Abstract: A flash memory device reduces noise peak and program time through serial programming of program blocks of memory cells. The time interval or the number of the program groups is decreased according to the proceeding program loop in the plurality of program loops, reducing the total program time.

Abstract: Nonvolatile memory devices including memory cell arrays with a plurality of cell strings connected between a substrate and a plurality of bit lines and selected by selection lines, and a gating circuit configured to drive the selection lines in at least two directions.

Abstract: A semiconductor device includes a plurality of page buffers coupled to bit lines and suitable for performing a verification operation to output a verification signal to a verification terminal, wherein a predetermined number of page buffers are grouped into a sub-page buffer group; and verification signal control units, wherein each of the verification signal control units is coupled to the page buffers included in the corresponding sub-page buffer group and suitable for controlling to output the verification signals from the page buffers included in the corresponding sub-page buffer group to a verification terminal based on fail column data.

Abstract: A structure of a memory device and a method for making the memory device structure are described. The memory device includes an array of memory cells in an array level die. The array comprises a plurality of sub-arrays. Each of the sub-arrays comprises respective data lines. The memory device also includes page buffers for corresponding sub-arrays in a page-buffer level die. The memory device also includes inter-die connections that are configured to electrically couple the page buffers in the page-buffer level die to data lines of corresponding sub-arrays in the array level die.

Abstract: A system and method for reading memory cells in a multi-level cell memory device. A set of thresholds may be received for reading a current page of the memory cells. The set of threshold may include hard decision thresholds for hard decoding, soft decision thresholds for soft decoding, erase thresholds for erase decoding and/or other combinations of thresholds. The set of thresholds may be divided into a plurality of groups of thresholds. The current page may be simultaneously read using multiple thresholds, where each of the multiple thresholds is divided into a different group of thresholds.

Abstract: In a 3D stacked non-volatile memory device, multiple smaller drain-end selected gate (SGD) transistors replace one larger SGD transistor. The SGD transistors have different work functions in their control gates so that, during a programming operation, a discontinuous channel potential is created in an inhibited NAND string. The SGD transistor closest to the bit line has a higher work function so that the channel potential under it is lower, and the next SGD transistor has a lower work function so that the channel potential under it is higher. The different work functions can be provided by using different control gate materials for the SGD transistors. One option uses p+ polysilicon and n+ polysilicon to provide higher and lower work functions, respectively. Metal or metal silicide can also be used. A single SGD transistor with different control gate materials could also be used.

Abstract: A memory system having a serial data interface and a serial data path core for receiving data from and for providing data to at least one memory bank as a serial bitstream. The memory bank is divided into two halves, where each half is divided into upper and lower sectors. Each sector provides data in parallel to a shared two-dimensional page buffer with an integrated self column decoding circuit. A serial to parallel data converter within the memory bank couples the parallel data from either half to the serial data path core. The shared two-dimensional page buffer with the integrated self column decoding circuit minimizes circuit and chip area overhead for each bank, and the serial data path core reduces chip area typically used for routing wide data buses. Therefore a multiple memory bank system is implemented without a significant corresponding chip area increase when compared to a single memory bank system having the same density.

Abstract: A nonvolatile semiconductor memory device includes a memory cell array that share a plurality of bit lines, each block unit including a plurality of memory cells for storing user data and at least one memory cell for storing flag data indicating whether the block unit is defective, and a control unit configured to read the flag data from a block unit during a read operation or a write operation on the block unit, and when the flag data indicates the block unit is defective, discontinue the read operation and the write operation on the block unit.

Abstract: A semiconductor memory device comprises a memory cell array including a plurality of memory blocks each including a plurality of pages, wherein each of the plurality of pages includes at least one flag cell indicating whether data is in a corresponding page, and a peripheral circuit configured to read data of flag cells of a selected memory block in response to an erase request and to omit an erase operation on the selected memory block based on the data of the flag cells.

Abstract: A non-volatile (“NV”) memory device is able to enhance data integrity using threshold voltage (“Vt”) recalibration based on a selected scheme. Upon receiving a command for reading a data page, the process, in one embodiment, identifies a reference page which is located at a predefined location in a block of the NV memory. After reading the first reference data from the reference page by a reader in response to a first or current Vt, a first bit error rate (“BER”) is generated based on the comparison between the first reference data and the predefined known data pattern. If the first BER is greater than a predefined BER target, a second Vt is subsequently calculated in accordance with the first Vt. When the second BER is equal to or less than the predefined BER target, an optimal Vt is set to the second Vt. There are also two other methods using DC balance coding scheme and counting the number of 1's in the selected data page can be used in recalibrating the threshold voltage.

