Abstract: A system is described having a JTAG diagnostic unit and a serial wire diagnostic unit. A watcher unit is connected to a data connection shared between the diagnostic units. Special patterns detected upon the shared data connection serve to switch between diagnostic modes with respective ones of the diagnostic units becoming active.

Abstract: The present invention provides a microelectronic device with a circuit core and a boundary scan test interface sharing a number of pre-selected pins. In the mode of a boundary scan test, the boundary scan test interface manipulates the input and output of the test signal through the shared pins. Pins necessary for the microelectronic device are therefore reduced.

Abstract: Apparatus, systems, and methods disclosed herein may cause an event trigger state machine associated with a programmable on-chip logic analyzer (POCLA) to transition to a programmable state at a programmable number of occurrences of a programmable set of events associated with a first subset of signals on a first subset of input signal paths. States associated with a second subset of signals on a second subset of input signal paths may be stored at a time relative to a transition to the programmable state if a set of storage criteria have been met. Additional embodiments are disclosed and claimed.

Abstract: An apparatus and method for a processor-memory unit for use in system-in-package (SiP) and system-in-package (SiP) integrated circuit devices. The apparatus includes a processing module, a memory module and a programmable system module. The programmable system module is configured to function as an interface between the memory module and the processing module, or as an interface between the memory module and a testing device. The invention facilitates integration and testing of processor-memory units including functional components having different communication protocols.

Abstract: A built-in self-test (BIST) circuit for testing addressable locations can include a BIST generator (202) that can generate test addresses for testing each addressable location. Defective addresses can be stored in a fault address store (216). An address range selector circuit (230) can limit the range of addresses generated by an address generator (234). Once defective addresses for a first range have been detected, an address range selector circuit (230) can test another range. An entire address range can thus be tested regardless of the depth of a fault address store (216).

Abstract: Various apparatuses, methods and systems for dual JTAG controllers with shared pins disclosed herein. For example, some embodiments provide a boundary scan apparatus having a first boundary scan circuit with a first plurality of control inputs, a second boundary scan circuit with a second plurality of control inputs, and a plurality of boundary scan control signals connected to the first plurality of control inputs on the first boundary scan circuit and to the second plurality of control inputs on the second boundary scan circuit. At least two of the plurality of boundary scan control signals are connected between the first boundary scan circuit and the second boundary scan circuit in a crossover fashion.

Abstract: A scan test circuit for a memory with a first memory cell column, a second memory cell column that replaces a failed column of the first memory cell column, a first switching circuit that connects one of the memory cell columns to a first peripheral circuit disposed at an input side, and a second switching circuit that connects one of the memory cell columns to a second peripheral circuit disposed at an output side, comprises: a test priority control circuit that controls the switching circuits to establish at least two patterns of connections of the memory cell columns to the peripheral circuits; and a test point circuit that includes scan flip-flop circuits employed in a scan test for detecting a delay fault of the peripheral circuits, and is disposed between the memory cell columns and the first switching circuit.

Abstract: An ECU that controls an engine of a vehicle includes a MPU and an IC that monitors the operation of the MPU. The MPU is programmed to execute a verification result check and test selection function for selecting a test for verifying the function of the MPU. The MPU runs the selected test, and transmits a test result indicating the result of the test to the IC. The IC checks whether the test result from the MPU is correct or incorrect, and transmits a verification result to the MPU.

Abstract: A method and a circuit for protecting a digital quantity stored in a microcontroller including a JTAG interface, including the step of making the digital quantity dependent from a value stored in non-volatile fashion in the microcontroller and made inaccessible if signals are present at the input of the JTAG interface.

Abstract: A system for receiving serial messages from a device under test includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

Abstract: A design structure embodied in a machine readable medium for designing, manufacturing, testing and/or enabling a redundant memory element (20) during testing of a memory array (14), and a method of repairing a memory array.

Abstract: A method and corresponding equipment for emulation of a target programmable unit, which has at least one CPU, by means of an external emulation device, which is coupled to the target programmable unit by means of a communication link, comprising: transferring predetermined initialization data through the communication link to the emulation device for initializing the emulation; transferring through the communication link to the emulation device a CPU clock signal and emulation data; emulating the target programmable unit in the external emulation device using the transferred emulation data; ascertaining respective trace data from the emulation in the external emulation device and storing and/or outputting the trace data; deriving respective target integrity-control data and emulation integrity-control data from respective target-internal data and emulation-internal data; and transferring the derived target integrity-control data from the target programmable unit to the external emulation device.

