Thermal Calibration System Patents (Class 374/1)
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Publication number: 20110054822Abstract: An apparatus and a method monitor condition of a temperature measurement point in an industrial process system by sensing vibration frequency of a thermowell positioned in a process fluid flow passage and providing a diagnostic output based upon the vibration frequency sensed. The apparatus includes a temperature measurement point having a thermowell, a vibration sensor, a temperature sensor, and a transmitter. The vibration sensor is fixedly attached to the thermowell, and the temperature sensor is positioned inside a bore cavity of the thermowell. The transmitter is electrically connected to both the temperature sensor and the vibration sensor.Type: ApplicationFiled: September 3, 2009Publication date: March 3, 2011Applicant: Rosemount Inc.Inventors: Dirk Willy Bauschke, Lara Ivey Kauchak, Duyen Mong-Thi Pham
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Patent number: 7887234Abstract: Methods for maximum scene surface temperature estimation for blades with reflective surface properties in advanced stationary gas turbines are disclosed. The approach utilizes high speed infrared imagery provided by an online monitor system using a focal plan array (FPA) for near-infrared monitoring during engine runtime up to base load. The one waveband method for temperature estimation is assumed as starting point. A lower surface emissivity and higher surface reflectance of thermal barrier coating (TBC) in near-infrared can cause systematic estimation errors. Methods using the one wave band method, with the purpose to reduce estimation errors for maximum temperatures are also disclosed. Theoretical results, data from numerical simulations, and real data from engine test are provided. A system for performing temperature estimation methods is also disclosed.Type: GrantFiled: October 16, 2007Date of Patent: February 15, 2011Assignees: Siemens Corporation, Siemens Energy, Inc.Inventors: Vinay Jonnalagadda, Dennis H. Lemieux, Visvanathan Ramesh, Matthias Voigt
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Publication number: 20110019713Abstract: There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system including a temperature sensor that includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.Type: ApplicationFiled: October 4, 2010Publication date: January 27, 2011Applicant: Micron Technology, Inc.Inventors: Manoj Sinha, Sujeet Ayyapureddi, Brandon Roth
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Patent number: 7874724Abstract: Two vertically offset thermistors for sensing a fluid such as oil and refrigerant in a compressor shell are monitored by a method that takes into account rapidly changing conditions within the shell. The system can determine the fluid's sump temperature, high/low liquid levels, and can determine whether the thermistors are sensing the fluid as a liquid, gas, or a mixture of the two, such as a foam or mist of liquid and gas. For greater accuracy, thermistor readings can be dithered and filtered to provide temperature or voltage values having more significant digits than the readings originally processed through a limited-bit A/D converter. For faster response, limited microprocessor time is conserved by sampling thermistor readings at strategic periods that enable the microprocessor to identify certain conditions and temperatures via simple delta-temperature ratios and undemanding equations rather than resorting to exponential functions or lookup tables to determine time constants.Type: GrantFiled: April 11, 2007Date of Patent: January 25, 2011Assignee: Trane International Inc.Inventors: Ronald W. Okoren, Jerry E. Brown, Joel C. VanderZee, Charles E. Nelson, Steven K. Klingemann, Jeffrey J. DeGroot
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Patent number: 7874725Abstract: An optical fiber temperature distribution measuring apparatus and a method for measuring optical fiber temperature distribution, provided with a light source for inputting a pulse light to an optical fiber to be measured, a signal detecting unit for detecting a received light intensity of a predetermined light included in a backscattering light generated by an input of the pulse light in the optical fiber to be measured, and a signal processing unit for calculating a value corresponding to a variation of the received light intensity due to a hydrogen molecular absorption of the optical fiber to be measured based on the received light intensity of the predetermined light, to compensate the received light intensity of the predetermined light corresponding to a temperature of the optical fiber to be measured based on the value.Type: GrantFiled: September 21, 2007Date of Patent: January 25, 2011Assignees: J-Power Systems Corporation, Sumitomo Electric Industries, Ltd.Inventors: Hidehiko Komeda, Tsuyoshi Igi, Yasushi Koyano, Fumiyoshi Ohkubo, Kazuaki Negishi
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Patent number: 7866882Abstract: The present standard radiation source comprises a black body having a cavity, a shielding plate positioned at an open end of the cavity, at least one first heater positioned in the shielding plate, at least one second heater positioned on the outer wall of the black body, a first insulation device covering the second heater and a temperature-controlling device positioned on the first insulation device.Type: GrantFiled: November 16, 2007Date of Patent: January 11, 2011Assignee: Industrial Technology Research InstituteInventors: Hsin Yi Ko, Chun Jen Lin
