Abstract: Current is provided from a first node coupled to an output of a power supply to a second node coupled to a voltage supply input of an electronic device under test via a transistor having a first current-carrying electrode coupled to the first node and a second current-carrying electrode coupled to the second node. A first voltage is determined based on a voltage difference between the first node and the second node and a second voltage is determined based on a comparison of the first voltage to a voltage of the second node. The transistor is selectively disabled based on the second voltage.

Abstract: A trimmer circuit is so configured that an electronic device will break down to produce a high current to trim a fuse. The electronic device is selectively configured to have a breakdown voltage lower than an applied voltage, for the trigger of its breakdown to be controllable. In an embodiment, the electronic device is switched between two states having two breakdown voltages respectively, and the applied voltage is higher than one of the breakdown voltages and lower than the other one.

Abstract: An integrated circuit includes a trimming signal creating section, disposed downstream of a trimming circuit in which a number of fuses are arranged in alignment, creating a trimming signal corresponding to the trimming value on the basis of a signal output from said trimming circuit and arranges blown object fuses such that every two of the blown object fuses are interposed at least one un-blown fuses in the trimming circuit. An efficient arrangement of blowing points in addition to the above arrangement of blown object fuses can reduce the area occupied by the trimming circuit.

Abstract: A fuse circuit can include a cut-off unit circuit configured to electrically isolate a fuse from an input to a status information circuit after latching of status information associated with status of the fuse. Other fuse related circuits and methods are disclosed.

Abstract: Methods and corresponding systems for reading a memory cell include a first current sourced from a first current source into a summing node, wherein the first current source is coupled to a first reference. A second current is sourced from a second current source into the summing node, wherein the second current source is coupled to the first reference through a programmable fuse. A third current is sunk from the summing node with a current sink, wherein the current sink is coupled to a second reference, and wherein a third current limit is greater than a first current limit and less than the sum of the first current limit and the second current limit. A voltage at the summing node is output in response to the first current, the second current, and the third current. The first and second current sources, and the current sink can be current mirrors.

Abstract: To improve the ESD protection of a circuit receiving a signal. An inverter circuit INV1 is connected to ground wiring GND1 for supplying power, and is connected to power supply wiring VDD1 via a PMOS transistor MP5. An inverter circuit INV2 is connected to ground wiring GND2 and power supply wiring VDD2 for supplying power, and its input node is connected to an output node of the inverter circuit INV1. Further, the ground wiring GND1 and the ground wiring GND2 are connected via a protection element PE0. During normal operation, the output of an inverter circuit INV3 goes to an H level, the output of an inverter circuit INV4 goes to an L level, and the PMOS transistor MP5 is turned on. When ESD is applied, the power supply wiring VDD2 is place in a floating state, the output of the inverter circuit INV4 goes to an H level, the PMOS transistor MP5 is turned off, and a current that occurs when EDS is applied does not flow into the inverter circuit INV2.

Abstract: An electrically reprogrammable fuse comprising an interconnect disposed in a dielectric material, a sensing wire disposed at a first end of the interconnect, a first programming wire disposed at a second end of the interconnect, and a second programming wire disposed at a second end of the interconnect, wherein the fuse is operative to form a surface void at the interface between the interconnect and the sensing wire when a first directional electron current is applied from the first programming wire through the interconnect to the second programming wire, and wherein, the fuse is further operative to heal the surface void between the interconnect and the sensing wire when a second directional electron current is applied from the second programming wire through the interconnect to the first programming wire.

Abstract: The fuse cell architecture 371 for the presently claimed invention employs a multiple fuse structure 301, 302 architecture in lieu of a single fuse structure. As such, the terminals of these fuse structures that couple to other on-chip devices are always at ground potential throughout the application of programming voltage to the fuse pads 311. This approach overcomes previous single fuse problems owing to the fact that a sufficiently high programming voltage can be applied to blow fuse structures with unexpectedly high resistance without damaging nearby on-chip devices. Furthermore, even if one of the fuse structures 301, 302 possessed an abnormally high resistance which would not be blown under typical conditions, the desired circuit trimming result can still be achieved owing to the blowing of the other fuse structure in the fuse cell 371.

