Abstract: A method and system for optically inspecting manufactured rounds of ammunition or cylindrical components of the rounds to obtain rounds which exhibit superior accuracy when fired are provided. The method includes providing a nominal numerical value and an acceptable range of numerical values for a size or a geometric characteristic of an acceptable manufactured round of ammunition or a cylindrical component of the round for a predetermined caliber of ammunition. Also provided is a high-performance range of numerical values for the corresponding size or geometric characteristic of a high-performance manufactured round of ammunition or a cylindrical component of the high-performance round for the predetermined caliber of ammunition.

Abstract: A non-contact scanning system for three dimensional non-contact scanning of a work piece is disclosed for use in various applications including reverse engineering, metrology, dimensional verification and inspection The scanning system includes a scanner carried by an arcuately configured gantry assembly and a fixture for carrying a work piece. The gantry assembly includes a fixed arcuately shaped gantry member and a telescopic arm that is movable in an arcuate direction relative to a rotary table that carries the object to be scanned. A scanner is mounted on the end of the telescopic member and is movable in a radial direction. Objects to be scanned are mounted on a rotary table that is also movable in an X-Y direction or alternatively in the X, Y and Z directions under the control of a motion control subsystem, a machine control user interface subsystem and an image capture.

Abstract: A film-like structural color body comprises a front surface layer disposed on a front surface side, a back surface layer disposed on a back surface side, and an intermediate layer disposed between the front surface layer and the back surface layer, the front surface layer, the back surface layer and the intermediate layer contain block copolymers and have micro-phase separated structures including lamellar micro domains, each of the micro domains has a wave-like shape having amplitudes in the thickness direction of the structural color body, a maximum value of predetermined distances in the micro domains of the front surface layer and a maximum value of predetermined distances in the micro domains of the back surface layer are larger than the wavelength in the visible light range, and predetermined distances in the micro domains of the intermediate layer are equal to or less than the wavelength in the visible light range.

Abstract: A system and method determine an approximate structure of an object on a substrate. This may be applied in model based metrology of microscopic structures to assess critical dimension or overlay performance of a lithographic apparatus. A scatterometer is used to determine approximate structure of an object, such as a grating on a stack, on a substrate. The wafer substrate has an upper layer and an underlying layer. The substrate has a first scatterometry target region, including the grating on a stack object. The grating on a stack is made up of the upper and underlying layers. The upper layer is patterned with a periodic grating. The substrate further has a neighboring second scatterometry target region, where the upper layer is absent. The second region has just the unpatterned underlying layers.

Abstract: Described are a method and device for determining three-dimensional position information of a surface of a translucent object having a wavelength-dependent transmittance and reflectance characteristics. The method includes illuminating the surface of the translucent object with optical radiation at a predetermined wavelength emitted from a pair of optical sources. Radiation scattered from the surface and below the surface is detected, and a phase of the optical radiation from one of the optical sources relative to a phase of the optical radiation from the other optical source is changed before again detecting the scattered radiation. The predetermined wavelength is selected so that the optical radiation scattered from below the surface and detected provides a substantially constant background intensity with respect to the optical radiation scattered from the surface and detected. Three-dimensional position information of the surface is calculated in response to the detected radiation.

Abstract: The inner surface of an underground tunnel defining structure, such as a culvert or pipe, is measured by apparatus including a portable hand held battery powered laser unit releasably attached to a rotor disk supported within the tunnel by an adjustable stand or tripod for rotation on a generally horizontal axis. The disk has peripherally spaced notches which receive a spring-biased latch member for positioning the disk and laser unit at predetermined angular positions about the axis. The laser unit emits a laser beam to a target on the inner surface of the structure and displays on the unit a precision distance reading from the laser unit to the target. The distance reading for each target is entered in a chart for comparison with a prior measurement reading to indicate changes in the shape or profile of the inner surface.

