Thermal Calibration System Patents (Class 374/1)
  • Patent number: 7661876
    Abstract: Infrared Ir Thermometer Calibration Systems and Methods are Disclosed in which the temperature of an IR thermometer calibration system is controlled such that radiation emitted by a target at a given input temperature is equal to the radiation emitted by a graybody heated to the input temperature and having an emissivity equal to an emissivity setting of an IR thermometer to be calibrated using the IR thermometer calibration system.
    Type: Grant
    Filed: November 14, 2007
    Date of Patent: February 16, 2010
    Assignee: Fluke Corporation
    Inventor: Frank E. Liebmann
  • Patent number: 7654733
    Abstract: A controller of a hob is connected to a temperature sensor of a radiation based heating element. In principle, two different groups of temperature sensors can be used, whose resistance values differ by approximately a factor of three. When the hob is first used, the resistance of the temperature sensor is measured at room temperature and is classified in one of the two groups of temperature sensors on the basis of a limit value between the two typical temperature profiles of the groups of temperature sensors. On the basis of this, calibration of the controller is carried out for the purpose of adjusting to the established group to which the temperature sensor belongs.
    Type: Grant
    Filed: August 21, 2008
    Date of Patent: February 2, 2010
    Assignee: E.G.O. Elektro-Geraetebau GmbH
    Inventors: Eugen Wilde, Wilfried Schilling
  • Publication number: 20100020842
    Abstract: A method for precision thermal measurement and control, especially for bioreactors, as well as the correction of temperature sensitive probes such as pH and dissolved oxygen. Typical control requirements are ±0.1° C. The thermal measurement circuit converts a sensor output to a high level voltage or current with great accuracy and provides noise immunity and sensor isolation. While digital outputs from sensor converters can have the greatest noise immunity, the noise associated with digital circuitry may contaminate low level sensor signals so in many cases an analog sensor converter is preferred because of low noise generation, especially if the converter is near the sensor. The circuit is low cost, reliable, generates minimal heat is immune to, and does not generate noise, and requires minimal calibration effort.
    Type: Application
    Filed: July 28, 2008
    Publication date: January 28, 2010
    Inventors: Alfred Riddle, Anthony Sproul
  • Patent number: 7651263
    Abstract: A method and apparatus for measuring the temperature of a gas in a mass flow controller is described. One embodiment derives gas-temperature information from a mass flow sensor of the mass flow controller without relying on a separate temperature sensor. This embodiment supplies a substantially constant electrical current to a thermal mass flow sensor of the mass flow controller, the thermal mass flow sensor being designed to measure a mass flow rate of the gas; measures an input voltage of the thermal mass flow sensor to obtain a present input voltage, the input voltage varying with a temperature differential between a pair of sensing elements of the thermal mass flow sensor; calculates an adjusted input voltage by accounting for a component of the present input voltage that is dependent on the mass flow rate of the gas; and calculates the temperature of the gas based on the adjusted input voltage.
    Type: Grant
    Filed: March 1, 2007
    Date of Patent: January 26, 2010
    Assignee: Advanced Energy Industries, Inc.
    Inventors: Michael John Zolock, Hiroyuki Ito
  • Patent number: 7648270
    Abstract: In one embodiment, an integrated circuit (IC) is provided with a thermal diode and a constant current source. In this embodiment, the saturation current of the diode may be determined by means external to the IC. During normal operation of the IC, the constant current source drives a current to the diode, and the forward bias voltage of the diode is used as a temperature indicator. In another embodiment, an IC is provided with a pair of thermal diodes and a constant current source. During normal operation of the IC, each of the diodes receives a current of different magnitude from the constant current source, and a comparison of the diodes' forward bias voltages is used as a temperature indicator.
    Type: Grant
    Filed: April 2, 2004
    Date of Patent: January 19, 2010
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: Fouad A. Faour, Brandon Gregory Greiner
  • Patent number: 7648271
    Abstract: Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages.
    Type: Grant
    Filed: April 23, 2007
    Date of Patent: January 19, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: Jerry L. Doorenbos, Marco A. Gardner
  • Publication number: 20100008394
    Abstract: The present invention relates to a method of measuring a temperature and/or temperature distribution at a resolution <1 &mgr; m in an object and to a device for performing such method, more particularly to a microscope for performing such method. The method comprises applying a molecular thermometer embedded in a matrix layer on an object, photoexciting the said molecular thermometer with a light source of said microscope and measuring emission of radiation from said molecular thermometer with two photodetectors of said microscope. A first intensity at a first wavelength is measured by said first detector, a second intensity at a second wavelength is measured by said second.detector, and a ratio of said intensities is calculated and used to determine a temperature with a calibrated curve. Said microscope is a confocal microscope or a stimulated emission depletion (STED) microscope.
