Abstract: In a nonvolatile memory array that stores randomized data, the program level—the number of states per cell stored in a population of memory cells—is determined from the total current passing through the population of memory cells under read conditions, as observed on a common line, for example a source line in NAND flash memory.

Abstract: A semiconductor memory device comprises a memory cell array including a plurality of memory blocks each including a plurality of pages, wherein each of the plurality of pages includes at least one flag cell indicating whether data is in a corresponding page, and a peripheral circuit configured to read data of flag cells of a selected memory block in response to an erase request and to omit an erase operation on the selected memory block based on the data of the flag cells.

Abstract: A non-volatile memory device includes a plurality of memory cells, with each memory cell for storing a bit having a first logic value or a second logic value. An input is for receiving a word defined by bits to be stored in the plurality of memory cells. Programming circuitry is for programming a corresponding memory cell for each bit having the first logic value. Forming circuitry is for receiving the word from the input and for providing to the programming circuitry at least one additional word defined by bits to also be stored in the plurality of memory cells. The forming circuitry includes processing circuitry for calculating a current maximum number of simultaneously programmable bits, and logic circuitry for generating the additional word, with the additional word having a number of bits having the first logic value equal to the current maximum number.

Abstract: Non-volatile solid state mass storage device and methods for improving write performance thereof. The storage device includes a NAND flash controller, an array of NAND flash memory integrated circuits, and means for determining a lowest unused page number of each write target block in a group of the NAND flash memory integrated circuits that are simultaneously accessible at any given time by a write command. The storage device has further means for programming a dummy write to at least a first write target block in a first NAND flash memory integrated circuit within the group of NAND flash memory integrated circuits if the lowest unused page number within the first write target block is lower than the lowest unused page number of a second write target block in a second NAND flash memory integrated circuit in the group of NAND flash memory integrated circuits.

Abstract: In a non-volatile memory device, the parameters used in write and erase operation are varied based upon device age. For example, in a programming operation using a staircase waveform, the amplitude of the initial pulse can be adjusted based upon the number of erase-program cycles (hot count) of the block containing the selected physical page for the write. This arrangement can preserve performance for relatively fresh devices, while extending life as a devices ages by using gentler waveforms as the device ages.

Abstract: Methods of programming a memory, memory devices, and systems are disclosed, for example. In one such method, each data line of a memory to be programmed is biased differently depending upon whether one or more of the data lines adjacent the data line are inhibited. In one such system, a connection circuit provides data corresponding to the inhibit status of a target data line to page buffers associated with data lines adjacent to the target data line.

Abstract: A NAND flash memory bank having a plurality of bitlines of a memory array connected to a page buffer, where NAND cell strings connected to the same bitline are formed in at least two well sectors. At least one well sector can be selectively coupled to an erase voltage during an erase operation, such that unselected well sectors are inhibited from receiving the erase voltage. When the area of the well sectors decrease, a corresponding decrease in the capacitance of each well sector results. Accordingly, higher speed erasing of the NAND flash memory cells relative to a single well memory bank is obtained when the charge pump circuit drive capacity remains unchanged. Alternately, a constant erase speed corresponding to a single well memory bank is obtained by matching a well segment having a specific area to a charge pump with reduced drive capacity. A reduced drive capacity charge pump will occupy less semiconductor chip area, thereby reducing cost.

Abstract: The present disclosure includes methods, devices, modules, and systems for operating semiconductor memory. One method embodiment includes determining a status of a page of memory cells without using input/output (I/O) circuitry, and outputting the status through the I/O circuitry.

Abstract: Data errors in non-volatile memory inevitably increase with usage and with higher density of bits stored per cell. The memory is configured to have a first portion operating with less error but of lower density storage, and a second portion operating with a higher density but less robust storage. An error management provides reading and checking the copy after copying to the second portion. If the copy has excessive error bits, it is repeated in a different location either in the second or first portion. The reading and checking of the copy is accelerated by reading only a sample of it. The sample is selected from a subset of the copy having its own ECC and estimated to represent a worst error rate among the copy it is sampling. One embodiment has the sample taken from one bit of each multi-bit memory cell of a group.

Abstract: A memory device implements hybrid programming sequences for writing data to multiple level cells (MLCs). The memory device obtains specified data to write to the MLC and selects among multiple different programming techniques to write the specified data. Each of the programming techniques establishes a charge configuration in the MLC that represents multiple data bits. The memory device writes the specified data to the MLC using the selected programming technique. In one implementation, the programming techniques include a robust programming technique that preserves previously written data in the MLC in the event of a write abort of the specified data and an additional programming technique that has higher average performance than the robust programming technique. The selection may be made based on a wide variety of criteria, including whether data has been previously written to a block that includes the MLC.

