Lens Or Reflective Image Former Testing Patents (Class 356/124)
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Publication number: 20110310410Abstract: Provided is a method of manufacturing imaging optical elements which cause a plural light beams to enter a deflection unit, and guide those beams to corresponding surfaces to be scanned, the imaging optical elements being arranged optically at the same position, having the same optical performance, the method including: measuring, with respect to the imaging optical elements having the same optical performance, the optical performance at each of a plurality of positions of the different light beam passing states; calculating a correction shape of an optical functional surface of the imaging optical element based on a deviation amount from a design value of the optical functional surface of the imaging optical element; performing correction processing on a shape of a mirror-finish insert of a mold for molding based on the correction shape of the optical functional surface; and performing molding by using the mirror-finish insert subjected to the correction processing.Type: ApplicationFiled: June 6, 2011Publication date: December 22, 2011Applicant: CANON KABUSHIKI KAISHAInventor: Hidekazu SHIMOMURA
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Patent number: 8078245Abstract: A method and apparatus for measuring an apparent depth of a section of an animal body are disclosed. Light is focused concurrently to an extended focal region comprising a plurality or continuum of measurement locations. Light reflected by a refractive index interface coincident with one of the plurality of measurement locations is detected. Detected light signals are generated from light reflected from first and second interfaces respectively defining the section under investigation, so that the apparent positions of the interfaces may be derived. A confocal arrangement and an axicon element may be employed. Preferably, the section is the aqueous humor of an eye. From changes in its refractive index corresponding changes in glucose concentration in the aqueous humor and, in turn, in the bloodstream of a patient may be derived, offering a non-invasive monitoring means for diabetic patients. Other compounds and structures of the body may alternatively be investigated.Type: GrantFiled: November 24, 2004Date of Patent: December 13, 2011Assignee: Lein Applied Diagnostics LimitedInventors: Daniel John Daly, Graeme Lawrence Clark
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Patent number: 8077300Abstract: A MTF measuring system includes measurement result screen data indicative of an object image and an MTF curve image are generated in accordance with the object image data obtained by photographing the object and the MTF curve image data indicative of the MTF curve generated from MTF data that become an index to evaluate lens performance. The measurement result screen based on the generated measurement result screen data is displayed on a real time basis in the case of evaluation measurement operations of the lens performance. A user can grasp the necessity for a focus adjustment from the MTF curve image on the measurement result screen. If necessary, the user can adjust the focus of the object displayed together with the MTF curve image, and at the same time can evaluate the lens performance from the MTF curve image.Type: GrantFiled: August 3, 2007Date of Patent: December 13, 2011Assignee: Acutelogic CorporationInventors: Takashi Masuda, Kouki Yoshida, Takaharu Aoki, Kenichiro Waki
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Patent number: 8049891Abstract: The present invention provides an adjustment method for a position detection apparatus which comprises an optical system including first and second optical members whose positions can be changed, and detects a position of an object, comprising the steps of calculating a value representing an asymmetry of a detection signal of a light which enters a photoelectric conversion device via the optical system, for each of a plurality of positions of the first optical member in a direction perpendicular to an optical axis of the optical system, specifying a position of the object in the direction of the optical axis, at which the value is insensitive, for each of the plurality of positions, and adjusting a position of the second optical member in the direction perpendicular to the optical axis based on the value at the position of the object specified in the specifying step.Type: GrantFiled: July 8, 2008Date of Patent: November 1, 2011Assignee: Canon Kabushiki KaishaInventor: Hironori Maeda
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Publication number: 20110255079Abstract: An auxiliary device for measuring the coaxiality of a lens. The auxiliary device includes a cylindrical main body having a first surface and a flat second surface facing away the first surface, and a protrusion formed on the first surface and defining a reference convex surface. The second surface of the main body defines a position part. The position part is coaxial with the reference convex surface and configured to engage with the lens to measure the coaxiality of the lens.Type: ApplicationFiled: August 12, 2010Publication date: October 20, 2011Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: TSUNG-YU LIN
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Patent number: 8041148Abstract: An image processing program causes a computer to execute the following steps. A first step reads data of a first image and data of a second image which are generated by imaging a common object under natural light and have different contents of specular reflection components. A second step generates an output image which gives a different visual impression of the object than the first image and the second image, based on difference data of the specular reflection components extracted from the first image and the second image.Type: GrantFiled: February 6, 2008Date of Patent: October 18, 2011Assignee: Nikon CorporationInventor: Mari Sugihara
