Abstract: A method and apparatus for sequencing determines possible next states for respective possible previous states based upon resources, selects one of the possible next states as an actual next state based upon an actual previous state, and communicates the actual next state as the actual previous state.

Abstract: A system facilitates state processing in an industrial control environment is provided. The system includes a module component to facilitate control operations in an industrial control environment. A propagation component is embedded within the module component to communicate state information to at least one other module component. The state information is communicated in an upward or downward direction according to a hierarchical module configuration.

Abstract: A method for testing logic devices configured across asynchronous clock domains includes deactivating, during at-speed fault testing, a local clock signal for each of a first plurality of latches having at least one data input thereto originating from a source located within an asynchronous clock domain with respect thereto. The deactivation of a local clock signal for each of the plurality of latches is implemented in a manner so as to permit data capture within the first plurality of latches, and wherein the deactivation of a local clock signal for each of the plurality of latches is further implemented in a manner so as to permit at-speed data launch therefrom to downstream latches with respect thereto during at-speed testing.

Abstract: Described is an electronics system having an individually replaceable electronics module installed therein. The individually replaceable electronics module includes a component, a light-emitting device (LED) disposed near the component, a processor module for performing diagnostics on the component and producing a message based on results of the diagnostics, and a microcontroller in communication with the processor module to receive the message produced by the processor module. The microcontroller determines whether the component is faulting based on the message. A DC power source is coupled to supply power to the microcontroller after the individually replaceable electronics module is electrically disconnected from the electronics system so that the microcontroller can illuminate the LED if the received message indicates that the component is faulting.

Abstract: A semiconductor integrated circuit comprises a plurality of cores (99) connected with an inter-connection network (1000) and a test controller (500) which is connected with the inter-connection network (1000) and which issues a test control request associated with the test of the core (99) via the inter-connection network (1000). The inter-connection network (1000) is constituted of a plurality of adapters (3000) which serve as connection interfaces of the plurality of cores (99) and the test controller (500), respectively, and a plurality of routers (2000) which connect the plurality of adapters (3000). The adapters (3000) connected with the core (99) comprise a core testing unit for vicariously testing core (99) connected to itself based on the test control request received from the test controller (500) via the inter-connection network (1000).

Abstract: A test system 100 that can accept a plurality of plug-in electronic cards in Xi Slots 126 or PXI slots 134 is described. The test or source measure switching system 100 includes a sequencer or sequence engine 130 which is fully capable of executing opcode instructions having potentially indefinite completion times and monitoring multiple asynchronous inputs simultaneously without interrupts. The sequencer 130 is sequential and deterministic to approximately ten microsecond resolution.

Abstract: A system LSI comprising: a processor which processes confidential data; a first on-chip bus which is connected to the processor; a working memory which saves the confidential data processed by the processor; and a memory interface circuit which is connected between the first on-chip bus and the working memory, and through which data is transferred between the working memory and the first on-chip bus under control of the processor.

Abstract: This document relates to apparatus and methods to store and retrieve trace information in on-chip system memory of microcontrollers. A microcontroller comprises a microprocessor and a memory device accessible through a data bus and an address bus coupled to the microprocessor. The microcontroller includes on-chip debug logic coupled to the microprocessor. Trace data can be retrieved from system memory using a debug port of the debug logic. A system in accordance with the present invention will lower the cost of implementation of trace features in microcontrollers, and strongly reduce the cost of supporting such features in debug tools.

Abstract: An interface unit is provided for selectively testing a plurality of processor/cores. The interface unit includes an interface test access port (TAP) unit operable to receive test commands, and a logic unit coupled to the interface TAP unit and operable to generate control signals based on the received test commands to selectively generate a configuration of TAP units comprised in the plurality of processor/cores to receive test signals.

Abstract: A test circuit for testing a command signal at a package level in a semiconductor device includes: a logic level determining unit for determining logic levels of a plurality of command flag signals in response to a plurality of internal command signals in a test mode; a storage unit for storing the plurality of command flag signals in response to a store control signal and outputting the plurality of command flag signals in series in response to an output control signal; and an output unit for driving an output signal of the storage unit to a data pad.

Abstract: An apparatus and method for a processor-memory unit for use in system-in-package (SiP) and system-in-package (SiP) integrated circuit devices. The apparatus includes a processing module, a memory module and a programmable system module. The programmable system module is configured to function as an interface between the memory module and the processing module, or as an interface between the memory module and a testing device. The invention facilitates integration and testing of processor-memory units including functional components having different communication protocols.

