Dimensional Determination Patents (Class 702/155)
  • Patent number: 7340371
    Abstract: A system, method, and computer program product for transformation of rotations to translation degrees of freedom in structural analysis during finite element formulation.
    Type: Grant
    Filed: August 11, 2004
    Date of Patent: March 4, 2008
    Inventor: Phanindranath Vedula
  • Patent number: 7333912
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: February 19, 2008
    Assignee: Omron Corporation
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Publication number: 20080040070
    Abstract: At least one self-powered light source is mounted on the tail rod of a BOP to provide an indication of the position of the ram of the BOP. The light source moves back and forth with the ram actuating piston of the BOP. Opposite the light source is a light-receiving lens. The lens is coupled by optical fiber to a optical to electrical converter. As the BOP is actuated, the tail rod moves, thereby moving the light source to a position adjacent a different lens. The lens which is now positioned adjacent the light source sends a light signal to its respective converter, thereby indicating the position of the tail rod and thus to ram of the BOP.
    Type: Application
    Filed: August 11, 2006
    Publication date: February 14, 2008
    Applicant: VARCO I/P, INC.
    Inventor: Perry Lee McClanahan
  • Patent number: 7330279
    Abstract: A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. A set of optimization parameters is selected for the profile model using one or more input diffraction signals and one or more parameter selection criteria. The selected profile model and the set of optimization parameters are tested against one or more termination criteria. The process of selecting a profile model, selecting a set of optimization parameters, and testing the selected profile model and set of optimization parameters is performed until the one or more termination criteria are met.
    Type: Grant
    Filed: July 25, 2002
    Date of Patent: February 12, 2008
    Assignee: Timbre Technologies, Inc.
    Inventors: Vi Vuong, Emmanuel Drege, Junwei Bao, Srinivas Doddi, Xinhui Niu, Nickhil Jakatdar
  • Patent number: 7328125
    Abstract: A measuring method of a shape of a cross-sectional circle which is orthogonal to an axis of a cylinder includes steps of calculating distances between a reference point and points on a circumference on the basis of change of the distances of at least three predetermined points on the circumference of the cross-sectional circle to the reference point set in the cross-sectional circle by the rotation of the cylinder, and specifying the shape of the cross-sectional circle.
    Type: Grant
    Filed: August 31, 2006
    Date of Patent: February 5, 2008
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yasuhiro Kawai, Kyoichi Teramoto, Yoichi Kawamorita
  • Patent number: 7324917
    Abstract: A method and software is disclosed for evaluating characteristics, such as flatness, of a surface of a sample having an edge, comprising selecting an evaluation area having an area surface and a boundary, at least one portion of which is definable with reference to the edge, and evaluating characteristics of the area surface. Edge-specific evaluation conditions are used with edge-specific metrics to quantify parameters for said evaluation area. A system for evaluating such characteristics comprises a data collection system for generating data values for selected locations on said surface; and a data analyzing system for analyzing data values to determine such characteristics. A data interpolation system may be provided to interpolate data values collected with reference to a first coordinate system for analyzing with reference to a second coordinate system.
    Type: Grant
    Filed: July 1, 2005
    Date of Patent: January 29, 2008
    Assignee: KLA-Tencor Technologies Corporation
    Inventors: Chris L. Koliopoulos, Jaydeep K. Sinha, Delvin A. Lindley, John F. Valley, Noel Poduje
  • Patent number: 7324904
    Abstract: Systems and methods are provided for detecting the potential of a wood sample, such as a board, to stay on grade, i.e., resist warp, after it is put into service and/or its moisture has re-equilibrated with the surrounding environment. The systems and methods include various sensor technologies and subjection of obtained data to various models, algorithms, and/or other mathematical formulas.
    Type: Grant
    Filed: December 21, 2005
    Date of Patent: January 29, 2008
    Assignee: Weyerhauser Company
    Inventors: Stanley L. Floyd, Chih-Lin Huang, Mark A. Stanish, John E. Jones, III, Susan Kaluzny, David C. Slaughter, Tom J. Taylor
  • Patent number: 7315794
    Abstract: A timer survey system performing the steps of: placing a first reference point and a second reference point on a tree trunk, wherein an actual distance between the first reference point and the second reference point is a known distance, “A1”; capturing an image of that portion of the tree trunk having the reference points placed on the trunk; measuring on the image an image distance, “D1”, between the first reference point and the second reference point; measuring on the image an image distance, “D2”, between the left outer boundary and the right outer boundary of the tree trunk; and calculating an actual distance, “A2”, between the left outer boundary and the right outer boundary of the tree trunk as follows: A2=[(D2÷D1)(A1)].
