Abstract: A method for modeling optical scattering includes an initial step of defining a zero-th order structure (an idealized representation) for a subject including a perturbation domain and a background material. A Green's function and a zero-th order wave function are obtained for the zero-th order structure using rigorous coupled wave analysis (RCWA). A Lippmann-Schwinger equation is constructed including the Green's function, zero-th order wave function and a perturbation function. The Lippmann-Schwinger equation is then evaluated over a selected set of mesh points within the perturbation domain. The resulting linear equations are solved to compute one or more reflection coefficients for the subject.

Abstract: The invention relates to an apparatus and to a method for adapting the size of an ion beam spot in tumor irradiation. For that purpose, the apparatus has a raster scanning device composed of raster scanning magnets (20) for raster scanning the ion beam (19). In addition, the apparatus comprises quadrupole magnets (10) determining the size of the ion beam spot, which quadrupole magnets (10) are arranged directly in front of the raster scanning magnets (20), and finally two magnet power supply units (18) for the quadrupole doublet of the quadrupole magnets (10) determining the size of the ion beam spot, the apparatus having a control loop for obtaining current correction values, by comparing desired and actual values of the prevailing dimension of the beam, for two magnet power supply units (18) of the quadrupole doublet arranged directly in front of the raster scanning magnets (20), for defined homogenization and/or for defined variation of the size of the ion beam spot.

Abstract: The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.

Abstract: The disclosed device features is a contacting three dimensional sole measuring device to produce accurate three dimensional renditions of the bottom of a human foot placed thereon. The device features one or a plurality of sensors groups communicating with the top surface of a case. Each sensor group is dimensioned to accommodate the area of a footprint of a human foot when placed on top of it. Each sensor group is composed of a plurality of linear displacement sensors which measure the displacement caused by the bottom surface of the foot and communicate that displacement to a data processing device which compiles a three dimensional rendition of the bottom of the foot surface from the individual data points from the displacement senors. Accurate renditions of the bottom surface of a human foot may be achieved by a person simply standing on the sensor groups barefoot.

Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.

Abstract: A method for determining the position of a sensor element which is used to measure a magnetic alternating field emitted by at least one generator unit. The sensor element receives a signal. Interference fields, which are the fields arising due to eddy currents generated in electrically conductive objects, are calculated. The eddy currents are calculated based on the alternating field. The position can be corrected based on the signal received in the sensor element.

Abstract: A method of recommending an appropriate size of athletic foot wear utilizing a gradiated pad. The method comprises: receiving a heel-to-toe length measurement into a computer, wherein the foot-to-toe length measurement is a first shoe size; receiving an arch length measurement into the computer, wherein the arch length measurement is a second shoe size; if the first shoe size is greater than the second shoe size, then using the computer to recommend an athletic foot wear size equal to first shoe size plus an additional one-half to full size; and if the first shoe size is less than the second shoe size, then using the computer to recommend an athletic foot wear size equal to the second shoe size plus an additional zero to one-half size.

Abstract: A system and method for outputting measurement data on an object to a graphic file thereof. The system comprises a data obtaining module (510) for gathering the measurement data and the graphic file of the object, a data processing module (520) for outputting the measurement data to the graphic file, and a graphic file management module (530) for storing the graphic file incorporating the measurement data. The data processing module further comprises an information gathering sub-module (521), a program invoking sub-module (522), a port capturing sub-module (523), an attribute changing sub-module (524), an attribute retrieving sub-module (525), an analyzing and calculating sub-module (526), and a dimension data outputting sub-module (527). A method for outputting measurement data on an object to a graphic file thereof is also disclosed.

Abstract: A system and method for detecting defects of objects based on a CAD (Computer-Aided Design) platform includes a measurement apparatus (10), an application server (12), and a database server (14). The application server includes a data acquiring module (120) for acquiring point cloud data of an object and acquiring a three-dimensional digital model of the object; a point cloud cutting (121) module for cleaning and editing the point cloud data; a point cloud filtering module (122) for filtering the point cloud data; a data aligning module (123) for aligning the point cloud data with the three-dimensional digital model of the object; a data comparing module (124) for comparing the point cloud data with the three-dimensional digital model of the object; and a report management module (125) for generating a color comparison report. A related method is also disclosed.

