Abstract: Provided is a test apparatus that tests a device under test having a plurality of output terminals. The test apparatus comprises an executing section that executes a test command sequence for testing the device under test; a storage section that stores a plurality of pieces of setting data designating one or more output terminals among the plurality of output terminals; a detecting section that detects whether a value of an output signal from an output terminal designated by one of the pieces of setting data matches an expected value; and a selecting section that selects different pieces of setting data in the storage section when at least two detection commands, which change execution sequencing of the test command sequence according to the detection results of the detecting section, are executed, and supplies the selected pieces of setting data to the detecting section.

Abstract: A system includes at least one monitored device collect data detect and detect an error in the data, a central server, and at least one local server communicatively coupled to the monitored device and the central server. The local server is configured to receive the data and an indication of the error detected from the monitored device, determine a solution for use in resolving the error, transmit instructions to perform the solution to the monitored device, and transmit the error and the solution to the central server for storage.

Abstract: A method of sending programming and debug commands, comprises loading control instructions on a processor from an attached tangible, non-transitory computer-readable medium, copying the contents of a program image file by the processor from the computer-readable medium across a bus to a programmable device on the same card as the processor, signaling the programmable device to send an instruction to a configurable logic device (CLD) on the same card as the processor via a debug channel.

Abstract: A semiconductor memory may be provided with a built-in test mode that is accessible through a password protection scheme. This enables access to a built-in test mode after manufacturing, if desired. At the same time, the password protection prevents use of the built-in test mode to bypass security features of the memory.

Abstract: Techniques and mechanisms for evaluating I/O buffer circuits. In an embodiment, test rounds are performed for a device including the I/O buffer circuits, each of the test rounds comprising a respective loop-back test for each of the I/O buffer circuits. Each of the test rounds corresponds to a different respective delay between a transmit clock signal and a receive clock signal. In another embodiment, a first test round indicates a failure condition for at least one I/O buffer circuit and a second test round indicates the failure condition for each of the I/O buffer circuits. Evaluation of the I/O buffer circuits determines whether the device satisfies a test condition, where the determining is based on a difference between the delay corresponding to the first test round and the delay corresponding to the second test round.

Abstract: A method of testing devices under test (DUTs) and testing system are disclosed. The method comprises generating at least one control signal associated with a test pattern structure received from a testing system. The method further comprises selecting M1 number of ports from M number of I/O ports in the DUT to receive scan input corresponding to the test pattern structure based on the control signal, selecting M2 number of ports from the M number of I/O ports to provide scan output based on the control signal, wherein each of M1 and M2 is a number selected from 0 to M, and wherein a sum of M1 and M2 is less than or equal to M. Thereafter, the method comprises performing a scan testing of the DUT based on the scan input provided to the M1 number of ports and receiving the scan output from the M2 number of ports.

Abstract: A system and method for the execution of a program comprises a user-defined sequence of standard hardware and analysis module commands of an instrument, in the context of a tester comprising a plurality of VSAs and VSGs, or other hardware measurement modules types, where the coordination of command execution and resource availability is built into the system as an inherent part of its overall architecture. As such, the commands are the same as those ordinarily executed in piecemeal fashion, but are now automatically and sequentially executed in an atomic and deterministic manner through the coordinated interaction of embodiments of the invention.

Abstract: A data processor having a plurality of data processing cores configured to disable cores found defective by a self-test.

Abstract: A memory system includes a nonvolatile memory device and a memory controller configured to control the nonvolatile memory device and configured to provide the nonvolatile memory device with error flag information including error location information of an error of data read from the nonvolatile memory device.

Abstract: A method for testing a packet data signal transceiver via its packet data signal interface. The packet data signal interface is used to convey test packet data signals from the test equipment to the DUT, and response packet data signals responsive to such test packet data signals from the DUT to the test equipment.

Abstract: A method of testing a circuit includes halting a flow of normal data through the circuit, running test data through the circuit while subjecting the circuit to a stress condition, and determining whether a hard error exists in the circuit based on the running of the test data.

Abstract: Systems and methods for testing non-volatile storage devices are disclosed that provide functionality to control when testing of the non-volatile storage device is performed. In one embodiment, information stored in persistent memory indicates whether testing is enabled or disabled. For example, the testing information may indicate that testing is to be performed upon a first initialization of a non-volatile storage device, but not in connection with subsequent power-up events. Furthermore, functionality is disclosed for re-running and/or bypassing testing of the non-volatile storage device.

