With Voltage Or Current Signal Evaluation Patents (Class 324/713)
  • Patent number: 7663382
    Abstract: Systems and methods according to aspects of the present invention are described. The systems and methods enable charging, soaking, and measuring of capacitors to be conducted quickly. Charging and soaking typically occurs in parallel and certain embodiments facilitate the measuring of capacitor leakage by sequentially disconnecting each capacitor and measuring the time for voltage on the capacitor to reach a predetermined threshold. Further, all capacitors can be disconnected from a charging source simultaneously and voltages can be measured for each capacitor simultaneously. Monitoring can be periodic in nature. Substantial time savings in the calculation device of leakage values and parameters can be attained.
    Type: Grant
    Filed: January 29, 2007
    Date of Patent: February 16, 2010
    Assignee: Rudolph Technologies, Inc.
    Inventors: Charles Corulli, Gregory Olmstead, Donald B. Snow
  • Patent number: 7663323
    Abstract: A monitoring device for monitoring an array (4) of electrical units, in particular an array of high capacity light emitting diodes (LEDs) (4.1-4.12). The electrical units are connected in series and driven by a constant electric current (I). The monitoring device has a bypass means (4.1a-4.12a) for each electrical unit (4.1-4.12), operable to bypass the respective electrical unit in case of a disconnection of the respective electrical unit, and an evaluation unit (3) connected in parallel with the array (4) of electrical units, said evaluation unit (3) being adapted to determine a total voltage (UT) of the array (4) of electrical units and to output a control signal (CS) indicative of a function status of the array (4) of electrical units in accordance with a value of the total voltage (UT) relative to a predetermined threshold value (VREF). Thus is provided an electric circuitry which allows an easy and reliable detection of a malfunction of the array of electrical units, e.g.
    Type: Grant
    Filed: October 20, 2006
    Date of Patent: February 16, 2010
    Assignee: Alcatel Transport Solution Deutschland GmbH
    Inventor: Heinz Telefont
  • Patent number: 7641777
    Abstract: A connector for establishing electrical connection between a testing device and a test strip with a biological fluid thereon includes a contact pad on the test strip, and one or more contact wires in the testing device. When the strip is inserted into the testing device, the end of the strip engages with a bight in the contact wire, pushing the contact wire in a direction normal to the direction of insertion. The movement of the contact wire forces a second portion of the wire against a part of the housing, thereby deforming the wire and moving another portion of the wire toward the contact pad. Some embodiments of the invention include 4, 6, 8, 15, or more contacts, which may be situated so as to receive the end of the test strip substantially simultaneously, or may be staggered in 2, 3, or more rows to spread out the resistance to movement presented.
    Type: Grant
    Filed: September 7, 2004
    Date of Patent: January 5, 2010
    Assignee: Roche Diagnostics Operations, Inc.
    Inventors: Abner D. Joseph, Jack Schlanser
  • Publication number: 20090322358
    Abstract: A resistance measuring apparatus includes: a voltage injector that injects an AC signal into a circuit by applying an AC voltage to an injection coil; a current measuring unit that measures an AC current produced in the circuit by the injection coil using a detection coil; a processing unit that calculates the circuit resistance from the AC signal voltage and the measured AC current; and a reference signal generator that outputs a binary reference signal that has a same period as the AC voltage and is synchronized to the clock. The voltage injector generates a stepped wave whose amplitude changes in synchronization with a clock, applies a signal based thereon as the AC voltage. The current measuring unit converts the current in the detection coil to a voltage signal, carries out synchronous detection using the reference signal, and measures the AC current based on the synchronous detection result.
    Type: Application
    Filed: June 17, 2009
    Publication date: December 31, 2009
    Applicant: HIOKI DENKI KABUSHIKI KAISHA
    Inventor: Satoshi Imaizumi
  • Patent number: 7639023
    Abstract: A fuel cell voltage measurement device includes a main beam provided at two sides with a transverse slot each for slidably receiving a plurality of slides therein, and a plurality of retractable probe assemblies separately mounted on the slides to move along with the slides. Therefore, the retractable probe assemblies are applicable to contact with fuel cell bipolar plates having different heights and/or thicknesses, making the voltage measurement device highly practical for use. A voltage signal collecting unit is provided on a top of the main beam for directly collecting the measured voltage signals to obtain a voltage state of the fuel cell.
