Photoelectric Patents (Class 356/218)
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Patent number: 6774988Abstract: The optical system of the present invention includes a lens system assembly, a spectral filter material and a pixel array configured such that small, distant, light sources can be reliably detected. The optical system of the present invention provides accurate measurement of the brightness of the detected light sources and identification of the peak wavelength and dominant wavelength of the detected light sources. Use of the optical system of the present invention provides the ability to distinguish headlights of oncoming vehicles and taillights of leading vehicles from one another, as well as, from other light sources.Type: GrantFiled: July 30, 2002Date of Patent: August 10, 2004Assignee: Gentex CorporationInventors: Joseph S. Stam, Jon H. Bechtel, Spencer D. Reese, Darin D. Tuttle, Gregory S. Bush, Harold C. Ockerse
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Publication number: 20040150812Abstract: There are disclosed a mounting information-collecting device which is capable of collecting mounting information concerning mounted statuses of circuit boards with high accuracy and efficiency, as well as a connector and a mounting information-collecting method therefor. A light-emitting device emits an optical signal. A plurality of optical signal-processing elements each apply processing to the optical signal in a manner unique to a corresponding one of the circuit boards to thereby generate a processed optical signal. A mounting information-collecting device receives the processed optical signal and detects whether or not the processing has been applied, to thereby collect the mounting information.Type: ApplicationFiled: December 23, 2003Publication date: August 5, 2004Inventors: Fumihiko Saito, Takahiro Hosokawa, Shinji Hiyama, Hiroshi Nakaide
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Patent number: 6760099Abstract: A sun meter having a processor receiving a signal from a photocell. The processor first compares the signal to a first threshold to determine if it is daytime. If it is daytime, the processor then compares the signal to a second threshold to determine if the signal is greater than a value selected to correspond with direct sunlight. If the signal is greater than the second threshold, a counter counts. For each day of use, the amount of time of direct sun is tallied and may be displayed. An average amount of direct sun for a period of days may also be displayed. It is anticipated that a plurality of meters will be utilized in a specific area to determine the specific locations which receive the most direct sunlight and then know what plants will thrive and where to place such plants.Type: GrantFiled: March 26, 2002Date of Patent: July 6, 2004Inventors: Joseph D. Lewis, William Street, Al Alfers
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Patent number: 6738133Abstract: Methods, apparatus, and systems, including computer program products, implementing and using techniques for measuring multi-channel single-shot transient signals. A signal acquisition unit receives one or more single-shot pulses from a multi-channel source. An optical-fiber recirculating loop reproduces the one or more received single-shot optical pulses to form a first multi-channel pulse train for circulation in the recirculating loop, and a second multi-channel pulse train for display on a display device. The optical-fiber recirculating loop also optically amplifies the first circulating pulse train to compensate for signal losses and performs optical multi-channel noise filtration.Type: GrantFiled: April 4, 2002Date of Patent: May 18, 2004Assignee: YY Labs, Inc.Inventor: Yan Yin
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Patent number: 6734957Abstract: An apparatus for collecting and sensing light in a projector, comprising a cold mirror positioned directly in the incident light path from a lamp and illumination optics of the projector for reflecting a large portion of visible light towards a light imaging device while transmitting IR and UV light and a small portion of the visible light; a secondary mirror for reflecting the small portion of the visible light, an integrating box positioned to collect and integrate the small portion of visible light, a light tube in optical communication with the integrating box for further integrating and attenuating the small portion of visible light, and an electro-optic device within the light tube for measuring the small portion of visible light within the light tube and generating an electrical signal in response thereto.Type: GrantFiled: January 31, 2002Date of Patent: May 11, 2004Assignee: Christie Digital Systems, Inc.Inventors: Terry Schmidt, John Parkin
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Patent number: 6724472Abstract: Object: provide an accurate monitor of light of even intensity light. Construction: A beam splitter (4) being fixed on a base (1) in the path of a main beam (2) of a light system, a reflecting mirror (5) being fixed on a side of the beam splitter (4), an inlet 6a of an integrating sphere (6) is provided at an opposite side of the beam splitter (4), and a light sensor (8) is provided at a reflecting surface of the integrating sphere (6).Type: GrantFiled: January 14, 2002Date of Patent: April 20, 2004Assignee: Ushikata Mfg. Co., Ltd.Inventor: Akio Kubo
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Publication number: 20040061849Abstract: An optical power measuring apparatus for successively measuring optical power in a time series and displaying a time axis change of the measurement values as a measurement screen fixedly displays the latest measurement value of optical power on the measurement screen, and improves a working factor of an optical axis adjustment.Type: ApplicationFiled: September 25, 2003Publication date: April 1, 2004Inventor: Hiroshi Kubota