Abstract: A chip with a built-in self-test (BIST) component capable of testing the linearity of an ADC is described herein. The BIST component uses hardware registers to facilitate a sliding histogram technique to save space on the chip. A subset of detected digital codes are analyzed, and DNL and INL calculations are performed by a controller to determine whether any of the digital codes in the subset exceed maximum or minimum DNL and INL thresholds. New digital codes being detected by the ADC are added to the subset as lower-value digital codes are pushed out of the subset, maintaining the same number of digital codes being analyzed as the subset moves from lower codes detected during lower voltages to higher codes detected at higher voltages. A synchronizer and pointer ensure that the subset moves through the digital codes at the same rate as the analog input ramp source.

Abstract: The present invention is directed to an automated high voltage (HV) defibrillator tester system that is able to asynchronously test a plurality of devices (e.g. defibrillators etc.). The HV defibrillator tester system includes a first field programmable gate array (FPGA) connected to a set of tester modules. Each tester module of tester modules is individually associated with a single communication port of the first FPGA.

Abstract: A self-test module for use in an electronic device includes a test controller and a memory. The memory is configured to receive test vectors from the test controller. A comparator is configured to receive the test data from the memory via an output data path. A strobing buffer is located in the output data path between an output from the memory and an input to the comparator. The strobing buffer is configured to selectively enable the test vectors to propagate from the memory output to the comparator input.

Abstract: System and method for testing a radio frequency (RF) device under test (DUT) communicating using multiple radio access technologies (RATs). Single data signal sequences having characteristics of multiple RATs as prescribed by signal standards are exchanged between a tester and DUT. The tester and DUT process received signal sequences substantially in parallel with their reception. A pattern of contemporaneous signal sequence reception and processing continues for as many RATs as the DUT is capable of supporting.

Abstract: An apparatus is provided that comprises a test circuit; a first receiver unit arranged to receive test commands and to provide the test commands to the test circuit; a power supply unit arranged to supply power to the test circuit and to the first receiver unit; a second receiver unit arranged to receive power commands. The second receiver is arranged to control the operation of the power supply unit in response to the power commands received by the second receiver unit.

Abstract: A system and method for checking a ground via of control chips of a printed circuit board (PCB) provides a graphical user interface (GUI) displaying a layout of the PCB. The control chip has a plurality of ground pins. The computer searches for signal path routing of each ground pin and ground vias along each signal path routing of each ground pin. If there are any ground vias having the same absolute coordinates, the computer determines that the ground vias are shared by more than one ground pin.

Abstract: Exemplary embodiments include a sequential and concurrent status detection and evaluation method for multiple processor cores, including receiving data from a plurality of processor cores, for each of the plurality of processor cores, simultaneously running a built-in self test to determine if each of the plurality of cores has failed, checking the data for a dominant logic state and recording a subset of the plurality of processor cores that have failed.

Abstract: A debugging system using optical transmission comprises a sending side and a receiving side. The sending side comprises a debugging-data-generation unit, a modulation unit, and an optical-transmission apparatus. The debugging-data-generation unit generates debugging data according to an operation of the sending side. The modulation unit modulates the debugging data to generate a modulation signal. The optical-transmission apparatus coupled to the modulation unit converts the modulation signal into a first light and transmits the first light. The receiving side comprises an optical-receiving apparatus, a demodulation unit and a data storage device. The optical-receiving apparatus receives the first light and converts the first light into the modulation signal. The demodulation unit is coupled to the optical-receiving apparatus and demodulates the modulation signal into the debugging data. The data storage device receives and saves the debugging data.

Abstract: Testing operation of processors setup to operate in different modes. In an embodiment, each tester system includes a processor setup to operate in a corresponding mode. A user sends a test request to a scheduler system indicating the mode of the processor sought to be tested, and the scheduler system forwards the test request to one of the tester systems with a processor setup to test the requested configuration. The scheduler system may maintain configuration information indicating which processors are setup to test which modes of interest, and also status information indicating which tester systems are presently available for testing. The configuration information and status information is used in determining a specific suitable tester system to which a test request is to be forwarded.

Abstract: A test card includes a power interface, a controller, a test interface, and a test point. The test interface includes a power pin, a start pin, and a data signal pin. The power interface is connected to the controller and the power pin, and also connected to an external power to receive a work voltage. The controller transmits a turn-on signal to the start pin. The test point is connected to the data signal pin. When an interface of a motherboard is connected to the test interface, the power pin, the start pin, and the data signal pin are connected to corresponding pins of the interface of the motherboard. The motherboard outputs a data signal to the test point through the motherboard interface and the test interface after the controller receives the turn-on signal.