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Patent number: 8040496Abstract: An endoscopic illumination tester is provided for testing illumination quality of a light source. The endoscopic illumination tester includes an optical bridge that is removably interlockable with the light source. The endoscopic illumination tester includes an integrating sphere that is removably interlockable with the optical bridge. The endoscopic illumination tester may further engage a light guide connectable between the optical bridge and the light source. An endoscope may be inserted between the optical bridge and the integrating sphere.Type: GrantFiled: March 16, 2007Date of Patent: October 18, 2011Assignee: Lighthouse Imaging CorporationInventors: Dennis C. Leiner, Michael Bush, David J. Biolsi
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Patent number: 8040497Abstract: By encoding process-related non-uniformities, such as different height levels, which may be caused by CMP or other processes during the fabrication of complex device levels, such as metallization structures, respective focus parameter settings may be efficiently evaluated on the basis of well-established CD measurement techniques.Type: GrantFiled: May 30, 2007Date of Patent: October 18, 2011Assignee: GLOBALFOUNDRIES Inc.Inventors: Thomas Werner, Frank Feustel, Kai Frohberg
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Publication number: 20110242520Abstract: An image of a pattern used for measurement formed on a reticle for testing is transferred onto a wafer for testing via a projection optical system, while gradually changing a position in an optical axis direction of the projection optical system. The image of the pattern used for measurement which has been transferred is detected, and an amount corresponding to an expanse of the image of the pattern in a measurement direction is obtained. In this case, four images included in the image of the pattern used for measurement are detected in detection areas, respectively, or in other words, remaining sections except for both ends in a non-measurement direction are detected, and for example, area of the remaining sections is to be obtained as the corresponding amount. Optical properties of the projection optical system are to be obtained, based on the area which has been obtained.Type: ApplicationFiled: November 16, 2010Publication date: October 6, 2011Applicant: NIKON CORPORATIONInventors: Junichi KOSUGI, Shigeru HIRUKAWA, Naoto KONDO
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Patent number: 8027813Abstract: A system and method of calculating estimated image profiles. The system and method includes providing lens characteristic data and performing simulation calculations for various levels of aberration components using the lens characteristic data. A response surface functional relation is built between selected variables of the lens characteristics, in particular the lens aberration components, and the Image Profile using the simulation calculations. Evaluation is then performed on the arbitrary specified aberration values of a lens in relation to the response surface functional relations to provide a calculated estimate of the Image Profile for the specified aberration values. A machine readable medium and exposure apparatus are also provided.Type: GrantFiled: February 20, 2004Date of Patent: September 27, 2011Assignee: Nikon Precision, Inc.Inventor: Steven Douglas Slonaker
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Patent number: 8023758Abstract: A two-dimensional (2D) mesh is applied over a distortion surface to approximate a lens roll-off distortion pattern. The process to apply the 2D mesh distributes a plurality of grid points among the distortion pattern and sub-samples the distortion pattern to derive corrected digital gains at each grid location. Non-grid pixels underlying grid blocks having a grid point at each corner are adjusted based on the approximation of the lens roll-off for the grid points of the grid block. In one example, bilinear interpolation is used. The techniques universally correct lens roll-off distortion irregardless of the distortion pattern shape or type. The technique may also correct for green channel imbalance.Type: GrantFiled: August 7, 2007Date of Patent: September 20, 2011Assignee: QUALCOMM IncorporatedInventors: Szepo Robert Hung, Jingqiang Li, Hsiang-Tsun Li, Xin Zhong
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Patent number: 8018583Abstract: An lens screening device for controlling diameters of lenses within a range from a lower threshold to a upper threshold. The lens screening device includes a number of connecting poles and two screening plates. Each of the screening plates includes a tray and a scraper slidably disposed on the tray and configure for scraping the tray. The tray defines a number of through holes of same diameter therein. The diameter of the through holes in an upper screening plate is larger than that of the through holes in a lower screening plate.Type: GrantFiled: June 17, 2009Date of Patent: September 13, 2011Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Chung-Pei Wang