Abstract: A surface profile measurement apparatus, which measures a surface profile of an object, includes a wavefront measurement unit, a driving unit and a rotation unit. The wavefront measurement unit has an image sensor and emits a detecting light. The driving unit has a plurality of stages for moving the object or the wavefront measurement unit. The rotation unit has a rotation axis, is disposed on one of the stages of the driving unit, and holds the object. When measuring the object, the rotation unit rotates the object and the image sensor simultaneously exposes and acquires a measurement data, formed by the detecting light reflected from the object. An alignment method of the surface profile measurement apparatus and an improved sub-aperture measurement data acquisition method are also disclosed.

Abstract: Object detection and selection for use in a device having digital camera functionality is described. The mechanism detects the occurrence of a gesture by a pointing member in an image frame captured by an IR image sensor. The gesture is then recognized and an object pointed to is detected. The object detected is then selected as a result of the gesture recognition.

Abstract: A prismatic alignment artifact includes an artifact body having a prismatic shape.

Abstract: An information acquiring device has a light source which emits light in a predetermined wavelength band; a projection optical system which projects the light toward a target area; and a light receiving element which receives reflected light reflected on the target area for outputting a signal. First signal value information relating to a value of a signal outputted from the light receiving element during a period when the light is emitted from the light source, and second signal value information relating to a value of a signal outputted from the light receiving element during a period when the light is not emitted from the light source are stored in a storage. An information acquiring section acquires three-dimensional information of an object in the target area, based on a subtraction result obtained by subtracting the second signal value information from the first signal value information stored in the storage.

Abstract: Embodiments of the present invention provide a method of determining at least one characteristic of a target surface, comprising providing a phase map for a first region of a target surface via radiation having a first wavelength, providing n further phase maps for the first region via radiation having a further n wavelengths each different from the first wavelength, and determining at least one characteristic at the target surface responsive to the first and further phase maps.

Abstract: A laser radar system includes: a scanner for transmitting a pulse toward a target while two-dimensionally scanning a transmitting beam, and outputting scan angle information; a lens of the receiver for receiving received light; a high aspect photo detector array for converting the received light into a received signal; a transimpedance amplifier array for amplifying the received signal; an adder circuit for adding the received signal from each element of the transimpedance amplifier array; a distance detecting circuit for measuring a light round-trip time to the target of an output signal from the adder circuit; and a signal processing unit for causing the scanner to perform a two-dimensional scanning operation in association with the scan angle information, to determine distances to multiple points on the target based on the light round-trip time and a speed of light and measure a three-dimensional shape of the target.

Abstract: A method and apparatus for determining the topography or optical properties of a moving surface of a subject are disclosed. Taking images of the moving surface at different moment in time by aiming different illuminations at the subject. Taking images of a reference area located near the moving surface synchronously with the images of the moving surface, in such a way that, in each image of the reference area, illumination of substantially the same type is aimed at the reference area, wherein the images created of the reference area are used to position image areas corresponding to the same area of the subject in the images of the moving surface.

Abstract: Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: A method of determining an overlay error in which asymmetry of a first order of a diffraction pattern is modeled as being a weighted sum of harmonics. Both the first order harmonic and higher order harmonics are non-negligible and weights for both are calculated. The weights are calculated using three or more of sets of superimposed patterns using a least mean square method.

Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe is provided. The method includes: setting on a stage a calibration chart that includes not less than two non-parallel linewidth patterns being disposed relative to a reference position of the calibration chart and each having a known width and a level difference; capturing an image of the linewidth patterns of the calibration chart by an image probe to obtain the reference position of the calibration chart; measuring at least two of the linewidth patterns of the calibration chart by a contact-type detector to obtain the reference position of the calibration chart; and calculating a difference between the reference position obtained by using the image probe and the reference position obtained by using the contact-type detector to obtain the offset amount.

Abstract: A method of monitoring the effect of pollution in an aquatic mass, said method comprising disposing in said aquatic mass a biosensor unit containing a living sessile organism which exhibits apical growth and which is bound to a carrier, directing an electromagnetic beam towards a corresponding detector and between an edge and the apical tip of said sessile organism whereby to produce a diffraction pattern, detecting said diffraction pattern using said detector and monitoring a change (e.g. successive changes) in said diffraction pattern over time which is indicative of the natural growth of the apical tip of said organism.