Abstract: A cloud-based test system is disclosed. The cloud-based test system utilizes several cloud systems for testing. Each cloud system includes several cloud servers for providing a cloud resource to simulate several virtual test machines. The cloud-based test system includes several slave servers and a main server. Each slave server corresponds to one of the cloud systems for controlling the corresponding virtual test machines. The main server receives a test instruction, which is utilized to execute a target test item for a target electrical device, from a client, and generates a test environment condition corresponding to the test instruction. The main server determines the virtual test machines for executing the target test item and the at least one server to control the virtual test machines. The main server transmits the test instruction and the corresponding test environment condition to the server slave servers for testing.

Abstract: A circuitry testing module for testing an external circuit of a Light-Emitting Diode (LED) includes at least one logic unit and a latch circuit. Two input terminals of the at least one logic unit are connected to a first end and a second of the LED correspondingly. The output terminal of the at least one logic unit is connected to the latch circuit. If the external circuit works normally, the logic unit outputs a first logic operating signal to the latch unit, and the latch circuit outputs a first latch signal. If the external circuit does not work normally, the logic unit outputs a second logic operating signal to the latch unit, and the latch circuit outputs a second latch signal.

Abstract: A system for testing an integrated circuit, in which the system includes a deserializer, a frame sync module, and a diagnostic module. The deserializer is external to the integrated circuit and is configured to receive messages in a serial data format, wherein the messages include test results associated with the integrated circuit, and deserialize the messages into data frames. The frame sync module is configured to provide control code based on the data frames, wherein the control code includes, in a digital format, status information associated with the messages deserialized into the data frames. The diagnostic module is configured to generate, based on the control code, diagnostic data associated with states of the integrated circuit.

Abstract: A method for operating a data processing system to generate a test for a device under test (DUT) is disclosed. The method utilizes a model of the DUT that includes a plurality of blocks connected by wires and a set of control inputs. Each block includes a plurality of ports, each port being either active or inactive. Each block is also characterized by a set of constraints that limit which ports are active. The active ports of at least one of the blocks are constrained by one of the control inputs. A test vector having one component for each port of each block and one component for each control input is determined such that each set of constraints for each block is satisfied. The test vector defines a test for the DUT.

Abstract: A test system includes a supervisor unit coupled to a control interface; the control interface coupled to first and second test modules, each test module comprising a first logic module to test macro blocking errors; a second logic module to perform optical character recognition; a third logic module to perform signal to noise ratio measurement; and a fourth logic module to perform random noise measurement; each test module coupled to a device under test, the four logic modules applied to test a menu-driven video decoding device.

Abstract: An apparatus for testing a semiconductor integrated circuit includes a pattern data generating unit configured to generate test pattern data for testing a write operation in a memory of the semiconductor integrated circuit; and a write unit configured to write the test pattern data into a storage area of the semiconductor integrated circuit.

Abstract: A transition minimized differential signaling (TMDS) receiver system including a clock channel, a plurality of data channels, a TMDS decoding unit, and a self-test unit is provided. The clock channel receives, processes and outputs a clock signal. Each data channel receives, processes and outputs a corresponding data signal according to the clock signal. The TMDS decoding unit receives and decodes the processed data signals. The self-test unit receives the clock signal and an external parallel signal, and accordingly, generates a test signal for performing the BIST on the data channels and the TMDS decoding unit. A BIST method adapted for the TMDS receiver system is also provided.

Abstract: Provided is a method for the collection and storage of information related to the operation of a chip module. The disclosed technology provides a chip data collection and storage controller. In one embodiment, a chip module is provided with a stand-alone memory that records information relevant to potential debugging operations. The stand-alone memory is on the same chip module as the chip die but is not part of the chip die. A data bus is provided between the chip module and the memory. In addition, the memory has I/O access so that information can be accessed in the event that the chip module cannot be accessed. Stored information includes, but is not limited to, environmental conditions, performance information, errors, time usage, run time, number of power on cycles, the highest temperature experience by the chip, wafer and x, y data, manufacturing info, FIR errors, and PRSO, SRAM PSRO values.

