Patents Assigned to LSI
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Publication number: 20080313249Abstract: A random number generator includes a ring oscillator having an EX-OR gate and four inverters together forming a loop. This loop enters stable state for a start signal having the low level and oscillates for the start signal having the high level. When the start signal has a pulse of a width shorter than the loop's delay time, output nodes responsively, sequentially enter metastable state hovering between the high and low levels. The metastable waveform becomes smaller with time and finally disappears. As metastable state cannot be controlled in longevity, it disappears at any random number node. A counter thus outputs a signal serving as true random number data depending on the longevity of the metastable state. A random number generator miniaturized and having reduced power consumption, and of high performance can thus be implemented.Type: ApplicationFiled: August 18, 2008Publication date: December 18, 2008Applicants: RENESAS TECHNOLOGY CORP., RENESAS LSI DESIGN CORPORATIONInventors: Kazuhiko Fukushima, Atsuo Yamaguchi
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Publication number: 20080308882Abstract: A method to maintain a well-defined gate stack profile, deposit or grow a uniform gate dielectric, and maintain gate length CD control by means of an inert insulating liner deposited after dummy gate etch and before the spacer process. The liner material is selective to wet chemicals used to remove the dummy gate oxide thereby preventing undercut in the spacer region. The method is aimed at making the metal gate electrode technology a feasible technology with maximum compatibility with the existing fabrication environment for multiple generations of CMOS transistors, including those belonging to the 65 nm, 45 nm and 25 nm technology nodes, that are being used in analog, digital or mixed signal integrated circuit for various applications such as communication, entertainment, education and security products.Type: ApplicationFiled: June 17, 2008Publication date: December 18, 2008Applicant: LSI CORPORATIONInventors: Richard J. Carter, Wai Lo, Sey-Shing Sun, Hong Lin, Verne Hornback
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Patent number: 7467359Abstract: A method for developing a circuit is disclosed. The method generally comprises the steps of (A) generating a solution space having a dimension for each of a plurality of parameters for the circuit, (B) evaluating a plurality of instances of the circuit in the solution space through a software simulation, (C) evaluating the instances through a hardware simulation, and (D) updating the instances in response to the software simulation and the hardware simulation to approach an optimum instance of the instances for the circuit.Type: GrantFiled: November 3, 2005Date of Patent: December 16, 2008Assignee: LSI CorporationInventors: Miodrag Potkonjak, Seapahn Megerian, Advait Mogre, Dusan Petranovic
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Patent number: 7467363Abstract: A method for verifying that a physical location of a memory matches a design logical representation, without having to use a focused ion beam to physically damage a memory location. The method provides that either a temporary or permanent circuit “defect” is intentionally created in the physical layout. Then, the new electrical schematic is extracted from the modified physical layout. Subsequently, if the design “defect” which was created is temporary, the new electrical schematic is simulated, the logical address of the “defect” is determined, and the extracted logical address is compared to the expected address to verify the logical to physical correlation. Alternatively, if the design “defect” which was created is permanent, after the new electrical schematic is extracted from the modified physical layout, the product is fabricated and the known design “defect” location is used to correlate to the electrically-tested defect logical location.Type: GrantFiled: October 7, 2005Date of Patent: December 16, 2008Assignee: LSI CorporationInventors: David T. Price, Jayashree Kalpathy-Cramer, Mark Ward
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DIELECTRIC BARRIER FILMS FOR USE AS COPPER BARRIER LAYERS IN SEMICONDUCTOR TRENCH AND VIA STRUCTURES
Publication number: 20080303155Abstract: The present invention is directed to improved dielectric copper barrier layer and related interconnect structures. One structure includes a semiconductor substrate having a copper line. An insulating layer formed of at least one of silicon and carbon is formed on the underlying copper line. An opening is formed in the insulating layer to expose a portion of the copper line. The inner surface of the opening in the insulating layer has a dielectric barrier layer formed thereon to prevent the diffusion of copper into the insulating layer. A copper plug is formed to fill the opening and make electrical contact with the underlying copper interconnect structure. Aspects of the invention also include methods for forming the dielectric copper barrier layers and associate copper interconnects to the underlying copper lines.Type: ApplicationFiled: August 13, 2008Publication date: December 11, 2008Applicant: LSI CORPORATIONInventors: Hong-Qiang LU, Peter A. BURKE, Wilbur G. CATABAY -
Patent number: 7463267Abstract: A method for reading atoms positioned within a memory having a first memory portion and a second memory portions, comprising the steps of (a) positioning the atoms having memory addresses across the memory, (b) defining a strip across a portion of the atoms, (c) designating a first atom within the strip, (d) locating one or more second atoms to be paired with the first atom, (e) determining whether the one or more second atoms when paired with the first atom forms a legitimate pair, and (f) reading the legitimate pair from the first memory portion and the second memory portion.Type: GrantFiled: October 26, 2006Date of Patent: December 9, 2008Assignee: LSI CorporationInventors: Adrian Philip Wise, James A. Darnes