Abstract: Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including, but not limited to, a presence of macro and micro defects. In this manner, a measurement device may perform multiple optical and/or non-optical metrology and/or inspection techniques.

Abstract: A method for performing geometric dimension and tolerance stack-up analysis for an assembly, the method comprising receiving a target assembly dimension for stack-up analysis, where the assembly includes at least one part. The method further comprises receiving a feature corresponding to the part and receiving feature tolerance data associated with the feature. The feature tolerance data includes at least one of size tolerance and geometric tolerance. Stack-up rules are accessed in response to receiving the feature tolerance data. The stack-up rules include instructions to determine if a form tolerance, an orientation tolerance and a profile tolerance should be included in a stack-up tolerance for the feature. The stack-up rules also include formulas to calculate a nominal dimension and the stack-up tolerance for the feature when the feature tolerance data applies to features of sizes.

Abstract: The present invention relates to a method of determining the growth of trees based on first and second measurement data obtained at different moments of time by utilizing a laser scanner located above the measured trees. In order to determine the growth of a large number of trees as fast and as easy as possible, said method comprises: processing said first measurement data in order to determine the location of tree locations (A), processing said second measurement data in order to determine the location of tree locations (B), determining the locations which are tree locations according to the results of both said first and second processing (C), and calculating the growth of trees at said determined locations by determining the difference in the size indicated by the second measurement data as compared to the size indicated by said first measurement data (D).

Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibrations method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.

Abstract: A method for repairing a defective photomask having contained therein a minimum of one defect within a defective pattern employs a non-defective photomask for purposes of photoexposing a photoresist layer formed upon the defective photomask such as to form a patterned photoresist layer which leaves exposed the minimum of one defect. The minimum of one defect may then be repaired with the patterned photoresist layer in place as a repair mask. The method also provides for use of a non-defective pattern region within a defective photomask in a like fashion for repairing a defective pattern region within the same photomask. The method may be extended to repairing defective microelectronic products.

Abstract: A method for repairing a defective photomask having contained therein a minimum of one defect first provides forming a masking layer upon the defective photomask such as to leave exposed the minimum of one defect. Within the invention the minimum of one defect within the defective photomask may be repaired while employing the masking layer as a defect repair masking layer, to thus form a repaired photomask from the defective photomask. The method provides for efficient repairing of the defective photomask, absent transparent substrate damage.

Abstract: The present invention relates to a process and method for printing, utilizing a computer and computer printer, a scale instrument and conversion tool to be used in preparing and interpreting scaled drawings, maps, aerial photographs, graphs and similar documents. The instrument can be printed on paper, plastic film, or any flexible media capable of being processed by a computer printer. The invention includes a sub-process to not only print a scale denominated in the various scales typically used in preparing scaled drawings, etc., but also to print a scale denominated in any other scale to be used in interpreting a drawing, etc., which is not longer presented in the original scale due to reproduction, shrinkage, enlargement, or reduction.

Abstract: A method of measuring a concentration of a material includes irradiating an infrared light onto a substrate having a layer including a first material and dopants, wherein the infrared light is partially absorbed by and partially transmitted through the substrate including the layer. Intensities of the infrared light absorbed in the first material and the dopants are computed according to light wave numbers by utilizing a difference between intensities of the infrared light before and after transmitting the substrate and layer and by utilizing a difference between intensities of the infrared light absorbed in the substrate and layer and absorbed in only the substrate. Concentrations of the dopants are obtained by utilizing a ratio of light wave number regions corresponding to predetermined intensities of infrared light absorbed in the dopants relative to light wave number regions corresponding to the predetermined intensity of infrared light absorbed in the first material.

Abstract: A position detector includes a position indicator. Transmission/reception of electromagnetic waves relative to the position indicator is performed at least twice while the same loop coil is being selected. With a counter circuit and a switch circuit, a phase difference less than or equal to one cycle of a resonant frequency fO is added to a signal in each transmission/reception. The phase of a reception signal generated at the loop coil is adjusted, and the phase-adjusted signal is used as a detection clock by a synchronous detector circuit to perform synchronous detection. By computing the average or the sum of the results, external noise in the reception signals is cancelled out.