    Type: Grant
    Filed: March 23, 2005
    Date of Patent: January 1, 2008
    Inventor: Frank L. Willis
  • Publication number: 20070299628
    Abstract: A method, apparatus, and computer program product provides automated analysis of thermal imaging data for multi-layer materials based upon a theoretical model of a multi-layer material system, which is solved numerically. The computer-implemented method effectively processes the volume heating effect for thermal barrier coatings (TBCs), since quantitative evaluation of TBC thickness and conductivity is particularly important. TBC thickness is a processing parameter and required to be monitored. TBC conductivity is a measure of TBC quality because it is directly related with TBC density/porosity, microcracking and interface cracks. Because this method is an imaging technology, it can be used for fast and 100% area inspection of larger TBC surfaces, such as combustor liners.
    Type: Application
    Filed: June 13, 2006
    Publication date: December 27, 2007
    Inventor: Jiangang Sun
  • Patent number: 7313501
    Abstract: According to one embodiment of the invention a method for determining the location of a potential defect in a device includes scanning a surface of the device with a temperature sensor while operating the device. The method also includes measuring a temperature of the device by a temperature sensor at a plurality of locations while scanning. Based upon the measured temperatures, a temperature profile is constructed for the device. The method also includes comparing the constructed temperature profile to a reference profile to determine a location of the potential defect in the device.
    Type: Grant
    Filed: February 2, 2005
    Date of Patent: December 25, 2007
    Assignee: Texas Instruments Incorporated
    Inventor: Dat T. Nguyen
  • Patent number: 7310588
    Abstract: A computer-implemented method for verifying geometries of airfoils includes the steps of providing a part having an airfoil having an intended positional geometry and an intended feature geometry; measuring a first set of points of a primary datum system; determining an actual positional geometry of the airfoil based on the primary datum system measurements; calculating a first deviation between the intended positional geometry and the actual positional geometry of the airfoil; measuring a plurality of sets of points of at least one secondary datum system; determining an actual feature geometry of the airfoil based on the at least one secondary datum system measurement; calculating a second deviation between the intended feature geometry and the actual feature geometry of the airfoil; and performing a verification of the intended positional geometry and the intended feature geometry of the airfoil based upon the first deviation and the second deviation.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: December 18, 2007
    Assignee: United Technologies Corporation
    Inventors: Karl A. Mentz, Bryan P. Dube, Richard M. Salzillo, Jr.
  • Publication number: 20070288197
    Abstract: A method, system, and apparatus are described which are used to identify a geo-referenced object. In one embodiment, a position determining component is used to determine the geographic position of a handheld electronic device. An azimuth determination component determines an azimuth from the handheld electronic device to an object. An incline measurement device measures the vertical angle between the handheld electronic device and the object. Finally, based upon the based upon the geographic position, azimuth, and vertical angle of the handheld electronic device a database is automatically accessed wherein a description of the object is stored.
    Type: Application
    Filed: June 13, 2006
    Publication date: December 13, 2007
    Inventor: William Martin
  • Publication number: 20070282565
    Abstract: A method for locating at least one object in a restricted environment is disclosed. The method involves determining a measuring position with a navigation package, measuring a range between the at least one object and the measuring position, and establishing a location of the at least one object based upon the measuring position and the measured range.
    Type: Application
    Filed: June 6, 2006
    Publication date: December 6, 2007
    Applicant: Honeywell International Inc.
    Inventors: Charles T. Bye, Wayne A. Soehren
  • Patent number: 7305321
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: December 4, 2007
    Assignee: Omron Corporation
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Patent number: 7305322
    Abstract: To determine the profile of an integrated circuit structure, a signal is measured off the structure with a metrology device. The measured signal is compared to signals in a virtual profile library. The comparison is stopped if matching criteria are met. A subset of a virtual profile data space is determined when the matching criteria are not met. The subset is determined using profile data space associated with the library. A virtual profile signal of the subset is selected. Virtual profile shape/parameters are determined based on the virtual profile signal. A difference is calculated between the measured and virtual profile signals. The difference is compared to virtual profile library creation criteria. If the criteria are met, then the structure is identified using virtual profile data, which includes the virtual profile shape/parameters, associated with the virtual profile signal. Or, if the criteria are not met, then a corrective action is applied.
