Patents Assigned to LSI
  • Publication number: 20080313249
    Abstract: A random number generator includes a ring oscillator having an EX-OR gate and four inverters together forming a loop. This loop enters stable state for a start signal having the low level and oscillates for the start signal having the high level. When the start signal has a pulse of a width shorter than the loop's delay time, output nodes responsively, sequentially enter metastable state hovering between the high and low levels. The metastable waveform becomes smaller with time and finally disappears. As metastable state cannot be controlled in longevity, it disappears at any random number node. A counter thus outputs a signal serving as true random number data depending on the longevity of the metastable state. A random number generator miniaturized and having reduced power consumption, and of high performance can thus be implemented.
    Type: Application
    Filed: August 18, 2008
    Publication date: December 18, 2008
    Applicants: RENESAS TECHNOLOGY CORP., RENESAS LSI DESIGN CORPORATION
    Inventors: Kazuhiko Fukushima, Atsuo Yamaguchi
  • Publication number: 20080308882
    Abstract: A method to maintain a well-defined gate stack profile, deposit or grow a uniform gate dielectric, and maintain gate length CD control by means of an inert insulating liner deposited after dummy gate etch and before the spacer process. The liner material is selective to wet chemicals used to remove the dummy gate oxide thereby preventing undercut in the spacer region. The method is aimed at making the metal gate electrode technology a feasible technology with maximum compatibility with the existing fabrication environment for multiple generations of CMOS transistors, including those belonging to the 65 nm, 45 nm and 25 nm technology nodes, that are being used in analog, digital or mixed signal integrated circuit for various applications such as communication, entertainment, education and security products.
    Type: Application
    Filed: June 17, 2008
    Publication date: December 18, 2008
    Applicant: LSI CORPORATION
    Inventors: Richard J. Carter, Wai Lo, Sey-Shing Sun, Hong Lin, Verne Hornback
  • Patent number: 7467359
    Abstract: A method for developing a circuit is disclosed. The method generally comprises the steps of (A) generating a solution space having a dimension for each of a plurality of parameters for the circuit, (B) evaluating a plurality of instances of the circuit in the solution space through a software simulation, (C) evaluating the instances through a hardware simulation, and (D) updating the instances in response to the software simulation and the hardware simulation to approach an optimum instance of the instances for the circuit.
    Type: Grant
    Filed: November 3, 2005
    Date of Patent: December 16, 2008
    Assignee: LSI Corporation
    Inventors: Miodrag Potkonjak, Seapahn Megerian, Advait Mogre, Dusan Petranovic
  • Patent number: 7467363
    Abstract: A method for verifying that a physical location of a memory matches a design logical representation, without having to use a focused ion beam to physically damage a memory location. The method provides that either a temporary or permanent circuit “defect” is intentionally created in the physical layout. Then, the new electrical schematic is extracted from the modified physical layout. Subsequently, if the design “defect” which was created is temporary, the new electrical schematic is simulated, the logical address of the “defect” is determined, and the extracted logical address is compared to the expected address to verify the logical to physical correlation. Alternatively, if the design “defect” which was created is permanent, after the new electrical schematic is extracted from the modified physical layout, the product is fabricated and the known design “defect” location is used to correlate to the electrically-tested defect logical location.
    Type: Grant
    Filed: October 7, 2005
    Date of Patent: December 16, 2008
    Assignee: LSI Corporation
    Inventors: David T. Price, Jayashree Kalpathy-Cramer, Mark Ward
  • Publication number: 20080303155
    Abstract: The present invention is directed to improved dielectric copper barrier layer and related interconnect structures. One structure includes a semiconductor substrate having a copper line. An insulating layer formed of at least one of silicon and carbon is formed on the underlying copper line. An opening is formed in the insulating layer to expose a portion of the copper line. The inner surface of the opening in the insulating layer has a dielectric barrier layer formed thereon to prevent the diffusion of copper into the insulating layer. A copper plug is formed to fill the opening and make electrical contact with the underlying copper interconnect structure. Aspects of the invention also include methods for forming the dielectric copper barrier layers and associate copper interconnects to the underlying copper lines.
    Type: Application
    Filed: August 13, 2008
    Publication date: December 11, 2008
    Applicant: LSI CORPORATION
    Inventors: Hong-Qiang LU, Peter A. BURKE, Wilbur G. CATABAY
  • Patent number: 7463267
    Abstract: A method for reading atoms positioned within a memory having a first memory portion and a second memory portions, comprising the steps of (a) positioning the atoms having memory addresses across the memory, (b) defining a strip across a portion of the atoms, (c) designating a first atom within the strip, (d) locating one or more second atoms to be paired with the first atom, (e) determining whether the one or more second atoms when paired with the first atom forms a legitimate pair, and (f) reading the legitimate pair from the first memory portion and the second memory portion.