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Patent number: 8009281Abstract: A lens module distortion measuring system configured to measure the distortion of a lens module including: a light source configured to emit light rays; a diffusing panel configured to diffuse the light rays; a substantially opaque shielding plate beneath the diffusing panel, the shielding plate defining a regular matrix of light-passing holes capable of allowing some of the diffused light rays to pass therethrough; an image capturing device configured to capture a image of the shielding plate as viewed through the lens module, the image comprising an array of light spots corresponding to the light-passing holes; and a computing unit electrically connected to the image capturing device and configured to analyze the light spots of the image and thereby determine the distortion of the lens module.Type: GrantFiled: September 9, 2009Date of Patent: August 30, 2011Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Jen-Tsorng Chang
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Patent number: 8004693Abstract: A lens holder includes a lens holding member having a mounting shaft portion and is configured to hold a lens provided with at least one hole mounting a fitting for a rimless frame or a dummy lens provided with at least one hole, a main body including an opened bottom surface, a shaft holding cylinder provided in the main body and configured to hold the mounting shaft portion of the lens holding member, a clamping member configured to clamp the shaft holding cylinder to the mounting shaft portion of the lens holding member, and at least one confirming hole provided in the main body. When the shaft holding cylinder is clamped to the mounting shaft portion of the lens holding member by the clamping member, the confirming hole is configured to allow the hole of the lens or the dummy lens to be viewed.Type: GrantFiled: March 27, 2009Date of Patent: August 23, 2011Assignee: Kabushiki Kaisha TOPCONInventors: Kenichi Kanno, Kenji Miyashita
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Publication number: 20110202421Abstract: More appropriate evaluation, design, and manufacture are made feasible by taking visual performances into consideration more appropriately. In order to achieve this object, in the present invention, spectacle lenses are evaluated using a visual acuity function including a factor representing physiological astigma. The physiological astigma herein means astigma in the phenomenon that an improved visual acuity is yielded when slight astigma is present in the region where the accommodation power is lower than the region indicating the range of positive relative accommodation power in which the accommodation power increases among the relative accommodation power as adaptable accommodation power in a state that convergence does not change.Type: ApplicationFiled: October 30, 2008Publication date: August 18, 2011Inventor: Tetsuma Yamakaji
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Patent number: 7990531Abstract: A method for inspecting lenses, especially wet contact lenses provided in a volume of liquid inside a container is described. A first image of the lens at a first position in the container is obtained, the lens then being moved to a second position within the container where a second image is obtained. A computer algorithm processes the first and second images to compare features that have moved with the lens to those features that have not moved with the lens whereby lenses are rejected if a feature has moved with the lens but is not a normal feature of the lens.Type: GrantFiled: June 5, 2008Date of Patent: August 2, 2011Assignee: CooperVision International Holding Company, LPInventors: Julie Ann Clements, Steven John Collier, Jennifer Susan Marsh
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Patent number: 7973915Abstract: A method for providing a flexible molding, in particular an ophthalmic lens such as a contact lens, in a predetermined orientation, comprises the steps of determining the actual orientation of the molding, and in case the molding has been determined as not having the predetermined orientation, inverting the flexible molding to the predetermined orientation.Type: GrantFiled: February 18, 2009Date of Patent: July 5, 2011Assignee: Novartis AGInventors: GĂ¼nter Lässig, Roger Biel
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Patent number: 7969563Abstract: A lens measuring device and method applied therein. The lens measuring device includes a light source, a first polarizer, a second polarizer, and an image analysis module. The method includes enabling the light source to orderly pass through the first polarizer, a lens to be measured, and the second polarizer to generate a light beam to be measured, and then enabling the image analysis module to analyze image-related information of the light beam to be measured, consequently deducing the structural center and energy distribution of the lens to be measured, and then further analyzing errors in polarity and skewness of the lens to be measured. By applying a common light source, the method is spared complicated correction that is otherwise required when a conventional collimating laser light source is applied, and the method can also easily and simultaneously test a plurality of lenses to be measured.Type: GrantFiled: January 29, 2009Date of Patent: June 28, 2011Assignees: National Taiwan University, National Applied Research LaboratoriesInventors: Chien-Ching Ma, Ching-Yuan Chang, Kuo-Cheng Huang, Shih-Feng Tseng
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Publication number: 20110143287Abstract: According to one embodiment relates to an optical system radially downsized and corrected well for aberration and is applicable, for example, to an aberration measuring apparatus for measuring wavefront aberration of a liquid immersion projection optical system. A catadioptric system of a coaxial type is provided with a first optical system which forms a point optically conjugate with an intersecting point with the optical axis on a first plane intersecting with the optical axis, on a second plane, and a second optical system which guides light from the first optical system to a third plane. The first optical system has a first reflecting surface arranged at or near the first plane, a second reflecting surface having a form of an ellipsoid of revolution the two focuses of which are aligned along the optical axis in a state in which one focus is located at or near a first light transmissive portion, and a medium filling an optical path between the first reflecting surface and the second reflecting surface.Type: ApplicationFiled: September 10, 2010Publication date: June 16, 2011Inventor: Yasuhiro Ohmura