    Type: Application
    Filed: December 12, 2007
    Publication date: January 14, 2010
    Applicant: SONY DEUTSCHLAND GMBH
    Inventors: Tzenka Miteva, Gabriele Nelles, Akio Yasuda
  • Publication number: 20100008160
    Abstract: A temperature sensor includes a temperature sensing unit for producing a sensing level by sensing an internal temperature in a semiconductor memory device, a reference level generating unit for setting up a reference level by selecting one of a plurality of reference voltages, which are set up according to the internal temperature of the semiconductor memory device, in response to a test mode signal and a temperature detecting signal, wherein the reference level generating unit includes fuse, and a comparison unit for comparing the sensing level to the reference level and producing the temperature detecting signal.
    Type: Application
    Filed: November 18, 2008
    Publication date: January 14, 2010
    Inventor: Seong Seop Lee
  • Publication number: 20100002744
    Abstract: A method enables measurement of an inverter loss within a motor control circuit for an appliance. The method includes applying a constant DC current generated from a first AC supply voltage to a motor winding through an inverter at a first duty cycle, measuring a first voltage corresponding to the current through the motor at a motor current sense resistor, computing a first ratio of the first measured voltage at the motor current sense resistor to a first DC input voltage corresponding to the first AC supply voltage, identifying a second duty cycle from the first computed ratio, comparing the second duty cycle to the first duty cycle, and identifying a first inverter loss factor from the difference between the first duty cycle and the second duty cycle.
    Type: Application
    Filed: July 3, 2008
    Publication date: January 7, 2010
    Applicant: EMERSON ELECTRIC CO.
    Inventor: Thomas J. Sheahan
  • Patent number: 7641390
    Abstract: A method for digitally controlling the resistive output of a temperature probe is disclosed. The system is comprised of a temperature sensor, a processor and a means under the control of the processor for modifying the resistive output such as a digital potentiometer. In one embodiment, the processor reads the temperature sensor and adjusts the potentiometer based on a correlative or predictive technique so as to provide a modified output that matches that of a standard resistive temperature probe and is compatible for display on a multi-parameter monitor.
    Type: Grant
    Filed: April 12, 2008
    Date of Patent: January 5, 2010
    Assignee: YSIS Incorporated
    Inventors: Jack P. Shidemantle, Robert A. Kill
  • Patent number: 7641385
    Abstract: A fixing apparatus according to one aspect of the present invention includes a non-contact temperature detecting element 81 allocated in non-contact with a heat roller, the sensing element detecting a temperature of the heat roller. The non-contact temperature sensing section 81 includes a thermopile P which detects a target temperature Pt of a heat roller 2, a temperature element CPU 100 which estimates an ambient temperature at the periphery of the thermopile P and computes an estimated ambient temperature SQt, and a thermister Q which detects an ambient temperature Qt at the periphery of the thermopile and outputs the ambient temperature Qt at an output voltage of a predetermined rate with respect to a total output voltage value corresponding to the estimated ambient temperature SQt.
    Type: Grant
    Filed: May 12, 2008
    Date of Patent: January 5, 2010
    Assignees: Kabushiki Kaisha Toshiba, Toshiba Tec Kabushiki Kaisha
    Inventors: Toshihiro Sone, Osamu Takagi, Satoshi Kinouchi, Yoshinori Tsueda
  • Publication number: 20090310642
    Abstract: A multiple sensor fiber optic sensing system. A method of sensing distributed temperature and at least another property in a well includes the steps of: interconnecting an optical switch to an optical fiber which extends along a wellbore in the well; operating the optical switch to optically connect the optical fiber to an interferometric measurement system; and operating the optical switch to optically connect the optical fiber to a distributed temperature measurement system. Another method includes the steps of: installing an optical fiber along a wellbore in the well, the optical fiber being a first distributed temperature sensor, the installing step including providing a substantial length of the optical fiber proximate a second sensor which senses the well property; and calibrating the second sensor using a temperature sensed by the first sensor in the substantial length of the optical fiber.
    Type: Application
    Filed: June 8, 2009
    Publication date: December 17, 2009
    Applicant: Halliburton Energy Services, Inc.
    Inventor: Neal G. SKINNER
  • Patent number: 7632012
    Abstract: A method for measuring the differential emissivity between two sites on the surface of a body and the temperature of the two sites. The method includes a plurality of measurements of the infrared radiation arising from each of the two sites under a number of different conditions. Some of the measurements include irradiation by external infrared radiation at a known wavelength and intensity. The infrared radiation arising from each of the sites may include emitted radiation, reflected ambient radiation, and reflected external radiation. Additionally, the temperature determined using the method described can be used to calibrate infrared imaging devices used to inspect the entire body.
    Type: Grant
    Filed: September 1, 2005
    Date of Patent: December 15, 2009
    Assignee: Siemens Energy, Inc.
