Abstract: Provided are: an optical device for shape and gradient detection and/or measurement which has a simple structure, is robust to external disturbance, and enables accurate measurement of the gradient angle of an object surface, including a human body; a method for optical shape and gradient detection and/or measurement; and a circularly polarized light illumination device. The optical device for shape and gradient detection and/or measurement uses the optical reflection characteristics of the surface of an object to detect and/or measure the surface shape or gradient of an observed object, and is provided with an illumination device and a polarized light image detection device. The illumination device makes the incident light, which surrounds the periphery of the object and is essentially a known perfect polarized light, fall uniformly.

Abstract: A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object.

Abstract: An optical contour digitizer including a radiation source for emitting radiation therefrom, a first mirror for folding the radiation emitted from the radiation source towards an object being measured, a second mirror for folding a reflection of the radiation from the object being measured and a sensor for sensing the reflected radiation folded by the second mirror, and a method of using the same.

Abstract: A testing and analysis system for a pressure-sensitive device (42) that includes a testing stage (10) comprising a platform having an upper surface, a groove situated on the upper surface, an endless support gasket located in the endless groove, a pressure port located on the upper surface and interior to the endless groove, and a means for securing a substrate above the upper surface. The system also includes a substrate (40) supporting a pressure-sensitive device (42), such that the substrate (40) is secured above the upper surface and in contact with the endless support gasket to form a pressure chamber between the substrate (40) and the upper surface and in fluid communication with the pressure-sensitive device (42). The system further includes a pressure source (32) operatively connected to the pressure port and configured to modify a pressure inside the pressure chamber and deflect the pressure-sensitive device (42).

Abstract: The central idea of the present invention is that a readout result of an optical detection unit which is based on accumulating photocharges can be improved when the charge carriers accumulated on a photodiode capacitance can be transferred to a readout capacitance before being read out by a readout unit, and when the state of the readout capacitance can be read out in a non-destructive manner by the readout unit, so that a noise portion in the readout signal can be corrected by reading out the readout capacitance during charge accumulation and again reading out the readout capacitance after the end of charge accumulation. Additionally, it becomes possible by the transfer to the readout capacitance to vary the sensitivity of the optical detection device within broad limits and to record a sequence of successive light pulses, without having to reset a photodiode before recording every single light pulse.

Abstract: Directional albedo of a particular article, such as an identity card, is measured and stored. When the article is later presented, it can be confirmed to be the same particular article by re-measuring the albedo function, and checking for correspondence against the earlier-stored data. The re-measuring can be performed through us of a handheld optical device, such as a camera-equipped cell phone. The albedo function can serve as random key data in a variety of cryptographic applications. The function can be changed during the life of the article. A variety of other features are also detailed.

Abstract: An imaging device includes an illuminating unit configured to illuminate a measurement object with light from a light source; an aberration correcting unit configured to correct aberration of the measurement object occurring in light returning from the measurement object, the returning light being provided by light illuminating the measurement object through an area differing from a center axis of the illuminating unit; and an image obtaining unit configured to obtain an image of the measurement object on the basis of light returning from the measurement object, the returning light being provided by light that is provided after the aberration is corrected by the aberration correcting unit and that illuminates the measurement object through the center axis of the illuminating unit.

Abstract: A method and system for measuring an optical property of a multi-focal lens are disclosed. One embodiment of the method comprises: filtering out light transmitted by all but one of a plurality of diffraction orders of the lens to provide an unfiltered light from a single diffraction order; receiving the unfiltered light at a wavefront detector; and analyzing the unfiltered light at the wavefront detector to measure the optical property. The multi-focal lens can be a multi-focal diffractive intra-ocular lens. The measured optical property can be a discontinuity in the lens surface. Filtering can comprise blocking all but the unfiltered light using an aperture operable to let through the unfiltered light from the single diffraction order, and/or blocking all but the unfiltered light using an opaque obstruction operable to let through only a selected amount of light corresponding to the light transmitted by the single diffraction order.