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Patent number: 6714293Abstract: An exposure meter has both function of an incident light type exposure meter for measuring an exposure value of an object by an incident light to the object and a reflected light type exposure meter for measuring exposure value of the object by a reflected light from the object. A latitude of a film is calculated from the exposure value by the incident light. The exposure value by the incident light and an upper and a lower limit values of the latitude are displayed on a display device. At least one exposure value measured by the reflected light is further displayed on the display device comparably with the latitude.Type: GrantFiled: September 7, 2001Date of Patent: March 30, 2004Assignee: Minolta Co., Ltd.Inventors: Yasushi Goto, Yoshio Yuasa
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Patent number: 6714292Abstract: A position measuring system that includes a graduation support having a first detent and a detector arrangement on a holder for scanning the graduation support at a preset scanning distance. An adjusting device that sets the preset scanning distance, the adjusting device is displaceable relative to the holder along a first direction from a mounting position to an operating position. The adjusting device includes a second detent which, in the mounting position, acts together with the first detent of said graduation support acting in the first direction, and the first and second detents are out of engagement at the operating position and a receiver which, at the mounting position, maintains the graduation support oriented perpendicularly with respect to the first direction, and the receiver is removed from the graduation support by being displaced in the first direction.Type: GrantFiled: July 30, 2002Date of Patent: March 30, 2004Assignee: Dr. Johannes Heidenham GmbHInventor: Johann Mitterreiter
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Patent number: 6707543Abstract: There are disclosed a mounting information-collecting device which is capable of collecting mounting information concerning mounted statuses of circuit boards with high accuracy and efficiency, as well as a connector and a mounting information-collecting method therefor. A light-emitting device emits an optical signal. A plurality of optical signal-processing elements each apply processing to the optical signal in a manner unique to a corresponding one of the circuit boards to thereby generate a processed optical signal. A mounting information-collecting device receives the processed optical signal and detects whether or not the processing has been applied, to thereby collect the mounting information.Type: GrantFiled: November 19, 2001Date of Patent: March 16, 2004Assignee: Fujitsu LimitedInventors: Fumihiko Saito, Takahiro Hosokawa, Shinji Hiyama, Hiroshi Nakaide
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Publication number: 20040042000Abstract: A method and system for measuring the temporal response of a micromirror array to a variety of driving signals. A micromirror array is illuminated with a coherent light source so that a diffraction pattern is reflected from the micromirror array. One or more photodetectors are aligned with spots of light in the diffraction pattern that correspond to orders of the diffraction pattern. Diffraction pattern theory predicts that the intensity of these spots of light will vary as the tilt angle of the micromirrors is changed. Thus, by measuring the relative intensity of the spots of light as the micromirror array is provided with a variety of driving signals, many performance characteristics of the micromirror array can be measured. Some of these characteristics include the impulse response, the forced resonant frequency (i.e. the natural frequency), the damped resonant frequency, the quality factor of the micromirror response, the damping factor of the micromirror response, and the frequency transfer function.Type: ApplicationFiled: August 29, 2002Publication date: March 4, 2004Applicant: Texas Instruments IncorporatedInventors: David Joseph Mehrl, Kun Cindy Pan, Mark Henry Strumpell, Rand Derek Carr
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Publication number: 20040032580Abstract: There is described a method of characterizing a short laser pulse, the method comprising the steps of obtaining root-mean-square widths of the pulse through second order moments of the pulse; obtaining a spectral width of the pulse using the root-mean-square widths; obtaining a root-mean square temporal width of the pulse; and defining a Pulse Quality Factor proportional to a product of the spectral width and the temporal width. This approach does not require complete characterization of laser pulses and eliminates the need of any assumption to interpret autocorrelation traces. The method can be applied to pulses of arbitrary shape.Type: ApplicationFiled: May 6, 2003Publication date: February 19, 2004Inventors: Michel Piche, Guy Rousseau
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Patent number: 6690455Abstract: An illuminance measurement apparatus for measuring the illuminance of illumination light on an image plane of a projection optical system of an exposure apparatus designed to project the image of a pattern from an illuminated mask on a substrate held on a substrate stage by the projection optical system, including an illuminance meter detachably attached to the substrate stage, the illuminance meter having an illuminance detector, a transmitter for wirelessly transmitting a measurement result of the illuminance detector, a storage cell, and a photoelectric converter for converting part of the illumination light photoelectrically and storing it in the storage cell, and a receiver for receiving the wireless signal including the measurement results transmitted by the transmitter.Type: GrantFiled: March 22, 2001Date of Patent: February 10, 2004Assignee: Nikon CorporationInventor: Tsuyoshi Fujinaka
