Patents by Inventor Tadahiro Ohmi

Tadahiro Ohmi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8502450
    Abstract: With respect to a vacuum tube having a reduced pressure vessel containing an electric discharge gas sealed therein, problems such as the lowering of discharge efficiency owing to an organic material, moisture or oxygen remaining in the reduced pressure vessel have taken place conventionally. It has been now found that the selection of the number of water molecules, the number of molecules of an organic gas and the number of oxygen molecules remaining in the reduced pressure vessel, in a relation with the number of molecules of a gas contributing the electric discharge allows the reduction of the adverse effect by the above-mentioned remaining gas. Specifically, the selection of the number of molecules of the above electric discharge gas being about ten times that of the above-mentioned remaining gas or more can reduce the adverse effect by the above-mentioned remaining gas.
    Type: Grant
    Filed: March 31, 2005
    Date of Patent: August 6, 2013
    Assignee: Foundation for Advancement of International Science
    Inventors: Tadahiro Ohmi, Akihiro Morimoto
  • Patent number: 8496792
    Abstract: In a rotary magnet sputtering apparatus, a target consumption displacement quantity is measured, and corresponding to the measurement results, a distance between a rotating magnet group and a target is adjusted, and uniform film forming rate is achieved over a long period of time so as to reduce the change of a target surface due to consumption of the target and to reduce the change of the film forming rate with time. An ultrasonic sensor or a laser transmitting/receiving device may be used as a means for measuring the consumption displacement quantity of the target.
    Type: Grant
    Filed: March 28, 2008
    Date of Patent: July 30, 2013
    Assignees: National University Corporation Tohoku University, Tokyo Electron Limited
    Inventors: Tadahiro Ohmi, Tetsuya Goto, Takaaki Matsuoka
  • Patent number: 8497214
    Abstract: A semiconductor device manufacturing method, the method including: forming a semiconductor element on a semiconductor substrate; and by using microwaves as a plasma source, forming an insulation film on the semiconductor element by performing a CVD process using microwave plasma having an electron temperature of plasma lower than 1.5 eV and an electron density of plasma higher than 1×1011 cm?3 near a surface of the semiconductor substrate.
    Type: Grant
    Filed: August 7, 2008
    Date of Patent: July 30, 2013
    Assignees: Tokyo Electron Limited, National University Corporation Tohoku University
    Inventors: Hirokazu Ueda, Toshihisa Nozawa, Takaaki Matsuoka, Akinobu Teramoto, Tadahiro Ohmi
  • Publication number: 20130187283
    Abstract: Provided is a method of manufacturing a semiconductor device of a multilayer wiring structure that comprises a CFx film as an interlayer insulating film, that can make the most of the advantage of the CFx film having a low dielectric constant, and that can prevent degradation of the properties of the CFx film due to CMP. The method of this invention includes (a) forming a CFx film, (b) forming a recess of a predetermined pattern on the CFx film, (c) providing a wiring layer so as to bury the recess and to cover the CFx film, and (d) removing the excess wiring layer on the CFx film other than in the recess by CMP (Chemical Mechanical Polishing), thereby exposing a surface of the CFx film, wherein (e) nitriding the surface of the CFx film is provided before or after (b).
    Type: Application
    Filed: October 3, 2011
    Publication date: July 25, 2013
    Applicant: NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
    Inventors: Tadahiro Ohmi, Xun Gu
  • Publication number: 20130189423
    Abstract: Disclosed is a method for prediction of a film material such as a raw material for organic EL. In the method, a film material having an evaporation rate (V (%)) represented by the formula below can be predicted based on the values of the constant (Ko) and the activation energy (Ea). V=(Ko/P)×e?Ea/kT wherein Ko represents a constant (%·Torr), P represents a pressure (Torr), Ea represents an activation energy (eV), k represents a Boltzmann constant, and T represents an absolute temperature.
    Type: Application
    Filed: July 23, 2012
    Publication date: July 25, 2013
    Inventors: Tadahiro OHMI, Shozo Nakayama, Hironori Ito
  • Patent number: 8492879
    Abstract: On a surface of a semiconductor substrate, a plurality of terraces formed stepwise by an atomic step are formed in the substantially same direction. Using the semiconductor substrate, a MOS transistor is formed so that no step exists in a carrier traveling direction (source-drain direction).
