Dimensional Determination Patents (Class 702/155)
  • Patent number: 7822563
    Abstract: A method of calculating a cornering force to be applied to each wheel provided to a vehicle which is cornering, comprising the steps of: obtaining a magnitude of a centrifugal force to the vehicle in a direction substantially orthogonal to a vehicle traveling direction, a contact length of each wheel during the cornering of the vehicle, and an amount of deformation in a wheel width direction at the contact portion of each wheel of the vehicle, calculating a difference between the obtained amount of the deformation and an amount of deformation in the wheel width direction under a straight forward travel condition of the vehicle for each wheel, and calculating a cornering force for each wheel based on the magnitude of the centrifugal force, the contact length, and the difference between amounts of deformation in the wheel width direction.
    Type: Grant
    Filed: July 18, 2006
    Date of Patent: October 26, 2010
    Assignee: The Yokohama Rubber Co., Ltd.
    Inventors: Jun Matsuda, Tsuyoshi Kitazaki, Naoshi Miyashita
  • Patent number: 7818139
    Abstract: A data signal indicative of a gap between a sensor and at least one of a surface of a rotor and a surface of a stator rotating relative to the sensor is sent to a computer processor. The computer implements defining a plurality of lowest values of the data signal over a revolution of relative rotation between the rotor and the stator, and displaying the plurality of lowest values for assessment of the distance between the sensor and a surface of at least one of the rotor and the stator in order to determine a position of the rotor relative to the stator.
    Type: Grant
    Filed: October 24, 2008
    Date of Patent: October 19, 2010
    Assignee: General Electric Company
    Inventor: Raymond Verle Jensen
  • Patent number: 7810249
    Abstract: To remove an undercut part from three-dimensional data of the inner face, the program includes a surface model creating means to create a surface model based on three-dimensional data of a gypsum model including an abutment tooth, a cutting direction specifying means to specify a direction of a cutting bar, and a surface model creating means to create a surface model for machining by changing the three-dimensional data to have new coordinates by determining a base axis in parallel with the cutting bar in the surface model and plane moving coordinates of the cutting bar, and converting the coordinates of a point which becomes an undercut part, to be equal to the plane moving coordinates of a point having a high height from a specified face rectangular to the base axis at the opposite side of the occlusion face and a long distance from the base axis.
    Type: Grant
    Filed: August 17, 2007
    Date of Patent: October 12, 2010
    Assignee: GC Corporation
    Inventors: Yoshinori Matsuda, Tatsuru Doumoto, Yoshinori Ebihara
  • Patent number: 7813891
    Abstract: This application generally relates to methods and systems for detecting spectrophotometer misalignment. In particular, the application may characterize the noise of a spectral measurement relative to a reference substrate known to exhibit a generally linear (flat) spectral output over a known spectrum. From the spectral measurement, a linear regression may be performed on a portion of the spectral output to determine a best fit line and a correlation of determination (“R-squared value”) may be determined correlated the measured data to the best fit line. Finally, the R squared value may be compared to a predetermined threshold R squared value to determine if the sensor is misaligned beyond an acceptable amount. If so, an alert may be generated.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: October 12, 2010
    Assignee: Xerox Corporation
    Inventors: Paul S. Bonino, Timothy J. Sulenski
  • Publication number: 20100242243
    Abstract: A programmable machine and method for adhering a flexible photovoltaic film panel onto metal supplied from a roll for forming a combination solar and roof panel is provided. The voltaic film panels and metal to which is adhered are supplied on rolls which are fed from reels. The rollformer can form male and female edges on the metal which are necessary for a metal roof. The angle at which the exit cutter can cut is calculated by the programmable computer.
    Type: Application
    Filed: June 10, 2010
    Publication date: September 30, 2010
    Applicant: METALFORMING, INC.
    Inventors: Dale Kroskey, Curtis Lafore, Geoffrey Louis Stone
  • Patent number: 7805277
    Abstract: To provide a step number measuring apparatus in which a reduction in electric power is intended by a simple constitution, and which can correspond to plural movements. A CPU calculates a moving motion pitch on the basis of a detection signal from sensors that a switching circuit has selected, calculates the moving motion pitch by performing a processing having been selected from among plural kinds of processings, which have been stored in a memory, on the basis of the detection signal from the sensors that the switching circuit has selected, calculates the moving motion pitch by selecting the other processing among the plural kinds of processings when both the moving motion pitches differ, and performs a step number measurement by the selected processing when both the moving motion pitches become the same.
    Type: Grant
    Filed: February 6, 2007
    Date of Patent: September 28, 2010
    Assignee: Seiko Instruments Inc.