Abstract: A method for optical investigation of textured surfaces involves the steps of irradiation of radiation onto the surface to be investigated; reception of an image from at least part of the radiation irradiated onto the surface and reflected by the surface; location-resolved evaluation of the image recorded and determination of at least one value K which is characteristic of this image. A parameter G which is characteristic of the surface is determined while using the characteristic value K and while using at least one further property E known beforehand or determined of the surface.

Abstract: With a device for optically scanning and measuring an environment, which is designed as a laser scanner, with a light emitter, which emits an emission light beam, with a light receiver which receives a reception light beam which is reflected from an object in the environment of the laser scanner or scattered otherwise, and with a control and evaluation unit which, for a multitude of measuring points, determines at least the distance to the object, the laser scanner has a cooling device with a space between a carrying structure and a shell which serves as a housing, said space opening to the outside by means of an air inlet and otherwise being sealed with respect to the interior of the carrying structure and to the shell.

Abstract: A method for reading a topographic structure applied to a component includes providing the component with the topographic structure, applying an agent configured to enhance a contrast of the structure to at least a region of the component where the structure is located and reading the topographic structure after the applying the agent.

Abstract: A multi-purpose device that can be used, as, among other things, an otoscope and a three dimensional scanning system is disclosed.

Abstract: Various improvements to inflatable membranes for use in three-dimensional imaging of interior spaces are disclosed. These improvements include, among other things, equipping the inflatable membrane with desirable optical features, such as fiducials, optical coatings, etc., that can be used to improve data acquisition.

Abstract: An apparatus (10) for microlithographic projection exposure, which includes: an optical system (18) for imaging mask structures (16) onto a surface (21) of a substrate (20) by projecting the mask structures (16) with imaging radiation (13), the optical system (18) being configured to operate in the EUV and/or higher frequency wavelength range, and various structure defining a measurement beam path (36) for guiding measurement radiation (34), the measurement beam path (36) extending within the optical system (18) such that the measurement radiation (34) only partially passes through the optical system (18) during operation of the apparatus (10).

Abstract: A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate, and a sensor configured to measure a height level, curvature and/or angle of a surface of a patterning device supported on the support.

Abstract: In a method and system for measuring wear in the lining of a vessel by a laser contouring system having an electromagnetic radiation emitting and receiving device. The laser contouring system references permanent marks and temporary marks positioned outside, on, or within the vessel. The distances and direction from the electromagnetic radiation emitting and receiving device to the fixed and temporary marks is determined during an initial measurement by the electromagnetic radiation emitting and receiving device from a first scanning position. The electromagnetic radiation emitting and receiving device is then moved along a path from the first scanning position to a second scanning position wherein some of the marks which were scanned from the first scanning position are scanned again to determine the relative position of the vessel and points on the internal lining of the vessel to determine the contour of the lining.

Abstract: A system (and corresponding methodology) for testing, evaluating and diagnosing quality of solar concentrator optics is provided. The innovation discloses mechanisms for evaluating the performance and quality of a solar collector via emission of modulated laser radiation upon (or near) a position of photovoltaic (PV) cells. The innovation discloses positioning two receivers at two distances from the source (e.g., solar collector or dish). These receivers are employed to collect modulated light which can be compared to standards or other thresholds thereby diagnosing quality of the collectors.

Abstract: Various improvements to inflatable membranes are disclosed. These improvements include, among other things, features on the membrane that can mitigate hazards such as bubble formation or frictional damage during inflation of the membrane.

Abstract: Various improvements to inflatable membranes are disclosed. These improvements include techniques for advantageously controlling the inflation of a membrane within a cavity, such as a human ear canal.

Abstract: A method of measuring shot shape includes sequentially exposing a substrate with main scale marks (32) in compliance with a predetermined map, and forming a reference grid including a plurality of the main scale marks (32) arranged in the predetermined map in at least one shot region, exposing a shot for measuring, via a projection optical system, that includes a plurality of auxiliary scale marks (34) arranged in the predetermined map in the shot region, measuring a relative positional relationship between adjacent main scale marks (32), measuring an amount of deviation between the main scale marks (32) and the auxiliary scale marks (34), and correcting the reference grid based on the relative positional relationship, and calculating a shot shape of the shot for measuring based on the corrected reference grid and the amount of deviation.