    Type: Grant
    Filed: June 28, 2006
    Date of Patent: December 29, 2009
    Assignee: Industrial Technology Research Institute
    Inventors: Hsu-Lin Chang, Jar-Lu Huang
  • Patent number: 7629802
    Abstract: Provided is a semiconductor device including a determination circuit adapted to determine whether a fuse is in a connection or disconnection state. The semiconductor device includes a first and second power supply terminals, a measuring terminal, and at least one trimming detection circuit connected between the measuring terminal and one of the first and second power supply terminals. The trimming detection circuit is constructed by a current supplying element, a series arrangement of a fuse and a switch element, and the determination circuit. The current supplying element and series arrangement are connected in series between the measuring terminal and the one of the first and second power supply terminals. The determination circuit has an input connected to a node between the current supplying element and series arrangement. A voltage at the other of the first and second power supply terminals is applied to the measuring terminal in a normal mode.
    Type: Grant
    Filed: September 2, 2008
    Date of Patent: December 8, 2009
    Assignee: NEC Electronics Corporation
    Inventor: Kiyoshi Kanno
  • Patent number: 7630843
    Abstract: Some embodiments of a method, apparatus, and system for power source failure prediction are described. According to some embodiments, the system may include, among other things, a display device to draw power from a direct current power source, two or more electrical lines positioned on either side of the direct current power source to determine a voltage across the direct current power source, and a power source management unit coupled to the two or more electrical lines to measure the voltage. In some embodiments, a cell monitoring unit may be coupled to the two or more electrical lines to measure the voltage for the power source management unit, where the cell monitoring unit is capable of converting the measured voltage to a digital signal, measuring the rate of change of the voltage over a period of time, and providing information to the power source management unit. Other embodiments are described.
    Type: Grant
    Filed: September 21, 2006
    Date of Patent: December 8, 2009
    Assignee: Intel Corporation
    Inventor: Don J. Nguyen
  • Publication number: 20090295413
    Abstract: A sensor system having a sensor unit for detecting a measured variable, and an evaluation unit, which are interconnected via at least one or a plurality of connection line(s), the sensor unit having a sensor, which is connected to a supply voltage, and includes a signal output for a measuring signal that is a function of the measured variable, the evaluation unit having a voltage meter to detect the status of the measured variable as a function of a potential, the sensor unit including a first resistive circuits connected to the sensor, and the evaluation unit including a second resistive circuit connected to the voltage meter. The first and the second resistive circuits are coupled to one another via at least the sensor line and forming a resistor network.
    Type: Application
    Filed: April 5, 2006
    Publication date: December 3, 2009
    Inventor: Holger Borst
  • Publication number: 20090294805
    Abstract: A multiple-gate field-effect transistor includes a fluid in a top gate, two lateral gates, and a bottom gate. The multiple-gate field-effect transistor also includes a patterned depletion zone and a virtual depletion zone that has a lesser width than the patterned depletion zone. The virtual depletion zone width creates a virtual semiconductor nanowire that is lesser in width than the patterned depletion zone.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 3, 2009
    Inventors: Gil Shalev, Amihood Doron, Ariel Cohen
  • Patent number: 7622940
    Abstract: A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively connected to the internal circuits; and a contact failure detector coupled between the pads and a common node and configured to detect contact failures between tips of a probe card and the pads.
    Type: Grant
    Filed: July 24, 2008
    Date of Patent: November 24, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Gwang-Young Kim, Jong-Youb Kim, Boung-Lyoul Jung, Joon-Su Ji
  • Publication number: 20090278557
    Abstract: There are provided a first voltage applied part connected to a first voltage supply part and applied with a first voltage by the first voltage supply part on the basis of a first portion, a second voltage applied part connected to a second voltage supply part and applied with a second voltage by the second voltage supply part on the basis of a second portion, and a voltage monitoring part connected to the second portion and the second voltage applied part, operating when the second voltage is applied, and detecting the first voltage on the basis of the first portion.
    Type: Application
    Filed: July 25, 2008
    Publication date: November 12, 2009
    Applicant: NIKON CORPORATION
    Inventor: Fumiya Taguchi
  • Patent number: 7609076
    Abstract: A method of quickly measuring a characteristic impedance of an ESD protecting circuit by applying a discharge voltage to the ESD protecting circuit, includes the steps of measuring a variation in discharge voltage applied to and a variation in discharge current caused to flow through the ESD protecting circuit with time; simultaneously detecting a state when both the discharge voltage and discharge current corresponding to each other are attenuated, after both the discharge voltage and discharge current sequentially rise to arrive individually to respective peak values based on an input to or an output from a computer; and taking a ratio of the variation of discharge voltage to the variation of discharge current during the attenuation as an impedance value when the ratio is nearly constant as well as an apparatus for realizing the same.
