Abstract: A system on a chip for securing data is described. The system on a chip comprises: a controller arranged to: partition a data block into a plurality of segments; and determine and extract a subset of the plurality of segments to be compressed. A compressor logic circuit is arranged to receive and compress the subset of the plurality of segments. The controller is arranged to retrieve the compressed subset of the plurality of segments from the compressor logic circuit and attach the compressed subset of the plurality of segments to a remainder of the partitioned data block for transmission.

Abstract: An updated integrated circuit (IC) design is generated by applying a histogram-based algorithm to an invalid, current IC design. The histogram-based algorithm includes worst negative slack (WNS) optimization followed by total negative slack (TNS) optimization. WNS optimization uses the slack histogram for the current IC design to generate an invalid, but improved, intermediate IC design. TNS optimization uses the slack histogram of the intermediate IC design to generate the updated IC design.

Abstract: A method of fabricating an integrated circuit (IC) device includes mounting, via a first surface thereof, at least one semiconductor die on to a surface of an IC device package, mounting, via an interconnect surface thereof, at least one fuse component on to a second surface of the at least one semiconductor die, the second surface of the at least one semiconductor die having at least one terminal of the at least one active component. The at least one fuse component is mounted such that the interconnect surface of the at least one fuse component is thermally coupled to the second surface of the at least one semiconductor die and electrically coupled to the at least one terminal of the at least one active component.

Abstract: A matching network and method for matching a source impedance to a load impedance is provided. A bias feed microstrip structure is coupled to a direct current (DC) voltage source and has a bias feed microstrip electrical length less than one fifth of a fundamental wavelength of a fundamental frequency component of an input signal. A harmonic impedance transformation network can be configured to compensate for parasitic reactances of a precursor element. A tuned impedance element presents a short circuit impedance at the second harmonic impedance transformation network terminal for harmonic frequency components and presents a higher impedance for the fundamental frequency component. A fundamental impedance transformation network is configured to match a fundamental impedance transformation network input impedance for the fundamental frequency component to a load impedance of a load. Multiple instances of the harmonic impedance transformation network and the tuned impedance element can be provided.

Abstract: This disclosure describes a multi-height routing cell and utilization of the multi-height routing in an integrated circuit to reduce routing congestion in a standard cell design floorplan. The multi-height routing cell includes a bypass connection, or “tunnel,” that routes a signal through a non-routing layer and under an impeding power rail. The multi-height routing cell includes bypass connectors on both sides of the bypass connection that provide connection points for which to connect standard cells on opposite sides of the impeding power rail. As such, the multi-height routing cell provides a route underneath the impeding power rail and, in turn, reducing routing congestion in the standard cell design floorplan.

Abstract: A display processor device is for processing display image data by overlaying a multitude of image layers. Pixel values of at least one of the image layers are stored in a memory and may comprise pixels values having a single predefined value, such as transparency. The display processor has a fetch unit for selectively fetching stored pixel values from the memory by skipping stored pixels values having the single predefined value according to a fetch mask indicative of pixels values having the single predetermined value. Advantageously the bandwidth for accessing the memory is reduced, because less pixel data values need be retrieved. Power consumption may be reduced, and slower memories may be applied.

Abstract: A method of searching of base stations in a mobile communication system has a first stage of detecting at least one slot boundary, a second stage of detecting at least one frame boundary and a scrambling code group, and a third stage of detecting a scrambling code. Multiple possible base stations are identified by determining a first threshold based on correlation values of correlating the input signal with a primary synchronization channel code. For each hit, the input signal is aligned to the corresponding slot boundary, an average correlation value is based on all correlations with secondary sequences, and a second threshold based on the average correlation value is set. Any delay and codewords that have a correlation value above the second threshold are correlated with the codes in the detected group so as to determine multiple base stations.

Abstract: A current sense circuit for a PWM driver comprises: a PWM control circuit comprising: a first switching device arranged to receive a PWM signal from the PWM driver whose current is to be sensed; and a second switching device whose supply current is arranged to track the sensed current of the PWM driver. An ADC is operably coupled to the first and second switching device. The ADC comprises: a DAC arranged to provide a current sense to the second switching device that tracks the current passing through the PWM driver; a first comparator arranged to receive and compare an output current from the DAC and an output current from the first switching device; and a first successive approximation register arranged to receive an output from the comparator and provide: a first output to the ADC; and a second output that provides a representation of the sensed current.

Abstract: A method of controlling access by a master to a peripheral includes receiving one or more interrupt priority levels from one or more interrupt controllers associated with the peripheral, comparing the one or more interrupt priority level with respective one or more pre-established interrupt access levels to obtain an interrupt level comparison result, establishing whether an access condition is satisfied in dependence on at least the interrupt level comparison result, and if the access condition is satisfied, granting access. If the access condition is not satisfied, access is denied. Further, a circuitry is described including one or more masters, one or more peripherals, and an access control circuitry including one or more interrupt controllers associated with the one or more peripherals. The access control circuitry is arranged to perform a method of controlling access by a master of the one or more masters to a peripheral of the one or more peripherals.