    Inventor: Keisuke Tsubata
  • Publication number: 20100241395
    Abstract: The invention relates to a method and a device for measuring a damaged vehicle, in which inclination of the vehicle is measured with the measuring device and the measured inclination of the vehicle is used as a datum plane, distances of measuring points (9a, 9b) of the damaged vehicle (8) are measured with a measuring sensor of the measuring device and the measured data are compared to registered reference values of the measuring points, and inclination of the measuring device is measured with an inclination sensor of the measuring device. According to the invention, the measuring device simultaneously measures the distance between the measuring points and the inclination of the damaged vehicle and height difference of the measuring points is calculated from the values of distance between the measuring points and inclination.
    Type: Application
    Filed: May 20, 2010
    Publication date: September 23, 2010
    Inventor: Jarkko Venäläinen
  • Patent number: 7801700
    Abstract: Some embodiments of the present invention provide a system that generates a simulated vibration pattern in a computer subsystem. During operation, a vibration pattern is monitored at a location in the computer subsystem, wherein the vibration pattern is monitored while the computer subsystem is incorporated into the computer system and the computer system is operating. Then, the vibrations of the computer subsystem are mimicked by generating the simulated vibration pattern at the same location in the computer subsystem based on the monitored vibration pattern.
    Type: Grant
    Filed: August 5, 2008
    Date of Patent: September 21, 2010
    Assignee: Oracle America, Inc.
    Inventors: Kenny C. Gross, Anton A. Bougaev, Aleksey M. Urmanov
  • Publication number: 20100228519
    Abstract: A measurement method of the present invention is a measurement method which measures a target divided into a plurality of partial regions to measure a whole shape of the target by stitching the plurality of partial regions. The measurement method comprises Steps S501 to S511 which measures a plurality of partial regions, Step S102 which determines an error in a partial region that is a reference, Step S105 which calculates each of errors in the plurality of partial regions, and Step S107 which performs a correction depending on each of the errors to stitch the plurality of partial regions. Steps S102 to S107 are repeatedly performed by changing the partial region that is the reference (S110).
    Type: Application
    Filed: March 3, 2010
    Publication date: September 9, 2010
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Yuki Oshima
  • Publication number: 20100228518
    Abstract: A method includes receiving multiple biased measurements associated with a property of a sheet of material, where the biased measurements correspond to multiple known sheet geometries. The method also includes determining an unbiased measurement associated with the property of the sheet using the biased measurements, where the unbiased measurement corresponds to a nominal sheet geometry. The method further includes storing and/or outputting the unbiased measurement. Determining the unbiased measurement could include performing regression using the biased measurements and their corresponding sheet geometries to identify an estimated value of the property of the sheet at the nominal sheet geometry. The biased measurements can be generated using one or more sensors, and the sheet may not be stabilized during the biased measurement generation. Additional sheet geometries can also be created, such as by varying a tilt angle, a curvature, and/or a position of the sheet.
    Type: Application
    Filed: March 9, 2009
    Publication date: September 9, 2010
    Applicant: Honeywell International Inc.
    Inventors: John F. Shakespeare, Tarja T. Shakespeare, Markku Kellomaki
  • Patent number: 7783101
    Abstract: Methods and systems for determining dimensions of a structure that has a re-entrant profile are disclosed. A method includes imaging at least a portion of a top surface of the structure. Subsequently, a second portion of the structure is imaged from a plurality of perspectives. A third portion of the structure is also imaged from a plurality of perspectives. A dimension of a bottom portion of the structure is determined based on the imaging.
    Type: Grant
    Filed: December 15, 2004
    Date of Patent: August 24, 2010
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventor: Justin Jia-Jen Hwu
  • Patent number: 7778798
    Abstract: A system and method for measuring tool performance of a multi-path cluster semiconductor fabrication tool. The system comprises a status data unit for receiving up or down status data for each element of the tool for respective operational time periods; a performance value assignment unit for assigning a performance value to the tool for each time period based on the status data of the elements during said each time period; and an operational uptime unit for determining an operational uptime for a period covering the time periods of the tool based on multiplying the respective time periods with the corresponding assigned performance values.
    Type: Grant
    Filed: October 12, 2006
    Date of Patent: August 17, 2010
    Assignee: Systems on Silicon Manufacturing Co. Pte. Ltd.