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Publication number: 20040021853Abstract: The optical system of the present invention includes a lens system assembly, a spectral filter material and a pixel array configured such that small, distant, light sources can be reliably detected. The optical system of the present invention provides accurate measurement of the brightness of the detected light sources and identification of the peak wavelength and dominant wavelength of the detected light sources. Use of the optical system of the present invention provides the ability to distinguish headlights of oncoming vehicles and taillights of leading vehicles from one another, as well as, from other light sources.Type: ApplicationFiled: July 30, 2002Publication date: February 5, 2004Inventors: Joseph S. Stam, Jon H. Bechtel, Spencer D. Reese, Darin D. Tuttle, Gregory S. Bush, Harold C. Ockerse
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Publication number: 20030234924Abstract: An optical device measuring apparatus includes a photodetector receiving light emitted from an optical device, and an introduction portion for introducing the emitted light transmitted through the photodetector to an optical fiber.Type: ApplicationFiled: June 18, 2003Publication date: December 25, 2003Applicant: FUJITSU QUANTUM DEVICES LIMITEDInventor: Haruyoshi Ono
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Publication number: 20030210390Abstract: A blood leak detector is disclosed having a light source projecting a beam along an optical path, wherein the beam has a wavelength in a range of about 800 nm to 930 nm; a light detector receiving the beam; a housing with a slot to receive a transparent tube between the light source and light detector and aligned with the optical path.Type: ApplicationFiled: February 19, 2003Publication date: November 13, 2003Inventors: John J. O'Mahony, Edwin B. Merrick, Sonny Behan
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Patent number: 6633374Abstract: A dosimeter for evaluating the degree of illumination by a change in coloration includes a substrate on which is positioned a light-sensitive coloring substance, where the coloring substance is formed of a mixture of several organic dyes dispersed in a polymer matrix and coated onto paper.Type: GrantFiled: April 13, 2001Date of Patent: October 14, 2003Assignee: Centre National de la Recherche Scientifique (C.N.R.S.)Inventor: Bertrand Lavedrine
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Publication number: 20030184738Abstract: A luminance measuring device for a LCD includes a photometric unit having a contact type luminance meter, a light shielding cushion member surrounding a vicinity of a light receiving portion of the contact type luminance meter and a holding unit for fixing the contact type luminance meter to the LCD a converting unit for converting a first luminance measurement result by the contact type luminance meter into a second luminance measurement result corresponding to a telescopic luminance meter and a processing unit for conducting conversion processing using the converting unit to a luminance measurement result of the LCD by the photometric unit.Type: ApplicationFiled: March 31, 2003Publication date: October 2, 2003Applicant: FUJI PHOTO FILM CO., LTD.Inventor: Akira Yamaguchi
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Publication number: 20030174317Abstract: The present invention provides apparatus for a beam transmissometer. In an embodiment, the beam transmissometer includes a LED signal source, collimating apparatus, a retroreflector that directs the projected beam, imaging apparatus that directs the beam onto a detector that converts the projected beam into an electrical signal, and signal processing circuitry that enhances the reception of the optical beam. The LED signal source is modulated in a pulsed fashion so that the effects of beam reflection are ameliorated. Signal processing circuitry amplifies, filters, and synchronizes to the electrical signal. A calculating unit uses the processed signal to determine a beam attenuation coefficient, which is indicative of the visibility of a medium in which the transmissometer is immersed. A method is also provided for aligning optics of a beam transmissometer. The method determines an offset and a rotation of a retroreflector housing that causes an optical beam to be centered.Type: ApplicationFiled: January 22, 2003Publication date: September 18, 2003Inventors: Thomas M. Murdock, Kirk S. Decker, James T. Velky, Karen D. Rennich
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Publication number: 20030164941Abstract: Two or more triangular apertures are employed to pass radiation from a source to a detector to reduce the amount of stray radiation received by the detector. Preferably, the two apertures are equilateral triangles oriented at 60° rotated relative to each other and have dimensions proportional to their distances from the sensor. A Bessel filter is employed to reduce the effect of flicker and other rapid changes in intensity in the radiance from the source. The output of the sensor is integrated and sampled at sampling time intervals that are powers of two of time, and a reading is provided when the output of the integrator exceeds the same threshold under all radiation source intensity conditions so that the meter has a substantially constant resolution at different signal levels.Type: ApplicationFiled: April 3, 2003Publication date: September 4, 2003Inventor: Edward Granger
