Abstract: Various embodiments provide an integrated circuit (IC) design method and design kit for reducing context variations through design rule restrictions. The design method can be applied to components (e.g., analog blocks) with a context variation in an IC design. By drawing a cover layer over such components, context-variation-reduction design rule restrictions can be applied to reduce the context variations.

Abstract: A circuit board designing device has a database that stores an another-component arrangement forbidden range table, a related component information table, and a relative-arranging position table, and a processing unit that executes arrangement of the components, determines the another-component arrangement forbidden range which is set to forbid arrangement of another component in the predetermined range on the basis of the arranging position of the basic component with reference to the another-component arrangement forbidden range table when arrangement of the basic component is instructed, acquires related component information corresponding to the related component to be combined with the basic components with reference to the related component information table, acquires a relative-arranging position of the related component from the relative-arranging position table on the basis of the acquired related component information, and sets the acquired related component in the another-component arrangement forb

Abstract: A monitor position determining apparatus includes an acquiring unit that acquires design data concerning circuit elements arranged in a layout of a semiconductor device and for each of the circuit elements, yield sensitivity data indicative of a percentage of change with respect to a yield ratio of the semiconductor device; a selecting unit that selects, based on the yield sensitivity data, a circuit element from a circuit element group arranged in the layout; a determining unit that determines an arrangement position in the layout to be an installation position of a monitor that measures a physical amount in the semiconductor device in a measurement region, the arrangement position being of the circuit element that is specified from the design data acquired by the acquiring unit and selected by the selecting unit; and an output unit that outputs the installation position determined by the determining unit.

Abstract: A computer-implemented method of implementing a circuit design within a programmable logic device can include selecting at least one circuit element of the circuit design. The selected circuit element can be converted to a latch. A timing analysis can be performed upon the circuit design after conversion of the selected circuit element to a latch. A determination can be made by a computer as to whether the timing of the circuit design improves and the conversion of the selected circuit element to a latch can be accepted when the timing of the circuit design improves. The circuit design can be output.

Abstract: An approach is provided for selectively optimizing a circuit design to be physical implemented. The approach includes generating a circuit routing solution in accordance with a plurality of constraints for parametric resources of the circuit design, with the constraints being defined respectively by a plurality of corresponding constraint instances. Each constraint instance variably indicates an effective constraining limit and degree of consumption for at least one of the parametric resources. At least one of the constraints is selectively adjusted by a predetermined over-constraining amount, and the circuit routing solution is preliminarily modified by applying at least one routing action selected responsive to the constraint adjustment. An automatic evaluation is then made of the potential impact upon constraint compliance.

Abstract: A congestive placement preventing apparatus, applied in a logic circuit layout having 2K logic circuits, where K is a positive integer, is provided. The congestive placement preventing apparatus includes a restructuring module and a synthesizing module. The restructuring module adds a selecting unit in the logic circuit layout, and adds (N?K) buffers in each of the 2K logic circuits, where N is a positive integer. The synthesizing module synthesizes the restructured logic circuit layout according to a plurality of “don't touch” synthesizing commands associated with the added buffers. In the synthesized logic circuit layout, all of the 2K logic circuits are independent and not coupled or merged with one another.

Abstract: A method for designing a system to be implemented on a target device includes computing slack potential of paths between components on the target device after timing analysis. A graphical representation of the slack potential and slack for the paths is generated. The graphical representation identifies that a design change is required for a first portion of the system associated with a first path and that a change in placement is required for a second portion of the system associated with the second path.

Abstract: Block placement within each device-containing layer is optimized under the constraint of a simultaneous optimization of interlayer connectivity between the device-containing layer and immediately adjacent device-containing layers. For each functional block within the device-containing layer, lateral heat flow is calculated to laterally adjacent functional blocks. If the lateral heat flow is less than a threshold value for a pair of adjacent functional blocks, placement of the functional blocks and/or interlayer interconnect structure array therebetween or modification of the interlayer interconnect structure array is performed. This routine is repeated for all adjacent pairs of functional blocks in each of the device-containing layers. Subsequently, block placement within each device-containing layer may be optimized under the constraint of a simultaneous optimization of interlayer connectivity across all device-containing layers.