Abstract: A fuse circuit in accordance with one embodiment of the present invention includes a first power supply liner a second power supply liner a current source connected between the first power supply line and an output terminal, a first transistor having a drain or a collector connected to the output terminal, the first transistor having a current supply capability or a current draw capability larger than that of the current source for the output terminal, a second transistor having a gate or a base connected in common with the gate or the base of the first transistor, a first resistive element and a fuse connected in series between the source or the emitter of either one of the first or second transistor and the second power supply line, and a second resistive element connected between the source or the emitter of the other one of the first or second transistor and the second power supply line.

Abstract: A fuse circuit includes a first power supply line, a second power supply line, a first current source connected between the first power supply line and an output terminal, a second current source connected between the second power supply line and the output terminal, the second current source having higher current supply capacity or current draw-out capacity than the first current source, and a fuse connected in series with the second current source between the second power supply line and the output terminal

Abstract: An exemplary embodiment of an efuse device is provided and comprises a plurality of word lines, at least one bit line, a plurality of cells, a plurality of first selection devices, and at least one second selection device. The word lines are interlaced with the bit line. The cells are disposed in an array, and each corresponds to one set of the interlaced word line and bit line. Each first selection device is coupled to one of the word lines, and the second selection device is coupled to the bit line.

Abstract: Various systems and methods for device configuration are disclosed herein. For example, some embodiments of the present invention provide semiconductor devices that include a fuse blow circuit. The fuse blow circuit provides two fuse blow outputs. Assertion of one of the fuse blow outputs causes one electronic fuse to blow, and assertion of the other fuse blow output causes another electronic fuse to blow. One of the electronic fuses represents a configuration bit while the other electronic fuse represents an inversion status bit indicating an inversion to be applied to the configuration bit. Both the configuration bit and the inversion status bit are applied to an inverter which operates to invert the configuration bit based at least in part on the inversion status bit.

Abstract: A phase detector is applied for detecting the phase difference between a data signal and a clock signal, and outputting a first up signal whose pulse width is between 1/2 and 3/2 period of the clock signal, a first down signal, a second down signal, and a second up signal whose periods are equal to the period of the clock signal to a charge pump. The pulse width of the first up signal varies with the difference between the falling edge of the clock signal and the data signal. Besides, the falling edge of the first up signal of the invention is aligned to the falling edge of the clock signal, and is unrelated to the pulse of the data signal. The invention utilizes the up signal and down signal which are more accurate to resolve the unlock problem due to the divergence of the phase error signal.

Abstract: A semiconductor device includes a fuse section having a plurality of fuse circuits configured to generate switch control signals; and an offset adjusting section configured to adjust an offset voltage of a differential amplifier based on the switch control signals supplied from output nodes of the plurality of fuse circuits. Each of the plurality of fuse circuits includes a fuse connected between a first power supply voltage and a cut node; a current source connected between a second power supply voltage and the output node; and a first transistor connected between the output node and the cut node and having a gate connected to the second power supply voltage.

Abstract: An e-fuse adapted to indicate programming state in relation leakage current path defined by a program transistor both before and after dielectric breakdown has occurred. The e-fuse comprises: a program circuit including the program transistor, a switch circuit connected between the program circuit and ground, a current supply circuit connected to the program circuit and supplying a predetermined current to the leakage current path after the program transistor is programmed; and a sense/amplification circuit connected to a program node associated with the leakage current path and adapted to sense and output the programming state.

Abstract: A fuse state detection circuit is comprised of a first fuse element, a second fuse element, and an output for carrying an output signal, the output signal represents a first logic state when the first fuse element is blown and the second fuse element is unblown and the output signal represents a second logic state when the first element is unblown and the second element is blown. The fuse state detection circuit produces an output signal whose state is recoverable from a negative triggering event and is capable of resolving itself to the correct state without the need for a reset pulse. Methods of using the fuse state detection circuit, such as a method of using fuse elements to control a setting within an electronic circuit, the improvement comprising using a pair of fuse elements to control a single setting, are also given.

Abstract: A first transistor is provided in a first route and a second transistor is provided in a second route, the first route and the second route constituting a current mirror circuit. The sources of the transistors are grounded. In order to match VDS of the first transistor and that of the second transistor match each other, there are provided an operational amplifier receiving the drain voltages of the transistors, and a third transistor having a gate thereof connected to the output of the operational amplifier. The third transistor is provided in the first route. As a result, the current fed to the third transistor is controlled so that VDS of the first transistor and that of the second transistor match each other.