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Patent number: 6614518Abstract: A multi-point light measuring system for sensing an optical characteristic such as illuminance at a plurality of measurement points with respect to the same illumination is configured by a single main unit, a plurality of light measuring units and a plurality of adapters for data communication. At least one light measuring unit and the main unit are connected by wired or wireless adapters, and each adjoining two light measuring units is connected by wired adapters. A controller of the main unit controls the light measuring units by commands transmitted by the adapters for obtaining light measuring data from the light measuring units and displays a measurement result on a display of the main unit.Type: GrantFiled: January 11, 2000Date of Patent: September 2, 2003Assignee: Minolta Co., Ltd.Inventors: Norio Ishikawa, Norihisa Hosoi, Susumu Shirai, Michio Nishio, Ryuji Tsuji, Tomoya Kimata
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Patent number: 6608674Abstract: A device is disclosed for combining optical radiation by utilizing the polarization properties of light and which includes a plane-parallel optically transparent plate with a refraction index n which has an optically active first surface on which a first optical beam (active beam) impinges, and a second optically active surface parallel to the first one on which a second optical beam (targeting beam) impinges at the exit location of the first beam from this second surface. The plane-parallel plate is arranged relative to the beams or the beam paths to be coupled in such a manner that the first beam impinges on the first surface of the plate and the second beam impinges on the second surface of the plate and that both do this at an angle &agr; which is equal to or approximately equal to the Brewster angle corresponding to the refractive index n of the plate.Type: GrantFiled: June 27, 2001Date of Patent: August 19, 2003Assignee: Carl Zeiss Jena GmbHInventors: Mario Gerlach, Bastiaan Oostdijck
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Publication number: 20030142296Abstract: An apparatus for collecting and sensing light in a projector, comprising a cold mirror positioned directly in the incident light path from a lamp and illumination optics of the projector for reflecting a large portion of visible light towards a light imaging device while transmitting IR and UV light and a small portion of the visible light; a secondary mirror for reflecting the small portion of the visible light, an integrating box positioned to collect and integrate the small portion of visible light, a light tube in optical communication with the integrating box for further integrating and attenuating the small portion of visible light, and an electro-optic device within the light tube for measuring the small portion of visible light within the light tube and generating an electrical signal in response thereto.Type: ApplicationFiled: January 31, 2002Publication date: July 31, 2003Inventors: Terry Schmidt, John Parkin
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Patent number: 6597439Abstract: A method and an apparatus for performing measurement of light from an illuminated specimen, under background light having intensity which varies cyclically with a period. A first measuring operation is performed for a certain length of time while illuminating the specimen. Then, a second measuring operation is performed for the same length of time as the first operation without the illumination of the specimen. A result of measurement unaffected by the background light is obtained by subtracting a result of the second measuring operation from a result of the first measuring operation. The difference between beginning times of the first and second measuring operations is made equal to an integer multiple of the above period. Alternatively, the above length of time of each of the first and second operations is made equal to an integer multiple of the above period.Type: GrantFiled: February 11, 2000Date of Patent: July 22, 2003Assignee: Fuji Photo Film Co., Ltd.Inventor: Kazuo Hakamata
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Patent number: 6590644Abstract: A system for calibrating a plurality of optical modules includes a plurality of optical signal sources and optical signal degradation elements optically communicating with input switches. The input switches supply optical test signals to optical modules (units under test) plugged into a common shelf. Calibration switches including variable optical attenuators may be used to adjust the input signal levels and alternately supply adjusted signals to an optical power meter and the units under test. A controller is used to control the adjustment and thereby provide defined, measured signal levels to the units under test. By reading data from the units under test and using these defined signal levels, the optical modules may be calibrated or diagnosed. Output optical switches are used in a similar fashion to calibrate or diagnose the outputs of the units under test. In addition to input/output power calibration, the invention may also perform wavelength calibrations.Type: GrantFiled: January 12, 2001Date of Patent: July 8, 2003Assignee: Ciena CorporationInventors: Bryan Coin, Michael J. Ransford, David A. Schwarten, Chao Jiang, Iqbal M. Dar, Andrei Csipkes