Abstract: A hierarchical design apparatus 1 for a semiconductor integrated circuit includes a hierarchical block placing unit 1-02 which places sets of hierarchical blocks onto a chip; a hierarchical block terminal placing unit 1-03 which places terminals of the hierarchical blocks so that for sets of hierarchical blocks having the same function, the hierarchical blocks coincide with each other in a coordinate of the corresponding terminal; an intra-hierarchical block layout unit 1-06 which executes the individual types of intra-hierarchical-block layout designs, meanwhile executes only a single type of intra-hierarchical-block layout design for the sets of hierarchical blocks having the same function; and a chip layout finishing unit 1-07 which replicates thus-obtained layout patterns, and thereby completing a layout design over the entire chip.

Abstract: Methods for generating a device layout are provided. First, design rules corresponding to a specific technology are received. A selection of at least one element and a parameter value corresponding to at least one parameter on the selected element are received. A draft device layout corresponding to the selected element is generated by a device generator by referencing the parameter value and the design rules. A script is then executed to modify the draft device layout to generate an updated device layout. The script includes at least one command, and when the script is executed, the at least one command is performed to modify the parameter value of the at least one parameter of the selected element and cause the device generator to delete the old draft device layout and generate a new draft device layout by referencing the modified parameter value and the design rules.

Abstract: A system for selecting gates for an integrated circuit design may include at least one processing device configured to identify gates of the integrated circuit design having a slack value less than a predefined slack threshold. The at least one processing device may be further configured to, for each of the identified gates, determine (i) a number of nodes of the integrated circuit design that experience a timing slack improvement if the gate is swapped with an alternative implementation having a reduced delay or (ii) a sum of timing slack improvements experienced by nodes of the integrated circuit design if the gate is swapped with the alternative implementation having a reduced delay. The at least one processing device may still be further configured to swap the gate with the alternative implementation having the reduced delay if the determined number or sum is greater than a corresponding predetermined threshold.

Abstract: An integrated circuit device for a switching regulator, includes: a controller configured to generate a digital duty signal for a current mode control of the switching regulator based on an output voltage to be supplied from the switching regulator to a load circuit; and a switching pulse generating section configured to set a time ratio of a switching pulse signal for controlling turning-on and turning-off of a switching circuit which is provided in the switching regulator, based on the digital duty signal. The controller is a digital circuit which operates based on a master clock of the same frequency as a switching frequency of the switching circuit.

Abstract: A method includes determining a mapping between model parameters and electrical parameters of integrated circuits. The model parameters are configured to be used by a simulation tool. A set of electrical parameters is provided, and the mapping is used to map the set of electrical parameters to a set of model parameters.

Abstract: A global placer receives a plurality of regions, each region occupying a sub-area of a design area. receives a plurality of movebound objects, each movebound object associated with a region. The global placer receives a plurality of unconstrained objects, each unconstrained object associated with no region. The global placer receives a tolerance, wherein the placement tolerance defines a coronal fringe to at least one region. The global placer initially placing the plurality of movebound objects and unconstrained objects. The global placer iterates over objects without preference to region-affiliation to select an object, wherein the objects are comprised of the plurality of movebound objects and plurality of unconstrained objects. The global placer determines whether movebound object is within the tolerance of a region associated with the movebound object.

Abstract: Improving routability of an integrated circuit (IC) design without impacting the area is described. A local region of congestion of an IC design is determined according to a design parameter. A cell with a specified level of complexity is identified within the local region of congestion. An alternative cell is algorithmically created with a same logic function as the cell by adding an access point to the alternative cell. The cell is then replaced with the alternative cell within the local region of congestion.

Abstract: An arrangement verification apparatus that makes it possible to shorten a time it takes to complete a failure/no-failure test on the arrangement of control circuits that control block circuits is provided. The arrangement verification apparatus arranges block circuits to be controlled comprising a semiconductor device and control circuits that control the block circuits over a predetermined floor and conducts a failure/no-failure test on the arrangement of the control circuits.

Abstract: An integrated circuit (IC) and fabrication method thereof is provided that include the steps of specifying a plurality of required tile modules suitable for a particular end application, each of the modular tiles being configured to perform a predetermined function and constructed to have approximately the same length and width dimensions. The modular tiles are used to form the IC in a standard IC fabrication process. In many implementations, physical layout of the IC does not include the step of routing. Capabilities also include configuring the modular tiles to have programmable performance parameters and configuring the modular tiles to cooperate usefully with one another based on a programmable parameter.

