Abstract: A method and apparatus for an automated testing system that tests for physical properties of golf balls or golf ball cores. The apparatus includes an on-load magazine wherein golf balls or cores are loaded for pick and place feeding to holding nests defined in a rotary indexing table. The nests are removable and/or of multiple size accommodations to accept balls and cores from 1.00 to 1.72 inches. The system includes a diameter measuring station, a compression measuring station, and a weight measuring station. Through the rotary indexing table, the golf ball or core may be selectively dialed to one or more of the stations for testing. A computer analyzes the properties of each ball or core tested and correlates the data so that each ball is subsequently either passed to an off-load magazine or rejected.

Abstract: Some embodiments of the present invention provide a system that determines a center of rotation for a component in a computer system. During operation, the system measures a first acceleration of a first location on the component and a second acceleration of a second location on the component, wherein the first location and the second location are separated by a predetermined distance. Then, the system determines the center of rotation using the first acceleration, the second acceleration, and the predetermined distance.

Abstract: Concealed object detection using electromagnetic and acoustic multistatic imaging systems and methods. A method of simultaneously screening plural subjects for concealed objects includes transmitting a signal into a screening area where there is at least one subject to be screened having an associated object, receiving a reflected signal from the object when the object is located within the screening area, processing the reflected signal using multistatic Fourier space sampling and tomographic reconstruction to generate a three-dimensional image of the object and displaying the three-dimensional image. The transmitting and receiving are performed using a multi-directional array including at least three sensors. An object detection system includes a screening area, a multi-directional array including at least three sensors, a processor configured to execute multistatic Fourier space sampling and tomographic reconstruction and a display.

Abstract: A pattern verification method according to an embodiment includes, dividing a pattern data region or a pattern formation region formed based on the pattern data to a plurality of unit regions, calculating a pattern area ratio with respect to each unit region, calculating differences in the amount of the pattern area ratio between each unit region and adjacent unit regions thereto, setting the number or density of measurement point with respect to each unit region to the pattern of the pattern data region or the pattern formation region according to the difference in the amount of pattern area ratio, measuring the pattern size at each measurement point, and verifying whether the size measurement value is within a predetermined range or not.

Abstract: A method for calculating the effective volume of a diesel particulate filter invention may include: determining whether regeneration efficiency exists; determining, if regeneration efficiency exists, whether a learning condition of the ash coefficient is satisfied; detecting an exhaust flow amount Qexh if the learning condition of the ash coefficient is satisfied; calculating change of a pressure difference ?(?Pash(n)) caused by the ash; calculating change of an ash coefficient ?(a4) by using the change of the pressure difference ?(?Pash(n)) caused by the ash and the exhaust flow amount Qexh; calculating a current ash coefficient a4(n) by using the change of the ash coefficient ?(a4) and a previous ash coefficient a4(n-1); and calculating the effective volume Ve by using the current ash coefficient a4(n) and a first filter coefficient a1.

Abstract: According to one embodiment, generating images according to intersection points includes obtaining samples of signals from transmitter-receiver pairs. A transmitter-receiver pair is configured to transmit a signal and receive the signal reflected by an object. Intersection points are determined, where an intersection point indicates an intersection for integer multiples of a sample-time distance. A subset of samples corresponding to the intersection points is selected. Image data is generated from the selected subset of samples, where the image data is used to generate an image of the object.

Abstract: The present invention relates to computing reachable areas given a first point. More specifically, the present invention relates to the computation of an intersection between a first surface and a second surface for determining a set of points that are reachable from a first point. Using the present invention, a user can determine either (1) a locus of target sites that can be struck by a ballistic projectile from a given launch site, or (2) a locus of launch sites that can be used to hit a given target site. The disclosed system and method employs graphics hardware to determine an intersection between a first surface defined by trajectory paths, and a second surface defined by terrain.

Abstract: A method for measuring at least one hole in at least one first surface of a component, in particular for turbomachines, in which at least the following steps are executed: a) provision, using a data processing system, of a target geometry of the component at least for the area of the hole, the target geometry characterizing at least one first target surface of the component in the area of the hole, b) determination, using a measurement system, of an actual geometry of the component at least for the area of the hole, the actual geometry characterizing at least one first actual surface of the component in the area of the hole, and c) determination, using the data processing system, of an actual geometry of the hole on the basis of a deviation between the target geometry and the actual geometry of the component.