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Patent number: 6556289Abstract: Two or more triangular apertures are employed to pass radiation from a source to a detector to reduce the amount of stray radiation received by the detector. Preferably, the two apertures are equilateral triangles oriented at 60° rotated relative to each other and have dimensions proportional to their distances from the sensor. A Bessel filter is employed to reduce the effect of flicker and other rapid changes in intensity in the radiance from the source. The output of the sensor is integrated and sampled at sampling time intervals that are powers of two of time, and a reading is provided when the output of the integrator exceeds the same threshold under all radiation source intensity conditions so that the meter has a substantially constant resolution at different signal levels.Type: GrantFiled: June 28, 2000Date of Patent: April 29, 2003Assignee: Roygbiv, LLCInventor: Edward Granger
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Patent number: 6551751Abstract: In one illustrative embodiment, a method is provided that comprises energizing a light source to provide light having a preselected intensity. A first photosensor, which is capable of delivering a first signal indicative of the intensity of the light source, is exposed to the light source. A second photosensor, which is also capable of delivering a second signal indicative of the intensity of the light source, is also exposed to the light source. Thereafter, the first and second signals are compared, and an error signal is delivered in response to detecting a significant difference between the first and second signals.Type: GrantFiled: July 29, 2002Date of Patent: April 22, 2003Assignee: Advanced Micro Devices, Inc.Inventors: Anthony John Toprac, Richard David Edwards, Curtis Warren Doss
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Patent number: 6549277Abstract: An illuminance meter is provided to simplify measuring tasks and labor associated with the process of determining the energy level of a radiation used in an exposure apparatus. A wafer-type illuminance meter has an optical sensor fabricated integrally within a dummy wafer, which is made of a thin disk so that it may be handled in a manner similar to a substrate wafer to be imprinted. The illuminance meter is retained on a wafer stage in a manner similar to the substrate wafer so as to be loaded on and unloaded off a number of exposure apparatuses to determine a level of illuminance in the vicinity of the image plane of each exposure apparatus that uses a type of radiation assigned to each exposure apparatus.Type: GrantFiled: September 21, 2000Date of Patent: April 15, 2003Assignee: Nikon CorporationInventors: Hiroaki Narushima, Toshihiko Tsuji
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Publication number: 20030053044Abstract: A system and method are provided for measuring the average light levels from a flat panel display for use in a brightness compensating system. One or more photodiodes are disposed outside of the display area of a flat panel display so as to measure the average light levels directly or via total internal reflection through the transparent substrate of the display. The measured light levels are then used to provide a baseline for calibrating the color balance and brightness of the display using the brightness compensating system.Type: ApplicationFiled: September 18, 2001Publication date: March 20, 2003Applicant: Xerox CorporationInventors: Zoran D. Popovic, John F. Graham, Hany Aziz, Nan-Xing Hu
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Publication number: 20030035102Abstract: A system and method for measuring radiation. In one embodiment, a radiometer includes an inlet port, a light sensor operatively coupled to the inlet port, and a direction sensor adapted to detect the orientation of the inlet port. In another aspect, a radiometer has a base, a housing pivotally mounted to the base, an aperture in the housing, a radiation sensor in communication with the aperture, and a direction sensor adapted to detect the orientation of the housing relative to the base. In yet another aspect, a radiometer has a housing including at least one aperture, and a radiation sensor adapted to detect the irradiance and direction of origin of radiation entering the aperture. A method is disclosed for detecting the irradiance of radiant energy from a source in at least two dimensions. The method involves the steps of providing a radiometer of the present invention and positioning the radiometer in the path of radiant energy emitted from the source.Type: ApplicationFiled: August 16, 2001Publication date: February 20, 2003Inventors: Chris Dimas, John Kuta
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Publication number: 20030025903Abstract: A position measuring system that includes a graduation support having a first detent and a detector arrangement on a holder for scanning the graduation support at a preset scanning distance. An adjusting device that sets the preset scanning distance, the adjusting device is displaceable relative to the holder along a first direction from a mounting position to an operating position. The adjusting device includes a second detent which, in the mounting position, acts together with the first detent of said graduation support acting in the first direction, and the first and second detents are out of engagement at the operating position and a receiver which, at the mounting position, maintains the graduation support oriented perpendicularly with respect to the first direction, and the receiver is removed from the graduation support by being displaced in the first direction.Type: ApplicationFiled: July 30, 2002Publication date: February 6, 2003Inventor: Johann Mitterreiter
