Abstract: An efficient method for selecting a minimal and statistically relevant set of SER sensitive logic devices critical to the SER robustness for a design, through identification by device type, identification nomenclature, connectivity and context. The minimal set of devices comprise the set of fault injection test points using a conventional fault injection test verification environment to establish an SER induced failure rate a logic design. The selection method affords a design independent means to evaluate any design regardless of the origin, source language or documentation by working at the common logic device level “gate-level” netlist format for the design data. The selected set of devices is distilled from the design data by successively filtering the design through a series of heuristic rule-based device identifier computer programs that group and annotate the devices into specific database records.

Abstract: Methods and software for determining one or more boundary conditions for nets in a signal path are disclosed. The method generally includes determining an expected characteristic for at least one net in the signal path and determining a boundary characteristic for that net. Determining a boundary characteristic for the net may include multiplying the expected characteristic by a scaling factor to produce a scaled characteristic for the net, performing timing analysis of the signal path in accordance with the scaled characteristic (e.g., by calculating timing while assuming that the net has the scaled characteristic), determining if the signal path violates a timing constraint when the net has the scaled characteristic, and repeating the determination with a new scaled characteristic if timing is violated. Advantageously, maximum and/or minimum values may be determined for characteristics of signal path nets that still satisfy timing constraints.

Abstract: A computer-readable recording medium stores a design support program that causes a computer to execute a process that includes generating based on a control flow graph conversion result for operation description information concerning a circuit-under-design, a first synthesis result according to which a time length of 1 clock cycle of the circuit-under-design is greater than or equal to a clock period in which the circuit-under-design operates; calculating based on the generated first synthesis result, first circuit scale information indicating a circuit scale of the circuit-under-design; acquiring a second synthesis result that is for the circuit-under-design and conforms to a timing constraint that is based on the control flow graph conversion result; calculating second circuit scale information indicating the circuit scale of the circuit-under-design, based on the generated second synthesis result; and outputting the calculated first circuit scale information and the calculated second circuit information.

Abstract: A method of test path selection and test program generation for performance testing integrated circuits. The method includes identifying clock domains having multiple data paths of an integrated circuit design having multiple clock domains; selecting, from the data paths, critical paths for each clock domain of the multiple clock domains; using a computer, for each clock domain of the multiple clock domain, selecting the sensitizable paths of the critical paths; for each clock domain of the multiple clock domain, selecting test paths from the sensitizable critical paths; and using a computer, creating a test program to performance test the test paths.

Abstract: A method of designing a model of an integrated circuit block, an electronic design automation tool and a non-transitory computer-readable medium are disclosed herein. In one embodiment, the method includes: (1) generating an input and output timing budget for the block based on design constraints of the block and a netlist of the block, (2) updating the input and output timing budget with clock customization data based on designer knowledge of the integrated circuit and (3) providing the model for the block based on the update of the input and output timing budget, wherein the model represents clock information of the block separately from data path information of the block.

Abstract: Systems, apparatus, and methods of static timing analysis for an integrated circuit design in the presence of noise are disclosed. The integrated circuit design undergoing analysis may be partitioned into a plurality of subcircuit stages. Each subcircuit stage in the integrated circuit design may be modeled to include a model of at least one victim driver, at least one aggressor driver, at least one receiver, and an interconnect network. Associated with each subcircuit stage is a set of related edges of a design graph to compute signal propagation delay. For each subcircuit stage, full timing delays of each edge can be concurrently computed. This includes concurrently computing base timing delays for a nominal response to the at least one victim driver and the interconnect network and noise related timing delays in response to the at least one aggressor driver and the interconnect network.

Abstract: A system and methods for metastability verification of an integrated circuit design are provided. An IC design is received and the source-to-destination paths of the IC design are determined. For each of the determined source-to-destination paths, it is determined whether the corresponding source is synchronized. For each source its respective synchronized or unsynchronized result is stored and a report is generated for each source describing whether it is synchronized or unsynchronized. The system may be at least a portion of a computer aided design (CAD) system.

