Abstract: An electrical connector for a multi-wire electrical cable includes two cable-side electrical contact elements including associated terminals to each of which is to be connected a wire of the electrical cable, and two output-side electrical contact elements which are spaced apart from the cable-side electrical contact elements and from each of which projects an electrical connector element via which an electrical connection can be established to a mating connector. An active electrical device is disposed between the cable-side contact elements and the output-side contact elements. The active electrical device is placed on the contact elements, such that the active electrical device is in electrical contact with each of the contact elements, and such that the cable-side contact elements and the output-side contact elements are electrically connected to each other. The output-side contact elements are separated and axially spaced apart from the cable-side contact elements.

Abstract: An illustrative system disclosed herein includes a conductive probe that is adapted to hold a quantity of mercury, wherein the conductive probe includes a conductive body with an outlet and a mercury control system adapted to supply mercury to the conductive probe. In this example, the system also includes an image sensor that is adapted to obtain an image of a mercury droplet positioned on a surface of a material and a measurement system that is adapted to receive the image of the mercury droplet and calculate a contact area between the mercury droplet and the surface of the material based upon the image of the mercury droplet.

Abstract: The present document describes a connector for use with a harness under test by an automated test equipment (ATE). The harness is electrically connected to a reference. The connector comprises connection points having a layout, namely a connector layout, electronic identifiers and a switch. Each one of the electronic identifiers is connected to a respective one of the connection points. The switch is either for connecting the ATE to the reference via the electronic identifiers, either for connecting the ATE to the reference while bypassing the electronic identifiers.

Abstract: A testing probe and a testing apparatus are disclosed. The testing probe including: a housing, including a test end and a fixed end, and with a test opening at the test end; a piston, being capable of sliding between the test end and the fixed end along an inner wall of the housing, and a conductive adhesive agent chamber being formed by the piston and the fixed end of the housing and being configured to be filled with a conductive adhesive agent; and the conductive adhesive agent being allowed to overflow from a gap between the piston and the inner wall of the housing by squeezing the piston; an elastic member with a first end fixed to the piston and a second end extending toward the test end; a sphere being disposed at the test opening and separated from the second end of the elastic member by a preset distance.

Abstract: A guided approach device for guiding together a first device (handler or tester) and a second device (including a test head for electronic components), including a latching device with a cylindrical pin socket for holding and fixing a front end of a catch pin. The latching device is connected to a linear displacement device such that the cylindrical pin socket may be displaced in a linear direction at least a short distance corresponding to a multiple of a length of a leading section of the catch pin, which may be inserted into the pin socket. Additionally or alternatively, the latching device is connected to a linear displacement device such that the latching element, a spring element and the pin socket may be displaced, with the catch pin engaged, in a linear direction by the linear displacement device, so that the first and second devices maybe moved relative to one another.

Abstract: Test fixtures for testing layers of touch screen material and methods for using the same. Some test fixtures include first and second test beds that are movable relative to each other, an impedance measurement circuit, an electrical connector, a clamping actuator, and a processor, where the test fixtures and/or test fixture components are configured to secure a layer of touch screen material and measure the electrical impedance of at least one feature of the layer. Some of the present methods include securing a layer of touch screen material between test beds, calculating an electrical impedance of at least one feature of the layer, and releasing the layer from the test beds.

Abstract: A method of measuring slider resistance of different types of row bar with a common tester comprises judging the type of the row bar, if the row bar is femto-type row bar, supplying a first voltage to the front pins, and supplying a second voltage that is unequal to the first voltage to the back pins, thereby obtaining resistances of the sliders; if the row bar is shunting-type row bar, supplying a third voltage to the front pins which contact the test pads, and supplying a fourth voltage that is unequal to the third voltage to the front pin that contacts the common test pad, thereby obtaining resistances of the sliders. The present invention can measure two different types of row bar with a same common tester, which can reduce the downtime of machine and the manpower, and prevent the probe card from being damaged without a frequent disassembly and switch.

Abstract: An embodiment test system is proposed; the test system is used to test electronic devices each one having a case with a plurality of terminals for example, of the BGA type. The test system includes a set of (one or more) test boards. Each test board includes a plurality of banks of electrically conductive receptacles, each one for resting a corresponding electronic device; each receptacle is adapted to receive a terminal of the corresponding electronic device. A set of (one or more) boxes is arranged in operation above the test boards. Each box defines an expandable chamber for a conditioning fluid; particularly, the box includes a rigid body, a flexible membrane of a thermally conductive material facing the test boards, an inlet, and an outlet. Means is provided for controlling a temperature of the conditioning fluid (for example, a heat exchanger).

Abstract: A chuck with triaxial construction comprises a receiving surface for a test substrate and arranged below the receiving surface: an electrically conductive first surface element, an electrically conductive second surface element electrically insulated therefrom, and an electrically conductive third surface element electrically insulated therefrom, and, between the first and the second surface element, a first insulation element and, between the second and the third surface element, a second insulation element.

Abstract: An electrical testing device has a first probe that electrically contacts with an inspection device, a second probe that is electrically connected to the first probe and electrically contacts with an external terminal of a test object, a cylinder that houses the first probe and second probe, and into which and out of which a fluid flows between the first probe and second probe, and a fluid pressure regulator that controls the fluid pressure in the cylinder. The fluid pressure in the cylinder controls the contact force between the first probe and the inspection device and the contact force between the second probe and the external terminal.

Abstract: A socket connector for electrically connecting a lead of a semiconductor device under test (DUT) with a tester includes a container having a chamber, a conductive end or plug that seals the chamber at one end, and a conductive membrane that seals the chamber at another end. A liquid conductive material fills the chamber. The conductive plug is arranged to be in electrical contact with the tester. The lead of the semiconductor DUT is in electrical contact with the conductive membrane and thus with the tester via the conductive membrane, the liquid conductive material and the conductive plug.