    Type: Grant
    Filed: October 6, 2008
    Date of Patent: July 23, 2013
    Assignees: National University Corporation Tohoku University, Shin-Etsu Handotai Co., Ltd.
    Inventors: Tadahiro Ohmi, Akinobu Teramoto, Tomoyuki Suwa, Rihito Kuroda, Hideo Kudo, Yoshinori Hayamizu
  • Patent number: 8485534
    Abstract: A metal gasket includes an outer ring that is formed in a substantially C-shaped cross-section having an opening in a circumferential direction and an inner ring that is disposed inside the outer ring, wherein the inner ring is configured in a polygonal shape of a cross section, and a pair of corner portions opposing to each other in the inner ring are disposed on inner circumferential faces on the both sides of the opening in the outer ring.
    Type: Grant
    Filed: May 7, 2009
    Date of Patent: July 16, 2013
    Assignees: Tohoku University, Nippon Valqua Industries, Ltd.
    Inventors: Tadahiro Ohmi, Yasuyuki Shirai, Koji Sato, Masayuki Noguchi, Tsutomu Yoshida, Akira Muramatsu, Satoshi Kumaki, Yuki Kuwamura
  • Publication number: 20130154469
    Abstract: Provided is a cathode body that comprises a cylindrical cup 30 as a base member, a barrier layer 303 provided on a surface of the cylindrical cup 30 and containing SiC, and a film formed on a surface of the barrier layer 303 and containing a boride of a rare earth element and that can prevent interdiffusion of a constituent element of the base member and the boride.
    Type: Application
    Filed: August 30, 2011
    Publication date: June 20, 2013
    Applicant: NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
    Inventors: Tadahiro Ohmi, Tetsuya Goto, Hidekazu Ishii
  • Patent number: 8465719
    Abstract: A silicon carbide substrate has a high-frequency loss equal to or less than 2.0 dB/mm at 20 GHz is effective to mount and operate electronic components. The silicon carbide substrate is heated at 2000° C. or more to be reduced to the high-frequency loss equal to 2.0 dB/mm or less at 20 GHz. Moreover, manufacturing the silicon carbide substrate by CVD without flowing nitrogen into a heater enables the high-frequency loss to be reduced to 2.0 dB/mm or less.
    Type: Grant
    Filed: April 16, 2009
    Date of Patent: June 18, 2013
    Assignees: National University Corporation Tohoku University, Mitsui Engineering & Shipbuilding Co., Ltd.
    Inventors: Tadahiro Ohmi, Akinobu Teramoto, Sumio Sano, Fusao Fujita
  • Publication number: 20130140700
    Abstract: Provided is a method of manufacturing a TSV structure, which prevents a substrate from warping even if it is made thin. A method of manufacturing a semiconductor device comprises integrating semiconductor elements on a surface of a semiconductor substrate to form at least a part of a circuit, forming holes from the surface of the semiconductor substrate, forming an insulating film and a barrier film on an inner surface of each hole, forming a conductive metal on a surface of the barrier film to fill each hole, processing a back surface of the semiconductor substrate to reduce the thickness thereof to thereby protrude the conductive metal, and providing a SiCN film on the back surface of the semiconductor substrate.
    Type: Application
    Filed: August 4, 2011
    Publication date: June 6, 2013
    Applicant: NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
    Inventor: Tadahiro Ohmi
  • Publication number: 20130140984
    Abstract: A plasma processing apparatus can excite uniform plasma on a large substrate. The plasma processing apparatus 10 includes a vacuum chamber 100 having therein a mounting table 115 configured to mount a substrate G, and a plasma space, formed above the mounting table, in which plasma is generated; a first coaxial waveguide 225 through which a high frequency power for exciting plasma is supplied into the vacuum chamber 100; a waveguide path 205, connected to the first coaxial waveguide 225, having a slit-shaped opening toward the plasma space; and an adjusting unit configured to adjust a wavelength of the high frequency power propagating in the waveguide path in a lengthwise direction of the slit-shaped opening. By adjusting the wavelength of the high frequency power propagating in the waveguide path to be sufficiently lengthened, uniform plasma can be excited on the large substrate.