    Type: Grant
    Filed: May 17, 2007
    Date of Patent: October 27, 2009
    Assignee: Hanwa Electronic Ind. Co., Ltd.
    Inventors: Toshiyuki Nakaie, Masanori Sawada, Taizo Shintani, Natarajan Mahadeva Iyer, David Eric Tremouilles
  • Patent number: 7609049
    Abstract: A scan mode is used in a voltage detection circuit. An oscillator in the circuit is always on and a system including the voltage detection circuit detects various abnormal conditions, such as overcharging, overdischarging and overcurrent one by one for some clocks. To reduce the power consumption, the voltage detection circuit is turned on only once for several clocks. The on-time is very short and lasts about only one tenth of a clock cycle time. In other times, the voltage detection circuit is turned off to save power consumption.
    Type: Grant
    Filed: May 28, 2008
    Date of Patent: October 27, 2009
    Assignee: Vimicro Corporation
    Inventors: Wenbo Tian, Hang Yin, Wang Zhao
  • Patent number: 7609075
    Abstract: For measuring a voltage difference between two measurement potentials at the input of a voltage converter that can be controlled via a control input, the measurement potentials are shifted by a voltage potential defined by a first pair of impression currents to obtain a first pair of shifted measurement potentials at the output of the voltage converter. Subsequently, the measurement potentials are shifted by a voltage potential defined by a second pair of impression currents different to the first pair to obtain a second pair of shifted measurement potentials. A controller determines measurement phases, in which the first or second pair of measurement potentials, respectively, is determined. An evaluator determines the voltage difference based on the first voltage difference between the first pair of shifted measurement potentials and based on the second voltage difference between the second pair of shifted measurement potentials and outputs the same at the output.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: October 27, 2009
    Assignee: Infineon Technologies AG
    Inventor: Harald Panhofer
  • Patent number: 7605594
    Abstract: The present invention is directed to an electrical wiring inspection system that includes a user interface device including processor circuitry, a user interface, and a first communications interface. The first communications interface is configured to transmit configuration data related to a plurality of electrical test procedures and receive test data corresponding to a plurality of electrical parameters. A branch circuit analysis device is configured to be coupled to the user interface device via the first communications interface and at least one branch circuit by at least one test connector. The branch circuit analysis device includes processor circuitry, branch circuit test circuitry configured to perform one or more of the plurality of electrical test procedures, and a second communications interface configured to transmit and receive configuration data related to a plurality of electrical test procedures and transmit and receive test data corresponding to a plurality of electrical parameters.
    Type: Grant
    Filed: May 8, 2008
    Date of Patent: October 20, 2009
    Assignee: Pass & Seymour, Inc.
    Inventor: Frederick K. Blades
  • Publication number: 20090251157
    Abstract: Various methods are described to characterize interferometric modulators or similar devices. Measured voltages across interferometric modulators may be used to characterize transition voltages of the interferometric modulators. Measured currents may be analyzed by integration of measured current to provide an indication of a dynamic response of the interferometric modulator. Frequency analysis may be used to provide an indication of a hysteresis window of the interferometric modulator or mechanical properties of the interferometric modulator. Capacitance may be determined through signal correlation, and spread-spectrum analysis may be used to minimize the effect of noise or interference on measurements of various interferometric modulator parameters.
    Type: Application
    Filed: September 30, 2008
    Publication date: October 8, 2009
    Applicant: QUALCOMM MEMS Technologies, Inc.
    Inventor: Alok Govil
  • Publication number: 20090251158
    Abstract: The present invention provides a test strip for measuring a signal of interest in a biological fluid when the test strip is mated to an appropriate test meter, wherein the test strip and the test meter include structures to verify the integrity of the test strip traces, to measure the parasitic resistance of the test strip traces, and to provide compensation in the voltage applied to the test strip to account for parasitic resistive losses in the test strip traces.