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Patent number: 7857508Abstract: In a method for monitoring the functionality of a temperature sensor that can deliver an electrical signal as a function of the measured temperature and is disposed, in particular, in the cooling water circuit of an internal combustion engine, the persistence of the temperature sensor in the high signal range is made possible by a method encompassing the following steps: Characterizing the sensor as possibly faulty if the sensor indicates, upon engine shutdown, at least a maximum value of the cooling fluid temperature; determining a first gradient of the cooling fluid temperature, measured by the possibly faulty sensor, up to a first point in time after engine shutdown, and characterizing the sensor as fault-free if the gradient exceeds a minimum value; determining a second gradient of the cooling fluid temperature, measured by the possibly faulty sensor, between the point in time and a point in time after engine shutdown, and characterizing the sensor as fault-free if the second gradient exceeds a minimum vaType: GrantFiled: October 24, 2005Date of Patent: December 28, 2010Assignee: Robert Bosch GmbHInventors: Dirk Foerstner, Andreas Eckert, Siegfried Goetz, Joerg Neumann
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Patent number: 7857510Abstract: A temperature sensor, in accordance with the principles of the invention comprises a silicon substrate. The silicon substrate includes a bandgap, an offset circuit for providing calibration offsets, and a gain block for providing an output that varies substantially linearly with changes in temperature of the substrate.Type: GrantFiled: November 8, 2003Date of Patent: December 28, 2010Inventors: Carl F Liepold, Craig M Aykroyd, Jonathan Daniel McLin
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Patent number: 7857505Abstract: A method and circuit for preventing an output signal, which has been corrected through digital correction or analog correction, from deviating from a target value and for preventing power supply noise and power consumption from increasing. A sensor amplification circuit receives output of a sensor as an input signal. Correction points are set at predetermined temperature intervals. The sensor amplification circuit performs digital correction for correcting the input signal with correction data set for each correction point. Further, the sensor amplification circuit performs a second correction for correcting the input signal between the correction points with gradient data calculated from the correction data for two of the correction points that are adjacent to each other.Type: GrantFiled: November 14, 2006Date of Patent: December 28, 2010Assignee: Fujitsu Semiconductor LimitedInventors: Hiroyuki Sakima, Koju Aoki, Takahiro Watai, Masaya Mizutani, Takuya Okajima
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Publication number: 20100316086Abstract: A system for measuring temperature includes a thermowell, a primary temperature sensor, a reference sensor, and a transmitter. The thermowell has a measurement instrument connection and a side port. The primary temperature sensor extends into the thermowell through the measurement instrument connection, and the reference sensor extends into the thermowell through the side port. The transmitter is connected to each of the primary temperature sensor and the reference sensor. The transmitter has circuitry for measuring temperature based upon signals received from the primary temperature sensor and for concurrently calibrating based upon signals received from the reference sensor.Type: ApplicationFiled: June 11, 2009Publication date: December 16, 2010Applicant: Rosemount Inc.Inventors: Loren Michael Engelstad, Dirk Willy Bauschke, Jason Harold Rud
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Publication number: 20100309947Abstract: Methods and systems accurately determine an analyte concentration in a fluid sample. In an example embodiment, a receiving port receives a test sensor. The test sensor includes a fluid-receiving area for receiving a fluid sample. The fluid-receiving area contains a reagent that produces a measurable reaction with an analyte in the fluid sample. The test sensor has a test-sensor temperature and the reagent has a reagent temperature. A measurement system measures the reaction between the reagent and the analyte. A temperature-measuring system measures the test sensor temperature when the test sensor is received into the receiving port. A concentration of the analyte in the fluid sample is determined according to the measurement of the reaction and the measurement of the test sensor temperature. A diagnostic system determines an accuracy of the temperature-measuring system. The calculation of the analyte concentration may be adjusted according to the accuracy of temperature-measuring system.Type: ApplicationFiled: June 8, 2010Publication date: December 9, 2010Applicant: BAYER HEALTHCARE LLCInventors: Narasinha Parasnis, Hoi-Cheong Steve Sun, Wu Mu
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Fixed-point cell, fixed-point temperature realizing apparatus, and method of thermometer calibration
Patent number: 7837382Abstract: A fixed-point cell is provided which can provide a fixed-point in a wide temperature range by changing the fixed-point material. During the use of the fixed-point cell, the fixed-point material can be prevented from being contaminated, and the crucible of the cell can be prevented from being cracked. The fixed-point cell includes: the crucible composed of carbon; the fixed-point material enclosed in the crucible and composed of one of a metal, a eutectic of a metal and carbon, and a eutectic of a metal carbide and carbon; and a woven fabric of graphite fibers containing 10 ppm or lower of impurities and interposed between the crucible and the fixed-point material.Type: GrantFiled: August 23, 2006Date of Patent: November 23, 2010Assignee: National Institute of Advanced Industrial Science and TechnologyInventor: Yoshiro Yamada -