    Inventors: Swee Keng Ang, Hanif Bin Mohamed Mohamed, Joo Ming Jackson Tan
  • Patent number: 7774157
    Abstract: A method of checking turbomachine blades is presented that may be implemented using a computer and a measuring device. Turbomachine blades compatible with embodiments of the method have a profile including a centerline, suction face, pressure face, leading edge and trailing edge. The method measures geometrical coordinates of many points on a blade section profile, calculates an aerodynamic parameter of the blade section as a function of the measured coordinates, verifies whether the calculated aerodynamic parameter value departs from a valid range of parameters from a reference blade, and validates or rejects the blade depending upon whether the value of the aerodynamic parameter falls within the valid range.
    Type: Grant
    Filed: July 26, 2006
    Date of Patent: August 10, 2010
    Assignee: Snecma
    Inventors: Alain Henri Daniel Bouron, Jean-Francois Escuret, Didier Merville, Laurent Villaines
  • Patent number: 7774155
    Abstract: Acceleration data which is output from an acceleration sensor is obtained. A rotation motion of an input device around a predetermined direction as a rotation axis is determined by comparing a start point in a two-dimensional coordinate system which is represented by the first acceleration data obtained in a predetermined period, and an end point in the two-dimensional coordinate system which is represented by the last acceleration data obtained in the predetermined period. Coordinate axes of the two-dimensional coordinate system are defined based on components of the two axial directions of the acceleration data, and an origin of the two-dimensional coordinate system represents a value of the acceleration data in the state where no acceleration including the acceleration of gravity acts upon the acceleration sensor. Motion data including at least the determined rotation motion is output.
    Type: Grant
    Filed: August 15, 2008
    Date of Patent: August 10, 2010
    Assignee: Nintendo Co., Ltd.
    Inventors: Kenta Sato, Akio Ikeda, Kuniaki Ito, Ryoji Kuroda, Masahiro Urata
  • Publication number: 20100191502
    Abstract: A processing system for clearance estimation in a rotating machine includes one or more sensors and one or more digital signal processors for calculating the estimated clearance. The processing system may include techniques for obtaining real-time clearance estimates and techniques for obtaining averaged clearance estimates. Aspects of the processing system may also include a method of switching between real-time clearance estimates and averaged clearance estimates depending on the operating conditions of the rotating machine. Other aspects of the processing system include the use of two digital signal processors: a first digital signal processor configured to receive signals from a clearance sensor and perform a first set of high speed processing tasks, and a second digital signal processor configured to receive signals from the first digital signal processor and perform a second set of lower speed processing tasks.
    Type: Application
    Filed: January 28, 2009
    Publication date: July 29, 2010
    Applicant: General Electric Company
    Inventors: Zhiyuan Ren, Wayne Charles Hasz, Emad Andarawis Andarawis, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, William Lee Herron, David Walter Parry, Cheryl Lynn Herron, David Richard Esler, Mahadevan Balasubramaniam
  • Patent number: 7761257
    Abstract: An apparatus is for evaluating optical characteristics of an optical system based on an image forming position of a point image formed through the optical system. The apparatus includes a point image producing unit that forms a point image through the optical system in each point light source; an imaging unit that images the point images to produce a point image distribution image; and a moving unit that changes relative distance between the optical system and the point light source or the imaging unit in an optical axis direction. The apparatus also performs processing of detecting an image forming position in each different relative distance of the point image based on image information of the point image distribution images, the processing including calculating a regression expression for the detected image forming positions to obtain a shape parameter of the image axis in each of the point images.
    Type: Grant
    Filed: May 8, 2008
    Date of Patent: July 20, 2010
    Assignee: Olympus Corporation
    Inventor: Toshiaki Matsuzawa
  • Patent number: 7751035
    Abstract: A method and device for determining, in a non-destructive way, at least the active carrier profile from an unknown semiconductor substrate are disclosed. In one aspect, the method comprises generating 2 m independent measurement values from the m reflected signals and correlating these 2 m measurement values with 2 m independent carrier profile values. The method further comprises generating additional 2 m measurement values to allow determining the active carrier profile and a second parameter profile by correlating the 4 m measurement values with the 4 m profile values. The method further comprises generating a total of 2 m[n.k] measurement values to allow determining [n.k] independent material parameter depth profiles, each material parameter profile having m points.
    Type: Grant
    Filed: March 6, 2008
    Date of Patent: July 6, 2010
    Assignees: IMEC, Katholieke Universiteit Leuven
    Inventors: Trudo Clarysse, Janusz Bogdanowicz
  • Publication number: 20100161287
    Abstract: A system and process for managing measurement data and generating production and engineering drawings from measurements obtained from a sample population parts to generates and parametrically update engineering and production drawings from measurement data of actual parts. The system and process provides efficient allocation of measurement resources to generate engineering drawings and models. The resources are allocated in a manner that eliminates and reduce time required for producing and generating usable engineering models and drawings.