Abstract: The present invention discloses a bias circuit for a sense amplifier having a device under sensing, the device under sensing having an un-programmed state and a programmed state, the bias circuit comprises at least one first branch having at least one first device formed substantially the same as the device under sensing and remaining in the un-programmed state, and at least one second device formed also substantially the same as the device under sensing and being in the programmed state, wherein the at least one first device and the at least one second device are serially connected. A typical application of the present invention is an electrical fuse memory.

Abstract: A frequency generator apparatus and a control circuit thereof are provided. The frequency generator apparatus comprises the control circuit and a frequency generator, wherein the control circuit contains an electric fuse (efuse). The control circuit outputs an enabling signal according to the state of the efuse. The frequency generator is coupled to the control circuit, receives the enabling signal, and decides to output a frequency signal or not according to the enabling signal.

Abstract: A voltage control circuit provides a test supply voltage during manufacturing and testing of a semiconductor device and provides an operational supply voltage after certification of the semiconductor device. The operational supply voltage is lower than the test supply voltage. The voltage control circuit includes a clamp circuit having a plurality of voltage regulation devices, typically diodes. The voltage regulation devices control an output of the clamp circuit. A voltage regulator is electrically coupled to the clamp circuit and generates a first control signal based upon the output of the clamp circuit. A charge pump then receives the control signal from the voltage regulator, and, based on the value of the control signal, the charge pump generates the test supply voltage. At least one bypass device is connected to at least one of the plurality of voltage regulation devices. The bypass device is activated following the certification of the semiconductor device.

Abstract: A temperature compensation circuit having satisfactory linearity, a trimming circuit including a plurality of temperature gradients, and an acceleration detector having a wide applicable temperature range. A plurality of resistor elements R1 to R4, R5 to R8, R21 to R24, R25 to R28 are connected in series between a power supply voltage line and a ground voltage line. Resistor elements R9 to R14 are connected in series between connection nodes N1 and N3. Resistor elements R29 to R34 are connected in series between connection nodes N2 and N4. The resistor elements R1, R2, R4, R5, R7 to R14, R24, R25 have negative temperature coefficients. The resistor elements R3, R6, R21 to R23, R26 to R34 have positive temperature coefficients. An output terminal NT5 connects a connection node of the resistor elements R13 and R14 and a connection node of the resistor elements R30 and R29.

Abstract: A method and system is disclosed for device trimming. A device trimming system comprises at least one reference device to be trimmed having a reference electrical parameter, at least one trimming device to be coupled with the reference device for forming a trimmed reference device providing an altered reference electrical parameter based on a combination of the reference device and the trimming device, and at least one electrical fuse based control module for controlling whether the trimming device is to be coupled with the reference device based on a state of the electrical fuse.

Abstract: A fuse circuit may include a fuse cut detection unit to output state information indicating whether or not a fuse is cut during a fuse cut detection time period, a maintenance and output unit to maintain the state information and output a fuse state information signal, and a connection/disconnection unit to connect the fuse cut detection unit to the maintenance and output unit during the fuse cut detection time period and disconnect the fuse cut detection unit from the maintenance and output unit after the fuse cut detection time period. A fuse circuit may recognize an indefinite voltage at a detection node caused by a leakage path through a fuse as a predetermined fuse state.

Abstract: A fuse device includes a plurality of serially connected fuse elements whose number is n (n is an integer of two or more), a power source connected to one end of a first fuse element that is a top of the n serially connected fuse elements, and a plurality of program control transistors. Each of the program control transistors is connected to each of nodes between the fuse elements, and to an end of the n-th fuse element, respectively.

Abstract: A voltage regulator operable as a voltage follower while a fusible link is closed and in a regulated voltage mode when the fusible link becomes open. The voltage regulator can be formed on monolithic semiconductor chips. Patterned thin films including aluminum and nickel-iron, and aluminum and polycrystalline silicon, comprise the fusible link. With the fusible link closed, the voltage regulator output is an analog of positive polarity variable voltage levels at the regulator input. Systems powered by the voltage regulator are allowed to be programmed until system programming requiring variable voltage levels is complete. Afterwards, a negative polarity voltage is applied to the regulator input causing a large current to pass through the fusible link once the system programming is completed. Current thereby causes the fusible link to become opened and enables the voltage regulator to begin operating at a regulated voltage in response to positive voltage input.