Patent number: 7833348Abstract: An object of the invention is to calibrate an upper pyrometer for indirectly measuring a substrate temperature at the time of epitaxial growth in a comparatively short time and with accuracy to thereby improve the quality of an epitaxial substrate. After calibrating an upper pyrometer by a thermocouple mounted to a temperature calibrating susceptor, a measured value of a lower pyrometer is adjusted to a calibrated value of the upper pyrometer. Then, a correlation line between substrate temperature indirectly measured by the upper pyrometer at the time of epitaxial growth onto a sample substrate and haze of a sample substrate measured immediately after epitaxial growth is set to indirectly measure a substrate temperature by the upper pyrometer at the time of epitaxial growth onto a mass-production substrate.Type: GrantFiled: September 21, 2006Date of Patent: November 16, 2010Assignee: Sumco CorporationInventors: Naoyuki Wada, Hiroyuki Kishi
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Publication number: 20100285571Abstract: The invention relates to systems and methods for calibrating and using resistance temperature detectors. In one embodiment, the system includes a calibration circuit comprising a resistance temperature detector in a bridge circuit with at least one potentiometer, and a programmable gain amplifier coupled to the bridge circuit. Embodiments of the invention further comprise methods for calibrating the bridge circuit and the programmable gain amplifier for use with the resistance temperature detector and methods for determining the self heating voltage of the bridge circuit.Type: ApplicationFiled: May 8, 2009Publication date: November 11, 2010Applicant: Canon U.S. Life Sciences, Inc.Inventors: Johnathan S. Coursey, Kenton C. Hasson, Gregory H. Owen
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Patent number: 7824100Abstract: A temperature measurement device includes a first thermocouple mounted on a tubular body that is shielded from the effects of radiation by a radiation shield, and a second, unshielded thermocouple. A difference in the measured temperatures from the first and second thermocouples is compared with calculated temperatures using an iterative process to determine a corrected temperature of the gas stream that estimates and compensates for incident radiation.Type: GrantFiled: August 8, 2007Date of Patent: November 2, 2010Assignee: General Electric CompanyInventors: Mohamed Sakami, Fulton Jose Lopez, Hongmei Zhang, Shobhana Mani, Robert Michael Zirin, James Michael Storey, Aaton John Avagliano, David Howard Syck
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Publication number: 20100265986Abstract: A tip assembly for an IR thermometer apparatus includes a heat sink having a heat sink cavity and a tip section and a fluid path and at least one hydraulic port. The tip assembly also includes an IR sensor mechanically seated in the tip section and thermally coupled to the heat sink. The tip assembly also includes an electrical connector configured to provide an electrical connection to the tip assembly. A fluid having a fluid temperature is introduced into the fluid path via the hydraulic port. The fluid causes the heat sink and the IR sensor to substantially reach one or more pre-determined temperatures by thermal conduction during calibration of the tip assembly. Another tip assembly having an internal heat source is described. Another tip assembly having an internal heat pump is described. A method to calibrate a tip assembly is also described.Type: ApplicationFiled: April 20, 2009Publication date: October 21, 2010Applicant: Welch Allyn, Inc.Inventors: Matthew D. Mullin, Michael J. Anson, John A. Lane, David E. Quinn, Henry J. Smith, Ray D. Stone
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Publication number: 20100246630Abstract: An assembly includes a thermocouple, a cold junction sensor, and a circuit. The thermocouple has a process end and a cold junction end. The cold junction end has first and second cold junction terminals. The cold junction sensor is supported near the cold junction end and configured to measure temperature at the cold junction end. The circuit is electrically connected to the cold junction sensor and to the first and second cold junction terminals. The circuit is configured to produce a thermocouple signal as a function of voltage across the first and second cold junction terminals and to produce a cold junction sensor signal as a function of temperature of the cold junction end as measured by the cold junction sensor. The circuit is further configured to calculate a correlation between the thermocouple signal and the cold junction sensor signal.Type: ApplicationFiled: March 31, 2009Publication date: September 30, 2010Applicant: Rosemount Inc.Inventors: Robert J. Kaszynski, Charles E. Goetzinger
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Patent number: 7802917Abstract: Wafer temperature is measured as a function of time following removal of a heat source to which the wafer is exposed. During the wafer temperature measurements, a gas is supplied at a substantially constant pressure at an interface between the wafer and a chuck upon which the wafer is supported. A chuck thermal characterization parameter value corresponding to the applied gas pressure is determined from the measured wafer temperature as a function of time. Wafer temperatures are measured for a number of applied gas pressures to generate a set of chuck thermal characterization parameter values as a function of gas pressure. A thermal calibration curve for the chuck is generated from the set of measured chuck thermal characterization parameter values and the corresponding gas pressures. The thermal calibration curve for the chuck can be used to tune the gas pressure to obtain a particular wafer temperature during a fabrication process.Type: GrantFiled: August 5, 2005Date of Patent: September 28, 2010Assignee: Lam Research CorporationInventors: Keith William Gaff, Neil Martin Paul Benjamin
