Abstract: A sensing-amplifier device includes a first input terminal, a second input terminal, a reference unit, and a sense amplifier. The reference unit is configured to provide a reference signal. The switching unit is selectively coupled to the first input terminal, the second input terminal, and a reference unit. The sense amplifier includes two terminals. The two terminals of the sense amplifier are coupled to the first input terminal and the second input terminal respectively by switching of the switching unit so as to operate in a twin memory unit mode, or one terminal of the sense amplifier is coupled to the first input terminal or the second input terminal and the other terminal of the sense amplifier is coupled to the reference unit by switching of the switching unit so as to operate in a single memory unit mode.

Abstract: A semiconductor memory device which is able to perform a power sequence with high reliability is provided. When a power from an external device is supplied, the controller of the flash memory of the invention is configured to read codes stored in a read-only memory in synchronization with a clock signal to perform a power-on sequence. In addition, the controller is further configured to deactivate the clock signal so as to pause the power-on sequence when it has been detected during the power-on sequence that the voltage of the power is not greater than a threshold, and to activate the clock signal to resume the power-on sequence when it is detected that the voltage of the supplied power exceeds the threshold again.

Abstract: The present disclosure includes apparatuses and methods related to shifting data. A number of embodiments of the present disclosure include an apparatus comprising a shift register comprising an initial stage and a final stage. The shift register may be configured such that a clock signal may be initiated at the final stage of the shift register.

Abstract: A forming method of a resistive memory device is provided. The forming method includes: conducting a forming procedure to apply a forming voltage to the resistive memory device such that the resistive memory device changes from a high resistive state to a low resistive state and measuring a first current of the resistive memory device; performing a thermal step on the resistive memory device and measuring a second current of the resistive memory device; and comparing the second current to the first current and determining to apply a first voltage signal or a second voltage signal to the resistive memory device or to finish the forming procedure according to a comparison result of the first current and the second current. In addition, a memory storage apparatus including a resistive memory device is also provided.

Abstract: Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to implement circuits configured to compensate for parameter variations in layers of memory by adjusting access signals during memory operations. In some embodiments, memory cells are based on third dimensional memory technology. In at least some embodiments, an integrated circuit includes multiple layers of memory, a layer including sub-layers of semiconductor material. The integrated circuit also includes an access signal generator configured to generate an access signal to facilitate an access operation, and a characteristic adjuster configured to adjust the access signal for each layer in the multiple layers of memory.

Abstract: A memory bypass circuit for a memory device comprises: a word line disable circuit; a read and write activation circuit; an internal clock generator; and a write data input circuit. The word line disable circuit is coupled to a word line of the memory device for disabling a write function to the word line. The read and write activation circuit is coupled to the memory device for reading and writing of input data. The internal clock generator is coupled to the word line disable circuit and the read/write activation circuit. The write data input circuit is coupled to a write driver of the memory device for providing write data.

Abstract: Methods of operating semiconductor memory devices with floating body transistors, using a silicon controlled rectifier principle are provided, as are semiconductor memory devices for performing such operations.

Abstract: A semiconductor device includes: a stack structure; a source connection structure penetrating the stack structure; n first channel rows located at one side of the source connection structure, the n first channel rows including channel patterns; and n+k second channel rows located at the other side of the source connection structure, at least one channel row among the n+k second channel rows including dummy channel patterns, wherein the n and k are integers.

Abstract: A memory device is provided. The memory device comprises a memory array and circuitry configured to determine one or more settings for the memory array corresponding to a powered-on state of the memory device, to store the one or more settings in a non-volatile memory location, and in response to returning to the powered-on state from a reduced-power state, to read the one or more settings from the non-volatile memory location.

Abstract: A nonvolatile memory device includes a plurality of memory cells coupled to a single bit line, wherein each of the plurality of memory cells is coupled to a different word line from a plurality of word lines. The nonvolatile memory device includes a decoder configured to sequentially apply a read voltage of a first level to target word lines among the word lines, based on a multi-read command. The nonvolatile memory device includes a read circuit configured to obtain first sensing values of target memory cells coupled to the target word lines, by sensing the bit line each time the read voltage of the first level is applied to each of the target word lines.

Abstract: A memory device includes a memory array including a plurality of memory cells; and an array timer coupled to the memory array, configured to generate an output timing signal based on a fixed input and a reference signal, wherein: the fixed input is from a supply circuit, the reference signal is from a reference block, and the output timing signal is configured to control the memory array.

Abstract: A system and method for determining a condition of a filter filtering fuel associated with an engine. Input information relating to the operation of the engine is provided by a plurality of sensors. At least some of the input information is used to determine a plurality of input variables, the plurality of input variables representing a plurality of engine operating conditions including engine run time, engine torque and engine speed. An algorithm incorporating the input variables is used to determine the condition of the filter. Information concerning the condition of the filter may be output to a user such as an operator or service provider.