    Inventor: Michael Twerdochlib
  • Patent number: 7628531
    Abstract: Systems and methods for calibrating a temperature sensing system are disclosed. In one respect, a dual light source configuration may be provided. A first light source may illuminate a sensing fiber and an anti-Stokes band may be detected. A second light source may illuminate a sensing fiber and a Stokes band may be detected, where the Stokes band is substantially similar to the anti-Stokes band of the first light source. A ratio between the anti-Stokes and Stokes band may be used to calibrate a temperature sensing system.
    Type: Grant
    Filed: March 13, 2007
    Date of Patent: December 8, 2009
    Assignee: SensorTran, Inc
    Inventors: Chung E. Lee, Kent Kalar, Michael E. Sanders
  • Publication number: 20090296769
    Abstract: Temperature sensing circuitry is used for thermal management of an electronic device. The temperature sensing circuitry includes at least one thermistor placed at or near a component of the electronic device. The temperature sensing circuitry also includes a high-precision resistor for calibration purposes. The resistance of the resistor is equivalent to the resistance of the thermistor at a reference temperature. A calibration reading is obtained using a set current that is being passed through the resistor. An error present in the temperature sensing circuitry is determined based on the calibration reading and a design value. A temperature measurement associated with the component is then made using the thermistor, while the set current is being passed through the thermistor. The error is corrected in the temperature measurement of the component. Other embodiments are also described.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 3, 2009
    Inventors: Hugo Fiennes, Keith Alan Cox
  • Publication number: 20090296770
    Abstract: To provide a fluorescent temperature sensor capable of identifying easily the location of a failure. A fluorescent temperature sensor for producing a temperature signal from fluorescent light from a fluorescent material and that has been optically stimulated comprises a light projecting module having an LED for projecting light at the fluorescent material and a second photodiode for receiving light emitted from the LED and a light receiving module having a first photodiode for receiving the light emitted from the fluorescent material, where the location of a failure in the sensor can be identified based on, at least, the output signal from the second photodiode.
    Type: Application
    Filed: May 21, 2009
    Publication date: December 3, 2009
    Applicant: Yamatake Corporation
    Inventors: Seiichiro Kinugasa, Atsushi Kato, Shunji Ichida
  • Publication number: 20090262776
    Abstract: The presently described embodiments are directed to a calibration method and system for thin film thermistors that are locally heated with integrated thin film heaters. Initially, print head temperature is either measured or referenced. Then, transient thermistor resistances are measured and used to determine the thermistor resistance at a higher temperature. Notably, this calibration method is advantageously implemented as a step of an existing process without having to expose the print heads to operating temperatures. In some implementations of the presently described embodiments, trimming of the thermistors may be required once calibrated.
    Type: Application
    Filed: July 6, 2009
    Publication date: October 22, 2009
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Scott Jong Ho Limb, Michael Yu Tak Young, Karl A. Littau
  • Publication number: 20090252193
    Abstract: A device for calibrating a fiber-optic temperature measuring system has a broadband light source, a coupling-in device, which can couple light generated by the light source for calibration into an optical fiber of the temperature measuring system, a coupling-out device, which can couple components of the light source-generated light that are backscattered in the optical fiber out of the optical fiber. An evaluation device performs a calibration of the temperature measuring system on the basis of the backscattered components of the light.
    Type: Application
    Filed: April 7, 2009
    Publication date: October 8, 2009
    Applicant: LIOS TECHNOLOGY GMBH
    Inventors: Wieland Hill, Martin Fromme, Jochen Kubler
  • Patent number: 7585106
    Abstract: A temperature fixed-point cell is configured with a crucible composed of carbon and a fixed-point material enclosed in the crucible. The fixed-point material has a peritectic structure of carbon and a carbon compound. A thermometer is calibrated by installing the temperature fixed-point crucible in a furnace, increasing or decreasing the ambient temperature thereof, measuring the temperature of the temperature fixed-point cell with the thermometer, observing the state of temperature change, and using this state of temperature change as a basis for the calibration. This invention is aimed at realizing a fixed point in the temperature range exceeding the copper point and accomplishing great improvement in accuracy in the calibration of radiation thermometers, thermocouples and all thermometers used in high temperature ranges.
    Type: Grant
    Filed: February 23, 2007
    Date of Patent: September 8, 2009
    Assignee: National Institute of Advanced Industrial Science and Technology
    Inventors: Yoshiro Yamada, Naohiko Sasajima
  • Patent number: 7582859
    Abstract: An infrared sensor calibration system including a calibration body at a known temperature a fixture for a package with at least two infrared sensors each aimed at a different location on the calibration body. Relative motion is provided between the calibration body and the fixture so each infrared sensor is immune to temperature variations across the calibration body during calibration of the infrared sensors.