Abstract: An integrated circuit includes a clock-tree with a plurality of clock buffers, a plurality of clocked storage elements, and a plurality of logic circuits. Each clocked storage element has a clock input terminal connected to one of the plurality of clock buffers and a weight. Each of the logic circuits is associated with two of the plurality of clocked storage elements and is characterized as having a logic depth. The weight of each clocked storage element is equal to a sum of an inverse of a logic depth of each of the plurality of logic circuits associated therewith. A first clocked storage element which has a highest weight and is adjacent to and interacts with a second clocked storage element via one of the plurality of logic circuits. A first clock buffer provides a common clock signal to the first and second clocked storage elements.

Abstract: A circuit analysis tool is provided for optimizing circuit clock operating frequency using useful skew timing analysis. The instructions supply clock signal with an optimized operating frequency. A first gate signal input slack time is determined with respect to the clock signal to the first gate. If the first gate signal input has a negative slack time, a delay is added to the first clock signal. A second gate signal input slack time is determined with respect to the clock signal to the second gate. If the second gate signal input slack time is negative, a delay is added to the second clock signal necessary to create a second gate signal input positive slack time. In response to the first and second gate signal input positive slack times, it is determined that the circuit successfully operates at the clock optimized operating frequency.

Abstract: In one embodiment of the invention, a method includes partitioning an integrated circuit design into a hierarchy of a top level and a plurality of partitions, wherein the top level includes a top level netlist and each partition includes a partition netlist; receiving data path timing budgets and clock path timing budgets for each of the plurality of partitions of the integrated circuit design; and generating a timing budget model of each partition in response to the respective data path timing budgets and clock path timing budgets, wherein each timing budget model includes an intra-partition clock timing constraint for each respective partition for independent implementation of the top level.

Abstract: An electronic design automation (EDA) tool alters a user's netlist to provide timing success for distribution of asynchronous signals. Distribution networks are used with the addition of pipeline registers before and/or after the distribution buffer. Or, a tree of pipeline registers is inserted between the asynchronous source and the destination registers. Or, any number of distribution networks are stitched together and pipeline stages may be inserted before and/or after each distribution buffer. Or, beneficial skew is utilized by introducing a delay component that skews a clock signal. The skewed clock signal drives a pipeline register that is inserted before a distribution buffer in order to improve timing margin. Any of various compilation techniques may be used within the EDA tool to solve the problem of distributing high-speed, high-fanout asynchronous signals.

Abstract: A system generally including a clock structure analysis tool, a static timing analysis tool and a waveform tool is disclosed. The clock structure analysis tool may be configured to generate a simplified clock structure for a clock signal in a complex clock structure in a design of a circuit. The static timing analysis tool may be configured to generate a plurality of results for a plurality of intermediate signals in the simplified clock structure in response to a static timing analysis of the design. The waveform tool may be configured to generate a first representation in a graphical user interface format of the intermediate signals and the results.

Abstract: A method of integrated circuit (IC) disposition includes the steps of determining one or more disposition criteria based at least in part on statistical timing of a given IC design; and determining whether a given IC according to the given IC design satisfies the one or more disposition criteria based at least in part on one or more measurements of at least one test structure.

Abstract: A computer-readable, non-transitory medium stores a program that causes a computer to execute detecting in a circuit-under-test, a change in a signal output from each circuit element on a transmission-side, during one clock cycle on a reception-side at an asynchronous location; inputting to each circuit element on the reception-side, a signal for which a change is not detected at a detection time among detection times when a signal change is detected at the detecting and replacing with a random logic value, a signal for which a change has been detected at a detection time among the detection times and inputting the random logic value to each circuit element on the reception-side, in an action triggered by a rising edge of an operation clock on the reception-side after the one clock cycle; and outputting for each circuit element on the reception-side, an operation result obtained based on input at the inputting.