Abstract: In order to realize improving dimensional accuracy of a plastic workpiece and realize reducing a production cost and shortening time duration of manufacture, a computer comprises an initial die assembly shape calculating function to calculate a die assembly shape for the plastic workpiece according to a predetermined designed shape of said plastic workpiece; a workpiece shape calculating function to calculate the shape of the plastic workpiece to be manufactured with the initial die assembly shape considering a manufacturing condition of the plastic workpiece; a shape comparing function to compare the calculated shape of the plastic workpiece and the designed shape of the plastic workpiece; a workpiece-redesigning function to calculate a new designed shape of the plastic workpiece according to a result of the comparison; and a die assembly reshaping function to calculate a new die assembly shape according to the new designed shape of the plastic workpiece.

Abstract: The disclosed device features is a contacting three dimensional sole measuring device to produce accurate three dimensional renditions of the bottom of a human foot placed thereon. The device features one or a plurality of sensors groups communicating with the top surface of a case. Each sensor group is dimensioned to accommodate the area of a footprint of a human foot when placed on top of it. Each sensor group is composed of a plurality of linear displacement sensors which measure the displacement caused by the bottom surface of the foot and communicate that displacement to a data processing device which compiles a three dimensional rendition of the bottom of the foot surface from the individual data points from the displacement senors. Accurate renditions of the bottom surface of a human foot may be achieved by a person simply standing on the sensor groups barefoot.

Abstract: The present invention relates to a method for extracting individual band components from heavily overlapping bands. The method is based on first derivative-second derivative plots of an experimental spectrum and consists of two stases. The first stage is concerned with the geometric approach that estimates a set of values for the parameters of a component band in the overlapping bands, and repeats band decomposition of the remaining bands in the same manner after removing the estimated band from the overlapping bands. The second stage is to minimize the difference between the profiles of the estimated band and its complementary band by a least-squares optimization, and then to determine the optimum values of the band parameters.

Abstract: A method is provided that allows a simple and inexpensive apparatus to measure the uniformity of the height-directional positions of spheres or hemispheres such as bump electrodes of a semiconductor device. The degree of focus is calculated from an image of bump electrodes 11a and 11b acquired at a first focusing position F1 using an imaging system. After that, the bump electrodes 11a and 11b and the imaging system is relatively moved closer or farther, and then the degree of focus is calculated from an image acquired at a second focusing position F2. The degrees of focus at these two focusing positions F1 and F2 are compared with each other. As a result, detected are the contour lines of the horizontal cross sections of the bump electrodes 11a and 11b at the height (F1+F2)/2 of the position of equal degree of focus indicated by PQ. On the basis of the shapes and/or sizes thereof, the height-directional positions of the bump electrodes 11a and 11b are measured.

Abstract: A method of substrate eccentricity detection includes includes determining at least three positions on a perimeter of a first substrate, grouping the at least three perimeter positions to define one or more circles, estimating a location of a center of the first substrate as the location of a center of a predetermined circle approximated from the at least three perimeter positions, and determining an eccentricity vector as a difference between the estimated location and a reference position on a substrate transport mechanism on which the first substrate rests.

Abstract: Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including, but not limited to, critical dimension and a presence of defects. In this manner, a measurement device may perform multiple optical and/or non-optical metrology and/or inspection techniques.

Abstract: Embodiments of the invention generally provide a method for characterizing the surface topology of a hydrodynamic bearing used with a disc drive. In one embodiment, the invention provides a method to detect at least one hydrodynamic groove disposed on the hydrodynamic bearing. In another embodiment, the invention provides a method to measure the depth of at least one hydrodynamic groove. In still another aspect, the invention provides a method to establish a ratio between the hydrodynamic groove widths and the spacing between adjacent grooves.

Abstract: Methods and computer program products are provided for analyzing a crystalline structure, such as a wafer or an epitaxial layer in more detail, including the portion of the crystalline structure proximate the edge. The methods and computer program products of one aspect determine the average thickness and the normalized profile of a crystalline structure with enhanced detail. Additionally, the method and computer program product of another aspect represent the profile proximate the edge of the crystalline structure with a pair of lines that are selected to permit the profile of the crystalline structure proximate the edge of the crystalline structure to be characterized in more detail. Further, the method of yet another aspect permits the average edge profile for a plurality of crystalline structure to be defined.

