Abstract: A jig for measuring an object shape includes a plate having a first surface and a second surface opposed to the first plate and two reference balls fixed to the plate, each ball surface being exposed on both the first and second surfaces. A reference plane is fixed to the plate, the reference plane having a first plane and a second plane that are parallel to each other, the first and second planes being exposed on the first and second surfaces of the plate, respectively. An object-holding portion is fixed to the plate, the object-holding portion having a hole passing through the plate, the object-holding portion being able to hold an object in the hole with the front and back surfaces of the object being exposed on the first and second surfaces of the plate, respectively.

Abstract: A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system.

Abstract: A system and method reconstruct an anatomical impression. The system contains a light signal generating device for generating a light signal directed toward a synthetic test body having the anatomical impression. The light signal is directed toward the synthetic test body such that the light signal is attenuated upon passing through the synthetic test body. A sensor captures the attenuated light signal through the synthetic test body and converts the captured attenuated light signal into digitized image information. The system further includes a digital reconstruction device for reconstructing the digitized image information based on measurement of light attenuation to generate a three-dimensional volume of the anatomical impression.

Abstract: A housing including a base and cover has an open space that is open to the atmosphere and a closed space that is closed to the atmosphere. The open space contains a laser having a low operating temperature. The closed space contains a heat generating element and the like, which have higher operating temperatures than the laser. The heat generating element is in close contact with the base, which also serves as a heatsink, so that the heat generating element is cooled. Most parts of a motor, which is a heat generating member, are disposed in the closed space. A fan is diagonally disposed with respect to side surfaces of the heat generating element, which has a rectangular shape and flat side surfaces, so as to efficiently blow air toward the heat generating element disposed in the closed space.

Abstract: A device for shaping objects by removal of material from the surface thereof with a pulsed laser beam and a deflecting device through which the laser bean is guided over the surface of the object. An optical device is provided for changing the distribution of the radiation intensity inside the laser beam cross section. After the passage of the laser beam through this optical device, the radiation intensity has a bell-shaped or Gaussian distribution, or a distribution similar to a bell-shaped or Gaussian distribution, in at least one cross-sectional direction through the laser beam.

Abstract: To provide a height detection apparatus capable of detecting height information of a subject surface even in a narrow area, the height detection apparatus includes: an illumination optical system for illuminating the subject surface with a light flux emitted from a light source unit; an imaging optical system for causing the light flux reflected on the subject surface to form an image as a line image on an imaging surface; and a light detection unit disposed on the imaging surface. A light detection surface of the light detection unit is positioned in a plane rotated about a rotational axis, the rotational axis being an axis which is perpendicular to an optical axis of an optical element positioned optically closest to the light detection unit among optical elements constituting the imaging optical system, and is perpendicular to the line image to be formed by the imaging optical system.

Abstract: The present invention provides systems and methods for obtaining a three-dimensional (3D) representation of one or more light sources inside a sample, such as a mammal. Mammalian tissue is a turbid medium, meaning that photons are both absorbed and scattered as they propagate through tissue. In the case where scattering is large compared with absorption, such as red to near-infrared light passing through tissue, the transport of light within the sample is described by diffusion theory. Using imaging data and computer-implemented photon diffusion models, embodiments of the present invention produce a 3D representation of the light sources inside a sample, such as a 3D location, size, and brightness of such light sources.

Abstract: A shape detection system includes a distance image sensor that detects an image of a plurality of detection objects and distances to the detection objects, the detection objects being randomly arranged in a container, a sensor controller that detects a position and an orientation of each of the detection objects in the container on the basis of the result of the detection performed by the distance image sensor and a preset algorithm, and a user controller that selects the algorithm to be used by the sensor controller and sets the algorithm for the sensor controller.