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Publication number: 20110134417Abstract: An instrument (1) for characterizing an optical system, includes: at least one primary source (3) for emitting an illumination light beam (FE); an optical device for directing the illumination beam (FE) onto the optical system (L) to be characterized; a wave front analyzer (4) adapted for receiving a beam from the optical system (L); and a unit for processing the measure signals from the wave front analyzer (4), adapted for providing characterization information of the optical system (L). The instrument further includes a scattering member (22) substantially provided in the focal plane of the optical system (L) so as to create a secondary source generating a secondary beam flowing through the optical system (L) and further directed towards the wave front analyzer.Type: ApplicationFiled: January 16, 2009Publication date: June 9, 2011Applicant: IMAGINE OPTICInventors: Xavier Levecq, Guillaume Dovillaire
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Patent number: 7956994Abstract: A measurement apparatus which measures a transmittance distribution of an optical system, comprises a light source, a first spherical mirror which forms reference light by reflecting light which is emitted by the light source and is not transmitted through the optical system, a second spherical mirror which forms test light by reflecting light which is emitted by the light source and is transmitted through the optical system, a measurement unit which measures intensity distributions of the reference light and the test light, a unit which calculates reflectance distributions of the first spherical mirror and the second spherical mirror, and an arithmetic unit which calculates a transmittance distribution on a pupil plane of the optical system, on the basis of the intensity distributions of the reference light and the test light, and the reflectance distributions of the first spherical mirror and the second spherical mirror.Type: GrantFiled: October 27, 2008Date of Patent: June 7, 2011Assignee: Canon Kabushiki KaishaInventor: Naoto Hayashi
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Patent number: 7952696Abstract: An exposure measurement apparatus is configured by including a size measurer measuring respective sizes of at least a pair of transferred patterns having mutually different optimal focus positions out of a plurality of transferred patterns formed by being transferred onto a transfer object, a difference value calculator obtaining a difference value between the size of one transferred pattern and the size of the other transferred pattern, a focus variation amount calculator calculating a focus variation amount of the transfer object using the difference value, and an exposure variation amount calculator calculating an exposure error amount of a wafer.Type: GrantFiled: October 27, 2004Date of Patent: May 31, 2011Assignee: Fujitsu Semiconductor LimitedInventor: Tomohiko Yamamoto
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Patent number: 7948616Abstract: An image of an aperture pattern that includes an L/S pattern having a linewidth that exceeds the measurement resolution of a measurement device is generated in each of divided areas on a wafer via an optical system. A part of each of the divided areas on the wafer exposed via a projection optical system, and an image of the aperture pattern after removal of a part of the image of the L/S pattern is formed in each of the divided areas. An image of the pattern that is obtained by removing a part of the pattern is formed in each of the divided areas after the wafer is developed. Measurement is performed by a measurement device using the wafer as a sample, and the optical characteristics of the projection optical system (such as a best focus position, field of curvature, or astigmatism) are obtained.Type: GrantFiled: April 11, 2008Date of Patent: May 24, 2011Assignee: Nikon CorporationInventor: Kazuyuki Miyashita
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Patent number: 7944553Abstract: A method and system for measuring an optical property of a multi-focal lens are disclosed. One embodiment of the method comprises: filtering out light transmitted by all but one of a plurality of diffraction orders of the lens to provide an unfiltered light from a single diffraction order; receiving the unfiltered light at a wavefront detector; and analyzing the unfiltered light at the wavefront detector to measure the optical property. The multi-focal lens can be a multi-focal diffractive intra-ocular lens. The measured optical property can be a discontinuity in the lens surface. Filtering can comprise blocking all but the unfiltered light using an aperture operable to let through the unfiltered light from the single diffraction order, and/or blocking all but the unfiltered light using an opaque obstruction operable to let through only a selected amount of light corresponding to the light transmitted by the single diffraction order.Type: GrantFiled: February 8, 2010Date of Patent: May 17, 2011Assignee: Alcon, Inc.Inventors: Michael J. Simpson, Jihong Xie