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Patent number: 6509963Abstract: It is possible to enhance accuracy in photometry measurements without an increase in unnecessary actual measurement data and design value data in the case where on a low ambient luminance side, an output of a first light sensor, which receives light collected from a large area, is linear and an output of a second light sensor, which receives light collected from a small area, is non-linear. The number of luminance measurement points used for performing measurement with the second light sensor is set at low ambient luminance values to be larger than the number of luminance measurement points used for performing measurements with the first light sensor.Type: GrantFiled: December 19, 2000Date of Patent: January 21, 2003Assignee: Seiko Instruments Inc.Inventors: Hajime Oda, Takeshi Iwasawa
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Publication number: 20030007144Abstract: A power monitor for a light emitter uses an absorptive material placed in the path of the application beam. The absorptive has a measurable characteristics thereof altered by an intensity of the light beam, the absorptive material being thin enough to allow a portion of the light beam sufficient for a desired application to be passed to the desired application. Preferably, an anti-reflective coating is placed between the absorptive material and the light emitting device. The absorptive material may be formed directly on the light emitting device or may be formed on or integrated with a spacer.Type: ApplicationFiled: September 11, 2002Publication date: January 9, 2003Inventors: James E. Morris, Michael R. Feldman, Hongtao Han
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Publication number: 20020191177Abstract: An apparatus for determining the light power level of a light beam (7), having a beam splitter (1) and a detector (11) associated with the beam splitter (1), is disclosed. The apparatus is characterized in that the beam splitter (1) splits measuring light (23) out of the light beam and conveys it to the detector (11), and that the ratio between the light power level of the light beam (7) and the light power level of the measuring light (23) measured at the detector (11) is constant over time.Type: ApplicationFiled: May 24, 2002Publication date: December 19, 2002Applicant: Leica Microsystems Heidelberg GmbHInventors: Heinrich Ulrich, Holger Birk, William C. Hay, Holger Nissle
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Publication number: 20020176073Abstract: An illumination light supply system that can save users from the task of replacing defective light source lamps with proper ones, enabling the users to use illumination light over an extended time period, and can easily change the lighting atmosphere as requested by the user. The illumination light supply system comprises: two or more light source units that generate and output lights of different colors; mixing means for mixing the lights output from the two or more light source units; adjustment means for adjusting an amount of light supplied from each light source unit to the mixing means; light transfer means for transferring the mixed light output from the mixing means to a user; and an illumination unit that radiates the transferred light into a space for the user.Type: ApplicationFiled: March 21, 2002Publication date: November 28, 2002Inventor: Kenji Mukai
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Patent number: 6486945Abstract: An optical monitoring unit includes a transmitting unit having plural light emitting diodes that are connected together two at a time in respective diode pairs. Each diode of each diode pair is respectively selectively connectable to a current source so as to operate as an active transmitting diode, or to a load resistor across which a voltage may be measured so as to operate as a monitoring diode. When any selected single diode is operated as the transmitting diode, its light output is measured and evaluated by operating the other diode of the pair as the monitoring diode, which receives optical crosstalk from the light output of the transmitting diode and correspondingly generates a photoelectric current through the load resistor.Type: GrantFiled: February 29, 2000Date of Patent: November 26, 2002Assignee: DaimlerChrysler AGInventors: Thomas Haerle, Guenter Reisacher
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Patent number: 6466312Abstract: The present invention relates to an illuminance sensing head structure including a housing, a light detector, a positioning member, a first color light filtering plate, a second color light filtering plate, and a diffusion plate. The housing has a top face recessed with a square plate receiving slot receiving the two color light filtering plates. The plate receiving slot has a center recessed with a rectangular receiving chamber for receiving the light detector. One side of the plate receiving slot is formed with a member receiving space for receiving the positioning member. The plate receiving slot has an outer edge provided with multiple rod insertion holes. The diffusion plate has an enclosure, and has a bottom formed with multiple insertion rods each close fit with the rod insertion hole.Type: GrantFiled: July 9, 2001Date of Patent: October 15, 2002Assignee: ST&T Instrument Corp.Inventor: Tung-Liang Li