Abstract: A method and system are presented for determining a line profile in a patterned structure, aimed at controlling a process of manufacture of the structure. The patterned structure comprises a plurality of different layers, the pattern in the structure being formed by patterned regions and un-patterned regions. At least first and second measurements are carried out, each utilizing illumination of the structure with a broad wavelengths band of incident light directed on the structure at a certain angle of incidence, detection of spectral characteristics of light returned from the structure, and generation of measured data representative thereof. The measured data obtained with the first measurement is analyzed, and at least one parameter of the structure is thereby determined. Then, this determined parameter is utilized, while analyzing the measured data obtained with the second measurements enabling the determination of the profile of the structure.

Abstract: A scanning system for carrying out 3D scanning of dental models in a scanning direction V including a holding device for a whole jaw model which spans an occlusal plane E over a line-shaped mandibular arch, a base, a swivel bearing on a swivel axis normal to the scanning direction V and a stage mounted for rotation on the swivel bearing relatively to the base, on which the dental model to be scanned can be mounted. The stage can be rotated through an angular range ? of at least 150° about the swivel axis, and the whole jaw model can be mounted such that said occlusal plane E is aligned parallel to said scanning direction V. An evaluation unit receives data from a detector to generate a 3D data set.

Abstract: There is described a method and an apparatus for the optical 3D digitization of bodies and body parts which reveal non-visible regions which therefore cannot be detected by the 3D digitizer. A mechanical aid is fixed at these regions and protrudes into the measurement space visible for the 3D digitizer. On this visible part, it is provided with marks and is digitized together with the remaining, visible body parts. From the spatial position of the marks of these aids, important geometrical information of the non-visible parts, such as the spatial position, circumferential dimensions, etc., can be calculated, and the 3D model of the body or body part incomplete at these points can be completed therewith. Two applications from the field of orthopedics are described by way of example.

Abstract: The measurement accuracy of an apparatus for measuring the surface shape of an object utilizing a two-wavelength phase-shift interferometry is improved. A low-coherence light source, a plurality of wavelength filters with different transmission wavelengths, an angle control unit and an analysis unit are provided. When performing a two-wavelength phase shift method, the analysis unit detects the wavelength difference between two wavelengths, and corrects a calculated wavelength value and a calculated phase value of one of the wavelengths for preventing a fringe-order calculation error. Next, the angle of the wavelength filters is controlled for making the actual wavelength difference coincident with a designed value. Thus, the wavelength difference between the two wavelengths is continuously controlled to be constant, which enables measurements of surface shapes with high accuracy, even when there are wavelength fluctuations due to the temperature change or the time elapse.

Abstract: A method for profiling the shape of a component using a line sensor (110) which is provided in a component mounter (100) and which profiles the shape of the component (200) three-dimensionally by (a) projecting a sweeping light onto the component (200) in a relative movement between the line sensor (110) and the component (200) held by a mounting head (103) so that the sweeping light traverses the direction of the movement and (b) detecting the reflected light from the component using a detector (119). The method includes getting the component (200) from the component supply unit 101 using the mounting head (103), rotating the component (200) by a predetermined angle within a predetermined surface, and profiling the shape of the rotated component using the line sensor (110).

Abstract: An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.

Abstract: The performance of a laser scanner is optimized in the field by automatically determining appropriate laser parameters for the scan location. A laser control system uses information such as the environmental temperature to select an appropriate range of start points for various laser parameters, such as pump temperature and laser currents. Test pulses over that range can be used to determine optimal operating parameters.

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable scan speed beam scanning subsystem, preferably using an acousto-optic deflector, with beam compensation, so that variable scanning speeds can be achieved. Also included are methods and systems for improving the signal to noise ratio by use of scatter reducing complements, and a system and method for selectively and repeatedly scanning a region of interest on the surface in order to provide additional observations of the region of interest.

Abstract: A three dimensional (3D) measuring apparatus and method are provided. The 3D image measuring apparatus includes a stage, a projection portion, and an imaging portion. The projection portion includes first and second lights, first and second lattices, and first and second projection lenses. The imaging portion includes an imaging lens and a camera. The projection portion further includes a movement instrument which controls the first and the second lattices through a predetermined number of movement actions during operation of the measuring apparatus.