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Patent number: 7802916Abstract: There is provided a differential scanning calorimeter for exactly measuring a calorie variation of the measured sample on the basis of the temperature difference between sample container and the reference container without the influence of the heat irregularity incoming from the surroundings and the noise components.Type: GrantFiled: December 20, 2007Date of Patent: September 28, 2010Assignee: SII NanoTechnology Inc.Inventor: Yoshihiko Teramoto
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Patent number: 7798703Abstract: An apparatus and method is described for measuring a local surface temperature of a semiconductor device under stress. The apparatus includes a substrate, and a reference MOSFET. The reference MOSFET may be disposed closely adjacent to the semiconductor device under stress. A local surface temperature of the semiconductor device under stress may be measured using the reference MOSFET, which is not under stress. The local surface temperature of the semiconductor device under stress may be determined as a function of drain current values of the reference MOSFET measured before applying stress to the semiconductor device and while the semiconductor device is under stress.Type: GrantFiled: May 9, 2007Date of Patent: September 21, 2010Assignee: Infineon Technologies AGInventor: Rolf-Peter Vollertsen
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Publication number: 20100235141Abstract: Methods and systems for detecting faults in temperature sensors on engine systems provided with equipment for treatment of combustion products of an exhaust effluent stream during engine operation include determining sensor faults from differences in temperature between sensors present in such systems over time. Estimated exhaust gas temperatures may be compared against real time temperature measurements to arrive at a diagnostic residual value representing the difference between a modeled value and measured value, and deviation of the measured value from the modeled value is used to indicate a sensor fault.Type: ApplicationFiled: March 16, 2009Publication date: September 16, 2010Applicant: GM GLOBAL TECHNOLOGY OPERATIONS, INC.Inventors: Yue-Yun Wang, Yongsheng He
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Publication number: 20100226408Abstract: A testing device for testing thermal detectors includes a hollow sleeve, open on at least one end, configured to receive a thermal detector. The hollow sleeve can have a length greater than a diameter. A heater is positioned is in proximity to the hollow sleeve, and is configured to provide heat for testing the thermal detector. The heater can be a flexible foil heater. A power source is provided to supply power to the heater. A power control module can be provided for variably adjusting a set point temperature or a rate of temperature rise for the heater.Type: ApplicationFiled: March 6, 2009Publication date: September 9, 2010Inventor: Matthew Skinner
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Patent number: 7785000Abstract: In one aspect of the invention a drywell includes a heated receiver for receiving a temperature probe. The receiver has upper and lower ends and an inner shield positioned around the receiver to define a first air channel extending between the upper and lower ends. A flow plate is positioned above the upper end of the receiver and extends outwardly from the receiver. The flow plate defines a plate opening positioned over the receiver opening and has a lower surface sloping away from the receiver with distance above the receiver. A blower positioned below the lower end of the receiver induces air flow through the air channel. The lower surface of the flow plate directs the air flow away from the temperature probe.Type: GrantFiled: September 11, 2007Date of Patent: August 31, 2010Assignee: Fluke CorporationInventors: Kyle D. James, Scott M. Hampton, Michael W. Hirst
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Patent number: 7771113Abstract: A sensor diagnostic method, such as to determine rationality of one of three temperature sensors used in an exhaust aftertreatment system, includes determining the temperature difference between the first and second sensor, determining the temperature difference between the second and third sensor, determining whether the temperature differences are within an acceptable threshold range and comparing the two temperature differences to determine which sensor is in error, if any.Type: GrantFiled: June 29, 2007Date of Patent: August 10, 2010Assignee: Cummins Filtration IP, IncInventors: Todd Corbet, Ross C. Berryhill, Daniel R. Harshbarger
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Publication number: 20100195693Abstract: Until the accuracy in calculation of an estimated oil temperature value which is calculated by means of a heat dissipation amount map reaches a predetermined level, an ECU determines, when a transmission oil temperature well exceeds a predetermined temperature after the engine start, whether or not an oil temperature sensor fails. When it is determined that the oil temperature sensor is normal, the ECU uses the detected oil temperature value to learn about the heat dissipation map. When the accuracy in calculation of the estimated oil temperature value reaches the predetermined level through the learning about the heat dissipation amount map, the ECU determines whether or not the oil temperature sensor fails based on the divergence of the detected oil temperature value relative to the estimated oil temperature value.Type: ApplicationFiled: July 17, 2009Publication date: August 5, 2010Inventor: Kei KITAJIMA
