Abstract: A detector of the state (on or off) of a vertical power component formed in a lightly-doped semiconductor substrate of a first conductivity type having a front surface and a rear surface. The region corresponding to the power component is surrounded with an isolating wall of opposite type to that of the substrate. This state detector is formed outside of said region and is formed with a vertical detection component, the state of which is switched by parasitic charges propagating outside of the isolating wall when the power component is on.

Abstract: A circuit for reading a non-volatile memory cell has an output terminal for providing an output current, and a control terminal for receiving a voltage for controlling the output current. The reading circuit includes a feedback circuit which can be connected electrically to the output terminal and to the control terminal to generate the control voltage from a reference signal and from the output current. The feedback circuit also includes a current-amplification circuit having a first terminal for receiving a current-error signal derived from the reference signal and from the output current, and a second terminal for supplying an amplified current.

Abstract: In an integrated circuit, a detection device detects a drop in the supply voltage of the core of the integrated circuit or an excessively slow build-up of this voltage with respect to a supply voltage of the input/output interface circuits of the integrated circuit. Outputs of the interface circuits are set to a high impedance state by the detection device to minimize their power consumption.

Abstract: A nonvolatile memory having a NOR architecture has a memory array including a plurality of memory cells arranged in rows and columns in NOR configuration, the memory cells arranged on a same column being connected to one of a plurality of bit lines; and a column decoder. The column decoder comprises a plurality of selection stages, each of which is connected to respective bit lines and receives first bit line addressing signals. The selection stages comprise word programming selectors controlled by the first bit line addressing signals and supplying a programming voltage to only one of the bit lines of each selection stage. Each selection stage moreover comprises a string programming selection circuit controlled by second bit line addressing signals thereby simultaneously supplying the programming voltage to a plurality of the bit lines of each selection stage.

Abstract: The vertical insulated gate transistor includes, on a semiconductor substrate, a vertical pillar incorporating one of the source and drain regions at the top, a gate dielectric layer situated on the flanks of the pillar and on the top surface of the substrate, and a semiconductor gate resting on the gate dielectric layer. The other of the source and drain regions is in the bottom part of the pillar PIL and the insulated gate includes an isolated external portion 15 resting on the flanks of the pillar and an isolated internal portion 14 situated inside the pillar between the source and drain regions. The isolated internal portion is separated laterally from the isolated external portion by two connecting semiconductor regions PL1, PL2 extending between the source and drain regions, and forming two very fine pillars.

Abstract: A variable charge pump contains several individual simple charge pumps, each with a pumping capacitor and a switching mechanism. Additionally, a switching network is coupled to the individual charge pumps so that the different lines in the charge pump can be connected together in a serial mode or parallel mode (or mixed serial and parallel modes) to match the needs of the output load. The switching network is easily changed to provide the necessary driving capability as the needs of the output load changes.

Abstract: An integrated circuit includes a sensor that reads a fingerprint and provides data corresponding to the fingerprint to a computation engine coupled to the sensor. The computation engine compares the data to stored data and enables a smart card coupled to the computation engine when the data and the stored data match. The computation engine may include an array of flash memory cells arranged in pairs of rows, where flash memory cells in any one row have sources coupled to a common row line and a plurality of conductance mode neurons each having first and second inputs coupled to first and second row lines forming a respective pair of rows. The neurons are coupled to the flash memory cells through a buffer circuit sets a drain-source voltage of the flash memory cells in the row pair coupled to the neuron.

Abstract: Process for fabricating a component, such as a capacitor in an integrated circuit, and integrated component, in which process and component a first electrode is in the form of a cup; a layer made of a dielectric covers at least the wall of the first electrode; a second electrode fills the cup; a first electrical connection via lies above the second electrode; and a second electrical connection via lies laterally with respect to and at a predetermined distance from the first electrode and is connected to the first electrode.

Abstract: A random access memory (RAM) includes at least two memory banks. Each memory bank includes an array of dynamic random access memory (DRAM) cells, and self-refresh circuits for continuously submitting the DRAM cells to a refresh operation independent of the other memory banks. A first circuit selectively accesses one of the memory banks in response to an external access request. A second circuit suspends the refresh operation in the accessed memory bank while processing the external access request, and while the refresh operations in non-selected memory banks are not suspended.

Abstract: An electrically programmable and erasable memory includes memory cells connected to word lines and to bit lines arranged in columns. Bit lines selection transistors are driven by bit lines selection signals. Column selection latches each includes a locking element for a column selection signal and a circuit for delivering a gate control signal which depends on the output of the locking element. Each column selection latch delivers, in addition to a gate control signal, a bit lines selection signal. This signal depends on the output of the locking element at least during programming and reading phases of the memory cells.

Abstract: A serial input/output memory is able to read data in the memory upon reception of a partial read address in which there are N least significant bits lacking to form a complete address. The read-ahead step includes: simultaneously reading the P first bits of M words of the memory having the same partial address; when the received address is complete, selecting the P first bits of the word designated by the complete address and delivering these bits at the serial output of the memory; reading P following bits of the word designated by the complete address during the delivery of P previous bits and delivering these bits at the serial output of the memory when the P previous bits are delivered.

Abstract: Programmability of the data background patterns used to test random-access-memories (RAMs) is accomplished by adding to the memory input/output (I/O) buffers of RAM memory, for each data bit of a data background pattern to be programmed, a programming mechanism and a selection mechanism. The programming mechanism is capable of programming a data bit of the data background pattern in accordance with a programming information signal provided to the RAM. The selection mechanism provides either the programmed data bit or a normal, application data bit to an input/output buffer of the RAM in accordance with whether the RAM is in a test mode or a normal operating mode, as indicated by a test control signal provided to the RAM.

Abstract: A micro-pipeline type asynchronous circuit and a method for detecting and correcting soft error. The asynchronous circuit records in a first recording unit a signal output by a calculation unit and then records in a second recording unit the same signal delayed by at least the duration of the pulse of a soft error. The recorded signals then are compared in a comparer circuit. If they are identical, no soft error has been detected and the output signal is recorded after another delay that is longer than the pulse duration of the soft error, and a request signal is transmitted to a control unit of a next logic stage with a delay twice as long as the pulse duration of a soft error.

Abstract: The present invention relates to a method of data transmission over an A.C. power supply line of a load to be cyclically powered, including organizing a switching of the A.C. supply voltage according to a coding of the data to be transmitted and outside cyclic load supply periods.

Abstract: A testing device for testing dynamic characteristics of an electronic circuit using serial transmissions. The circuit includes a multiplexing device and a demultiplexing device for implementing a serial link in the component or circuit. The testing device includes a transmitter for transmitting binary signals to the multiplexing device, a receiver for receiving binary signals from the demultiplexing device, and a link for selectively providing a coupling between the transmitter and the receiver. Additionally, a clock generator delivers a first clock signal to the transmitter and a second clock signal, which has a different frequency than the first clock signal, to the receiver. In one preferred embodiment, the clock generator includes a single programmable-frequency oscillator and a variable delay circuit. The programmable-frequency oscillator delivers the first clock signal and the variable delay circuit delays the first clock signal to deliver the second clock signal.

Abstract: The integrated device comprises a PMOS transistor and a voltage selector having an output connected to the bulk terminal of the PMOS transistor. The voltage selector comprises an input stage supplying a supply voltage or a programming voltage according to whether the device is in a reading step or in a programming step; a comparator connected to the output of the input stage, receiving a boosted voltage, and generating a first control signal, the state whereof depends upon the comparison of the voltages at the inputs of the comparator; a logic circuit connected to the output of the comparator and generating a second control signal, the state whereof depends upon the state of the first control signal and of a third-level signal; and a switching circuit controlled by the first control signal, by the second control signal, and by the third-level signal and supplying each time the highest among the supply voltage, the boosted voltage, and the programming voltage.

Abstract: A method for forming an conductive interconnection in an electronic semiconductor device includes forming a layer of insulating material on a substrate of semiconductor material having a contact region therein, and forming a first opening through the layer of insulating material to expose the contact region. The first opening is filled with a material to form a first connection element. A first layer comprising a first removable conductive material is formed adjacent the layer of insulating material and the first connection element. The method further includes forming a second opening in the first layer to expose the first connection element, and filling the second opening with the material to form a second connection element. The first removable conductive material is removed except for a portion underlying the second connection element to expose the layer of insulating material. The areas left free after removing the first removable conductive material are filled with a dielectric material.

Abstract: A reference voltage trim circuit includes a voltage follower receiving the reference voltage to be trimmed, with one or more resistive loads providing predefined voltage shifts serially connected between the output of the voltage follower and the output of the trim circuit. The voltage follower includes a current mirror differential amplifier receiving the reference voltage at one input and the output of the voltage follower at the other input, and a transistor with a resistive load connected between the power supply voltages and receiving the output of the current mirror differential amplifier at the transistor's gate. The resistive loads provide varying preselected voltage drop and are each shunted by corresponding fuses, with the entire series of resistive loads shunted by a master fuse. To trim the reference voltage, at least the master fuse is blown, together with the fuse(s) shunting resistive loads which combine to result in the desired trim voltage.

Abstract: Reference cells are refreshed in a non-volatile memory that includes a plurality of memory cells. A selected reference cell and a non-used memory cell are read simultaneously, and a signal read from the reference cell is compared to a signal read from the non-used memory cell. A refresh signal for refreshing the reference cell is supplied when the signal read therefrom is less than the signal read from the non-used memory cell.

Abstract: Regulation of the output voltage of a power supply employing a flyback-type self-oscillating DC—DC converter employing a transformer. The primary winding circuit of the transformer senses a current recirculation loop for discharging the energy cyclically stored in an auxiliary winding of the self-oscillation loop of the converter such as to represent a replica of the circuit of the secondary winding of the transformer and by summing a signal representative of the level of the energy stored in the auxiliary winding with a drive signal on a control node of a driver of the power switch of the converter.