Abstract: A device for optical measuring of grains for analysis of the quality of the grains, comprises a feeder which is arranged to feed at least one grain in a direction of transport, a light source which is arranged to illuminate the grain along a line, a detector which is arranged to detect reflection from the surfaces of the grain and an analyzer which is arranged to analyze the detected reflection in order to determine a height profile of the grain along the line and to determine three-dimensional surface topographical information on the grain based on a plurality of determined height profiles as the grain is transported. The device further comprises an arrangement used in generating a two-dimensional image and the analyzer is arranged to determine a quality of the grain based on the three-dimensional surface information and the two-dimensional image of the same grain.

Abstract: A method for optically measuring a surface is described, in particular, for a surface having a spherical form and a high reflection of radiation. The surface is illuminated by at least one radiation source, as well as by at least one structured light source, in order to produce an illumination structure on the surface to be measured, and to then record the illumination structure using a camera; prior to measuring the surface, a coating being applied thereto in order to reduce the reflected radiation, the electrostatic coating principle being followed when applying the coating to the spherical surface. Thus, a method for optically measuring a surface is described, which provides for a coating to be uniformly deposited on the entire surface of the test object and to have a thickness of less than 0.01 mm.

Abstract: The automated testing device contains a platform, a rotational plate on a top side of the platform, and, around the rotational plate and along a rotating direction of the rotational plate, an uploading member, a guiding member, an optical testing member, and an unloading member are provided and located in this sequence. The uploading member places fasteners in an upright manner on the top side of the rotational plate. The guiding member aligns the upright fasteners along a specific path. The optical testing member obtains and examines at least a profile image of each fastener. The unloading member screens out substandard fasteners and collects those qualified fasteners out of the rotational plate.

Abstract: Described is a method and apparatus for obtaining additional information from an object and a method for surface imaging and three-dimensional imaging. Single lens, single aperture, single sensor system and stereo optic systems are enhanced via selective filtering, use of defocusing information, use of an addressable pattern, image matching, and combinations thereof.

Abstract: A method for correcting the measured values of positions of structures (3) on a substrate (2) resulting from bending of a substrate (2) is disclosed. A plurality of geometric parameters of the substrate (2) are determined. A plurality of physical parameters of the substrate (2) are determined. A degree of bending is calculated individually for each substrate (2) on the basis of the obtained geometric parameters, the physical parameters and the position of the support points (40). The measured position data of the structures (3) on the substrate (2) is corrected with the aid of each individually calculated degree of bending.

Abstract: An automated mechanism for measuring the amount of accuracy loss attributable to reverse engineering processes that use 3D scan data is discussed. The embodiments provide a mechanism that displays to a user the effect scan data editing and CAD remodeling operations have on scan data accuracy. Additionally, the user can choose the way the graphical display illustrates the error distribution on the model such as by color mapping and whisker mapping. The accuracy loss may be displayed to the user after finishing an editing/modeling command or during the previewing of the command thereby allowing a user to take appropriate action. Parameters may also be adjusted programmatically based on the amount of accuracy loss determined to be attributable to scan data editing or CAD remodeling operations.

Abstract: This is an optical three-dimensional measurement device provided with observation illumination light for illuminating an observation specimen, an object lens for collecting the observation light on the observation specimen and a display unit for displaying an observation image and its measurement result that are obtained via the object lens. The optical three-dimensional measurement device comprises a filter process determination unit for determining a first filter process on the basis of observation conditions used when taking in a three-dimensional image of the observation specimen and a filter process unit for applying the first filter process determined by the filter process determination unit to the measurement image or the measurement result.

Abstract: An inspection system and a method for measuring physical characteristics of a component using the inspection system is provided, wherein the inspection system includes a light source, a sensing device and a retention mount, at least one of which is movably associated with the inspection system. The method includes associating a component with the inspection system such that the component is disposed within the retention mount, operating the inspection system to cause the light source to emit a collimated light beam propagating along a source optical path such that the collimated light beam is incident upon the component to produce a component silhouette which is incident upon the sensing device, generating image data responsive to the component silhouette and processing the image data to generate resultant data including at least one of a plurality of physical characteristics of the component.