Abstract: An operating method of a memory controller controlling a nonvolatile memory device including a plurality of pages includes receiving a read request and a logical address from an additional device; determining a program state of an upper unselected word line of a selected word line corresponding to the received logical address; and transmitting a physical address corresponding to the logical address, state information, and a read command to the nonvolatile memory device according to a result of the determination in response to the read request, wherein the state information indicates a level of a first unselect read voltage the nonvolatile memory device is to apply to the upper unselected word line.

Abstract: Memory devices, methods for accessing a memory cell, and memory systems are disclosed. One such memory device includes a plurality of planes of memory cells. Each plane of memory cells includes series strings of memory cells that each have a select gate drain transistor. Control gates of corresponding select gates are coupled together by a shared local control line. Each of a plurality of global control lines are coupled to their corresponding local control line with only a single global select gate.

Abstract: A nonvolatile memory device includes a memory cell array having multiple memory blocks. Each memory block includes memory cells arranged at intersections of multiple word lines and multiple bit lines. At least one word line of the multiple word lines is included in an upper word line group and at least one other word line of the multiple word lines is included in a lower word line group. The number of data bits stored in memory cells connected to the at least one word line included in the upper word line group is different from the number of data bits stored in memory cells connected to the at least one other word line included in the lower word line group.

Abstract: A nonvolatile memory device comprises cell strings formed in a direction substantially perpendicular to a substrate and is configured to select memory cells in units corresponding to a string selection line. The device selects a page to be programmed among pages sharing a common word line, determines a level of a program voltage to be provided to the selected page according to a location of a string selection line corresponding to the selected page, and writes data in the selected page using the determined level of the program voltage.

Abstract: A semiconductor device includes first memory blocks arranged in a longitudinal direction, and including a plurality of strings, wherein the strings are formed along a vertical direction, and the strings adjacent to each other share bit lines or source lines with each other, each string including a drain selection transistor coupled to an odd drain selection line or an even drain selection line, memory cells coupled to word lines, and a source selection transistor coupled to an odd source selection line or an even source selection line, page buffers suitable for storing data, a selection switch unit suitable for transferring the data stored in the page buffers or various voltages supplied from an external source to the bit lines and the source lines; and a control circuit suitable for controlling the page buffers and the selection switch unit.

Abstract: A method and system for increasing the lifespan of a flash memory device by selectively erasing sub-blocks of a memory block. Each physical memory block of the flash memory device is dividable into at least two logical sub-blocks, where each of the at least two logical sub-blocks is erasable. Therefore, only the data of the logical sub-block is erased and reprogrammed while unmodified data in the other logical sub-block avoids unnecessary program/erase cycles. The logical sub-blocks to be erased are dynamically configurable in size and location within the block. A wear leveling algorithm is used for distributing data throughout the physical and logical sub-blocks of the memory array to maximize the lifespan of the physical blocks during programming and data modification operations.

Abstract: An indication of a page type which failed error correction decoding is received. A threshold to adjust is selected from a plurality of thresholds based at least in part on the page type. A third adjusted threshold associated with the page type is generated, including by: determining a first number of flipped bits using a first adjusted threshold associated with the page type, determining a second number of flipped bits using a second adjusted threshold associated with the page type, and generating the third adjusted threshold using the first number of flipped bits and the second number of flipped bits.

Abstract: In a method of operating a memory circuit, which includes a plurality of memory arrays each coupled with a corresponding input/output (IO) interface and a redundancy memory page a failing address of a failing bit cell is determined. The failing address is located in a memory page of one of the memory arrays. The method further includes repairing the failing bit cell by replacing the memory page with the redundancy memory page.

Abstract: The present invention discloses a discrete three-dimensional memory (3D-M). Its 3D-M arrays are located on at least one 3D-array die, while its read/write-voltage generator (VR/VW-generator) is located on a separate peripheral-circuit die. The VR/VW-generator generates at least a read and/or write voltage to the 3D-array die. A single VR/VW-generator die can support multiple 3D-array dies.

Abstract: A semiconductor device and a method of operating the same. The semiconductor device may include a plurality of memory blocks. Each of the plurality of memory blocks may include a plurality of cell strings extending substantially perpendicular to a semiconductor substrate, the plurality of cell strings sharing a plurality of bit lines, and a plurality of source lines respectively connected to the cell strings and word lines. Page buffers, connected to the bit lines, may store data. A selection switch portion may selectively transmit a voltage corresponding to data stored in the page buffers, and voltages supplied from an external source, to the bit lines and the source lines during the program operation, the read operation and the erase operation. A control circuit may control the page buffers and the selection switch portion.