    Type: Grant
    Filed: March 31, 2006
    Date of Patent: December 4, 2007
    Assignee: Tokyo Electron Limited
    Inventors: Merritt Funk, Daniel Prager
  • Patent number: 7305320
    Abstract: A method of preparing recipes for operating a metrology tool, each recipe including a set of instructions for measuring dimensions in a microelectronic feature. A database includes a plurality of known instructions with best known methods for measuring different feature dimensions by creating a summary of a recipes used by the tool, and adding categorization attributes to identify the summary for retrieval from the database. There is provided a desired recipe having instructions for measuring desired dimensions, including a summary of parameters relating to tool function for the feature dimension to be measured. The method includes comparing the instructions in the desired recipe with the instructions in the database, identifying differences therebetween, modifying the desired recipe instructions to conform to the database instructions, verifying the desired recipe prior to using the modified desired recipe by the tool, and using the desired recipe to execute a feature measurement on the tool.
    Type: Grant
    Filed: February 15, 2006
    Date of Patent: December 4, 2007
    Assignee: International Business Machines Corporation
    Inventors: Ejaj Ahmed, Charles N. Archie, Stephen W. Goodrich, Eric P. Solecky, Georgios A. Vakas, Erwin E. Weissmann, Lin Zhou
  • Patent number: 7302359
    Abstract: Improved systems and methods for mapping are provided. In one embodiment, a system for mapping is provided. The system comprises a rangefinder adapted to output range measurements; an inertial sensor adapted to capture inertial measurements including inertial forces acting on the rangefinder and the attitude of the rangefinder; and a processor coupled the rangefinder and the inertial sensor and adapted to receive a set of range measurements from the rangefinder and inertial measurements from the inertial sensor. The processor is adapted to produce a virtual room reconstruction based on the set of range measurements from the rangefinder and inertial measurements from inertial sensor.
    Type: Grant
    Filed: February 8, 2006
    Date of Patent: November 27, 2007
    Assignee: Honeywell International Inc.
    Inventor: John B. McKitterick
  • Publication number: 20070271065
    Abstract: Improved techniques and systems for utilizing a portable electronic device to monitor, process, present and manage data captured by a remote sensor are disclosed. The portable electronic device offers a convenient user interface that can be visual and/or audio based customized to a particular application, user-friendly and/or dynamic. The portable electronic device can pertain to a portable media player and thus also provide media playback.
    Type: Application
    Filed: May 22, 2006
    Publication date: November 22, 2007
    Inventors: Sandeep Gupta, Greg Marriott, Max Sprauer, David A. Shayer, John Wesley Archibald, Shannon E. Wells
  • Patent number: 7295948
    Abstract: System for identifying and marking individual automotive tires including use of a light sheet sensor enabled image processing for the identification of the tire type and the marking spot. The height profile of the raised symbols on the tire sidewall can be measured using the light sheet sensor and matched to a library of reference profiles stored in memory. The light sheet sensor measures the height profile of the tire sidewall for identifying the tire and for selecting the marking spot and where the light sheet sensor and a laser are mounted on a swivel arm. The light sheet sensor can be incorporated into a single- or multi-station system. A marking laser is adapted for engraving markings on a specific spot in rubber on the side of a tire via laser radiation after the type and size of the tire and a marking sport has been identified by image processing.
    Type: Grant
    Filed: July 25, 2005
    Date of Patent: November 13, 2007
    Inventor: Heinz L. Jetter
  • Patent number: 7280229
    Abstract: A structure formed on a semiconductor wafer is examined by obtaining a first diffraction signal measured from the structure using an optical metrology device. A first profile is obtained from a first machine learning system using the first diffraction signal obtained as an input to the first machine learning system. The first machine learning system is configured to generate a profile as an output for a diffraction signal received as an input. A second profile is obtained from a second machine learning system using the first profile obtained from the first machine learning system as an input to the second machine learning system. The second machine learning system is configured to generate a diffraction signal as an output for a profile received as an input. The first and second profiles include one or more parameters that characterize one or more features of the structure.
    Type: Grant
    Filed: December 3, 2004
    Date of Patent: October 9, 2007
    Assignee: Timbre Technologies, Inc.