    Type: Application
    Filed: December 22, 2008
    Publication date: June 24, 2010
    Inventors: Marc R. Sauerhoefer, Robert T. Brooks
  • Patent number: 7742633
    Abstract: An apparatus and method that uses at least six digital cameras to capture images of the foot, can reconstruct the 3D model of the foot rapidly. Users can only wear elastic socks, which have specially coded multicolored stripes or spots, and stands on the transparent plate of a platform. First from two parallel cameras under the transparent plate, the 3D contour about the sole of the foot can be computed and reconstructed through stereosis algorithm. Similarly, from the other four cameras at least around the upper part of the foot, four or more curved surfaces are combined to reconstruct 3D contour of the upper portion of the foot. Combining the bottom contours and upper contours of the foot the complete 3D foot model can be obtained.
    Type: Grant
    Filed: November 11, 2005
    Date of Patent: June 22, 2010
    Inventors: Jung-Tang Huang, Fuko Yu
  • Publication number: 20100141948
    Abstract: A method and system are presented for use in characterizing properties of an article having a structure comprising a multiplicity of sites comprising different periodic patterns. The method comprises: providing a theoretical model of prediction indicative of optical properties of different stacks defined by geometrical and material parameters of corresponding sites, said sites being common in at least one of geometrical parameter and material parameter; performing optical measurements on at least two different stacks of the article and generating optical measured data indicative of the geometrical parameters and material composition parameters for each of the measured stacks; processing the optical measured data, said processing comprising simultaneously fitting said optical measured data for the multiple measured stacks with said theoretical model and extracting said at least one common parameter, thereby enabling to characterize the properties of the multi-layer structure within the single article.
    Type: Application
    Filed: July 13, 2008
    Publication date: June 10, 2010
    Inventors: Yoel Cohen, Bonaz Brill
  • Publication number: 20100125433
    Abstract: An apparatus for selecting contact center resources is provided. The apparatus includes a memory and a processor in communication with the memory. The memory includes computer code executable with the processor. The computer code is configured to obtain one or more user characteristics; map a user point on a spatial map that includes a first resource spatial point for a first contact center resource, the user point being located at a point that spatially defines the one or more user characteristics; and determine a first distance between the user point and the first resource spatial point.
    Type: Application
    Filed: November 18, 2008
    Publication date: May 20, 2010
    Inventors: Kenneth Jordan, Michael Paul Lepore, Paul Robert Schechinger, Kevin Collins, Rick Whitesel, Lawrence E. Johnson, Victor L. Voydock
  • Patent number: 7720624
    Abstract: An information processing method, an information processing apparatus and a program can prevent errors from arising when associating point group data obtained by actually measuring an item such as a metal part and design data defining the item. The characteristic value representing the profile of a face of the design data defining the item and the characteristic value computationally determined from the point group data obtained by actually measuring the item are compared and associated with each other.
    Type: Grant
    Filed: August 21, 2007
    Date of Patent: May 18, 2010
    Assignee: Canon Kabushiki Kaisha
    Inventor: Kazuma Shimizu
  • Patent number: 7720632
    Abstract: A dimension measuring apparatus used for measuring a dimension of a semiconductor device having a first pattern of repeated structure and a second pattern that is linear and formed on the first pattern to extend over the repeated structure. The invention includes a shape information acquisition unit which acquires information on a shape of the first pattern; a width value acquisition unit which acquires a width value of each portion of the second pattern; an analytic area setting unit, which sets a plurality of analytic areas on the second pattern; and a dimension determining unit, which extracts, for each of the set analytic areas, width values of portions included in the analytic area, and uses the extracted width values to determine a dimension of the second pattern at portions overlapping the first pattern.
    Type: Grant
    Filed: May 28, 2008
    Date of Patent: May 18, 2010
    Assignee: Hitachi, Ltd.
    Inventors: Masaru Kurihara, Masaru Izawa, Junichi Tanaka
  • Publication number: 20100118316
    Abstract: Provided are an apparatus and a method of measuring structures on a workpiece using an optical metrology system, the optical metrology system comprising an auto focus subsystem which includes a motion control system and a focus detector. The focus detector includes an array of sensors where each sensor has identification (ID). The focus detector measures the focus beam and converts the measurements into a focus signal for each sensor. The focus signal and associated ID of each sensor are transmitted to a processor that generates a best focus instruction. A motion control system utilizes the best focus instruction to move the workpiece to the best focus location. The auto focusing of the workpiece is performed to meet set operating objectives of the auto focus subsystem.