Abstract: According to the present invention, the outputs of the last scanning flip-flop circuits 12 included in scan chains 111 are compiled and compressed in an output compression circuit 112, a sum of the outputs from the scan chains 111 and an expected value written in an expected value storage circuit 113 from the outside are compared with each other in an expected value decision circuit 114, the sum being outputted from the output compression circuit 112, a pass/fail decision result obtained by the comparison can be outputted from an output terminal 116 of the expected value decision circuit 114 to the outside, and the decision result can be stored regardless of the reset of a system.

Abstract: The present invention provides a method and system for routing a group of scan chains to a group of processor resources in a semiconductor chip. The group of processor resources is arranged in rows or columns. The group of processor resources in each row or column is connected through a plurality of scan chains. The first processor resource in each row or column is connected to input scan-chain pins, and the last processor resource in each row or column is connected to output scan-chain pins. A test-pattern generator, generating test signals, sends the test signals to the group of processor resources by using the group of scan chains within the semiconductor chip. The responses of the processor resources corresponding to the test signals are analyzed to detect and locate any error in the manufacture of the semiconductor chip.

Abstract: A circuit and method for providing a power-on self test capability for peripheral devices that allows direct testing of address-line data. The preferred embodiment includes a multiplexer circuit that allows the read address line outputs of a microprocessor to be directly returned to the data inputs of the microprocessor, thus providing a direct verification of the integrity of the read-address connection.

Abstract: Briefly, descriptions of embodiments in accordance with the invention, a test access port for a multi-core processor.

Abstract: Apparatus and methods are provided for debugging an integrated circuit. Local multiplexer circuits are provided near first and second circuit blocks in the integrated circuit. Each multiplexer circuit includes input nodes, a control node, and an output node. A first input node of the first multiplexer circuit is coupled to an internal node of the first circuit block, a first input node of the second multiplexer circuit is coupled to an internal node of the second circuit block, second input nodes of the first and second multiplexer circuits are coupled to logical 0, and the control signal nodes of the first and second multiplexer circuits are coupled to a control signal. An OR gate is provided that includes an input node coupled to the output node of the first multiplexer circuit, another input node coupled to the output node of the second multiplexer circuit, and an output node.

Abstract: A method, apparatus, and computer instructions for self-diagnosing remote I/O enclosures with enhanced FRU callouts. when a failure is detected on a RIO drawer, a data processing system uses the bulk power controller to provide an alternate path, rather than using the existing RIO links, to access registers on the I/O drawers. The system logs onto the bulk power controller, which provides a communications path between the data processing system and the RIO drawer. The communications path allows the data processing system to read all of the registers on the I/O drawer. The register information in the I/O drawer is then analyzed to diagnose the I/O failure. Based on the register information, the data processing system identifies a field replacement unit to repair the I/O failure.

Abstract: A pulse transmission technique is used for wireless communication between a microcomputer (13) having a debugging support circuit (17) and a debugger (13). The pulse transmission technique is based on magnetic field coupling between a first coil (14) provided for the microcomputer and a second coil (8) coupled with the debugger. During an initialization operation, the microcomputer performs a process of configuring a communication condition of the wireless communication to perform the wireless communication. The microcomputer awaits control from the debugger when the microcomputer establishes communication with the debugger. The debugger awaits establishment of the communication and proceeds to control of the microcomputer in accordance with the wireless communication. It is possible to provide contactless interface for system debugging without the need for a large antenna or a large-scale circuit for modulation and demodulation.

Abstract: A multicore processor has a plurality of processor cores each of which is configured to execute a computation, a plurality of reconfigurable devices dynamically reconfigurable in circuit configuration on the basis of circuit information, and a lock state storage section configured to store lock information indicating whether or not each of the reconfigurable devices is locked. The multicore processor also has a plurality of reconfigurable control sections each of which is configured to load circuit information for a computation to be executed into one of the reconfigurable devices not locked, by referring to the lock information, performs execution of the computation with the reconfigurable device and execution of the computation with the one of the processor cores in parallel with each other, and perform control so that results of execution of the computation completed faster are adopted.

Abstract: A method of sending data from a memory to a host, and a data storage device that uses the method. The controller of the data storage device sends the data directly from the memory to a buffer in an interface to the host while simultaneously checking the data for errors. If sufficiently few errors are found, the data are sent from the buffer to the host. Otherwise, the data are corrected, the data in the buffer are replaced with the corrected data, and the corrected data are written to the memory. If the data are stored by segments, the simultaneous sending and checking is effected segmentwise. When a bad segment is found, an error flag is set. When all the data have been sent and checked, or when the buffer is full, if the error flag has not been set, the data in the buffer are sent to the host.