    Type: Application
    Filed: July 14, 2011
    Publication date: June 6, 2013
    Applicants: TOHOKU UNIVERSITY, TOKYO ELECTRON LIMITED
    Inventors: Masaki Hirayama, Tadahiro Ohmi
  • Publication number: 20130118568
    Abstract: It is an object of this invention to provide a photoelectric conversion member including a heat dissipation mechanism which is more excellent in heat dissipation characteristics than conventional mechanisms. A photoelectric conversion member 1 of this invention includes a first electrode layer 20, a power generation laminate 22, and a second electrode layer 26 formed on the power generation laminate 22 through a nickel layer 24. A passivation layer 28 made of a material containing SiCN is formed on the second electrode layer 26. On the passivation layer 28, a heat dissipation structure 31 is provided. The heat dissipation structure 31 contains 40 to 750 parts by mass of an expanded graphite powder (E) per 100 parts by mass of at least one type of polymer (S).
    Type: Application
    Filed: July 22, 2011
    Publication date: May 16, 2013
    Applicant: NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
    Inventors: Tadahiro Ohmi, Takurou Kumamoto
  • Patent number: 8420974
    Abstract: A fixing structure for a welding electrode and a welding head is shown which enable improvement of durability of a welding electrode, improvement of work efficiency in welding, and a reduction of time required for welding and also which make it possible to execute welding for an extended time with high reliability. In the fixing structure, a fixed section of a welding electrode is inserted via a thermally conductive material into an inserting section of a fixing base and a peripheral surface of the fixed section of the welding electrode is uniformly contacted to the fixing base to affix the welding electrode to the fixing base.
    Type: Grant
    Filed: October 8, 2002
    Date of Patent: April 16, 2013
    Assignees: Kabushiki Kaisha Ultraclean Technology Research Institute
    Inventors: Tadahiro Ohmi, Takahisa Nitta, Yasuyuki Shirai, Osamu Nakamura
  • Patent number: 8418714
    Abstract: A pressure type flow rate control apparatus is provided wherein flow rate of fluid passing through an orifice is computed as Qc=KP1 (where K is a proportionality constant) or as Qc=KP2m(P1?P2)n (where K is a proportionality constant, m and n constants) by using orifice upstream side pressure P1 and/or orifice downstream side pressure P2. A fluid passage between the downstream side of a control valve and a fluid supply pipe of the pressure type flow rate control apparatus comprises at least 2 fluid passages in parallel, and orifices having different flow rate characteristics are provided for each of these fluid passages, wherein fluid in a small flow quantity area flows to one orifice for flow control of fluid in the small flow quantity area, while fluid in a large flow quantity area flows to the other orifice for flow control of fluid in the large flow quantity area.
    Type: Grant
    Filed: June 22, 2006
    Date of Patent: April 16, 2013
    Assignees: Fujikin Incorporated, National University Corporation Tohoku University, Tokyo Electron Ltd.
    Inventors: Tadahiro Ohmi, Masahito Saito, Shoichi Hino, Tsuyoshi Shimazu, Kazuyuki Miura, Kouji Nishino, Masaaki Nagase, Katsuyuki Sugita, Kaoru Hirata, Ryousuke Dohi, Takashi Hirose, Tsutomu Shinohara, Nobukazu Ikeda, Tomokazu Imai, Toshihide Yoshida, Hisashi Tanaka
  • Publication number: 20130084059
    Abstract: A vaporizer, capable of stabilizing the behavior of pressure inside the vaporizer, includes a chamber having an inlet and an outlet, a heating device that heats the inside of the chamber, a partition wall structure 13 that is provided inside the vaporizer and partitions the liquid material inside the chamber into a plurality of sections, and liquid distribution portions 20 that are provided at the lower portion of the partition wall structure 13 and that allow liquid distribution among the sections partitioned by the partition wall structure 13, and the partition wall structure includes a grid-like, honeycomb-shaped, mesh-like, or pipe-shaped partition wall.