    Type: Application
    Filed: November 13, 2008
    Publication date: May 13, 2010
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: MIHAIL MIHAYLOV, MANUEL MADRIAGA
  • Patent number: 7716009
    Abstract: A method of preparing recipes of operating a metrology tool, wherein each recipe includes a set of instructions for measuring at least one dimension in a microelectronic feature. There is provided a desired recipe having instructions for measuring one or more desired dimensions, the desired recipe or portion thereof including a summary of parameters relating to metrology tool function with respect to the microelectronic feature dimension to be measured. The method includes comparing the instructions in the desired recipe with the instructions in a database, identifying differences between the instructions in the desired recipe and the instructions in the database, modifying the instructions in the desired recipe to conform to the instructions in the database, verifying the desired recipe prior to using the modified desired recipe by the metrology tool, and using the desired recipe to execute a microelectronic feature measurement on the metrology tool.
    Type: Grant
    Filed: November 8, 2007
    Date of Patent: May 11, 2010
    Assignee: International Business Machines Corporation
    Inventors: Ejaj Ahmed, Charles N. Archie, Stephen W. Goodrich, Eric P. Solecky, Georgios A. Vakas, Erwin E. Weissmann, Lin Zhou
  • Patent number: 7711180
    Abstract: The present invention provides a three-dimensional image measuring apparatus and method capable of measuring projections and depressions on a surface of an object with fine precision, as well as ensuring stable convergence, even for stereo images with significant project distortion.
    Type: Grant
    Filed: April 20, 2005
    Date of Patent: May 4, 2010
    Assignee: Topcon Corporation
    Inventors: Tadayuki Ito, Hitoshi Otani, Nobuo Kochi
  • Publication number: 20100094587
    Abstract: A metrology system for measuring a cone angle, a cone straightness, and a cone quality of a sample and method of using the metrology system are disclosed. The system includes a rotary stage, one or more workpiece fixtures that hold the samples in the rotary stage, and a number of different sized measurement devices. The measuring devices are positioned next to the rotary stage and measure the samples using contact. The rotary stage is free to rotate when the measuring devices are in a non-measuring state. The invention also includes a processor that collects data from the measurement devices and calculates the cone angle, the cone straightness, and the cone quality of each sample based on the data.
    Type: Application
    Filed: October 15, 2008
    Publication date: April 15, 2010
    Applicant: SEAGATE TECHNOLOGY LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez, Reid E. Berry, II, Hans Leuthold
  • Patent number: 7690556
    Abstract: A method and apparatus for a step counter system is described. The step counter system comprises an accelerometer to detect motion of a user, a step calculation logic to utilize the motion detected by the accelerometer to detect and count steps, and an incline logic to calculate an incline of a surface on which the user moved.
    Type: Grant
    Filed: January 26, 2007
    Date of Patent: April 6, 2010
    Assignee: DP Technologies, Inc.
    Inventors: Philippe Kahn, Arthur Kinsolving
  • Publication number: 20100076721
    Abstract: Described are an automated system, an apparatus, and a method adapted to tracking and dynamically measuring locations in a volume for determining a size and a position of a body during a performance of a repetitive motion, such as in using sporting equipment. The sporting equipment may be a bicycle, and the body may be a cyclist. The apparatus comprises a plurality of markers attached to the body, a three-dimensional marker tracking system, and a processing unit. The apparatus, system, or method computes a dimensional statistic from computed measurements of all strokes of at least two strokes included in a period of time of the repetitive motion.
    Type: Application
    Filed: September 3, 2009
    Publication date: March 25, 2010
    Applicant: Crucial Innovation, Inc.
    Inventors: Clifford Simms, Waldean Schulz
  • Patent number: 7684956
    Abstract: A method of extracting the shape of a probe tip of a probe-based instrument from data obtained by the instrument is provided. The method employs algorithms based on the principle that no reconstructed image points can physically occupy the same region as the tip during imaging. Sequential translates of the tip shape or volume sweep out an area or volume that is an “exclusion zone” similar to morphological erosion. The embodiments of the alternative method use either the region defined by the tip boundary or simply the tip boundary.
    Type: Grant
    Filed: November 28, 2006
    Date of Patent: March 23, 2010
    Assignee: Veeco Instruments, Inc.
    Inventors: Gregory A. Dahlen, William Foreman
  • Patent number: 7684611
    Abstract: An edge bead removal measurement method includes determining an edge of a wafer about a circumference of the wafer. A location of a wafer notch on the edge of the wafer is determined. A location of a center of the wafer is determined. A distance from the edge of the wafer to an edge bead removal line about the circumference of the wafer is determined.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: March 23, 2010
    Assignee: Rudolph Technologies, Inc.