Abstract: Nanowire array structures based on periodic or aperiodic nanowires are provided in various configurations for sensing and interacting with light and substances to provide various functions such as sensors for detecting DNAs and others and solar cells for converting light into electricity.

Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape bei

Abstract: According to one embodiment, a method is disclosed for determining position of an auxiliary pattern on a photomask. The method can include generating a first set for each of three or more imaging positions of an exposure optical system. The method can include generating a second set for each of the three or more imaging positions by inverse Fourier transforming each of the first set. The method can include calculating a second order differential with respect to the imaging position of an index indicating amplitude of light belonging to the second set. In addition, the method can include extracting a position where the second order differential assumes an extremal value on an imaging plane of the exposure optical system. At least part of positions on the photomask each corresponding to the position assuming the extremal value on the imaging plane is used as a formation position of the auxiliary pattern.

Abstract: Methods and apparatus for measuring thickness of a thin film include: obtaining a high-speed thickness measurement of a thin film using a laser projection system and detector array, obtaining thickness measurements of the thin film at one or more locations using a single-point measurement apparatus and determining the accuracy of the high-speed measurement values by comparing them to one or more of the absolute thickness values of the film as measured by the single-point measurement apparatus.

Abstract: The invention relates to a method for irradiating a surface of a three-dimensional object, wherein a field of micromirrors in the beam path of a radiation source modulates the radiation. In order to be able to image irregularly shaped fields even on curved surfaces with the highest possible edge sharpness and to be able to exactly radiate the spatial distribution of the radiation power even onto three-dimensional surfaces, the topography (shape of the surface) is detected and a pulse duty factor is calculated and set for each micromirror so that the power density incident on a planar element corresponds approximately to a target power density and the target dimensions of the radiation surface.

Abstract: Systems, apparatuses, methods, and computer program products for inspection of objects or items in a conveyance system. Presence (or absence) of an object/item or objects/items is detected sensed and also one or more characteristics of the object/item can be determined based image detection of characteristics of one or more laser lines projected on a conveyance surface of the conveyance system.

Abstract: A bead inspection step and a bead inspection apparatus that inspect the quality of a bead are disclosed . . . . The bead inspection apparatus includes a wire-feed-speed measurement device that measures the feed speed of a brazing wire, and an analysis portion that measures and analyzes position coordinate data about surfaces of a first, workpiece, a second workpiece and the bead, and performs a first shape data measurement step of. measuring first shape data before brazing, a second shape data measurement step of measuring second shape data after the brazing, a feature quantity calculation step of calculating predicted values of feature quantities based on the first and second shape data and the brazing wire feed speed, and a throat thickness calculation step of calculating a predicted value of the throat thickness by a regression expression formed based on actual measurements of the feature quantities and of the throat thickness.

Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.

Abstract: A laser surveillance system includes a housing positioned generally at or below a water line and a laser and detector mechanism positioned within the housing. The mechanism includes a laser source and a sensor. The laser source is configured to project a laser beam towards a vessel being inspected. The sensor is configured to receive a reflection of the laser beam.

Abstract: The invention relates to a method for detecting objects in which a light pattern is beamed by a plurality of transmitting modules into an observation zone, the transmitting modules being spaced to each other, in which light radiated back from the observation zone is detected by at least one spatially resolving detector unit, in which a surface contour of an object located in the observation zone is determined on the basis of the detected light according to the light section principle, in which a maximum spatial resolution is caused by the intervals at which the transmitting modules are spaced from each other.

Abstract: A system and method is provided for imaging an article within a field of view, projecting an illumination field onto the article within field of view, and selectively projecting illumination structures onto the article within the field of view. Then, image data corresponding to the illumination field and the illumination structures may be received and a feature of the article may be analyzed based on the illumination field and the illumination structures.

Abstract: An apparatus and a method for measuring a three-dimensional shape are disclosed. The apparatus includes a transfer stage, a first projector, a second projector, a camera unit and a control unit. The transfer stage transfers a measurement object to a measurement position. The first projector irradiates a first pattern light having a first equivalent wavelength toward the measurement object in a first direction. The second projector irradiates a second pattern light having a second equivalent wavelength that is different from the first equivalent wavelength toward the measurement object in a second direction. The camera unit takes a first pattern image that is generated when the first pattern light is reflected by the measurement object, and a second pattern image that is generated when the second pattern light is reflected by the measurement object.