    Type: Application
    Filed: August 1, 2012
    Publication date: April 4, 2013
    Applicants: TOHOKU UNIVERSITY, FUJIKIN INCORPORATED
    Inventors: Tadahiro Ohmi, Yasuyuki Shirai, Masaaki Nagase, Satoru Yamashita, Atsushi Hidaka, Ryousuke Dohi, Kouji Nishino, Nobukazu Ikeda, Keiji Hirao
  • Patent number: 8399862
    Abstract: When positively charged ions are implanted into a target substrate, charge-up damage may occur on the target substrate. In order to suppress charge-up caused by secondary electrons emitted from the target substrate when positively charged ions are implanted, a conductive member is installed at a position facing the target substrate and electrically grounded with respect to a high frequency. Further, a field intensity generated in the target substrate may be reduced by controlling an RF power applied to the target substrate in pulse mode.
    Type: Grant
    Filed: December 20, 2007
    Date of Patent: March 19, 2013
    Assignees: National University Corporation Tohoku University, Tokyo Electron Limited
    Inventors: Tadahiro Ohmi, Tetsuya Goto, Akinobu Teramoto, Takaaki Matsuoka
  • Publication number: 20130058823
    Abstract: A screw vacuum pump includes a male rotor, a female rotor, a stator, and a drive motor/motors. A screw gear portion of the male rotor, a screw gear portion of the female rotor, and the stator cooperatively form a gas working chamber. The stator has an inlet port and an outlet port. At least one of the male rotor and the female rotor has a rotor hollow portion which is opened on at least one end face side in a rotation-axis longitudinal direction of the male rotor and/or the female rotor. The drive motor is at least partially received in the rotor hollow portion.
    Type: Application
    Filed: May 13, 2010
    Publication date: March 7, 2013
    Applicant: NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
    Inventors: Tadahiro Ohmi, Isao Akutsu
  • Patent number: 8389867
    Abstract: For the purpose of providing a semiconductor element built-in type multilayered circuit board in which a semiconductor element is closely joined to a recess of an insulating substrate to effectively disperse heat generated from the semiconductor element through the insulating substrate at a working temperature region of the semiconductor element circuit board, to surely conduct an electrical connection of an electronic part such as semiconductor element or the like in a short wiring and to enable the high density mounting of semiconductor elements, miniaturization and increase of working speed, there is proposed a semiconductor element built-in type multilayered circuit board formed by laminating a plurality of semiconductor element built-in type boards each comprising an insulating substrate and a semiconductor element accommodated in a recess formed therein, characterized in that a difference between a linear expansion coefficient of the insulating substrate and a linear expansion coefficient of the semicon
    Type: Grant
    Filed: September 29, 2006
    Date of Patent: March 5, 2013
    Assignees: Ibiden Co., Ltd., National University Corporation Tohoku University
    Inventors: Ryo Enomoto, Tadahiro Ohmi, Akihiro Morimoto
  • Publication number: 20130052816
    Abstract: A method of producing a semiconductor transistor involving formation of an ohmic electrode on an active layer composed of a GaN-based semiconductor includes a process of forming a first layer 11 composed of tantalum nitride on an active layer 3 and a second layer 12 composed of Al layered on the first layer 11 and a process of forming ohmic electrodes 9s and 9d in ohmic contact with the active layer 3 by heat treating the first layer 11 and the second layer 12 at a temperature of from 520° C. to 600° C.
    Type: Application
    Filed: March 2, 2011
    Publication date: February 28, 2013
    Applicants: TOHOKU UNIVERISTY, ADVANCED POWER DEVICE RESEARCH ASSOCIATION
    Inventors: Hiroshi Kambayashi, Akinobu Teramoto, Tadahiro Ohmi
  • Patent number: 8383194
    Abstract: To provide a film forming apparatus capable of using an expensive organic EL raw material without waste and uniformly forming an organic EL film over a long period of time and a jig therefor. A plurality of ejection vessels are provided for a single raw material container section. A switcher is provided for carrying out switching from a piping system, which evaporates an organic EL raw material in the raw material container section and supplies it along with a carrier gas to one of the ejection vessels, to a piping system for another ejection vessel. In this manner, by supplying the organic EL raw material from the single raw material container section to the plurality of ejection vessels by switching, the use efficiency of the organic EL raw material can be improved.
    Type: Grant
    Filed: September 5, 2006
    Date of Patent: February 26, 2013
    Assignees: Tohoku University, Tokyo Electron Limited
    Inventors: Tadahiro Ohmi, Takaaki Matsuoka, Shozo Nakayama, Hironori Ito