Abstract: A method for reducing leakage power of an IC during the design of the IC. A cell based IC design is received that includes a plurality of signal paths with positive slack. The positive slack is converted to negative slack by replacing cell instances in the IC design with footprint equivalent variants of the cell instances. The negative slack is converted back to positive slack via an iterative path-based analysis of the IC design. In each iteration, a path is selected that has negative slack and replacement values are computed for cell instances in the path. One or more cell instances in the path are then replaced with variants based on the replacement values.

Abstract: An iterative method may comprise obtaining a current input signal value for a current iteration, comparing the current input signal value with an output signal value determined in a previous iteration, updating a counter value determined in the previous iteration based on the comparison such that the updated counter value replaces the previously determined counter value, determining a slew value based on the counter value, and adding the slew value to the previously determined output signal value to generate a new current output signal value. Different slew values may be added to the previous output signal to obtain a new output signal. The counter value is updated to reflect recent trends in the input signals. For example, if the input signal is on an upward trend, the counter value may be relatively high because it is incremented each time an input signal exceeds a previously determined output signal.

Abstract: In one embodiment of the invention, a multi-CCC current source model is disclosed to perform statistical timing analysis of an integrated circuit design. The multi-CCC current source model includes a voltage waveform transfer function, a voltage dependent current source, and an output capacitor. The voltage waveform transfer function receives an input voltage waveform and transforms it into an intermediate voltage waveform. The voltage dependent current source generates an output current in response to the intermediate voltage waveform. The output capacitor is coupled in parallel to the voltage dependent current source to generate an output voltage waveform for computation of a timing delay.

Abstract: The present invention relates to a method and an apparatus for estimating a clock skew. The method comprises: obtaining a basic clock skew of each clock tree in the circuit; judging whether two units are in a same clock domain; if they are in different clock domains, estimating the clock skew between units to be a larger one of basic clock skews of the clock trees corresponding to these two unit; if these two units are in the same clock domain, further judging whether they are in a same hierarchical logic block; if they are in different hierarchical logic blocks, estimating the clock skew between units to be the basic clock skew of the clock tree of these two units plus additional clock skew caused by different hierarchical logic blocks. The apparatus is corresponding to the method. With the method and apparatus, the clock skew in the circuit can be estimated more accurately, which improves the efficiency of circuit design.

Abstract: A method for recursive hierarchical static timing analysis. The method includes accessing a lower-level netlist representing a lower-level block of a circuit design to be realized in physical form, and accessing constraints for the lower-level block. Static timing analysis is performed on the lower-level block. The method includes accessing an upper-level netlist representing an upper-level block of the circuit design to be realized in physical form, and accessing constraints for the upper-level block. Static timing analysis is performed on the upper-level block while incorporating results from the static timing analysis on the lower-level block.

Abstract: The timing verification method for deterministic and stochastic networks and circuits is a computerized method that includes a non-enumerative path length analysis algorithm for deterministic and stochastic directed acyclic graphs (DAGs) with applications to timing verification of circuits, the algorithm computing statistical measures of path lengths without storing and/or manipulating the paths in such networks. The timing verification method is able to compute deterministic or probabilistic costs assigned to edges, vertices, or both.

Abstract: A system and method for analyzing the timing requirements of a memory array are disclosed. The memory cell circuitry used in the original memory array may utilize two bi-directional passgate transistors which are both used during read and write operations on the memory cell, e.g., where signals can flow across the passgate transistors in two directions. A model of the memory array may be created according to a memory cell model that uses uni-directional passgate transistors. Modeling the memory array with uni-directional circuitry may enable a static timing analysis tool to determine the critical path through the memory array. Once the critical path has been determined from the model of the memory array, a dynamic simulation of the critical path in the original memory array may be performed to accurately determine the timing requirements of the original memory array.