    Type: Application
    Filed: June 15, 2009
    Publication date: October 8, 2009
    Inventors: Michael J. Celentano, Henning Groll, James L. Pauley, Steven K. Moore
  • Patent number: 7598754
    Abstract: An input detecting circuit for an electric-leakage protection device with self-diagnostic function includes an analog electric-leakage unit, a magnetic electric-leakage induction ring, an operational amplifier, and an inverse feedback circuit. The inverse feedback circuit includes a first resistance and a second circuit unit shunted with the first resistance. The second circuit unit includes a second resistance and a unidirectional break-over unit connected in series with the second resistance.
    Type: Grant
    Filed: June 18, 2007
    Date of Patent: October 6, 2009
    Assignee: Shanghai Fudan Microelectronics Co., Ltd.
    Inventors: Jun Yu, Qikang Chen
  • Publication number: 20090243636
    Abstract: Embodiments of an apparatus for measuring the leakage current of capacitive components is taught. One embodiment includes a first stage amplifier configured to receive an input from a serially-connected capacitive component at an inverting input and a feedback resistor in a feedback path of the first stage amplifier. A resistance value of the feedback resistor is programmable based on an expected value of the leakage current and a corresponding voltage output.
    Type: Application
    Filed: March 31, 2008
    Publication date: October 1, 2009
    Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.
    Inventors: Brian Johansen, Brandon J. McCurry
  • Patent number: 7592820
    Abstract: A circuit and method is disclosed for measuring the resistance of a resistive sensor, such as a PTC or NTC temperature sensor used for monitoring the temperature of the windings of an electric motor. The measurement circuit is based on an electronic circuit in which conductors from a sensor located in the object to be monitored are connected to an amplifier circuit in a feedback configuration that reduces the DC level supplied to the voltage divider when the sensor resistance increases. The measured signal is amplified and, using a comparator to compare it with the output voltage of a sawtooth generator, a continuous PWM (Pulse Width Modulation) signal is generated and transmitted in digital format to a SELV electronic circuit, for example through an opto-isolator. The essentially logarithmic signal amplification makes it possible to reliably distinguish between a short circuit in the sensor circuit and low values of sensor resistance.
    Type: Grant
    Filed: December 8, 2006
    Date of Patent: September 22, 2009
    Assignee: ABB Oy
    Inventors: Kari-Matti Laakso, Andreas Berts
  • Patent number: 7589540
    Abstract: Provided is a current-mode semiconductor integrated circuit device that operates in a voltage mode during a test mode. The current-mode semiconductor integrated circuit device includes a first transmitting converter, a first receiving converter, a second transmitting converter, and a second receiving converter. During the test mode, one of a first signal path and a second signal path is selected according to the location of the chip. In the first signal path, the first transmitting converter, the first receiving converter, and the second transmitting converter operate. In the second signal path, the second transmitting converter, the second receiving converter, and the first transmitting converter operate. Each of the first and second transmitting converters receives a test voltage signal and converts it into a current signal. Each of the first and second receiving converters generates a reference voltage signal, compares it with the test voltage signal, and outputs the comparing result.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: September 15, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jan-Jin Nam, Yong-Weon Jeon
  • Patent number: 7586315
    Abstract: A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to generate a transformed signal; blocking a negative voltage of the transformed signal to generate a test signal to be transmitted to the electronic component; and detecting electrical characteristics of the electronic component to generate result data.
    Type: Grant
    Filed: August 10, 2007
    Date of Patent: September 8, 2009
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Shih-Fang Wong, Tsung-Jen Chuang, Jun Li
  • Patent number: 7579846
    Abstract: An offset voltage measuring apparatus includes an offset voltage measuring unit including a plurality of measurement nodes having a current variation in response to a feedback voltage. An offset voltage amplifying unit outputs an output voltage amplified in response to an output signal of the offset voltage measuring unit, changes feedback voltage in response to a change in the output voltage and feeds back the feedback voltage to the offset voltage measuring unit.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: August 25, 2009
    Assignee: Hynix Semiconductor Inc.
    Inventor: Kwang-Myoung Rho
  • Publication number: 20090206854
    Abstract: A circuit and method for capacitor effective series resistance measurement. One embodiment provides a method for measuring the effective series resistance of a capacitor having a capacitor voltage. The method includes amplifying the capacitor voltage with an AC coupled amplifier yielding a first amplified signal. The capacitor is discharged with a constant current for a measurement time thus causing a voltage swing of the capacitor voltage due to a voltage drop across the effective series resistance. The capacitor voltage is amplified with the AC coupled amplifier yielding a second amplified signal being dependent on the voltage swing; calculating the effective series resistance from the first and the second amplified signal.