Abstract: A method for implementing at speed bit fail mapping of an embedded memory system having ABIST (Array Built In Self Testing), comprises using a high speed multiplied clock which is a multiple of an external clock of an external tester to sequence ABIST bit fail testing of the embedded memory system. Collect store fail data during ABIST testing of the embedded memory system. Perform a predetermined number of ABIST runs before issuing a bypass order substituting the external clock for the high speed multiplied clock. Use the external clock of the tester to read bit fail data out to the external tester.

Abstract: Electronic apparatus, systems, and methods of operating and constructing the electronic apparatus and/or systems include an embedded processor disposed in a logic chip to direct, among other functions, self-testing of an electronic device structure in conjunction with a pattern buffer disposed in the logic chip, when the electronic device structure is coupled to the logic chip. Additional apparatus, systems, and methods are disclosed.

Abstract: A method, system and computer program product for testing the Design-For-Testability/Design-For-Diagnostics (DFT/DFD) and supporting BIST functions of a custom microcode array. Upon completion of the LSSD Flush and Scan tests, the ABIST program is applied to target the logic associated direct current (DC) and alternating current (AC) faults of ABIST array Design-For-Testability/Design-For-Diagnostics DFT/DFD functions that support the microcode array. A LSSD test of the DFT functional combinational logic is performed by applying generated LSSD deterministic test patterns targeting the ABIST design-for-test faults to determine if the DFT supporting the microcode array is functioning correctly. Additional tests may be terminated upon resulting failure of the applied ABIST DFT circuitry surrounding the arrays.

Abstract: A test architecture and method of testing are disclosed to allow multiple scan controllers, which control different scan chain designs in multiple logic blocks, to share a test access mechanism. During test mode, the test architecture is configured to decouple clock sources of the test access mechanism, the scan controllers and the scan chains.

Abstract: A semiconductor device includes a volatile memory for storing a first instruction group, a first processing unit for executing the first instruction group, a nonvolatile memory for storing a second instruction group, a second processing unit for executing a second instruction group, a control signal output unit for outputting a control signal to specify permission or prohibition of executing a debugging function to the first processing unit, and a debug control unit for controlling execution of the debugging function by the first processing unit based on the control signal.

Abstract: A system on chip (SOC) may include function blocks, and a scan chain in each of the function blocks, the scan chains being adapted to conduct scan test operations in sync with a respective one of a plurality of clock signals having a different phase relative to each other, wherein during an isolation mode, the scan chains test combination circuits of the function blocks, and during an interface mode, the scan chains of adjacent ones of the function blocks test combination circuits between the adjacent ones of the function blocks.

Abstract: A data processing system 2 has a memory 6 with a memory address space incorporating a plurality of domains, each domain comprising a set of memory addresses as defined by programmable domain specifying data 32. A processor core 8 executes program instructions fetched from the memory 6. Diagnostic control circuitry 20 is responsive to the domain in which a currently executing program instruction is stored to selectively disable diagnostic circuitry 14, 16, 18 used to perform diagnostic functions upon the data processing system 2. The diagnostic control circuitry 20 is responsive to diagnostic-capability-defining data 36 associated with the domains to indicate which diagnostic circuitry 14, 16, 18 is enabled for which domains.

Abstract: A method for debugging a read only memory (ROM) in a wireless target device is disclosed. A wireless communication link is established between the target device and a host computer. A debug mode change command is received from the host computer by the application program running on the target device via a wireless communication interface in the target device. The wireless communication interface is parsed with the monitor program. A debug instruction is received by the monitor program from a debugger in the host computer where the debug instruction includes an entry address and a jump address. The application program jumps to the received jump address upon reaching the entry address location. An acknowledgement is transmitted from the target device to the debugger in the host computer, and, in response to the acknowledgement, a second debug instruction is received from the debugger in the host computer.