Abstract: A compensation table for compensating interference signal obtained by OCT measurement is generated easily. When a reflection body interference signal is obtained by OCT measurement, the reflection body interference signal is compensated by a compensation table (Formula (1)) to obtain an evaluation output signal. Then, a spectrum of the evaluation output signal is calculated to obtain an evaluation value of the spectrum. Thereafter, a model coefficient is updated such that the evaluation value becomes small.

Abstract: In the dimension measurement of a circuit pattern using a scanning electron microscope (SEM), in order to make it possible to automatically image desired evaluation points (EPs) on a sample, and automatically measure the circuit pattern formed at the evaluation points, according to the present invention, in the dimension measurement of a circuit pattern using a scanning electron microscope (SEM), it is arranged that coordinate data of the EP and design data of the circuit pattern including the EP are used as an input, creation of a dimension measurement cursor for measuring the pattern existing in the EP and selection or setting of the dimension measurement method are automatically performed based on the EP coordinate data and the design data to automatically create a recipe, and automatic imaging/measurement is performed using the recipe.

Abstract: A method and a measuring system for characterizing a deviation of an actual dimension of a component from a nominal dimension of the component, is disclosed. In an embodiment, the method includes a) determining at least one measured value characterizing the actual dimension at a position of the component by a measuring device; b) making a nominal value available with which the nominal dimension is characterized as a function of the position of the measured value; c) determining a spatial distance between the measured value and the nominal value; d) making a limiting criterion available with which a permissible deviation from the nominal value is characterized as a function of the position of the measured value; and e) determining a tolerance utilization value characterizing the deviation for the measured value as a function of the spatial distance and of the limiting criterion.

Abstract: A device for determining dimensions of a workpiece includes a locating apparatus, a determining apparatus and a main processor. The locating apparatus includes a locating board supporting workpieces and defining at least one detecting aperture therethrough. The determining apparatus includes a detecting module, the detecting module includes at least one laser detector, each laser detector includes a laser emitter and a laser receiver respectively mounted on two opposite sides of the locating board. The main processor is connected to the locating apparatus and the determining apparatus, the laser emitter emits laser beams traveling through the detecting aperture and received by the laser receiver, and the main processor determines the dimension of the workpiece according to the dimension of parts on the laser receiver shielded by the workpiece.

Abstract: A standard component for length measurement includes a first diffraction grating and a second diffraction grating. Each of components of the second diffraction grating is disposed between components of the first diffraction grating.

Abstract: A method for calculating coordinate points corresponding to a segment of a circle for arch construction includes entering a desired width dimension of a desired arch, entering a desired height dimension of a desired arch, and calculating coordinate pairs corresponding to a previously defined coordinate system, wherein the resultant coordinate pairs correspond to points defining an arc, wherein the arc is the arc corresponding to the width and height dimensions of the desired arch.

Abstract: An apparatus for measuring the weight of items on a conveyor includes a scale that generates a first signal corresponding to the weight of the items. A movable platform transports the items to the scale and generates a second signal corresponding to position of the items in relation to the scale. A dimensioner examines the items and generates a third signal representative of whether the items are singulated or nonsingulated. A processor receives the second and third signals and determines whether to associate the first signal with information stored in memory about a particular item based upon whether the particular item is singulated or nonsingulated.

Abstract: An optical tomographic image production apparatus includes an optical probe, in which a light-transmitting area that transmits measurement light and a light-blocking area that blocks the measurement light are formed. The light-blocking area is provided at a start position and an end position of the light-transmitting area. A tomographic image processing means detects an interference signal or tomographic information when the light-blocking area is irradiated with the measurement light. Further, the tomographic image processing means detects, based on the detected interference signal or tomographic information, interference signals or tomographic information obtained when the light-transmitting area is irradiated with the measurement light to produce a tomographic image in the light-transmitting area.