Abstract: A method of operating a nonvolatile memory device includes determining whether a program operation is performed on even memory cells coupled to even bit lines of a selected page, setting a coupling resistance value between odd bit lines of the selected page and page buffers depending on whether the program operation for the even memory cells is performed, performing a program operation on the odd memory cells coupled to the odd bit lines, and coupling the odd bit line to the page buffer based on the set coupling resistance value and performing an verification operation for verifying whether threshold voltages of the odd memory cells on which the program operation is performed are a target voltage or more.

Abstract: A semiconductor device includes cell strings that each include a plurality of memory cells, a page buffer having latches coupled to bit lines and precharge the bit lines in response to page buffer control signals, a page buffer control circuit configured to generate the page buffer control signals using a high voltage source, and a controller configured to generate control signals for controlling the page buffer control circuit.

Abstract: A semiconductor memory device includes a memory cell array including first memory cells and second memory cells connected to at least one word line, a circuit group configured to perform a pre-program operation on the first memory cells using a target voltage and a main program operation on the first memory cells and the second memory cells using a final target voltage, and a control circuit configured to set the target voltage depending on variations in threshold voltages of the first memory cells caused by the main program operation of the second memory cells.

Abstract: A non-volatile memory device includes a memory cell block including a plurality of memory cells, a plurality of page buffer groups including a plurality of page buffers coupled to bit lines of the memory cell block, a pass/fail check circuit coupled to the plurality of page buffers and configured to perform a pass/fail check operation of comparing a total amount of current varying according to verify data sensed from the memory cells and stored in the page buffers with an amount of reference current corresponding to the number of allowed bits, and a control circuit configured to control the pass/fail check circuit by stopping, when a fail signal is generated during the pass/fail check operation currently being performed on a page buffer group among the plurality of page buffer groups, the pass/fail check operation on the remaining page buffer groups.

Abstract: A first read threshold associated with a first page in a block and a second read threshold associated with a second page in the block are received, where the first page has a first page number and the second page has a second page number. A slope and a y intercept are determined based at least in part on the first read threshold, the second read threshold, the first page number, and the second page number. The slope and the y intercept are stored with a block identifier associated with the block.

Abstract: A nonvolatile memory device includes a memory cell array, a page buffer unit which output a verify-read result, a reference current generating unit which generates a reference current signal, a page buffer decoding unit which outputs currents according to the verify-read result. The nonvolatile memory device further includes an analog bit counting unit which counts the currents, a digital adding unit which calculates an accumulated sum of the counting result, a pass/fail checking unit which outputs a pass signal or fail signal according to the calculation result, and a control unit controlling a program operation.

Abstract: A device comprises a non-volatile memory array, a first selection circuit selecting whether to make a first connection path between a first bit line and a first circuit node, and selecting whether to make a second connection path between the first bit line and a second circuit node, a power supplying circuit supplying a power supply voltage to the first circuit node, the power supply voltage being, when the first connection path is selected to be made, supplied to the first bit line, and a first voltage supplying circuit supplying a first voltage to the second circuit node, the first voltage being, when the second connection path is selected to be made, supplied to the first bit line, the first voltage and the power supply voltage being higher than a ground potential, and the first voltage being higher than the power supply voltage.

Abstract: A method for erasing a page-erasable EEPROM-type memory includes: the memory receiving a command associated with a set of addresses of pages of the memory to be erased, each page comprising several memory cell groups each forming a word, for each address of the set of addresses, selecting a word line corresponding to a page of the memory, and triggering the simultaneous erasing of all the selected word lines.

Abstract: An embodiment of the present invention provides a semiconductor device, including cell string comprising a plurality of memory cells; page buffer comprising latch and switching element, wherein the switching element is coupled between the latch and the bit line which is coupled to the cell string; and a page buffer controller configured to apply a gradually rising turn-on voltage to the switching elements during a bit line setup operation of a program operation.

Abstract: An erase process for a 3D stacked memory device controls a drain-side select gate (SGD) and a source-side select gate (SGS) of a NAND string. In one approach, SGD and SGS are driven to provide a predictable drain-to-gate voltage across the select gates while an erase voltage is applied to a bit line or source line. A more consistent gate-induced drain leakage (GIDL) at the select gates can be generated to charge up the body of the NAND string. Further, the select gate voltage can be stepped up with the erase voltage to avoid an excessive drain-to-gate voltage across the select gates which causes degradation. The step up in the select gate voltage can begin with the first erase-verify iteration of an erase operation, or at a predetermined or adaptively determined erase-verify iteration, such as based on a number of program-erase cycles.