Abstract: A semiconductor circuit design supporting method includes: reading Register Transfer Level (RTL) description circuit data; generating an equivalent circuit corresponding to the RTL description circuit data; extracting a plurality of arithmetic components included in the generated equivalent circuit; clustering some of the extracted arithmetic components as a single arithmetic component, wherein no storage element exists between said some of the extracted arithmetic components; reading a timing constraint on the RTL description circuit data; tracing an exception path of the RTL description circuit data when the timing constraint includes a timing exception; determining whether or not the timing exception is set for input pins of said some of the arithmetic components which are clustered as the single arithmetic component, based on the traced exception path of the RTL description circuit data; and separating a arithmetic component for which the timing exception is set, from said some of the arithmetic component

Abstract: A design tool hierarchically presents information about a design with nested blocks. For example, the design tool presents scheduling information for the design in a hierarchical Gantt chart. The scheduling information includes hierarchical design schedule blocks which accurately depict the timing and scheduling of the nested blocks of the design. Each of the hierarchical design schedule blocks includes control steps numbered relative to the block. The scheduling information also includes a hierarchical list of scheduled operations for the design. The hierarchical list emphasizes which operations are associated with which nested blocks. The scheduling information further includes pseudo-operation icons that are easily differentiated from real operation icons in the hierarchical Gantt chart.

Abstract: A clock gating mechanism controls power within an integrated circuit device. One or more clock gating circuits are configured to couple a system clock to a different portion of the integrated circuit device. A logic circuit applies an enabling signal to one of the clock gating circuits to control whether the system clock passes through the clock gating circuit to a portion of the integrated circuit device associated with the clock gating circuit. A plurality of scan flip-flops is configured to provide a binary code to the logic circuit, where the binary code indicates to the logic circuit that the enabling signal should be applied to the clock gating circuit. One advantage of the disclosed technique is that power droop during at-speed testing of a device is reduced without significantly increasing the quantity of test vectors or reducing test coverage, resulting in greater test yields and lower test times.

Abstract: In a method of designing a system-on-chip including a tapless standard cell to which body biasing is applied, a slow corner timing parameter is adjusted to increase a slow corner of an operating speed distribution for the system-on-chip by reflecting forward body biasing, and a fast corner timing parameter is adjusted to decrease a fast corner of the operating speed distribution for the system-on-chip by reflecting reverse body biasing. The system-on-chip including the tapless standard cell is implemented based on the adjusted slow corner timing parameter corresponding to the increased slow corner and the adjusted fast corner timing parameter corresponding to the decreased fast corner. The slow corner timing parameter corresponds to a lowest value of an operating speed design window of the system-on-chip, and, the fast corner timing parameter corresponds to a highest value of the operating speed design window of the system-on-chip.

Abstract: A system for, and method of, generating block timing constraints and a timing model. In one embodiment, the system includes a hierarchical modeling tool configured to: (1) generate a model file, (2) receive at least one abstracted view margin, at least one timing environment margin and at least one operational margin for inclusion in the model file, (3) generate block implementation timing constraints employing the at least one timing environment margin and the at least one operational margin and (4) generate a block timing model employing the at least one abstracted view margin and the at least one operational margin.

Abstract: Buffers on a clock tree are reduced, as long as there is enough set-up margin, in order to reduce power consumption in the clock tree. An FF group coupled to a partial tree, which is a part of the clock tree and expanded from the branch point being focused on, is defined as the target FF and the other FFs are defined as non-target FFs. The target buffer of an elimination candidate and the target and non-target FFs are defined so as not to change the slack in principle in a signal propagation path between the non-target FFs even if the buffer is eliminated. The buffer which can be eliminated is specified within a range in each signal propagation path which has a start point at the non-target FF and an end point at the target FF and in each signal propagation path between the target FFs.

Abstract: A system for, and method of, performing static timing analysis. In one embodiment, the system includes: (1) a CVS tool configured to determine a cell-based voltage supply corresponding to each of a plurality of cells in an integrated circuit design and (2) an STA tool configured to derate the each of the cells based on the corresponding cell-based voltage supply.

