With Voltage Or Current Signal Evaluation Patents (Class 324/713)
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Patent number: 8432149Abstract: The described embodiments may provide a chemical detection circuit with an improved signal-to-noise ration. The chemical detection circuit may include a current source, a chemical detection pixel, an amplifier and a capacitor. The chemical detection pixel may comprise a chemical-sensitive transistor that may have a first and second terminals and a row-select switch coupled between the current source and chemically-sensitive transistor. The amplifier may have a first input and a second input, with the first input coupled to an output of the chemically-sensitive transistor via a switch and the second input coupled to an offset voltage line. The capacitor may be coupled between an output of the amplifier and the first input of the amplifier. The capacitor and amplifier may form an integrator and may be shared by a column of chemical detection pixels.Type: GrantFiled: June 30, 2011Date of Patent: April 30, 2013Assignee: Life Technologies CorporationInventor: Peter Levine
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Patent number: 8432150Abstract: Methods are described for reading a chemically-sensitive field-effect transistor (chemFET) with an improved signal-to-noise ratio. In one embodiment, a method is described for reading a chemFET having a first terminal and a second terminal, and a floating gate coupled to a passivation layer. The method includes biasing the first terminal of the chemFET to a first bias voltage during a read interval. The second terminal of the chemFET is coupled to a data line during the read interval. A current is induced through the chemFET via the data line. An output signal proportional to an integral of a voltage or current on the data line is generated in response to the induced current through the chemFET during the read interval.Type: GrantFiled: March 15, 2012Date of Patent: April 30, 2013Assignee: Life Technologies CorporationInventor: Peter Levine
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Publication number: 20130099807Abstract: This disclosure provides systems, methods and apparatus for detecting an impedance of a wireless power transmitter load. In one aspect, a method of determining a reactive condition of a wireless power transmitter apparatus is provided. The method comprises determining a value correlated to a voltage of a drain of a switching element of a driver circuit of the wireless power transmitter. The method further comprises determining a reactance load change based on the determined voltage.Type: ApplicationFiled: October 5, 2012Publication date: April 25, 2013Applicant: QUALCOMM INCORPORATEDInventor: QUALCOMM Incorporated
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Publication number: 20130093444Abstract: Provided is a system and associated method for detecting a resistance of a cable. An example method may comprise applying power to a first end of a first and a second conductive pair of the cable, measuring a first voltage across the first end of the first and second conductive pairs of the cable, applying a current source across the first end of a third and a fourth conductive pair of the cable, measuring a second voltage across the current source, and determining a resistance of the cable using the measured first and second voltages. This method may be carried out in a physical arrangement where a second end of the first, second, third and fourth conductive pairs of the cable are connected to a first, a second, a third and a fourth input terminal of a powered device, respectively.Type: ApplicationFiled: October 18, 2011Publication date: April 18, 2013Applicant: BROADCOM CORPORATIONInventors: Sanjaya MANIKTALA, Sesha PANGULURI
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Patent number: 8421438Abstract: Apparatuses and methods for diffusion sensing are disclosed. In one embodiment, an apparatus includes a complimentary metal oxide semiconductor (CMOS) switch and a switch sense block. The switch includes a gate, a drain, a source, and a well. The source and drain are formed in the well. The gate is formed adjacent the well between the source and drain, and the source is configured to receive a bias voltage from a power amplifier. The switch sense block is configured to measure a signal indicative of the voltage of at least one of the source or drain voltage of the switch and to generate an output signal based on the measurement.Type: GrantFiled: July 27, 2010Date of Patent: April 16, 2013Assignee: Skyworks Solutions, Inc.Inventors: Ryan M Pratt, Karl J Couglar, David K Homol
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Patent number: 8421437Abstract: Circuits are described for reading a chemically-sensitive field-effect transistor (chemFET) with an improved signal-to-noise ratio. In one embodiment, a device is described that includes a chemFET including a first terminal and a second terminal, and a floating gate coupled to a passivation layer. An integrator circuit is coupled to the second source/drain terminal of the chemFET via a data line. The integrator circuit applies a bias voltage to the data line during a read interval, thereby inducing a current through the chemFET based on a threshold voltage of the chemFET. The integrator circuit then generates an output signal proportional to an integral of the induced current through the chemFET during the read interval.Type: GrantFiled: March 15, 2012Date of Patent: April 16, 2013Assignee: Life Technologies CorporationInventor: Peter Levine