    Type: Grant
    Filed: November 30, 2006
    Date of Patent: September 1, 2009
    Assignee: General Electric Company
    Inventor: Theodore J. Krellner
  • Patent number: 7575370
    Abstract: The present invention provides precise temperature estimation in a heat treatment apparatus that estimates temperatures of process objects by using a thermal model and performs a heat treatment while performing a temperature control based on the estimated temperatures. The heat treatment apparatus (1) includes a processing vessel (11) accommodating plural wafers W, plural heaters (31 to 33) and plural temperature sensors (S1 to S5), and stores the thermal model. The heat treatment apparatus 1 estimates temperatures of the wafers W based on outputs of the temperature sensors (S1 to S5) by using the thermal model and controls the heaters (31 to 33) based on the estimated temperatures, applying a heat treatment to the wafers W. The thermal model for an individual apparatus is made by calibrating a standard thermal model designed for a standard apparatus.
    Type: Grant
    Filed: July 1, 2004
    Date of Patent: August 18, 2009
    Assignee: Tokyo Electron Limited
    Inventors: Youngchul Park, Kazuhiro Kawamura, Yuichi Takenaga
  • Publication number: 20090201968
    Abstract: An apparatus for ascertaining and/or monitoring at least one temperature. The apparatus includes, according to a first variable, at least one temperature sensor, at least one reference temperature sensor, and at least one heating/cooling unit, which is thermally coupled with the temperature sensor and with the reference temperature sensor. According to a second variant, the invention includes that at least one reference temperature sensor, and the temperature sensor and the reference temperature sensor are embodied and placed in such a manner that they measure essentially the same temperature. At least one head transmitter is provided, which connects the temperature sensor and the reference temperature sensor with the head transmitter in such a manner that the head transmitter receives the data measured by the temperature sensor and the reference temperature sensor. At least one memory unit is provided, in which the measured data of the temperature sensor and the reference temperature sensor are storable.
    Type: Application
    Filed: July 13, 2006
    Publication date: August 13, 2009
    Applicant: Endress + Hasuer Wetzer GmbH + Co. KG
    Inventor: Stefan Schulze
  • Publication number: 20090201969
    Abstract: Circuitry is disclosed for the calibration of heating element and ambient temperature sensors, comprising: a) an amplifier having positive and negative inputs, and an output; b) one or more heating MOS transistors selectably coupled in parallel and having 1) a heating transistor drain coupled to the positive input of the amplifier; 2) a heating transistor source configured to receive a supply voltage; and 3) a heating transistor gate coupled to the amplifier output; c) one or more ambient MOS transistors selectably coupled in parallel and having 1) an ambient transistor drain, 2) an ambient transistor gate coupled to the amplifier output; and 3) an ambient transistor source configured to receive the supply voltage; d) a temperature difference resistance configured: 1) to be coupled at least partially between an ambient connection and the ambient transistor drain; and 2) to be coupled at least partially between the ambient connection and the negative input of the amplifier.
    Type: Application
    Filed: February 11, 2009
    Publication date: August 13, 2009
    Applicant: Zentrum Mikroelektronik Dresden AG
    Inventors: Mathias Krauss, Maha Jaafar
  • Patent number: 7572051
    Abstract: The presently described embodiments are directed to a calibration method and system for thin film thermistors that are locally heated with integrated thin film heaters. Initially, print head temperature is either measured or referenced. Then, transient thermistor resistances are measured and used to determine the thermistor resistance at a higher temperature. Notably, this calibration method is advantageously implemented as a step of an existing process without having to expose the print heads to operating temperatures. In some implementations of the presently described embodiments, trimming of the thermistors may be required once calibrated.
    Type: Grant
    Filed: November 15, 2004
    Date of Patent: August 11, 2009
    Assignee: Palo Alto Research Center Incorporated
    Inventors: Scott Jong Ho Limb, Michael Yu Tak Young, Karl A. Littau
  • Patent number: 7572052
    Abstract: The present invention provides a non-destructive method for monitoring and calibrating chamber temperature. One embodiment of the present invention provides a method for measuring temperature comprising forming a target film on a test substrate at a first temperature, wherein the target film has one or more properties responsive to thermal exposure, exposing the target film to an environment at a second temperature in a range higher than the first temperature, measuring the one or more properties of the target film after exposing the target film to the environment at the second temperature, and determining the second temperature according to the measured one or more properties.
    Type: Grant
    Filed: July 10, 2007
    Date of Patent: August 11, 2009
    Assignee: Applied Materials, Inc.
    Inventors: Jallepally Ravi, Maitreyee Mahajani, Yi-Chiau Huang
  • Patent number: 7572055
    Abstract: The present invention provides an outside air temperature determination apparatus including an outside air temperature detection means (3) disposed in a vehicle for detecting an outside air temperature; a control means (6) having a first determination processing portion (61) which performs a first determination processing to obtain a determination value based on the detection temperature detected by the outside air temperature detection means (3); and a speed detection means (4) for detecting a speed of the vehicle, wherein the control means (6) includes a second determination processing portion (62) which predicts a real outside air temperature based on a variation on the detection temperature detected by the outside air temperature detection means (3) and performs a second determination processing to obtain a determination value based on the predicted outside air temperature; and controls the second determination processing portion (62) to perform the second determination processing (STEP 6) prior to the fi
    Type: Grant
    Filed: June 13, 2008
    Date of Patent: August 11, 2009
    Assignee: Honda Motor Co., Ltd.
