Abstract: The disclosure describes a novel method and apparatus for making device TAPs addressable to allow device TAPs to be accessed in a parallel arrangement without the need for having a unique TMS signal for each device TAP in the arrangement. According to the disclosure, device TAPs are addressed by inputting an address on the TDI input of devices on the falling edge of TCK. An address circuit within the device is associated with the device's TAP and responds to the address input to either enable or disable access of the device's TAP.

Abstract: Merging sub-resolution assist features includes receiving a mask pattern that includes the sub-resolution assist features. A first sub-resolution assist feature is selected to merge with a second sub-resolution assist feature. A merge bar width of a merge bar is established. A distance between the first sub-resolution assist feature and the second sub-resolution assist feature is determined. A merging technique is determined in accordance with the distance and the merge bar width. The first sub-resolution assist feature and the second sub-resolution assist feature are merged according to the identified merging technique.

Abstract: The disclosure describes a novel method and apparatus for providing expected data, mask data, and control signals to scan test architectures within a device using the falling edge of a test/scan clock. The signals are provided on device leads that are also used to provide signals to scan test architectures using the rising edge of the test/scan clock. According to the disclosure, device test leads serve to input different test signals on the rising and falling edge of the test/scan clock which reduces the number of interconnects between a tester and the device under test.

Abstract: A media over packet networking appliance provides a network interface, a voice transducer, and at least one integrated circuit assembly coupling the voice transducer to the network interface. The at least one integrated circuit assembly provides media over packet transmissions and holds bits defining reconstruction of a packet stream having a primary stage and a secondary stage. The secondary stage has one or more of linear predictive coding parameters, long term prediction lags, parity check, and adaptive and fixed codebook gains. The packet stream has an instance of single packet loss, and the reconstruction includes receiving a packet sequence represented by P(n)P(n?1)?, [Lost Packet], P(n+2)P(n+1)?, and P(n+3)P(n+2)?, obtaining as information from the secondary stage one or more of the linear predictive coding parameters, long term prediction lags, parity check, and adaptive and fixed codebook gains, and performing an excitation reconstruction utilizing said packet sequence thus received.

Abstract: A transmitter using quadrature modulation includes a rectangular to polar converter for converting data symbols into a polar form, where each polar symbol has a magnitude signal and an angle signal. Digital phase modulation circuitry includes an all digital PLL circuit for generating a phase modulated RF carrier signal responsive to the angle signal frequency control word (FCW) and a carrier frequency FCW. A digitally controlled amplifier for amplifying the phase modulated signal is controlled by a digital amplitude control circuitry for controlling the gain of the digitally controlled amplifier responsive to the magnitude signal.

Abstract: A method and/or a system of a processor-agnostic encoded debug architecture in a pipelined environment is disclosed. In one embodiment, a method of a processor includes processing an event specified by a data processing system coupled to the processor to determine a boundary of the event, generating a matrix having combinations of the event and other events occurring simultaneously in the processor, capturing an output data of observed ones of the event and other events, and applying the matrix to generate an encoded debug data of the output data. The method may also include determining which of the combinations are valid based on an architecture of the processor. The event may be a trace-worthy event whose output value cannot be reliably predicted in an executable file in the data processing system and/or a sync event that is specified by a user of the data processing system.

Abstract: The present invention provides a semiconductor device fuse, comprising a metal layer and a first semiconductor layer that electrically couples the metal layer to a fuse layer, wherein the fuse layer is spaced apart from the metal layer. The semiconductor device fuse further comprises a second semiconductor layer that forms a blow junction interface with the fuse layer. The blow junction interface is configured to form an open circuit when a predefined power is transmitted through the second semiconductor layer to the fuse layer.

Abstract: Scan distributor, collector, and controller circuitry connect to the functional inputs and outputs of core circuitry on integrated circuits to provide testing through those functional inputs and outputs. Multiplexer and demultiplexer circuits select between the scan circuitry and the functional inputs and outputs. The core circuitry can also be provided with built-in scan distributor, collector, and controller circuitry to avoid having to add it external of the core circuitry. With appropriately placed built-in scan distributor and collector circuits, connecting together the functional inputs and outputs of the core circuitry also connects together the scan distributor and collector circuitry in each core. This can provide a hierarchy of scan circuitry and reduce the need for separate test interconnects and multiplexers.

Abstract: With high speed, high resolution time-interleaved (TI) analog-to-digital converters (ADCs), bandwidth mismatches between the various ADC branches can pose a significant problem. Previously, though, no adequate solution has been found. Here, a method and apparatus are provided that can calculate and compensate for bandwidth mismatches in a TI ADC, enabling a high speed, high resolution TI ADC to be produced.

Abstract: A process of selecting alternative test circuitry within an integrated circuit enables a test access port. Scan test instruction data is loaded into an instruction register of a test access port TAP, the instruction data including information for selecting the alternative test circuitry. An Update-IR instruction update operation is performed at the end of the loading to output scan test control signals from the instruction register. A lockout signal is changed to an active state to disable the test access port and enable scan test circuits.

Abstract: A method of manufacturing a semiconductor device, the method comprising: taking an SOI substrate comprising a bulk substrate, a buried insulating layer and an active layer, and implanting the bulk substrate from the side of and through the insulating layer and the active layer so as to generate an area having an increased doping concentration in the bulk substrate at the interface between the bulk substrate and the insulating layer.