Abstract: The present invention relates to a measurement apparatus capable of improving measurement precision of a measurement object using measurement light without deteriorating the visibility of the measurement object. An observation illumination device 12 has: three types of light sources, i.e., a LED 51 which emits red single-color light, a LED 52 which emits green single-color light, and a LED 53 which emits blue single-color light. The three types of the light of red, green, and blue emitted from the LEDs 51 to 53 irradiates the measurement object 2 at the same time or in a short period of time, thereby becoming observation light, which is perceived by humans as illumination of white light, and irradiates the measurement object 2. The measurement light source 31 is a light source which emits measurement light used in measurement of the shape of the measurement object 2 and is composed of a light source which emits near-infrared single-color laser light having a wavelength different from that of the LED 51.

Abstract: The present invention provides systems and methods for obtaining a three-dimensional (3D) representation of one or more light sources inside a sample, such as a mammal. Mammalian tissue is a turbid medium, meaning that photons are both absorbed and scattered as they propagate through tissue. In the case where scattering is large compared with absorption, such as red to near-infrared light passing through tissue, the transport of light within the sample is described by diffusion theory. Using imaging data and computer-implemented photon diffusion models, embodiments of the present invention produce a 3D representation of the light sources inside a sample, such as a 3D location, size, and brightness of such light sources.

Abstract: An apparatus for measuring erosion of an edge of an aerofoil portion of a fan blade includes a laser source to direct light at a position on the edge of the fan blade. A detector detects light reflected from the position on the edge of the fan blade. A computer measures the distance from the laser source to points on the edge of the fan blade to produce a profile of the edge in terms of x and z coordinates. The computer calculates the distances of points on the edge of the fan blade from a centroid of the profile. The computer detects peaks in the distance of points from the centroid of the profile. The computer selects two peaks with the greatest distance therebetween. The computer determines the distance between the two peaks and compares the determined distance and a predetermined distance to determine if there is unacceptable erosion.

Abstract: Scanning device for scanning dental objects having a base plate to which dental objects can be attached and a mounting structure such as a mounting plate to which an optical scanning system is attached and means for moving the mounting structure. Furthermore, a method for scanning dental objects includes the steps of (a) attaching a dental object to the base plate of the scanning device, wherein a first angle between the surface of the base plate and the surface of the mounting structure is enclosed or the plane defined by the optical axes of the scanning device, (b) scanning the attached dental object to obtain a first data set, (c) using the means for moving the mounting structure to change the first angle to a second angle, and (d) scanning the attached dental object to obtain a second data set.

Abstract: An apparatus for obtaining images of a tooth comprises at least one image sensor disposed along an optical axis to take polarized reflectance image and fluorescence image, at least one broadband illumination apparatus for reflectance imaging, and a narrow-band ultraviolet illumination apparatus for fluorescence imaging. In order to remove the specular reflection, one or more polarization elements are disposed along the optical axis. A filter is disposed along the optical axis to block narrow-band ultraviolet light, and a switch for selecting one of the operation modes.

Abstract: A detecting apparatus used in a bonding apparatus including a capillary and a detection camera disposed with a certain amount of offset from the capillary and capable of detecting a press-bonded ball at a bonding portion after bonding. For a pad in which two edges of a press-bonded ball corresponding to two adjacent sides of the pad are definite, the detecting apparatus detects the respective distances between the two sides of the pad and the corresponding two edges of the press-bonded ball, and compares the detected values to determine if these values fall within previously set allowable ranges; and if the detected values are outside the allowable ranges, the amount of offset is corrected so that the press-bonded ball comes within the allowable ranges.

Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.

Abstract: Systems, processes, articles of manufacture, and techniques may be used to measure a surface to be machined. In particular implementations, a representation of a surface to be machined may be determined. Measuring the surface may include measuring a plurality of surface points at each of a plurality of surface measurement locations with a measurement system moving over a surface and measuring the position of the measurement system. Determining a representation of the surface to be machined may include determining an estimated shape for the surface based on the surface measurements at the surface measurement locations. The surface measurements, the surface measurement locations, and the estimated shape may be stored in computer memory for future retrieval and use.

Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe is provided. The method includes: setting on a stage a calibration chart that includes not less than two non-parallel linewidth patterns being disposed relative to a reference position of the calibration chart and each having a known width and a level difference; capturing an image of the linewidth patterns of the calibration chart by an image probe to obtain the reference position of the calibration chart; measuring at least two of the linewidth patterns of the calibration chart by a contact-type detector to obtain the reference position of the calibration chart; and calculating a difference between the reference position obtained by using the image probe and the reference position obtained by using the contact-type detector to obtain the offset amount.

Abstract: A system and method determine an approximate structure of an object on a substrate. This may be applied in model based metrology of microscopic structures to assess critical dimension or overlay performance of a lithographic apparatus. A scatterometer is used to determine approximate structure of an object, such as a grating on a stack, on a substrate. The wafer substrate has an upper layer and an underlying layer. The substrate has a first scatterometry target region, including the grating on a stack object. The grating on a stack is made up of the upper and underlying layers. The upper layer is patterned with a periodic grating. The substrate further has a neighboring second scatterometry target region, where the upper layer is absent. The second region has just the unpatterned underlying layers.

Abstract: A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.

Abstract: A method of a method for measuring wear in the lining of a metallurgical melting vessel such as a steel converter (1), by a laser scanner (2) A laser having a contouring system on a cart can be moved between measurements The laser contouring system references three permanent marks behind the cart (PM1, PM2, PM3) and two temporary marks positioned near the vessel (TM1, TM2) The distances from the movable cart to each of the five marks is determined during an initial measurement by the contouring system Every time the cart is moved and a new measurement is taken, the contouring system scans the vessel and the two temporary marks but not the permanent marks.

Abstract: A non-contact scanning system for three dimensional non-contact scanning of a work piece is disclosed for use in various applications including reverse engineering, metrology, dimensional verification and inspection The scanning system includes a scanner carried by an arcuately configured gantry assembly and a fixture for carrying a work piece. The gantry assembly includes a fixed arcuately shaped gantry member and a telescopic arm that is movable in an arcuate direction relative to a rotary table that carries the object to be scanned. A scanner is mounted on the end of the telescopic member and is movable in a radial direction. Objects to be scanned are mounted on a rotary table that is also movable in an X-Y direction or alternatively in the X, Y and Z directions under the control of a motion control subsystem, a machine control user interface subsystem and an image capture.

Abstract: The invention relates to a method for detecting objects in which a light pattern is beamed by a plurality of transmitting modules into an observation zone, the transmitting modules being spaced to each other, in which light radiated back from the observation zone is detected by at least one spatially resolving detector unit, in which a surface contour of an object located in the observation zone is determined on the basis of the detected light according to the light section principle, in which a maximum spatial resolution is caused by the intervals at which the transmitting modules are spaced from each other.

Abstract: A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens having a substantially oblong aperture, a sensor operable for capturing light transmitted from an object through the lens and the substantially oblong aperture, and a processor communicatively connected with the sensor for processing the sensor information and producing a 3-D image of the object. The aperture may have an asymmetrical shape for distinguishing objects in front of versus in back of the focal plane. The aperture may also be rotatable, where the orientation of the observed pattern relative to the oblong aperture is varied with time thereby removing the ambiguity generated by image overlap. The disclosed device further comprises a light projection system configured to project a predetermined pattern onto a surface of the desired object thereby allowing for mapping of unmarked surfaces in three dimensions.

Abstract: An optical profiler for an ultra-smooth surface, such as a magnetic recording disk, provides for a normally incident beam deflection against the target surface to be profiled. A linearly polarized laser light of a first polarization is focused on the target surface in a normally incident direction. The beam is reflected back along its original path from the focal point. Optics are provided that change the polarization of the reflected beam to a second polarization. A reflected beam, with a second polarization, is directed onto a position sensitive detector for evaluation.

Abstract: In a scatterometric method differential targets with different sensitivities to parameters of interest are printed in a calibration matrix and difference spectra obtained. principal component analysis is applied to the difference spectra to obtain a calibration function that is less sensitive to variations in the underlying structure than a calibration function obtained from spectra obtained from a single target.