Abstract: A property generation tool that automatically generates a property for a circuit design from a signal trace of the circuit design. The property generation tool receives a trace of a circuit design. The trace includes signal values for a number of signals of the circuit design over a number of clock cycles. Signal signatures are generated from one or more characteristics of the signal values. Sets of candidate signals are identified from the circuit design signals based on the signal signatures. One or more properties of the circuit design are generated based on the signal values associated with the sets of candidate signals. The property can be output, for example, for display to a user of the property generation tool. Examples of properties that are generated by the property generation tool include handshaking properties and fairness properties.

Abstract: Techniques for forming a first electronic circuit including a plurality of instances of a repeatable circuit element include the steps of: obtaining a total number of instances of the repeatable circuit element in a design of an IC including the first electronic circuit and at least a second electronic circuit; and configuring at least one functional parameter of the first electronic circuit as a function of the total number of instances of the repeatable circuit element in the IC to thereby satisfy a prescribed minimum composite manufacturing yield of the IC and/or at least one specification of the IC under prescribed operating conditions.

Abstract: In one embodiment of the invention, a multi-CCC current source model is disclosed to perform statistical timing analysis of an integrated circuit design. The multi-CCC current source model includes a voltage waveform transfer function, a voltage dependent current source, and an output capacitor. The voltage waveform transfer function receives an input voltage waveform and transforms it into an intermediate voltage waveform. The voltage dependent current source generates an output current in response to the intermediate voltage waveform. The output capacitor is coupled in parallel to the voltage dependent current source to generate an output voltage waveform for computation of a timing delay.

Abstract: There is provided a test apparatus for testing a device under test, including a plurality of operational units that operate in response to control data supplied thereto to test the device under test, a control section that generates packet data containing the control data and unit selection data indicating which one or more of the plurality of operational units are to be selected, and a plurality of data transfer units that are cascade-connected to each other so that the packet data is transferred from each of the plurality of data transfer units to a data transfer unit of a following stage, where each of the plurality of data transfer units corresponds to one or more of the plurality of operational units.

Abstract: The invention generally relates to systems and methods for modeling I/O simultaneous switching noise, and, more particularly, to systems and methods for modeling I/O simultaneous switching noise in a selected chip window area while accounting for the effect of current sharing among neighbors. A method includes determining a current sharing factor of areas of an integrated circuit (IC) chip package, and determining an offload scaling factor of the IC chip package based upon the current sharing factor and numbers of I/O devices in neighboring areas of the IC chip package.

Abstract: Solutions for ordering of statistical correlated quantities are disclosed. In one aspect, a method includes timing a plurality of paths in an integrated circuit to determine a set of timing quantities associated with each of the plurality of paths; determining a most critical timing quantity in the set of timing quantities; forming a tiered timing quantity arrangement for ordering a plurality of timing quantities in the set of timing quantities; removing the most critical timing quantity from the set of timing quantities and placing the most critical timing quantity in an uppermost available tier of the tiered timing quantity arrangement; and repeating the determining, forming and removing for the set of timing quantities excluding the removed most critical timing quantity.

Abstract: Accurate circuit and system timing analysis is a critical tool for designing and analyzing complex modern semiconductor chips. While the accuracy and detail of dynamic electrical simulation may be desirable in theory, such analysis is not feasible due to extreme computational complexity and open-ended simulation times. Improved circuit modeling and timing analysis tools that can provide both accuracy and computational efficiency are required. Table look-up (TLU) and other techniques provide computationally efficient timing analysis but may be undertaken at the expense of simulation accuracy. Instead, the use of current waveform moments representing the frequency domain equivalents of signals can provide the required simulation accuracy and computational efficiency.