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Patent number: 7464345Abstract: A method for estimating resources during design planning is generally provided. A first step generally involves receiving design information for an integrated circuit design. A first portion of the integrated circuit design is generally complete, while a second portion of the integrated circuit design is generally incomplete. A second step generally involves receiving user input of estimated design information for the second portion of the integrated circuit design. A third step generally involves automatically generating one or more representative blocks representing the second portion of the integrated circuit design based on the user input. The one or more representative blocks may be generated having substantially equivalent size and characteristics to one or more actual blocks developed for the second portion of the integrated circuit design.Type: GrantFiled: August 1, 2005Date of Patent: December 9, 2008Assignee: LSI CorporationInventors: Gregor J. Martin, Grant Lindberg, Ying Chun He
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Patent number: 7463781Abstract: A method for controlling an arithmetic codec context is disclosed. The method may include the steps of (A) reading a current value indicating one of a first condition and a second condition corresponding to a current context of a plurality of predetermined contexts, (B) generating an input state matching (i) an initial state in response to the first condition and (ii) an output state in response to the second condition, wherein the initial state has a predetermined value and the output state has a value generated by the method before receiving the current context and (C) generating a current output state by performing an arithmetic code operation on an input signal using the input state.Type: GrantFiled: April 14, 2004Date of Patent: December 9, 2008Assignee: LSI CorporationInventors: Eric C. Pearson, Harminder S. Banwait
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Patent number: 7461307Abstract: The present invention is directed to a system and method for improving transition delay test coverage through use of enhanced flip flops (ES flip-flops) for a broadside test approach. Each ES flip-flop includes a two port flip-flop including a first flip-flop and a second flip-flop. A separate control input (ESM) which is not time critical is used to select a multiplexer of the second flip-flop. Thus, the ES flip-flops do not require a fast signal switching between launch and test response capture or an extra clock signal. Various enhanced scan modes may be selected via a combination of SEN and ESM. Moreover, only a heuristically selected subset of scan flip-flops may be replaced with the ES flip-flops so as to minimize the length of a scan chain as well as the logic area overhead. The present invention provides high TDF coverage under the broadside testing.Type: GrantFiled: May 6, 2005Date of Patent: December 2, 2008Assignee: LSI CorporationInventors: Arun Gunda, Narendra Devta-Prasanna
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Patent number: 7461284Abstract: Disclosed is a method for minimizing the buffer size of an elasticity FIFO queue when synchronizing data between two clock domains. Data communication is typically sent by a transmitter device to a receiver device. The transmitted data signal includes an embedded clock signal and null data characters, as specified by the data communication signal protocol. A null character indicates an empty data frame and is included as part of most standard communication protocols. An embodiment skips one or more null characters from the elasticity FIFO queue during a single clock cycle when it is detected that the write pointer is catching up to the read pointer. By skipping multiple null characters during a single write cycle, the read pointer is moved ahead by one or more queue locations and the write pointer is insured to not catch up to the read pointer for a wider variation in frequencies between a transmitter and receiver than is normally possible.Type: GrantFiled: June 20, 2005Date of Patent: December 2, 2008Assignee: LSI CorporationInventors: Timothy D. Thompson, Christopher D. Paulson
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Patent number: 7461183Abstract: A method and apparatus in a data controller in a storage drive for retrieving, evaluating, and processing a context that describes a direct memory access (DMA) request. The data controller includes a buffer for storing data transferred in response to execution of a DMA transfer request, a host address pointer pointing to a current location in the buffer, and a retrieval channel device. The retrieval channel device is configured to: fetch a context that describes a DMA transfer requested by a host computer, determine whether a current capacity of the buffer for transferring data exceeds a threshold, generate an instruction to transfer a second amount of data to complete at least a portion of the requested DMA transfer if the current capacity does exceed the threshold, assert the instruction generated by the retrieval channel device, and adjust the host address pointer by the second amount of data.Type: GrantFiled: August 3, 2004Date of Patent: December 2, 2008Assignee: LSI CorporationInventors: Jackson Lloyd Ellis, Kurt Jay Kastein, Praveen Viraraghavan
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Patent number: 7461315Abstract: The present invention is directed to a system and method for quality improvement by identifying test patterns for DFT logic faults and functional logic faults. The identified test patterns may be selectively utilized for pruning of patterns or DPM estimation. Functional faults and DFT faults may be identified from detected TDF faults. The functional faults are faults on a logic which was present in a pre-test insertion net list. Remaining faults are the DFT faults. A set of test patterns for DFT faults may be utilized as the first target for the pattern truncation which will reduce the amount of test patterns to be tested. A set of test patterns for functional may be utilized for improving the TDF coverage.Type: GrantFiled: May 9, 2005Date of Patent: December 2, 2008Assignee: LSI CorporationInventors: Arun Gunda, Narendra Devta-Prasanna