    Inventors: Shifang Li, Junwei Bao
  • Patent number: 7275015
    Abstract: A method and a device for determining motion parameters of a conductive, profiled surface (22) relative to a sensor (3), with the sensor (3) comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface (22) and the sensor (3), to a variation, which is determined by means of the coil (16). The position change is derived from the coupling impedance (Zc) of the coil (16), and the real component (Rc) and the imaginary component (Xc) of the complex coupling impedance (Zc) of the coil (16) are determined, with a distance d between the sensor (3) and the surface (22) being computed based on the determined values while using an algorithm as a basis.
    Type: Grant
    Filed: October 25, 2005
    Date of Patent: September 25, 2007
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Stanislav Medinkov, Mark Netchaewskij, Felix Mednikov, Werner Grömmer, Martin Sellen
  • Patent number: 7271902
    Abstract: An optical metrology system includes a photometric device with a source configured to generate and direct light onto a structure, and a detector configured to detect light diffracted from the structure and to convert the detected light into a measured diffraction signal. A processing module of the optical metrology system is configured to receive the measured diffraction signal from the detector to analyze the structure. The optical metrology system also includes a generic interface disposed between the photometric device and the processing module. The generic interface is configured to provide the measured diffraction signal to the processing module using a standard set of signal parameters. The standard set of signal parameters includes a reflectance parameter chat characterizes the change in intensity of light when reflected on the structure and a polarization parameter that characterizes the change in polarization states of light when reflected on the structure.
    Type: Grant
    Filed: June 20, 2006
    Date of Patent: September 18, 2007
    Assignee: Timbre Technologies, Inc.
    Inventors: Shifang Li, Junwei Bao, Nickhil Jakatdar, Xinhui Niu
  • Publication number: 20070208544
    Abstract: A method and apparatus for estimating a motion parameter corresponding to a subject element employs one or more accelerometers operable to measure accelerations and a processing system operable to generate a motion parameter metric utilizing the acceleration measurements and estimate the motion parameter using the motion parameter metric.
    Type: Application
    Filed: March 1, 2007
    Publication date: September 6, 2007
    Applicant: GARMIN LTD.
    Inventors: Christopher J. Kulach, James K. Rooney, Paul R. MacDonald
  • Patent number: 7266471
    Abstract: A seat occupant identifying apparatus for automotive occupant restraint system is provided which works to identify whether a seat occupant is an adult passenger or a child passenger. When a total output value of a plurality of seat load sensors is greater than a given adult identifying threshold value, it is determined that the seat occupant is an adult. Afterwards, when the total output value decreases below the adult identifying threshold value due to, for example, a lateral G-force acting on the seat occupant during cornering of the vehicle, and an output of either of the right and left seat load sensors is lowered below a preselected cornering threshold value, while the other output is higher than it, the latest determination that the seat occupant is an adult is kept as it is. This provides for high accuracy seat occupant identification during cornering of the vehicle.
    Type: Grant
    Filed: March 16, 2004
    Date of Patent: September 4, 2007
    Assignees: DENSO CORPORATION, Fuji Jukogyo Kabushiki Kaisya
    Inventors: Akinori Jitsui, Satoshi Goshima
  • Publication number: 20070203667
    Abstract: In a positional information detecting device, a tone-burst signal propagating unit causes a tone-burst signal to propagate through a path. The tone-burst signal is composed of a continuous wave train, the continuous wave train including a plurality of cycles of a constant frequency. A detecting unit detects, at a predetermined position in the path, the tone-burst signal propagating through the path every one cycle of the tone-burst signal to measure a propagation delay time based on the detected signal. The propagation delay time represents a period for which the tone-burst signal has propagated through the path. A phase obtaining unit obtains a phase of the detected signal. A positional information obtaining unit obtains positional information associated with the predetermined position based on the measured propagation delay time and the obtained phase of the detected signal.
