Abstract: Methods and circuits process a data block of first bits. A circuit includes a register and a parallel combiner. The register is configured to store second bits. The second bits are iteratively a partial parity for each of multiple frames of the data block. The parallel combiner is coupled to the register and configured to generate a combination of bits from third bits and the second bits from the register. These third bits are iteratively those of the first bits within each of the frames of the data block. The circuit also includes respective exclusive-or circuits associated with the second bits. These exclusive-or circuits are coupled to the parallel combiner and the register. The respective exclusive-or circuit for each second bit is configured to generate the second bit from the combination of bits.

Abstract: A data link interface can include a programmable delay chain configured to provide an amount of delay to a first clock signal that clocks a first portion of a data path. The data link interface can include a phase interpolator configured to determine an amount of phase offset applied to a second clock signal that clocks a second portion of the data path. The data link interface further can include a latency detector coupled to the programmable delay chain and the phase interpolator. The latency detector can measure a phase difference between the first and second clock signals and vary the amount of delay applied to the first clock signal and/or the amount of phase offset on the second clock signal responsive to the phase difference.

Abstract: A multi-fingered device can be calibrated for performance. The multi-fingered device can include a first finger configured to remain active and a second finger that is initially deactivated concurrent with the first finger being active. A measure of degradation for the multi-fingered device within an IC can be determined. The measure of degradation can be compared with a degradation threshold. Responsive to determining that the measure of degradation meets the degradation threshold, a finger of the multi-fingered device can be activated.

Abstract: In accordance with some embodiments, an integrated circuit device comprises a circuit configured to provide a sense signal representing a dynamic power requirement of the circuit to a first sense node, a first sense switch coupled between the first sense node and a first die bump, and a sense switch controller configured to provide a control signal to the first sense switch.

Abstract: Approaches for creating a timed hybrid simulation model for a circuit design specification. An untimed, high-level language (HLL) data-path model is input, along with an HLL data-path interface specification that specifies input ports of the HLL data-path model. A hardware description language (HDL) control-path model that specifies port attributes and associated stitching directives is generated. Each stitching directive specifies a control port and an associated one of the input ports of the HLL data-path model. The HLL data-path and HDL control-path models are linked (314) to create the timed hybrid simulation model, and the timed hybrid simulation model is stored in a processor-readable storage medium.

Abstract: A packet network interface apparatus includes a media access control (MAC) module for constructing a packet for transmission over a packet network and a physical coding sublayer (PCS) module for encoding the packet for transmission over a physical interface. An inter packet gap module located between the MAC module and the PCS module directly transfers data to the PCS module while maintaining a certain inter packet gap by deleting or inserting idle characters. The inter packet gap module has at least one memory module for temporary storage of packet data. The modules preferably operate in a common time domain.

Abstract: A method and apparatus for clock phase alignment are described. An external clock is aligned to an internal clock by adjusting phase of the external clock. The external clock is of a physical medium attachment clock domain, and the internal clock is of a physical coding clock domain. After the aligning of the external clock to the internal clock, the external clock is maintained. The internal clock is aligned to the external clock by adjusting phase of the internal clock.

Abstract: A method of implementing a low power state within a circuit configurable to communicate at one of different communication speeds can include determining a current communication speed of the circuit and determining an inactivity duration of the circuit according to the current communication speed of the circuit. Responsive to detecting inactivity for an amount of time corresponding to the inactivity duration, the low power state can be implemented within the circuit.

Abstract: A system for mobile communication includes a mobile communication device that has a first plurality of antennas and a transmitter. The transmitter, in response to a requested bandwidth for a first packet not being greater than a bandwidth of a first transmit mode, is configured to encode and transmit the first packet from the first plurality of antennas. The first packet has a single-carrier frequency-division-multiple-access (SC-FDMA) modulation of the first transmit mode. In response to a requested bandwidth for a second packet being greater than the bandwidth of the first transmit mode, the transmitter is configured to encode and transmit the second packet from the first antennas. The second packet has a multiple-in-multiple-out orthogonal-frequency-division-multiplexing (MIMO-OFDM) modulation of a second transmit mode. A base station includes a second plurality of antennas and is configured to receive and decode the first packet and the second packet.

Abstract: An embodiment of a method is disclosed for protecting a key from discovery during decryption of a data stream. This embodiment of the method includes decrypting the data stream with the key. Before completing decryption of the data stream, the method checks consistency between a decrypted portion of the data stream and expected data using a circuit arrangement. In response to an inconsistency between the decrypted portion and the expected data, a tampering signal is generated to indicate tampering is suspected.