    Type: Application
    Filed: February 15, 2008
    Publication date: August 20, 2009
    Applicant: INFINEON TECHNOLOGIES AG
    Inventors: Derek Bernardon, Dieter Haerle
  • Publication number: 20090201037
    Abstract: A system and method for automatically discovering total transistor resistance in a hybrid power over Ethernet (PoE) architecture. A critical factor for a PoE system is the total resistance of the power FET. Typical PoE systems consist of a single power FET that may be integrated with the controller or external to the controller. In a hybrid architecture the PoE system consists of both an internal power FET and an external power FET. The external power FET can be used to customize a design to meet a particular application or need. The total resistance in the hybrid architecture can be automatically determined using voltage and current measurements of the internal and external power FETs.
    Type: Application
    Filed: February 7, 2008
    Publication date: August 13, 2009
    Applicant: Broadcom Corporation
    Inventors: Wael William Diab, Hemanth Nekkileru, Sesha Thalpasai Panguluri
  • Patent number: 7573274
    Abstract: A current sensor includes a busbar, a case, a connector, and a bare chip having a current detection circuit. The busbar has a crimp terminal at one end, a ring terminal at the other end, and a shunt resistor welded between the crimp and ring terminals. The shunt resistor is encapsulated in the case, and the busbar has an electrode exposed to a sealed inner room of the case. The connector has a connector body unitary with the case and has a connector terminal that is exposed to the inner room at one end and exposed to an outside of the connector body at the other end. The bare chip is arranged in the inner room of the case and wire-bonded to each of the busbar and the connector terminal.
    Type: Grant
    Filed: July 17, 2007
    Date of Patent: August 11, 2009
    Assignee: DENSO CORPORATION
    Inventor: Masahiro Aratani
  • Patent number: 7573273
    Abstract: A fuse cutting test method to test the state of a fuse includes measuring the current flowing through the fuse and determining the fuse to be either broken, or not broken, or in a state therebetween, based on the measured current.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: August 11, 2009
    Assignee: NEC Electronics Corporation
    Inventor: Takao Yanagida
  • Publication number: 20090195261
    Abstract: A measurement instrument for measuring the impedance of a device under test (DUT) includes a first source of either a voltage or a current and a second source of either a voltage or a current, wherein the first source is connectable in a first feedback relationship with the DUT and the second source is connectable in a second feedback relationship with both the DUT and the first source. The first and second sources are operated respectively as a current source responsive to the current through the DUT and a voltage source responsive to the voltage across the DUT or operated respectively as a voltage source responsive to the voltage across the DUT and a current source responsive to the current through the DUT. The second feedback relationship has a narrower bandwidth than the first feedback relationship. The resulting voltage across the DUT and the current through the DUT establish the measured impedance of the DUT.
    Type: Application
    Filed: February 1, 2008
    Publication date: August 6, 2009
    Applicant: Keithley Instruments, Inc.
    Inventor: James A. Niemann
  • Patent number: 7570068
    Abstract: First and second complementary voltage signals are operatively coupled across a series circuit comprising first and second sense resistors and a circuit element therebetween. A DC bias current in the series circuit is substantially nulled, and an output signal responsive to the self-impedance of the circuit element is generated responsive at least one of a voltage across the first sense resistor and a voltage across the second sense resistor.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: August 4, 2009
    Assignee: TK Holdings, Inc.
    Inventors: Scott E. Bauer, James D. Baal
  • Patent number: 7564251
    Abstract: Individual measuring sensors each have a different specific signal type and must therefore be appropriately connected to the analog measuring inputs. An adjustable voltage with adjustable current limitation, or an adjustable current with adjustable voltage clamping is used. The voltage or current is connected to the measuring sensors and the corresponding signal is detected and classified according to the sensor type. This permits the automated integration of the measuring sensor. The corresponding assembly can form part of the complete module.
    Type: Grant
    Filed: October 29, 2004
    Date of Patent: July 21, 2009
    Assignee: Siemens Aktiengesellschaft
    Inventor: Jürgen Rupp
  • Patent number: 7564248
    Abstract: Methods and apparatus are provided for monitoring a coolant conductivity of a fuel cell supplying power via positive and negative buses. The method includes measuring a first voltage of the positive bus, measuring a second voltage of the negative bus, applying a resistance between the positive bus and a reference potential, measuring a third voltage of the positive bus after a period of applying the resistance, and determining an isolation resistance based on the measured voltages. The isolation resistance is a function of the coolant conductivity.
