Abstract: A CML latch includes an input stage including input nodes to receive a differential input signal and output nodes to provide a differential intermediate output signal, and a negative output node to provide a negative side of the differential intermediate output signal, a negative resistance stage including an input node connected to a first voltage source and output nodes connected to the output nodes of the input stage, and a latch stage including input nodes connected to the output nodes of the input stage and output nodes to provide a differential output signal. The negative resistance stage increases a current gain of the input stage.

Abstract: A delay-locked loop (DLL) has a fractional phase frequency (PF) detector that reduces false locking and harmonic locking. The PF detector has a trunk, an upper branch, a lower branch, and a logic module. A delay line provides the PF detector a set of fractional phase-delayed clock signals that are used to prime and/or activate corresponding flip-flops of the trunk, upper branch, and lower branch in a sequence. The use of flip-flops in the lower branch activated by different fractional phase-delayed clock signals avoids false locking and harmonic locking over a wider range of initial delay magnitudes than conventional DLLs.

Abstract: A method for assembling a packaged semiconductor device includes mounting a pressure-sensing die onto a die paddle of a metal lead frame. A pressure-sensitive gel is dispensed into a recess of a lid, and the lead frame is mated with the lid such that the pressure-sensing die is immersed in the pressure-sensitive gel within the recess of the lid.

Abstract: A low resistance polysilicon (poly) structure includes a first poly coupled to a substrate and having a sidewall. A second poly is separated from the sidewall of the first poly and the substrate by a programming oxide. The first poly and the second poly have substantially a same planarized height above the substrate. The first poly extends from a device region to a strap region, and extends substantially parallel to a first length of the second poly. A second length of the second poly extends away from the first poly in the strap region and includes a salicide. A first diffusion region crosses the first poly and the second poly in the device region. A masked width of the first length of the second poly is defined by an etched spacer. A low resistance contact is coupled to the second length of the second poly in the strap region.

Abstract: A content addressable memory (CAM) and methods of operating a CAM are provided. The method for operating a CAM includes: during a first mode, performing a search function in a CAM bit array, the search result output at a match port of the CAM bit array; and during a second mode, columnwise reading data in the CAM bit array, the read column data output at the match data port of the CAM bit array. The method may include writing the CAM bit array with a predetermined data pattern. The method may further include providing an indication of pass/fail based upon comparing the read column data with expected data.

Abstract: A packaged integrated circuit (IC) device includes a flexible substrate having contact pads, an IC die mounted on the substrate and electrically connected to the contact pads, and conductive threads sewn into the substrate. The conductive threads have proximal ends electrically connected to corresponding ones of the contact pads with conductive bumps. The conductive threads eliminate the need for a complicated multi-layer substrate structure for interconnect fan-out so the substrate may be formed of a variety of materials such as cloth or paper.

Abstract: A hardware interface component arranged to operably couple at least one arithmetic unit to a an interconnect component of a processing system. The hardware interface component comprises a plurality of program-visible registers and at least one operation decoder component. The at least one operation decoder component is arranged to, upon receipt of a write access request via the interconnect component corresponding to a decorated memory-mapped address range for the hardware interface component, decode a register identifier component of a target address of the received write access request to identify at least one of the program-visible registers, decode a decoration component of the target address of the received write access request to identify an arithmetic operation to be performed, and configure the arithmetic unit to perform the identified arithmetic operation on at least one input operand within the identified at least one program-visible register.

Abstract: A transceiver circuit for operating in a controller area network (CAN), having a CAN bus network and a control unit, that supports a flexible data rate (CAN FD), is described. The transceiver circuit comprises: a transmit CAN path and a receive CAN path; an input node on the transmit CAN path; a detection module operably coupled to the input node on the transmit CAN path and arranged to receive an input frame from the control unit before the input frame is transmitted on the CAN bus network and determine whether the input frame on the transmit CAN path comprises a CAN FD frame; and at least one switching module, operably coupled to the detection module and coupleable to the CAN bus network, where the at least one switching module is operable to impart a first voltage value on the CAN bus network in response to the input frame being determined as comprising a CAN FD frame.

Abstract: A semiconductor device includes a test port configured to communicate with a test system, a test command controller coupled to communicate with the test port, a peripheral module configured to communicate with the test command controller, a processor, and a test memory configured to communicate with the test command controller and the processor. The test command controller is configured to issue a first set of one or more instructions to test the peripheral module and to issue a second set of one or more instructions to the processor to process information in the test memory resulting from the test of the peripheral module.

Abstract: A protection circuit and a gate driving circuitry. The protection circuit is for protecting a p-type back-to-back MOS switch. The circuit receives an input driving signal and provides a driving output signal to common gates of the p-type back-to-back MOS switch. The circuit comprises a driving signal insulation switch for disconnecting the common gate of the p-type back-to-back MOS switch from the received input driving signal when the voltage of the common gates is larger than the supply voltage of the circuit. The circuit further comprises a gate source coupling switch for coupling a voltage received at the common source of the p-type back-to-back MOS switch to the common gate if a received voltage at the common sources is larger than a reference voltage Vref.

Abstract: An integrated circuit device comprises at least one power gating arrangement, including at least one gated power domain, and at least one power gating component operably coupled between at least one node of the at least one gated power domain and at least a first power supply node. The at least one power gating component is arranged to selectively couple the at least one node of the at least one gated power domain to the at least first power supply node.

Abstract: A packaged semiconductor device is made by forming a conductive pad on an external surface of an integrated circuit device, forming a passivation layer over the conductive pad, removing a portion of the passivation layer over a bond area on the conductive pad, forming a sacrificial anode around a majority of a periphery surrounding the bond area, forming a conductive bond in the bond area, and forming an encapsulating material around the conductive bond and an exposed portion of the sacrificial anode.

Abstract: A protection unit of a subroutine stack accessible by a CPU controlled by one main software program, for storing and removing stack frame(s), the stack protection unit being coupleable to the stack and the CPU, comprising: a processor coupled to a first and a second address register; wherein, when a first stack frame is stored onto the stack and the execution of the main software program is suspended by the CPU due to the execution of a subroutine; the processing unit is adapted to set one access rule based on the first and second address registers, preventing: the ongoing subroutine, from accessing a hardware-protected region of the stack, comprising at least one stack frame associated with a return address from which the main software program resumes execution after termination of the execution of the subroutine. A processor, a method and a computer program are also claimed.

Abstract: A network node of a wireless communication network comprises a receiver receiving an input signal from a remote transmitter of the wireless communication system via a transmission channel. A signal to noise ratio calculator is arranged to calculate a signal to noise ratio of the received input signal. A soft bit normalizer is arranged to determine a plurality of normalized soft bits using the input signal. A primary detector is arranged to detect a discontinuous transmission on the transmission channel using the plurality of the normalized soft bits and the signal to noise ratio, and if a discontinuous transmission on the transmission channel is detected, generate a DTX-decision or else trigger a refinement detector. The refinement detector is arranged to decode the normalized soft bits and to generate a further decision about whether the signal indicates a discontinuous transmission on the transmission channel using the decoded normalized soft bits.

Abstract: A switching power converter for DC-DC converting has an inductance coupled between a power output and a high side switch in a controller device. The controller device has an error amplifier coupled to the power output and a reference voltage for activating the high side switch. The controller device has a bypass circuit including a bypass switch coupled between the supply input and the power output, a bypass driver having a first input coupled to the power output and a second input coupled to the reference voltage, and an output coupled to the bypass switch for activating the bypass switch. The controller further has a high bypass current sensor for generating a transient signal based on a current via the bypass switch, and a bandwidth control circuit for increasing the bandwidth of the error amplifier based on the transient signal.

Abstract: A phased-array receiver comprises a plurality of analog beamforming receive channels, each comprising an antenna element arranged to receive a radio frequency signal and a channel output arranged to provide an analog channel output signal. At least one of the plurality of analog beamforming receive channels comprises an in-phase downconversion mixing circuit connected to the antenna element and a local oscillator source and arranged to provide a downconverted in-phase signal to a phase rotation circuit, and a quadrature downconversion mixing circuit connected to the antenna element and the local oscillator source and arranged to provide a downconverted quadrature signal to the phase rotation circuit. The phase rotation circuit is arranged to provide to the channel output a phase-shifted analog output signal generated from the downconverted in-phase signal and the downconverted quadrature signal.

Abstract: A method of testing software uses a debugger and a breakpoint handler. The debugger inserts a breakpoint in a target application and enters at least one filtering condition associated with the breakpoint in a data structure. When during execution the target application encounters a breakpoint at an address, the target application transfers execution to the breakpoint handler. The breakpoint handler uses the address to retrieve filtering conditions from the data structure, executes code for evaluating the filtering condition, and transfers execution back to the target application if the filtering condition is not met.

Abstract: A method of performing register allocation for at least one program code module. The method comprises constructing a restriction graph for program variables within at least one program instruction, and determining whether the constructed restriction graph is colourable. The method further comprises, if it is determined that the constructed restriction graph is not colourable, determining whether at least one alternative form of the at least one program instruction is available, and modifying the at least one program instruction to comprise an alternative form if it is determined that at least one alternative form is available.

Abstract: A voltage level shifter for high voltage applications has a low voltage domain current mirror having first and second branches. A high voltage switch and a resistor are connected in series with the second branch. An output stage provides an output signal that is a function of a voltage difference across the resistor, and the output stage and the resistor are in the high voltage domain. Assertion of an input signal in the low voltage domain develops a first current in the first branch, and causes the high voltage switch to pass in the resistor a second current from the second branch that is a function of the first current and develops the voltage difference across the resistor. Only the high voltage switch needs to have high breakdown voltage characteristics.

Abstract: A semiconductor wafer has a multi-stage structure that damps and contains nascent cracks generated during dicing and inhibits moisture penetration into the active region of a die. The wafer includes an array of die regions separated by scribe lanes. The die regions include an active region and a first ring that surrounds the active region. A portion of the first ring includes a low-k dielectric material. A second ring includes a stack of alternating layers of metal and interlayer dielectric (ILD) material. A dummy metal region around the rings includes a stacked dummy metal features and surrounds the active region. A regular or irregular staggered arrangement of saw grid process control (SGPC) features reduces mechanical stress during dicing.