Abstract: Devices and methods of programming memory cells, both SLC and MLC, such as to reduce charge-storage structure to charge-storage structure coupling, are shown and described. Programming of memory cells can include comparing a first page of data to a second page of data, and further programming cells corresponding to the first page of data that will not likely be affected by coupling from programming the second page of data.

Abstract: A method for multiple step programming programs data to an even page of memory cells. The even page of memory cells is read into a page buffer and the uncertain data is removed. An odd page of memory cells is programmed and the data from the even page data from the page buffer is reprogrammed to the even page of memory cells without the uncertain data.

Abstract: A non-volatile electronic memory device is integrated on a semiconductor and is of the Flash EEPROM type with a NAND architecture including at least one memory matrix divided into physical sectors, intended as smallest erasable units, and organized in rows or word lines and columns or bit lines of memory cells. At least one row or word line of a given physical sector is electrically connected to at least one row or word line of an adjacent physical sector to form a single logic sector being erasable, with the source terminals of the corresponding cells of the pair of connected rows referring to a same selection line of a source line.

Abstract: A non-volatile memory device includes first and second memory regions to store data and a memory control unit. Each of the first and second memory regions is configured by a plurality of physical pages. Each of the physical pages is configured by a plurality of regions corresponding to a plurality of logical addresses. The memory control unit performs control of batch erasing and batch writing on every physical page. When a first physical page in the first memory region includes a first region corresponding to a first logical address, which is a target to be written, and when a second physical page in the second memory region includes a second region corresponding to the first logical address, which is a target to be written, the memory control unit selects either the first physical page or the second physical page as a physical page for writing.

Abstract: A method of managing a page buffer of a non-volatile memory device comprises programming least significant bit (LSB) page data from an LSB page buffer into a page of memory cells, and retaining the LSB page data in the LSB page buffer until most significant bit (MSB) page data corresponding to the LSB page data is programmed in the page.

Abstract: In a nonvolatile memory, less than a full block maybe erased as one or more pages. A select voltage is applied through pass transistors to each of plural selected wordlines and an unselect voltage is applied through pass transistor to each of plural unselected wordlines of a selected block. A substrate voltage is applied to the substrate of the selected block. A common select voltage may be applied to each selected wordline and the common unselect voltage may be applied to each unselected wordline. Select and unselect voltages may be applied to any of the wordlines of a select block. A page erase verify operation may be applied to a block having plural erased pages and plural nonerased pages.

Abstract: The present disclosure includes methods, devices, modules, and systems for operating non-volatile multilevel memory cells. One method embodiment includes assigning, to a first cell coupled to a row select line, a first number of program states to which the first cell can be programmed. The method includes assigning, to a second cell coupled to the row select line, a second number of program states to which the second cell can be programmed, wherein the second number of program states is greater than the first number of program states. The method includes programming the first cell to one of the first number of program states prior to programming the second cell to one of the second number of program states.

Abstract: A memory control method is used for controlling a flash memory. The flash memory includes a first memory element and a second memory element. The second memory element includes multiple blocks and each block includes multiple pages. In this method, original data are written to the first memory element. Input data are obtained by reading the original data from the first memory element. The input data includes multiple input data rows. The input data rows are divided into data groups. Each input data row corresponding to each data row is written to a corresponding data page on the second memory element. A parity row corresponding to each data group is written to a data page on the second memory element. The number of data rows for each data group is smaller than the number of each block in the second memory element.

Abstract: A nonvolatile memory device includes at least a memory cell block including memory cells that are coupled to a plurality of word lines, respectively, and store data; a content addressable memory (CAM) block including CAM cells that are coupled to the word lines, respectively, and store chip information for operations of the nonvolatile memory device; and a block switching circuit configured to couple the word lines with global word lines; and a voltage supply circuit coupled to the global word lines, for supplying a first read voltage to a selected global word line while supplying a first pass voltage to unselected global word lines in reading the memory cell block, and supplying a second read voltage to a selected global word line while supplying a second pass voltage to unselected global word lines in reading the CAM block, wherein the second pass voltage is lower than the first pass voltage.

Abstract: A memory system includes a controller and a memory part including a memory cell array including memory cells, word lines, bit lines including bit line pairs each composed of an even bit line and an odd bit line adjacent to each other, and sense amplifiers provided to the bit line pairs and configured to detect data in selected memory cells connected to a selected word line. When reading data is performed from first memory cells to which writing data is performed first in memory cell pairs each including two adjacent memory cells respectively connected to one of the even bit lines and one of the odd bit lines, the controller controls the memory part so as to change a read level voltage applied to the selected word line depending on a data write state of second memory cells in the memory cell pairs to which writing data is performed later.

