Abstract: Clock control circuitry for an integrated circuit, a method of testing an integrated circuit having a clock gate, an integrated circuit and a library of cells including the clock control circuitry are provided. In one embodiment, the integrated circuit includes: (1) a clock gate configured to apply a clock signal to at least a first scan chain of the integrated circuit, (2) combinational logic coupled to an input of the clock gate and (3) Design-for-Test logic located external to the combinational logic and coupled to the clock gate and a first cell of a second scan chain of the integrated circuit, the Design-for-Test logic configured to control operation of the clock gate based on a logic value of the first cell.

Abstract: A method for detecting a failure in a serial topology. The method may comprise sending a predetermined pattern to a plurality of devices communicatively connected to an initiator in a serial topology; receiving a return result from each of the plurality of devices in response to the predetermined pattern; recognizing a problem associated with a particular device among the plurality of devices, the problem being recognized based on the return result from the particular device; sending a plurality of test patterns to the particular device; receiving a plurality of test results from the particular device in response to the plurality of test patterns; and determining a cause of the problem based on the plurality of test results, the cause of the problem being at least one of: a cable failure and a device failure.

Abstract: A storage system comprising: a SCSI initiator being configured for receiving a data request and providing a SMP request corresponding to the data request, the SCSI initiator being further configured for encapsulating the SMP request into a first SCSI command; a SCSI target being configured for receiving the first SCSI command, the SCSI target being further configured for recognizing encapsulation of the SMP request and obtaining the SMP request from the first SCSI command; and an SMP target being configured for processing the SMP request and providing an SMP response to the SCSI target. The SCSI target being further configured for acknowledging the SCSI initiator upon reception of the SMP response; and the SCSI initiator being further configured for sending a second SCSI command to the SCSI target to retrieve the SMP response.

Abstract: The disclosure provides embodiments of ICs and a method of testing an IC. In one embodiment, an IC includes: (1) a functional logic path having a node and at least one sequential logic element and (2) test circuitry coupled to the functional logic path and having a delay block, the test circuitry configured to form a testable path including the delay block and the node in response to a test mode signal, wherein a delay value of the delay block is selected to detect a small delay defect associated with the node.

Abstract: Various embodiments of the present invention provide systems and methods for acquiring timing and/or gain information. For example, various embodiments of the present invention provide data processing circuits that include a sample splitting circuit, a first averaging circuit, a second averaging circuit and a parameter calculation circuit. The sample splitting circuit receives a data input that includes a series of samples that repeat periodically over at least a first phase and a second phase. The sample splitting circuit divides the series of samples into at least a first sub-stream corresponding to the first phase and a second sub-stream corresponding to the second phase. The first averaging circuit averages values from the first sub-stream to yield a first average, and the second averaging circuit averages values from the second sub-stream to yield a second average. The parameter calculation circuit calculates a parameter value based at least in part on the first average and the second average.

Abstract: A system comprising a host, a solid state device, and an abstract layer. The host may be configured to generate a plurality of input/output (IO) requests. The solid state device may comprise a write cache region and a read cache region. The read cache region may be a mirror of the write cache region. The abstract layer may be configured to (i) receive the plurality of IO requests, (ii) process the IO requests, and (iii) map the plurality of IO requests to the write cache region and the read cache region.

Abstract: A nonvolatile trap charge storage cell selects a logic interconnect transistor uses in programmable logic applications, such as FPGA. The nonvolatile trap charge element is an insulator located under a control gate and above an oxide on the surface of a semiconductor substrate. The preferred embodiment is an integrated device comprising a word gate portion sandwiched between two nonvolatile trap charge storage portions, wherein the integrated device is connected between a high bias, a low bias and an output. The output is formed by a diffusion connecting to the channel directly under the word gate portion. The program state of the two storage portions determines whether the high bias or the low bias is coupled to a logic interconnect transistor connected to the output diffusion.

Abstract: A method of automatically classifying defects. The method generally includes the steps of (A) receiving information for a current defect, (B) extracting field values from the current defect, (C) counting a number of occurrences of one or more keywords in the current defect, (D) determining one or more new keywords occurring in the current defect and storing the one or more new keywords in a database and (E) creating one or more linkages in the database between a first record corresponding to the current defect and one or more second records corresponding to previous defects based upon one or more similarities between the first and the second records.

Abstract: To ensure that a memory device operates in self-refresh mode, the memory controller includes (1) a normal-mode output buffer for driving a clock enable signal CKE onto the memory device's CKE input and (2) a power island for driving a clock enable signal CKE_prime onto that same input. To power down the memory controller, the normal-mode output buffer drives signal CKE low, then the power island drives signal CKE_prime low, then the memory controller (except for the power island) is powered down. The power island continues to drive the memory device's CKE input low to ensure that the memory device stays in self-refresh mode while the memory controller is powered substantially off. To resume normal operations, the power module powers up the memory controller, then the normal-mode output buffer drives signal CKE low, then the power island is disabled, then the memory controller resumes normal operations of the memory device.