Abstract: Disclosed are embodiments of an apparatus incorporating a detection circuit adapted for determining the state of selected fuses and a programming circuit for blowing selected fuses on demand. Also, disclosed are embodiments of an associated method. The detection circuit comprises a plurality of fuses in identical signal and reference legs in order to increase the signal margin for detecting blown fuses and/or current sources configured to pass offset currents through the signal and reference legs in order to set the trip point for detecting blown fuses between the un-blown and the minimum blown resistances. Thus, the invention provides the flexibility of single-sided fuse state detection devices with even greater sensitivity than both single-sided and differential fuse state detection device.

Abstract: A detect circuit may be used to detect one or more characteristics corresponding to the fuse being programmed. When the one or more characteristics of the fuse being programmed reach the desired states or values, the programming of the fuse is discontinued. Thus, the programming duration for each fuse is customized for each fuse. As a result, for some embodiments, there may be fewer fuses that have been over-programmed. In addition, for some embodiments, the range of impedances of the programmed fuses have a narrower distribution of impedances due to the use of the detect circuit.

Abstract: A programmable detection adjuster is disclosed. The programmable detection adjuster comprises a bandgap and an adjusting circuit. The bandgap comprises a power input terminal, a voltage output terminal, a main resistance and a plurality of resistors. The adjusting circuit comprises a plurality of adjusting resistors, a plurality of transistor switches, a logic controller and detection circuits; said adjusting resistors connected to the main resistance of the bandgap in series. The adjusting resistors are respectively connected to the transistor switch in parallel. The transistor switches are connected to the logic controller. The logic controller is respectively connected to the detection circuits. The detection circuit detects the corresponding resistances in the detection circuit and outputs a voltage level to the logic controller to enable the logic controller to control a conduction of the transistor switches according to a logic conversion table.

Abstract: A fuse structure includes a reference power layer disposed between first and second resistance-variable material layers. The first and second resistance-variable material layer may at least partially overlap each other in plan view. First and second insulating layers are disposed over and under the first and second resistance-variable material layers. A plurality of first leads is disposed over the first insulating layer. A plurality of second leads is disposed under the second insulating layer. A plurality of first via contacts penetrates the first insulating layer and connects between the first leads and the first resistance-variable material layer. A plurality of second via contacts penetrates the second insulating layer and connects between the second leads and the second resistance-variable material layer. Each of the first leads extends in a second horizontal direction that crosses a first horizontal direction in which the first and second resistance-variable material layer extend.

Abstract: The present disclosure provides an electrical fuse cell with redundancy features and the method for operating the same. The fuse cell includes a first set of electrical fuses having at least one electrical fuse contained therein, and a second set of electrical fuses having at least one electrical fuse for providing redundancy to at least one fuse of the first set, wherein if one of the first set of electrical fuses is defective, at least one of the second set of the electrical fuses can be programmed to provide a redundancy function of the defective fuse.

Abstract: An electrical fuse programming circuit and a method for programming an electrical fuse within the electrical fuse programming circuit use a programming circuit bus to which are electrically connected in parallel the electrical fuse and a bypass resistor. A current within the programming circuit bus is made to flow through the bypass resistor for a period of time sufficient to stabilize the current, and then sequentially and instantaneously switched to program the electrical fuse.

Abstract: A poly fuse trimming circuit. The poly fuse trimming circuit comprises a poly fuse and a silicon controlled rectifier (SCR) device. The poly fuse is coupled between a first fixed potential and an output node. The SCR device is controlled by a trimming signal and has an anode coupled to the output node and a cathode coupled to a second fixed potential.

Abstract: Provided is a semiconductor device including a divisional resistor having a fuse, and a divisional resistor for measuring relative accuracy which is obtained by eliminating the fuse from the divisional resistor having the fuse. Characteristic values of the divisional resistor for measuring relative accuracy are measured so as to obtain trimming data, and then the divisional resistor having the fuse is trimmed, to thereby obtain a semiconductor device with highly precise characteristics.