Abstract: An integrated circuit that supports both internal and external voltage regulators as well as various modes, such as a low power mode or a test mode, includes voltage regulator selection circuitry and power control circuitry. The regulator selection circuitry selects one of internal and external regulators based on two pin conditions. The power control circuitry controls ON/OFF status of the regulators corresponding to a power mode, including power-on reset, entering a low power mode, and wake-up from a low power mode.

Abstract: A system provides synchronous read data sampling between a memory and a memory controller, which includes an asynchronous FIFO buffer and which outputs a clock and other control signals. An outbound control signal (e.g., read_enable) is used to time-stamp the beginning of a read access using a clock edge counter. The incoming read data is qualified based on the time-stamped value of the read_enable signal plus typical access latency by counting FIFO pops. The system performs correct data sampling irrespective of propagation delays between the controller and memory. The system may be implemented in a System on a Chip (SOC) device having a synchronous communication system.

Abstract: A circuit for determining a threshold indication of temperature with respect to a threshold temperature. The circuit includes a timer circuit and a temperature sensor circuit having an counter whose output has a relationship to temperature. At the end of a period determined by the timer circuit, a comparator circuit compares the count of the counter with an indication of the threshold temperature to determine a state of the threshold indication. In response to a change in state of the threshold indication, the circuit changes one of the count time or the counter output's relationship to temperature to provide a hysteresis for the threshold indication.

Abstract: A memory having a memory array having a plurality of word lines, a plurality of bit cells coupled to the word lines, and a plurality of control memory cells coupled to the word lines. Each word line of the plurality of word lines has a control memory cell coupled thereto and each control memory cell has an output. The memory also has a plurality of logic circuits coupled to the plurality of word lines. The output of each control memory cell is coupled to a corresponding one of the plurality of logic circuits. The plurality of logic circuits prevents access to the word line selected by a row address if the output of the control memory cell coupled to the selected word line is in a first logic state.

Abstract: A circuit for driving a control gate of a split-gate nonvolatile memory cell may include a switched current source; a first transistor having a current electrode coupled to the switched current source and a control electrode coupled to a voltage source; a second transistor having a current electrode coupled to a second node of the switched current source, and a control electrode coupled to a third voltage source; a third transistor having a control electrode coupled to the second transistor, a current electrode coupled to the first transistor and a fourth switched voltage source; and a fourth transistor having a current electrode coupled to the first switched voltage source, a control electrode coupled to the switched current source, and a second current electrode coupled to the second transistor at a driver voltage node, wherein a voltage level at the driver voltage node is operable to drive the control gate.

Abstract: A method includes, in one implementation, performing a memory operation to place memory cells of a memory array to a first logic state using a voltage of a charge pump. A portion of the operation is performed on the memory cells using the voltage of the charge pump. A temperature of the memory array is compared to a threshold. If the temperature is above a reference level, a load on the charge pump is reduced by providing the voltage to only a reduced number of memory cells.

Abstract: A method of forming a packaged semiconductor device includes loading an array of package sites in position for saw singulation, saw singulating the array of package sites, and performing a non-electrolytic plating operation on exposed lead tips of individual packages from the array of package sites as the array of package sites is saw singulated.

Abstract: System circuitry includes a logic circuit having an input and an output that is a functional element of the system circuitry. Pattern application circuitry is coupled to the input of the logic circuit and provides an input pattern to the input of the logic circuit. The input pattern has a valid signature based upon a comparison of the input and the output of the logic circuit when the logic circuit is functioning properly. A logic comparator is coupled to the input and the output of the logic circuit and generates pulses in response to the input pattern. A counter is coupled to the logic comparator that obtains a count of the pulses generated by the logic comparator in response to the input pattern. A signature comparator is coupled to the counter and generates a warning signal if the valid signature is different from the count.

Abstract: Upon detecting an occurrence of a watchpoint event for debugging a computer processing system, at least a portion of at least one message in a trace message buffer is flushed when a characteristic of the at least one of the messages matches a specified characteristic.

Abstract: A monitoring system for detecting stress degradation of a semiconductor integrated circuit has an amplifier circuit and degradation test transistors. Multiplexers are provided that have an output coupled to a respective electrode of the degradation test transistor. Each of the multiplexers has an input coupled to one of the monitor nodes and a respective node of the amplifier circuit. In operation, the multiplexers selectively insert the degradation test transistor into either the integrated circuit or the amplifier circuit so that when inserted into the integrated circuit the degradation test transistor is subjected to stress degradation voltages in the integrated circuit. When the degradation test transistor is inserted into the amplifier circuit, an output signal is generated that is indicative of stress degradation of the integrated circuit.

Abstract: A multiple-path, configurable, radio-frequency (RF) circuit is provided, including: a first amplifier path amplify a first RF signal to generate a first amplified signal; a second amplifier path configured to amplify a second RF signal to generate a second amplified signal; a corrective input matching circuit, configured to change first input-impedance-matching properties of the first amplifier path, and to change second input-impedance-matching properties of the second amplifier path; a first isolation element configured to selectively ground an input node of the second amplifier path; a second isolation element configured to selectively ground an output node of the second amplifier path; and a third isolation element connected between the first and second amplifier paths, configured to selectively isolate the corrective input matching circuit from first and second input nodes of the first and second amplifier paths, respectively, or connect the corrective input matching circuit to the first and second input