Abstract: The surface shape measuring system includes an illumination unit including a main light source, a focusing lens, and a projection lens; a beam splitter to split illumination light emitted respectively irradiated onto a reference surface and a measurement surface; a light detecting element to capture an interference pattern; and a control computer to obtain surface shape data through white-light interference pattern analysis from an image captured and detect whether or not the measurement surface is defective from the obtained data, wherein a subsidiary light source to provide falling illumination to the target object; and two-dimensional data and three-dimensional data regarding the surface shape of the target object are obtained by selectively intermitting the turning-on of the main light source and the subsidiary light source and the irradiation of the illumination light onto the reference surface.

Abstract: A three-dimensional shape measuring apparatus includes a measuring section and a data integrating section. The measuring section has three-dimensional measurement dimensions, and measures a three-dimensional shape of a measurement object in a non-contact state. The measuring section measures a three-dimensional shape of a part of the measurement object multiple times by shifting the measurement dimensions to obtain multiple measurement data. The measurement dimensions are shifted in such a manner that at least portions of consecutive measurement dimensions by the shifting are lapped one over the other. The data integrating section integrates the multiple measurement data to obtain the three-dimensional shape of the measurement object. The data integrating section executes the data integration, using reliability information attributed to the respective measurement data.

Abstract: The invention relates to a method for controlling a vehicle washing installation with the use of a light-section procedure, wherein at least one treatment device (1) and a vehicle (2) to be washed are moved relative to each other in the washing direction (L), the vehicle surfaces are illuminated by two light fans (11, 12) starting from different positions, a first (FIG. 7) and a second (FIG. 8) two-dimensional depiction of the vehicle surfaces illuminated by the light fans (11, 12) are recorded from shooting angles which are oblique with respect to the planes of the light fans, and are stored in a control unit (20) together with the relative position and/or relative movement of treatment devices (1) and vehicle (2), the preceding steps are repeated during a traversing operation from one end to the other end of the vehicle (2), and, during or after the end of the traversing operation, a three-dimensional representation of the vehicle surfaces is calculated from the two-dimensional depictions (FIG. 7, FIG.

Abstract: An optical measuring apparatus for measuring 3D surface profiles of an object comprising, in combination: a linear detector array; an imaging system including a light source to image the object onto the detector array; and machine readable software for producing a 3D topology map from a 2D image, wherein the apparatus is calibrated by changing the optical focus distance between the detector array and the object for the purpose of 3D measurement calibration, and changing the relative lateral positions between the detector array and the object for the purpose of scanning the object's surface.

Abstract: A computer-controlled system automatically measures and records various physical characteristics of an elongated shaft or tube, such as a golf club shaft or other structural member. The characteristics measured include the principal planar oscillation plane, oscillation frequency, stiffness asymmetry, relative stiffness, torsional stiffness, shaft length, shaft straightness and tip angle.

Abstract: The present invention relates to a system for three-dimensional (3-D) acoustic imaging of a scattering structure using information from a two-dimensional (2-D) image. The system uses a characterized sensor array to emit a signal from the sensor array into an object of interest to generate at least one 2-D representation of the object of interest. The 2-D representation comprises a plurality of x and y coordinate pairs and at least one candidate scattering structure. The candidate scattering structure comprises a shape defined by at least one pair of x and y coordinates. The candidate scattering structure shape is restricted to at least one pair of x and y coordinates. The pair of x and y coordinates of the candidate scattering structure shape are then compared with a first coordinate-dependent response function to assign an x, y, and z position of a scattering structure in 3-D space.

Abstract: A method for measuring the roundness profiles moved forward in longitudinal direction inside a rolling mill, using two laser scanners, respectively provided with a light-sensitive sensor and a laser. At least three shadow edges that fit against the round profile to be measured and enclose the round profile to form a polygon are generated and measured and the corresponding tangents are computed.