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Patent number: 6456373Abstract: In a method for monitoring the measurement light emitted from an illumination apparatus for an optical measuring instrument, a continuous sensing of measurement light parameters is performed. The sensed measurement light parameters are compared to predefined setpoints. Any deviation from the predefined parameter ranges associated with the setpoints is signaled. This signal is used to initiate a lamp exchange on the illumination apparatus, which has multiple lamps that can be selectively switched on and off individually or in groups. Also described is a corresponding illumination apparatus that preferably performs a lamp exchange automatically. The result is to identify a point in time for a lamp change that is optimal with regard to measurement accuracy and the longest possible utilization of the lamps, so that a measurement light quality that remains consistent during continuous operation can reliably be maintained within predefined tolerance ranges.Type: GrantFiled: November 6, 2000Date of Patent: September 24, 2002Assignee: Leica Microsystems Jena GmbHInventors: Joachim Wienecke, Kuno Backhaus, Detlef Wolter, Matthias Slodowski, Horst-Dieter Jaritz
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Publication number: 20020130252Abstract: Light under measurement whose wavelength is continuously swept is incident on fiber-optic Etalon. The fiber-optic Etalon transmits the light under measurement each time the wavelength of the light under measurement satisfies specific conditions. A PD detects the transmitted light of the fiber-optic Etalon and outputs the intensity of the light under measurement. A counter counts the number of peaks of the output of the PD. A CPU calculates the wavelength of the light under measurement based on the count value of the counter.Type: ApplicationFiled: February 15, 2002Publication date: September 19, 2002Inventor: Seiji Funakawa
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Patent number: 6445856Abstract: The most common method of testing the various aspects of light traveling in a waveguide includes tapping a portion of the light and directing the tapped portion at an appropriate sensor. Conventionally, the simplest method for tapping light utilized a fused fiber coupler; however, even this method requires additional fiber splicing and management steps that increase manufacturing costs. The present invention uses a beam splitter, positioned inside a centerpiece sleeve in the path of the light, to direct a portion of the beam through the wall of the centerpiece sleeve to a monitoring sensor, preferably a photodiode. The centerpiece sleeve includes a window, which is at least partially transparent to the light, enabling the tapped portion of the light to reach the monitoring sensor. Preferably, the centerpiece sleeve is manufactured entirely out of glass.Type: GrantFiled: June 4, 2001Date of Patent: September 3, 2002Assignee: JDS Uniphase Corp.Inventor: Long Yang
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Patent number: 6404488Abstract: Photometer comprising a photo diode, arranged for producing an electric current, proportional to the intensity of picked-up light, the photo diode being linked by the intermediate of a resistance to an operational amplifier equipped with a bandpass filter, the value of the resistance is sized in such way as to level the resonance peak in the pass-band of the filter.Type: GrantFiled: September 6, 2000Date of Patent: June 11, 2002Assignee: University of LiegeInventor: Nicolas Martin
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Patent number: 6362876Abstract: A laser beam power detecting device for planar type semiconductor laser diode is disclosed. The laser beam power detecting device includes a heat dissipation substrate mounted on a printed circuit board, and a laser diode mounted on the heat dissipation substrate. The laser diode is capable of emitting a first laser beam toward a front end thereof and a second laser beam toward a rear end thereof. A light reflecting plate is mounted on the printed circuit board and at a rear area of the heat dissipation substrate for reflecting the second laser beam emitted from the laser diode. A light detecting diode is arranged between the laser diode and the light reflecting plate for receiving the reflected laser beam reflected by the light reflecting plate, thereby detecting an output power of the first laser beam emitted by the laser beam and then controlling the driving current of the laser diode under control of a control circuit.Type: GrantFiled: June 21, 2000Date of Patent: March 26, 2002Inventor: Shian-Fu Lai
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Publication number: 20020030806Abstract: An exposure meter has both function of an incident light type exposure meter for measuring an exposure value of an object by an incident light to the object and a reflected light type exposure meter for measuring exposure value of the object by a reflected light from the object. A latitude of a film is calculated from the exposure value by the incident light. The exposure value by the incident light and an upper and a lower limit values of the latitude are displayed on a display device. At least one exposure value measured by the reflected light is further displayed on the display device comparably with the latitude.Type: ApplicationFiled: September 7, 2001Publication date: March 14, 2002Inventors: Yasushi Goto, Yoshio Yuasa
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Patent number: 6353474Abstract: An improved system and method for obtaining photogrammetric measurements which eliminates optical distortions created by thermal gradients on windows that are used to protect the photogrammetry camera. A gate valve is introduced between the window and the wall that opens for a limited time to allow the camera to take measurements of a test article contained within a thermal testing chamber. This limits or eliminates any thermal gradients on the window and improves photogrammetric measurements. With a gate valve the window can be removed entirely, as the gate valve can prevent a thermal gradient from being introduced to the lens of the photogrammetry camera. The improved system is suited for making close-in photogrammetric measures of test articles on earth.Type: GrantFiled: April 13, 2000Date of Patent: March 5, 2002Assignee: Hughes Electronics CorporationInventors: Thaddeus Kucharski, Grant Ager, Jose J. Barbosa, Roberto Conte, Gregory H. Link, William D. McKay, Alan W. Tom, William J. Brennan, III