Abstract: A layout apparatus stores a plurality of capacitor cells which are classifiable into a first classification for identifying capacitor cells having different sizes by frequency characteristic correlating with gate width of a capacitor and a second classification for identifying capacitor cells having different frequency characteristics by cell size.

Abstract: An integrated circuit (IC) and fabrication method thereof is provided that include the steps of specifying a plurality of required tile modules suitable for a particular end application, each of the modular tiles being configured to perform a predetermined function and constructed to have approximately the same length and width dimensions. The modular tiles are used to form the IC in a standard IC fabrication process. In many implementations, physical layout of the IC does not include the step of routing. Capabilities also include configuring the modular tiles to have programmable performance parameters and configuring the modular tiles to cooperate usefully with one another based on a programmable parameter.

Abstract: Disclosed is a method for placing dummy patterns in a semiconductor device layout. More specifically, the method places the dummy patterns densely between main patterns in accordance with a sequence and configuration. The method includes placing vertical dummies having a greater length than width in a region other than main patterns to form a first layout, removing the vertical dummies within a first distance from the main patterns to form a second layout, placing horizontal dummies having a greater length than width in a vacant space of the second layout to form a third layout, and removing the horizontal dummies within a second distance from the main patterns in the third layout. The method prevents and/or inhibits pattern deformation.

Abstract: A method of filling dcaps in an integrated circuit includes identifying a set of dcap-eligible areas of the integrated circuit for areas large enough to accommodate at least one dcap cell having a selected size smaller than a default size. The dcap cell includes at least one built-in power track. A set of dcap cells are filled in the identified set of dcap-eligible areas. Each of the built-in power tracks included in the set of dcap cells is connected to a corresponding power grid. An integrated circuit including a power grid channel formed between at least two power grids and a plurality of dcaps including a first dcap included in a dcap cell, the dcap cell including built-in power tracks, each one of the built-in power tracks being connected to a corresponding one of the at least two power grids is also described.

Abstract: A system and method for testing size of vias reads a component group from a storage system and reads a via size of each via in the component group. If the via size of a via accords with a standard size corresponding to the component group, the via is determined as a qualified via. If the via size of a via does not accord with the standard size, the via is determined as an unqualified via. The unqualified via is highlighted on a printed circuit board (PCB) design map displayed on a display.

Abstract: Assigning pins to macro-blocks of an Integrated Circuit (IC) chip is described. The macro-block pin assignments are automatically placed using Constraint Programming (CP) techniques to position the pins on the periphery of a macro-block. Bus-ordering and pin-spacing constraints are performed considering all the nets forming the IC design simultaneously. The CP formulation includes modeling detailed and discrete constraints required to achieve an optimal pin-assignment. A stochastic CSP solver is used to define the cost function on search points giving full assignments to all the variables. The macro-block pins are ultimately moved to computed locations.

Abstract: A structure, apparatus and method for circuits to minimize sensitivity to latch. The method includes, for example, identifying element density of at least one functional circuit block and element attributes of elements associated with the at least one functional circuit block. An element density function parameterized from the element attributes is formed. The placement of the at least one functional circuit block is modified relative to other functional circuit blocks based on the element density function to substantially eliminate latching effects in a circuit.

Abstract: A method, system, and computer usable program product for an improved object placement in integrated circuit design are provided in the illustrative embodiments. The IC design includes cells, the cells including electronic components, wires, and pins defined for interconnections of the IC. An initial placement corresponding to the design is received. A characteristic of the initial placement is estimated, which may include congestion, pin density, or both in an area of the initial placement. A transformation is performed on a part of the initial placement including the area to improve the characteristic. If the characteristic has improved in the transformed placement, a final placement corresponding to the transformed placement is produced. The transformation may be any combination of resizing an object, weighting a connection, clustering a plurality of objects, shortening of a route taken by a wire, and straightening a bend in a wire in the initial placement.