    Type: Application
    Filed: August 10, 2006
    Publication date: August 30, 2007
    Applicant: DENSO CORPORATION
    Inventors: Takamoto Watanabe, Sumio Masuda
  • Publication number: 20070198209
    Abstract: A magnetic-sensor controller includes an input section, a perpendicular-bisector calculation section, a storage section, and a setting section. The input section successively inputs a plurality of magnetic data sets successively output from a three-dimensional magnetic sensor. Each magnetic data includes three components. The perpendicular-bisector calculation section calculates, for each pair of two of the magnetic data sets, a perpendicular bisector of two points corresponding to the two magnetic data sets. The storage section stores a plurality of perpendicular bisectors. The setting section statistically approximates, by a single point, a region where the plurality of perpendicular bisectors stored in the storage section meet, and sets an offset of the magnetic data set on the basis of the single point. The magnetic-sensor controller enables accurate setting of an offset even when the magnetic field strength changes.
    Type: Application
    Filed: February 21, 2007
    Publication date: August 23, 2007
    Applicant: YAMAHA CORPORATION
    Inventor: Hideki Sato
  • Publication number: 20070192058
    Abstract: A method of measuring warpage of a rear surface of a substrate includes a substrate detection step, a best fit plane calculation step, and a warpage calculation step. Further, the method of measuring warpage of a rear surface of a substrate can further includes after the substrate detection step and before the best fit plane calculation step: a noise removal step and an outer peripheral portion removal step; the outer peripheral portion removal step and a smoothing step; or the noise removal step, the outer peripheral portion removal step, and the smoothing step. Thereby, a method of measuring warpage of a rear surface with a high surface roughness of a substrate can be provided.
    Type: Application
    Filed: February 15, 2007
    Publication date: August 16, 2007
    Inventors: Keiji Ishibashi, Noriko Tanaka
  • Patent number: 7248994
    Abstract: An apparatus and method for determining a linear position from a linear variable differential transformer (LVDT) including a primary coil driven by an excitation signal, and two secondary coils coupled to two correlated signals. The method includes converting the correlated signals to a digital estimate, for each of the correlated signals, and evaluating an amplitude of the correlated signals to determine the linear position. The process of converting the correlated signals comprises comparing the correlated signal to an analog feedback signal to generate a comparison result and incrementally adjusting the digital estimate in response to sampling the comparison result at an estimation frequency.
    Type: Grant
    Filed: January 27, 2006
    Date of Patent: July 24, 2007
    Assignee: Alliant Techsystems Inc.
    Inventor: John A. Stolan
  • Patent number: 7248992
    Abstract: A computerized method is disclosed for determining the size and location effects of simulated or manufactured features on an object, determining the transformation of a pattern of features, determining usable feature size within a pattern of features, and determining the remaining feature tolerances. The simulated or manufactured position of a pattern of features is used to determine how to translate a tolerance zone framework. Positional errors and remaining feature tolerances are determined relative to the translated design framework.
    Type: Grant
    Filed: October 13, 2005
    Date of Patent: July 24, 2007
    Assignee: The Boeing Company
    Inventor: Bruce A. Wilson
  • Patent number: 7246030
    Abstract: A portable coordinate measurement machine for measuring the position of an object in a selected volume includes a positionable articulated arm having a plurality of jointed arm segments. The arm includes a measurement probe having an integrated line laser scanner mounted thereon. The laser may be a thermally stabilized laser.
    Type: Grant
    Filed: January 18, 2006
    Date of Patent: July 17, 2007
    Assignee: Faro Technologies, Inc.
    Inventors: Simon Raab, Seyed Ali Sajedi, Paul Christopher Atwell, Joel Wyatt Upchurch, Jacint R. Barba
  • Publication number: 20070162254
    Abstract: If the diving mode is erroneously entered while travelling at a high altitude, such as when flying in an airplane, the error is detected so that calculating tissue in/out-gassing of inert gases continues. The control unit 50 of the dive computer records the water depth corresponding to the pressure measured by the depth measuring unit 61 together with the elapsed time, determines if the user is moving in a low pressure region based on water entry detection by a water entry detection unit and the depth detected by the depth measuring unit 61, and if the user is determined to be travelling in a low pressure region cancels measuring the water depth, cancels the wrongly selected operating mode, and changes from the operating mode used when diving to an operating used when not diving.
    Type: Application
    Filed: January 4, 2007
    Publication date: July 12, 2007
    Applicant: Seiko Epson Corporation
    Inventor: Takeshi Hirose
  • Publication number: 20070162253
    Abstract: The present invention comprises a calculator for performing sewing calculations. The calculator includes a processor and an input device connected to the processor. A display is connected to the processor. Software operates on the processor to receive quilt function operands from the input device. The software calculates quilt function results and displays the quilt function results on the display. A method of performing calculations is also disclosed. The method includes receiving data related to quilt calculations. The results related to the quilt calculations are calculated and the results related to the quilt calculations are displayed.