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Patent number: 8415962Abstract: An electric security fence. An electric signal generator generates an initial electric signal. The generated initial electric signal is transmitted through a transmission line. The transmission line will generate a reflected electric signal when the transmission line is disturbed by the presence of a human or animal at a disturbance area. A receiver receives the reflected electric signal and forwards it to a signal processing unit. The signal processing unit calculates the location of the disturbance area after receiving the reflected electric signal. In one preferred embodiment, the signal processing unit calculates the location of the disturbance area by determining the amount of time required for the reflected signal to travel from the disturbance area.Type: GrantFiled: November 26, 2010Date of Patent: April 9, 2013Inventors: Xuekang Shan, Jin Hao, Runbao Hao
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Patent number: 8410801Abstract: A pressure detection apparatus has a pressure-sensitive resistor whose first resistance varies according to pressure and a change of its own temperature, a temperature-sensitive resistor which has a same resistance-temperature coefficient as the pressure-sensitive resistor and whose second resistance varies according to the change of the temperature, a current source supplying first and second constant-currents to the pressure-sensitive and temperature-sensitive resistors respectively, and a pressure signal generation output section. The current source adjusts the first and second constant-currents so that when the pressure is an initial pressure, a reference first voltage appearing across the pressure-sensitive resistor and a reference second voltage appearing across the temperature-sensitive resistor become equal to each other.Type: GrantFiled: September 30, 2009Date of Patent: April 2, 2013Assignee: NGK Spark Plug Co., LGDInventors: Toshiyuki Matsuoka, Yuzo Higuchi, Yoshinori Tsujimura, Takio Kojima
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Patent number: 8405411Abstract: A method for controlling an induction apparatus having an induction coil. In one implementation the induction apparatus includes a capacitor that is connected in parallel with the induction coil to form a parallel resonant circuit, and also includes a switch connected in series with the parallel resonant circuit, between the parallel resonant circuit and a reference voltage. According to one method, a digital test signal dependent on the voltage in a node disposed between the switch and the parallel resonant circuit is generated, the switch is closed for a predetermined closure time and then reopened at the end of the closure time. With the switch reopened, the test signal is evaluated for a predetermined waiting time in order to determine the presence or absence of a vessel on the induction coil.Type: GrantFiled: August 4, 2010Date of Patent: March 26, 2013Assignee: Coprecitec, S.L.Inventors: Gonzalo José Fernández Llona, Javier Rubiales Garrido
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Publication number: 20130069677Abstract: A phasing voltage meter comprises first and second probes. Each probe comprises an insulated shield supporting an electrode for contacting a high voltage electrical conductor. The shield houses a high voltage resistor connected in series with the electrode. A capacitance formed by a metallic collar across the resistor compensates for stray capacitance across the resistor. A meter comprises a housing enclosing electrode circuit for measuring phasing voltage. The electrical circuit measures voltage across the electrodes and provides an output representing phasing voltage.Type: ApplicationFiled: September 19, 2011Publication date: March 21, 2013Inventor: Vasu MOGAVEERA
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Patent number: 8395371Abstract: Various methods are described to characterize interferometric modulators or similar devices. Measured voltages across interferometric modulators may be used to characterize transition voltages of the interferometric modulators. Measured currents may be analyzed by integration of measured current to provide an indication of a dynamic response of the interferometric modulator. Frequency analysis may be used to provide an indication of a hysteresis window of the interferometric modulator or mechanical properties of the interferometric modulator. Capacitance may be determined through signal correlation, and spread-spectrum analysis may be used to minimize the effect of noise or interference on measurements of various interferometric modulator parameters.Type: GrantFiled: September 30, 2008Date of Patent: March 12, 2013Assignee: QUALCOMM MEMS Technologies, Inc.Inventor: Alok Govil
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Patent number: 8384404Abstract: Described herein are processes and apparatuses for preparation and optimization of photovoltaic films and film stacks with application of electrical pulses. The process achieves high photovoltaic efficiency upon application of conditioning electrical pulses to the stack or layers of deposited photovoltaic films. This may be done at manufacture, or in the field at certain time intervals. The films of photovoltaic devices may be optimized by application of programmed voltage pulses. Furthermore, it is possible to deliver larger portion of energy from the pulse to a particular layer of a multi-stack film by rendering one or more layers of the film relatively more conductive using exposure to selected narrow wavelength of light corresponding to the band gap of the particular layer.Type: GrantFiled: August 24, 2010Date of Patent: February 26, 2013Assignee: YewSavin, Inc.Inventor: Makarand Prabhakar Gore