Abstract: A nonvolatile memory device including memory blocks, a pre-decoder, and a row decoder is disclosed. Each of the memory blocks has a plurality of memory cells. The pre-decoder includes a multiplexer and negative level shifters. The multiplexer is configured to generate multiplexing signals in response to address signals. Each of the negative level shifters is configured to generate a converted multiplexing signal corresponding to a respective multiplexing signal by converting a multiplexing signal having a ground voltage into a converted multiplexing signal having a first negative voltage. The row decoder is configured to select at least one of the memory blocks in response to the converted multiplexing signals.

Abstract: Memory, memory devices, and a method for a backup sequence are disclosed. In one such memory device, sense circuitry and page buffers are coupled between a three transistor memory cell device and a non-volatile memory device. Enable/disable gates enable selective access to the sense circuitry and page buffers by either the three transistor memory cell device or the non-volatile memory device.

Abstract: An EEPROM circuit includes a data reception register and a column decoder. A buffer memory having a size corresponding to the size of a data page is included between the data reception register and the column decoder.

Abstract: A method for data storage includes initially storing a sequence of data pages in a memory that includes multiple memory arrays, such that successive data pages in the sequence are stored in alternation in a first number of the memory arrays. The initially-stored data pages are rearranged in the memory so as to store the successive data pages in the sequence in a second number of the memory arrays, which is less than the first number. The rearranged data pages are read from the second number of the memory arrays.

Abstract: A semiconductor memory device of the present invention includes a memory cell array configured to include a sensing circuit configured to perform program verifying of the page buffer group selected by the select signal, and configured to output a pass/fail signal corresponding to the page buffer group, a verifying result signal generation section configured to output one or more of a first verifying signal and a second verifying signal in accordance with pass or fail of the program for total page buffer groups by using the pass/fail signal, and a control circuit configured to output the select signals to verify the program after the program is performed, and control operation of the program in response to an output signal of the verifying result signal generation section.

Abstract: A method of programming a nonvolatile memory device includes sequentially programming first to (n?1)th logical pages of all the physical pages of a first memory block of the memory blocks in response to a first program command, a step of loading data of the first to (n?1)th logical pages stored in a first physical page of the first memory block and latching the loaded data in first to (n?1)th latches of each of the page buffers, respectively, when receiving a second program command after programming all the first to (n?1)th logical pages, and latching new program data, received along with the second program command, in an nth latch of the corresponding page buffer and programming the data, stored in the first to nth latches of the page buffer, into a first physical page of a second memory block of the memory blocks.

Abstract: A system on chip (SoC) provides a nonvolatile memory array that is configured as n rows by m columns of bit cells. Each of the bit cells is configured to store a bit of data. There are m bit lines each coupled to a corresponding one of the m columns of bit cells. There are m write drivers each coupled to a corresponding one of the m bit lines. An AND gate is coupled to the m bit lines and has an output line coupled to an input of a test controller on the SoC. An OR gate is coupled to the m bit lines and has an output line coupled to an input of the test controller.

Abstract: A data storage device includes a non-volatile memory that includes a three-dimensional (3D) memory and circuitry associated with operation of memory cells of the 3D memory. A method includes programming a first page at a word line of the non-volatile memory. While programming a second page at the word line, first storage elements of the word line are selectively programmed in response to a power drop at the data storage device to increase a state separation that separates data values of the first page.

Abstract: An erase process for a 3D stacked memory device controls a drain-side select gate (SGD) and a source-side select gate (SGS) of a NAND string. In one approach, SGD and SGS are driven to provide a predictable drain-to-gate voltage across the select gates while an erase voltage is applied to a bit line or source line. A more consistent gate-induced drain leakage (GIDL) at the select gates can be generated to charge up the body of the NAND string. Further, the select gate voltage can be stepped up with the erase voltage to avoid an excessive drain-to-gate voltage across the select gates which causes degradation. The step up in the select gate voltage can begin with the first erase-verify iteration of an erase operation, or at a predetermined or adaptively determined erase-verify iteration, such as based on a number of program-erase cycles.

Abstract: A semiconductor memory device comprises a memory cell array including a plurality of memory blocks each including a plurality of pages, wherein each of the plurality of pages includes at least one flag cell indicating whether data is in a corresponding page, and a peripheral circuit configured to read data of flag cells of a selected memory block in response to an erase request and to omit an erase operation on the selected memory block based on the data of the flag cells.