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Patent number: 7766541Abstract: The invention relates to a method for detecting an abnormality of a temperature sensor. A plurality of temperature sensors are preliminarily grouped for each of predetermined attachment areas of a machine tool, and after a temperature of each part is measured in S1, the detected temperatures are classified in S2 for each of the grouped attachment areas, and then sorted in descending order in S3. Subsequently, a difference ?T between any closest two of the detected temperatures is obtained in S4, and then compared with a preset limit value ? in S5, when ?T exceeds the limit value ?, temperature sensors in a corresponding attachment area are determined abnormal in S6, and an alarm is displayed.Type: GrantFiled: December 5, 2007Date of Patent: August 3, 2010Assignee: Okuma CorporationInventor: Reiji Sato
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Patent number: 7762721Abstract: A device temperature measurement circuit, an integrated circuit (IC) including a device temperature measurement circuit, a method of characterizing device temperature and a method of monitoring temperature. The circuit includes a constant current source and a clamping device. The clamping device selectively shunts current from the constant current source or allows the current to flow through a PN junction, which may be the body to source/drain junction of a field effect transistor (FET). Voltage measurements are taken directly from the PN junction. Junction temperature is determined from measured junction voltage.Type: GrantFiled: April 3, 2008Date of Patent: July 27, 2010Assignee: International Business Machines CorporationInventors: Robert L. Franch, Keith A. Jenkins
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Publication number: 20100176746Abstract: A control system is disclosed for determining an actual temperature of a light emitting diode. The control system uses conductor that supply power to the light emitting diode to supply a pulse to the light emitting diode. The pulse is determined along with a reaction caused by the pulse and the information gained is used in determination of the light emitting diode die temperature which can then be used in controlling current to the light emitting diode to control the temperature of the light emitting diode.Type: ApplicationFiled: January 6, 2010Publication date: July 15, 2010Inventors: Anthony Catalano, Daniel Harrison
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Publication number: 20100172391Abstract: A method for testing a measuring device is used to determine a permittivity of a frying fat which permittivity is inter alia dependent on the temperature, while taking into consideration the temperature. The method is characterized in that the permittivity is measured at least two different temperatures and the temperature dependence is determined and is used to make a statement on the ability to function of the measuring device.Type: ApplicationFiled: January 24, 2007Publication date: July 8, 2010Inventors: Mike Muhl, Juergen Hall, Markus Langenbacher
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Patent number: 7748897Abstract: A method for monitoring the proper functioning of a temperature-dependent resistor, particularly a NTC resistor, for measuring the temperature of a medium heated by a heat source. Said medium is preferably the air flow in a clothes dryer for drying clothes. In order to increase the safety of a device, in particular a clothes dryer, where the temperature-dependent resistor is used in combination with a heat source, it is checked, once the heat source is switched on, whether the temperature measured by the resistor after a first predetermined period of time following the switching on of the heat source falls below a predetermined temperature threshold value. If this is the case, monitoring of a resistor-temperature curve characteristic of the temperature-dependent resistor is carried out.Type: GrantFiled: February 8, 2006Date of Patent: July 6, 2010Assignee: BSH Bosch und Siemens Hausgeraete GmbHInventors: Kai-Uwe Bache, Thomas Nawrot, Ulrich Nehring, Andreas Ziemann
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Patent number: 7744276Abstract: There are a number of sensors (2, 22) such as thermocouples which can provide a putative measurand signal which is within a predicted range for such signals whilst the sensor is incorrectly operating, such as as due to an open circuit. Techniques and processes are available to determine by interrogation sensor operational validity, but these can distort the measurand signal if correct. By time division multiplex techniques the present arrangement takes a putative measurand signal from a sensor (2, 22) in order that either within the same time division or more normally a separate time division, an interrogation of the sensor is performed in order to determine accuracy and therefore validity of the sensor 22.Type: GrantFiled: July 6, 2006Date of Patent: June 29, 2010Assignee: Rolls-Royce PLCInventor: Peter D Webb
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Patent number: 7736053Abstract: Disclosed are embodiments of an improved on-chip temperature sensing circuit, based on bolometry, which provides self calibration of the on-chip temperature sensors for ideality and an associated method of sensing temperature at a specific on-chip location. The circuit comprises a temperature sensor, an identical reference sensor with a thermally coupled heater and a comparator. The comparator is adapted to receive and compare the outputs from both the temperature and reference sensors and to drive the heater with current until the outputs match. Based on the current forced into the heater, the temperature rise of the reference sensor can be calculated, which in this state, is equal to that of the temperature sensor.Type: GrantFiled: January 6, 2009Date of Patent: June 15, 2010Assignee: International Business Machines CorporationInventors: William F. Clark, Jr., Edward J. Nowak