Abstract: A probe straightness measuring method includes: placing a measurement jig having a measurement reference surface with a known profile error on a stage surface of an XY stage so that the measurement reference surface is slanted in a moving direction of the XY stage; measuring a displaced position of the measurement piece by a displacement detector of the probe each time the XY stage is moved for a predetermined distance while controlling a driving actuator so that the measurement piece of a probe touches the measurement reference surface at a constant pressure; and calculating a straightness error of a measurement-piece moving mechanism on a basis of a measured position of the measurement piece obtained in the measuring, a nominal position of the measurement piece obtained by a calculation and a slant angle of the measurement reference surface.

Abstract: The teachings provided herein are generally directed to a non-destructive method of measuring a moisture content profile across a dimension of a hygroexpansive, composite material using radiation and a volumetric shrinkage correction. The measurement of a series of moisture content profiles over time can provide, for example, a measure of the movement of moisture during the process of drying of the composite material.

Abstract: An apparatus and method for measuring a height of an object above a surface includes a housing with a first portion having an upper surface and a lower surface and an extension portion extending a first distance from the lower surface of the first portion. The extension portion defines a cavity opposing the lower surface of the first portion. The apparatus further includes one or more actuators passing through the lower surface of the first portion of the housing and extending into the cavity. Additionally, the apparatus includes a plate supported by one or more flexible members coupled to the extension portion. The plate has a top surface and a bottom surface that lies in a plane substantially parallel to the surface. Moreover, the apparatus includes a plurality of sensors disposed at predetermined positions of the plate. Each of the plurality of sensors is responsive to a height measured between each of the plurality of sensors and the surface.

Abstract: A system and method for determining dimensions of a package during imaging for supply chain management is provided. The system and method utilize a value of an auto focus control voltage when an image of a package is in focus to calculate a magnification ratio. The calculated magnification ratio is used to multiply the dimensions of the package image to obtain the dimensions of the package.

Abstract: The divergence of an optical beam is determined. An optic is configured to provide internal reflection of at least a part of a beam of radiation scanned over varying angles of incidence on the optic. The optic has a film configured to provide a surface plasmon resonance (SPR) effect. A detector is arranged relative to the optic and configured to electronically detect radiation reflected from the optic. The divergence angle of the beam of radiation is calculated based on a change in reflectance relative to angle of incidence.

Abstract: The disclosure relates to an APS based integrated sun sensor comprising: a diaphragm unit, a detection unit, a processing electronics unit and an interface unit. The diaphragm unit is operatively connected with the detection unit for forming a sunspots image. The detection unit is configured for outputting a gray value of each pixel. The processing electronics unit is operatively connected with the detector unit and the interface unit respectively, for evaluating an attitude angle on the basis of the gray value and coordinate of each pixel. The interface unit is operatively connected with a host computer, for transferring the attitude angle to the host computer. This disclosure has such merits as high accuracy, wide FOV (Field of View), low power consumption, low weight, small size and high update rate.

Abstract: A method of determining the dimensions of a mailpiece by means of a portable measuring device having a housing provided with an opening having a side reference surface along which the mailpiece is guided under a position sensor in a first pass along a first dimension of the mailpiece, after which pass a value for the first dimension of the mailpiece is determined by a processing unit and is communicated to a franking system to which the portable measuring device is connected, and in a second pass along a second dimension of the mailpiece, after which pass a value for the second dimension of the mailpiece is determined by the processing unit and is communicated to the franking system.

Abstract: A method, apparatus, and computer usable program product for calibrating rivet height gages. In one embodiment, the process calculates a size of sphere required to create a sphere-based ring gage to simulate a contact point between a rivet height gage and a sharp edge of a specified sharp-edged ring gage. The process identifies an expected protrusion height from a top of the rivet height gage to a reference surface formed by tops of a set of spheres of the size of sphere required to simulate the contact point.

Abstract: Methods are provided for detecting compression wood, blue stain, or pitch in lumber. A light beam is projected towards the wood sample. Line or area cameras acquire images of light that is reflected from the wood sample. Based on the intensity of the reflected light at one or more locations on the wood sample, compression wood, blue stain, or pitch may be detected.

Abstract: A dimension measuring device that has improved operability when an expensive display device, such as, a bar graph is used. The device includes plural dimension measuring sections and a display section for displaying dimension measurements generated by the plural dimension measuring sections, wherein the number of dimension measurements the display section can display simultaneously is less than the number of dimension measurements generated by the plural dimension measuring sections. The device also includes a display control section, which automatically selects a dimension measurement to display on the display section in accordance with the dimension measurements generated by the plural dimension measuring sections.