Abstract: A system and method for measuring the physical characteristics of an object is provided, wherein the method includes disposing the object within the sensor optical path of an inspection system, causing a source collimated light beam to propagate along the source optical path to be at least partially incident upon the reflecting device, reflecting the source collimated light beam to create a reflected collimated light beam that propagates along the sensor optical path such that the reflected collimated light beam is at least partially incident upon the object to produce a silhouette, wherein at least a portion of the silhouette is incident upon the sensing device to generate initial image data responsive to the silhouette and processing the initial image data responsive to at least one predetermined algorithm to generate resultant image data responsive to at least one of a plurality of physical characteristics of the object.

Abstract: An image processing apparatus is made up of a processing target area specification section for specifying a processing target area; a circumferential direction specification section for specifying the circumferential direction of a contour circle in the processing target area; an edge detection region specification section for specifying three or more regions made different in position in the circumferential direction in the processing target area as edge detection regions based on the processing target area and the circumferential direction; an edge position identification section for identifying edge positions with respect to the radial direction based on the intensity distribution in the edge detection regions; and a contour circle determination section for determining a contour circle based on the edge positions identified relative to the edge detection regions.

Abstract: A method and apparatus are disclosed for providing image data for constructing an image of a region of a three dimensional target object. The method includes the steps of providing incident radiation, via at least one detector detecting an intensity of radiation scattered by the target object, repositioning incident radiation relative to the target object, subsequently detecting the intensity of radiation scattered by the target object, determining a probe function indicating an estimate of at least one characteristic of the incident radiation at one or more depths of the object and providing image data from which an image of one or more regions of the object may be constructed via an iterative process using the probe function.

Abstract: A process of measuring a shape while changing the relative posture of an microscopic interferometer to a sample lens which is rotated about a rotation axis is divided into a process of measuring a top surface in a state where the sample lens is supported from a back surface and a process of measuring a back surface in a state where the sample lens is supported from the top surface. By combining first shape information of a flange side surface acquired by the process of measuring the top surface and second shape information of the flange side surface acquired by the process of measuring the back surface, the relative positional relation between the sample top surface and the sample back surface is calculated.

Abstract: An apparatus and a method for examining a curved surface (5), having a camera (2) and an objective (3) and a lamp (4), is described. The camera (2) can be aimed at the inside of the curved surface (5), and the lamp (4) can be located such that light (7) emitted by the lamp (4) is reflected from the inside of the curved surface (5) into the camera (2). To attain high contrast with a simple arrangement, the lamp (4) is located in the beam path of the objective (3) of the camera (2).

Abstract: An apparatus for determining surface topology of a portion (26) of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor.

Abstract: Provided are a three-dimensional image measuring method and apparatus for an LCD color filter automatic grinder. It is possible to measure a three-dimensional image of an LCD color filter, even though textures for recovering the three-dimensional image are insufficient, by irradiating illumination passed through a patterned filter to the LCD color filter. In addition, it is possible to measure a three-dimensional image of an LCD color filter by obtaining a plurality of image sequences along an optical axis of a camera composed of CCD or CIS. Illumination is irradiated to an LCD color filter to be measured through a patterned filter.

Abstract: Described are a method and device for determining three-dimensional position information of a surface of a translucent object having a wavelength-dependent transmittance and reflectance characteristics. The method includes illuminating the surface of the translucent object with optical radiation at a predetermined wavelength emitted from a pair of optical sources. Radiation scattered from the surface and below the surface is detected, and a phase of the optical radiation from one of the optical sources relative to a phase of the optical radiation from the other optical source is changed before again detecting the scattered radiation. The predetermined wavelength is selected so that the optical radiation scattered from below the surface and detected provides a substantially constant background intensity with respect to the optical radiation scattered from the surface and detected. Three-dimensional position information of the surface is calculated in response to the detected radiation.