Abstract: Disclosed are a method, system, and computer program product for providing customizable information in designing electronic circuits with electrical awareness. The method or the system displays a portion of a physical design of an electronic circuit in a first display area. The method or the system receives or identifies a user's or a system's manipulation of the portion of the physical design of the electronic circuit. The method or the system then determines and displays an in situ response to the manipulation in the first display area. The method or the system may further display, in the first display area or in another display area, result(s) relating to the physical data of a component, electrical parasitic(s) associated with the physical data, electrical characteristic(s) associated with the physical data or the electrical characteristic(s), or other element(s) of the physical design that is impacted by the manipulation.

Abstract: In an example embodiment, an EDA program receives input which includes a selection as to an FPGA die and its device package and a selection as to a structured ASIC die and its device package. If the I/O pins on the device package for the FPGA differ from the I/O pins on the device package for the structured ASIC, the EDA program determines a correspondence between the I/O pins on the two device packages (e.g., by identifying the location of the pads for I/O pins on the structured ASIC die and/or creating a virtual structured ASIC device package whose I/O pins are a superset of the I/O pins on the selected structured ASIC device package), which determination includes checking rules for resource assignments. The EDA program then stores the determined correspondence in a device database where the determined correspondence can be accessed by CAD algorithms.

Abstract: A microcomputer provided on a rectangular semiconductor board has memory interface circuits. The memory interface circuits are separately disposed in such positions as to extend along the peripheries of the semiconductor board on both sides from one corner as a reference position. In this case, limitations to size reduction imposed on the semiconductor board can be reduced compared with a semiconductor board having memory interface circuits only on one side. Respective partial circuits on each of the separated memory interface circuits have equal data units associated with data and data strobe signals. Thus, the microcomputer has simplified line design on a mother board and on a module board.

Abstract: A method for cell placement in an integrated circuit design that uses a calculated diffusion velocity determined from a density value in order to relocate the cells until the cell placement reduces the density below a predetermined threshold. The method acts to control the movement of different cells to reduce the density of the cells prior to legalization of the cell placement.

Abstract: A system may include a database configured to store information including characteristics of a plurality of components. The system may further include a server in communication with the database and configured to receive design parameters indicative of characteristics of an LED lighting solution; determine a plurality of LED lighting array designs, each design including at least one of a parallel and a series arrangement of LEDs and configured to provide an amount of light specified by the design parameters; for each one of at least a subset of the plurality of LED lighting array designs, determine an LED driver design configured to power the one of the LED lighting array designs; and generate at least one LED lighting solution, each LED lighting solution including one of the LED lighting array designs combined with one of the LED driver designs configured to power the one of the LED lighting arrays.

Abstract: A PMOS device can be designed and manufactured in accordance with the invention to locate its drain junction breakdown point and maximum impact ionization point to reduce or eliminate drain breakdown voltage walk-in. In some embodiments, the drain junction breakdown point and maximum impact ionization point are located sufficiently far from the gate that the device exhibits no significant drain breakdown voltage walk-in. The device can be a high voltage power transistor having an extended drain region including a P-type lightly doped drain (P-LDD) implant, with drain junction breakdown and maximum impact ionization points appropriately located by controlling the implant dose employed to produce the P-LDD implant.

Abstract: There is described a method for creating a thermally-isolated microstructure on a slab of mono-crystalline silicon which uses a hybrid dry-then-wet etch technique that when controlled, can produce microstructures without any silicon adhering underneath, microstructures having small masses of silicon adhering underneath, and microstructures that are still attached to the slab of mono-crystalline silicon via a waisted silicon body. When creating the microstructures with a waisted silicon body, the thermal isolation of the microstructure can be designed by controlling the depth of the etching and the size of the waist.

Abstract: Integrated circuits and methods of manufacture and design thereof are disclosed. For example, a method of manufacturing includes using a first mask to pattern a gate material forming a plurality of first and second features. The first features form gate electrodes of the semiconductor devices, whereas the second features are dummy electrodes. Based on the location of these dummy electrodes, selected dummy electrodes are removed using a second mask. The use of the method provides greater flexibility in tailoring individual devices for different objectives.