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Patent number: 6342947Abstract: By employing a high-repeatability optical switch that transmits input optical power selectively either to the standard or the unit under test (UUT), OPHASE presents a system for performing a rapid, repeatable comparison between the standard and the UUT. Further, the selective routing of beam traveling through one of the two output fibers that are coupled to the switch either to the standard or the UUT enables the elimination of much of the system uncertainty by enabling initial characterization of the ratio, Rp, and inequivalence, Im, between the power outputs of the multiple output fibers coupled to the switch. This characterization is accomplished by using an angled interface which is constructed so as to allow simultaneous coupling of the multiple output fibers to the angled interface and enable the power readout of all the output fibers at the standard. Rp and Im are then used to calculate the correction factor that reduces the total uncertainty level in the subsequent calibration of the unit under test.Type: GrantFiled: April 10, 2000Date of Patent: January 29, 2002Assignee: The United States of America as represented by the Secretary of the ArmyInventor: Gary D. Gillino
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Publication number: 20010043325Abstract: A light-measuring device comprises a photosensor, a light shield and a control device. The light shield has a plurality of apertures. Light from a luminous surface of a plane light source project onto the photosensor through the apertures of the light shield to form a plurality of non-overlapping photosensing areas on the photosensor. Each photosensing area on the photosensor generates a corresponding signal. The control device analyzes the corresponding signals from the photosensing areas to check the light from each corresponding test area on the luminous surface. With the light-measuring device, a tester can adjust the color temperature and brightness values of the plane light source.Type: ApplicationFiled: February 9, 2001Publication date: November 22, 2001Inventor: Jih-Yung Lu
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Publication number: 20010012105Abstract: It is possible to enhance accuracy in photometry measurements without an increase in unnecessary actual measurement data and design value data in the case where on a low ambient luminance side, an output of a first light sensor, which receives light collected from a large area, is linear and an output of a second light sensor, which receives light collected from a small area, is non-linear. The number of luminance measurement points used for performing measurement with the second light sensor is set at low ambient luminance values to be larger than the number of luminance measurement points used for performing measurements with the first light sensor.Type: ApplicationFiled: December 18, 2000Publication date: August 9, 2001Inventors: Hajime Oda, Takeshi Iwasawa
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Patent number: 6246045Abstract: A reflected radiance sensor is held in a spaced-apart relationship with a surface so the field of view of the sensor intersects the surface so that the radiation reflected off the surface can be detected and measured. The sensor is configured to detect only reflected radiation so that the reflected radiation is accurately measured without any direct incident component. A support structure is utilized to hold the detector of the sensor in place. The support structure is preferably made of material that is substantially invisible (i.e., transparent) to the radiation wavelength band of interest. The design of a support structure in accordance with the present invention is not limited to any one design, but may be designed for optimum performance in a particular application.Type: GrantFiled: September 9, 1998Date of Patent: June 12, 2001Assignee: McDonnell Douglas CorporationInventors: Henry B. Morris, Arvi D. Jeffery
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Patent number: 6229602Abstract: A photometering apparatus has a photometering apparatus having a plurality of photometering systems for measuring the brightness of an object. photometering system includes:a light receiving device in which different parts of an object are detected by a plurality of split photodetectors whose light receivers each comprise a detection area which is made separate by at least one insensitive area; a photometering optical system for projecting the image of the object onto the light receiving device; wherein the image of the object formed on the at least one insensitive area of one of the plurality of split photodetectors of one of the plurality of photometering systems is formed on the plurality of detection areas of another of the plurality of split photodetectors of another of the plurality of photometering systems.Type: GrantFiled: October 27, 1998Date of Patent: May 8, 2001Assignee: Asahi Kogaku Kogyo Kabushiki KaishaInventors: Isamu Hirai, Tadahisa Ohkura
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Patent number: 6201235Abstract: An electro-optic sampling oscilloscope facilitates adjustment of signal-to-noise ratio caused by electrical, optical and temperature factors.Type: GrantFiled: April 27, 1999Date of Patent: March 13, 2001Assignee: Ando Electric Co., Ltd.Inventors: Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada