Abstract: A delay cell with a wider delay range is provided. The delay cell employs frequency dependent current source to generate the majority of the delay of the cell, while a control circuit (which is generally a current source that is controlled by a control voltage) provides additional delay. Thus, the delay cell provided here can be used to improve the performance of delay locked loops (DLLs) and other circuits.

Abstract: Multiplying digital-to-analog converters (MDACs), which are generally employed in pipelined analog-to-digital converters (ADCs), can have a settling error associated with the MDAC amplifier. Here, a circuit is provided that includes additional amplifiers and a capacitor network that compensates for this settling error. Thus, a more accurate pipelined ADC can now be produced.

Abstract: Conventional multistage amplifiers oftentimes employ trim circuits or highly matched components to combat noise and offset contributions. Having trim circuitry or highly matched components increases the overall size, cost, and power consumption, so it is desirable to have a circuit that reduces any need for better matching components or trim circuitry. Here, a multistage amplifier system is provided that generally accounts for some noise and offset contributions, reducing the need for better matching components and/or trim circuitry.

Abstract: An electronic device is provided for analog to digital conversion using successive approximation. The device comprises a first ADC stage. The first ADC stage includes a first plurality of capacitors adapted to sample an input voltage, and adapted to be coupled to either a first reference signal level or a second reference signal level. At least one capacitor of the first plurality of capacitors is adapted to be left floating. A control stage is adapted to switch the at least one floating capacitor to the first reference signal level or the second reference signal level in response to an analog to digital conversion decision made by a second ADC stage.

Abstract: An apparatus is provided. The apparatus comprises an error amplifier that amplifies the difference between a reference voltage and a feedback voltage, a first variable impedance circuit coupled to the error amplifier that receives a control voltage from the error amplifier, a charge pump coupled to the variable impedance that receives an input voltage from the variable impedance, and a Miller compensator coupled to the charge pump and to the first variable impedance circuit. The Miller compensator receives the output voltage and output current from the charge pump. It also outputs the feedback voltage, adjusts the control voltage, and has a zero-pole that is proportional to a power of the output current of the charge pump.

Abstract: A method for handling watchdog events of an electronic device includes detecting a watchdog fault in a normal mode, which is a watchdog event in which a watchdog trigger is not correctly serviced; entering from the normal mode into a first escalation level of nx escalation levels upon detection of the watchdog fault, wherein nx is an integer equal to or greater than 1; detecting correct watchdog events, which are watchdog events in which a watchdog trigger is correctly serviced; and concurrently detecting watchdog faults, leaving the first escalation level if a first escalation condition is met. An electronic device embodiment includes a CPU and program instructions for carrying out the method.

Abstract: A method for handling watchdog events of an electronic device includes detecting a watchdog fault in a normal mode, which is a watchdog event in which a watchdog trigger is not correctly serviced; entering from the normal mode into a first escalation level of nx escalation levels upon detection of the watchdog fault, wherein nx is an integer equal to or greater than 1; detecting correct watchdog events, which are watchdog events in which a watchdog trigger is correctly serviced; and concurrently detecting watchdog faults, leaving the first escalation level if a first escalation condition is met, and recovering in a recovering step back from any of the nx escalation levels to a previous level or mode, if a de-escalation condition is met. An electronic device embodiment includes a CPU and program instructions for carrying out the method.

Abstract: In at least some embodiments, an electronic device includes a first data endpoint and differential data transceiver coupled to the first data endpoint. The differential transceiver provides a communication interface between the first data endpoint and a second data endpoint. The differential transceiver compensates for variations in a series impedance and/or a parallel impedance for a differential data line between the differential transceiver and the second data endpoint.

Abstract: A touch screen controller (1A) includes circuitry (2B) for generating a pen touch detection signal (PENTOUCH) having a first level if a touch point (Q) of a touch screen assembly (30,31) including first (30) and second (31) resistive screens is detected, and generating a second level of the pen touch detection signal if a touch point is not detected. A controller (41A) includes circuitry (58A) that generates an interrupt signal (IRQ) to be sent to a host processor (3) in response to the first level of the pen touch detection signal and for resetting the interrupt signal (IRQ) in response to the second level of the pen touch detection signal if the second level is received before a convert command is received from the host processor. The interrupt signal (IRQ) represents an interrupt service request for a convert command from the host processor (3). Resetting of the interrupt signal (IRQ) has the effect of canceling the interrupt service request.

Abstract: Various systems and methods for registering data are disclosed herein. For example, test enabled flip-flop devices are provided. Such devices include a test mode input signal and a register output signal. In addition, the devices include a flip-flop with a data input and a clock input. When the test mode input signal is de-asserted, the flip-flop is operable to register the data input upon a transition of the clock input. Further, the registered data input signal is provided as the register output signal. The devices also include a test circuit with a test data input. The test circuit is operable to provide the test data input signal as the register output signal when the test mode input signal is asserted.

Abstract: A DC-DC boost converter is provided that generally maintains discontinuous mode operation in a generally efficient manner. To accomplish this, a clamp generator, comparator, logic gates, a flip-flop, and counter are employed. These components generally operate together to determine if an over-limit condition has taken place, so that the ON time of the boost converters' switch can be varied accordingly.

Abstract: A heterodyne receiver comprising a gain controllable RF mixer (14) which has a first input connected to a first local oscillator (16) and a second input connected to an RF input. The receiver comprises a peak detector (38) which detects a peak value of an input signal at the second input of the HF mixer and generates a digital control signal if it is determined that the peak value of the input signal is above a predetermined level. A digital automatic gain control circuit (34) decreases upon reception of the digital control signal the gain of the RF mixer.

Abstract: A time-interleaved (TI) analog-to-digital converter (ADC) is provided. The TI ADC generally comprises a clock generator, two or more ADCs, adjustable delay elements, and an estimator. The clock generator generates clock signals. Each ADC is associated with at least one of the clock signals so as to sample an input signal that is generally wide-sense stationary at sampling instants, where correlation function exist between samples from a two or more of the ADCs that is a function of the time differences between associated sampling instants. The estimator is coupled to each of the adjustable delay elements and each of the ADCs so as to calculate the correlation function and adjust the adjustable delay elements to account for sampling mismatch between the ADCs based at least in part on the correlation function.

Abstract: An amplifier is provided that includes an output portion that sources and sinks current associated with an output load and an amplification portion that is biased by a relatively small bias current with respect to an output current of the amplifier. The amplification portion provides an amplified output signal to the output portion. The amplifier further comprises at least one impedance component coupled between the output portion and the amplification portion to alter at least one pole associated with the amplifier to mitigate instability of the amplifier related to the relatively small bias current.

Abstract: An apparatus is provided. The apparatus comprises a sample switch, a sampling capacitor, an amplifier, feedback branches, a second hold switch, an N-bit converter pair, a third hold switch, and an M-bit converter pair. The sample receives an input signal and is actuated by a sample signal. The sampling capacitor is coupled to the sample switch. The amplifier has a first input terminal that is coupled to the sampling capacitor. The feedback branches are coupled between the output terminal of the amplifier and the first input terminal of the amplifier, with each feedback branch including a feedback capacitor, and a first hold switch that is coupled to the feedback capacitor. The second hold switch is coupled to the sampling switch. The N-bit converter pair is coupled to the sampling switch and to the second hold switch. The third hold switch is coupled to at least one of the feedback branches, and the M-bit converter pair is coupled to the output terminal of the amplifier and to the third hold switch.

Abstract: A gated resonant tunneling diode (GRTD) that operates without cryogenic cooling is provided. This GRTD employs conventional CMOS process technology, preferably at the 65 nm node and smaller, which is different from other conventional quantum transistors that require other, completely different process technologies and operating conditions. To accomplish this, the GRTD uses a body of a first conduction type with a first electrode region and a second electrode region (each of a second conduction type) formed in the body. A channel is located between the first and second electrode regions in the body. A barrier region of the first conduction type is formed in the channel (with the doping level of the barrier region being greater than the doping level of the body), and a quantum well region of the second conduction type formed in the channel. Additionally, the barrier region is located between each of the first and second electrode regions and the quantum well region.

Abstract: An apparatus for analog-to-digital conversion using successive approximation is provided, which is adapted to be supplied with a single ended supply voltage. The device includes: a first analog-to-digital conversion stage including a first set of capacitors coupled with a side at a common node and adapted to sample an input voltage and to be coupled to either a first reference voltage level or a second reference voltage level, at least one capacitor of the first set of capacitors being adapted to be left floating, a control stage being adapted to connect the at least one floating capacitor to the first reference voltage level or the second reference voltage level in response to an analog-to-digital conversion decision made by a second analog-to-digital conversion stage. The first analog-to-digital conversion stage is operable to couple the common node to a supply voltage level, in particular ground, during analog-to-digital conversion.

Abstract: An apparatus for analog-to-digital conversion using successive approximation is provided. There is a successive approximation register or SAR controller for providing a digital code representing a conversion result, and an integral non-linearity (INL) compensator configured to provide an INL compensation signal for reducing INL of the analog-to-digital conversion in response to the digital code.

Abstract: A programmable offset amplifier includes first (M1) and second (M2) input transistors having differentially connected sources and gates coupled to first (Vin+) and second (Vin?) input voltages. A tail current (Itail1) is shared between the first and second input transistors. First (M3) and second (M4) load devices are coupled between a reference voltage and drains of the first and second input transistors, respectively. An output stage (13) has a first input (+) coupled to the drain of the second input transistor and a second input (?) coupled to the drain of the first input transistor. Programmable voltage changes are produced on input elements of programmable input offset circuitry to cause changes in offset voltages associated with electrodes of the input transistors which are reflected back to the amplifier input to provide a large programmable input-referred offset voltage.

Abstract: Traditionally, complementary metal oxide semiconductor (CMOS) and bipolar transistors have been separately employed in low voltage differential signal (LVDS) drivers. Here, a hybridized LVDS driver is provided with an input stage that uses CMOS transistors and output stages that use bipolar transistors. As a result of this hybridization, the LVDS driver has superior functional characteristics compared to conventional LVDS drivers as well as being able to function with a supply range between about 1.8V and 3.3V.