Abstract: A circuit generally comprising a memory and a logic circuit. The memory may comprise (i) a first section configured to (a) read and write data and (b) have a first configurable size and (ii) a second section configured to (a) read and write data independently of the first section and (b) have a second configurable size. The logic circuit may be configured to control the first configurable size and the second configurable size.

Abstract: An apparatus comprising an arbiter cell and a delay logic circuit. The arbiter cell may be configured to receive a plurality of request signals and provide two or more grant signals. The delay logic circuit may be configured to interface the arbiter cell and force each of the plurality of request signals to be serviced in succession when a metastable state occurs.

Abstract: A method of bridging an incoming packet from a first network to a second network. The method may comprise the steps of (A) reading a pointer for a first parameter within the incoming packet, (B) processing the first parameter in accordance with the pointer to produce a second parameter, and (C) presenting an outgoing packet containing the second parameter for the second network in response to step (B).

Abstract: A circuit generally comprising a database and a processing circuit. The database may be configured to store a pointer for each first parameter of a network protocol. The processing circuit may be configured to (i) process at least one of the first parameters in an incoming packet in accordance with the pointer to produce a second parameter and (ii) present an outgoing packet containing the second parameter.

Abstract: An integrated circuit or chip having a number of bond pads or inputs that may or may not have a bond wire connecting the pad to a supply voltage, ground or via a package pin to an external input when the chip is placed in the package. The circuits such as the input buffer connected to the pad are normally biased in the opposite voltage to that which the bond wire may be connected. For example, the input buffer circuitry connected to the bond pad, may see the pad as being connected to ground if the bond wires are connected, otherwise the input buffer circuitry will see the pad as being connected to VCC. When the pad is connected to a package pin then the end user may apply an electrical signal (e.g., supply voltage or ground) so that the integrated circuit may be configured as any one of a number of possible devices having one of a set of electrical attributes. Typically, the chip will have up to 8 such pads which can be used individually or in combination to configure the device.

Abstract: A circuit that may be configured to provide a first well bias voltage to the output buffer when the output buffer is in a first mode and to provide a second well bias voltage to the output buffer when the output buffer is in a second mode. The first well bias voltage and the second well bias voltage may be used to maintain a reverse bias in diffusion wells used for electrical isolation of transistors.

Abstract: An improved door closure indicator is provided. The indicator operates on pressure levels read within a pressurized chamber rather than from proximity switches coupled between the chamber and the door. If the door seals to the chamber, pressure within the chamber will quickly change, and the change will be read on a pressure sensor indicative of the door closure. According to one example, the chamber can comprise a vacuum chamber and the pressure sensor can be a vacuum monitor. Once vacuum is detected, it is determined with more absolutism that the door is actually closed rather than having to rely upon switch operation and/or alignment of the door activation mechanism to proximity switches arranged on the chamber housing.

Abstract: A circuit comprising a plurality of groups of memory cells and a control circuit. The plurality of groups of memory cells may each (i) have a first and a second bitline and (ii) configured to read and write data to one or more of the plurality of groups of memory cells. The control circuit may be configured to select an active group of the plurality of groups in response to one or more control signals. The control circuit may be implemented within the groups of memory cells.

Abstract: An apparatus including a first circuit and a second circuit. The first circuit may be configured to generate one or more first control signals in response to a reference impedance. The second circuit may be configured to operate in (i) a first mode in response to a first state of a second control signal and (ii) a second mode in response to a second state of the second control signal. When the second circuit is in the first mode, an output impedance of the second circuit may be adjusted in response to the one or more first control signals and the one or more first control signals may be presented at a first input/output of the second circuit. When the second circuit is in the second mode, the output impedance of the second circuit may be adjusted in response to one or more third control signals received at a second input/output of the second circuit.

Abstract: A device and a method are provided for isolating a circuit well from a substrate of the same conductivity type. In particular, an integrated circuit is provided which includes a circuit well arranged over a semiconductor substrate with no layer of opposite conductivity type arranged between the well and the substrate. The integrated circuit may further include a pair of isolation wells extending along opposite lateral boundaries of the circuit well. The isolation wells and circuit well may be adapted such that a single continuous depletion region underlying the circuit well may be formed upon application of an isolation voltage between the substrate and the pair of isolation wells. The formation of such a depletion region may beneficially isolate the circuit well from the underlying substrate.