Abstract: In an example embodiment, the system obtains the mutual inductance (e.g., Mij) between a quiet I/O buffer and each switching I/O buffer on a PLD from an automatic SSN measurement system. The system calculates the corrected mutual inductance between the quiet I/O buffer and each switching I/O buffer by multiplying the mutual inductance by a correction factor (e.g., ?j). The system multiplies each corrected mutual inductance by the rate of current flowing through the switching I/O buffer to obtain an induced voltage resulting from the switching I/O buffer. The system sums the induced voltages for all the switching I/O buffers on the PLD to obtain an estimate of total induced voltage caused in the quiet I/O buffer by all switching I/O buffers. The correction factor is based on bench measurements and depends on the amplitude of the simultaneous switching noise affecting each switching I/O buffer.

Abstract: A method for generating a design for a system to be implemented on a target device includes compiling the design. Information used to make a compilation decision on the design is stored. A strategy to improve timing closure on a signal path on the design is derived using the information.

Abstract: A non-transitory computer-readable recording medium stores therein a program that causes a processor to execute inputting a driving capability value, a lumped-constant capacitance value, and an input capacitance value included in the lumped-constant capacitance value, respectively defined in a circuit model, and further inputting a first delay time of the circuit model, based on the driving capability value and the lumped-constant capacitance value; setting in the circuit model, the driving capability value, the lumped-constant capacitance value, and the input capacitance value; acquiring a second delay time of the circuit model, by providing to a simulator, the circuit model having values set therein; calculating a relative evaluation value for the first delay time and the second delay time; and storing to a storage apparatus and as a delay time correcting coefficient, the relative evaluation value correlated with the driving capability value, the lumped-constant capacitance value, and the input capacitance

Abstract: A timing adjustment device includes a plurality of receive circuits that receive an input signal based on mutually different timings, a determination circuit that determines a first transition and a second transition of the input signal based on a received result by receive circuits, among the plurality of receive circuits, that receive the input signal with adjacent timings among different timings of the plurality of receive circuits, and an adjustment circuit that adjusts the receiving timing of the input signal so that the receiving timing of the input signal becomes close to a central timing of a period according to the first transition and the second transition.

Abstract: The invention provides a method and system for performing Static Timing Analysis on SoC (System on a Chip) designs. The invention solves a longstanding problem with timing analysis of designs, namely, the ability to multi-thread the design under analysis. The invention provides for slicing a design into levels, further decomposing each level into gates, and the multi-threaded processing of gates so that the solution of large design analysis is generated significantly faster than current approaches. Further, the invention provides that only one level exists in the RAM at any time. Once the arrival time on the level is computed, the data is saved to disk immediately. Because the memory footprint is sub-linear to the size of the design, entire system-on-a chip designs may be nm on inexpensive, off-the-shelf hardware.

Abstract: In one embodiment of the invention, a method includes reading an automatically generated timing budgeting file, including timing budget information for a plurality of partitions of an integrated circuit design; graphically displaying a time budgeting debug window on a display device; and graphically displaying a timing budget analyzer window on the display device in response to selection of a selected signal path in a path list window pane. The timing budget analyzer window graphically displays timing budgets and timing delays of a selected path for visual comparison. The time budgeting debug window includes a button with a path category menu to display one or more signal paths meeting a selected path category, and a path list window pane to display a list of one or more signal paths through one or more ports of the plurality of partitions in response to the selected path category in the path category menu.

Abstract: Techniques for performing race logic synthesis on an integrated circuit (IC) are described herein. According to one aspect of the invention, HDL (hardware description language) and/or ESL (electronic system level) design source files of an IC design are compiled into a common design database. Race logic analysis is performed on the IC design, either by a third-party tool or by the same EDA (electronic design automation) tool that also performing race logic synthesis, if the latter has built-in race logic audit functions. Based on the race logic audit results, race logic synthesis is performed on the common design database, and getting rid of all identified race logic in the IC design. This renders the EDA tool can perform concurrent analysis of the IC design, via the race-free common design database, using multi-CPU/core computers and the results will be the same as if the EDA tool had performed serial analysis of the IC design using a single-CPU/core computer.