Abstract: A method of reading sequential pages of flash memory from alternating memory blocks comprises loading data from a first page into a first primary data cache and a second page into a second primary data cache simultaneously, the first and second pages loaded from different blocks of flash memory. Data from the first primary data cache is stored in a first secondary data cache, and data from the second primary data cache is stored in a second secondary data cache. Data is sequentially provided from the first and second secondary data caches by a multiplexer coupled to the first and second data caches.

Abstract: A flash memory device wherein off cell margin is increased by controlling a voltage of a sensing node and a corresponding reading method, wherein the flash memory device includes a memory cell array; a sensing node voltage controller generating a precharge voltage and a sensing node voltage control signal; and a page buffer unit connected to the memory cell array through bit lines and having page buffers. The page buffers include a bit line connection unit connected between a corresponding bit line and a sensing node, that controls a voltage of the sensing node according to the sensing node voltage control signal; a precharge unit which precharges the sensing node according to the precharge voltage responsive to a precharge control signal; and a data input/output unit sensing a voltage level of the sensing node responsive to a latch control signal and outputting the data of the selected memory cell.

Abstract: The unintentional programming of an unselected (or inhibited) non-volatile storage element during a program operation that intends to program another non-volatile storage element is referred to as “program disturb.” A system is proposed for programming and/or reading non-volatile storage that reduces the effect of program disturb. In one embodiment, different verify levels are used for a particular word line (or other grouping of storage elements) during a programming process. In another embodiment, different compare levels are used for a particular word (or other grouping of storage elements) during a read process.

Abstract: A semiconductor memory device includes a memory cell array including memory block groups each coupled to bit lines, a page buffer group coupled to first bit lines of a first memory block group and configured to control voltages of the first bit lines of the first memory block group depending on data to be stored in memory cells in a program operation and configured to sense the voltage of the first bit lines in a read operation, at least one bit line coupling circuit configured to couple first bit lines of a nth memory block group to the page buffer group by selectively coupling first bit lines of the first to nth memory block groups in response to bit line coupling signals, and bit line control circuits configured to control second bit lines of the memory block groups in response to bit line control signals.

Abstract: A memory module can include a plurality of dynamic memory devices that each can include a dynamic memory cell array with respective regions therein, where the plurality of dynamic memory devices can be configured to operate the respective regions responsive to a command. A DRAM management unit can be on the module and coupled to the plurality of dynamic memory devices, and can include a memory device operational parameter storage circuit that is configured to store memory device operational parameters for the respective regions to affect operation of the respective regions responsive to the command.

Abstract: A method and apparatus for operating an array block of dual charge retaining transistor NOR flash memory cells by erasing the dual charge retaining transistor NOR flash memory cells to set their threshold voltage levels to prevent leakage current from corrupting data during a read operation. Erasure of the array block of NOR flash memory cells begins by selecting one of block section of the array block and strongly and deeply erasing, over-erase verifying, and programming iteratively until the charge retaining transistors have their threshold voltages between the lower voltage limit and the upper voltage limit of the first program state. Other block sections are iteratively selected and erased, over-erase verified, and programmed repeatedly until the charge retaining transistors have their threshold voltages between the lower voltage limit and the upper voltage limit of the first program state until the entire block has been erased and reprogrammed to a positive threshold level.

Abstract: A nonvolatile memory device includes a memory cell array configured to comprise a number of cell strings, a number of page buffers each coupled to the cell strings of the memory cell array through bit lines, and a bit line precharge circuit configured to precharge a selected bit line up to a voltage of a first level before one of the page buffers precharges the selected bit line.

Abstract: At least one data-line pair has a first data line aligned with a first column of memory cells and a second data line aligned with a second column of memory cells. The first data line is coupled to the second column of memory cells and the second data line is coupled to the first column of memory cells.

Abstract: A memory system includes a memory and a memory controller operating to control the memory. The memory includes a random accessible memory including a memory cell array operable in a random access mode, a NAND flash memory, and a selection circuit making the memory controller operate either one of the random accessible memory or the NAND flash memory.

Abstract: A method of programming a semiconductor memory device includes the steps of grouping memory cells in accordance with levels of threshold voltages to be programmed, programming the memory cell groups by sequentially applying program voltages to the memory cell groups, and program-verifying the memory cell groups.

Abstract: A nonvolatile memory device includes a flag cell configured to store flag information, a plurality of dummy cells adjacent to the flag cell, and program control logic configured to control a program operation on the flag cell and a dummy program operation on the plurality of dummy cells. When the program operation on the flag cell is performed, the program control logic performs the dummy program operation on at least one of the plurality of dummy cells.