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Patent number: 8384403Abstract: In a system or method to detect an electrical potential and layer thickness of a layer of toner particles in a printer or copier, a measurement arrangement is provided having a first electrode and at least one second electrode situated opposite the first electrode. An intermediate image carrier is provided on a surface of which a toner image is generated. A drive unit drives the intermediate image carrier so that its surface is directed past the first electrode situated opposite the surface. An evaluation unit is electrically connected with the first electrode. The evaluation unit detects an electrical current flowing between the first electrode and the evaluation unit. The evaluation unit determines an electrical charge of toner particles arranged in a detection region in a first measurement procedure with aid of the detected current. The evaluation unit also determines the layer thickness of the layer of toner particles in an inked region via at least one second measurement procedure.Type: GrantFiled: February 20, 2008Date of Patent: February 26, 2013Assignee: Océ Printing Systems GmbHInventors: Alfred Zollner, Markus Jeschonek
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Patent number: 8377518Abstract: In-situ flux measurement methods, devices, and systems are provided. According to some embodiments, an in-situ molecular flux device generally comprises a electrically conductive container configured to hold a precursor material, a heat source proximate the electrically conductive container to heat the precursor material to release ions such that an ion current is produced; and a current-measuring device in electrical communication with the electrically conductive container to measure the ion current associated with the heated precursor material. Other embodiments are also claimed and described.Type: GrantFiled: August 15, 2012Date of Patent: February 19, 2013Assignee: Georgia Tech Research CorporationInventors: W. Alan Doolittle, Alexander G Carver
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Publication number: 20130038340Abstract: A measurement apparatus comprising a serial resistor in series with an element under measurement; a switching section that sequentially selects ends of a serial circuit including the element under measurement and the serial resistor, and ends of the serial resistor; an applying section that applies an application voltage or application current corresponding to a preset setting value, to each of the sequentially selected ends; a measuring section that, for each of the sequentially selected ends, measures current when the applying section applies the application voltage corresponding to the setting value and measures voltage when the applying section applies the application current corresponding to the setting value; and a resistance calculating section that calculates the resistance value of the element under measurement, based on either the setting values set sequentially in the applying section or measured values measured sequentially by the measuring section for each of the sequentially selected ends.Type: ApplicationFiled: September 14, 2012Publication date: February 14, 2013Applicant: ADVANTEST CORPORATIONInventor: Noriyuki MASUDA
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Publication number: 20130038341Abstract: In one possible implementation, a method is provided for determining contactor health including measuring a differential voltage between a first utility line voltage and a second utility line voltage on a primary side of a contactor and on a secondary side of the contactor. The measuring is performed with both an unloaded current and with a load current. The unloaded and loaded measurements are performed at the primary side and the secondary side, and are made with the contactor closed. It includes determining a difference between a secondary unloaded voltage and a secondary loaded voltage and subtracting a difference between a primary unloaded voltage and a primary loaded voltage to provide a contactor voltage drop. The contactor resistance is determined by dividing the contactor voltage drop by the loaded current.Type: ApplicationFiled: October 18, 2012Publication date: February 14, 2013Inventor: Albert Flack
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Patent number: 8368411Abstract: The invention relates to a method for the determination of diffusion coefficients and/or exchange coefficient of a material having electronic and ionic conductivity. The material is permeable to at least one gas. It is the object of the invention to provide a cost-effective, accurate method for the determination of the diffusion coefficient and of the surface exchange coefficient which can be carried out in a short time and can thus be used for a screening of materials, in particular for application in the field of permeation membranes. The procedure is followed in accordance with the invention such that a sample of the material is arranged in a measurement chamber and has an electric current passed through it for a determination of the electric resistance. In this respect, a gas mixture in which the respective gas is contained is conducted through the measurement chamber as a gas flow and the partial pressure of the respective gas in the gas mixture is changed periodically at regular intervals.Type: GrantFiled: July 28, 2008Date of Patent: February 5, 2013Assignee: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.VInventors: Mihails Kusnezoff, Steffen Ziesche, Anne Paepke