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Patent number: 7944552Abstract: A method for displaying a result of measurement of eccentricity in an optical system is provided where an amount of eccentricity for each lens element's surface in a lens system can be displayed and where the amount of eccentricity displayed can be a magnified amount of eccentricity. Additionally a sectional view of the lens system can be displayed using scaling factor.Type: GrantFiled: August 4, 2008Date of Patent: May 17, 2011Assignee: Canon Kabushiki KaishaInventor: Yasunori Murata
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Patent number: 7941232Abstract: By repeatedly executing a predetermined measurement at set intervals, data on a predetermined performance (a best focus position) of a predetermined apparatus and data on variation factors of the performance are obtained (Steps 204 to 214). Based on the obtained data, multivariate analysis is performed and a model equation that is used to predict a variation amount of the performance and includes at least one of the variation factors as a variable is derived (Step 214). Therefore, after deriving the model equation, a variation amount of the performance can be predicted using the model equation by obtaining data on the variation factor that serves as the variable (Step 238). Accordingly, it becomes possible to maintain the performance described above with good accuracy in accordance with the prediction results and also optimize the implementation timing of maintenance and the like.Type: GrantFiled: September 15, 2006Date of Patent: May 10, 2011Assignee: Nikon CorporationInventors: Yuuki Ishii, Shinichi Okita
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Publication number: 20110102775Abstract: An ophthalmic lens scanner includes an inspection platform configured to receive an ophthalmic lens thereon. A camera is spaced apart from the inspection platform and is arranged to, in response to an activation signal, capture an image of the ophthalmic lens. A light source is spaced apart from the inspection platform and is configured to emit light when the camera is activated to capture an image of the ophthalmic lens. The inspection platform is located between the camera and the light source. A first Fresnel lens is located between the inspection platform and the camera. A second Fresnel lens is located between the inspection platform and the light source. The ophthalmic lens scanner may be incorporated in an ophthalmic lens scanner system that includes a computing device and a display device.Type: ApplicationFiled: November 4, 2010Publication date: May 5, 2011Applicant: Practical engineering, LLCInventors: Richard C. Palmer, Spencer Daniel Luster, Keith Alan Flick, James D. Goerges, Jake Schneider
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Patent number: 7936451Abstract: The invention relates to a method for machining and estimating an optical lens which is designed as a semi-finished product, with a pre-finished form of a first side and a second side to be machined, in which a pre-specified form of a surface of the second side to be machined is estimated, wherein prior to estimating the pre-specified form of the surface of the second side, an actual form of the surface of the first side is measured using measuring means and is incorporated into the estimation of the pre-specified form of the surface of the second side.Type: GrantFiled: December 4, 2009Date of Patent: May 3, 2011Assignee: Schneider GmbH & Co. KGInventors: Gunter Schneider, Helwig Buchenauer, Stephan Huttenhuis
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Patent number: 7916284Abstract: In a scatterometric method differential targets with different sensitivities to parameters of interest are printed in a calibration matrix and difference spectra obtained. principal component analysis is applied to the difference spectra to obtain a calibration function that is less sensitive to variations in the underlying structure than a calibration function obtained from spectra obtained from a single target.Type: GrantFiled: July 18, 2006Date of Patent: March 29, 2011Assignee: ASML Netherlands B.V.Inventors: Mircea Dusa, Arie Jeffrey Den Boef, Hugo Augustinus Joseph Cramer
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Publication number: 20110069304Abstract: A device is provided for demonstrating and testing the cosmetic qualities of an ophthalmic lens by viewing, the device comprising both a bearing wall (2) for bearing against a fixed surface and provided on its face opposite from its bearing face with a viewing target (3), and also a support wall (4) for supporting said lens and placed at a distance lying in the range 20 mm to 50 mm from said face of said bearing wall (2) that is provided with the target. According to the invention, the device is constituted by a support part (1) constituted by a channel-section member having its flanges forming said bearing surface (2) and said support wall (4), the support wall being provided with at least one orifice (5) of dimensions smaller than the dimensions of said lens, and said bearing surface and said support surface being inclined relative to each other by an angle lying in the range 0° to 25°.Type: ApplicationFiled: May 15, 2009Publication date: March 24, 2011Inventors: Nadolny Carole, Sylvie Tantin
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Patent number: 7907263Abstract: The present invention provides a method including measuring a wavefront aberration of the optical system to be measured on a measurement surface, measuring a pupil transmittance distribution of the optical system determining a pupil function of the optical system based on the wavefront aberration and the pupil transmittance distribution, and performing imaging computation using the pupil function to obtain a light intensity distribution formed on an image plane of the optical system, and calculating a flare, generated in the optical system, from the light intensity distribution.Type: GrantFiled: June 28, 2009Date of Patent: March 15, 2011Assignee: Canon Kabushiki KaishaInventors: Michiko Aizawa, Eiji Aoki, Osamu Kakuchi, Yoshiyuki Kuramoto