Abstract: A method for dynamically broadcasting configuration information to controllers connected in a scan topology in a target system is provided in which a selection event followed by the configuration information is received from a signal line at each of the controllers, wherein the plurality of controllers are connected in parallel to the signal line and the configuration information is stored within each controller that matches a selection criteria following the selection event when the selection event initiates a selection sequence.

Abstract: A method and apparatus for conveying test response data from an integrated circuit to ATE via a plesiochronous interconnect. The integrated circuit includes a core logic unit and a first transmitter coupled thereto by a first data path. In a normal mode, data conveyed from the core logic unit to the transmitter may be transmitted plesiochronously over an interconnect coupled to the transmitter output. The integrated circuit further includes a second data path coupled between the core logic unit and the interconnect. During a test mode, test response data may be conveyed from the core logic unit to ATE via the second data path and the interconnect, wherein the test response data is synchronously transmitted over the interconnect.

Abstract: Techniques for the design and use of a digital signal processor, including (but not limited to) for processing transmissions in a communications (e.g., CDMA) system. A method and system control transferring data between debugging registers and digital signal processor processes in association with a power transition sequence of the digital signal processor. In a digital signal processor, debugging registers associate with the core processor process and the debugging process. Control bits control transferring data among the debugging registers, the core processor process and the debugging process. The control bit prevents transferring data among the debugging registers, the core processor process and the debugging process in the event of a power transition sequence. Control bits also prevent a power transition sequence of the digital signal processor in the event of transferring data among the debugging registers and the core processor process or the debugging process.

Abstract: Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The received scan frames contain stimulus data to be applied to circuitry within the device to be tested, a command for enabling a test control operation, and a frame marker bit to indicate the end of the scan frame pattern. The inputting of scan frames can occur continuously and simultaneous with a commanded test control operation.

Abstract: A memory test circuit includes a counter circuit that outputs a set signal that is set to the first set value or the second set value alternately in a cycle of the clock signal, an OR circuit that calculates a logical sum of the set signal and the input signal each time when the set signal is output from the counter circuit and outputs a control signal indicating the logical sum of the set signal and the input signal, and a test pattern generation circuit that generates the test pattern for causing the memory to operate in each first cycle if a set value of the control signal is the first set value, or generates the test pattern for causing the memory to operate in each second cycle if the set value of the control signal is the second set value.

Abstract: A test device for the SoC test architecture is disclosed. The device comprises plural test groups connected in parallel and a test control flag register within a controller. Each test group comprises single or plural core circuits. The test control flag register enables a set of test signals to input in one of the test groups, testing the core circuits in the test group.

Abstract: According to some embodiments, a first bus may be monitored, the first bus being to exchange data between a first processing system and a second processing system. A second bus may also be monitored, the second bus being to exchange data between the second processing system and a third processing system. Responsive to the monitoring of at least one of the first or second buses, execution of applications, executing on at least two of the processing units, may be interrupted.

Abstract: A method according to one embodiment may include communicating, by a far end device with a near end device, using a Serial ATA (SATA) communications protocol; receiving, by the far end device, a SATA signal sequence having two bits, the state of which define at least one loopback mode; defining, by the far end device, a reserved and/or error state if both of the bits are set; and processing, by the far end device, the two bits together to determine if the two bits are in a state that defines at least one loopback mode or if the two bits are set. Of course, many alternatives, variations, and modifications are possible without departing from this embodiment.

Abstract: To enable measurement of a suspension position and a suspension period of the reference clock of a microcomputer to be inspected, based on the information stored into a clock information register section, by acquiring output data output from the microcomputer; preserving the acquired output data into a data bank section by use of the reference clock being output from the microcomputer together with the output data; discriminating the suspension of the reference clock by a clock operation discrimination section at sampling intervals of the output data; and writing and preserving the discrimination result into the clock information register section by a register control section.

Abstract: An interface test can be performed by, for example, only a self apparatus when interface operation specifications are different between the self apparatus and an original connection partner apparatus. An LSI has a plurality of interfaces (IFs) for transmission/reception of data with an external device, and the LSI includes an emulation control unit for allowing one of the two of the plurality of IFs to perform an operation of emulating an IF of a connection partner device having operation specifications different from those of the LSI, when two IFs are connected to each other via a transmission line.