Abstract: An apparatus for deriving a body fat area comprises a parameter measuring unit and/or a parameter input unit, an arithmetic unit and a display unit. The parameter measuring unit measures a parameter value correlated to the body fat area, including a subcutaneous fat area and a visceral fat area, and the parameter input unit enters a parameter value correlated to the body fat area. The arithmetic unit calculates the subcutaneous and visceral body fat area from the measured parameter value and/or from the input parameter value by using a regression equation. The display unit displays for the calculated subcutaneous and visceral fat areas in a concentric circle format.

Abstract: A system and method for measuring the radial runout of a shaft, rotatably supported on a standard rest, includes at least a first journal surface sensing assembly, a second journal surface sensing assembly, and a test surface sensing assembly which sense the radial position of the first journal surface, the second journal surface, and a test portion of the shaft, respectively, during rotation of the shaft. A transmitter of each surface sensing assembly transmits a runout signal which is received by a receiver of a computer. Within the computer, the runout signal from the test surface sensing assembly is adjusted with the runout signals from the first and second journal surface sensing assemblies to factor out deflection of the shaft caused by the standard rest and the shaft runout is computed and plotted using the normalized runout data.

Abstract: A part measurement system includes a press machine, a part measurement sensor, a part forming rail, and a press controller. The press machine includes a lower die coupled to an upper die, wherein the lower die includes a top surface supporting a strip of material to be formed into a part after a stripper plate coupled to the upper die contacts the strip of material. The part measurement sensor is located in the lower die and measures a critical dimension of the part while the part is in the lower die. The part forming rail is coupled to the lower die. The forming rail and the upper die form the critical dimension of the part. The press controller is coupled to the press machine and the sensor. The controller processes a measurement signal from the part measurement sensor of the critical dimension of the part, compares the measurement signal to a predetermined threshold value, and generates a command signal to the press machine to adjust the forming rail based on the measurement signal.

Abstract: A method and apparatus for determining a profile of a pavement. The method and apparatus includes determining a slope of a mobile machine as the mobile machine traverses the pavement, and determining a change in elevation of the pavement as a function of the slope and a distance from a first ground engaging member on the mobile machine to a second ground engaging member on the mobile machine, the change in elevation being indicative of a profile of the pavement.

Abstract: A method for performing geometric dimension and tolerance stack-up analysis for an assembly, the method comprising receiving a target assembly dimension for stack-up analysis, where the assembly includes at least one part. The method further comprises receiving a feature corresponding to the part and receiving feature tolerance data associated with the feature. The feature tolerance data includes at least one of size tolerance and geometric tolerance. Stack-up rules are accessed in response to receiving the feature tolerance data. The stack-up rules include instructions to determine if a form tolerance, an orientation tolerance and a profile tolerance should be included in a stack-up tolerance for the feature. The stack-up rules also include formulas to calculate a nominal dimension and the stack-up tolerance for the feature when the feature tolerance data applies to features of sizes.

Abstract: A method and apparatus for determining the shape and dimension of a human foot is disclosed. One embodiment of a method comprises the steps of obtaining an imprint of the foot, scanning the imprint of the foot to obtain pixel image data regarding the foot imprint at one or more points, determining at said one or more points the depth of the imprint from the pixel image data, and determining a size of said foot from the pixel image data. In one embodiment, an imprint is created by a person stepping onto a foam member. In one embodiment, the scanning step generates RGB pixel data and this data is converted to YIQ data. The depth of the imprint is generated using the Y or luminance value information for a point. In one embodiment, foot size information is determined from the scanned foot imprint. The foot size and shape data may be used to create an orthotic, shoe, sandal or the like.

Abstract: Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including, but not limited to, critical dimension and a thin film characteristic. In this manner, a measurement device may perform multiple optical and/or non-optical metrology and/or inspection techniques.

Abstract: A method and apparatus provides for particle size detection. A particle detector signal is utilized to provide particle size information. The particle detection signal is obtained by utilizing particle detector information.

Abstract: A system and method of metrology (10) whereby a three dimensional shape profile is defined (16) for a surface feature on a substrate by applying (38) a transform function F(x) to an image intensity map I(x,y) obtained (40) by inspecting the substrate with a scanning electron microscope (12). The transform function F(x) is developed (34) by correlating the image intensity map of a first wafer (18) to a height vector (32) obtained by inspecting the first wafer with a more accurate metrology tool, for example a stylus nanoprofilometer (14). A simple ratio-based transform may be used to develop F(x). An asymmetric multiple parameter characterization of the three dimensional shape profile may be developed (74) by plotting critical space and width dimensions (SL, SR, W1, WR) from a vertical axis (C—C) as a function of height of the feature.