    Inventor: Patrick Simpkins
  • Patent number: 7679055
    Abstract: An evaluation method and apparatus is provided for evaluating a displacement between patterns of a pattern image by using design data representative of a plurality of patterns superimposed ideally. A first distance is measured for an upper layer pattern between a line segment of the design data and an edge of the charged particle radiation image, a second distance is measured for a lower layer pattern between a line segment of the design data and an edge of the charged particle radiation image; and an superimposition displacement is detected between the upper layer pattern and lower layer pattern in accordance with the first distance and second distance.
    Type: Grant
    Filed: August 24, 2007
    Date of Patent: March 16, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takumichi Sutani, Ryoichi Matsuoka, Hidetoshi Morokuma, Akiyuki Sugiyama, Hiroyuki Shindo
  • Publication number: 20100063770
    Abstract: A method for analyzing tolerances for features for an object. A framework may be created from the plurality of features for the object. The framework may be fitted to a plurality of manufactured features for the object based on the plurality of features to form a fit framework. A remaining clearance may be identified between each of a plurality of manufactured sizes associated with the plurality of features and each of plurality of virtual conditions for the plurality of features to form a plurality of remaining clearances. A plurality of remaining clearance geometric shapes may be formed from the plurality of remaining clearances. The plurality of remaining clearance features may be positioned around a single true position. A common region may be identified from between the plurality of remaining clearances. A minimum remaining float may be identified from the common region. A resulting pattern transformation may be determined.
    Type: Application
    Filed: September 8, 2008
    Publication date: March 11, 2010
    Inventors: Bruce A. Wilson, Paul C. Hollingshead
  • Publication number: 20100047340
    Abstract: The present invention includes compositions and methods of making a modified release pharmaceutical formulation and a method of preparation for the embedding of modified release multi-particulates into a polymeric or wax-like matrix. The modified release multi-particulates comprise an effective amount of a therapeutic compound having a known or desired drug-release profile. Modified release multi-particulates may include a polymeric coat or may be incorporated into particle or core material. The polymer matrix comprises a thermoplastic polymer or lipophilic carrier or a mixture thereof that softens or melts at elevated temperature and allows the distribution of the modified release multi-particulates in the polymer matrix during thermal processing. Formulation compounds and processing conditions are selected in a manner to preserve the controlled release characteristics and/or drug-protective properties of the original modified release multi-particulates.
    Type: Application
    Filed: August 20, 2009
    Publication date: February 25, 2010
    Applicant: BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM
    Inventors: James W. McGinity, Sandra U. Schilling
  • Patent number: 7660697
    Abstract: The present invention aims at surely and efficiently calculating size tolerances of a plurality of parts constituting a structure with the configuration that includes a tentative size tolerance setting section setting tentative size tolerances of the plurality of parts based on design data of the structure and part information of the plurality of parts; a primary analyzing section calculating a quality of the structure and sensitivities of the plurality of parts based on the tentative size tolerances set by the tentative size tolerance setting section; a judging section judging whether or not the quality satisfies a desired quality which the structure demands; and a secondary analyzing section calculating, if the judging section judges that the quality does not satisfy the desired quality, the size tolerances of the plurality of parts using the sensitivities such that the structure satisfies the desired quality.
    Type: Grant
    Filed: February 1, 2008
    Date of Patent: February 9, 2010
    Assignee: Fujitsu Limited
    Inventor: Kazuhiko Hamazoe
  • Patent number: 7653508
    Abstract: A method for monitoring human activity using an inertial sensor includes continuously determining an orientation of the inertial sensor, assigning a dominant axis, updating the dominant axis as the orientation of the inertial sensor changes, and counting periodic human motions by monitoring accelerations relative to the dominant axis.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: January 26, 2010
    Assignee: DP Technologies, Inc.
    Inventors: Philippe Kahn, Arthur Kinsolving, Mark Andrew Christensen, Brian Y. Lee, David Vogel
  • Patent number: 7640137
    Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: December 29, 2009
    Assignee: Hitachi, Ltd
    Inventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
  • Publication number: 20090315544
    Abstract: There is provided a rotation detection device 1 which includes a plurality of magnetic encoders (2A, 2B) of a ring shape arranged coaxially and having different numbers of magnetic poles, a plurality of magnetic sensors (3A, 3B) each operable to detect the magnetic field of the corresponding magnetic encoder and having a function of detecting positional information within a single magnetic pole of the corresponding magnetic encoder, a phase difference detector (6) for determining the phase difference of magnetic field signals detected respectively by the magnetic sensors (3A, 3B), and an angle calculator (7) for calculating an absolute rotation angle of the magnetic encoders based on the detected phase difference.