    Type: Grant
    Filed: October 26, 2006
    Date of Patent: December 9, 2008
    Assignee: LSI Corporation
    Inventors: Adrian Philip Wise, James A. Darnes
  • Patent number: 7464345
    Abstract: A method for estimating resources during design planning is generally provided. A first step generally involves receiving design information for an integrated circuit design. A first portion of the integrated circuit design is generally complete, while a second portion of the integrated circuit design is generally incomplete. A second step generally involves receiving user input of estimated design information for the second portion of the integrated circuit design. A third step generally involves automatically generating one or more representative blocks representing the second portion of the integrated circuit design based on the user input. The one or more representative blocks may be generated having substantially equivalent size and characteristics to one or more actual blocks developed for the second portion of the integrated circuit design.
    Type: Grant
    Filed: August 1, 2005
    Date of Patent: December 9, 2008
    Assignee: LSI Corporation
    Inventors: Gregor J. Martin, Grant Lindberg, Ying Chun He
  • Patent number: 7463781
    Abstract: A method for controlling an arithmetic codec context is disclosed. The method may include the steps of (A) reading a current value indicating one of a first condition and a second condition corresponding to a current context of a plurality of predetermined contexts, (B) generating an input state matching (i) an initial state in response to the first condition and (ii) an output state in response to the second condition, wherein the initial state has a predetermined value and the output state has a value generated by the method before receiving the current context and (C) generating a current output state by performing an arithmetic code operation on an input signal using the input state.
    Type: Grant
    Filed: April 14, 2004
    Date of Patent: December 9, 2008
    Assignee: LSI Corporation
    Inventors: Eric C. Pearson, Harminder S. Banwait
  • Patent number: 7461307
    Abstract: The present invention is directed to a system and method for improving transition delay test coverage through use of enhanced flip flops (ES flip-flops) for a broadside test approach. Each ES flip-flop includes a two port flip-flop including a first flip-flop and a second flip-flop. A separate control input (ESM) which is not time critical is used to select a multiplexer of the second flip-flop. Thus, the ES flip-flops do not require a fast signal switching between launch and test response capture or an extra clock signal. Various enhanced scan modes may be selected via a combination of SEN and ESM. Moreover, only a heuristically selected subset of scan flip-flops may be replaced with the ES flip-flops so as to minimize the length of a scan chain as well as the logic area overhead. The present invention provides high TDF coverage under the broadside testing.
    Type: Grant
    Filed: May 6, 2005
    Date of Patent: December 2, 2008
    Assignee: LSI Corporation
    Inventors: Arun Gunda, Narendra Devta-Prasanna
  • Patent number: 7461284
    Abstract: Disclosed is a method for minimizing the buffer size of an elasticity FIFO queue when synchronizing data between two clock domains. Data communication is typically sent by a transmitter device to a receiver device. The transmitted data signal includes an embedded clock signal and null data characters, as specified by the data communication signal protocol. A null character indicates an empty data frame and is included as part of most standard communication protocols. An embodiment skips one or more null characters from the elasticity FIFO queue during a single clock cycle when it is detected that the write pointer is catching up to the read pointer. By skipping multiple null characters during a single write cycle, the read pointer is moved ahead by one or more queue locations and the write pointer is insured to not catch up to the read pointer for a wider variation in frequencies between a transmitter and receiver than is normally possible.
    Type: Grant
    Filed: June 20, 2005
    Date of Patent: December 2, 2008
    Assignee: LSI Corporation
    Inventors: Timothy D. Thompson, Christopher D. Paulson
  • Patent number: 7461183
    Abstract: A method and apparatus in a data controller in a storage drive for retrieving, evaluating, and processing a context that describes a direct memory access (DMA) request. The data controller includes a buffer for storing data transferred in response to execution of a DMA transfer request, a host address pointer pointing to a current location in the buffer, and a retrieval channel device. The retrieval channel device is configured to: fetch a context that describes a DMA transfer requested by a host computer, determine whether a current capacity of the buffer for transferring data exceeds a threshold, generate an instruction to transfer a second amount of data to complete at least a portion of the requested DMA transfer if the current capacity does exceed the threshold, assert the instruction generated by the retrieval channel device, and adjust the host address pointer by the second amount of data.
    Type: Grant
    Filed: August 3, 2004
    Date of Patent: December 2, 2008
    Assignee: LSI Corporation
    Inventors: Jackson Lloyd Ellis, Kurt Jay Kastein, Praveen Viraraghavan
  • Patent number: 7461315
    Abstract: The present invention is directed to a system and method for quality improvement by identifying test patterns for DFT logic faults and functional logic faults. The identified test patterns may be selectively utilized for pruning of patterns or DPM estimation. Functional faults and DFT faults may be identified from detected TDF faults. The functional faults are faults on a logic which was present in a pre-test insertion net list. Remaining faults are the DFT faults. A set of test patterns for DFT faults may be utilized as the first target for the pattern truncation which will reduce the amount of test patterns to be tested. A set of test patterns for functional may be utilized for improving the TDF coverage.
    Type: Grant
    Filed: May 9, 2005
    Date of Patent: December 2, 2008
    Assignee: LSI Corporation
    Inventors: Arun Gunda, Narendra Devta-Prasanna
  • Patent number: 7461140
    Abstract: The present invention is directed to a method and apparatus for identifying IPsec security policy in iSCSI. In an exemplary aspect of the present invention, a method for identifying IPsec security policy in iSCSI includes the following steps. An IP address may be allocated to a physical port of an iSCSI network entity. The physical port may include at least one TCP listening port. For a discovery session, the IP address may be statically allocated (or permanently leased). For a normal session, the IP address may be statically allocated or DHCP assigned. A TCP listening port associated with the IP address in an iSCSI portal may then be used to link a security policy on an IP connection with iSCSI configuration.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: December 2, 2008
    Assignee: LSI Corporation
    Inventors: Andrew J. Spry, James A. Lynn
  • Patent number: 7460211
    Abstract: An apparatus includes an edge expose unit for exposing an annular area in an edge exclusion zone of a wafer to radiation having a wavelength suitable for removing a film from the wafer in the annular area and a radiation modulator coupled to the edge expose unit for modulating the radiation to pattern the film in the annular area.
    Type: Grant
    Filed: May 12, 2006
    Date of Patent: December 2, 2008
    Assignee: LSI Corporation
    Inventors: Bruce Whitefield, David Abercrombie
  • Patent number: 7461107
    Abstract: A fixed-point arithmetic unit comprises a plurality of full-adders and half-adders arranged in at least an input row and an output row. A plurality of inputs to the input row is arranged to receive bits comprising a sparse-redundant representation of the integer. A converter converts 1-redundant representations of the integer to the space (1/K)-redundant representations. A process is described to design rows of a multiplier by identifying a distribution of multiplication product groups, and transforming the distribution of multiplication product groups to adders to occupy a highest unoccupied row of the multiplier.
    Type: Grant
    Filed: March 22, 2007
    Date of Patent: December 2, 2008
    Assignee: LSI Corporation
    Inventor: Mikhail I. Grinchuk
  • Publication number: 20080295044
    Abstract: A method and apparatus are provided for receiving a list of design memories, wherein each type of design memory in the list has a name and at least one instance. A pre-placement model is associated with each named memory type in the list. The design memories in the list are mapped to an integrated circuit layout pattern, wherein at least one memory type comprises first and second instances that are mapped differently from one another. After mapping, at least one of the first and second instances is renamed to have a different name than the other. A post-placement model is then associated with each named memory type in the list, including a separate model for each renamed design memory.
    Type: Application
    Filed: August 5, 2008
    Publication date: November 27, 2008
    Applicant: LSI Corporation
    Inventors: Alexandre Andreev, Andrey Nikitin, Ilya V. Neznanov, Ranko Scepanovic
  • Publication number: 20080294799
    Abstract: Methods and apparatus to provide a high throughput pipelined data path are described. In one embodiment, an apparatus may include three stages to process inbound data packets, e.g., to align one or more bits of data. Other embodiments are also described.
    Type: Application
    Filed: May 27, 2007
    Publication date: November 27, 2008
    Applicant: LSI LOGIC CORPORATION
    Inventor: Robert E. Ward
  • Patent number: 7457905
    Abstract: A request transaction ordering method and system includes designing of the Open Core Protocol (OCP) bus to an Advanced extensible Interface (AXI) bus bridge. The general flow of the bridge is to accept a plurality of read and write requests from the OCP bus and convert them to a plurality of AXI read and write requests. Control logic is set for each first in first out policy of push and pop control and for a plurality of handshake signals in OCP and in the AXI. The request ordering part of the bridge performs hazard checking to preserve required order policies for both OCP and AXI bus protocols by using a FIFO (first in first out) policy to hold the outstanding writes, a plurality of comparators, a first in first out policy to hold OCP identities for a plurality of read requests.
    Type: Grant
    Filed: July 20, 2006
    Date of Patent: November 25, 2008
    Assignee: LSI Corporation
    Inventor: Judy Gehman
  • Patent number: 7458044
    Abstract: Methods and structure for improved simulation of CDM ESD events and for remediation of circuit designs correcting for previously inexplicable damage to core circuits of an application circuit design caused by such events. Features and aspects hereof note that such previously inexplicable damage to core circuits of an application circuit design is caused by inductive coupling between the non-core circuits and the core circuits of an application circuit design. Improved simulation techniques in accordance with features and aspects hereof may predict where such inductive coupling may cause damage to core circuits. Other features and aspects hereof may alter an application circuit design to provide remediation by automated insertion of additional buffer circuitry to core traces of the core circuitry that may be impacted by such inductive coupling.
    Type: Grant
    Filed: February 7, 2006
    Date of Patent: November 25, 2008
    Assignee: LSI Corporation
    Inventors: Choshu Ito, Li Lynn Ooi, William Loh
  • Patent number: D581585
    Type: Grant
    Filed: March 18, 2008
    Date of Patent: November 25, 2008
    Assignee: LSI Industries, Inc.
    Inventor: John Delmore Boyer