Abstract: The present invention is directed to a method for custom fitting an article to a human being having the steps of defining a first set of human body dimensions to be reported by the human being, defining a second set of human body dimensions to be inferred from said first set of human body dimensions, providing a first mathematical model relating said second set of human body dimensions to said first set of human body dimensions, wherein said mathematical model has been generated by statistical analysis of a human anthropometric database, obtaining a first set of values of said first set of body dimensions by report of the human being, computing a second set of values of said second set of human body dimensions from said first set of values of said first set of human body dimensions by using said first mathematical model, defining a set of article dimensions, providing a second mathematical model relating said article dimensions to said first set of human body dimensions and said second set of human body dimen

Abstract: An improved method and system for solving a combinatorial optimization problem, such as a tracking problem, to define a plurality of associations of measurements taken of a plurality of objects is provided. In one aspect, a method, a system and a computer program product are provided for constructing a plurality of updated tracks by solving a Lagrangian dual in which each of the measurement constraints has been relaxed. In another aspect, a hybrid branch and bound and LR technique is provided to select a plurality of updated tracks from among a plurality of candidate tracks having respective initial costs. In this regard, a search tree of the candidate tracks is ordered based upon the initial costs of the candidate tracks as adjusted by the dual variables that have been defined as a result of solving a Lagrangian dual.

Abstract: A range finder device, for measuring, when a plurality of projected lights having radiation patterns whose light intensity differs three-dimensional space-wise are irradiated onto an object from a light source on a time-sharing basis to image-pick up reflected light of the projected light from the object with a camera, a distance using the light intensity of an image picked up, characterized in that, with respect to each of a plurality of surfaces including the center of the light source and the center of a lens, there is obtained, in advance, relation between an angle of each projected light from the light source and light intensity ratio in each surface, characterized in that, at the time of actual distance measurement, light intensity of each pixel of the camera is measured, and on the basis of the light intensity thus measured, and relation between the angle and the light intensity ratio on a predetermined surface corresponding to a coordinate position of the pixel measured, there is obtained the angle co

Abstract: A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system is formed by combining a plurality of three-dimensionally arranged planes. The calibration pattern unit comprises supporting members each of which has a predetermined surface corresponding to one of the planes, and a calibration pattern in which a predetermined pattern is formed on the predetermined surface of the supporting member. The supporting member can selectively set the calibration pattern unit to a first form for photographing when the correction information is obtained, and a second form for other purposes.

Abstract: Method of reducing waste in a process involving the cutting up of blocks of frozen foodstuff, especially blocks of plate frozen fish fillets are described in which at least the final cutting step is performed using a guillotine rather than a bandsaw. Additionally, methods and apparatus are described for adjusting the length of the frozen foodstuff which is advanced before the next cut is to be performed, so as to produce final cut pieces of substantially uniform weight. The methods allow for variations in density and variations in cross section to be accommodated.

Abstract: Process for plotting the shape of a contour (5, 6) of a previously machined ophthalmic lens (1), which comprises the operations consisting of:

Abstract: Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including, but not limited to, at least four properties of a specimen such as critical dimension, overlay, a presence of macro defects, and thin film characteristics. In this manner, a measurement device may perform multiple optical and/or non-optical metrology and/or inspection techniques.

Abstract: A principle curvature of a target curved surface S′ and a principle curvature of a corresponding position of a reference surface S are obtained and each part is displayed by being classified into (a) a case where two principle curvatures increase, (b) a case where two principle curvatures decrease, and (c) a case where one of the principle curvatures increases and the other decreases from the difference between the principle curvatures. (a), (b), and (c) are determined as mountain, valley, and twist, respectively, and are displayed in different symbols or colors on an image. Consequently, a different part between two three-dimensional shapes can be accurately grasped, the cause of the occurrence of the error such as a partial curve or the like can be easily found, how much the shapes coincide with each other as a whole can be indicated by an objective numerical value, and the error can be easily determined even if the reference shape is complicated.