    Inventors: Masatoshi Kubota, Masafumi Higashiyama
  • Patent number: 7561058
    Abstract: An externally powered temperature calibration device includes a system that provides a warning of high temperatures within the device after the device has been disconnected from the external power. The warning system includes a capacitor that provides power to a light-emitting diode (“LED”) after the calibration device has been disconnected from the external power. A temperature sensor monitors the temperature of an internal component. An output signal from the sensor is used to control a switch that connects the capacitor to one of several resistors having different resistances. The switch therefore controls the discharge rate of the capacitor based on the sensed temperature at the time the calibration device was disconnected from the external power. As a result, the period during which the capacitor powers the LED can be commensurate with the time required for the internal component to cool from its initial temperature.
    Type: Grant
    Filed: June 14, 2006
    Date of Patent: July 14, 2009
    Assignee: Fluke Corporation
    Inventors: David W. Farley, Frank E. Liebmann, Allen E. Sjogren
  • Patent number: 7556423
    Abstract: The output of a solid-state temperature sensor is the ratio of a voltage proportional to a reference voltage. The solid-state temperature sensor used diodes in its sensing and reference circuits, however, these diodes exhibit a second order behavior that causes the temperature sensor output response to deviate from an ideal straight line. This output response deviation has a characteristic error curve that is shaped like a parabola. An offset that varies opposite to that of the temperature sensor output response deviation may be determined and applied in the digital domain as offset compensation after the temperature has been conversed to a digital value with an analog-to-digital converter (ADC). By adding this offset compensation to the digital output of the ADC, digital representations of the measured temperatures will track more linearly.
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: July 7, 2009
    Assignee: Microchip Technology Incorporated
    Inventor: Amado Abella Caliboso
  • Publication number: 20090168832
    Abstract: A temperature sensor diagnostic system for a vehicle comprises a deviation calculation module, a limits determination module, and a fault diagnostic module. The deviation calculation module calculates a deviation coefficient based on a time constant of a temperature sensor and a period between first and second temperatures measured by the temperature sensor, wherein the second temperature is measured after the first temperature. The limits determination module determines upper and lower temperature limits based on the first temperature and the deviation coefficient. The fault diagnostic module selectively diagnoses a fault in the temperature sensor when the second temperature is one of greater than the upper temperature limit and less than the lower temperature limit.
    Type: Application
    Filed: April 2, 2008
    Publication date: July 2, 2009
    Applicant: GM GLOBAL TECHNOLOGY OPERATIONS, INC.
    Inventor: Paul A. Bauerle
  • Patent number: 7549796
    Abstract: A digital temperature detection circuit adapted for use with a semiconductor device is disclosed. The digital temperature detection circuit comprises a digital temperature generation unit adapted to detect an internal temperature of the semiconductor device, convert the internal temperature into perception data in accordance with a perception data code, and output the perception data. The digital temperature detection circuit further comprises an offset shift unit adapted to shift the perception data in accordance with offset data to thereby generate standard data; and, an offset generation unit adapted to generate the offset data, wherein the offset generation unit is controlled from outside of the digital temperature detection circuit.
    Type: Grant
    Filed: January 18, 2007
    Date of Patent: June 23, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jeong Sik Nam, Byung Kwan Chun
  • Publication number: 20090154519
    Abstract: A method for calibrating a thermometer is provided. The method includes deriving values of at least two different reference calibration coefficients of a reference calibration equation. The reference calibration equation relates temperature of a reference temperature sensor to at least two different calibration coefficients and a measured characteristic of the reference temperature sensor. A primary temperature sensor of the thermometer is calibrated using the derived values of the at least two different reference calibration coefficients. In another method for calibrating a thermometer, value of at least one reference calibration coefficient is derived from a reference calibration equation. The reference calibration equation is a non-linear equation relating the temperature of the reference temperature sensor to the at least one calibration coefficient and a measured characteristic of the reference temperature sensor.
    Type: Application
    Filed: February 19, 2009
    Publication date: June 18, 2009
    Applicant: Sherwood Service AG
    Inventor: Jeffrey E. Price
  • Patent number: 7547137
    Abstract: It is discovered that a range of showing a state in which a sample is at a constant temperature at a freezing temperature by a latent heat can be specified from a result of a differential scanning calorimetry in a cooling procedure and a method of acquiring the freezing point of the sample from data in the range is shown. For example, an output temperature of an intersection constituted by a tangential line extrapolated from a DSC curve, an output temperature curve, and a base line or an extension of a range brought into a liquid state including a supercooled state is read, and a method of analyzing the DSC curve, the output temperature curve constituting the freezing point of the sample by a temperature of the intersection is discovered and adopted.