Abstract: A process for a prognosis of faults in electronic circuits identifies parameters of a circuit under test. An upper and a lower limit is determined for one or more components of the circuit under test. A population of faulty and non-faulty circuits are generated for the circuit under test, and feature vectors are generated for each faulty and non-faulty circuit. The feature vectors are stored in a fault dictionary, and a feature vector for an implementation of the circuit under test in a field operation is generated. The feature vector for the implementation of the circuit under test in the field operation is compared to the feature vectors in the fault dictionary.

Abstract: An apparatus and computer program product are disclosed for, in a processor, concurrently sharing a memory controller among a tracing process and non-tracing processes using a programmable variable number of shared memory write buffers. A hardware trace facility captures hardware trace data in a processor. The hardware trace facility is included within the processor. The hardware trace data is transmitted to a system memory utilizing a system bus. The system memory is included within the system. The system bus is capable of being utilized by processing units included in the processing node while the hardware trace data is being transmitted to the system bus. Part of system memory is utilized to store the trace data. The system memory is capable of being accessed by processing units in the processing node other than the hardware trace facility while part of the system memory is being utilized to store the trace data.

Abstract: A method for testing at least two arithmetic units installed in a control unit includes: loading of first test data for testing a first arithmetic unit; saving the loaded first test data in a second memory unit of a second arithmetic unit; switching the first arithmetic unit to a test mode, in which a first scan chain of the first arithmetic unit is accessible; reading the first test data from the second memory unit; shifting the first test data which have been read through the first scan chain of the first arithmetic unit switched to the test mode for providing test result data for the first arithmetic unit; checking the provided test result data for plausibility for providing a test result for the first arithmetic unit.

Abstract: ASICs or like fabrication-preprogrammed hardware provide controlled power and recovery signals to a computing system that is made up of commercial, off-the-shelf components—and that has its own conventional hardware and software fault-protection systems, but these are vulnerable to failure due to external and internal events, bugs, human malice and operator error. The computing system preferably includes processors and programming that are diverse in design and source. The hardware infrastructure uses triple modular redundancy to test itself as well as the computing system, and to remove failed elements—powering up and loading data into spares. The hardware is very simplified in design and programs, so that bugs can be thoroughly rooted out. Communications between the protected system and the hardware are protected by very simple circuits with duplex redundancy.

Abstract: A memory module including a plurality of memory banks, a memory control unit, and a built-in self-test (BIST) control unit is provided. The memory banks store data. The memory control unit accesses the data in accordance with a system command. The BIST control unit generates a BIST command to the memory control unit when a BIST function is enabled in the memory module. While the system command accessing the data in a specific memory bank exists, the memory command control unit has the priority to execute the system command instead of the BIST command testing the specific memory bank. Memory reliability of a system including the memory module is enhanced without reducing the system effectiveness.

Abstract: Provided are a method and system for activating a design test mode in a graphics card having multiple execution units. A design test mode is activated in a graphics module comprising multiple execution units coupled to a cache on a bus. The bus is configured to return test instructions from the cache to the execution units in response to a request from one execution unit for the test instructions from the cache in the design test mode. The execution units execute the test instructions during the design test mode. Interrupts are prevented during the design test mode.

Abstract: A disk order examining system for a dual-controller redundant storage device and method thereof, implementing in a dual-controller redundant device with a master controller and a slave controller. Examining if the linkage orders of the disks to the master controller are the same as those of the slave controller by sequentially writing random values into each disk of a disk concatenation, and then reading out to discriminate their sequence.

Abstract: A probing system for an integrated circuit device, which transmits a testing data/signal between an automatic test equipment (ATE) and an integrated circuit device, is disclosed. The probing system includes a test head having a first transceiving module. There is a test station having a test unit coupled to the test head to perform a test operation. A communication module has a second transceiving module configured to exchange data with the first transceiving module in a wireless manner. There is an integrated circuit device having a core circuit being tested, and a test module having a self-test circuit coupled to the core circuit and the communication module for performing the core circuit self-testing.

Abstract: A test controller switches the operation of output stages in an integrated circuit between a normal operation mode and a test mode. The output stages are respectively connected to switch elements. A level shifter generates a switch signal for controlling activation and deactivation of the switch elements in accordance with the normal operation mode and the test mode.