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Patent number: 8362790Abstract: There is provided an alternating current (AC) detection circuit for a power supply, the circuit including: a rectifying part rectifying an AC voltage; a voltage division part dividing the voltage rectified by the rectifying part according to a preset division ratio; a voltage stabilization circuit part stabilizing the voltage divided by the voltage division part; a comparing part comparing the voltage stabilized by the voltage stabilization circuit part with an internal reference voltage and generating an input detection signal when the stabilized voltage is higher than the internal reference voltage; and an output part outputting an AC detection signal when the input detection signal is inputted from the comparing part.Type: GrantFiled: December 2, 2009Date of Patent: January 29, 2013Assignee: Samsung Electro-Mechanics Co., Ltd.Inventors: Sung Uk Lee, Dong Kyun Ryu, Kyung Hyun Kim, Seung Heun Yang, Tai Sung Kim, Jae Han Yoon, Peel Sik Jeon, Yun Seop Shin, Kyung Su Han
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Patent number: 8359176Abstract: A method and apparatus for preventing photovoltaic (PV) cell reverse breakdown during operation of a PV module. In one embodiment, the method comprises determining a first temperature value; and restricting an operating voltage of the PV module based on the first temperature value.Type: GrantFiled: March 21, 2011Date of Patent: January 22, 2013Assignee: Enphase Energy, Inc.Inventor: Martin Fornage
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Patent number: 8358138Abstract: PDs that can be supplied through the LAN line are discriminated from PDs that cannot be so supplied as a function of the resistance of the supply line and of the voltage drop caused by nonlinear elements in series therewith. The values of these two parameters are estimated by applying two distinct voltages to the supply terminals of the LAN line and sensing the relative steady-state currents absorbed by the power supply line, and by processing voltage and current values for estimating the resistance of the line and the voltage drop caused by nonlinear elements connected in series therewith.Type: GrantFiled: November 6, 2009Date of Patent: January 22, 2013Assignee: STMicroelectronics S.R.L.Inventors: Aldo Torazzina, Riccardo Russo
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Patent number: 8356191Abstract: A method and apparatus are provided for determining resistive power loss through a channel between Power Sourcing Equipment (PSE) and a Powered Device (PD). The method includes (1) receiving indication that a PSE signal measurement is available from the PSE or a PD signal measurement is available from the PD, (2) selecting, as an input parameter to a processing operation, at least one of the PSE signal measurement or the PD signal measurement, (3) performing the processing operation to calculate a resistance value indicative of the resistive power loss through the channel between the PSE and PD based on the input parameter, and (4) outputting the resistive power loss value as a result of carrying out the processing operation.Type: GrantFiled: October 5, 2010Date of Patent: January 15, 2013Assignee: Cisco Technology, Inc.Inventor: Frederick R. Schindler
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Publication number: 20130009655Abstract: An apparatus and method make use of a single shunt and two or more instrumentation amplifiers, switchably measuring voltages at the shunt. This permits current measurement. At times each instrumentation amplifier has its input shorted, which permits zeroing out many sources of offset in the signal path of that amplifier. Dynamic range is several orders of magnitude better than known current measurement approaches, permitting coulometry.Type: ApplicationFiled: December 7, 2011Publication date: January 10, 2013Applicant: SENDYNE CORPORATIONInventor: Victor Marten
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Publication number: 20120326736Abstract: A detection circuit can be configured to receive a digital value from an identification register and to determine a resistance at a conducting terminal of an audio or video jack plug using the digital value. The detection circuit can include a current source that outputs a current according to the digital value from the identification register and a comparator that compares a reference voltage to a voltage created by the current source across the resistance at the conducting terminal of the audio or video jack plug. A control logic circuit can be configured to store the digital value in the identification register, generate an interrupt signal to cause a processor to read the digital value, and identify a function of an accessory device including the audio or video jack plug, when the detection circuit determines the resistance at the conducting terminal of the audio or video jack plug.Type: ApplicationFiled: August 13, 2012Publication date: December 27, 2012Applicant: Fairchild Semiconductor CorporationInventors: Peter Chadbourne, Gregory A. Maher, James A. Siulinski
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Publication number: 20120313654Abstract: A voltage detection method for detecting a voltage source includes generating a first voltage with a first negative temperature coefficient, wherein the first voltage is related to the voltage source, generating a second voltage with a second negative temperature coefficient, wherein the second voltage is related to the voltage source, and through a comparator to connect the first voltage and the second voltage, for generating a detection result voltage without temperature coefficient according to a voltage difference between the first voltage and the second voltage, and the relationship that the first negative temperature coefficient is equivalent to the second negative temperature coefficient, to perform the voltage detection.Type: ApplicationFiled: June 6, 2012Publication date: December 13, 2012Inventor: Cheng-Hung Chen