    Type: Grant
    Filed: March 12, 2007
    Date of Patent: July 21, 2009
    Assignee: GM Global Technology Operations, Inc.
    Inventors: Richard M. Breese, Thomas P. O'Meara, Stanley K. Fujii, Bernd Peter Elgas, Stephen Raiser
  • Patent number: 7564249
    Abstract: First and second complementary voltage signals are operatively coupled across a series circuit comprising first and second sense resistors and a circuit element therebetween. A voltage across the circuit element is regulated in reference to a predetermined level, and an output signal responsive to the self-impedance of the circuit element is generated responsive at least one of a voltage across the first sense resistor and a voltage across the second sense resistor.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: July 21, 2009
    Assignee: TK Holdings, Inc.
    Inventors: Scott E. Bauer, James D. Baal
  • Patent number: 7564250
    Abstract: A system and method for measuring resistance of a polarizing material are disclosed. The system includes a voltage divider circuit having a first resistive element of known resistance and the polarizing material of unknown resistance and a processing unit. The processing unit is electrically-coupled to the voltage divider circuit and adapted to apply a voltage across the voltage divider circuit. A first input/output (I/O) pin is electrically-coupled between the processing unit and the first resistive element. A second pin is electrically-coupled between the processing unit and a junction between the polarizing material and the first resistive element. A controller is adapted to cause the second pin to short the polarizing material after a measurement is completed, to bleed off any residual polarization from the capacitive element of the polarizing material.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: July 21, 2009
    Assignee: Onset Computer Corporation
    Inventor: Lon Hocker
  • Patent number: 7554336
    Abstract: A method for measuring the insulation resistance in an information technology (IT) network. The IT network has a DC voltage intermediate circuit and at least one self-commutated converter having at least one first and one second power switch. The IT network also includes a measuring arrangement for measuring the intermediate circuit voltage relative to ground potential comprising a voltage divider and two assigned potential measuring devices. The method has an offline and an online measurement, wherein, during the offline measurement, all of one of the first and second power switches are closed and the potentials Up and Um, respectively, and also the intermediate circuit voltage are measured and the insulation resistance Rf is determined therefrom. During the online measurement, the two potentials Up and Um are measured and the temporal profile of the measurements is compared with the offline measurement.
    Type: Grant
    Filed: July 6, 2007
    Date of Patent: June 30, 2009
    Assignee: Semikron Elektronik GmbH & Co. KG
    Inventor: Klaus Backhaus
  • Patent number: 7554344
    Abstract: Apparatus and methods of adjusting system efficiency for a current-consuming system are disclosed. In the disclosed apparatus, a system current detector receives a system current from the current-consuming system and calculates a system current variation accordingly. A system efficiency adjustment module is coupled to the system current detector to receive the system current variation and output a frequency control signal and a voltage control signal accordingly.
    Type: Grant
    Filed: January 11, 2007
    Date of Patent: June 30, 2009
    Assignee: Via Technologies, Inc.
    Inventors: Chien-Ping Chung, Chung-Ching Huang
  • Patent number: 7554343
    Abstract: The present invention relates to methods for velocity control of transducers that can compensate both for age related changes as well as the more immediate changes that occur during operation. In one aspect of the invention, the non-motional reactive current is measured at two predetermined frequencies, one below (Ilf) and one above the resonance frequency (Ihf). A correction factor is calculated from these measured currents is used to maintain a specified value of end effector velocity or displacement. In another aspect of the invention, methods are provided for the detection of secondary resonances that could be indicative of end effector fault conditions. In another aspect of the invention, velocity control is achieved.
    Type: Grant
    Filed: July 24, 2006
    Date of Patent: June 30, 2009
    Assignee: PiezoInnovations
    Inventor: George Bromfield
  • Patent number: 7550976
    Abstract: A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test.
    Type: Grant
    Filed: February 23, 2007
    Date of Patent: June 23, 2009
    Assignee: Advantest Corporation
    Inventor: Seiji Amanuma
  • Patent number: 7548076
    Abstract: A coaxial cable is disclosed that includes a signal line, an insulating layer for coating the signal line, a first shield having a tape-like conductor wound around the insulating layer and a second shield composed of a conductor provided around the outer periphery of the first shield. The coaxial cable further includes multiple coaxial cables of equal length, a fixing member for bundling the multiple coaxial cables, a signal line connecter for connecting the multiple coaxial cables, and a shield connector for connecting the shields of the multiple coaxial cables.