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Patent number: 7461140Abstract: The present invention is directed to a method and apparatus for identifying IPsec security policy in iSCSI. In an exemplary aspect of the present invention, a method for identifying IPsec security policy in iSCSI includes the following steps. An IP address may be allocated to a physical port of an iSCSI network entity. The physical port may include at least one TCP listening port. For a discovery session, the IP address may be statically allocated (or permanently leased). For a normal session, the IP address may be statically allocated or DHCP assigned. A TCP listening port associated with the IP address in an iSCSI portal may then be used to link a security policy on an IP connection with iSCSI configuration.Type: GrantFiled: December 19, 2003Date of Patent: December 2, 2008Assignee: LSI CorporationInventors: Andrew J. Spry, James A. Lynn
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Patent number: 7460211Abstract: An apparatus includes an edge expose unit for exposing an annular area in an edge exclusion zone of a wafer to radiation having a wavelength suitable for removing a film from the wafer in the annular area and a radiation modulator coupled to the edge expose unit for modulating the radiation to pattern the film in the annular area.Type: GrantFiled: May 12, 2006Date of Patent: December 2, 2008Assignee: LSI CorporationInventors: Bruce Whitefield, David Abercrombie
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Patent number: 7461107Abstract: A fixed-point arithmetic unit comprises a plurality of full-adders and half-adders arranged in at least an input row and an output row. A plurality of inputs to the input row is arranged to receive bits comprising a sparse-redundant representation of the integer. A converter converts 1-redundant representations of the integer to the space (1/K)-redundant representations. A process is described to design rows of a multiplier by identifying a distribution of multiplication product groups, and transforming the distribution of multiplication product groups to adders to occupy a highest unoccupied row of the multiplier.Type: GrantFiled: March 22, 2007Date of Patent: December 2, 2008Assignee: LSI CorporationInventor: Mikhail I. Grinchuk
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Publication number: 20080295044Abstract: A method and apparatus are provided for receiving a list of design memories, wherein each type of design memory in the list has a name and at least one instance. A pre-placement model is associated with each named memory type in the list. The design memories in the list are mapped to an integrated circuit layout pattern, wherein at least one memory type comprises first and second instances that are mapped differently from one another. After mapping, at least one of the first and second instances is renamed to have a different name than the other. A post-placement model is then associated with each named memory type in the list, including a separate model for each renamed design memory.Type: ApplicationFiled: August 5, 2008Publication date: November 27, 2008Applicant: LSI CorporationInventors: Alexandre Andreev, Andrey Nikitin, Ilya V. Neznanov, Ranko Scepanovic
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Publication number: 20080294799Abstract: Methods and apparatus to provide a high throughput pipelined data path are described. In one embodiment, an apparatus may include three stages to process inbound data packets, e.g., to align one or more bits of data. Other embodiments are also described.Type: ApplicationFiled: May 27, 2007Publication date: November 27, 2008Applicant: LSI LOGIC CORPORATIONInventor: Robert E. Ward
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Patent number: 7457905Abstract: A request transaction ordering method and system includes designing of the Open Core Protocol (OCP) bus to an Advanced extensible Interface (AXI) bus bridge. The general flow of the bridge is to accept a plurality of read and write requests from the OCP bus and convert them to a plurality of AXI read and write requests. Control logic is set for each first in first out policy of push and pop control and for a plurality of handshake signals in OCP and in the AXI. The request ordering part of the bridge performs hazard checking to preserve required order policies for both OCP and AXI bus protocols by using a FIFO (first in first out) policy to hold the outstanding writes, a plurality of comparators, a first in first out policy to hold OCP identities for a plurality of read requests.Type: GrantFiled: July 20, 2006Date of Patent: November 25, 2008Assignee: LSI CorporationInventor: Judy Gehman
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Patent number: 7458044Abstract: Methods and structure for improved simulation of CDM ESD events and for remediation of circuit designs correcting for previously inexplicable damage to core circuits of an application circuit design caused by such events. Features and aspects hereof note that such previously inexplicable damage to core circuits of an application circuit design is caused by inductive coupling between the non-core circuits and the core circuits of an application circuit design. Improved simulation techniques in accordance with features and aspects hereof may predict where such inductive coupling may cause damage to core circuits. Other features and aspects hereof may alter an application circuit design to provide remediation by automated insertion of additional buffer circuitry to core traces of the core circuitry that may be impacted by such inductive coupling.Type: GrantFiled: February 7, 2006Date of Patent: November 25, 2008Assignee: LSI CorporationInventors: Choshu Ito, Li Lynn Ooi, William Loh
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Patent number: D581585Type: GrantFiled: March 18, 2008Date of Patent: November 25, 2008Assignee: LSI Industries, Inc.Inventor: John Delmore Boyer