Abstract: Signature circuits are used during testing of an integrated circuit. Test vectors are applied as inputs to a circuit under test. A signature circuit stores a “signature” for the circuit under test based on a combination of signals from the circuit under test in response to test vectors and a previous stored state of the signature register. The value contained in the signature register at the end of the test is the signature. A fault-free circuit generates a particular signature for the applied test vectors. Faults can be determined by detecting variances from the expected signature. In one embodiment, the signature circuit uses a combination of two error detection codes.

Abstract: An integrated circuit device includes first and second latches (e.g, D-type flip flops) responsive to a clock signal. Each of the first and second latches respectively includes a data input terminal, a scan input terminal, a scan enable terminal and an output terminal. A combinational logic circuit may be provided, which is configured to receive the signal from the output terminal of the first latch and configured to generate a signal at the data input terminal of the second latch. A scan path is also provided, which is responsive to a scan enable signal. The scan path is configured to selectively pass a signal from the output terminal of the first latch to the scan input terminal of the second latch when the scan enable signal is active. A power saving switch is also provided. This switch, which is responsive to the scan enable signal, includes a first current carrying terminal electrically coupled to the scan path.

Abstract: A panel driving circuit that produces a panel test pattern and a method of testing a panel are provided. The driving circuit includes a pattern generation unit and a selection unit. The pattern generation unit responds to a system clock and produces pattern test data and pattern test signals. The selection unit responds to a test signal and selects and outputs either (a) the pattern test data and the pattern test signals that are outputted from the pattern generation unit, or (b) the pattern test data and pattern test signals that are directly applied from the outside. The driving circuit and the method of the panel test generates the panel test data, the horizontal synchronizing signal, the vertical synchronizing signal, and the data activating signal within the driving circuit using a system clock so that the testing of the panel can be carried out without using a separate test device.

Abstract: Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.

Abstract: Various embodiments of the present invention provide systems and methods for evaluating and debugging a data decoder. For example, a data decoder circuit is discussed that includes an input memory, a data decoder operable to decode data from the input memory in one or more iterations, an output memory operable to store decoded data from the data decoder, and a test port operable to provide access to the input memory, the data decoder and the output memory.

Abstract: A system including a frame capture module, a serializer, and a deserializer. The frame capture module is configured to receive, from a device under test, data corresponding to test results, and package the data into first data frames. The serializer is configured serialize the first data frames to form serial messages that include serialized data. The serializer includes i) a first serial link configured to output the serial messages according to a first clock domain, and ii) a second serial link configured to output the serial messages according to a second clock domain. The deserializer is configured to deserialize the serial messages received on the first serial link and the second serial link to form second data frames.

Abstract: In a memory testing method for testing a memory module of a computing device, an operating voltage of the memory module is adjusted to a first voltage or a second voltage. A predetermined data set is written into the memory module after the operating voltage of the memory module is adjusted, and the written data set is read out from the memory module, to accomplish a data writing and reading process of the memory module. A register value that presents how many memory errors have occurred during the data writing and reading process is acquired from an ECC register of the memory module, to determine whether the memory module is stable during the adjusting of the operating voltage according to the register value.

Abstract: An apparatus for use in testing at least a portion of a system under test via a Test Access Port (TAP) is provided. The apparatus includes a memory for storing a set of instructions of a test instruction set architecture and a processor executing the set of instructions of the test instruction set architecture for testing at least a portion of the system under test via the TAP. The set of instructions of the test instruction set architecture includes a first set of instructions including a plurality of instructions of an Instruction Set Architecture (ISA) supported by the processor and a second set of instructions including a plurality of test instructions associated with the TAP. The instructions of the first set of instructions and the instructions of the second set of instructions are integrated to form the set of instructions of the test instruction set architecture.

Abstract: In a radio device such as a receiver or transceiver, a test operation can be performed to determine performance. A received signal can be processed to obtain demodulated samples, which can be provided to a logic to perform a logic operation on the samples to generate a logic output. A storage such as a counter or other mechanism is coupled to the logic to store a count of a number of the logic outputs having an error.

Abstract: Methods for at-speed testing of a memory interface associated with an embedded memory comprise two write operations in succession, two read operations in succession, and a capture operation using scan cells. The write and read operations are performed during a single clock burst, two separate clock bursts in a clock signal, or two separate clock bursts in separate clock signals.