    Type: Grant
    Filed: January 8, 2007
    Date of Patent: June 16, 2009
    Assignees: Hirakawa Hewtech Corporation, Advantest Corporation
    Inventors: Mitsunori Satou, Yasuo Furukawa
  • Publication number: 20090146671
    Abstract: A device having a switch with a voltage applied across the switch. A current sensing circuit is connected to one terminal of the switch. The current sensing circuit receives power independently of the voltage applied across the switch. The power supply shares the other terminal of the switch with the current sensing circuit. The switch is adapted for opening and closing. When the switch closes, the current sensing circuit senses current through the switch and upon opening the switch the high voltage of the switch is blocked from the current sensing circuit. The sense current is caused to flow from the current sensing circuit to the other terminal when the switch is closed.
    Type: Application
    Filed: December 4, 2008
    Publication date: June 11, 2009
    Inventor: Meir Gazit
  • Patent number: 7545135
    Abstract: An electricity meter coupled to a load, the load coupled to electrical power lines includes a sensor module having a sensor housing, voltage and current sensors secured within the sensor housing and a service disconnect switch secured within the housing. The voltage and current sensors are operable to receive voltage and current signals representative of voltage and current provided to the load and generate measurements signals therefrom. The service disconnect switch is operable to controllably disconnect and connect the load to the electrical power lines. The meter further includes a removable measurement module including a measurement circuit operable to receive the measurement signals and generate energy consumption data therefrom. The measurement module includes a device for communicating information relating to the energy consumption data. The measurement module is configured to be coupled to the sensor module to connect the measurement circuit to the voltage and current sensors.
    Type: Grant
    Filed: May 10, 2006
    Date of Patent: June 9, 2009
    Assignee: Landis+Gyr, Inc.
    Inventors: Brett Holle, Michael Anderson, John Voisine, Scott Gambill
  • Patent number: 7545156
    Abstract: The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the light-receiving elements and each of the amplifiers.
    Type: Grant
    Filed: February 21, 2007
    Date of Patent: June 9, 2009
    Assignee: Panasonic Corporation
    Inventors: Yousuke Kuroiwa, Hideo Fukuda, Hiroshi Yamaguchi, Tetsuo Chato, Yuzo Shimizu, Masaki Taniguchi
  • Publication number: 20090133743
    Abstract: The present invention relates to a method of manufacturing an electrode substrate that has a base substrate made of glass having a strain point of 520° C. or higher, a transparent conductive layer formed on the base substrate, a metal wiring layer, and an insulating layer made of low-melting glass that covers the metal wiring layer, the metal wiring layer and the insulating layer being provided on the transparent conductive layer, the method including at least the steps of providing paste that forms a base material of the low-melting glass so as to cover the metal wiring layer; and forming the insulating layer by sintering the paste by means of a heat treatment.
    Type: Application
    Filed: November 18, 2008
    Publication date: May 28, 2009
    Applicant: FUJIKURA LTD.
    Inventor: Hiroshi MATSUI
  • Publication number: 20090134890
    Abstract: An switching interface is provided for use on a vehicle. In an exemplary embodiment the switching interface comprises a receiver and a switch assembly. The receiver may include an input node; a regulated power supply electrically couple to the input node; and an analog-to-digital (A/D) converter configured to measure a voltage potential between the input node and the receiver ground. The switch assembly may include a first resistor electrically coupled to the receiver input node, the first resistor having a first resistive value; a first switch electrically coupled between the first resistor and a switch assembly ground; a second resistor electrically coupled to the first resistor and the first switch, the second resistor having a second resistive value; and a second switch coupled between the second resistor and the switch assembly ground.
    Type: Application
    Filed: January 29, 2009
    Publication date: May 28, 2009
    Applicant: GM GLOBAL TECHNOLOGY OPERATIONS, INC.