Abstract: A system and method for enabling programmatic analysis of a graphical program, where the programmatic analysis includes user-defined tests. A software program referred to herein as a graphical program analyzer may be operable to programmatically analyze a graphical program by programmatically performing various tests on the graphical program. Some of the tests may be built in to the graphical program analyzer. The graphical program analyzer may also allow a user to add various user-defined tests. Adding user-defined tests to the graphical program analyzer may allow the functionality of the graphical program analyzer to be extended. When programmatically analyzing a graphical program, the graphical program analyzer may be operable to perform the user-defined tests in addition to the built-in tests.

Abstract: A method and apparatus for conveying test stimulus data from an ATE system to an integrated circuit (IC) via a plesiochronous interconnect. The IC includes a core logic unit and a first receiver coupled to the core logic unit by a first data path. The first receiver includes an input having an interconnect coupled thereto. In a normal mode of operation, the first receiver is configured to receive data transmitted plesiochronously over the interconnect and to convey the data, via the first data path, to the core logic unit. The integrated circuit also includes a second data path coupled between the core logic unit and the interconnect. In a test mode, the core logic unit is configured to receive test stimulus data conveyed synchronously over the second data path, wherein the test stimulus data is received by the IC from the ATE via the interconnect.

Abstract: A scannable flip-flop and method are provided. The flip-flop includes a clock input, a normal data input, a test data input, a normal data output and a scan data output. The flip-flop has a normal operating mode during which the normal data output is enabled and the scan data output disabled and has a scan-shift mode during which the normal data output is disabled and the scan data output is enabled.

Abstract: A device is disclosed for testing the function of a display port. The device includes a display port transmitting part, a field programmable gate array, and a memory. The display port transmitting part transmits connecting signals to a display port timing controller mounted on a display panel. The field programmable gate array applies a test signal to the display port timing controller, and controls the connecting signals applied from the display port transmitting part to the display port timing controller. The memory has software that determines acceptance or rejection of the display port function based on data output from the display port timing controller in response to the connecting signals or the test signal.

Abstract: A system for debugging a device under test may include a processor register with a program count and a debug program register that receives the program count upon execution of an instruction by a processor. In one implementation, a microcontroller under test by a debugger is accessed using a serial interface, such as a JTAG interface. The interface can communicate directly with a debug register to retrieve program count values, both when the microcontroller is halted and when it is executing instructions. The polling interval to retrieve the program count values may be adjusted by a user of the debugger based on considerations such as bandwidth and accuracy. The microcontroller may transmit the program count value to the debug register from a processing register that is not accessible to the debugger.

Abstract: A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

Abstract: Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.

Abstract: There is implemented a semiconductor memory tester capable of efficiently conducting a test on a fast memory by programming according to parameters of a device without being attended by complex program handling. The semiconductor memory tester for determining pass/fail on a memory device under test is characterized in comprising a measurement division for comparing an output from the memory device under test with an expected value at timing on the basis of a clock outputted by the memory device under test.

Abstract: A system and method of providing error detection and correction capability in an IC using redundant logic cells and an embedded field programmable gate array (FPGA). The system and method provide error correction (EC) to enable a defective logic function implemented within an IC chip design to be replaced, wherein at least one embedded FPGA is provided in the IC chip to perform a logic function. If a defective logic function is identified in the IC design, the embedded FPGA is programmed to correctly perform the defective logic function. All inputs in an input cone of logic of the defective logic function are identified and are directed into the embedded FPGA, such that the embedded FPGA performs the logic function of the defective logic function.

Abstract: A DGP, upon detecting the occurrence of a fault in an IOP that controls a CH, causes another IOP that can control the CH to control the CH and reports to an EPU the occurrence of the fault in the CH and the recovery from the fault. The DGP stores information in a CH configuration table indicating that the other IOP is controlling the CH. Upon receiving the reports of the occurrence of the fault in the CH and the recovery, the EPU refers to the CH configuration table, verifies that the other IOP is controlling the CH, and provides data transfer instructions to the other IOP.

Abstract: In a high-speed serial link, an eye finder diagnostic circuit has improved performance by being on-chip with the existing capture latch(es) of a receive equalizer. The eye finder circuit employs an additional capture latch with its input tied to the same input node as the existing capture latch(es) of a receive equalizer. The additional capture latch has a clock input and reference voltage input. The clock input is adjusted through a phase interpolator (or variable delay line) while the reference voltage input is adjusted by a voltage generator. A digital post processing circuit then compares the output of the additional capture latch with the output of the other existing capture latch(es), in order to determine the receive eye opening. The horizontal eye opening is measured by changing the phase of the additional capture latch through the phase interpolator, while the vertical eye opening is measured by changing the reference voltage of the voltage generator of the additional capture latch.

