image; a photoelectric converter that is provided at an image forming position at which the reflected image is formed by the focusing image forming optical system to detect the reflected image; a signal output device that outputs a signal for controlling a focus actuator based upon a signal corresponding to the reflected image obtained at the photoelectric converter; and an image forming position adjustment device that adjusts an offset quantity between a focus position of the objective lens and an image forming position of the optical image by moving at least one of the im

Abstract: Automated methods and systems for determining an in-focus-distance for a position on the surface of a molecular array substrate using a molecular array scanner are provided. A signal from a first position of an array substrate is detected and noise is filtered out of the detected signal using a symmetrical filter to produce an in-focus-distance. In one embodiment, the in-focus-distance is utilized as an estimated in-focus-distance at a second position of the array substrate. The method finds use in maintaining the focus of a light source while scanning the array by the scanner. Also provided are methods of assaying a sample using the methods and systems of the invention, and kits for performing the invention. The subject invention finds use in a variety of different applications, including both genomics and proteomics applications.

Abstract: A near-field scanning optical microscope (NSOM) laser micromachining system for laser machining features on surfaces using an ultrafast laser source and a method of laser machining such features. The system includes: the ultrafast laser source to generate pulses of laser light having pulse durations less than 1 ns and a peak wavelength; an NSOM probe having a substantially cylindrical shape; an NSOM mount to controllably hold the NSOM probe and the microstructure workpiece to be machined; an NSOM probe monitor coupled to the NSOM mount for determining the distance between the probe tip of the NSOM probe and the surface; and an NSOM controller coupled to the NSOM probe monitor, and motion stages in the NSOM mount. The NSOM mount includes an XY motion stage and a Z motion stage. These motion stages are couple to either the NSOM probe or the microstructure workpiece, or one motion stage to each.

Abstract: An apparatus for controlling optical power in a microscope includes a measuring device for measuring the optical power, and a control unit for controlling a high-frequency source as a function of the measured optical power so as to achieve a selectable level of the optical power. The microscope includes a source providing light along an illumination beam path to a sample, a detector receiving detection light lead along a detection beam path from the sample, and an acousto-optical or electro-optical element located in the illumination beam path and driven by the high-frequency source.

Abstract: The invention concerns a method and an apparatus for investigating layers (1) of tissues in living animals using a microscope (2). The microscope (2) is focused onto a layer (1), and images of the layer (1) are acquired or optical measurements are performed on it. Positional changes of the layer (1) are brought about by movements of the animal or of its organs. The positional changes are sensed, and corresponding signals are generated. The signals are stored, together with the corresponding images or measurement results, for later evaluation; or they are processed in such a way that the positional changes are compensated for in order to investigate the layer (1). As a result, the layer (1) can be qualitatively or quantitatively investigated microscopically, irrespective of the movement of the animal or its organs.

Abstract: A full-field imaging, long working distance, incoherent interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. A long working distance greater than 10 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-dimensional height profiles of MEMS test structures to be acquired across an entire wafer while being actively probed, and, optionally, through a transparent window. An optically identical pair of sample and reference arm objectives is not required, which reduces the overall system cost, and also the cost and time required to change sample magnifications. Using a LED source, high magnification (e.g., 50×) can be obtained having excellent image quality, straight fringes, and high fringe contrast.

Abstract: In case of irradiating a sample with laser beam, dispersing light emitted from the sample to a spectrum, and fetching and detecting from a wavelength band extraction portion light in at least one band area from the dispersed spectrum, when at least one of a plurality of optical elements arranged between the sample and the dispersive element is switched, a positional relationship between the wavelength band extraction portion and a spectrum image formation position which is displaced in a dispersion direction due to a change in angle of light entering the dispersive element.

Abstract: Auto focus systems and methods for a machine vision metrology and inspection system provide high speed and high precision auto focusing, while using relatively low-cost and flexible hardware. One aspect of various embodiments of the invention is that the portion of an image frame that is output by a camera is minimized for auto focus images, based on a reduced readout pixel set determined in conjunction with a desired region of interest. The reduced readout pixel set allows a maximized image acquisition rate, which in turn allows faster motion between auto focus image acquisition positions to achieve a desired auto focus precision at a corresponding auto focus execution speed that is approximately optimized in relation to a particular region of interest. In various embodiments, strobe illumination is used to further improve auto focus speed and accuracy. A method is provided for adapting and programming the various associated auto focus control parameters.