Abstract: A method for verifying the internal microstructure of interconnects in flip-chip applications includes providing a microelectronic assembly comprising the following: a substrate hosting an array of flip-chip attach pads and one or more process control pads; a flip chip having an array of solder bumps in contact with the array of flip-chip attach pads; and one or more representative solder bumps contacting the one or more process control pads. The representative solder bumps have a substantially similar or identical chemical composition as the array of solder bumps. A reflow cycle is then applied to the microelectronic assembly to melt and solidify the array of solder bumps on the flip-chip attach pads and melt and solidify the representative solder bumps on the process control pads. The surface texture of the representative solder bumps is then optically inspected to determine an internal microstructure of the array of solder bumps.

Abstract: A glass molding system and a method of making glass articles using the glass molding system are disclosed. The glass molding system includes an indexing table, a plurality of enclosures arranged along the indexing table, and a plurality of stations defined on the indexing table such that each of the stations is selectively indexable with any one of the enclosures. At least one radiant heater is arranged in at least one of the enclosures. A radiation reflector surface and a radiation emitter body are arranged in the at least one of the enclosures. The radiation emitter body is between the at least one radiant heater and the radiation reflector surface and has a first surface in opposing relation to the at least one radiant heater and a second surface in opposing relation to the radiation reflector surface.

Abstract: Gaps between strips of composite tape forming a surface are measured by a gauge. The position of the edges of adjacent strips of the tape is sensed as the gauge is moved along the surface, and a gap between the adjacent strips is calculated based on the sensed position of the edges.

Abstract: An optical measurement apparatus includes a fixed headstock and an opposed, movable tailstock mounted on a reference support. The movable tailstock is movable along a linear axis to maintain a piece to be measured between the headstock and tailstock. A mobile carriage is movable along the linear axis. The carriage carries a light source directing a beam of collimated light across the linear axis to be interrupted by a piece under measurement. An optical detector aligned with the light source is arranged to receive residual light of the beam that has not been interrupted by the piece under measurement. The measuring apparatus has a rectilinear guide, fastened on the reference support, on which are slideably engaged the optical carriage and the tailstock, whereas the headstock is placed on a headstock carrier that is fastened on the reference support and hangs at least in part over the rectilinear guide.

Abstract: A method for analyzing probe mark, the method includes: scanning the probe mark by multiple spots; evaluating a probe mark characteristic in response to detection signals generated by multiple sensors of the chromatic confocal system that is characterized by a sub-micron axial resolution.

Abstract: A 3D measuring apparatus includes a stage, a projection portion, and an imaging portion. The projection portion includes first and second lights, first and second lattices, and first and second projection lenses. The imaging portion includes an imaging lens and a camera. The projection portion further includes a movement instrument which control the first and the second lattice simultaneously with predetermined n times.

Abstract: Chirped light pulses, the color of which changes regularly with time, are generated and applied to an object to be measured. A reflected light image of the chirped light pulses reflected from the object is acquired. Then, three-dimensional information of the object is acquired using two-dimensional information, color information represented by the reflected light image of the chirped light pulses, and the field of vision of the three-dimensional information to be acquired is enlarged.

Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for determining a location relative to an object and a type of a light source that illuminated the object when the image was captured, are described. A method performed by a process executing on a computer system includes identifying an object of interest in a digital image. The method further includes projecting at least a portion of the digital image corresponding to the object of interest onto a three dimensional (3D) model that includes a polygon-mesh corresponding to the object's shape. The method further includes determining one or more properties of a light source that illuminated the object in the digital image at an instant that the image was captured based at least in part on a characteristic of one or more polygons in the 3D model onto which the digital image portion was projected.

Abstract: A method for measuring a surface profile of an object, the method includes, acquiring information about a first direction where a step of a surface of the object extends relative to a scanning direction, setting phase distribution applied to the irradiation beam according to the information, and scanning the object in the scanning direction with the irradiation beam.