Abstract: A device for measuring structures of an object. The device includes a probe element extending from a probe extension, an optical sensor for capturing an image of the probe element on a sensor field, an evaluation unit configured to compute the structures based on a position of the optical sensor relative to a coordinate system of a coordinate measuring machine and from a position of the probe element measured by the optical sensor. The device also includes a lens disposed on the probe extension between the optical sensor and the probe element.

Abstract: A computer-implemented method for scanning and obtaining points of an object is provided. The method includes defining a measuring distance between two points of an object and scanning the measuring distance according to an optimal measuring position. If coordinate values of each of the scanned points are valid, then the method send the obtained coordinate values to an electronic device if the obtained coordinate values are valid.

Abstract: A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light, and an extraction unit which extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.

Abstract: A method for determining the positions of structures (3) on a mask (2) is disclosed. The method is implemented in a metrology tool (1) comprising a measurement table (20) which is movable in X-coordinate direction and Y-coordinate direction. A first intensity profile (IX) is recorded along a first measurement direction (MRX), which is parallel to the X-coordinate direction. A second intensity profile (IY) is recorded along a second measurement direction (MRY), which is parallel to the Y-coordinate direction. A two-dimensional position of a centre of gravity (S) with respect to the coordinate system of the metrology tool (1) is determined from the first intensity profile (IX) and the second intensity profile (IY).

Abstract: A chromatic confocal technique and apparatus for the rapid three-dimensional measurement of an object shape, particularly of a tooth in a patient's jaw, using an array of polychromatic point light sources, a planar detector matrix, a beam splitter for lateral spectral separation, and an objective for illuminating and recording the object. Spectral defined reference light bundles are generated, injected into the detection beam path via a reference beam path and, following spectral splitting, are focused on the detector matrix as reference image points, wherein laterally shifted sub-matrices are numerically defined on the detector matrix for spectral analysis of the object light, which sub-matrices are implemented as spectral cells for three-dimensional measurement of the shape of the object.

Abstract: Methods and systems for determining dimensions of a structure that has a re-entrant profile are disclosed. A method includes imaging at least a portion of a top surface of the structure. Subsequently, a second portion of the structure is imaged from a plurality of perspectives. A third portion of the structure is also imaged from a plurality of perspectives. A dimension of a bottom portion of the structure is determined based on the imaging.

Abstract: A reticle manufacturing method of the present invention comprises the steps of holding a reference mask blank by a reference chuck to measure a surface shape of the reference mask blank as a first surface shape, holding the reference mask blank by a reticle chuck of the exposure apparatus to measure a surface shape of the reference mask blank as a second surface shape, holding the electron beam drawing mask blank by the reference chuck to measure a surface shape of the electron beam drawing mask blank as a third surface shape, calculating a difference between the measurement values of the first surface shape and the second surface shape as a first deference value, calculating, as a forth surface shape, a surface shape of the electron beam drawing mask blank held by the reticle chuck on the basis of the first deference value and the measurement value of the third surface shape, and drawing the pattern on the electron beam drawing mask blank on the basis of the forth surface shape.

Abstract: An apparatus for observing the appearance of a surface (2) of a sample (1) of semitransparent material, the apparatus comprising a light source (11) for illuminating at least a region of interest (16) of the surface of the sample (1) from a predetermined direction and means (14) for observing a response to the illumination of the region of interest (16), wherein the illuminated region (5) comprises the region of interest (16) and a region surrounding the region of interest (16). In this way the influence of emitted scattered light (32) on the accuracy of the observation of the appearance of the sample (1) is minimized.

Abstract: Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: To provide a recording-material type determination apparatus and recording-material type determination method which can determine the type of recording material using simple calculations as well as to provide an image forming apparatus capable of obtaining stable image quality independent of the type of recording material using the apparatus and method. Based on data read by a read unit which reads surface images of recording material, a first calculation unit calculates the depth of irregularities in the surface of recording material and stores the results of calculation in a register A while a second calculation unit calculates the spacing of irregularities on the surface of the recording material and stores the results of calculation in a register B. Based on the values in the registers A and B, the type of recording material such as gloss paper, plain paper, rough paper or OHT is determined.