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Publication number: 20100142583Abstract: An analog thermometer calibration apparatus may comprise a substantially flat piece of steel or other suitably rigid material having at least one hexagonal or appropriately non-circular shaped aperture or opening formed designed to be at least generally complimentary in size and shape to the calibration adjustment member or projection of an analog type thermometer such that the two may engage in a substantially complimentary manner that will permit rotation of the thermometer readout dial and to prevent the relative rotation of the base or lower portion of the analog thermometer connected to a temperature sensing stem probe during the rotation of the analog thermometer dial face during a calibration procedure. A round or other suitably shaped aperture opening may be included to accommodate support and passage of the temperature sensing probe of a more accurate digital type thermometer (or a recently calibrated thermometer of any type) in order to provide a calibration reference temperature reading.Type: ApplicationFiled: September 11, 2009Publication date: June 10, 2010Inventor: Thor Manuel Christensen
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Patent number: 7731418Abstract: A method for calibrating a thermometer is provided. The method includes deriving values of at least two different reference calibration coefficients of a reference calibration equation. The reference calibration equation relates temperature of a reference temperature sensor to at least two different calibration coefficients and a measured characteristic of the reference temperature sensor. A primary temperature sensor of the thermometer is calibrated using the derived values of the at least two different reference calibration coefficients. In another method for calibrating a thermometer, value of at least one reference calibration coefficient is derived from a reference calibration equation. The reference calibration equation is a non-linear equation relating the temperature of the reference temperature sensor to the at least one calibration coefficient and a measured characteristic of the reference temperature sensor.Type: GrantFiled: February 19, 2009Date of Patent: June 8, 2010Assignee: Covidien AGInventor: Jeffrey E. Price
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Patent number: 7731417Abstract: A PWM signal generation circuit in an IPM includes an amplification circuit amplifying a voltage across terminals of a temperature sensor, a comparison circuit generating a PWM signal based on a triangular wave signal and an output signal of the amplification circuit, and a correction circuit setting an amplification ratio of the amplification circuit such that a pulse width of the PWM signal is set to a reference pulse width in an adjustment mode in which a switching element is caused to have a reference temperature. Consequently, characteristic variations in the temperature sensor, the amplification circuit, and the like can be corrected, and the temperature of the switching element can be detected with high accuracy.Type: GrantFiled: July 9, 2007Date of Patent: June 8, 2010Assignee: Mitsubishi Electric CorporationInventor: Toshiyuki Kumagai
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Publication number: 20100128254Abstract: A system (100) for sensing a temperature of a light emitting diode (LED). The system may comprise an LED having a spectral output centered at a first wavelength, a first filter (104) that transitions from attenuation to transmission at about the first wavelength, and a second filter (106) that transitions from transmission to attenuation at about the first wavelength. The system may also comprise a first sensor (108) positioned to sense a first intensity of the LED through the first filter and a second sensor (110) positioned to sense a second intensity of the LED through the second filter. It will be appreciated that a single sensor may be substituted instead of the first and second sensors, provided that the single sensor is capable of selectively viewing the LED through the first and the second filters. The system may also comprise a computer (112) configured to derive a temperature of the LED considering the first intensity and the second intensity.Type: ApplicationFiled: August 15, 2006Publication date: May 27, 2010Inventors: Jon K. Nisper, Michael J. Mater
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Publication number: 20100118911Abstract: A method for manufacturing a contact temperature sensor to be used at a temperature of use, including a) supplying a carbon fiber; b) heat treating of the fiber at a temperature higher than 800° C. and higher than the temperature of use; c) full layer depositing on the fiber, at a deposition temperature, an electrically insulating ceramic coating layer stable at the temperature of use, the ceramic material chosen among silica (SiO2), zirconia (ZrO2), and alumina (Al2O3); d) heat treating of the fiber, coated with the coating layer, at a temperature higher than the deposition temperature of the coating layer and higher than the temperature of use, or (c?) full layer depositing on the fiber a first coating layer of silicon carbide; d?) full layer depositing the first coating layer a second coating layer of boron nitride; e?) heat treating the fiber thereby obtained at a temperature above the deposition temperatures and the temperature of use of the sensor.Type: ApplicationFiled: February 8, 2008Publication date: May 13, 2010Applicant: Commissariat A L' Energie AtomiqueInventors: Christophe Lorrette, Rene Pailler, Jean-Marc Goyheneche, Jean-Christopher Batsale