Abstract: A method for calculating coordinate values of a measuring machine is provided. The method includes receiving signals in three dimensions from a raster ruler signal generator, identifying a direction of each signal and multiply a frequency of each signal. The method further includes counting each of multiplied signals in each dimension, sending the counted data to the MCU. The method further includes adding the counted data of each of the multiplied signals in each dimension to obtain an accumulated number in each dimension and calculating coordinate values of the measuring machine according to the accumulated number in each dimension and a proportionality factor of the raster ruler signal generator.

Abstract: A level sensor includes a first transducer generating a first signal, a second transducer generating a second signal, and a processor configured to switch operation between a first mode and a second mode. In the first mode, the first transducer generates the first signal and the second transducer senses a reflection of the first signal from a surface. In the second mode, the second transducer generates the second signal and the first transducer senses a reflection of the second signal from a reference target. The processor determines a distance to the surface.

Abstract: The invention relates to a method for determining the co-ordinates of a workpiece (9). According to said method: a first co-ordinate system, which has a fixed position in relation to the workpiece (9), is defined; first co-ordinates of the workpiece (9) are measured using a first co-ordinate measuring device (3); second co-ordinates of the workpiece (9) are measured using a second co-ordinate measuring device (5); and a common set of co-ordinates is generated from the first co-ordinates and the second co-ordinates in the first co-ordinate system or in a second co-ordinate system, which has a fixed position in relation to the workpiece (9). The method can be used in particular to determine co-ordinates of a plurality of workpieces (9) during and/or after the production and/or processing of the workpieces (9).

Abstract: Indications of user inputs with respect to a diagnostic image displayed on a display monitor are received to identify defective locations of the display monitor. Information is collected based on the received user inputs that identify defective locations of the display monitor.

Abstract: A technique is disclosed for determining a portion of a document corresponding to a captured image. A user employs a pen to create a stroke in a document, and images are captured by a camera mounted on the pen. The locations of some of the images are determined by, e.g., analyzing a pattern on the document captured by the image or by a pixel-by-pixel comparison of the image with the document. The locations of other images are determined by segmenting the sequence of images into groups corresponding to the shape of the stroke. Information relating to a located image in a segment is employed to determine the position of an unlocated image in the segment. This determined position is used for obtaining further information that may be used to determine the position of another unlocated image in the segment, and so on, until the segment is finished.

Abstract: A measuring apparatus for measuring a workpiece (2), comprising a turntable (1) for receiving the workpiece (2), a base plate (3) with a turntable bearing, and a foundation (12) on which the base plate (3) rests. The turntable (1) comprises a vertical shaft (W) which is situated beneath the turntable (1) and is held by means of the turntable bearing in the base plate (3). The turntable baring comprises an axial bearing (9) at a bottom face end (13) of the shaft (W) which is spaced from the turntable (1). The shaft (W) is rotatably held on the axial bearing in such a way that the weight (G) of the workpiece (2), when received by the turntable (1), is introduced into the foundation (12) through the turntable (1), the shaft (W) and the axial bearing (9).

Abstract: A method and apparatus for measuring a critical dimension (CD) are provided. Image data of a measurement pattern are generated. The measurement pattern may include a first surface and a second surface facing each other. The image data may include a first side and a second side corresponding to the first surface and the second surface of the measurement pattern, respectively. The image data may be edited to increase an overlap length of the first and second sides. A measurement window crossing the first and second sides in the edited image data is set. A distance between the first and second sides in the measurement window is measured.

Abstract: A system for examining a patterned structure formed on a semiconductor wafer using an optical metrology model includes a first fabrication cluster, a metrology cluster, an optical metrology model optimizer, and a real time profile estimator. The first fabrication cluster processes a wafer, the wafer having a first patterned and a first unpatterned structure. The metrology cluster measures diffraction signals off the first patterned and first unpatterned structure. The metrology model optimizer optimizes an optical metrology model of the first patterned structure. The real time profile estimator creates an output comprising underlying film thickness, critical dimension, and profile of the first patterned structure.