    Type: Application
    Filed: December 14, 2006
    Publication date: July 12, 2007
    Inventors: Susan Blades, Michael Diamond
  • Patent number: 7243051
    Abstract: The present invention is to provide a system for measuring the similarity between protein profile matrices which is suitably used for predicting a protein three-dimensional structure.
    Type: Grant
    Filed: December 26, 2003
    Date of Patent: July 10, 2007
    Assignee: National Institute of Advanced Industrial Science and Technology
    Inventor: Kentaro Tomii
  • Patent number: 7233878
    Abstract: A method for monitoring consumption of a component, including the steps of emitting a radiation beam onto a first area of the component and detecting a portion of the radiation beam that is refracted by the component. A radiation level signal is generated based at least on a strength of the detected portion of the radiation beam, and a thickness of the component is determined based on the radiation level signal. The thickness of the component is compared to a predetermined thickness value, and a status signal is generated when the comparing step determines that the thickness of the component is substantially equal to or below the predetermined thickness value. When the comparing step determines that the thickness of the component is greater than the predetermined thickness value, the component is exposed to a process that can erode at least a portion of the component.
    Type: Grant
    Filed: January 30, 2004
    Date of Patent: June 19, 2007
    Assignee: Tokyo Electron Limited
    Inventors: Andrej S. Mitrovic, Eric J. Strang
  • Patent number: 7231314
    Abstract: The wall thickness and ovality of a tubular are simultaneously determined. The theoretical radius of a pipe is computed from a measurement of its circumference. An ultrasonic device conventionally used to measure the wall thickness of tubulars is adapted to also measure the maximum and minimum diameters and ovality by equipping or utilizing existing ultrasound inspection device with contact surfaces which contact the tubular at a fixed distance apart and at a known distance from the surface of the ultrasonic transducer. The contact surfaces define a chord of known length on the tubular under test. The mean radius of the tubular may be computed from multiple water path measurements around the circumference relative to a known fixture. The maximum and minimum diameter and ovality are calculated from the measured differences in distance from the surface of the tubular to the ultrasonic transducer and the theoretical circle.
    Type: Grant
    Filed: March 2, 2006
    Date of Patent: June 12, 2007
    Assignee: Cudd Pressure Control, Inc.
    Inventor: David Glascock
  • Patent number: 7214954
    Abstract: A method for operating an optical sensor for measuring a physical quantity with a defined scale value that is subject to a calibration certification. The measurement accuracy of the quantity being measured is dependent on at least one external condition, and a given scale value is used for the measurement according to the desired measurement accuracy. The scale value is appropriately changed when the measurement accuracy changes due to a change of external condition. An optoelectronic sensor has a switching arrangement for changing the scale value. The sensor is more diversified and can cover larger measurement ranges without requiring new certifications or authorizations for the different measurement ranges.
    Type: Grant
    Filed: January 29, 2004
    Date of Patent: May 8, 2007
    Assignee: Sick AG
    Inventor: Thomas Schopp
  • Patent number: 7212883
    Abstract: A machine readable medium and a method are disclosed that determine whether a pattern of manufactured or simulated features violates a feature relating tolerance and determines acceptability of the pattern. Allowable tolerance may include feature relating tolerances and material conditions. Manufactured centers are drawn relative to a one true position. A circle drawn through or outside the manufactured centers is used to determine if there is feature relating tolerance violation. Material condition may also be used.