    Type: Application
    Filed: August 21, 2009
    Publication date: December 24, 2009
    Applicant: NTN CORPORATION
    Inventors: Toru Takahashi, Shintarou Ueno
  • Patent number: 7634374
    Abstract: There is described a method of manufacturing a device to be used with a computer-aided surgery system, a method of calibrating the device, and the device itself. After fabrication, the device is measured to obtain true parameters thereof. The true parameters are stored on a storage medium associated with the device and include measurement data of high precision relating to dimensions of the device as well as to relative positioning of a tracker on the device with respect to the device. The true parameters are entered into the system and when the tracker is located in the 3D environment, the device can then be located in the 3D environment with a high degree of precision using the true parameters.
    Type: Grant
    Filed: April 26, 2005
    Date of Patent: December 15, 2009
    Assignee: Orthosoft Inc.
    Inventors: Benoît Chouinard, Louis Brillon, Benoît Pelletier, Sébastien Jutras
  • Publication number: 20090304227
    Abstract: The invention provides consumers, private enterprises, government agencies, contractors and third party vendors with tools and resources for gathering site specific information related to purchase and installation of energy systems. A system according to one embodiment of the invention remotely determines the measurements of a roof. An exemplary system comprises a computer including an input means, a display means and a working memory. An aerial image file database contains a plurality of aerial images of roofs of buildings in a selected region. A roof estimating software program receives location information of a building in the selected region and then presents the aerial image files showing roof sections of building located at the location information. Some embodiments of the system include a sizing tool for determining the size, geometry, and pitch of the roof sections of a building being displayed.
    Type: Application
    Filed: February 2, 2009
    Publication date: December 10, 2009
    Inventors: Daniel Ian Kennedy, Adam Pryor, Andrew Birch
  • Publication number: 20090306929
    Abstract: An ultrasonic dimensioning system and method by which objects can be quickly and accurately measured (dimensioned). The system includes at least a stable object support surface, a number of ultrasonic receivers, and an ultrasonic transmitter. The ultrasonic transmitter is preferably part of a pointer device that is properly positioned relative to an object to be measured, the proper position(s) depending on the shape of the object. Subsequent transmission of ultrasonic pulses (waves) from the pointer device are received by the ultrasonic receivers. The time intervals between transmission and reception of the ultrasonic pulses (waves) are used to determine the distance of the pointer from the receivers, which distances are subsequently used to calculate the dimensions/volume of the object.
    Type: Application
    Filed: June 4, 2008
    Publication date: December 10, 2009
    Applicant: METTLER-TOLEDO, INC.
    Inventors: Wenquan Li, Philip M. Metzler, Hugh G. Hindmon, John Scott Churan, Helen Winfrey
  • Publication number: 20090299687
    Abstract: A method of inspecting gas turbine engine rotor disks for reverse engineering includes establishing a plurality of datums for providing a local coordinate system, establishing rim face and primary rim slot data, manually verifying coordinate measuring machine probe indexing relative to probe locations on a rotor disk programming coordinate measuring machine probing of the primary rim slot as a function of the manually verified coordinate measuring machine probe indexing along a plurality of scan lines that are substantially parallel to each other, obtaining coordinate measuring machine probing data from coordinate measuring machine probing of a plurality of sample rotor disks, outputting dimension data as a function of average values of coordinate measuring machine probing data for the plurality of sample rotor disks, and outputting tolerance data as a function of dimension data value ranges for the plurality of sample rotor disks.
    Type: Application
    Filed: August 7, 2007
    Publication date: December 3, 2009
    Applicant: United Technologies Corporation
    Inventors: Robert T. Brooks, Wayne D. Nye, Donald P. Oswald
  • Publication number: 20090299690
    Abstract: A method for measuring dimensions between selected points on a side of interest in objects selected for measurement by an optical measuring system comprising a flatbed scanner and a connected computer system through acquiring a reference image to provide corresponding image distance errors; and also acquiring a measurement object image. Deviation curves are provided as the basis for determining deviation errors in the measurement object image. Corrected measurement object image distances are formed through combining the deviation errors in the measurement object image distances with the corresponding measurement object image. These corrected measurement object image distances are used to determine distances between chosen pairs of those selected locations.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: United Technologies Corporation
    Inventors: Randall W. Joyner, Jesse R. Boyer
  • Patent number: 7627449
    Abstract: An exemplary apparatus (100) for measuring eccentricity of an optical module (23) includes a worktable (10), an image sensor device (17), a driving device (13), and a processing device (19). The worktable is configured for supporting the optical module. The image sensor device is configured for receiving an image of the optical module. The driving device is configured for driving rotation of the worktable. The processing device is connected to the image sensor device, and the processing device is configured for analyzing the image of the optical module.