Abstract: A delay library generation apparatus, associated control method, and associated program are provided. The delay library generation apparatus comprises a storage device which stores architecture information of a logic element array, layout data of an overall programmable logic device, a netlist of the overall programmable logic device, and a wiring route extraction unit which refers to the storage device and extracts wiring route information regarding a wiring route section based on the architecture information. Moreover, the delay library generation apparatus comprises an analyzing unit which analyzes the layout data of the logic device and extracts parameters of a parasitic element and a crosstalk between adjacent interconnections. The delay generation apparatus further comprises a delay calculation unit which calculates delay data based on the extracted parameters and a delay library generation unit which generates a delay library of the logic device based on the wiring route information and the delay data.

Abstract: A circuit for preventing a setup fail between a first latch and a second latch according to one embodiment of the present invention comprises a mimic combinational logic module and a clock compare module. The mimic combinational logic module is configured to receive a first clock signal for the first latch and to generate a delayed first clock signal, which is a delayed version of the first clock signal. The clock compare module is configured to provide a delayed second clock signal, which is a delayed version of a second clock signal for the second latch, to the second latch after receiving the delayed first clock signal and the second clock signal.

Abstract: A method includes approximating a physical characteristic of a semiconductor substrate with a frequency-dependent circuit, and creating a technology file for the semiconductor substrate based on the frequency-dependent circuit. The physical characteristic of the semiconductor substrate identified by one of an electromagnetic simulation or a silicon measurement. The technology file is adapted for use by an electronic design automation tool to create a netlist for the semiconductor substrate and is stored in a non-transient computer readable storage medium.

Abstract: A method, system or computer usable program product for performing timing analysis on an array circuit including receiving in memory a set of pins to be timed, selecting with a data processor a cross section of the array circuit including the set of pins wherein a backtrace is performed from the set of pins to identify a set of bus groups, each bus group having a plurality of timing pins, and assigning timing for an assigned pin of a first bus group equal to timing calculated for a surrogate pin of the first bus group based on array circuit regularity.

Abstract: A semiconductor circuit design supporting method includes: reading Register Transfer Level (RTL) description circuit data; generating an equivalent circuit corresponding to the RTL description circuit data; extracting a plurality of arithmetic components included in the generated equivalent circuit; clustering some of the extracted arithmetic components as a single arithmetic component, wherein no storage element exists between said some of the extracted arithmetic components; reading a timing constraint on the RTL description circuit data; tracing an exception path of the RTL description circuit data when the timing constraint includes a timing exception; determining whether or not the timing exception is set for input pins of said some of the arithmetic components which are clustered as the single arithmetic component, based on the traced exception path of the RTL description circuit data; and separating a arithmetic component for which the timing exception is set, from said some of the arithmetic component

Abstract: A method, system or computer usable program product for performing timing analysis on an array circuit including receiving in memory a set of pins to be timed, selecting with a data processor a cross section of the array circuit including the set of pins wherein a backtrace is performed from the set of pins to identify a set of bus groups, each bus group having a plurality of timing pins, and assigning timing for an assigned pin of a first bus group equal to timing calculated for a surrogate pin of the first bus group based on array circuit regularity.

Abstract: A method and system for dispositioning integrated circuit chips. The method includes performing a performance path test on an integrated circuit chip having one or more clock domains, the performance path test based on applying test patterns to selected sensitizable data paths of the integrated circuit chip at different clock frequencies; and dispositioning the integrated circuit chip based on results of the performance path test.

Abstract: Systems and methods for accommodating correlated parameters in SSTA are provided. The method includes determining a correlation between at least two parameters. The method further includes calculating a new parameter or a new parameter set based on the correlation between the at least two parameters. The method further includes performing the SSTA such that the new parameter or the new parameter set is propagated into the SSTA. The method further includes projecting slack using the correlation between the at least two parameters and using a processor.