    Type: Grant
    Filed: February 13, 2007
    Date of Patent: June 16, 2009
    Assignee: SII Nano Technology Inc.
    Inventor: Toshihiko Nakamura
  • Publication number: 20090147820
    Abstract: In one example embodiment, a board for measuring device temperatures comprises a base and one or more fingers extending from the base. The base and the one or more fingers comprise a flexible material. One or more first temperature sensors are disposed on the one or more fingers. One or more second temperature sensors are disposed on the base. Each of the first and second temperature sensors comprises a partially thermally isolated temperature sensor.
    Type: Application
    Filed: December 8, 2008
    Publication date: June 11, 2009
    Applicant: FINISAR CORPORATION
    Inventors: Alex Fishman, Peter A. Scranton, Ramesh Sundaram
  • Publication number: 20090150110
    Abstract: This invention relates a method to use a bipolar transistor as temperature sensor and/or self-calibrated thermometer which is immune to errors generated by parasitic elements as resistances and ideality factors and their evolution. In this invention the product of the collector current values ICmi(VEBmi) as a function of the emitter-base forward bias voltage VEBim; ICi(VEBi)×exp(?qVEBi/kT0) is plotted as a function of the emitter-base forward bias voltage VEBim. T0 is a parameter which ensures that a region of the above mentioned plot results with a slope equal to zero, while simultaneously represents the transistor absolute temperature at the moment at which the collector current ICmi is obtained as a function of the forward bias VEBmi.
    Type: Application
    Filed: July 24, 2006
    Publication date: June 11, 2009
    Inventor: Jaime Mimila Arroyo
  • Publication number: 20090147819
    Abstract: Methods and systems for calibrating a temperature control system in a vapor deposition chamber. A temperature sensor senses temperature within a semiconductor processing chamber and generates an output signal. A temperature control system controls a chamber temperature by controlling a heating apparatus based on the output signal. A method includes instructing the control system to target a setpoint temperature, and depositing a layer of material onto a surface in the chamber by a vapor deposition process. A variation of a property of the layer is measured while depositing the layer, the property known to vary cyclically as a thickness of the layer increases. The measured property is allowed to vary cyclically for one or more cycles. If there is a difference between a time period of one or more of the cycles and an expected time period associated with the setpoint temperature, the temperature control system is adjusted based on the difference.
    Type: Application
    Filed: November 18, 2008
    Publication date: June 11, 2009
    Applicant: ASM AMERICA, INC.
    Inventors: MATTHEW G. GOODMAN, MARK HAWKINS, RAVINDER AGGARWAL, MICHAEL GIVENS, ERIC HILL, GREGORY BARTLETT
  • Publication number: 20090139367
    Abstract: A method of calibrating an adjustable control device using a knob assembly with adjustable temperature scale. A knob and a bezel that bears the temperature scale are assembled and the temperature scale is calibrated without physically changing any internals within the adjustable control device. The knob and bezel are secured to the adjustable control device so that the knob and bezel assembly can transmit an input load from a user through to the adjustable control device and so that the bezel can be rotated relative to the knob which remains fixed to an input shaft of the control for calibration purposes.
    Type: Application
    Filed: October 10, 2008
    Publication date: June 4, 2009
    Inventors: Paulo Jorge Rosa, David Popowich, Joseph Felix Scheuring, III
  • Patent number: 7537377
    Abstract: A method for performing highly accurate PCR employing an assembly, a heated cover and an internal computer. The assembly is made up of a sample block, a number of Peltier thermal electric devices and heat sink, clamped together. The sample block temperature is changed exclusively by the thermoelectric devices controlled by the computer. The control software includes calibration diagnostics which permit variation in the performance of thermoelectric coolers from instrument to instrument to be compensated for such that all instruments perform identically. The block heat sink assembly can be changed to another of the same or different design. The assembly carries the necessary information required to characterize its own performance in an on-board memory device, allowing the assembly to be interchangeable among instruments while retaining its precision operating characteristics. The instrument monitors the thermoelectric devices and warns of changes in resistance that may result in failure.