Abstract: Systems and methods (“utility”) for providing a computer system with a mechanism to record live data on a continuous basis which may be analyzed subsequent to a fault condition is provided. The utility uses the existing DRAM memory of a computer system as a retentive DRAM (RDRAM) device that may be used to store the data. To accomplish this, software and firmware is provided for continuously refreshing the DRAM memory across resets that are due to fault conditions. Further, non-maskable interrupts (NMI) are used to flag a variety of fault conditions to the computer system. To make the utility platform independent, a standardized power and configuration interface is used to implement a computer system reset that preserves the contents of the RDRAM.

Abstract: A semiconductor device including a logic circuit and a test circuit is provided which comprises: a logic signal terminal that supplies a signal to the logic circuit; a latch circuit that latches a signal based on a synchronization signal from the test circuit; a first selection circuit that supplies an external signal from the logic signal terminal to one of the logic circuit and the latch circuit selectively based on a test mode signal; and a second selection circuit that supplies one of the external signal and a signal from the test circuit selectively to a memory.

Abstract: A system and method for detecting transition delay faults decouples the test enable pins of the clock gating cells from other elements in the circuitry. The test enable pins are controlled during test mode by a unique signal, allowing the tester to independently control the clock gating logic of the circuitry. By being able to ungate the clock, the tester can ensure that the two clock pulses needed to check for transition delay faults will always be present.

Abstract: A System-on-Chip (SOC) integrated circuit (IC) debugging system includes a plurality of SOC ICs connected to a shared debug bus. One of the plurality of SOC ICs is a master SOC IC having a master/slave debug interface. The master/slave debug interface on the master SOC IC is a bidirectional debug interface operable to send and receive debug data between the SOC ICs and an external host system.

Abstract: A memory access device includes logic to switch data from a processor memory bus to a memory bus in a first operational mode, and to switch data from a test bus to the memory bus in a second operational mode, and logic to switch address signals from the processor memory bus to the memory bus in the first operational mode. In the second operational mode the device accepts from the test bus a starting memory address for memory reads and writes, and automatically and independently of the test bus adjusts a memory address for reads and writes during burst memory operations.

Abstract: According to some embodiments, a first bus may be monitored, the first bus being to exchange data between a first processing system and a second processing system. A second bus may also be monitored, the second bus being to exchange data between the second processing system and a third processing system. Responsive to the monitoring of at least one of the first or second buses, execution of applications, executing on at least two of the processing units, may be interrupted.

Abstract: Various embodiments of a test mode signal generating device are disclosed. The device includes first and second test mode signal generating units. The first test mode signal generating unit is configured to receive test address signals to generate a first test mode signal when a first mode conversion signal is enabled. The first test mode signal generating unit is also configured to enable a second mode conversion signal when the test address signals correspond to a first predetermined combination. The second test mode signal generating unit is configured to receive the test address signals to generate a second test mode signal when the second mode conversion signal is enabled. The second test mode signal generating unit is also configured to enable the first mode conversion signal when the test address signals correspond to a second predetermined combination.

Abstract: An interface processes memory redundancy data on an application specific integrated circuit (ASIC) with self-repairing random access memory (RAM) devices. The interface includes a state machine, a counter, and an array of registers. The state machine is coupled to a redundancy chain. The redundancy chain includes coupled redundant elements of respective memory elements on the ASIC. In a shift-in mode, the interface shifts data from each of the elements in the redundancy chain and compresses the data in the array of registers. The interface communicates with a test access port coupled to one or more eFuse devices to store and retrieve the compressed data. In a shift-out mode, the interface decompresses the data stored in the array of registers and shifts the decompressed data to each unit in the redundancy chain. The interface functions absent knowledge of the number, bit size and type of self-repairing RAM devices in the redundancy chain.

Abstract: Proposed are methods and apparatuses for synthesis of a new class of compressors called augmented multimode compactors, capable of achieving a flexible trade-off between compaction ratio, observability, control data volume and diagnostic properties in the presence of a large number of unknown values. The augmented multimode compactors reduce and/or completely avoid the X-masking effect in the compacted test responses. In addition, a requirement for constructing compactors is that any single error in the test response produces a unique erroneous signature within S consecutive shift cycles where the erroneous signature is calculated as a difference between the faulty signature and the fault-free signature.

Abstract: An apparatus comprising a processor and an internal memory. The processor may be configured to test an external memory using (i) a netlist and (ii) a testing program. The internal memory may be configured to store the testing program. The testing program may be downloadable to the internal memory independently from the storing of the netlist.

