Abstract: An apparatus, such as a radar system that conducts beamforming operations, includes a plurality of analog-to-digital-converters (ADCs) and an error correction system coupled to the ADCs. Based upon an assessment of a plurality of errors associated with the ADCs by the error correction system, the error correction system programs sampling operations for the ADCs. The error correction system includes an error correction unit that identifies the plurality of errors associated with a plurality of sub-ADCs of the ADCs, a selection unit coupled to the error correction unit that sorts the errors associated with the plurality of sub-ADCs, and a programming unit coupled to the selection unit that reconfigures the sorted errors to generate a sequence of sampling operations for the plurality of sub-ADCs.

Abstract: An integrated circuit and method of designing an integrated circuit including an error detection and correction circuit is described. The integrated circuit includes a data-path being arranged between an output of a first register and second register clocked by a system clock. The integrated circuit includes a timing error detection and correction circuit (EDAC) which has a clock unit configured to receive a reference clock and to provide a delayed reference clock. The EDAC includes a plurality of transition detectors coupled to a respective node on the data-path and an error detection circuit coupled to each transition detector. The error detection circuit flags an error if a transition occurs during a time period between a transition of the reference clock and a corresponding transition of the delayed reference clock. A timing correction circuit coupled to the error detection circuit outputs the system clock derived from the delayed reference clock.

Abstract: A self-test mechanism within an integrated circuit to automatically interleave evaluation of a clock signal by a clock monitor unit with periodic testing for faulty operation of a clock monitor unit implemented within the integrated circuit for monitoring a clock signal. The mechanism injects faults into the clock monitor unit to evaluate if the clock monitor unit is operating in accordance with its specified operating parameters. The injected faults are intended to cause the clock monitor unit to determine that the clock signal is operating outside of a specified frequency range. If the injected faults do not cause the clock monitor unit to determine that the clock signal is operating both above and below the specified frequency range, then the clock monitor unit is not functioning according to specified operating parameters.

Abstract: The disclosure relates to an integrated circuit and associated method and packaged integrated circuit. The integrated circuit comprises a first pad; a second pad; an active element having a node that is capacitively coupled to the first and second pads; a voltage or current source connected to the first pad; and a detection module connected to the second pad and configured to determine an electrical continuity between the second pad and the first pad.

Abstract: In accordance with a first aspect of the present disclosure, a communication device is provided, comprising: a plurality of antennas; a communication unit configured to execute ranging sessions with an external communication counterpart through said antennas; an antenna selection unit configured to select a specific antenna from said plurality antennas for carrying out one or more of said ranging sessions, wherein the antenna selection unit is configured to select said specific antenna in dependence on one or more parameters indicative of a communication quality between the antennas and the external communication counterpart. In accordance with a second aspect of the present disclosure, a corresponding method of operating a communication device is conceived. In accordance with a third aspect of the present disclosure, a computer program is provided for carrying out said method.

Abstract: A method and apparatus are described for a reconfigurable architecture analog front end architecture for electrochemical sensors. In one example, an analog front end includes an electrode driver stage coupled to electrodes of an electrochemical sensor, and measurement channels coupled to the electrode driver stage to receive an electrode signal from the electrodes of the electrochemical sensor and to generate measurement results, the measurement channels configured to switch configurations to perform different measurements.

Abstract: A circuit that receives a series a digital signal values from a digital circuit output where the output has a propensity to produce digital values with a metastable error. The circuit produces an analog output signal having values over time corresponding to the digital signal values. The circuit includes two data paths that receive the digital signal values and produce a delayed analog signal. One data path includes an analog delay and the other data path includes a digital delay and a digital to analog converter. The circuit uses the output of the two data paths to adjust a later output analog signal value that is produced by the analog circuit output subsequent to a former output analog signal value produced by the analog circuit output that corresponds to a digital signal value of the series with a metastable error to compensate for the metastable error in the output signal.

Abstract: A method of tie bar removal is provided. The method includes forming a leadframe including a tie bar and a flag. The tie bar extends from a side rail of the leadframe and has a distal portion at an angle different from a plane of the flag. A semiconductor die is attached to the flag of the leadframe. A molding compound encapsulates the semiconductor die, a portion of the leadframe, and the distal portion of the tie bar. The tie bar is separated from the molding compound with an angled cavity remaining in the molding compound.

Abstract: An apparatus to insure safe behavior in an inverter system. In one embodiment, the apparatus includes a first high side gate driver, a first low side gate driver, a microcontroller configured to control the first high side and low side gate drivers. A voltage regulator provides a supply voltage to the microcontroller. A first pair of high side voltage regulators provide a first pair of high side supply voltages to the first high side gate driver. A first pair of low side voltage regulators provide a first pair of low side supply voltages to the first low side gate driver.

Abstract: A true random number generator circuit includes a ring oscillator and a plurality of sampling circuits. The ring oscillator includes a plurality of series-connected stages coupled together in a ring. An output of a last stage of the ring oscillator is coupled to an input of a first stage of the ring oscillator. A sampling circuit of the plurality of sampling circuits has an input coupled to a node located between two adjacent stages of the plurality of series-connected stages. Every node of the ring oscillator is coupled to a corresponding sampling circuit of the plurality of sampling circuits. In another embodiment, a method for generating a random number is provided.

Abstract: A packaging assembly and methodology provide a PCB substrate with one or more waveguide apertures and a conductive pattern which includes a plurality of landing pads that are disposed around peripheral edges of each waveguide aperture and that are connected to one another by trace lines so that, upon attachment and reflow of solder balls to the plurality of landing pads, the solder balls reflow along the trace lines to form a fully closed solder waveguide shielding wall disposed around peripheral edges of the first waveguide aperture.

Abstract: A sigma-delta ADC is described including a passive filter with an input coupled to the ADC input and a filter output. A gain stage has an input connected to the filter output. A quantiser has an input connected to the gain stage output and a quantiser output. The passive filter includes a first filter resistor between the filter input and the filter output and a filter capacitor having first terminal coupled to the filter output. A feedback resistor is coupled between the quantiser output and the filter output and receives a negative of the value of the output to provide negative feedback to the filter output. The gain stage has a capacitor and resistor in series, and a gain element connected to the gain stage input and an output connected to the gain stage output. One terminal of the gain stage capacitor is connected to the gain element output.

Abstract: A method of forming a semiconductor device is provided. The method includes providing a connector structure configured for carrying a signal and providing a semiconductor die. At least a portion of the connector structure and the semiconductor die are encapsulated with an encapsulant. The semiconductor die is interconnected with the connector structure by way of a conductive trace.

Abstract: An integrated circuit (IC) device includes a non-volatile memory device with an array of non-volatile memory cells, and an isolation circuit configured to conduct voltage from an internal voltage supply to one of the memory cells during a hidden write operation to the one of the memory cells, and conduct voltage from an external voltage supply to the one of the memory cells during a non-hidden write operation to the one of the memory cells. Current at the external voltage supply can be monitored external to the IC device during the non-hidden write operation, and current of the internal voltage supply is provided by a capacitor that cannot be monitored external to the IC device during the hidden write operation.

Abstract: A transistor includes a trench formed in a semiconductor substrate. A conductive spacer is formed in the trench and offset from a first sidewall of the trench. A dielectric material is formed in the trench and surrounds the conductive spacer. A drift region is formed in the semiconductor substrate adjacent to the first sidewall and a first portion of a second sidewall of the trench. A drain region is formed in the drift region adjacent to a second portion of the second sidewall. A first gate region overlaps a portion of the drift region and is formed separate from the conductive spacer.

Abstract: Analog-to-digital converters (ADCs) of an integrated circuit includes a first set of ADCs and second set of ADCs in which the ADCs of the first set are of a different type than the ADCs of the second set. On-chip testing of the ADCs includes calibrating an N-bit differential digital-to-analog converter (DAC) and storing a pair of calibration codes for each of 2N possible DAC input codes for the DAC in an on-chip memory. The first set of ADCs is tested using the pairs of calibration codes stored in the on-chip memory and a full N-bit resolution of the DAC. Subsequently, the second set of ADCs is tested using pairs of calibration codes corresponding to a reduced M-bit resolution of the DAC, in which M is less than N. During the testing of the second set of ADCs, a portion of the calibration codes stored in the on-chip memory is overwritten.

Abstract: Various embodiments relate to a memory controller configured to read data from a memory array, including: an error correction codes (ECC) encoder configured to encode data stored in the memory array; an ECC decoder configured to decode first data read from the memory array based upon a first read request and detect errors in the first data read from the memory array; and a fault controller configured to: command the memory controller to read other data from the memory array when the ECC detects an error; command the memory controller to re-read the first data from the memory array; when the ECC detects an error; compare the re-read first data to the read first data; and signal a fault attack when the re-read first data is different from the read first data.

Abstract: A method is described for analyzing an output of an object detector for a selected object of interest in an image. The object of interest in a first image is selected. A user of the object detector draws a bounding box around the object of interest. A first inference operation is run on the first image using the object detector, and in response, the object detect provides a plurality of proposals. A non-max suppression (NMS) algorithm is run on the plurality of proposals, including the proposal having the object of interest. A classifier and bounding box regressor are run on each proposal of the plurality of proposals and results are outputted. The outputted results are then analyzed. The method can provide insight into why an object detector returns the results that it does.

Abstract: Embodiments of an antenna system and a method for operating an antenna are disclosed. In an embodiment, an antenna system includes a first ferrite element, a second ferrite element, a first coil wrapped around the first ferrite element, a second coil wrapped around the second ferrite element, a first antenna interface electrically coupled to the first coil, a second antenna interface electrically coupled to the second coil, and a conductor network connected between the first coil, the second coil, the first antenna interface, and the second antenna interface.

Abstract: A method for direct memory access includes: receiving a direct memory access request designating addresses in a data block to be accessed in a memory; randomizing an order of the addresses the data block is accessed; and accessing the memory at addresses in the randomized order. A system for direct memory access is disclosed.