Abstract: A method of recording a temporary defect list on a write-once recording medium, a method of reproducing the temporary defect list, an apparatus for recording and/or reproducing the temporary defect list, and the write-once recording medium. The method of recording a temporary defect list for defect management on a write-once recording medium includes recording the temporary defect list, which is created while data is recorded on the write-once recording medium, in at least one cluster of the write-once recording medium, and verifying if a defect is generated in the at least one cluster. Then, the method includes re-recording data originally recorded in a defective cluster in another cluster, and recording pointer information, which indicates a location of the at least one cluster where the temporary defect list is recorded, on the write-once recording medium.

Abstract: A method and apparatus for controlling driving of a test device that analyzes a sample are provided. The method includes identifying a test device, executing a script containing a plurality of operations to be performed to analyze the sample contained in the test device, wherein the script includes a plurality of operation commands, wherein at least one operation command among the plurality of operation commands includes a conditional statement, and wherein at least one operation command among the plurality of operation commands is designated to be executed according to whether the conditional statement is satisfied.

Abstract: An integrated circuit (“IC”) includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. One such IC also includes circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. Such an IC provides output signals indicative of results of its operations. One such IC operates in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.

Abstract: A system for generating test signals to test characteristics of input-output (IO) cells includes a memory and a processor coupled together through an integrated circuit (IC) chip. The IC chip includes a controller configured to exchange signals between the memory and the processor through IO cells of the IC chip. The IC chip further includes a protocol sequence generator for generating test signals for testing characteristics of the IO cells.

Abstract: An apparatus, system, and method are disclosed for bad block remapping. A bad block identifier module identifies one or more data blocks on a solid-state storage element as bad blocks. A log update module writes at least a location of each bad block identified by the bad block identifier module into each of two or more redundant bad block logs. A bad block mapping module accesses at least one bad block log during a start-up operation to create in memory a bad block map. The bad block map includes a mapping between the bad block locations in the bad block log and a corresponding location of a replacement block for each bad block location. Data is stored in each replacement block instead of the corresponding bad block. The bad block mapping module creates the bad block map using one of a replacement block location and a bad block mapping algorithm.

Abstract: In the system management server, an information processing apparatus that is an event-information acquisition target is registered as a monitored apparatus in configuration information; event information that complies with a rule stored in advance is identified from among a plurality of pieces of event information stored in the system management server; a server apparatus for a network service related to the event information is identified; and a message is displayed which indicates that the cause of the event that occurred in a client information processing apparatus which has generated event information is an event related to the network service, which occurred in the server apparatus.

Abstract: A process for electrically testing electronic devices includes connecting at least one electronic device to an automatic testing apparatus suitable for testing digital circuits, and sending, through the apparatus, control signals for electrically testing the electronic device. The process further includes electrically testing the electronic device through at least one reconfigurable digital interface connected to the apparatus through a dedicated digital communication channel and comprising a limited number of communication or connection lines strictly appointed to the exchange of the testing information. Response messages are sent from the electronic device to the apparatus through the digital communication channel in response to the control signals. The response messages contain mesaurements, failure information, and data.

Abstract: A method and system for reducing switching activity of a spreader network during a scan-load operation is disclosed. According to one embodiment, a spreader network receives a plurality of scan input signals from a tester. A linear feedback shift register of the spread network is updated using the plurality of scan input signals. Each bit of the linear feedback shift register is shifted at each shift cycle for a plurality of shift cycles. The linear feedback shift register outputs a nonlinear gating signal using a first set of outputs and a data value feeding one or more scan chains of the spreader network using a second set of outputs. The pipeline clock of a pipeline element of the scan chains is gated using the nonlinear gating signal, and the data value is fed to the scan chains based on the pipeline clock. The scan chains are fed with updated values at the pipeline stage.

Abstract: A semiconductor die includes interface logic for performing a function on an external device, and a surrogate circuit in communication with the interface logic. The interface logic facilitates testing of the interface logic by attempting to perform the function on the surrogate circuit. The interface logic may be a memory interface, and the surrogate circuit may be a memory circuit that is a smaller and simpler replica of an external memory die. The surrogate circuit allows the interface logic to be tested before the semiconductor die is physically coupled to the external device, for exampled in a three dimensional (3D) integrated circuit (IC).

Abstract: An apparatus for debugging internal signals of integrated circuits is presented. In one embodiment, the apparatus comprises a number of vector registers associated with states of a state machine. A group of registers, associated with a state of the state machine, comprises a mask register an arm register. A comparator compares debug data with contents of the mask register and the arm register to determine a comparison result to be stored in one or more bit positions of the vector register. The apparatus further comprises a triggering logic unit to determine whether or not to trigger a fire event based on the vector registers.