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Publication number: 20120306516Abstract: According to an embodiment, the threshold value generation unit generates a setting voltage and converts the setting voltage to a first current. One end of the first resistor is connected to a detection terminal. When a voltage applied to the detection terminal is greater than or equal to a predetermined factor times the voltage of the higher voltage source, the detection unit causes a constant detection terminal input current to flow from the detection terminal to the first resistor. When the voltage at the detection terminal is less than the predetermined factor times the voltage of the higher voltage source, a higher voltage source voltage is outputted to a detection output terminal, while the voltage at the detection terminal is greater than or equal to the predetermined factor times the voltage of the higher voltage source, a lower voltage source voltage is outputted to the detection output terminal.Type: ApplicationFiled: March 13, 2012Publication date: December 6, 2012Applicant: Kabushiki Kaisha ToshibaInventor: Masaji UENO
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Patent number: 8324914Abstract: Techniques for characterizing a molecule are described herein. In one example, a portion of the molecule is trapped in a nanopore, a variable voltage is applied across the nanopore until the trapped portion of molecule is moved within the nanopore, and the molecule is characterized based on the electrical stimulus required to affect movement of at least a portion of the trapped portion of the molecule within the nanopore.Type: GrantFiled: February 8, 2010Date of Patent: December 4, 2012Assignee: Genia Technologies, Inc.Inventors: Roger Chen, Randy Davis
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Patent number: 8319600Abstract: A monitoring system includes a controller, a number of input devices, a number of first sensors, a number of second sensors, and a number of alarms. Each input device comprises a switching circuit, an input circuit, and a connector. The connector is connected to a first sensor and a voltage source in series or connected to a second sensor and a current source in series. The controller controls the switching circuit of the input device to receive a voltage signal of the first sensor or a current signal of the second sensor and send out a corresponding detection signal. The input circuit transmits the detection signal to the controller. The controller controls the corresponding alarm to work according to the detection signal.Type: GrantFiled: May 18, 2010Date of Patent: November 27, 2012Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Ming-Chih Hsieh
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Patent number: 8319507Abstract: A system and method for sensing a load current that flows from an amplifier into a load of the amplifier involves obtaining a voltage drop across internal impedance of the amplifier and computing the load current using the internal impedance and the voltage drop across the internal impedance.Type: GrantFiled: February 8, 2010Date of Patent: November 27, 2012Assignee: NXP B.V.Inventor: Temujin Gautama
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Patent number: 8314679Abstract: A monitoring system includes a controller, a number of input devices, a number of digital sensors, a number of analog sensors, and a number of alarms. Each input device comprises a switching circuit, an input circuit, and a connector. The connector is connected to a digital sensor or connected to an analog sensor and a first power source in series. The controller controls the switching circuit of the input device to receive a digital signal of the digital sensor or an analog signal of the analog sensor and output a corresponding detection signal. The input circuit transmits the detection signal to the controller. The controller controls the corresponding alarm to work according to the detection signal.Type: GrantFiled: May 18, 2010Date of Patent: November 20, 2012Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Ming-Chih Hsieh
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Patent number: 8310251Abstract: A method and system for assessment of a pipe (110) is provided. The system can include a probe (100) having first (120) and second (130) electrodes and a processor (200) in communication with the probe (100). The probe (100) can be in a medium (140) proximate to a section of the pipe (110) to be analyzed. The section of the pipe (110) can have a coating (115) thereon. The processor (200) can measure a difference in potential between the first (120) and second (130) electrodes. The processor (200) can determine a local impedance with respect to the section of the pipe (110) based at least in part on the difference in potential. The processor (200) can evaluate a condition of the coating (115) on the section of the pipe (110) based at least in part on the local impedance or a parameter derived from the local impedance.Type: GrantFiled: January 3, 2008Date of Patent: November 13, 2012Assignee: University of Florida Research Foundation, Inc.Inventor: Mark E. Orazem
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Patent number: 8310326Abstract: Example methods include calculating a first number of turns of a shield winding included in an energy transfer element of a power supply. A first number of turns of the shield winding is calculated for the power supply to have a low noise current in an input conductor of the power supply. The method then includes increasing the first number of turns to a second number of turns. The power supply is then operated, which generates a first voltage waveform of a voltage between the input conductor and an output conductor of the power supply. An impedance is then inserted between the shield winding and the input conductor. The noise current is reduced by adjusting a value of the impedance until a second voltage waveform of the voltage between the input conductor and the output conductor reverses polarity to be the opposite of a polarity of the first voltage waveform.Type: GrantFiled: February 29, 2012Date of Patent: November 13, 2012Assignee: Power Integrations, Inc.Inventor: Marvin C. Espino