Abstract: A portable coordinate measurement machine for measuring the position of an object in a selected volume comprises includes an a positionable articulated arm having a plurality of jointed arm segments. The arm includes a measurement probe having an integrated line laser scanner mounted thereon. The laser may be a fiber coupled laser. Wireless data transfer and communication capability for the CMM is also possible.

Abstract: Improved systems and methods for mapping are provided. In one embodiment, a system for mapping is provided. The system comprises a rangefinder adapted to output range measurements; an inertial sensor adapted to capture inertial measurements including inertial forces acting on the rangefinder and the attitude of the rangefinder; and a processor coupled the rangefinder and the inertial sensor and adapted to receive a set of range measurements from the rangefinder and inertial measurements from the inertial sensor. The processor is adapted to produce a virtual room reconstruction based on the set of range measurements from the rangefinder and inertial measurements from inertial sensor.

Abstract: An optical metrology model for the structure is obtained. The optical metrology model comprising one or more profile parameters, one or more process parameters, and a dispersion. A dispersion function that relates the dispersion to at least one of the one or more process parameters is obtained. A simulated diffraction signal is generated using the optical metrology model and a value for the at least one of the process parameters and a value for the dispersion. The value for the dispersion is calculated using the value for the at least one of the process parameter and the dispersion function. A measured diffraction signal of the structure is obtained using an optical metrology tool. The measured diffraction signal is compared to the simulated diffraction signal to determine one or more profile parameters of the structure. The fabrication tool is controlled based on the determined one or more profile parameters of the structure.

Abstract: An interferometric intensity equation includes parameters that depend on bandwidth and numerical aperture. An error function based on the difference between actual intensities produced by interferometry and the intensities predicted by the equation is minimized iteratively with respect to the parameters. The scan positions (i.e., the step sizes between frames) that minimized the error function are then used to calculate the phase for each pixel, from which the height can also be calculated in conventional manner. As a result, the phase map generated by the procedure is corrected to a degree of precision significantly better than previously possible.

Abstract: A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. The set of geometric parameters is selected to a set of optimization parameters. The number of optimization parameters within the set of optimization parameters is less than the number of geometric parameters within the set of geometric parameters. A set of selected optimization parameters is selected from the set of optimization parameters. The parameters of the set of selected geometric parameters are used as parameters of the selected profile model. The selected profile model is tested against one or more termination criteria.

Abstract: The present invention provides an improved magnetic winding and method of calculating desired winding parameters (winding layer thickness, number of winding layers and number of turns per winding layer) for a winding in a magnetic component. The invention may be applied to general boundary conditions in a magnetic winding or component and considers relative phase displacement for sinusoidal and nonsinusoidal winding currents. Ratios of magnetic surface field intensities at corresponding inner and outer boundaries of one or more winding layer(s) are calculated, and considered with relative phase displacement to select magnetic winding configurations having desired or optimal power dissipation. In certain aspects, a normalized loss function f(H,R,B,?) is utilized to determine a preferred construction among a plurality of iteratively generated selections.

Abstract: One or more embodiments of the invention set forth methods for performing quantity takeoff computations from computer aided design (CAD) drawings. The user initiates the quantity takeoff of an instance of a drawing object by manually selecting one or more geometries that visually represent the instance. The quantity takeoff engine identifies or creates a takeoff object that is associated with the drawing object. A takeoff object may include the dimension of geometry to quantify, the object parameter to be quantified, and the takeoff calculations to be performed. The takeoff measurement tool quantifies the instance and adds markup information to the CAD drawings to represent the determined quantity. Subsequently, the quantity takeoff engine performs takeoff calculations and adds the quantity and cost information to a takeoff report representing all previous selected instances. Advantageously, these techniques allow the user to incrementally create takeoff reports without making any manual measurements.

Abstract: The present invention provides a method and apparatus for dynamic adjustment of sensor and/or metrology sensitivities. The method includes accessing measurement information provided by a first measurement device and modifying a sensitivity of a second measurement device based on the measurement information provided by the first measurement device.