Abstract: An auto focus method for a microscope (2), and a system for adjusting a focus for the microscope (2), are disclosed. The microscope (2) possesses a microscope stage (18) and an objective (16) located in a working position. A relative motion in the Z direction takes place between the microscope stage (18) and the objective. Images are read in by the camera (20) during the relative motion, and a microscope control device (4) and a computer (6) are provided for evaluation and determination of the focus position.

Abstract: The invention provides an optical-scanning examination apparatus with a simple configuration, in which the resolution of acquired images can be freely changed and in which the fluorescence image intensity and examination depth can be adjusted to suit the purpose of examination. The optical-scanning examination apparatus includes a light source unit; a focusing lens for forming a first intermediate image of excitation light; an imaging lens; a first objective lens; an optical fiber bundle; a second objective lens; and an imaging unit for imaging return light that returns via the second objective lens, the optical fiber bundle, the first objective lens, and the imaging lens. In addition, a scanning mirror device, which is disposed at the first intermediate image position, is formed of a plurality of mirrors that simultaneously receive the first intermediate image and that can be selectively turned on and off.

Abstract: The scanning microscope includes an illumination beam path, microscope optics and at least one light source which generates an excitation light beam of a first wavelength and a second light beam of a second wavelength. Microscope optics are provided for focussing the excitation light beam onto a first focal region in a first plane of a sample and for focusing the second light beam onto a second focal region in a second plane of the sample. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.

Abstract: A method for generating a multicolor image of a specimen with a microscope is disclosed. The method comprises the step of determining the spacing of the focal planes of a first illuminating light beam that has a first wavelength and of a second illuminating light beam that has a second wavelength; the step of scanning the specimen with the first illuminating light beam and generating a first partial image; the step of performing a relative displacement, by an amount equal to the spacing, between the specimen and the focal plane of the illuminating light beam of the second wavelength; the step of scanning the specimen with the second illuminating light beam and generating a second partial image; and the step of superimposing the first and second partial images to yield the multicolor image. Further more a microscope and a confocal scanning microscope are disclosed.

Abstract: Tomographic methods and device for obtaining images of microscopic specimens such as Pap smears.

Abstract: The apparatus for automatically focusing an image in a microscope includes onto an object plane includes an optical system configured to form an optical image of a sample plane to be observed, an autofocusing detection system, and a focus correction system. The autofocusing system includes an autofocusing light beam source for generating autofocusing light beams. The autofocusing system further includes a detection system lens for directing autofocusing light beams to an autofocusing detection device, and an autofocusing detection device for determining the amount of displacement of the image of the object plane from a desired focused reference plane. The focusing correction system includes a feedback controller and focus adjusting device for automatically adjusting the distance between an objective lens and the sample plane in order to properly focus the image in the optical system. A related method of automatically focusing an image of an object plane in a microscope is also provided.

Abstract: A system and method are described herein for determining the quality of an optical material by measuring and analyzing birefringence (e.g., stress-induced birefringence, inherent birefringence) in the optical material (e.g., glass sheet). The method is a scanning technique in which a birefringence sensor is set to a first optical state and then moved in a direction at a constant velocity over a glass sheet while first power transmission measurements are made at a high data rate. At the end of this move, the birefringence sensor is set to a second optical state and then moved at the same velocity back over the glass sheet, while second power transmission measurements are made. This procedure is repeated the same number of times as there are optical states in the birefringence sensor. A computer then calculates birefringence values using profiles of the power transmission measurements so as to determine the quality of the glass sheet.

Abstract: A laser microscope includes a pulse laser which generates irradiation light having a pulse string, a laser scanner which irradiates a specimen by scanning the irradiation light on the specimen, a detector which detects emitted light generated from the specimen, a shutter which is inserted in an optical path of the irradiation light, and intercepts and transmits the irradiation light for a time period shorter than a scanning time during which a small region on the specimen is scanned, wherein the detector obtains a light amount for each scanning time, and a controller which controls the shutter to intercept a predetermined number of pulses of the pulse string of the irradiation light for each scanning time.