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Patent number: 8305096Abstract: An apparatus and method for measuring and monitoring layer properties in web-based processes are described. The apparatus includes multiple electrode devices adjacently positioned on a surface of a web material, which advances with a predetermined speed. The electrode devices perform measurements of electrical parameters of a layer of the web material and provide an electrical signal to a layer deposition system for further adjustment of layer properties of the layer.Type: GrantFiled: October 30, 2006Date of Patent: November 6, 2012Assignee: Hewlett-Packard Development Company, L.P.Inventors: Warren Jackson, Carl Taussig
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Patent number: 8305095Abstract: A voltage measurement device for connection to a primary voltage dividing element provided between ground and an electrically conducting element in a system for controlling an electrical process and such a system. The device includes at least one first branch of secondary voltage dividing elements, where the branch is adapted to be connected in parallel with the primary voltage dividing element, and a first measuring unit connected to one of the secondary voltage dividing elements of the first branch and arranged to measure the voltage across this secondary voltage dividing element and provide a first voltage signal corresponding to a voltage of the electrically conducting element.Type: GrantFiled: June 2, 2008Date of Patent: November 6, 2012Assignee: ABB Technology AGInventors: Hans Björklund, Krister Nyberg
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Patent number: 8305094Abstract: The resistance measuring device of the present invention includes switch transistors and switch conductive lines disposed between the bonding pads on a first substrate and between the bumps on a second substrate, such that the bonding pads and the bumps are conducted when the transistors are turned on, and the bonding resistance between at least one of the bonding pads and its corresponding bump can be directly measured.Type: GrantFiled: September 6, 2009Date of Patent: November 6, 2012Assignee: Chunghwa Picture Tubes, Ltd.Inventor: Hsi-Ming Chang
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Publication number: 20120274343Abstract: The invention relates to a method for measuring the electrical resistance of a glow plug, wherein a test current is set by closed-loop control to a constant value using a constant-current source, and is directed through the plug. A value of the electrical resistance of the glow plug is determined by evaluating a feedback signal of the constant-current source.Type: ApplicationFiled: April 25, 2012Publication date: November 1, 2012Inventor: Peter SCHAEFER
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Publication number: 20120268147Abstract: A structure for measuring bump resistance and a package substrate comprising the same are disclosed, the structure for measuring bump resistance of the present invention comprises: plural connecting bumps arranged in a row; at least one first connecting element; and at least one second connecting element; wherein the nth connecting bump and the (n+1)th connecting bump connect by the first connecting element, the (n+1)th connecting bump and the (n+2)th connecting bump connect by the second connecting element, n is an odd number of 1 or more; the first connecting element connects with a first voltage-measurement pad; the second connecting element connects with an auxiliary pad, the auxiliary pad connects with an auxiliary bump, a second voltage-measurement pad connects with the auxiliary bump.Type: ApplicationFiled: September 23, 2011Publication date: October 25, 2012Inventors: Chih CHEN, Yuan-Wei Chang
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Patent number: 8289037Abstract: A method and an apparatus to measure current in power switching supplies are disclosed for simplification of in-circuit measurement. The method and apparatus to measure current include a sensing capacitor, which in series with a resistor, is placed across the output inductor of the power supply in order to utilize the parasitic resistance of the inductor, in conjunction with a measurement controller which performs initial calibration and temperature compensation. Initial and secondary measurements are performed using an adjustable current sink in order to eliminate thermal effects. The method and apparatus to measure current in power switching supplies are particularly useful for overcoming invasive measurement techniques for measuring current known in the art.Type: GrantFiled: September 30, 2009Date of Patent: October 16, 2012Assignee: Alcatel LucentInventors: Rami Labib, Marcos Vivas
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Patent number: 8289012Abstract: The invention relates to a signal transmission/reception device (DER) which can cooperate with an antenna device (A) capable of emitting a magnetic field. The invention is characterized in that the device (DER) comprises the following elements for transmission, namely: a power stage (P) for sending a symmetrical square-wave voltage signal (U0) to the input of the antenna device (A) in order to supply same with a current that can be used to generate the emitted magnetic field; and a current measuring stage (C) for measuring the current circulating in the antenna device (A). The invention is suitable for motor vehicles.Type: GrantFiled: December 21, 2007Date of Patent: October 16, 2012Assignee: Valeo Securite HabitacleInventors: Eric Leconte, Stéphane Violleau, Michael Notarianni