    Type: Grant
    Filed: February 15, 2005
    Date of Patent: May 26, 2009
    Assignee: Applied Biosystems, LLC
    Inventors: John G. Atwood, Adrian Fawcett, Keith S. Ferrara, Paul M. Hetherington, Richard W. Noreiks, Douglas E. Olsen, John R. Widomski, Charles M. Wittmer
  • Publication number: 20090129430
    Abstract: In a method for monitoring the functionality of a temperature sensor that can deliver an electrical signal as a function of the measured temperature and is disposed, in particular, in the cooling water circuit of an internal combustion engine, the persistence of the temperature sensor in the high signal range is made possible by a method encompassing the following steps: Characterizing the sensor as possibly faulty if the sensor indicates, upon engine shutdown, at least a maximum value of the cooling fluid temperature; determining a first gradient of the cooling fluid temperature, measured by the possibly faulty sensor, up to a first point in time after engine shutdown, and characterizing the sensor as fault-free if the gradient exceeds a minimum value; determining a second gradient of the cooling fluid temperature, measured by the possibly faulty sensor, between the point in time and a point in time after engine shutdown, and characterizing the sensor as fault-free if the second gradient exceeds a minimum va
    Type: Application
    Filed: October 24, 2005
    Publication date: May 21, 2009
    Inventors: Dirk Foerstner, Andreas Eckert, Siegfried Goetz, Joerg Neumann
  • Patent number: 7534033
    Abstract: A method and device for checking temperature values of a temperature sensor of a combustion engine are provided. A first temperature actual value is recorded during a first length of time at an ending of the operation of the combustion engine. A second temperature actual value is recorded during a second length of time during an operating state reflecting the starting of the combustion engine. A turn-off length of time of the combustion engine is determined between the ending of the operation of and the subsequent starting of the operation of the combustion engine. In addition, a temperature set value is established based on the first temperature actual value and on the turn-off length of time. An error of the second temperature actual value is recognized based on the second temperature actual value and on the temperature set value.
    Type: Grant
    Filed: November 4, 2005
    Date of Patent: May 19, 2009
    Assignee: Siemens Aktiengesellschaft
    Inventors: Oliver Prinz, Hong Zhang
  • Patent number: 7534028
    Abstract: A burning oven, especially for dental materials, is provided and includes a temperature detection element and a calibrating device for calibrating the temperature detection element. The calibrating device has a temperature sensor that in turn can be calibrated at a given number of temperature points, especially one or two temperature points.
    Type: Grant
    Filed: June 15, 2005
    Date of Patent: May 19, 2009
    Assignee: Ivoclar Vivadent AG
    Inventors: Rudolf Jussel, Heinrich K. Feichtinger
  • Publication number: 20090125267
    Abstract: A method and apparatus are provided for calibrating digital thermal sensors. A processor chip with a plurality of digital thermal sensors receives an analog voltage. A test circuit coupled to the processor chip receives a clock signal and a register coupled to the test circuit outputs a value on each clock cycle to a digital thermal sensor in the plurality of digital thermal sensors. The digital thermal sensor transitions an output state in response to the value of the register received in the digital thermal sensor equaling a temperature threshold of the digital thermal sensor. The value of the register at the point of transition is used to calibrate the digital thermal sensor. An incrementer increments the value of the register on each clock cycle in response to the value of the register received in the digital thermal sensor failing to equal the temperature threshold of the digital thermal sensor.
    Type: Application
    Filed: November 8, 2007
    Publication date: May 14, 2009
    Inventors: Charles R. Johns, Mack W. Riley, David W. Shan, Michael F. Wang
  • Patent number: 7529434
    Abstract: Methods and apparatus for distributed temperature sensing (DTS) along a single mode or multimode optical waveguide or fiber include a calibration of initial Brillouin-based DTS measurements using Raman-based DTS measurements to enable accurate subsequent Brillouin-based DTS measurements. Such calibration may occur while the fiber is deployed in the environment in which temperature is to be sensed and thereby corrects influences on Brillouin scattered light from stress or strain along the fiber. Further, calibration may utilize one or more discrete temperature sensors to correct errors in one or both of the Brillouin-based DTS measurements and the Raman-based DTS measurements.
    Type: Grant
    Filed: January 29, 2008
    Date of Patent: May 5, 2009
    Assignee: Weatherford/Lamb, Inc.
    Inventors: Domino Taverner, Douglas A. Norton
  • Publication number: 20090110022
    Abstract: Temperature detection circuitry is selectively coupled to a thermistor and one of two sources representing the impedance at respective ends of the expected range of temperature to which the thermistor is to be exposed. The offset of an amplifier and a scale factor to account for gain set of the amplifier are determined in an automatic calibration process while coupled to the source(s), and thereafter temperature readings are taken from the thermistor. During the calibration process, if the gain or scale factor are outside of expected ranges, a failure is determined and an alarm given and/or a heater is disabled.
    Type: Application
    Filed: October 29, 2007
    Publication date: April 30, 2009
    Applicant: SMITHS MEDICAL ASD, INC.