Abstract: A bioinstrumentation apparatus irradiates light onto a measured region of a subject, detects diffused light to acquire internal information on the measured region, and includes: a container holding a light transmitting medium; a light irradiation unit including a plurality of light emitting ends fixed to the container and irradiating a first light and a second light that mutually differ in wavelength onto the measured region that is immersed in the medium; a light detection unit including a plurality of light detecting ends fixed to the container and detecting the diffused light from the measured region; and a computing unit computing the internal information based on an output signal from the light detection unit; the wavelength of the first light being a wavelength at which an absorption coefficient of the measured region and a mean value of absorption coefficient of the medium are substantially equal, the wavelength of the second light being a wavelength at which the absorption coefficient of the measured

Abstract: Apparatus for indicating the departure of a shape of an object from a specified shape is described. The apparatus includes a light source for directing an incident beam of radiation onto the object, and an inspecting device for inspecting the final beam after transmission by or reflection from the object. The apparatus is arranged so that the final beam will have a substantially planar wavefront when the object has the specified shape, and said inspecting device is arranged to determine any departure of the wavefront of the final beam from planarity. In one embodiment, the inspecting device includes a beamsplitter, for example a diffraction grating or hologram, and a detector such as a CCD camera. The beamsplitter is then arranged to split the final beam into two or more beams and to direct the two or more beams to laterally displaced locations on the detector.

Abstract: An apparatus for detecting top scattered light from a substrate. A source directs a light onto a position on the substrate. The light thereby reflects off in a specular beam, scatters off the top surface, and scatters off a bottom surface of the substrate. An objective receives the top and bottom scattered light. The objective has a first focal point focused on the position on the top surface of the substrate, and a second focal point focused on a pinhole field stop. The pinhole field stop passes the top scattered light that is focused on the pinhole field stop, and blocks the bottom scattered light. A sensor receives and quantifies the top scattered light.

Abstract: A 3D measuring apparatus includes a stage, a projection portion, and an imaging portion. The projection portion includes first and second lights, first and second lattices, and first and second projection lenses. The imaging portion includes an imaging lens and a camera. The projection portion further includes a movement instrument which control the first and the second lattice simultaneously with predetermined n times.

Abstract: The invention is directed to a method for illuminating an object and projecting its image on a ground glass screen. Optical comparators conventionally use incandescent illumination, either mercury arc or halogen. The use of an array of high intensity LED devices, provides many options for packaging the required optical components used in comparators.

Abstract: A system for characterizing material properties in miniature semiconductor structures performs a scatterometry analysis on inelastically scattered light. The system can include a narrowband probe beam generator and a detector. A single wavelength probe beam from the narrowband probe beam generator produces scattered light from a measurement pattern on a test sample. The scattered light is measured by the detector, and the measurement data (e.g., Raman spectrum) is used in a scatterometry analysis to determine material properties for the measurement pattern. The detector can measure either incoherent inelastically scattered light (e.g., using a spectrometer) or coherent inelastically scattered light (e.g., using an array detector). If the measurement pattern dimensions are substantially similar to actual device dimensions, the material property distributions determined for the measurement pattern can be applied to the actual devices on the test sample.

Abstract: Systems and methods for focusing optics are disclosed herein. In some embodiments, methods are disclosed for focusing an optical device, wherein the methods can include: collecting light from a region of an object to be imaged with an objective lens, said region having a feature with a known geometric characteristic; splitting the collected light into a first portion and a second portion, and directing said first portion through a weak cylindrical lens to a focusing sensor, and directing said second portion to an imager; observing, with said focusing sensor, a shape of the feature; focusing the optical device by moving at least one of the objective lens and the object to be imaged until the observed shape of the feature has a predetermined relationship to the known geometric characteristic. In some embodiments, the feature can be a fluorescent bead. In some embodiments, the splitting step can be accomplished with a dichroic mirror.

Abstract: A method for reading a topographic structure applied to a component includes providing the component with the topographic structure, applying an agent configured to enhance a contrast of the structure to at least a region of the component where the structure is located and reading the topographic structure after the applying the agent.

Abstract: This disclosure provides for an impression scanner system having improved calibration having a housing and a calibration plate of known geometry. The calibration plate has a plurality of different shapes thereon. The system also has a radiation source for emitting radiation towards the shapes on the plate and a surface for reflecting images created by the radiation on the shapes. A sensor for receiving the images of the shapes as the plate moves relative to the housing is also provided. A processor compares known geometry of the plate to the images received by the sensor and calibrates the sensor based upon the known geometry and images to reduce system aberration and distortion.