Abstract: A device with at least one light source, comprising several individual light sources (3, 3?) and an optical arrangement. At least two individual light sources (3, 3?) comprise a light-emitting surface with different, long axes perpendicular to each other. At least two individual light sources (3, 3?) form at least one individual light source grouping (4, 4?), which is arranged coaxially to the optical axis (5) of an astigmatic optical element (7). Said astigmatic optical element (7) is impinged upon by the emitted bundles (2) from the individual light sources. One axis of the emission surface of an individual light source (3) lies on the meridional plane of the astigmatic optical element (7). Said plane is defined through the mid-point of the emission surface. The other axis of the emission surface lies on the corresponding sagittal plane.

Abstract: In a laser scanning microscope comprising a deflecting device, which is provided for variable deflection of a laser beam about a deflection angle, and a control unit, which controls the deflecting device via a control signal and measures, at least temporarily, a present deflection angle value, it is envisaged that, at the time of measurement of the present deflection angle value, a testing structure, which comprises at least one structural element whose position is assigned to a predetermined deflection angle value, is arranged downstream of the deflecting device, a detecting device is provided, which emits a detection signal when the laser beam is directed to the structural element, and the control unit assigns the present control signal to the predetermined deflection angle value upon reception of the detection signal.

Abstract: A microscope apparatus has a sample table for supporting a sample and being mounted to undergo movement in a horizontal direction. A line sensor acquires a line image for each of a series of measuring positions of the sample in accordance with movement of the sample at a constant speed by one measuring width of the line sensor in the horizontal direction. An image processing device produces an image of the sample based on the line images acquired by the line sensor. A focusing device has a light-projecting member for projecting light onto the sample at a position forward of a leading side of an imaging range of the line sensor in the horizontal direction to prevent light reflected by the sample as a result of the projected light from being incident on and interfering with the line images acquired by the line sensor.

Abstract: The scanning microscope comprises an illumination beam path (41), microscope optics (37) and at least one light source (17, 21, 61, 67), which generates an excitation light beam (19, 63) of a first wavelength and an emission light beam (23, 69) of a second wavelength. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path (41) are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.

Abstract: The invention relates to an optical system for determining the distribution, environment, or activity of fluorescently labeled reporter molecules in cells for the purpose of screening large numbers of compounds for specific biological activity. The invention involves providing cells containing fluorescent reporter molecules in an array of locations and scanning numerous cells in each location with a fluorescent microscope, converting the optical information into digital data, and utilizing the digital data to determine the distribution, environment or activity of the fluorescently labeled reporter molecules in the cells. The array of locations may be an industry standard 96 well or 384 well microtiter plate or a microplate which is a microplate having a cells in a micropaterned array of locations. The invention includes apparatus and computerized method for processing, displaying and storing the data.

Abstract: The invention relates to reverse focusing and methods and systems which employ reverse focusing. In a particular example, an automated focusing microscope uses one or more reverse focusing steps to acquire a focused image. Computer programs having instructions for instructing a computer to acquire a focused image by reverse focusing are also included.

Abstract: A specimen processing system according to the present invention includes a plurality of specimen processing units each having flat sides and a specimen operating surface and operated singly. The specimen processing units have at least the same depth dimension, and the specimen operating surfaces of the specimen processing units have the same height dimension. The system further includes a coupling section for closely coupling the right and left sides of the specimen processing units to each other and a single driving control unit for controlling a related operation of all of the specimen processing units coupled to each other by the coupling section and a single operation of a designated one of the specimen processing units.

Abstract: A flexible shaft driven to rotate is inserted through a transparent sheath having pliability. By a fiber inserted through the inside thereof, low-coherence light is guided and is made to exit to a living-body tissue side which is an observation target through a lens and a prism forming an exit and entrance portion at the tip portion. Subsequently, the light reflected on the living-body tissue side is guided in order to produce an image. In that case, a positioning member for keeping the exit and entrance portion and the living-body tissue at a proper distance is formed at the tip portion of the sheath or the tip portion of an endoscope through which an optical probe is inserted and, therefore, a stable tomogram image can be produced.