Abstract: An apparatus comprising a storage element coupled between a first and a second bond pad, the storage element having a physical characteristic that can be measured and altered. Data may be stored in the storage element by altering the physical characteristic.

Abstract: A system and method for reconfiguring a peripheral device connected by a computer bus and port to a host from a first generic configuration to a second manufacturer specific configuration is provided in which the configuration of a peripheral device may be electronically reset. A peripheral interface device for a standardized computer peripheral device bus and port is also provided in which a physical disconnection and reconnection of the peripheral device is emulated to reconfigure the bus and port for a particular peripheral device.

Abstract: A circuit comprising a clock generator and a state machine. The clock generator may be configured to generate an output clock signal in response to (i) a first enable signal and (ii) a second enable signal. The state machine may be configured to generate the second enable signal in response to a first and a second control signal.

Abstract: A method and system for automatically identifying configuration cell addresses in a schematic hierarchy is disclosed. In one embodiment of the present invention, a memory cell (e.g., a configuration bit) is identified in a schematic hierarchy. Next, this embodiment determines an address for the memory cell. Then, this embodiment determines a unique name for the memory cell. The name is comprised of a hierarchical logical name and a schematic path name. By traversing the schematic and using logical names, all addresses of configuration bits of a circuit design may be automatically determined. The process is repeated for each memory cell in the schematic. This embodiment stores the unique name of the configuration bit and the address of the configuration bit in a data structure.

Abstract: An apparatus comprises two or more memory elements connected in parallel and programmed alike, where the memory elements comprise a high speed path of a programmable logic device.

Abstract: A programmable switch includes at least one or more pass transistors having a control voltage that is greater than the data path reference voltage that is selected by a corresponding pass transistor. The control voltage is provided by a higher voltage power supply than the power supply that provides the data path reference voltage. In one embodiment, the higher voltage supply is a quiet supply that is not loaded with devices that switch during normal operation of the programmable switch such as CMOS devices. In another embodiment, the power supply that provides a voltage to an I/O circuit of the probable switch is the power supply that is utilized to provide the control voltage to the pass transistors. In a particular embodiment, the pass transistors comprise higher voltage tolerant devices than other devices in the programmable device. In a particular embodiment, the higher voltage supply is at least the data path reference voltage plus the threshold voltage of the pass transistors.

Abstract: An apparatus comprising a native device coupled to an input of an amplifier. The native device is configured to provide a high voltage protection in response to an enable signal.

Abstract: A method and system for automatically proactively debugging fitting problems in programmable devices. Automatic fitters are computer programs that place and route circuit resources within a programmable device, e.g., a complex programmable logic device (CPLD) to determine the resources used and timing for a given hardware design. Upon a fitting failure for an IC or hardware design, an embodiment first may identify any specific architectural information, if any, causing the failure and may advise the user including solution recommendations. Second, an embodiment obtains a larger device having the same pin package, if available, or a virtual device, and may perform a second fitting on the hardware design but using this larger device. If this fits properly, then the resulting pin assignment is fixed and a third fitting may be performed on the smaller device with the fixed pin assignment. If this fails, further architectural violations are identified and solution recommendations are given to the user.

Abstract: A circuit than may be used in an integrated circuit capacitor design. The circuit generally comprises a multilayer capacitor and a buffer. The multilayer capacitor may be configured as (i) a first capacitance, (ii) a second capacitance, and (iii) a third capacitance in series between the first capacitance and the second capacitance. The buffer may be configured to maintain a constant voltage across the third capacitance to isolate the first capacitance from the second capacitance.

Abstract: Architecture, circuitry, and methods are provided for producing a content addressable memory (CAM). The CAM includes one or more CAM cells arranged in an array. Each CAM cell is symmetrical about its x- and y-axis to form rows and columns of the array. Additionally, each CAM cell can use either SRAM or DRAM storage cells implemented in either a binary or ternary arrangement. If the CAM cell is a ternary SRAM design, then the cell size is no more than 4 microns by 1-½ microns, assuming a 0.15 micron critical dimension. Critical dimension is noted as the smallest resolvable size for the particular process being employed. The CAM cell utilizes a selection circuitry that will disable the compare circuit during times when a compare operation is not being performed. This will ensure the compare circuit will not consume power during, for example, a read or write operation.