Abstract: The present invention provides a two-cycle half-page read scheme by dividing whole NAND array bit lines (BLs) into an odd-BL group and an even-BL group. During the half-plane reading of NAND cells in the odd(even)-BL group, the half-plane even(odd)-BL group acts as the shielding BLs to protect over the odd(even)-BL string reading so that each half-page read operation is substantially reliable and free from BL coupling noise effect. Additionally, each half-page read operation is preferably divided into 3 periods: the first being a bias-condition setup period of the selected WL and remaining control signals; the second being a pre-charge period for all BLs; and the third being a half-page flash data sensing period.

Abstract: A method for managing a flash memory device including pages of memory cells is described. The memory device may be erasable at the page level, and the pages may include operative pages for storing operative values and service pages for storing information relating to the erasing of the operative pages. In response to a request to erase selected operative pages, the method may include determining a service page in use among the service pages according to service information stored in the service pages, verifying the presence a service page to be erased, and applying an erasing pulse to each service page to be erased. The method may also include writing an address of the operative pages into the service page in use, erasing the selected operative pages, and writing a completion indication of the erasing of the selected operative pages into the service page in use.

Abstract: A flash memory device comprises alternately arranged odd and even memory cells. The odd and even memory cells are connected to corresponding odd and even bitlines, which are connected to corresponding odd and even page buffers. In a read operation of the flash memory device, data is sensed at two different times via the odd and even bitlines. In certain embodiments, data is read from the odd page buffers while data is being sensed via the even bit lines, or vice versa.

Abstract: A method and system for extending the life span of a flash memory device. The flash memory device is dynamically configurable to store data in the single bit per cell (SBC) storage mode or the multiple bit per cell (MBC) mode. In the MBC storage mode, the cell can have one of multiple possible states, where each state is defined by respective threshold voltage ranges. In the SBC mode, the cell can have states with threshold voltages corresponding to states of the MBC storage mode which are non-adjacent to each other to improve reliability characteristics of the cell.

Abstract: A method for data storage includes accepting data for storage in a memory that includes multiple analog memory cells and supports a set of built-in programming commands. Each of the programming commands programs a respective page, selected from a group of N pages, in a subset of the memory cells. The subset of the memory cells is programmed to store M pages of the data, M>N, by performing a sequence of the programming commands drawn only from the set.

Abstract: According to an embodiment, a semiconductor memory device includes a first storage unit, a receiving unit, an acquiring unit, and an output control unit. The first storage unit is configured to store a value and address information in which a key address generated on the basis of a key associated with the value and a physical address of the value are associated with each other. The receiving unit is configured to receive a request for acquisition of the value associated with the key. The request contains the key. The acquiring unit is configured to acquire the physical address associated with the key address of the key contained in the request for acquisition on the basis of the address information. The output control unit is configured to acquire the value at the acquired physical address from the first storage unit and output the acquired value in response to the request.

Abstract: A non-volatile memory device capable of reading and writing a large number of memory cells with multiple read/write circuits in parallel has features to reduce power consumption during read, and program/verify operations. A read or program verify operation includes one or more sensing cycles relative to one or more demarcation threshold voltages to determine a memory state. In one aspect, selective memory cells among the group being sensed in parallel have their conduction currents turned off when they are determined to be in a state not relevant to the current sensing cycle. In another aspect, a power-consuming period is minimized by preemptively starting any operations that would prolong the period. In a program/verify operation cells not to be programmed have their bit lines charged up in the program phase. Power is saved when a set of these bit lines avoids re-charging at every passing of a program phase.

Abstract: The unintentional programming of an unselected (or inhibited) non-volatile storage element during a program operation that intends to program another non-volatile storage element is referred to as “program disturb.” A system is proposed for programming and/or reading non-volatile storage that reduces the effect of program disturb. In one embodiment, different verify levels are used for a particular word line (or other grouping of storage elements) during a programming process. In another embodiment, different compare levels are used for a particular word (or other grouping of storage elements) during a read process.

Abstract: A method for programming a NAND flash string. In the present method, wordlines are driven to a first pass voltage for coupling a string precharge voltage provided by a source line to the memory cells, where the string precharge voltage is greater than the first pass voltage. With the exception a first wordline corresponding to a first memory cell adjacent to a selected memory cell, all the other wordlines are driven to a second pass voltage greater than the first pass voltage. The first memory cell is positioned between the selected memory cell and a string select device. A second wordline corresponding to a second memory cell adjacent to the selected memory cell is driven to a first supply voltage for turning off the second memory cell. A third wordline corresponding to the selected memory cell is driven to a programming voltage greater than the second pass voltage. A bitline is then coupled to the selected memory cell.