    Inventors: Robert L. Snyder, Maurice Wheatley
  • Publication number: 20090112503
    Abstract: An improved method and apparatus for setting a trip-point temperature value for detection of an over-temperature condition in a chip when a reading from a main temperature sensor exceeds the trip-point temperature value. In one embodiment, the trip-point temperature value is set to a known temperature limit value offset by a temperature difference, ?T. ?T is calculated by taking the difference between a reading of the main temperature sensor and a reading of another temperature sensor, remote from the main temperature sensor, while a heat-generating circuit is enabled. The main temperature sensor is distal from heat-generating circuit on the chip and the remote temperature sensor is proximate the heat-generating circuit. For multiple heat-generating circuits on the chip, a ?T is determined for each of the heat-generating circuits, and the largest ?T is used to calculate the trip-point temperature value. Advantageously, the largest ?T determination may be done only once.
    Type: Application
    Filed: October 31, 2007
    Publication date: April 30, 2009
    Inventor: James Matthew Hattis
  • Publication number: 20090110023
    Abstract: Disclosed are embodiments of an improved on-chip temperature sensing circuit, based on bolometry, which provides self calibration of the on-chip temperature sensors for ideality and an associated method of sensing temperature at a specific on-chip location. The circuit comprises a temperature sensor, an identical reference sensor with a thermally coupled heater and a comparator. The comparator is adapted to receive and compare the outputs from both the temperature and reference sensors and to drive the heater with current until the outputs match. Based on the current forced into the heater, the temperature rise of the reference sensor can be calculated, which in this state, is equal to that of the temperature sensor.
    Type: Application
    Filed: January 6, 2009
    Publication date: April 30, 2009
    Applicant: International Business Machines Corporation
    Inventors: William F. Clark, JR., Edward J. Nowak
  • Patent number: 7524106
    Abstract: There are occasions when an intermittent abnormality occurs in a water temperature sensor that is of a type that does not cause a sudden change in a detection value of the water temperature sensor. The movement of the detection value of the water temperature sensor when this type of abnormality occurs may be, for example, a movement in which the detection value of the water temperature sensor becomes lower even through warm up has been proceeding after engine start up has begun. When this type of movement of the detection value occurs, if the detection value of the water temperature sensor reduces, after engine start up has begun, to a value lower than that when start up began, it is immediately determined based on this fact that an abnormality of the water temperature sensor is occurring.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: April 28, 2009
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Norikazu Higashiyama, Koichi Satoya, Koichi Mizutani
  • Patent number: 7517144
    Abstract: The present invention is related to a method of determining the temperature in a system, said system comprising a molecular heater fraction and a molecular thermometer fraction, and to an integrated system for temperature determination and temporally and spatially resolved thermal profile detection, and to uses of such system.
    Type: Grant
    Filed: July 19, 2006
    Date of Patent: April 14, 2009
    Assignees: Sony Deutschland GmbH, Max-Planck-Gesel. zur Foerderung der Wissen. E.V.
    Inventors: Tzenka Miteva, Gabriele Nelles, Akio Yasuda, Stanislav Balouchev, John Lupton
  • Publication number: 20090086788
    Abstract: A temperature sensor and device and system including same comprise a switched capacitor circuit configured to generate a noise voltage in response to switching and circuitry configured to generate a relative temperature output signal proportional to an absolute temperature output signal in response to the noise voltage. The device includes a temperature sensors temperature sensitive device logic and temperature compensation logic configured to receive the absolute temperature and generate an adjustment signal to adapt the temperature sensitive device logic in response thereto. A related method for sensing temperature includes amplifying a noise voltage from a switched capacitor circuit in a plurality of parallel amplifier channels and removing amplifier noise from each of the plurality of parallel amplifier channels to form a relative output signal proportional to an absolute temperature.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 2, 2009
    Inventor: Nail Khaliullin
  • Publication number: 20090080490
    Abstract: Certain exemplary embodiments can provide a system, which can comprise a thermocouple input module. The thermocouple input module can be adapted to determine one or more calibration factors. The thermocouple input module can be adapted to store the calibration factors. The thermocouple input module can be adapted to apply the calibration factors to an incoming thermocouple voltage value to obtain an adjusted thermocouple voltage value.
    Type: Application
    Filed: September 9, 2008
    Publication date: March 26, 2009
    Applicant: Siemens Energy & Automation, Inc.
    Inventors: Stephen Weeks Mowry, JR., Robert Alan Weddle
  • Patent number: 7507019
    Abstract: A method for calibrating a thermometer is disclosed. The thermometer comprises a primary temperature sensor for determining the temperature of a target. The thermometer also comprises a reference temperature sensor positioned proximate to the primary temperature sensor and being responsive to an extraneous temperature affecting the primary temperature sensor. One calibration method calibrates the reference temperature sensor. This calibration can utilize a non-electrically conductive liquid bath for temperature control. Another calibration method calibrates the reference temperature sensor and the primary temperature sensor.
    Type: Grant
    Filed: May 19, 2006
    Date of Patent: March 24, 2009
    Assignee: Covidien AG
    Inventor: Jeffrey E. Price