Abstract: A compact speed measurement system for field or onsite use in measuring speeds of vehicles and capturing images of select vehicles. The system includes a laser speed detector for determining a speed of a vehicle in a specific target area. When a speed is determined, the detector generates a speed signal. The system includes a camera generally aligned with the speed detector operable to capture and store digital still images of vehicles in memory. The camera is programmed to respond to an image capture signal to generate and transmit a digital image file including a still image of the vehicle targeted by the detector. A portable field processor is communicatively linked to the speed detector and the camera to first receive the speed signal, to process the speed signal and to transmit an image capture signal to the camera, and to receive the digital image file from the camera.

Abstract: A system and method for measuring the radial runout of a shaft, rotatably supported on a standard rest, includes at least a first journal surface sensing assembly, a second journal surface sensing assembly, and a test surface sensing assembly which sense the radial position of the first journal surface, the second journal surface, and a test portion of the shaft, respectively, during rotation of the shaft. A transmitter of each surface sensing assembly transmits a runout signal which is received by a receiver of a computer. Within the computer, the runout signal from the test surface sensing assembly is adjusted with the runout signals from the first and second journal surface sensing assemblies to factor out deflection of the shaft caused by the standard rest and the shaft runout is computed and plotted using the normalized runout data.

Abstract: A method of determining a magnetic track width of a magnetic head is disclosed. The method begins by obtaining a full track profile of the magnetic head which includes a plurality of signal amplitudes read across a track of a magnetic disk at a plurality of magnetic head positions. An initial magnetic track width value is then determined from the full track profile data. Preferably, this initial value is the magnetic write width which is determined based on the difference between left and right head positions which read half of the maximum signal amplitude. To determine the final magnetic write width, the initial value is adjusted with side reading correction values. The side reading correction values are determined based on left and right side reading “tails” of a bell-shaped signal curve which is formed by the full track profile data when graphed. It is not necessary to obtain the microtrack profile to determine these side reading values.

Abstract: To provide an evaluation method and an evaluation apparatus for a cylindrical-shaped workpiece designated by a shape developed on a two-dimensional plane. A single two-dimensional reference shape data is substantially designated from a hard disk which includes a plurality of two-dimensional reference shape data based on a two-dimensional shape displayed on a two-dimensional plane where a curved surface of a reference cylindrical-shaped workpiece is developed. A reference cylindrical-shaped workpiece having a curved surface with a two-dimensional shape corresponding to the read two-dimensional reference shape data is converted by a converter into a surface shape of the reference cylindrical-shaped workpiece. In addition, a surface shape of an evaluation object cylindrical-shaped workpiece is measured, and a distance between a measurement point in the measurement and a point in the surface shape of the reference cylindrical-shaped workpiece corresponding to the measurement point is obtained by a calculator.

Abstract: In the present invention, for an NC program for controlling a machine tool, information for machining quality required by a machine tool is prewritten in the program. A measurement program for measuring the machining quality of the workpiece using a measuring machine is produced by analyzing the NC program. The machining quality of the workpiece is measured by the measurement program and the measuring machine. The machining quality of the workpiece can be judged by comparing the measurement results and the machining quality information included in the NC program. By utilizing this quality judgement, simple and effective system control can be achieved when a system such as CIM (Computer Integrated Manufacturing) is constructed in cooperation with other machine tools.

Abstract: At step 1, a golf ball model is divided into a large number of elements composed of a large number of nodal points in the form of meshes; a physical property of a material for the golf ball is inputted; a simulation is executed by an analysis based on a finite element method, assuming that a golf club head collides with the golf ball; and a strain amount generated in the golf ball model at the time of the collision is computed. At step 2, a stress and a strain component of each element of the golf ball model and coordinate values of the nodal points of each element are outputted; and a value of a stress and a strain of each of six components of each element are computed momently. At step 3, the relationship between the stress and the strain of each component of each element is found from the value of the stress and the strain of each of the six components; and energy loss values of each element are computed.

Abstract: A method of measuring an angle of inclination of trapezoidal microobject side faces includes positioning an object in a microscope so that a direction along which a scanning of a video signal is to be performed is substantially perpendicular to an orientation of an inclined side face, determining on a video signal two main peaks near edges of an object to be measured which are edge peaks having an asymmetrical shape, in each left and right edge peaks of the video signal using two characteristic points, analyzing a left edge peak and a right edge peak of the video signal, and determining an angle of inclination of a side face, based on the analysis of the left and right edge peaks and the characteristic points of the video signal.