Abstract: A Body Spatial Dimension Mapper (BSDM) comprising a body mapping booth (10), an array of laser range detectors mounted on the top (17) and bottom (18) of the booth, a moveable circular sensor ring (11), a sensor controller and processing unit (13), and a media production unit (14). The BSDM provides a highly automated and accurate method for determining 3-D surface measurements of a human body, a digital representation of the body shape, contour, length, width, and volume measurements, and a digital format of these measurements for storage, transmission, and computer processing. It is applicable to the garment, online clothing retail, and medical industries.

Abstract: A method and apparatus measure properties of two layers of a damascene structure (e.g. a silicon wafer during fabrication), and use the two measurements to identify a location as having voids. The two measurements may be used in any manner, e.g. compared to one another, and voids are deemed to be present when the two measurements diverge from each other. In response to the detection of voids, a process parameter used in fabrication of the damascene structure may be changed, to reduce or eliminate voids in to-be-formed structures.

Abstract: A system and process for inspecting an underlying edge of a composite article, such as a disposable absorbent article. The article has first and second panels in at least partially opposed, overlapping engagement with each other. The process and system determine whether the panels of the article are present and/or properly positioned. Also disclosed is a process and system for detecting whether one or more components are present and/or properly positioned in the composite article by use of infrared radiation. Also disclosed is a process and system for defining a window in an image of the article, scanning the defined window to determine a position of the edge and redefining the window in the event that the edge is not located within the defined window during scanning of the defined window.

Abstract: A gas permeable probe for use in an optical analyzer for an exhaust gas stream flowing through a duct or chimney has: an elongate hollow structure having first and second ends and a side wall, with an optical cavity defined between the first and second ends within the side wall, a filter forming part of the elongate hollow structure, a mounting structure at the first end and adapted for mounting the elongate hollow structure within the duct or chimney, an optical window at the first end permitting a light beam originating from an optical analyzer to enter into the optical cavity to travel from the first end to the second end, a retroreflector provided at the second end for returning the light beam to the first end of the hollow structure, and a tube disposed within the mounting structure and having first and second opposite ends, the first opposite end being located remote from the first end of the elongate hollow structure and being closed by a first window adapted to transmit the light beam from an optic

Abstract: A quality test of fluids of biological origin can be performed optically with applying a suitable evaluation method. In case of two components to be determined in a such fluid, an extinction spectrum is approximated in a first wavelength range by a combination of a merely theoretical curve and the spectrum of the pure first substance in a first wavelength range, and this evaluation is repeated in a second wavelength range this time by approximating the measured spectrum (62) by a combination of a hypothetical curve, the spectrum (64) of the first component with the already determined concentration, and the spectrum (65) of the pure second component. Furthermore, it is feasible to subtract the first and second spectrum and analyze the so obtained differential spectrum (66) in view of anomalies. The hypothetical curves are preferably straight lines which are defined by slope and ordinate section.

Abstract: System for scanning a surface, including a light source producing an illuminating light beam; an objective lens assembly, located between the light source and the surface; at least one light detector; an apodizator located between the light source and the objective lens assembly; and a relay lens assembly located between the apodizator and the objective lens assembly, wherein the light source produces an image of the illuminating light beam on the apodizator, the apodizator blocks at least a portion of the illuminating light beam, the relay lens assembly images the blocked illuminating light beam at an entrance pupil of the objective lens assembly, and wherein at least one of said at least one light detector, detects light reflected from said surface.

Abstract: The system has a single pulse spectrum capability for sensing the presence of contamination on a surface to be interrogated. The system includes a narrow frequency bandwidth visible pulse and broadband infrared pulse that are directed to the surface. An output wavelength discriminator receives the reflected sum-frequency that is generated. The output wavelength discriminator is substantially non-transmissive at the frequencies of the visible pulse and the infrared pulse, but is substantially transmissive at the sum-frequency of the visible pulse and the infrared pulse. The output of the wavelength discriminator is a broadband output. A frequency disperser receives the output of the wavelength discriminator and provides a physical separation of output wavelengths of the broadband output. A multi-channel analyzer analyzes the intensity of the physically separated output wavelengths as a function of their physical positions.

Abstract: A diffusion-type gas sensor is disclosed. The sample chamber uses a narrow slot as a gas diffusion port. The slot is advantageous as it can be formed during extrusion of chamber stock material, instead of during subsequent machining steps that are costly and may adversely affect the chamber surfaces. Further, the slot profile can be designed according to various profiles and/or positions that can improve gas diffusion, chamber reflection efficiency, or both, as compared to conventional ported chamber designs.

Abstract: In a defect inspecting apparatus, having contrast, brightness and appearance of a target for inspection and detection sensitivity of a defect changed depending on optical system conditions, and adapted to perform inspection by selecting an optimal test condition, even an unskilled user can easily select an optimal optical condition by quantitatively displaying evaluation values side by side when optical system conditions are changed. Moreover, by selecting an evaluation item having highest satisfaction based on a result of a series of test inspection, an optimal test condition can be automatically selected.

Abstract: An apparatus and method for detecting pattern defects and/or particles on the front surface of a semiconductor wafer having repetitive patterns includes a laser for illuminating an area on the front surface with a beam of polarized light. A lens collects light scattered from the area and forms a Fourier diffraction pattern of the area illuminated. A Fourier mask blocks out scattered light collected by the lens at locations in the Fourier diffraction pattern where the intensity is above a predetermined level indicative of background information and leaves in light at locations where the intensity is below the threshold level indicative of possible particle information. The Fourier mask includes a spatial light modulator and a polarization discriminator. The lens also images the area illuminated onto a camera using scattered light collected from the area by the lens and not blocked out by the Fourier mask.