Abstract: A binary bidirectional trimming circuit is disclosed. The trimming circuit includes: a first resistor set having 4 resistors in parallel connected and a first fuse bridged two ends thereto provide one trimming step; a second resistor set having 2 resistors in series connected and a second fuse bridged two ends thereto provide eight trimming steps; a third resistor set having 2 resistors in parallel connected and a third fuse bridged two ends thereto provide two trimming steps; a fourth resistor set having 1 resistor and a fourth fuse bridged two ends thereto provide four trimming steps; a first loading resistor; and a second loading resistor. The first resistor set, second resistor set, first loading resistor, third resistor set, the fourth resistor set, and the second loading resistor are in series connected.

Abstract: The present invention provides a circuit for determining the optimal gate voltage for programming transistors. The determination of the optimal voltage compensates for the variations in the programming current due to process variations in manufacturing or due to ambient conditions. By applying the optimal gate voltage thus determined to the programming transistors of electrical fuses, the optimal level of current is passed through the electrical fuses to enable high yielding and reliable electrical fuse programming.

Abstract: A device controls internal voltage. Increased reliability of a semiconductor memory device is obtained by increasing or decreasing a level of internal reference voltage according to change of the device. Fuse ROMs generate fuse signals having different levels according to a cutting condition of each fuse. A bit counter performs up/down counting operation in response to a count control signal after setting the fuse signals to initial values in response to a set signal and generates counter output signals which are higher or lower than the initial values by a counting number. A decoder decodes the counter output signals and activates one of switching signals. A reference voltage selector provides a trimming level of internal reference voltage in response to the switching signals and generating reference voltage.

Abstract: Devices comprising trimmable electric units and methods for providing trim values to electric units are presented herein. One such device comprises a trimmable electric unit, at least one fuse to provide at least one first trim value, and a trim value provision unit to provide at least one second trim value, and a register. The register, which is connected to the electric unit, the at least one fuse, and the trim value provision unit, selectively stores the first and/or the second trim values and provides them to the electric unit. Optionally, a third trim value may be used. In the case of integrated circuits, provision of the trim values allows for on-chip debugging without waiting for creation of a test program used by automatic testing equipment at the wafer probe stage.

Abstract: A semiconductor integrated circuit is disclosed which includes a main transistor and at least one of a fuse transistor or an anti-fuse transistor (“fuse/anti-fuse transistor”). Each transistor type includes an active region formed in a semiconductor substrate, a gate stack comprising a gate insulation layer and a gate electrode sequentially formed on the active region, and source/drain regions separated across the gate stack, but the gate insulation layer of the fuse/anti-fuse transistor is selectively damaged during fabrication.

Abstract: A virtual electronic fuse (VEF) apparatus and methodology are disclosed that permit the state of an electronic fuse to change from an un-blown state to a blown state and then back to a virtual un-blown state. In one embodiment, the electronic fuse may change from the virtual un-blown state back again to a virtual blown state. The fuse apparatus includes multiple VEFs, each VEF exhibiting a respective address. The fuse apparatus also includes an address pool including multiple address pool locations. A fuse programmer stores an address of one of the VEFs in one or more address pool locations to indicate one or more state changes for a particular VEF. The fuse programmer may also store different VEF addresses in different address pool locations to indicate state changes for different VEFs.

Abstract: A virtual electronic fuse apparatus and methodology are disclosed that permit the state of an electronic fuse to change from an un-blown state to a blown state and then back to a virtual un-blown state. In one embodiment, the electronic fuse may change from the virtual un-blown state back to a virtual blown state.

Abstract: A first transistor is connected in series with one end of a fuse element. A second transistor is connected in series with the other end of the fuse element. A current flows through the fuse element when both the first and second transistors are turned on.

Abstract: Disclosed are embodiments of an apparatus incorporating a detection circuit adapted for determining the state of selected fuses and a programming circuit for blowing selected fuses on demand. Also, disclosed are embodiments of an associated method. The detection circuit comprises a plurality of fuses in identical signal and reference legs in order to increase the signal margin for detecting blown fuses and/or current sources configured to pass offset currents through the signal and reference legs in order to set the trip point for detecting blown fuses between the un-blown and the minimum blown resistances. Thus, the invention provides the flexibility of single-sided fuse state detection devices with even greater sensitivity than both single-sided and differential fuse state detection device.

Abstract: A read-out circuit is disclosed, where the circuit reads information out of a memory unit comprising two non-volatile memory cells. The cells have different programming states, and the memory information of the memory unit is given by the programming states of the two memory cells. The read-out circuit has a volatile signal memory, the inputs of which are connected to the read outputs of the memory cells.