Abstract: A printed circuit board includes a group of pads suitable to be soldered to a respective group of solder-balls of a device. Each pad of the group has a crack initiation point on its perimeter at a location where cracks in a solder-ball are anticipated to start after that solder-ball is soldered to that pad. For a pad of that group having a microvia located therein, a center of that microvia is located farther than a center of that pad from its crack initiation point. For a pad of that group having a trace merging along a portion of its perimeter, that portion does not include a vicinity of that crack initiation point.

Abstract: A high-speed, low leakage-power Standard Cell Library is provided. The high-speed, low-leakage-power Standard Cell Library provides the extra drive-strength of a taller X-Track library (e.g., 14-Track library) and low leakage-power comparable to that of a smaller, N-Track library (e.g., 10-Track library). The high-speed, low leakage-power Standard Cell Library includes a set of cells each having a device area designed to provide maximum drive strength for the cell. The high-speed, low leakage-power Standard Cell Library further includes a second set of cells having varying device areas that provide reduced leakage power characteristics comparable to cells in the smaller, N-Track library. The modified reduced leakage-power cells are formed by adding padding to the cell to achieve a desired leakage-power characteristic of the cell.

Abstract: Some embodiments of the present invention provide techniques and systems for reducing the number of scenarios over which a circuit design is optimized. Each scenario in the set of scenarios can be associated with a process corner, an operating condition, and/or an operating mode. During operation, the system can receive a set of scenarios over which the circuit design is to be optimized. Next, the system can compute values of constrained objects in the circuit design over the set of scenarios. The system can then determine a subset of scenarios based at least on the values of the constrained objects, so that if the circuit design meets design constraints in each scenario in the subset of scenarios, the circuit design is expected to meet the design constraints in each scenario in the set of scenarios.

Abstract: The present invention relates to an extracting method for a circuit model, configured to represent output driving capability and an input capacitor of an interface pin of an application circuit. The extracting method comprises: receiving a netlist describing a circuit structure of the application circuit, which comprises a plurality of transistors; selecting an interface pin of the application circuit in the netlist; selecting a bias pin of the application circuit in the netlist; selecting at least one path between the interface pin and the bias pin in the netlist; and obtaining sum of equivalent width/length ratios according to the width/length ratios of all first transistors coupled to the at least one path.

Abstract: Some embodiments of the present invention create a layout for a circuit design which includes one or more circuit modules. The system can receive a nominal implementation of a circuit module, and a user-defined module generator capable of generating one or more custom implementations of the circuit module from an existing implementation of the circuit module. Next, the system can create the layout for the circuit design by executing the user-defined module generator on at least one processor to generate one or more custom implementations of the circuit module from the nominal implementation. The system can then use the one or more custom implementations of the circuit module in the layout.

Abstract: A method and system checks a double patterning layout and outputs a representation of G0-rule violations and critical G0-spaces. The method includes receiving layout data having patterns, determining whether each distance between adjacent pattern elements is a G0-space, find all G0-space forming a G0-rule violation, finding all G0-space that are critical G0-spaces, and outputting a representation of G0-rule violations and critical G0-spaces to an output device. By resolving G0-rule violations and critical G0-spaces, a design checker can effectively generate a double patterning technology (DPT) compliant layout.

Abstract: Roughly described, methods and systems for improving integrated circuit layouts and fabrication processes in order to better account for stress effects. Dummy features can be added to a layout either in order to improve uniformity, or to relax known undesirable stress, or to introduce known desirable stress. The dummy features can include dummy diffusion regions added to relax stress, and dummy trenches added either to relax or enhance stress. A trench can relax stress by filling it with a stress-neutral material or a tensile strained material. A trench can increase stress by filling it with a compressive strained material. Preferably dummy diffusion regions and stress relaxation trenches are disposed longitudinally to at least the channel regions of N-channel transistors, and transversely to at least the channel regions of both N-channel and P-channel transistors. Preferably stress enhancement trenches are disposed longitudinally to at least the channel regions of P-channel transistors.

Abstract: A detailed placement process which optimizes cell placement with up to one hundred percent densities in a linear run time. The output from a conjugate-gradient coarse placement process is input to the detailed placement process. A dynamic programming technique is used to optimize cell placement by swapping cells between two or more rows. The search space is pruned beforehand. A greedy cleanup phase using an incremental row placer is used. Thereby, the detailed placement process handles congestion driven placements characterized by non-uniform densities expeditiously and efficiently.