    Inventor: WADE G. JOHNSON
  • Publication number: 20090128170
    Abstract: A print medium detecting module includes a first conductive unit, a second conductive unit and a detector. The first conductive unit is coupled to a first reference voltage level. The detector has a detecting port, which is coupled to the second conductive unit and a second reference voltage level, for referring to an electrical characteristic of the detecting port to detect whether there is a non-conductive print media between the first and second conductive units that causes the first conductive unit to not be electrically connected to the second conductive unit. The first and second conductive units in an initial state are electrically connected to each other. The first reference voltage level is different from the second reference voltage level.
    Type: Application
    Filed: March 20, 2008
    Publication date: May 21, 2009
    Inventor: Tsung-Yueh Chen
  • Patent number: 7535237
    Abstract: A sensor for measuring the moisture and salinity of a material is disclosed herein. The sensor preferably includes a soil moisture circuit, a soil salinity circuit and a probe structure. The soil moisture circuit includes a high frequency oscillator, a voltage meter and a reference capacitor. The soil salinity circuit includes a low frequency oscillator, a voltage meter and a reference resistor. A third voltage meter allows for voltage outputs to be measured to calculate soil moisture and soil salinity values.
    Type: Grant
    Filed: August 2, 2008
    Date of Patent: May 19, 2009
    Assignee: Advanced Sensor Technology, Inc.
    Inventor: Jeffrey Campbell
  • Patent number: 7535246
    Abstract: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on at least an S parameter of a measuring system and an input impedance of the measuring unit. A voltage drop at the drain is determined from the coefficient. Based on the determined voltage drop, a drain bias voltage actually applied to the drain of an FET is determined. Also, a coefficient for converting the measurement voltage of the measuring unit into a drain current is determined based on at least an S parameter of a measuring system and the input impedance of the voltage measuring unit and an electrical length of the measuring system if necessary. Based on the determined coefficient, a drain current actually flowing in the FET is determined.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: May 19, 2009
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasushi Okawa
  • Publication number: 20090121729
    Abstract: Load current of a circuit is determined across a component of the circuit by calibrating the resistance of the component with a reference current having a distinguishable characteristic. For example, a reference current with swept frequency modulation is applied to the component so that the resistance of the component is determined from voltage drop associated with the reference current across the component. The component resistance is applied to a voltage drop associated with the load current to determine the load current. For example, a filter matched to the reference current frequency modulation isolates the reference current voltage drop so that a ratio of the reference current voltage drop and the load current voltage drop provides a ratio of the reference current and load current.
    Type: Application
    Filed: November 12, 2007
    Publication date: May 14, 2009
    Inventor: Sandor Farkas
  • Patent number: 7528734
    Abstract: A system for automatically detecting power supply voltage includes a voltage divider connected to a power supply, an A/D converter connected to the voltage divider, a detection module connected to the A/D converter for comparing a digital signal converted by the A/D converter with a reference signal stored in the detection module, a relay driving circuit connected to the detection module, a relay connected to the relay driving circuit and the power supply respectively, and an outlet coupled to the relay for outputting voltage. If the digital signal matches the reference signal, the detection module controls the relay driving circuit to turn on the relay to output voltage at the outlet. Relevant method for detecting power supply voltage is also provided.
    Type: Grant
    Filed: December 20, 2005
    Date of Patent: May 5, 2009
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Heng-Chen Kuo
  • Publication number: 20090109586
    Abstract: A method and an apparatus for monitoring a load driven by a power semiconductor switch. The method may comprise, for example: driving a control electrode of the power semiconductor switch, in such a way that a rise in the load current through the power semiconductor switch is effected after a delay time; generating a diagnostic current flowing through the load, wherein the diagnostic current brings about a voltage drop across the load before the delay time has elapsed; and evaluating the voltage drop across the load before the delay time has elapsed.
    Type: Application
    Filed: October 29, 2007
    Publication date: April 30, 2009
    Applicant: INFINEON TECHNOLOGIES AG
    Inventors: Erich Scheikl, Alberto Zanardi
  • Publication number: 20090108855
    Abstract: A test structure for electromigration and related method are disclosed. The test structure may include an array of a plurality of multilink test sets, each multilink test set including a plurality of metal lines positioned within a dielectric material and connected in a serial configuration; each multilink test set being connected in a parallel configuration with the other multilink test sets, the parallel configuration including a first electrical connection to a cathode end of a first metal line in each multilink test set and a second electrical connection to an anode end of a last metal line in each multilink test set.
    Type: Application
    Filed: January 5, 2009
    Publication date: April 30, 2009
    Inventors: Kaushik Chanda, Ronald G. Filippi, Ping-Chuan Wang