Abstract: A method of testing a multi-die integrated circuit (IC) can include testing an inter-die connection of the multi-die IC. The inter-die connection can include a micro-bump coupling a first die to a second die. The method can include detecting whether a fault occurs during testing of the inter-die connection. Responsive to detecting the fault, the multi-die integrated circuit can be designated as including a faulty inter-die connection. Also described is an integrated circuit that includes a first die, a second die on which the first die may be disposed, a plurality of inter-die connections coupling the first die to the second die, and a plurality of probe pads, where each probe pad is coupled to at least one of the inter-die connections.

Abstract: Within a system comprising a processor and a memory, a method of automatically documenting a circuit design can include determining an assignment of a user comment entity (UCE) of a high level modeling system (HLMS) circuit design to an HLMS block of the HLMS circuit design, translating each HLMS block of the HLMS circuit design into a hardware description language (HDL) representation of the HLMS block, and for each HLMS block assigned a UCE, inserting within the HDL representation, by the processor, content of the UCE that is assigned to the HLMS block in the form of a comment. The HDL representations can be stored within the memory.

Abstract: Modeling and simulating behavior of a transistor are described. At least one sub-circuit model for modeling at least one second order effect associated with the transistor is obtained. At least one instance parameter for the at least one second order effect is obtained. Operation of a transistor behavior simulator is augmented with the at least one sub-circuit model populated with the at least one instance parameter such that the simulating of the behavior of the transistor produces data that takes into account the at least one second order effect. The at least one second order effect may be an LOD/eSiGe effect, a poly pitch effect, or a DSL boundary effect. Also described is a method for generation of a sub-circuit model.

Abstract: In one embodiment, a differential amplifier is provided. Gates of a first differential pair of transistors, of a first conductivity type, and a second pair or transistors, of a second conductivity type are coupled to first and second input terminals of the differential amplifier. A first pair of adjustable current sources are configured to adjust respective tail currents of the first differential pair of transistors in response to a first bias current control signal. A second pair of adjustable current sources are configured to adjust respective tail currents of the second differential pair of transistors in response to the first bias current control signal. A third pair of adjustable current sources are configured to adjust respective currents through the second differential pair of transistors in response to a second bias current control signal.

Abstract: Processing a circuit design specified in a hardware description language (HDL) can include, for each of a plurality of nets of the circuit design, creating a trace memory structure, using a processor, during compilation of the HDL circuit design. Each trace memory structure can include trace properties indicating whether tracing is active for the net. A transaction function can be generated during compilation for each net. The transaction function can be configured to invoke tracing for each net during simulation of the circuit design according to an evaluation of the trace properties for the net.

Abstract: An embodiment of a method for providing a bandgap voltage is described. In such an embodiment, current density of a current in a bandgap circuit is shifted into a current density range having at least a substantially stable scaling factor to enhance temperature stability of the bandgap voltage, and the bandgap voltage output is moved to a target voltage.

Abstract: A method, non-transitory computer readable medium, and apparatus for performing single event upset detection and correction are disclosed. For example, the method comprises: setting, by a processor, at least one starting address for each of a plurality of rows of a design for an integrated circuit, setting, by the processor, at least one ending address for each of the plurality of rows of the design, and performing, by the processor, the single event upset detection and correction scan in parallel, from the at least one starting address for each of the plurality of rows to the at least one ending address for each of the plurality of rows.

Abstract: When a first sub-circuit of a programmable integrated circuit (“IC”) is to be deactivated, a global write enable (GWE) signal is deasserted. In response to deassertion of the GWE signal and a first memory cell associated with the first sub-circuit being in a first state, flip-flops in the first sub-circuit are disabled from changing state. In response to memory cells associated with sub-circuits other than the first sub-circuit being in a second state, flip-flops in the other sub-circuits are enabled to change state. When the first sub-circuit is to be activated, the GWE signal is asserted. Logic implemented by the first sub-circuit is preserved between the deasserting and the asserting of the GWE signal. In response to assertion of the GWE signal and the first memory cell associated with the first sub-circuit being in the first state, flip-flops in the first sub-circuit are enabled to change state.

Abstract: A method of circuit design includes receiving a user input selecting a first interface of a circuit block of a circuit design as a source interface in creating a connection within the circuit design and selecting a second interface of the circuit design as a candidate destination interface for the connection using a processor. The method further includes determining compatibility between the second interface and the first interface and indicating compatibility of the second interface with the first interface for the connection.

Abstract: In one embodiment a circuit for testing delays is provided. A test signal generator circuit toggles a plurality of output signals 1 through N in sequential order, separating the toggles by a delay period. Each output signal is coupled to an input of a respective one of a plurality of delay circuits. A phase detector circuit is coupled to the delay circuits and is configured to determine the order in which signals output from delay circuits X?1, X, and X+1 are toggled for each delay circuit X. In response to the output signals being toggled in the order X?1 followed by X followed by X+1, the phase comparator circuit is configured to output a first signal indicating correct operation. Otherwise, the phase comparator circuit is configured to output a second signal indicating incorrect operation.