Abstract: A method, device, and system including built-in self tests for a communication bus device is disclosed. In one form, a method of testing a device operable to be coupled to a communication port an information handling system includes accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system. The method can also include detecting a self-test descriptor associated with the configuration descriptor and testing a portion of the first device using test information associated with the self-test descriptor. The device and system can include logic to perform the methods described herein.

Abstract: To provide a debugging system, debugging method, and a semiconductor integrated circuit device capable of collecting debug-target information with accuracy and improving debug efficiency. A semiconductor integrated circuit device according to an embodiment of the present invention includes: subsystems; a break detecting unit detecting that a program execution of a CPU core in one subsystem satisfies a predetermined break condition; and a break selecting unit stopping operations of one selected from the subsystems in accordance with the detection result of the break detecting unit.

Abstract: The technology disclosed relates to real-time collection and flexible reporting of test data. In particular, it is useful when collecting packet counts during tests of network devices that simulate thousands or even millions of data sessions conducted through a device under test (“DUT”).

Abstract: The input for a test generator is a plurality of test templates, each of which typically aims at covering a specific verification task. Test templates direct the production of distinct transactions, which are the atomic functional building blocks of the design-under-verification. Test templates directed to different hardware functions of the scenario are dynamically interleaved. In this way several transactions are combined together in complex statements in order to achieve a complex test scenario. The transactions are submitted to the test generator, which generates test cases, in which the different hardware functions of the scenario are exercised in combinations. Variation among the test cases is achieved through a large number of random decisions made during the generation process.

Abstract: Methods and apparatus are provided for implementing a semiconductor device with a debug core separate from a processor core. The user configurable debug core can be customized to include one or more debug core submodules. Each debug core submodule is generally associated with a particular debug feature such as trace generation, performance counters, or hardware triggers. The debug core can be driven through a variety of interfaces to allow debugging, monitoring, and control of processor operations.

Abstract: A clock control hierarchy is provided that is comprised of synchronous and asynchronous hold request signals that are used to start and stop functional units of a chip. Pervasive logic is provided that uses a synchronous “chip hold” signal and asynchronous latch/functional unit hold signals to individually target functional units and latches that are to remain in a held state once the “chip hold” state is released. With the present invention, a chip hold request is first activated followed by scannable latch and non-scannable latch hold requests being activated to identify which latches will be clocked or not clocked when the chip hold is released. Functional unit hold signals are activated to place certain ones of the functional units of the chip in a hold state. The chip hold request is deactivated and the chip operates with the selected functional units and latches being maintained in a held state.

Abstract: Systems and methods for performing logic built-in-self-tests (LBISTS) in digital circuits. In one embodiment, the operation of LBIST circuitry is suspended at the end of each test cycle so that the bit patterns generated by the functional logic of the device under test can be examined to determine if any errors occurred during the test cycle. Pseudorandom bit patterns are scanned into the scan chains interposed between portions of the functional logic circuit and then propagated through the functional logic. The resulting bit patterns are captured in scan chains following the functional logic and then scanned out of the scan chains. The bit patterns are processed and compared to corresponding data generated by a parallel LBIST system in a device that is known to operate properly. The LBIST test cycles are then halted if there are errors in the generated bit patterns or resumed if there are no errors.

Abstract: A computer implemented method, a data processing system, and a computer usable program code for automatically identifying multiple combinations of operational and non-operational components with a single part number. A non-volatile storage is provided on a part, wherein the part includes a plurality of sub-components. Unavailable sub-components in the plurality of sub-components are identified based on a series of testing to form identified unavailable sub-components. Information of the identified unavailable sub-components is stored into the non-volatile storage.

Abstract: A system, apparatus, computer program product and method of performing operational validation on a system are provided. The system may include a CPU with a cache, a communications network, and a plurality of devices exchanging data during a test. When the test is ready to be performed, the CPU may set up a pool of buffers in the cache. The pool of buffers may generally have a set of locations corresponding to locations in an actual destination buffer and a set of locations corresponding to locations in an actual source buffer. During the performance of the test, data is exchanged over the communications network to and from the source and destination buffers. Snooping logic in the cache may snoop data on the communications network. The data snooped may be entered in appropriate locations in the pool of buffers. This allows the CPU to perform operational validation by using cached data instead of data that is in the actual source and destination buffers.