Abstract: A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens, at least one polarization-coded aperture obstructing the lens, a polarization-sensitive sensor operable for capturing electromagnetic radiation transmitted from an object through the lens and the at least one polarization-coded aperture, and a processor communicatively connected with the sensor for processing the sensor information and producing a 3-D image of the object.

Abstract: Included are an illumination lamp (2) for illuminating a color filter edge (23) at a predetermined angle of incidence, a sensor (3) for taking at least two images by imaging light reflected at a predetermined angle different from the angle of incidence, an image processing section (9) for calculating a difference in luminance within a color filter in accordance with the images thus taken, and a defect determination section (13) for determining the existence of unevenness in the color filter from the difference in luminance. Provided thereby are a color filter inspection method and a color filter inspection apparatus, each for early discovering unevenness through macroscopic observation of the whole color filter by illuminating the color filter edge and by taking reflected light that is not specular reflected light, the unevenness occurring in a drying step, the color filter edge containing a boundary between a pixel and a black matrix.

Abstract: Embodiments of the present invention generally relate to systems, apparatuses, and methods used to form solar cell devices using processing modules adapted to perform one or more processes in the formation of the solar cell devices. In one embodiment, the system provides an inline inspection system of solar cell devices within a solar cell production line while collecting and using metrology data to diagnose, tune, or improve production line processes during manufacture of solar cell devices. In one embodiment, the inspection system provides an on-the-fly characterization module positioned downstream from one or more processing tools wherein the characterization module is configured to measure on-the-fly one or more properties of one or more photovoltaic layers formed on a substrate surface and a system controller in communication with the characterization module and the one or more processing tools, where the system controller is configured to analyze information received from the characterization module.

Abstract: The present invention releases a method of producing a metal separator for a solid polymer fuel cell by stainless steel, titanium, or titanium alloy during which securing lower cost and mass producibility by using a material having a high workability to form a complicated shape by a high productivity, then using an inexpensive blast process to drive a conductive substance into the surface of the metal separator member, that is, provides a stainless steel, titanium, or titanium alloy solid polymer fuel cell separator comprised of stainless steel, titanium, or titanium alloy in the surface of which a low ion release conductive substance is buried, having an arithmetic mean roughness (Ra) of the separator surface of 0.5 to 5.0 ?m, having a 10-point mean roughness (Rz) of 3 to 20 ?m, having an average spacing of surface relief shapes (Sm) of 300 ?m or less, having values of a warp rate and twist rate of a separator of 0.

Abstract: A method for the measurement of the stock of a gear with an axis of rotation which has to be finished in the hardened state, wherein the gear has a gearing with a plurality of teeth at its outer and/or inner circumference and wherein the teeth have, compared with the finished geometry, a stock on their tooth flanks. To carry out a reliable measurement of the stock the invention proposes that the position of the surface of the tooth flank with the stock is detected by using optical distance measurement by means of a distance sensor, wherein a light beam is directed by the distance sensor onto the surface, wherein the light beam is guided onto the surface in such a way that it is perpendicular to the axis of rotation or that it is parallel to this direction.

Abstract: The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supporting it and having a predetermined reference surface set at a side thereof; an image obtaining means in which it is moved toward X,Y and Z shafts by the XYZ shaft transfer means, scans a grating image by the frequency of N times to a side of the measuring object supported and fixed to the work stage, obtains the changed grating image by the measuring object by N times; a light emitting means mounted to a side of the image obtaining means for generating and emitting light with a predetermined wavelength; and a control unit which irradiates light generated from the light emitting means mounted to a side of the image obtaining means to the reference surface set the side of the work stage, receives the changed grating image obtained from the image obtaini

Abstract: An apparatus for recording a shape of a section of the human ear is provided. The apparatus has a recording device for recording a spatial shape of a first and a second subsection of the section and for recording a position or a variable representing the position of the first and the second subsection relative to a predetermined optical feature of the section. The apparatus has an evaluation device for obtaining shape infoimation about the section by combination of the shapes of the subsections based on the recorded positions or the variables representing the respective position. This enables a number of individual images to be joined together into a three-dimensional map based on natural features in the auditory canal, such as skin flecks or veins for example.