Abstract: A displacement sensor includes a light emitter for emitting light towards a target object, a detector for receiving reflected light from the target object and generating a detection signal which depends on the distance to the target object, a signal processor for calculating the distance to the target object from the detection signal. The signal processor receives from another sensor a data item representing a distance value calculated by the latter and carries out a specified calculation using also the result of calculation with the calculated distance obtained by itself and said calculated distance data item and to output the result of said calculation.

Abstract: A method of automatically sorting and placing parts for inspection is described which includes orienting the parts within a feeder and delivering the oriented parts from the feeder to an escapement. Once the parts are delivered, they are advanced from the escapement, one at a time, down a ramp, and caught by a resilient material. The parts are then transferred ring from the resilient material to a parts fixture and positioned for inspection in the parts fixture within ±0.001 inch in a vertical direction and within 0.002 inches in x and y directions, x and y defining a horizontal plane.

Abstract: An apparatus and method permits measuring of near-direct forward scattering functions in water to enable acceptable underwater imaging for detection, classification, and identification of objects, such as mines. A source of light mounted on a housing member receiving ambient water emits a beam of light along an axis to a scattering detector assembly mounted on the base member. The detector assembly has a central active region disposed in the axis to receive portions of the light beam emitted along the axis and a plurality of concentric active regions are located radially outwardly from the central active region and the axis to receive scattered portions of the light beam. The central and concentric active regions provide signals representative of the magnitudes of the axial and scattered portions of the light beam for determination of the scattering function of the ambient water.

Abstract: The distribution states of defects are analyzed on the basis of the coordinates of defects detected by an inspection apparatus to classify them into a distribution feature category, or any one of repetitive defect, congestion defect, linear distribution defect, ring/lump distribution defect and random defect. In the manufacturing process for semiconductor substrates, defect distribution states are analyzed on the basis of defect data detected by an inspection apparatus, thereby specifying the cause of defect in apparatus or process.

Abstract: Method for determining useful properties of individual building blocks of a material library including a substrate having at least two individual building blocks in at least two sections separated from one another, which method includes: (ii) introducing at least one starting material into at least two sections of a substrate of a material library which are separated from one another, in order to carry out a chemical or physical or chemical and physical reaction of the starting material in the at least two substrate sections separated from another, in each case in the presence of the corresponding building block, obtaining in each case an effluent comprising at least one reaction product and/or starting material and, (iii) analysing the effluent obtained in the reaction according to (ii) comprising at least one reaction product and/or starting material; the effluent being analysed by recording and analysing at least one photoacoustic signal.

Abstract: Methods and apparatus for analysis of multiple samples by photoacoustic spectroscopy are disclosed. Particularly, a photoacoustic spectroscopy sample array vessel including a vessel body having multiple sample cells connected thereto is disclosed. At least one acoustic detector is acoustically coupled with the vessel body. Methods for analyzing the multiple samples in the sample array vessels using photoacoustic spectroscopy are provided.

Abstract: The invention relates to a portable device for carrying out examinations of turbid media using a three-dimensional cross-correlation technique and for suppressing the influence of multiple scattering, as well as to an adjustment method for adjusting the device. The device has a base plate (1) upon which an adjustable laser (2) is positioned in tilting devices or by means of mirrors for directing the laser beam perpendicularly onto the wall of a cuvette (6) filled with a medium to be examined. The device is provided with a translucent plate (7) which in some sections is completely mirror-coated and in other sections is partially mirror-coated and which serves as a beam splitter (4). The plate is firmly secured to the base plate (1) using a positioning fixture (8) whose support surface (16) for the translucent plate (7) is situated at a fixed angle with respect to the base plate (1).

Abstract: Methods and apparatus for simultaneous or sequential, rapid analysis of multiple samples by photoacoustic spectroscopy are disclosed. A photoacoustic spectroscopy sample array including a body having at least three recesses or affinity masses connected thereto is used in conjunction with a photoacoustic spectroscopy system. At least one acoustic detector is positioned near the recesses or affinity masses for detection of acoustic waves emitted from species of interest within the recesses or affinity masses.

Abstract: A method for modeling optical scattering includes an initial step of defining a zero-th order structure (an idealized representation) for a subject including a perturbation domain and a background material. A Green's function and a zero-th order wave function are obtained for the zero-th order structure using rigorous coupled wave analysis (RCWA). A Lippmann-Schwinger equation is constructed including the Green's function, zero-th order wave function and a perturbation function. The Lippmann-Schwinger equation is then evaluated over a selected set of mesh points within the perturbation domain. The resulting linear equations are solved to compute one or more reflection coefficients for the subject.

Abstract: An apparatus and a method for reading a mark on a wafer. The apparatus includes a wafer receptacle having a mirror material coated on one side and a plurality of slots formed therein. The wafer receptacle is coupled to a base plate via a back support. The apparatus may also include a front support coupled between the wafer receptacle and the base plate. A plurality of concave mirrors are coupled to the base plate. A wafer placed in one of the plurality of slots reflects light to the mirror material coating the wafer receptacle. The light is reflected by the mirror material to one of the concave mirrors, which rectifies an image contained in the light and reflects the rectified image to the back support. The image can be viewed on the back support.