Abstract: A method for sensing an electrical signal includes the steps of: providing an arrangement having a fuse connected in series to an antifuse, the arrangement further having an output tap connected to an intermediate node located between the fuse and the antifuse; programming the fuse and the antifuse; applying a sense signal across the combination of the programmed fuse and the programmed antifuse, and then measuring an output signal at the output tap.

Abstract: The reference current source circuit 10 is provided with a current source circuit 1, a trimming fuse 3, a switching circuit 2 which connects/disconnects the current source circuit 1 and/from the trimming fuse 3, a NAND circuit 4 which controls the operation of the switching circuit 2, and a pull-down resistor R1 which connects one input terminal of the NAND circuit 4 to a GND terminal. The NAND circuit 4 controls the operation of the switching circuit 2 upon receipt of control signals S1 and S2 and also in accordance with a signal of the one input terminal of the NAND circuit 4 so as to connect the current source circuit 1 to the trimming fuse 3. This arrangement makes it possible to measure characteristics of a semiconductor integrated circuit after fuse trimming. In addition, it is possible to maintain the state after fuse trimming without the supply of a signal from outside. Moreover, a reference current source circuit which does not consume extra consumption current is realized.

Abstract: A circuit for programming an antifuse coupled between a first node and a second node includes at least one transistor for supplying a programming potential VPP to the first node. A first transistor has a source coupled to a third node switchably coupleable between a potential of VPP/2 and ground potential, a drain, and a gate. A second transistor has a source coupled to the drain of the first transistor, a drain coupled to the second node, and a gate. Programming circuitry is coupled to the gate of the first transistor and the gate of the second transistor and configured to in a programming mode apply a potential of either zero volts or VPP/2 to the gate of the first transistor and to apply a potential of VPP/2 to the gate of the second transistor. The first and second transistors have a BVDss rating of not more than about VPP/2.

Abstract: A power supply controller having final test and trim circuitry. In one embodiment, a power supply controller for switched mode power supply includes a selector circuit, a trim circuit, a shutdown circuit and a disable circuit. The trim circuit includes a programmable circuit connection that can be selected by the selector circuit by toggling a voltage on an external terminal such as for example a power supply terminal, a control terminal or a function terminal of the power supply controller. The programmable circuit connection in the trim circuit can be programmed by applying a programming voltage to the external terminal. The shutdown circuit shuts down the power supply controller if the temperature rises above an over temperature threshold voltage. The shutdown circuit includes adjustment circuitry that can be used to test the shutdown circuit. The adjustment circuitry can adjust and reduce the over temperature threshold of the power supply controller.

Abstract: A design structure for electrically programmable fuse sense circuit having an electrically programmable fuse and a reference resistance. A first current source is coupled, through a first switch, to the electrically programmable fuse. A second current source is coupled, through a second switch, to the reference resistance. A precharge signal enables the first current source, the second current source and closes the first switch and the second switch, creating voltage drops across the electrically programmable fuse and the reference resistance. When the precharge signal goes inactive, the first current source and the second current source are shut off, and, at the same time the first switch and the second switch are opened. A latching circuit uses a difference in the voltage drops when the precharge signal goes inactive to store a state of the electrically programmable fuse, indicative of whether the electrically programmable fuse is blown or unblown.

Abstract: A sense amplifier for detecting a logic state of a selected electrical fuse cell among a number of unselected electrical fuse cells includes a bias module coupled to a power supply for generating a first current, and a tracking module coupled to the bias module for generating a second current. A current supplier is coupled to the bias module and the tracking module for generating a third current substantially equal to a sum of the first and second currents scaled by a predetermined factor, the third current being diverted into a first sub-current flowing through the selected electrical fuse cell and a second sub-current leaking through the unselected electrical fuse cells. The tracking module is so configured that the second current scaled by the predetermined factor is substantially equal to the second sub-current, thereby avoiding the first sub-current to be reduced by the second sub-current.

Abstract: A gate of a MOS transistor connected to a fuse device in series is controlled by an AND circuit connected to the same power source as the fuse device is connected, thereby pulling down one input of the AND circuit to a ground. Thus, misprogramming of the fuse device when an LSI power source is turned ON/OFF can be prevented.