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Patent number: 7708459Abstract: A temperature varying low-temperature comparative calibration including a vacuum jacket, a comparative calibration block in the vacuum jacket which is formed of a material of a high heat conductivity and which is maintained at a fixed temperature by a refrigerator or a heater, a reference thermometer housing portion in the comparative calibration block in which a reference thermometer is mounted, and an insertion hole in the comparative calibration block through which a calibration target thermometer is inserted from outside the vacuum jacket via an introduction pipe. The introduction pipe is filled with heat exchange gas.Type: GrantFiled: March 1, 2007Date of Patent: May 4, 2010Assignee: National Institute of Advanced Industrial Science and TechnologyInventors: Tohru Nakano, Osamu Tamura, Hirohisa Sakurai
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Publication number: 20100103975Abstract: A calibration apparatus for temperature probes comprising an elongate calibration chamber (1) with an opening (2) for receiving an insert (3) that has passages (4) for receiving temperature probes (6), and wherein the chamber (1) has several heat energy elements (9-11) that are controlled by temperature probes (12-14). In the insert as such one or more external probes (7) are provided, each of which has one or more temperature sensors to the effect that at least two sensors (19, 20 or 15, 17) are provided at respective dissimilar distances to an end of the insert (3). The latter sensors are connected to electronic regulation (20, 23) and measurement units (21, 24) for regulating the supply of power to the heat energy elements.Type: ApplicationFiled: October 27, 2008Publication date: April 29, 2010Inventors: Jan Haakon Harslund, Folke Galsgaard
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Publication number: 20100098130Abstract: In a hydrogen tank, discharge of a hydrogen gas may cause lowering of the temperature to a value at which it is assumed that disconnection has occurred in a thermistor. A temperature detection system for the hydrogen tank estimates the possibility that the temperature of the hydrogen tank is below this temperature value, according to the ambient temperature and the internal pressure. Only when there is no possibility that the temperature is below the value, disconnection is judged to have occurred.Type: ApplicationFiled: February 22, 2008Publication date: April 22, 2010Inventor: Naoki Kanie
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Publication number: 20100073670Abstract: A technique for an infrared radiation thermometer used for thermography detects measurement abnormality of the infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.Type: ApplicationFiled: March 25, 2008Publication date: March 25, 2010Inventors: Yuichi Furukawa, Shingo Nakamura, Yuji Okada, Fumio Kawahara
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Patent number: 7682073Abstract: A conventional radiation thermometer encompasses an infrared radiation sensor and a heatable and/or coolable radiation incidence window. The method and radiation thermometer according to the invention use the established dependence of the sensor signal U of the infrared radiation sensor on the temperature Tw of the radiation incidence window W (or any other heatable or coolable optical element in the beam path) for verifying its proper functional operation. Applying the method according to the invention, the radiation incidence window (or perhaps another optical element in the beam path) is heated up or cooled by activating an associated electric heating or cooling device. The resulting change ?Uw in the sensor signal U is detected, preferably in continuous fashion, as a function of the window temperature Tw and analyzed or verified for any deviation from an acceptable value or permissible range.Type: GrantFiled: August 25, 2005Date of Patent: March 23, 2010Assignee: Kaz, IncorporatedInventor: Bernhard Kraus
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Patent number: 7677794Abstract: The present invention relates to a multi fixed-point cell for calibrating a thermometer and a thermometer calibration apparatus using the same, wherein measuring errors can be checked by using a property of constant temperature of a metal on the basis of a phase transition and wide range of temperature region can be measured by one time calibration, thereby capable of increasing efficiencies of time and cost which are taken for calibration. In a multi fixed-point cell for calibrating a thermometer according to the present invention, a thermometer inserting hole in which a thermometer is inserted is formed at one side and at least two reference material inserting holes in which reference materials having different phase transition temperatures are inserted respectively are formed on a same plane as that of the thermometer inserting hole so as to be spaced apart each other.Type: GrantFiled: March 14, 2007Date of Patent: March 16, 2010Assignee: Korea Research Institute of Standards and ScienceInventors: Yong-gyoo Kim, Inseok Yang, Kee sool Gam, Kee hoon Kang
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Patent number: 7674035Abstract: A method for calibrating a digital temperature sensor circuit, the circuit comprising an analogue temperature sensing means, an internal reference voltage source and an analogue-to-digital converter (ADC). The ADC is arranged to receive respective signals from the analogue temperature sensing means and the reference voltage source and output a digital signal indicative of the ambient temperature. The method comprises the steps of determining the value of the internal reference voltage outputted by the reference voltage source, comparing it with the desired reference voltage value, and adjusting the reference voltage source in response to the result of the comparison step. Such an electrical voltage mode calibration can significantly reduce production costs, as it can be performed much faster than a traditional thermal calibration. The method can be applied to a sensor that produces a PTAT voltage that has to be compared to a temperature-independent bandgap reference voltage.Type: GrantFiled: September 13, 2005Date of Patent: March 9, 2010Assignee: NXP B.V.Inventors: Michiel Pertijs, Johan Huijsing