    Type: Grant
    Filed: March 12, 2004
    Date of Patent: May 1, 2007
    Assignee: The Boeing Company
    Inventors: Paul C. Hollingshead, Craig A. Beike
  • Patent number: 7209858
    Abstract: A method for generating a surface profile of a microstructure. The profile is processed to determine positions of at least two edges and an approximate center point of the profiled surface. Segments of points on the determined profile are fit to a straight line centered at the approximate center point. A standard deviation of the fitted points is measured. The length and position of the segment are varied until a minimum standard deviation is determined and the process is repeated for segments having different lengths. The point is determined from the longest segment having a standard deviation approximately equal to the minimum standard deviation of all of the segment lengths.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: April 24, 2007
    Assignee: Matsushita Electric Industrial Co., Ltd
    Inventor: Chen-Hsiung Cheng
  • Patent number: 7209857
    Abstract: The present invention is a method of evaluating a shape of a semiconductor wafer comprising the steps of: measuring shape data of a semiconductor wafer by scanning a front surface and/or a back surface of the semiconductor wafer; calculating a differential profile through a differential process of the measured shape data; analyzing the obtained differential profile and obtaining a surface characteristic of the wafer, and; evaluating a shape of the semiconductor wafer. Thereby, there are provided a method of evaluating a shape of a semiconductor wafer and an apparatus for evaluating a shape thereof, wherein a shape of a semiconductor wafer, particularly a shape of a peripheral portion of the wafer, can be quantitatively evaluated from a viewpoint different from conventional SFQR etc., and the shape quality of the wafer can be accurately evaluated over a specification of a strict design rule.
    Type: Grant
    Filed: June 10, 2003
    Date of Patent: April 24, 2007
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Masakazu Sato, Masato Onishi
  • Patent number: 7206718
    Abstract: A method for the design and production of improved pressure reducing therapeutic shoe insoles for a person. The method includes the steps of measuring a three dimensional image of a foot and the distribution of plantar pressures applied by a person's foot being measured for a pressure reducing insole. Selecting a shoe insole outline or template which best fits or corresponds to the shape of a foot being measured. A foot display is generated which combines and aligns the three dimensional foot shape and the plantar pressure distribution. A three dimensional insole display is generated which combines and aligns the foot shape and plantar pressure distribution, and includes modifications based upon selected pressure contour lines identified within the foot display which are above predetermined pressure thresholds.
    Type: Grant
    Filed: September 21, 2005
    Date of Patent: April 17, 2007
    Assignees: DIApedic, L.L.C.
    Inventors: Peter R. Cavanagh, Jan S. Ulbrecht, Timothy B. Hurley, Huixiong Zhang
  • Patent number: 7197178
    Abstract: An edge bead removal measurement method includes determining an edge of a wafer about a circumference of the wafer. A location of a wafer notch on the edge of the wafer is determined. A location of a center of the wafer is determined. A distance from the edge of the wafer to an edge bead removal line about the circumference of the wafer is determined.
    Type: Grant
    Filed: July 14, 2004
    Date of Patent: March 27, 2007
    Assignee: Rudolph Technologies, Inc.
    Inventor: Patrick Simpkins
  • Patent number: 7194378
    Abstract: A method for measuring a workpiece includes the steps: measuring measurement points on the surface of a workpiece using a measuring device; evaluating the measured measurement points in such a manner that a predetermined desired geometry of the workpiece to be measured and an actual geometry defined by the measured measurement points are mapped one on top of the other with the aid of a fitting method. In order to be able to adapt or fit the predetermined desired geometry of the workpiece to a measured workpiece, which had been altered, the application of a fitting method is suggested. In this method, transformation parameters are additionally provided for the fitting. These parameters permit a defined transformation of the desired geometry or of the actual geometry with regard to a targeted change of shape of the desired geometry or of the actual geometry.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: March 20, 2007
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Daniel Görsch, Andreas Lotze
  • Patent number: 7191091
    Abstract: The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: March 13, 2007
    Assignee: 3M Innovative Properties Company
    Inventors: Donald E. Yuhas, James H. Voth, Patrick Schneider, Keith H. Foster
  • Patent number: 7188046
    Abstract: The present invention provides a form measuring device including a measuring section (302) for obtaining measurement data obtained by measuring a space between a straightedge rule (321) and an edge of an object to be measured (305) paired with each other, a function value setting section for setting form-function values, which indicates distances from a reference line R to the straightedge rule (321) and to edges of the object to be measured, and angle-function values ?, which indicates internal angles of the object to be measured 305 and an angle formed by the straightedge rules (321), a simultaneous equation deriving section for deriving simultaneous equations for pains each consisting of the straightedge rule (321) and an edge of the object to be measured (305) based on the measurement data, and a simultaneous equation processing section for processing the derived simultaneous equations.