Abstract: Methods and apparatus for analyzing surface properties of particles are provided. A method for analyzing the surface properties of the particle includes a associating a first particle with a first capture zone having a specific binding affinity for a first chemical species, applying an optical force to the first particle, sensing a response of the first particle to the optical force, and using the sensed response to determine the presence, absence or quantity of the first chemical species on the first particle surface. This process may be repeated in parallel to test multiple particles. In addition to directly testing the surface properties of the particles, the method can be used in direct, indirect and competitive assays to determine the presence, absence or quantity of free or immobilized analytes. A fluidic cartridge with capture zones having avidities that are tuned for the use of optical forces is provided. A software routine for performing the method is also provided.

Abstract: According to the invention, to measure an object (32), for example a hollow, translucent or transparent sphere with respect to a visible light, using Snell-Descartes laws, relating to the propagation of light through the object, an equation is established which associates optogeometric parameters of the object with the result of an observation performed directly on an image of the object, said image being acquired by observing said object, by single-view optical shadowgraphy, said image is acquired, the observation is performed, and at least one geometric or optical parameter of the object is determined using the equation and the result of the observation.

Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.

Abstract: A method for the optical investigation of textured surfaces (10) with the steps: irradiation of radiation onto the surface (10) to be investigated; reception of an image from at least part of the radiation irradiated onto the surface (10) and reflected by the surface (10); location-resolved evaluation of the image recorded and determination of at least one value (K) which is characteristic of this image. According to the invention a parameter (G) which is characteristic of the surface is determined whilst using the characteristic value (K) and whilst using at least one further property (E)—known beforehand or determined—of the surface (10).

Abstract: A chromatic point sensor (CPS) calibration object and characterizing data are provided. The calibration object comprises a flat base plane with steps extending from it. Step measurement points provided by the steps and base plane measurement points provided by portions of the base plane are intermingled along a measurement track. The characterizing data characterizes known heights of the measurement points. A calibration method acquires measurement data such that some base plane measurement points should be at nearly the same measurement distance and therefore have the same common mode errors relative to known base plane measurement point heights. If such base plane measurement points exhibit minimal error variations, then measurements for those and proximate measurement points may provide reliable calibration data. In contrast, error variations outside an expected range indicate unreliable measurements that should be screened or replaced by new calibration measurements.

Abstract: A probe microscope includes a cantilever having a probe for contact with an object, first and second displacement detection optical systems, and an object lens. The first displacement detection optical system includes a first light source and a first displacement detecting section that detects displacement of the cantilever. The second displacement detection optical system includes a second light source and a second displacement detecting section that detects displacement of the object. The object lens is provided between the cantilever and the first light source and between the cantilever and the second light source. The object lens has a focal position for the light that is emitted from the first light source and has a first wavelength at the position of the cantilever and has a focal position for the light that is emitted from the second light source and has a second wavelength at the position of the object.

Abstract: According to an embodiment there is provided a bi-directional reflectance distribution function (BRDF) instrument, including an enclosure having a plurality of sides. A first side has a relatively high reflectivity substantially non-specular interior surface, while each of the remaining sides has a relatively low reflectivity interior surface. A bottom of the enclosure has a relatively low reflectivity interior surface. A viewport is formed in one of the plurality of sides or the bottom, at least one exit port is formed in at least one of the sides, and at least one entrance port is formed in at least of the sides.

Abstract: A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.

Abstract: A height-limited-area-information creating device creates a clip plane on a base plane of a printed circuit board, and sets a view so that an image faces the base plane and a normal to the base plane represents a depth direction of the image. According to the view, a three-dimensional image of a chassis-side component is created. The base plane is divided into unit areas, and one of the unit areas is selected. Coordinates of vertices of the selected unit area are transformed to screen coordinates to acquire a component and a polygon at the position of the screen coordinates. Distances from respective four vertices to the polygon are calculated as height, and a minimum value is determined as a maximum height for the unit area.