Abstract: A method of managing a non-volatile memory where the non-volatile memory comprises a plurality of memory blocks and each of the plurality of memory blocks includes a plurality of memory pages includes partitioning a memory page among the plurality of memory pages into a plurality of clusters; and writing data and a mapping information corresponding to the data into different clusters of the plurality of clusters.

Abstract: A flash memory device may operate from two supply voltages, one being provided externally, and the other being generated within the flash memory device from the external supply voltage. The flash memory device may be provided with a selectable-level buffer for interfacing with either low supply voltage or high supply voltage integrated circuits. To provide even greater flexibility, the flash memory device may be provided with the capability of receiving a second supply voltage from an external source, which may take precedence over the internally-generated second supply voltage or may be combined with the internally-generated second supply voltage.

Abstract: A flash memory controller, a non-transitory computer readable medium and a method for reading flash memory cells of a flash memory module. The method may include calculating a group of read thresholds to be applied during a reading operation of a set of flash memory cells that belong to a certain row of the flash memory module based upon a compressed representation of reference read thresholds associated with multiple reference rows of the flash memory module; and reading the set of flash memory cells by applying the group of reference read thresholds to provide read results.

Abstract: The present disclosure includes apparatuses and methods for determining soft data for combinations of memory cells. A number of embodiments include an array of memory cells, wherein the array includes a first memory cell and a second memory cell, wherein the first and second memory cells are each programmable to one of a number of program states, and wherein a combination of the program states of the first and second memory cells corresponds to one of a number of data states. A number of embodiments also include a buffer and/or a controller coupled to the array and configured to determine soft data associated with the program states of the first and second memory cells and determine soft data associated with the data state that corresponds to the combination of the program states of the first and second memory cells based, at least in part, on the soft data associated with the program state of the first memory cell and the soft data associated with the program state of the second memory cell.

Abstract: Data capacity efficiency is improved by de-duplicating data assigned with a code that is different for each data. A storage apparatus comprising a flash memory control device equipped with one or more flash memory modules, wherein the flash memory module comprises at least one flash memory chip for providing a storage area, and a controller for controlling writing/reading of data including user data and a guarantee code accompanying the user data to and from the storage area provided by the flash memory chip, wherein the controller respectively divides a plurality of the data having the common user data into the user data and the guarantee code, stores one of the user data in an area of a predetermined unit of the storage area, and links and stores each of the guarantee codes accompanying the plurality of user data in an area of a predetermined unit of the storage area.

Abstract: A nonvolatile memory device comprises a memory cell array and a voltage generator. The memory cell array comprises a plurality of memory cells connected in series between a string selection transistor connected to a bit line and a ground selection transistor connected to a source line. The voltage generator provides read voltages to word lines of memory cells selected from among the plurality of memory cells during a read operation. The read voltages of the selected memory cells differ from each other according to their respective distances from the string selection transistor.

Abstract: A method of programming a non-volatile memory device including a plurality of strings arranged in rows and columns comprises activating all or a part of selection lines in one column at the same time depending upon data to be programmed, driving a bit line corresponding to the one column with a bit line program voltage, and repeating the activating and the driving until bit lines corresponding to the columns are all driven.

Abstract: Techniques for a post-write read are presented. In an exemplary embodiment, a combined simultaneous sensing of multiple word lines is used in order to identify a problem in one or more of these word lines. That is, sensing voltages are concurrently applied to the control gates of more than one memory cell whose resultant conductance is measured on the same bit line. The combined sensing result is use for measuring certain statistics of the cell voltage distribution (CVD) of multiple word lines and comparing it to the expected value. In case the measured statistics are different than expected, this may indicate that one or more of the sensed word lines may exhibit a failure and more thorough examination of the group of word lines can be performed.

Abstract: Apparatuses, systems, and methods are disclosed to manage non-volatile media. A method includes determining a configuration parameter for a set of storage cells of a non-volatile recording medium. A method includes reading data from a set of storage cells using a determined configuration parameter. A method includes adjusting a configuration parameter based on read data.

Abstract: A non-volatile semiconductor storage device includes: a memory cell array having memory cells arranged therein, the memory cells storing data in a non-volatile manner; and a plurality of transfer transistors transferring a voltage to the memory cells, the voltage to be supplied for data read, write and erase operations with respect to the memory cells. Each of the transfer transistors includes: a gate electrode formed on a semiconductor substrate via a gate insulation film; and diffusion layers formed to sandwich the gate electrode therebetween and functioning as drain/source layers. Upper layer wirings are provided above the diffusion layers and provided with a predetermined voltage to prevent depletion of the diffusion layers at least when the transfer transistors become conductive.