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Patent number: 7674038Abstract: To measure and regulate temperature, a temperature measuring resistor and a control element are accommodated in one layer as metallization on a substrate. The printed or otherwise manufactured conductors of the temperature measuring resistor and of the control element are arranged in close proximity to one another.Type: GrantFiled: October 24, 2001Date of Patent: March 9, 2010Assignee: Tesat-Spacecom GmbH & Co. KGInventors: Frank Heine, Lars Bartelt-Berger, Berry Smutny
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Publication number: 20100054298Abstract: The present invention relates to an optical fiber temperature sensor capable of reducing an error in a temperature measurement. The sensor comprises an optical fiber, an optical frequency difference adjusting section, a light source system, a spectrum measuring section, a temperature calculating section, and a correcting section. The light source system outputs, into different ends of the optical fiber, probe light and pumping light of which each center frequency is set corresponding to an instruction from the optical frequency difference indicating section respectively. The temperature calculating section calculates a temperature of an object based on BGS in a first domain measured by the spectrum measuring section. On the other hand, the correcting section outputs a correction instruction to the light source system so that BGS center frequency of a second domain may be in agreement with a reference value thereof.Type: ApplicationFiled: August 21, 2007Publication date: March 4, 2010Applicant: Sumitomo Electric Industries, Ltd.Inventors: Eisuke Sasaoka, Yoshinori Yamamoto
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Patent number: 7670047Abstract: A temperature sensor disposed in an exhaust system of an engine is inspected. Determination is made that conditions for inspecting the temperature sensor are satisfied in the current engine load range. The time for the temperature in the exhaust system to reach a value appropriate for checking the temperature sensor is determined in accordance with engine water temperature. Output of the temperature sensor is checked to determine if the temperature sensor is normal at the determined time.Type: GrantFiled: July 5, 2007Date of Patent: March 2, 2010Assignee: Honda Motor Co., Ltd.Inventors: Kouji Okayasu, Yoshinori Ishihara
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Publication number: 20100047058Abstract: A method for measuring temperature of a rotating body such as a steam turbine is provided. The method includes striking a light beam onto the rotating body onto the rotating body and measuring a reflectance of the light beam from the rotating body. The method further includes obtaining a temperature of the rotating body based upon the measured reflectance.Type: ApplicationFiled: August 25, 2008Publication date: February 25, 2010Applicant: General Electric Company, a New York CorporationInventors: Chayan Mitra, Ayan Banerjee, Norman Arnold Turnquist, Danian Zheng, Sandip Maity, Roy Paul Swintek
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Publication number: 20100040191Abstract: The invention relates to an integrated temperature sensor (1) comprising: means (2000) for generating a pulse train (DATA_IN) at an oscillation frequency, means (3000) for counting the number of pulses during a fixed period of time independent of a temperature to be measured (T) and for generating a plurality of bits (b11, b10, . . . , b0) indicating the number of pulses in the pulse train (DATA_IN), and means (4000) for generating a serial digital signal (DATA_OUT) from said bits (b11, b10, . . . , b0), in which the means (2000) for generating a pulse train (DATA_IN) include a plurality of logic gates (2410, 2420, 2430, 2440, 2450) which can introduce a delay dependent on the temperature to be measured (T), said means (2000) generating a pulse train (DATA_IN) the oscillation frequency of which is dependent on said temperature to be measured (T). The invention also relates to a temperature measurement method and to a transponder for a wireless system.Type: ApplicationFiled: October 9, 2006Publication date: February 18, 2010Inventors: Aritz Ubarretxena Belandia, Roc Berenguer-Pérez, César Matinez Antón, Daniel Egurrola López, Javier Hernández De Miguel
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Publication number: 20100037626Abstract: A temperature calibration device uses Peltier cells for heating and cooling. The Peltier cells are connected to a relay that connects the cells to each other in one configuration for heating and a different configuration for cooling. The Peltier cells also receive supply voltages having different magnitudes and polarities for heating and cooling. By changing the manner in which the Peltier cells are connected to each other and using different supply voltages for heating and cooling, the cells are able to operate closer to their specified maximum temperature differential without sacrificing the useful life of the cells.Type: ApplicationFiled: October 26, 2009Publication date: February 18, 2010Applicant: Fluke CorporationInventors: FRANK E. LIEBMANN, David W. Farley, Richard W. Walker, Michael W. Hirst, Allen E. Sjogren