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Patent number: 7907262Abstract: Apparatus for indicating the departure of a shape of an object from a specified shape is described. The apparatus includes a light source for directing an incident beam of radiation onto the object, and an inspecting device for inspecting the final beam after transmission by or reflection from the object. The apparatus is arranged so that the final beam will have a substantially planar wavefront when the object has the specified shape, and said inspecting device is arranged to determine any departure of the wavefront of the final beam from planarity. In one embodiment, the inspecting device includes a beamsplitter, for example a diffraction grating or hologram, and a detector such as a CCD camera. The beamsplitter is then arranged to split the final beam into two or more beams and to direct the two or more beams to laterally displaced locations on the detector.Type: GrantFiled: February 10, 2005Date of Patent: March 15, 2011Assignee: QinetiQ LimitedInventors: Andrew M Scott, Andrew C Lewin
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Patent number: 7898663Abstract: A uniform light generating system for testing an image-sensing device includes a light-generating unit, a light-transmitting unit, a light-diffusing unit, and a lens unit. The light-generating unit has a substrate and a plurality of light-emitting elements electrically disposed on the substrate. The light-transmitting unit has one side communicated with the light-generating unit for receiving and uniformizing light beams projected from the light-emitting elements. The light-diffusing unit has one side disposed on the other side of the light-transmitting unit for receiving and diffusing the light beams that have passed through the light-transmitting unit. The lens unit is disposed on the other side of the light-diffusing unit for transmitting the light beams that have passed through the light-diffusing unit to the image-sensing device.Type: GrantFiled: September 30, 2008Date of Patent: March 1, 2011Assignee: Youngtek Electronics CorporationInventors: Bily Wang, Kuei-Pao Chen, Chih-Ming Wang
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Patent number: 7884928Abstract: A cup attaching apparatus for attaching a cup as a processing jig to an eyeglass lens including an illumination optical system including an illumination light source arranged to illuminate a side of the front surface of the lens by light from the light source; an imaging optical system including an imaging device and a retroreflection member placed on an opposite side from the light source with respect to the lens; an image processing device adapted to process an image signal from the imaging device to detect at least one of a mark point provided on a unifocal lens, a small lens portion of a bifocal lens, and a progressive mark provided on a progressive focal lens and obtain a position of the detected one; and an arithmetic control device adapted to determine an attaching position of the cup based on the position obtained by the image processing device.Type: GrantFiled: May 15, 2008Date of Patent: February 8, 2011Assignee: Nidek Co., Ltd.Inventors: Toshiaki Mizuno, Yoshinori Matsuyama, Toshiro Matsumoto, Kenji Suzuki, Satoshi Imaizumi
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Publication number: 20110026014Abstract: A system for calculating intrinsic properties and an entry pupil location of an adjustable camera lens is disclosed. The system includes a camera and a calibration target. Methods for calculating intrinsic properties and an entry pupil location of an adjustable camera lens are also disclosed.Type: ApplicationFiled: July 8, 2010Publication date: February 3, 2011Applicant: Lightcraft Technology, LLCInventors: Newton Eliot Mack, Philip R. Mass
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Patent number: 7880869Abstract: A calibration apparatus and method for optical system assembly is provided, applicable to a finite conjugate optical system to determine the optimal image-forming positions of the light source and the focus object lens of the finite conjugate optical system. The apparatus includes an external light source, a low magnification image-forming optical system, an electrical control system and a monitor. When the parallel beam generated by the external light source is parallel to the optical axis of the finite conjugate optical system, the low magnification image-forming optical system is used to magnify the two focal spots formed by the external light source and the internal light source of the finite conjugate optical system to be calibrated. Finally, by adjusting the related position of the focus object lens or the internal light source of the finite conjugate optical system, the optimal relative positions between the light source and the focus object lens of the finite conjugate optical system can be found.Type: GrantFiled: May 13, 2009Date of Patent: February 1, 2011Assignee: TopRay Technologies, Inc.Inventors: Tsung-Min Yang, Wei-Chih Lu
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Patent number: 7880902Abstract: The probe comprises a light source (20), means for shaping (24, 25, 21) the beam emitted by said light source and the beam coming from a surface arranged close to a target distance, an optical detector unit (22), comprising a pinhole diaphragm (26) and a photoelectric detector (28), providing a voltage peak (31) when said surface is at said target distance and further comprising a diaphragm (27) with a hole larger than said pinhole and a photoelectric detector (29), providing a voltage greater than that produced by said detection sensor (28), except when said surface is a the target distance. The method uses the probe to measure the thickness of an optical lens.Type: GrantFiled: January 11, 2006Date of Patent: February 1, 2011Assignees: Essilor International (Compagnie Generale d'Optique), MB OptiqueInventors: Frederic Dubois, Michael Bray