Abstract: A nonvolatile memory system is described with novel architecture coupling nonvolatile storage memory with random access volatile memory. New commands are included to enhance the read and write performance of the memory system.

Abstract: A memory apparatus includes a memory cell array comprising a plurality of memory cells connected with a plurality of bit lines and a plurality of word lines, a page buffer unit connected to the plurality of bit lines and latch data read from a memory cell selected from the plurality of memory cells, and a control unit configured to generate a refresh signal according to a prestored current status and provide the refresh signal to the page buffer unit in order to substantially prevent loss of the data latched by the page buffer unit.

Abstract: A non-volatile memory device includes a first sector including a first sector selection transistor and a first plurality of pages connected to the first sector selection transistor, and a second sector including a second sector selection transistor and a second plurality of pages connected to the second sector selection transistor. Each of the first and second plurality of pages includes a memory transistor and a selection transistor, and a number of pages in the first plurality of pages is greater than a number of pages in the second plurality of pages.

Abstract: A memory device includes a memory cell array including a plurality of memory blocks, each memory block including a plurality of memory cells, a plurality of word lines coupled to rows of the plurality of memory cells, a plurality of bit lines coupled to columns of the plurality of memory cells, and a control unit controlling an erase operation so that erase data is simultaneously written in the plurality of memory cells corresponding to an erase unit. A first erase mode may include a first erase unit and a first erase data pattern. A second erase mode may include a second erase unit and a second erase pattern. At least one of the first and second erase units and the first and second erase data patterns are different.

Abstract: A programming method for a nonvolatile memory device includes performing a LSB programming operation programming all LSB logical pages, and thereafter performing a MSB programming operation programming all MSB logical pages, wherein during the LSB programming operation a selected MLC is programmed to a negative intermediate program state. A program sequence for the LSB and MSB programming operations may be sequential or non-sequential in relation to an order arranged of word lines.

Abstract: A method for operating a semiconductor memory device includes the steps of: erasing memory cells of a memory block to set the memory cells in a first erased state, programming a part of the memory cells of the memory block to convert them into a programmed state, raising threshold voltages of selected memory cells of the memory block and converting the selected memory cells from the programmed state to a second erased state, and reading data from the memory cells in the first erased state, the programmed state, and the second erased state, and outputting the data read from the memory cells in the first and second erased states with the same value.

Abstract: A system for error recovery for flash memory comprises a receiver and an interface. The receiver is configured to receive a portion of data. The receiver is further configured to identify a logical type of the portion of data. The receiver is further configured to adjust a threshold for error recovery of the portion of data based at least in part on the logical type. The receiver is further configured to read the portion of data using the adjusted threshold. The interface is coupled to the receiver.

Abstract: Embodiments of the inventive concept provide a nonvolatile memory device. The nonvolatile memory device includes a memory cell array, a read/write circuit, and a backup circuit. The memory cell array includes a first memory block including a first word line having first memory cells and a second word line having second memory cells. Each of the first memory cells and second memory cells configured to store first-bit data and second-bit data. The read/write circuit is configured to program data into the first and second memory cells and read data stored in the first and second memory cells. The backup circuit is configured to, after first-bit data are programmed into the first word line, but before second-bit data are programmed into the first word line, store first-bit data stored in the second memory cells of the second word line.

Abstract: Embodiments of solid-state storage system are provided herein include data recovery mechanism to recover data upon detection of a read error (e.g., an uncorrectable ECC error) in a storage element such as a page. In various embodiments, the system is configured to determine optimal reference voltage value(s) by evaluating the reference voltage value(s) of page(s) that are related to the page where the failure occurred. The related page(a) may include a page that is paired with the initial page where the failure occurred (e.g., the paired pages reside in a common memory cell), or a neighboring page that is physically near the page where the initial page, and/or a paired page of the neighboring page. In another embodiment, the system is configured to perform a time-limited search function to attempt to determine optimal reference voltage values through an iterative process that adjusts voltage values in a progression to determine a set of values that can retrieve the data.

Abstract: Systems and methods are disclosed for handling read disturbs based on one or more characteristics of read operations performed on a non-volatile memory (“NVM”). In some embodiments, a control circuitry of a system can generate a variable damage value determined based on one or more characteristics of a read operation. Using the damage value, the control circuitry can update a score associated with the block. If the control circuitry determines that the score exceeds a pre-determined threshold, at least a portion of the block can be relocated to a different memory location in the NVM. In some embodiments, portions of the block may be relocated over a period of time.