Abstract: A comparator determines the fidelity of a response vector received from a memory under test. The comparator includes a first logic gate configured to output a first value that is the logical OR of a first proper subset of bits of the response vector. A second logic gate is configured to output a second value that is the logical NAND of the proper subset of bits. A first multiplexer is configured to select between the first and second values based on the value of a first bit of a check vector corresponding to the response vector.

Abstract: A radiation sensor for an integrated circuit (IC), a radiation sensing method and an IC incorporating the sensor or the method. In one embodiment, the radiation sensor includes: (1) a built-in self-test (BIST) controller configured to provide BIST with respect to main IC circuitry of the IC and (2) a radiation sensor controller coupled to the main IC circuitry and the BIST controller and configured to identify temporarily inactive portions of the main IC circuitry and cause the BIST controller to perform at least one BIST with respect to at least one of the portions, the at least one of the portions acting as a radiation target.

Abstract: A computing system peripheral device compatible with the peripheral component interconnect express (PCI-E) protocol responds to a DL_DOWN command primitive by configuring a general-purpose input/output (GPIO) port into a known state without invoking a GPIO module reset. In addition, select resources are excluded from resources on the peripheral device that are issued a reset command. The select resources can include a GPIO module, a memory element and a PCI-E SERDES module. After the remaining reset resources have completed their individual initialization processes, the central processor core on the peripheral device is reset. The described response to the DL_DOWN command primitive avoids cache data loss, masks signal transitions on I/O ports and timing problems that prevent some peripheral devices from being recognized in a computer's basic input/output system (BIOS).

Abstract: A digital latch circuit substantially reduces leakage current in output stages of edge-triggered digital switching devices. The circuit comprises first and second NAND gates for receiving first and second input signals and providing first and second output signals. The first NAND gate includes a first A input for receiving the first input signal, a first B input connected to a second NAND gate output, a first leakage current control input connected to a second A input of the second NAND gate, and a first NAND gate output for providing the first output signal. The second NAND gate includes the second A input for receiving the second input signal, a second B input connected to the first NAND gate output, a second leakage current control input connected to the first A input of the first NAND gate, and the second NAND gate output for providing the second output signal.

Abstract: A method includes storing at least one user datum received from a user in a secure storage portion of a memory within a mobile communication device. Authentication information is received into the mobile communication device. The at least one user datum is transmitted from the mobile communication device to a recipient in response to entry of the authentication information, while preventing the user of the mobile communication device from reading the at least one user datum.

Abstract: A modulated clock, a method of providing a modulated clock signal, an integrated circuit including a modulated clock and a library of cells including a modulated clock. In one embodiment, the modulated clock includes (1) a clock controller configured to generate a digital control stream and (2) clock logic circuitry having a first input configured to receive a clock signal and a second input configured to receive the digital control stream. The clock logic circuitry is configured to provide a modulated clock signal in response to the clock signal and the digital control stream, wherein the modulated clock signal has an effective frequency that differs from the first frequency.

Abstract: An apparatus including a control circuit and an encoder circuit. The control circuit may configured to generate a first control signal and a second control signal. The encoder circuit may be configured to (i) receive a plurality of coefficients, the first control signal and the second control signal and (ii) generate an encoded signal in response to the plurality of coefficients, the first control signal and the second control signal. The encoder circuit may be further configured to simultaneously encode run before syntax elements with the plurality of coefficients.

Abstract: The present invention is directed to a distributed architecture of an information handling system, including a buried nucleus inaccessible for inspection without heroic means while the buried nucleus is in operation, and a trusted authority for generating a secure protocol. The secure protocol controls the operation of the buried nucleus.

Abstract: A packaged integrated circuit having a thermal pathway to exhaust heat from the integrated circuit. The integrated circuit is disposed on a package substrate, with an encapsulant disposed around the integrated circuit. A heat sink is disposed at least partially within the encapsulant, with at least a portion of one surface of the heat sink exposed outside of the encapsulant. The integrated circuit has an uppermost passivation layer, where the passivation layer is not electrically conductive, with a port disposed in the passivation layer. The port extends completely through the passivation layer to expose an underlying layer. A thermal pathway is disposed at least partially within the port, and makes thermal contact to both the underlying layer and the heat sink. The thermal transfer rate of the thermal pathway is greater than the thermal transfer rate either the passivation layer or the encapsulant.

Abstract: The methods and structure herein provide for expanding the storage capacity of a RAID storage system while maintaining the same level of RAID storage management. A RAID storage controller may be coupled between a host computer and a RAID storage volume. The RAID storage controller manages the disk drives of the storage volume to present a single logical volume of storage to the host computer. When a storage expansion is desired, the RAID storage controller may communicatively couple to at least one expansion disk drive and begin transfer of data from the original RAID storage volume to the expansion disk drive(s). During this data transfer, read and write operations are continued to the original RAID storage volume. Additionally, the RAID storage controller duplicates write operations to the expansion disk drive(s) such that general storage operations required by the host computer are continued.

Abstract: Data segments are logically organized in clusters in a data repository of a data storage system. Each clusters contains compressed data segments and data common to the compression of the segments, such as a dictionary. In association with a write request, it is determined in which of the clusters would the data segment most efficiently be compressed, and the data segment is stored in that data cluster.