Abstract: Images of a work piece in which measurement object is restricted to a specific point or domain are taken by a camera which takes the image of the work piece from a front-view direction and a camera which takes the image from obliquely above, and a height of each measurement object region is measured. Each pixel of the front-view image used in measurement processing is virtually disposed in a three-dimensional coordinate system including x- and y-axes constituting a coordinate system of the image and a z-axis indicating the height, and a perspective transform is performed to produce a processing result image expressing measurement result. A measurement value is set as the z-coordinate at the pixel which is a height measurement object, and the z-coordinates of other pixels are set at other pixels. A mark for identifying a position and an auxiliary line indicating the height are set at measurement object points and measurement object region in the image.

Abstract: A storage area network (SAN) management application generates device allocation reports displaying foundation variables, device specific parameters, and computed, derived fields for different types of storage arrays, without burdening the allocation report with extraneous parameters through the use of a layout indicative of the information included on the report, providing a streamlined and seamless allocation report. The SAN management application defines a layout indicative of the foundation variables, device attributes, and derived fields requested in an allocation report. The user selected layout indicates the requested allocation parameters for a report, indicative of the foundation variable, device attributes, and derived fields, and also indicates the device usage metrics for computing the derived fields from the foundation variables and device attributes.

Abstract: An object geometry measurement apparatus (10, 20) for the dynamic generation and transmission of geometrical data of objects (14) moved on a conveying device (12) is set forth, wherein the apparatus has a first optoelectronic sensor (10) which is made for the detection of the object geometry in a section of the object (14) with reference to intervals and/or of the remission behavior, as well as a first control (20) which can calculate geometrical data from the object geometry of each section and can output them via a first interface. In this respect, the first control (20) is made to adapt the information density of the output geometrical data to a measure for changes of the object geometry from section to section.

Abstract: A system for segmented parametric optimization of emissions from a light source, including a light source emitting light rays at a plurality of angles and an optic for directing light rays from the light source, the optic including at least one annular segment, the at least one annular segment being configured to optimize a characteristic of the emitted light rays, and a method for using and manufacturing the system.

Abstract: A method and apparatus is provided for generating a customized insole for footwear using information relating to pressure applied by the sole of a foot, which information is correlated to removable pieces of the insole. Embodiments include a method and apparatus for generating a customized insole for footwear, including receiving data from a pressure plate corresponding to a pressure map of the sole of a foot; determining regions of high relative pressure exceeding a predetermined relative pressure level within the pressure map; and associating data related to the regions of high relative pressure to an insole including removable insole pieces corresponding to the pressure map.

Abstract: The present invention provides a form measuring device comprising a measuring section (302) for obtaining measurement data obtained by measuring a space between a straightedge rule (321) and an edge of an object to be measured (305) paired with each other, a function value setting section for setting form-function values, which indicates distances from a reference line R to the straightedge rule (321) and to edges of the object to be measured, and angle-function values ?, which indicates internal angles of the object to be measured 305 and an angle formed by the straightedge rules (321), a simultaneous equation deriving section for deriving simultaneous equations for pairs each consisting of the straightedge rule (321) and an edge of the object to be measured (305) based on the measurement data, and a simultaneous equation processing section for processing the derived simultaneous equations.

Abstract: For measuring the filling level of a measuring medium, including detecting multiple medium layers and interfaces between them, a multi-sensor probe can be dipped into the measuring medium and longitudinally segmented into a plurality of segments, each segment comprising a sensor for measuring a predetermined physical parameter of the surrounding medium. To provide an accurate, reliable and robust measurement of multiple medium layers a measurement model is defined for modeling signals of the sensors as a function of positions of a number of interfaces between the medium layers and the physical parameters of the medium layers. Prior distributions of the number of the interfaces, the positions of the interfaces and the physical parameters of the medium layers are defined. Based on the measurement model and the prior distributions a joint posterior distribution of the number of the interfaces and the positions of the interfaces is determined.

Abstract: A method of increasing control precision of a path of a product in a leveling machine including: a fixed support cage; two leveling assemblies with parallel rollers, which are placed above and below the strip respectively; devices necessary to adjust the interlocking of the rollers; a mechanism for measuring leveling forces at least of two sides of the machine; and a theoretical pre-setting model. The method directly measures at least one value for the spacing of the leveling rollers, which is compared to reference values, and uses the members for adjusting the position of the leveling rollers to maintain the measured values equal to the reference values. The method is particularly suitable for machines used to level flat metal products.