Abstract: A semiconductor package for performing a reset operation includes a first semiconductor device including a first resistor element coupled to a reset pin, the first semiconductor device configured to be applied with a reset signal through the reset pin such that the reset operation is performed. The semiconductor package includes a second semiconductor device including a second resistor element coupled to the reset pin, the second semiconductor device configured to be applied with the reset signal through the reset pin such that the reset operation is performed. The first resistor element and the second resistor element may be selectively coupled to the reset pin when the reset operation is performed.

Abstract: A non-volatile memory system comprises a memory structure and a control circuit connected to the memory structure. The control circuit includes a programmable and reprogrammable hybrid microcontroller having a state machine and one or more processors. The state machine is configured to generate a first set of execution signals in response to a request to perform memory operations on non-volatile memory cells in the memory system. The first set of execution signals have a format configured to interface with one or more circuits coupled to the non-volatile memory cells. The hybrid microcontroller has an interface that translates the first set of execution signals to instruction identifiers. The one or more processors execute instructions identified by the instruction identifiers to generate a second set of execution signals. The second set of execution signals are provided to the one or more circuits to perform the memory operations on the non-volatile memory cells.

Abstract: In one embodiment, a computing device includes one or more processors configured to execute instructions that cause the one or more processors to acquire pressure data measured by at least one pressure sensor disposed proximate to a filter house in an intake of a gas turbine engine system, derive an airflow or an air mass flow through a duct of the intake using a thermodynamic model of the gas turbine engine system based at least on the pressure data, derive an intake pressure drop in the duct using at least the pressure data, derive a loss parameter of the filter house by combining the air mass or air mass flow, and the intake pressure drop, derive a pressure loss model based on the loss parameter over a period of time, and determine a condition of the filter house based on the pressure loss model.

Abstract: Systems and devices are provided for fully discharging leakage current generated during standby and/or power down modes regardless of variations in PVT conditions. An apparatus may include a power generation unit that powers components of the apparatus and a bleeder circuit. The bleeder circuit may include an operational amplifier. Further, the bleeder circuit may include leakage current generator circuitry that is coupled to the operational amplifier and generates a first current that mimics leakage current generated by the power generation unit. Furthermore, the bleeder circuit may include leakage current mirroring circuitry that is coupled to an output of the operational amplifier and that generates a second current that mirrors the first current. In addition, the bleeder circuit may also include leakage current bleeder circuitry that is coupled to the leakage current mirroring circuitry and that generates a third current that sinks the leakage current to ground.

Abstract: Once a delay locked loop has been locked to a clock signal, an omitted clock cycle is injected into the input of the delay locked loop without stopping the operation of the delay locked loop. The omitted cycle is later detected at an output of the delay locked loop, and the delay between the input and output is determined based on the time the omitted cycle requires to propagate through the delay locked loop. Once determined, the number of cycles of delay for the delay locked loop can be used in conjunction with an internal clock signal to launch data and/or data strobes from memory devices and memory controllers such that the proper phase alignment and clock cycle alignment is achieved.

Abstract: A self-time circuitry is coupled to a first power rail to receive a first voltage and a second power rail to receive a second voltage. The self-time circuitry includes a tracking control circuit which generates a first tracking signal at the first voltage and a second tracking signal at the second voltage. In response to a memory access request, a first number of dummy discharge cells (DDCs) in a first DDC group are activated according to the first tracking signal to discharge a dummy bit line (DBL), and a second number of DDCs in a second DDC group are activated according to the second tracking signal to discharge the DBL. The DBL mimics operations of a bit line in a memory cell array and the DDCs in the first DDC group and the second DDC group mimic operations of bit cells in the memory cell array.

Abstract: A spin current magnetization rotational element including a first ferromagnetic metal layer in which a magnetization direction is variable, and a spin-orbit torque wiring that extends in a second direction intersecting a first direction that is a plane-orthogonal direction of the first ferromagnetic metal layer, and is joined to the first ferromagnetic metal layer. The first ferromagnetic metal layer has a lamination structure including a plurality of ferromagnetic constituent layers and a plurality of nonmagnetic constituent layers which are respectively interposed between the ferromagnetic constituent layers adjacent to each other.

Abstract: A memory array includes wordlines, local bitlines, two-terminal memory elements, global bitlines, and local-to-global bitline pass gates and gain stages. The memory elements are formed between the wordlines and local bitlines. Each local bitline is selectively coupled to an associated global bitline, by way of an associated local-to-global bitline pass gate. During a read operation when a memory element of a local bitline is selected to be read, a local-to-global gain stage is configured to amplify a signal on or passing through the local bitline to an amplified signal on or along an associated global bitline. The amplified signal, which in one embodiment is dependent on the resistive state of the selected memory element, is used to rapidly determine the memory state stored by the selected memory element. The global bit line and/or the selected local bit line can be biased to compensate for the Process Voltage Temperature (PVT) variation.