    Type: Grant
    Filed: September 9, 2004
    Date of Patent: March 6, 2007
    Assignee: Mitutoyo Corporation
    Inventors: Masayuki Nara, Makoto Abbe
  • Patent number: 7178561
    Abstract: Disclosed are methods, systems, and computer program products for performing temperature standardization of the volume of a liquid product from a distributor to a consumer. Using a volume measurement device and a temperature measurement device located at a rack, a storage tank, and a dispenser, a gross volume and temperature of the liquid product at, respectively, the rack, the storage tank, and the dispenser can be measured. Volume data indicative of the gross volume and temperature data indicative of the temperature can be generated. A time-stamp system at each of the rack, the storage tank, and the dispenser allocates a time-stamp to each of the volume data and the temperature data so that a reconciliation process can use each of the time-stamps, the temperature data, and the volume data to reconcile gross to net volumes at a single point in time.
    Type: Grant
    Filed: February 18, 2005
    Date of Patent: February 20, 2007
    Assignee: Flying J, Inc.
    Inventors: Vincent J. Memmott, John D. Hillam, Richard D. Peterson
  • Patent number: 7177740
    Abstract: Three-dimensional parameters of a tire are measured dynamically in a non-contact way using laser vision technology. Two laser vision sensors are used, which are calibrated and then used for practical measurement. The system offers a wide measuring range, high accuracy and high efficiency, even though the tire is moving, and it minimizes the size of the measuring apparatus, and reduces the cost of the apparatus.
    Type: Grant
    Filed: November 18, 2005
    Date of Patent: February 13, 2007
    Assignee: Beijing University of Aeronautics and Astronautics
    Inventors: Zhang Guangjun, Zhou Fuqiang, Wei Zhenzhong, Jiang Jie
  • Patent number: 7158914
    Abstract: A test surface of a test object is measured with respect to a reference surface to generate a first relative surface measurement, where the test surface is in a first position relative to the reference surface. The test surface is measured with respect to the reference surface to generate a second relative surface measurement, where the test surface is in a second position relative to the reference surface different from the first position. Estimates of a rotationally varying part of a measurement of the test surface and a rotationally varying part of a measurement of the reference surface are provided. An estimate of a rotationally invariant part of the measurement of the test surface is calculated at a plurality of radial values based on a combination of the relative surface measurements, the provided estimates, and a difference between the first and second relative positions.
    Type: Grant
    Filed: February 7, 2005
    Date of Patent: January 2, 2007
    Assignee: Zygo Corporation
    Inventor: William P. Kuhn
  • Patent number: 7145664
    Abstract: A method for modeling samples includes the use of control points to define lines profiles and other geometric shapes. Each control point used within a model influences a shape within the model. Typically, the control points are used in a connect-the-dots fashion where a set of dots defines the outline or profile of a shape. The layers within the sample are typically modeled independently of the shape defined using the control points. The overall result is to minimize the number of parameters used to model shapes while maintaining the accuracy of the resulting scatterometry models.
    Type: Grant
    Filed: February 23, 2004
    Date of Patent: December 5, 2006
    Assignee: Therma-Wave, Inc.
    Inventors: Jon Opsal, Hanyou Chu, Xuelong Cao, Youxian Wen
  • Patent number: 7146291
    Abstract: A computer-implemented method of generating an inspection program for a computer-controlled coordinate measuring probe comprises the steps of: (a) receiving nominal geometry data for a component, (b) receiving inspection requirement data specifying one or more selected shape characteristics of the component, (c) determining from the nominal geometry data and the inspection requirement data an inspection path for a computer-controlled coordinate measuring probe, the inspection path enabling the measuring probe to measure actual component coordinates associated with the selected shape characteristics, and (d) generating an inspection program for moving the computer-controlled coordinate measuring probe along the inspection path.
    Type: Grant
    Filed: November 12, 2004
    Date of Patent: December 5, 2006
    Assignee: Rolls-Royce plc
    Inventor: Gerald W. Hough
  • Patent number: 7138645
    Abstract: A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system is formed by combining a plurality of three-dimensionally arranged planes. The calibration pattern unit comprises supporting members each of which has a predetermined surface corresponding to one of the planes, and a calibration pattern in which a predetermined pattern is formed on the predetermined surface of the supporting member. The supporting member can selectively set the calibration pattern unit to a first form for photographing when the correction information is obtained, and a second form for other purposes.
    Type: Grant
    Filed: August 28, 2003
    Date of Patent: November 21, 2006
    Assignee: Olympus Corporation
    Inventors: Kazuhiko Arai, Akio Kosaka, Takashi Miyoshi, Kazuhiko Takahashi, Hidekazu Iwaki