Abstract: Techniques, systems, and methods are provided for optimizing pattern density fill patterns for integrated circuits. The method includes adjusting an area of a scribe line and a density of dummy fill shapes in the adjusted scribe line, while maintaining an area of the die, to achieve a pattern density associated with technology ground rules for a particular design of the die.

Abstract: A layout method of a semiconductor integrated circuit by using cell library data includes specifying a gate in a predetermined cell as a reference gate, and automatically arranging a plurality of cells by a computer such that a number of gates arranged in an area in a predetermined distance from the reference gate meets a preset gate data density condition.

Abstract: Various embodiments of the invention comprise methods and systems for determining when or whether to use hard rules or preferred rules during global routing of an electronic design. In some embodiments, the entire routable space is first routed with hard rules during global routing while ensuring the design may be embedded. The design is then analyzed with preferred rules where the overcongested areas are marked as “use hard rule” and areas not overcongested are marked as “use preferred rule.” The methods or the systems thus ensure that the design remains routable throughout the process while improving timing, manufacturability, or yield by reserving routing space for the preferred rules.

Abstract: A power layout of an integrated circuit includes at least one power grid cell. Each power gird cell includes at least one first power layer configured to be coupled to a high power supply voltage and at least one second power layer configured to be coupled to a lower power supply voltage. The at least one first power layer has conductive lines in at least two different directions. The at least one second power layer has conductive lines in at least two different directions.

Abstract: A method for analog placement and global routing considering wiring symmetry performs a layout for a circuit which is described by a netlist having a set of devices and wires. First, the method inputs the netlist, and each device thereof has a design constraint and a corresponding priority. Based on the priorities, it performs a sorting on the devices to establish a constraint library. Then, based on the design constraint and corresponding priority of each device, the method establishes a hierarchical constraint tree. According to the hierarchical constraint tree, the method performs placement of each device, wherein possible shape of each device is represented by a shape curve. For each placement of the device, the method calculates a corresponding cost function. Then, it selects an optimum placement of the device according to the cost functions. The method establishes an RSMT for each wire and then performs an analog routing.

Abstract: An apparatus of preventing congestive placement is provided. The apparatus comprises a judging module, a pattern generating module, and a placement module. The judging module judges whether a circuit layout comprises a congestive region according to a judging rule. When a judgment result of the judging module is affirmative, the pattern generating module generates a redistribution pattern with a density distribution of blockages. The density distribution gradually decreases outward. The placement module regards the congestive region as the center redistributes the blockages and electronic cells according to the redistribution pattern.

Abstract: A layout for an integrated circuit includes standard cells positioned at standard cell sites. Programmable cells are positioned at programmable fill sites which have a size sufficient to accommodate the programmable cells and are not occupied by standard cells. The position of these programmable sites is recorded in site data as part of the layout data associated with the layout. Empty standard cell sites remaining after standard cells and programmable cells have been placed are filled with standard fill cells. The boundaries of the programmable cells are not constrained other than by alignment with standard cell sites. This permits a high density of programmable fill sites and programmable cells to be achieved. When it is desired to replace a programmable cell with a programmed cell the programmable cells are all deleted from the layout and then the required programmed cells are subject to an automated placement algorithm to place them where appropriate for their function.

Abstract: A computer-implemented method for handling a plurality of constraints in layout optimization for an integrated circuit (IC) layout is disclosed. In one embodiment, the method includes building a graph representing the plurality of constraints; marking two-dimensional constraints in the plurality of constraints; generating two-dimensional clusters including groups of the two-dimensional constraints; handling at least one of the two-dimensional clusters, the handling including finding a solution for the two-dimensional constraints in the at least one two-dimensional cluster; repeating the handling for any unprocessed two-dimensional clusters until all of the two-dimensional clusters are handled; and adopting the solution for each of the two-dimensional clusters to solve at least a portion of the plurality of constraints including the two-dimensional clusters.

Abstract: A method of managing power supply to at least one device in a data processing system, the method comprising determining when the at least one device has been associated with no resources for a predetermined period of time; turning off the power supply to the at least one device; determining that the at least one device is required for use by the data processing system; and restoring the power supply to the at least one device.