    Type: Grant
    Filed: September 12, 2006
    Date of Patent: December 1, 2009
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Kuo-Lung Lin
  • Publication number: 20090284758
    Abstract: Displacement of a subject is measured easily and accurately from a distant point by attaching a displacement measuring target, where two or four light sources are fixed on a flat, substrate to a measured point of the subject, comprehending displacement correction coefficients (Kx, Ky) expressing a relation between intervals in X and Y directions on the subject and interval detecting voltages corresponding to the intervals on the basis of position detecting voltages corresponding to positions of the light sources obtained by projecting the light from the respective light sources onto a PSD light receiving surface of a PSD camera, detecting displacement of the light source caused by displacement of the subject by the light receiving surface to output the position detecting voltage, and computing a two-dimensional or three-dimensional displacement amount of the measured point on the basis of the position detecting voltages and the displacement correction coefficients (Kx, Ky).
    Type: Application
    Filed: May 19, 2008
    Publication date: November 19, 2009
    Applicants: Toyonaka Kenkyusho Co., Ltd., Jibanshikenjo Co., Ltd., Pile Dynamics, Inc.
    Inventor: Akira Kuwata
  • Publication number: 20090287452
    Abstract: The invention relates to an improved method of providing customers with indications of whether certain articles, for instance footwear or clothing, will fit that customer and to making recommendations for articles that will fit. The method takes body size data regarding the size/shape of the appropriate body part of the customer and compares the data against a reference body size/shape associated with an article. The reference body size is obtained from the recorded body sizes of previous customers who are known to fit the particular article. A match between the current customer's body size and the reference body size for an article is an indication that such article will fit that customer. The present invention thus avoids any need to obtain any size information about the article itself and can generate the reference body size data through normal retail practices. The invention is particularly applicable to the fitting of shoes.
    Type: Application
    Filed: May 13, 2008
    Publication date: November 19, 2009
    Inventors: Maurice Stanley, Tej Kaushal
  • Patent number: 7620501
    Abstract: A system and method for artery-vein separation and vessel modeling are provided, the system including an adapter unit, a centerline locating unit in signal communication with the adapter unit, and a deformable modeling unit in signal communication with the centerline locating unit; and the method including receiving three-dimensional image data indicative of vessels, visualizing the received image data, selecting seed points on the vessels relative to the visualization, smoothing the image data with a non-linear filter responsive to curvature information of the data, initiating a deformable model for each selected seed point, modulating the propagation of each deformable model in accordance with at least one of local and global statistics, and growing an interconnected region for each model, where each model competes for classifying new points in its own region until convergence.
    Type: Grant
    Filed: May 3, 2005
    Date of Patent: November 17, 2009
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventors: Huseyin Tek, James P. Williams
  • Patent number: 7617069
    Abstract: A hang-timer device is disclosed that is capable of issuing recording instructions to a recording device, such as a digital camera. The hang-timer can measure a static acceleration profile of a wearer of the hang-timer, and based on this static acceleration profile it can issue recording instructions to a recording device. For example, if the static acceleration profile changes from about 1 g to about 0 g, the hang-timer can issue instructions for the recording device to record; additionally, if the profile changes from about 0 g to about 1 g, it can issue instructions to stop recording. Moreover, the hang-timer can issue instructions for the recording device to record some period of time before a hang-time event and some period of time after a hang-time event. Various other such variations on the general notion described above are also disclosed.
    Type: Grant
    Filed: January 3, 2006
    Date of Patent: November 10, 2009
    Assignee: Drop Zone Corp.
    Inventors: Jeffrey Michael Alexander, Erich T. Griebling
  • Patent number: 7613588
    Abstract: A shoe shape selection method selects an appropriate shoe shape from a plurality of kinds of shoe shapes prepared beforehand, based on a plurality of items of data on a customer. The plurality of data items include the foot length of the customer, the foot girth of the customer and the difference between the lengths of the first and second toes of the customer.
    Type: Grant
    Filed: April 9, 2004
    Date of Patent: November 3, 2009
    Assignee: ASICS Corporation
    Inventors: Makoto Katsu, Tetsuro Kurashina, Hiroyuki Kusumi
  • Patent number: RE41342
    Abstract: A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.
    Type: Grant
    Filed: April 3, 2000
    Date of Patent: May 18, 2010
    Assignee: DeFelsko Corporation
    Inventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish