Abstract: A method includes receiving a plurality of digital feedback signals from a voltage converter, controlling the voltage converter based upon a user desired brightness level and the plurality of digital feedback signals, the voltage converter receiving input from a DC voltage bus and providing output to drive a lighting load, and receiving a plurality of feedback signals from a power factor correction circuit that receives a rectified mains voltage and provides output to the DC voltage bus, and based thereupon operating the power factor correction circuit in transition mode or discontinuous mode based upon the user desired brightness level and a threshold brightness. The plurality of feedback signals include an input sense signal that is a function of the rectified mains voltage as drawn by the power factor correction circuit and an output sense signal that is a function of the output provided to the DC voltage bus.

Abstract: System, method, and circuitry for simulating a memory architecture to generate a bin image of a file tree for a memory embedded on a programmable computing device. A memory configuration of the memory and a file tree identifying a file structure to be used in the memory are obtained. A bin image of a file system for the memory is generated based on the memory configuration and the file tree using a memory simulator and a file-management-system manager. The bin image is provided to the programmable computing device for storage in the memory.

Abstract: An integrated circuit includes a first subsystem including a first clock generator configured to generate a first clock signal. The integrated circuit also includes a second subsystem including a second clock generator configured to generate a second clock signal. The first subsystem includes an edge detector configured to detect an edge of the second clock signal. The first clock generator generates the first clock signal with a selected phase relative to the second clock signal based on the edge of the second clock signal.

Abstract: A substrate made of doped single-crystal silicon has an upper surface. A doped single-crystal silicon layer is formed by epitaxy on top of and in contact with the upper surface of the substrate. Either before or after forming the doped single-crystal silicon layer, and before any other thermal treatment step at a temperature in the range from 600° C. to 900° C., a denuding thermal treatment is applied to the substrate for several hours. This denuding thermal treatment is at a temperature higher than or equal to 1,000° C.

Abstract: A control circuit and a method for delaying an electronic signal are provided, along with a time-to-digital converter including the control circuit. The example control circuit includes a first delay circuit having a first plurality of delay elements electrically connected in series and configured to generate a first control voltage associated with a first delay time. The control circuit further includes a second delay circuit having a second plurality of delay elements electrically connected at least in part in series. The second delay circuit is configured to generate a second control voltage associated with a second delay time. A first group of delay elements within the second plurality of delay elements exhibits the first delay time based on the first control voltage, and a second group of the second plurality of delay elements exhibits a second delay time based at least in part on the second control voltage.

Abstract: A diode and method of design the layout of the same having reduced parasitic capacitance is disclosed. In particular, the diode for providing fast response protection of an RF circuit from a high power noise event, such as an ESD, voltage spike, power surge or other noise is disclose. The parasitic capacitance in disclosed circuit is a greatly reduced compared to the prior art, thus significantly increasing the speed of the response to dissipate all high power noise events.

Abstract: An imaging device includes a sensor array with a number of pixels. In an embodiment, the imaging device can be operated by capturing a first low-spatial resolution frame using a subset of pixels of the sensor array and then capturing a second low-spatial resolution frame using the same subset of pixels of the sensor array. A first depth map is generated using raw pixel values of the first low-spatial resolution frame and a second depth map is generated using raw pixel values of the second low-spatial resolution frame. The first depth map can be compared to the second depth map to determine whether an object has moved in a field of view of the imaging device.

Abstract: An integrated circuit improves scan testing efficiency by addressing slow Scan-OUT pins. The integrated circuit shifts data through high-frequency Scan-OUT pins every cycle and through low-frequency Scan-OUT pins every other cycle. Data that cannot be shifted through low-frequency pins is stored in an accumulator and later shifted out through high-frequency pins. Despite changing the scan-out data pattern, the tester used for testing the integrated circuit anticipates the resulting pattern, providing for the testing to not be negatively impacted.

Abstract: The present disclosure is directed to a device for detecting the passage of an infrared, IR, radiation emitting body in a monitoring zone. The device has a first surface and a second surface mutually tilted and configured to face the monitoring zone. The device includes a first IR radiation sensor extending on the first surface and a second IR radiation sensor extending on the second surface. The first IR radiation sensor is configured to detect the IR radiation of the emitting body when the emitting body is in a first field of view of the first IR radiation sensor and the second IR radiation sensor is configured to detect the IR radiation of the emitting body when the emitting body is in a second field of view of the second IR radiation sensor. The first and the second fields of views are configured to be partially superimposed on each other at the monitoring zone.

Abstract: An integrated circuit includes a memory array and a memory read circuitry for reading data from the memory array. The memory read circuitry includes a leakage current compensation circuit. The leakage current compensation circuit senses the leakage current in a bitline of the memory array during a read operation and generates a leakage compensation current to offset the leakage current during the read operation.

Abstract: An LDO regulator has a pass device arranged between an input node and an output node. The pass device is controlled at a control node by an error amplifier. A first current generator sources compensation current to the control node, a cascode device is arranged between the control node and a compensation node, and a second current generator sinks compensation current from the compensation node. A compensation capacitor is arranged between the output and compensation nodes. Load current through the pass device is sensed to generate a feedback current at a first feedback node. An input branch of a current mirror receives the feedback current. A filtering circuit is coupled between a control terminal of the input branch and a second feedback node. Output branches of the current mirror sink and source additional compensation current from the compensation node and the control node, respectively, proportional to the feedback current.

Abstract: A method of securization of programs in a memory embedded within a microcontroller includes writing a boot program into a first area of the memory and writing at least one additional program into at least one second area of the memory. One or more values of a first register are modified to provide a write protection of the first and second areas. A prohibition against modification of the one or more values of the first register is then implemented when those values are associated with a write protection state of the first area.

Abstract: An output potential level among two first levels is delivered according to an input level among two second levels. The output potential level is delivered at a first node connecting together first and second transistors electrically in series between two second nodes of application of the first levels. A first DC voltage defining a high limit for the control voltage of the first transistor is delivered by a first voltage generator powered by one of the second nodes. A second DC voltage defining a high limit for the control voltage of the second transistor is delivered by a second voltage generator controlled by a value representative of the first voltage and powered between the second nodes.

Abstract: A startup circuit includes a first circuit leg coupled between an input node and an output node and a second circuit leg coupled between the input node and the output node. The first circuit generates a first current and the second circuit leg sinks current from a first node based upon the first current. A third circuit leg is coupled between the input node and the output node and sources current to a second node based upon a voltage at the first node to thereby generate a feedback voltage at the second node. The first circuit leg increases the first current based upon the feedback voltage, in turn increasing the current sunk from the first node by the second circuit leg and increasing the current sourced to the second node by the third circuit leg to thereby generate a startup current at the output node.

Abstract: The disclosure relates to a scan chain circuit comprising cascaded flip-flops having a functional input node and a test input node configured to be selectively coupled to logic circuitry at a clock edge time. A clock line is provided configured to distribute one or more clock signals to the flip-flops in the chain, wherein the flip-flops in the chain have active clock edges applied thereto at respective clock edge times. The chain of flip-flops comprise a set of flip-flops configured to receive an edge inversion signal and to selectively invert their active clock edges in response to the edge inversion signal being asserted.

Abstract: A method for accessing memory cells in an array of memory cells storing respective data signals, wherein memory cells in the array of memory cells have a first, resp. second, node selectively couplable to respective bitline branches in a first, resp. second, set of bitline branches, wherein the first and the second set of bitline branches provide at least one bitline capacitance configured to store a bias level of charge in response to being charged.

Abstract: An electronic device has an input which, in operation, receives an input stream of accelerometer data samples indicative of acceleration values along at least one axis. The devices includes circuitry, coupled to the input. The circuitry, in operation, executes an automatic-learning algorithm on blocks of samples of the input stream of accelerometer data samples to identify, for each block, a corresponding condition-of-user-movement from among a plurality of determined conditions-of-user-movement. The circuitry generates a plurality of streams of samples based on the input stream of accelerometer data samples, and for each condition of movement identified, selects a corresponding stream of samples of the plurality of streams of samples. The circuitry executes a wrist-tilt gesture detection algorithm using samples of the selected stream of the plurality of streams of samples.

Abstract: One or more keys are derived from a master key by executing a plurality of encryption operations. A first encryption operation uses the master key to encrypt a plaintext input having a plurality of bytes. Multiple intermediate encryption operations are performed using a respective intermediate key generated by a previous encryption operation to encrypt respective plaintext inputs having a number of bytes. At least two bytes of a plaintext input have values based on a respective set of bits of a plurality of sets of bits of an initialization vector, wherein individual bits of the respective set of bits are introduced into respective individual bytes of the plaintext input and the respective set of bits has at least two bits and at most a number of bits equal to the number of bytes of the plaintext input.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: According to an embodiment, a method for testing and repairing local memory in a hardware accelerator from a one-time programmable memory (OTP) is provided. The method includes asserting a grant signal, a loading of a first repair data for a sub-set of the local memory associated with a main-controller from a first partition of the OTP memory, communicating a status signal after completion of the loading indicating a completion of the loading, and de-asserting the grant signal in response to receiving the status signal.