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Patent number: 7876428Abstract: A method includes a step of contactless optical measurement of the local value of at least one refringence optical characteristic of the lens over defined local zone around the measurement point of the lens, and at least one step of determining the axial position of the measurement point on one of the faces of the lens; the axial position of the measurement point obtained is compared with the local value of the optical characteristic of the lens at the measurement point as determined from the contactless optical measurement, in order to deduce therefrom at least one vertex optical power of the lens at the measurement point.Type: GrantFiled: June 4, 2007Date of Patent: January 25, 2011Assignee: Essilor International (Compagnie Generale d'Optique)Inventor: Fabien Divo
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Patent number: 7876429Abstract: The evaluating apparatus evaluates a restoration-premised lens which is employed in an image forming system that converts an optical image into an electronic image and then enforces a restoration processing on the electronic image in order to obtain a sharp image, is actually manufactured based on such design as premised on the restoration processing. The evaluating apparatus includes an evaluating corrective optical system, measuring section and evaluating section. The evaluating corrective optical system, when it is combined with a lens manufactured just as designed, forms a sharp optical image. The measuring section measures the optical characteristics of a composite optical system provided by combining together the evaluating corrective optical system and the manufactured lens. The evaluating section evaluates the manufactured lens according to measured results provided by measuring section.Type: GrantFiled: July 17, 2008Date of Patent: January 25, 2011Assignee: Fujinon CorporationInventor: Ryoko Tomioka
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Patent number: 7869017Abstract: One embodiment of the invention provides an test apparatus having a plurality of combinations of object distances and being used for testing an optical device. The test apparatus comprises at least one reflector, at least one first target module and at least one second target module. The first target module is for forming a first patterned light beam being shed on the optical device. The second target module is for forming a second patterned light beam being reflected by the reflector and then shed on the optical device. The third target module is for forming a quasi-parallel third patterned light beam being shed on the optical device. The distance between the first target module and the optical device is smaller than the distance between the second target module and the optical device.Type: GrantFiled: August 14, 2009Date of Patent: January 11, 2011Assignee: UMA Technology Inc.Inventors: Chang Yuan Lee, Wen Wen Teng
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Patent number: 7855782Abstract: The present invention relates to an inspection system for the automatic inspection of ophthalmic lenses, preferably in an automated lens manufacturing line. The inspection system provides a phase contrast imaging unit and an inspection method using said phase contrast imaging unit designed to recognize defective lenses with an improved degree of reliability but that does not falsely sort out perfect lenses.Type: GrantFiled: January 7, 2010Date of Patent: December 21, 2010Assignee: Novartis AGInventors: Roger Biel, Livio Fornasiero
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Publication number: 20100309458Abstract: Disclosed is an asphere measurement method capable of measuring the surface deviations and the surface tilts with high accuracy even when an asphere to be measured does not have the wedge-shaped flat portion. Provided is an asphere measurement method of measuring surface deviations and surface tilts of an asphere having a first detection target surface and a second detection target surface formed as aspheric surfaces which are rotationally symmetric. The method includes, in order of measurement: a first interference fringe acquisition step; a second interference fringe acquisition step; a first shape data acquisition step; a second shape data acquisition step; a first axis data acquisition step; a second axis data acquisition step; and a surface deviation/tilt analysis step.Type: ApplicationFiled: May 24, 2010Publication date: December 9, 2010Inventors: Zongtao GE, Ping Sun
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Publication number: 20100290036Abstract: A calibration apparatus and method for optical system assembly is provided, applicable to a finite conjugate optical system to determine the optimal image-forming positions of the light source and the focus object lens of the finite conjugate optical system. The apparatus includes an external light source, a low magnification image-forming optical system, an electrical control system and a monitor. When the parallel beam generated by the external light source is parallel to the optical axis of the finite conjugate optical system, the low magnification image-forming optical system is used to magnify the two focal spots formed by the external light source and the internal light source of the finite conjugate optical system to be calibrated. Finally, by adjusting the related position of the focus object lens or the internal light source of the finite conjugate optical system, the optimal relative positions between the light source and the focus object lens of the finite conjugate optical system can be found.Type: ApplicationFiled: May 13, 2009Publication date: November 18, 2010Inventors: Tsung-Min Yang, Wei-Chih Lu