Abstract: A flash memory device includes a flash memory array, a set of non-volatile redundancy registers, a serial interface, and testing logic coupled to the serial interface, the testing logic configured to accept a set of serial commands from an external tester; erase the array; program the array with a test pattern; read the array and compare the results with expected results to identify errors; determine whether the errors can be repaired by substituting a redundant row or column of the array, and if so, generate redundancy information; and program the redundancy information into the non-volatile redundancy registers.

Abstract: Methods and systems are provided for detecting temporal relationships that are uniquely associated with a selected root cause. The method comprises identifying error codes associated with a root cause, wherein each error code comprises a plurality of event indicators and temporal data describing when the event indicator was generated, analyzing each of the error codes to detect a combination of event indicators that is associated with error codes corresponding to the selected root cause and to a non-selected root cause, and detecting a temporal relationship involving the combination of event indicators, wherein the temporal relationship is uniquely associated with error codes corresponding to the selected root cause.

Abstract: The Advanced Logic System (ALS) is a complete control system architecture, based on a hardware platform rather than a software-based microprocessor system. It is significantly different from other PLC-type control system architectures, by implementing a FPGA in the central control unit. Standard FPGA logic circuits are used rather than a software-based microprocessor which eliminate problems with software based microprocessor systems, such as software common-mode failures. It provides a highly reliable system suitable for safety critical control systems, including nuclear plant protection systems. The system samples process inputs, provides for digital bus communications, applies a control logic function, and provides for controlled outputs. The architecture incorporates advanced features such as diagnostics, testability, and redundancy on multiple levels. It additionally provides significant improvements in failure detection, isolation, and mitigation for the highest level of integrity and reliability.

Abstract: A system and method for tracing acceleration in an embedded device. Various embedded devices that generate debug trace output for which the usage of the processor can benefit from optimization include mobile phones, TV set-top-boxes, and networking equipment. Tracing acceleration is accomplished using a logic unit that is implemented in hardware, which thereby enables the processing of tracing data to be handled in parallel to the operation of the processor.

Abstract: In a circuit board on which a plurality of CPUs are mounted, the CPUs comprises: monitor units for outputting task statuses of the respective CPUs; and a diagnosis circuit connected to the plurality of CPUs, comparing and judging combinations of the task statuses of the plurality of CPUs based on information on task statuses outputted from the monitor units, and detecting false operations and failures of the circuit board.

Abstract: For a control apparatus to be boundary scan testable even when running, including processor cores in an operator to be capable of self-repairing a troubling part, an operator (2) has processor cores (2a, 2b) connected to a boundary scan bus (12), and adapted to mutually diagnose opponent processor cores for troubles, by boundary scan testing each other in a time-dividing manner.

Abstract: A method, device, and system including built-in self tests for a communication bus device is disclosed. In one form, a method of testing a device operable to be coupled to a communication port an information handling system includes accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system. The method can also include detecting a self-test descriptor associated with the configuration descriptor and testing a portion of the first device using test information associated with the self-test descriptor. The device and system can include logic to perform the methods described herein.

Abstract: A NAS device comprises a user control and storage in which at least one of an operating system and system firmware is stored. Logic is also provided that is coupled to the user control and the storage. The logic causes a recovery to be performed of the operating system or system firmware upon user activation of the user control. The NAS device does not comprise any of a keyboard, mouse, trackball, and computer monitor.

Abstract: A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.

Abstract: An identification (ID) process comprises in each of a plurality of bit times, a debug test system asserting a control signal at a predefined state to a plurality of target systems, and each target system, having a bit pattern and the bit patterns being different among the target systems, outputting a bit from its bit pattern on the control signal. The process further comprises each target system comparing the resulting state of the control signal to that target system's output bit. If the target system's output bit differs from the resulting control signal state, the target system ceases participating in the ID process or, if the target system's output bit matches the resulting control signal state, the target system continues to participate in the ID process.

Abstract: A scan element with self scan-mode toggle is described. In an example, the scan element is configured to automatically switch between a capture mode and a scan mode. In the capture mode, data is captured from logic under test. In the scan mode, the captured data is scanned out for testing. The scan elements each include a shift register that serves a dual purpose of providing control for determining when the scan element is to switch from the capture mode and the scan mode, as well as providing a location to store captured data.