Abstract: A switching power supply device for a ripple control system that can obtain the ripple component with the necessary amplitude without using discrete elements. On capacitor Ci of CR integrator 11, a voltage is generated corresponding to the integration value of the voltage applied to inductor Lo. The ripple voltage generated on capacitor Ci has a waveform similar to that of the ripple current flowing through inductor Lo. The voltage of capacitor Ci is converted into current Iq by voltage/current converter 12, and the current is injected in resistor R3 arranged on the transmission path of output feedback voltage VFB in comparator 2. Resistor R3 generates ripple voltage (Iqxr3) corresponding to the ripple current flowing through inductor Lo. The synthetic voltage of the ripple voltage and output feedback voltage VFB is compared to reference voltage Vref.

Abstract: A method is provided for fabricating a ferroelectric capacitor structure including a method for etching and cleaning patterned ferroelectric capacitor structures in a semiconductor device. The method comprises etching portions of an upper electrode, etching ferroelectric material, and etching a lower electrode to define a patterned ferroelectric capacitor structure, and etching a portion of a lower electrode diffusion barrier structure. The method further comprises ashing the patterned ferroelectric capacitor structure using a first ashing process, where the ash comprises an oxygen/nitrogen/water-containing ash, performing a wet clean process after the first ashing process, and ashing the patterned ferroelectric capacitor structure using a second ashing process.

Abstract: Device comprising an ohmic via contact, and method of fabricating thereof. A preferred embodiment comprises forming a metal layer over a substrate, forming a conductive barrier layer over the metal layer, depositing an insulating layer over the conductive barrier layer, creating an opening in the insulating layer to expose the conductive barrier layer, and forming a via contact in the opening. The conductive barrier layer protects the metal layer by preventing the formation of an oxide layer, which could reduce conductivity.

Abstract: An integrated regulated current drive circuit for driving a squib of an inflatable airbag has a current sense resistor connected in series with a load, and a reference resistor connected in series with a reference current source. Both resistors are matched to define a precise ratio of resistance values which determines the amount of current fed to the squib. Both resistors are implemented by combining a number of identical on-chip resistor elements.

Abstract: An embodiment of the present invention uses estimates of delay spreads of transmissions from user equipments (UEs) to a NodeB to determine a set of transmission parameters for the UEs reference signals. In an exemplary embodiment, the transmission parameters for reference signals include cyclic shifts. Thus, embodiments include a set of allocated cyclic shift values that are tailored to the delay spreads. The set of allocated cyclic shift values are used by a corresponding set of UE being served by a NodeB to form references signals. Each UE uses the allocated cyclic shift to form its reference signal by applying the cyclic shift to a modified reference sequence. The modified reference sequence can be generated from a Constant-Amplitude-Zero-Auto Correlation (CAZAC) sequence. The set of allocated cyclic shift values can be updated periodically to account for changes of delay spreads, which can be caused by physical movements of the set of UEs.

Abstract: Data is communicated through two separate circuits or circuit groups, each having clock and mode inputs, by sequentially reversing the role of the clock and mode inputs. The data communication circuits have data inputs, data outputs, a clock input for timing or synchronizing the data input and/or output communication, and a mode input for controlling the data input and/or output communication. A clock/mode signal connects to the clock input of one circuit and to the mode input of the other circuit. A mode/clock signal connects to the mode input of the one circuit and to the clock input of the other circuit. The role of the mode and clock signals on the mode/clock and clock/mode signals, or their reversal, selects one or the other of the data communication circuits.

Abstract: A semiconductor device having a thyristor SCR with reduced turn-off time. A third semiconductor region of the second conductivity type (anode AN) and a fourth semiconductor region of the first conductivity type (anode gate AG) are formed in the top layer of a first semiconductor region; fifth semiconductor region of the first conductivity type (cathode CA) and sixth semiconductor region of the second conductivity type (cathode gate CG) are formed in the top layer of a second semiconductor region; a gate insulating film and gate electrode MG are formed on the second semiconductor region. When the thyristor is turned off from the on state, a higher potential than that on the anode is applied to the anode gate, and a diode made up of the anode and the anode gate inside the thyristor is made to conduct so as to control the potential of the anode during driving.

Abstract: A method implemented to test a plurality of components coupled in a star configuration, each component having a test access port (TAP) controller. The method comprises performing a capture phase of a scan operation on all of the TAP controllers in the star configuration and sequentially selecting one of the TAP controllers at a time to perform a shift state. When all of the TAP controllers have been sequentially selected to perform the shift phase, the method further comprises selecting all of the TAP controllers to perform an update phase.

Abstract: System and method for multistage frame rate conversion. A method comprises receiving an incoming frame at a first frame rate, and determining whether a fault condition exists. The method also includes if the fault condition does not exist, toggling a write buffer pointer from a first frame buffer to a second frame buffer, and storing the incoming frame in the second frame buffer. The method additionally includes if the fault condition exists, determining whether a previously received frame was repeated, discarding the incoming frame if the previously received incoming frame was not repeated, and storing the incoming frame in one of the frame buffers pointed to by the write buffer pointer if the previously received incoming frame was repeated.