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Patent number: 7834990Abstract: An evaluation method for evaluating optical characteristics of an optical system, the evaluation method includes: providing an optical system that is an evaluation object and that has a light incidence section and a light emission section; disposing a first pattern having a fist predetermined pitch, in an optical path of light which is incident onto the light incidence section; disposing a projection surface having a second pattern with a second predetermined pitch, at the position to which the light emitted from the light emission section is reached; projecting an image of the first pattern onto the projection surface through the optical system; and evaluating the optical characteristics of the optical system by observing a state of moiré fringes which are generated onto the projection surface due to interference between the image and the second pattern.Type: GrantFiled: December 19, 2007Date of Patent: November 16, 2010Assignee: Seiko Epson CorporationInventors: Eiji Morikuni, Hideya Seki, Akira Shinbo
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Patent number: 7831105Abstract: The invention is directed to a method for determining the image quality of an optical imaging system and to the use of the method according to the invention for determining the influence of samples on the amplitude distribution and phase front distribution of the illumination light, of which the amplitude distribution is known in particular.Type: GrantFiled: June 11, 2004Date of Patent: November 9, 2010Assignee: Carl Zeiss SMS GmbHInventors: Thomas Engel, Herbert Gross
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Patent number: 7826044Abstract: A measurement method for measuring an optical characteristic of a target optical system includes the steps of introducing a light from each of plural patterns that reduce diffracted lights other than a predetermined order, to a different position on a pupil plane of the target optical system, the introducing step including the step of scanning the light in a radial direction in the pupil plane of the target optical system, detecting a imaging position of the light introduced by the introducing step, on an image plane of the target optical system, and obtaining the optical characteristic of the target optical system based on a detection result of the detecting step.Type: GrantFiled: August 24, 2006Date of Patent: November 2, 2010Assignee: Canon Kabushiki KaishaInventor: Yoshihiro Shiode
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Publication number: 20100245804Abstract: An optical element to be measured is irradiated with the light which has passed through an indicator, thereby to form an indicator image on an image pick-up surface. Maximum peak coordinates are specified and stored as a position of the indicator image relating to the first surface. Whether the second largest peak may be specified or not is determined. In case that this result is NO, the maximum peak indicator image is deleted, and maximum peak coordinates are specified again and stored as a position of the indicator image relating to the second surface.Type: ApplicationFiled: March 26, 2010Publication date: September 30, 2010Inventors: Zongtao GE, Kenichi TAKAHASHI
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Patent number: 7792366Abstract: An optical element to be measured is irradiated with the light which has passed through an indicator, thereby to form an indicator image on an image pick-up surface. Maximum peak coordinates are specified and stored as a position of the indicator image relating to the first surface. Whether the second largest peak may be specified or not is determined. In case that this result is NO, the maximum peak indicator image is deleted, and maximum peak coordinates are specified again and stored as a position of the indicator image relating to the second surface.Type: GrantFiled: March 26, 2010Date of Patent: September 7, 2010Assignee: Fujinon CorporationInventors: Zongtao Ge, Kenichi Takahashi
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Patent number: 7791718Abstract: Light is irradiated on a light-shielding pattern on an object surface side of a projection optical system, and light intensity distribution of the light having passed through the projection optical system and slits is detected while slits of an aerial image measuring unit on the image plane side of the projection optical system are moved within a plane perpendicular to the optical axis of the projection optical system, The information concerning the flare of the projection optical system is computed from the light intensity distribution, so that the influence of resist coated on a wafer used in a conventional exposing method can be eliminated, and highly accurate measurement of information concerning the flare can be realized. Further, measurement of information concerning the flare can be performed in a short time comparing to the exposing method because development process or the like of the wafer is not necessary.Type: GrantFiled: September 30, 2005Date of Patent: September 7, 2010Assignee: Nikon CorporationInventor: Tsuneyuki Hagiwara
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Patent number: RE41877Abstract: Multidirectional retroreflectors and methods of reflecting light beams from multiple directions are provided. The multidirectional retroreflectors utilize a four-mirror retroreflector with a common virtual reflection point.Type: GrantFiled: January 16, 2008Date of Patent: October 26, 2010Assignee: Associated Universities, Inc.Inventor: David H. Parker