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Patent number: 8283937Abstract: A monitoring system includes a controller, a number of sensors, a number of alarms, and a number of input/output devices. Each input/output device is connected between the controller and a sensor or an alarm. Each input/output device includes an input circuit, an output circuit, and a connector to selectively connect to the sensor or the alarm. The input circuit and the output circuit are connected between the controller and the connector. The controller controls status of the input circuit and the output circuit. When the connector is connected to the alarm, the controller controls the alarm to work via the output circuit. When the connector is connected to the sensor, the sensor outputs a detection signal to the controller via the input circuit.Type: GrantFiled: April 30, 2010Date of Patent: October 9, 2012Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Ming-Chih Hsieh
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Patent number: 8283938Abstract: A monitoring system includes a controller, a number of input and output devices, a number of sensors, and a number of electronic devices. Each input and output device includes a switching circuit, a first input circuit, a second input circuit, and a connector. The connector is connected to a sensor or an electronic device. The controller controls the switching circuit to receive a detecting signal of the sensor or supply power to the electronic device. The first input circuit and the second input circuit are connected between the switching circuit and the controller.Type: GrantFiled: May 18, 2010Date of Patent: October 9, 2012Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Ming-Chih Hsieh
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Publication number: 20120249160Abstract: After planarization of a gate level dielectric layer, a dummy structure is removed to form a recess. A first conductive material layer and an amorphous metal oxide are deposited into the recess area. A second conduct material layer fills the recess. After planarization, an electrical antifuse is formed within the filled recess area, which includes a first conductive material portion, an amorphous metal oxide portion, and a second conductive material portion. To program the electrical antifuse, current is passed between the two terminals in the pair of the conductive contacts to transform the amorphous metal oxide portion into a crystallized metal oxide portion, which has a lower resistance. A sensing circuit determines whether the metal oxide portion is in an amorphous state (high resistance state) or in a crystalline state (low resistance state).Type: ApplicationFiled: June 14, 2012Publication date: October 4, 2012Applicants: FREESCALE SEMICONDUCTOR, INC., INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Satya N. Chakravarti, Dechao Guo, Chuck T. Le, Byoung W. Min, Rajeevakumar V. Thekkemadathil, Keith Kwong Hon Wong
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Patent number: 8278950Abstract: A circuit and method for monitoring current flow to an integrated circuit (IC), alone or mounted on a substrate, in a temperature-compensated manner. In accordance with a preferred embodiment, a plurality of resistances having substantially equal temperature coefficients establishes a ratio of an output voltage and an internally measured voltage, with the output voltage corresponding to a voltage drop across an inherent resistance within the IC or on the substrate.Type: GrantFiled: March 3, 2010Date of Patent: October 2, 2012Assignee: ATI Technologies ULCInventor: Shahin Solki
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Patent number: 8274299Abstract: Various methods are described to characterize interferometric modulators or similar devices. Measured voltages across interferometric modulators may be used to characterize transition voltages of the interferometric modulators. Measured currents may be analyzed by integration of measured current to provide an indication of a dynamic response of the interferometric modulator. Frequency analysis may be used to provide an indication of a hysteresis window of the interferometric modulator or mechanical properties of the interferometric modulator. Capacitance may be determined through signal correlation, and spread-spectrum analysis may be used to minimize the effect of noise or interference on measurements of various interferometric modulator parameters.Type: GrantFiled: September 30, 2008Date of Patent: September 25, 2012Assignee: QUALCOMM MEMS Technologies, Inc.Inventor: Alok Govil
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Patent number: 8264247Abstract: The present invention provides an electric potential sensor for the measurement of potentials non-invasively. The sensor comprises at least one detection electrode arranged for capacitive coupling with a sample under test and for generating a measurement signal, and a sensor amplifier adapted to receive the measurement signal as input and to supply an amplified detection signal as output. Input impedance enhancing means are included for providing a high input impedance to the sensor amplifier for increasing the sensitivity of the electrode to reduced electric potentials, and a discrete pre-amplifier stage is arranged to co-operate with the sensor amplifier to reduce the input capacitance of the amplifier.Type: GrantFiled: February 13, 2007Date of Patent: September 11, 2012Assignee: University of SussexInventors: Robert Prance, Christopher Harland
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Publication number: 20120223728Abstract: The present subject matter refers to apparatus and methods for identifying a resistance level of a resistor. In an example, circuit configured to identify a resistor can include a plurality of current sources, each current source selectively coupled to the resistor to generate a resistor voltage, a comparator configured to compare the resistor voltage and a reference voltage, and to provide an output indicative of the comparison, and a controller configured to selectively couple a first one or more current sources of the plurality of current sources to the resistor, and to selectively couple a second one or more current sources of the plurality of current sources to the resistor in response to the output indicative of the comparison.Type: ApplicationFiled: May 11, 2012Publication date: September 6, 2012Applicant: Fairchild Semiconductor CorporationInventors: Hrvoje Jasa, Gregory A. Maher
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Patent number: 8258800Abstract: Various methods are described to characterize interferometric modulators or similar devices. Measured voltages across interferometric modulators may be used to characterize transition voltages of the interferometric modulators. Measured currents may be analyzed by integration of measured current to provide an indication of a dynamic response of the interferometric modulator. Frequency analysis may be used to provide an indication of a hysteresis window of the interferometric modulator or mechanical properties of the interferometric modulator. Capacitance may be determined through signal correlation, and spread-spectrum analysis may be used to minimize the effect of noise or interference on measurements of various interferometric modulator parameters.Type: GrantFiled: September 30, 2008Date of Patent: September 4, 2012Assignee: QUALCOMM MEMS Technologies, Inc.Inventor: Alok Govil
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Patent number: 8253421Abstract: An impedance measurement method for circuits that has multiple power supply ports and a common ground shared by the multiple power supply ports, that includes finding multiple mutual impedances; finding approximate values for the ground impedance from the multiple mutual impedances; calculating multiple power supply port impedances from the approximate ground impedance values; and generating an equivalent circuit for the applicable circuit based on the ground impedances.Type: GrantFiled: January 5, 2010Date of Patent: August 28, 2012Assignee: Renesas Electronics CorporationInventor: Ryuichi Oikawa
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Publication number: 20120212243Abstract: A circuit has a first sense resistor circuit having components including a first-circuit active element to provide a sense resistance to sense a current in a load in series therewith, the sense resistance being established by an input command voltage. A second sense resistor circuit has components replicating the components of the first sense resistor circuit including a replicated active element, a resistance of the replicated active element also being established by the input command voltage. A precision resistor is coupled to the replicated active element to provide a load thereto. When the input command voltage establishes a voltage across the replicated active element, a voltage is established across the first-circuit active element in proportion thereto to command a desired current in the load.Type: ApplicationFiled: February 23, 2011Publication date: August 23, 2012Applicant: Texas Instruments IncorporatedInventor: Robert Alan Neidorff
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Patent number: 8237458Abstract: The present invention relates to electromigration testing and evaluation methods and apparatus for a device under test with an interconnect structure. The method comprises forcing the occurrence of a step resistance-increase of the interconnect structure due to electromigration in the first layer and subsequently subjecting the interconnect structure to at least three respective predetermined stress conditions while concurrently measuring a test quantity indicative of an electrical resistance of the interconnect structure. The method allows performing an electromigration test in much shorter time than known electromigration testing methods, without loss of information or accuracy. It is therefore possible to accelerate the optimization of the interconnect manufacturing process so that the conductor electromigration kinetics remains compatible with a required product lifetime.Type: GrantFiled: March 27, 2008Date of Patent: August 7, 2012Assignee: NXP B.V.Inventor: Xavier Federspiel
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Patent number: 8237457Abstract: After planarization of a gate level dielectric layer, a dummy structure is removed to form a recess. A first conductive material layer and an amorphous metal oxide are deposited into the recess area. A second conduct material layer fills the recess. After planarization, an electrical antifuse is formed within the filled recess area, which includes a first conductive material portion, an amorphous metal oxide portion, and a second conductive material portion. To program the electrical antifuse, current is passed between the two terminals in the pair of the conductive contacts to transform the amorphous metal oxide portion into a crystallized metal oxide portion, which has a lower resistance. A sensing circuit determines whether the metal oxide portion is in an amorphous state (high resistance state) or in a crystalline state (low resistance state).Type: GrantFiled: July 15, 2009Date of Patent: August 7, 2012Assignees: International Business Machines Corporation, Freescale Semiconductor, Inc.Inventors: Satya N. Chakravarti, Dechao Guo, Chuck T. Le, Byoung W. Min, Thekkemadathil V. Rajeevakumar, Keith Kwong Hon Wong