DEGRADATION-RESISTANT PHOTOVOLTAIC DEVICES
A degradation-resistant photovoltaic device is provided. The device includes an active area and at least one photovoltaic cell located in the active area. The photovoltaic cell has an elongated shape with a characteristic width and a characteristic length. The characteristic length is greater than the characteristic width and an average distance from the photovoltaic cell to any edge of the active area is greater than the characteristic width.
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The following relates generally to photovoltaic devices, and more particularly to degradation and moisture resistant photovoltaic devices and methods of producing the same.
BACKGROUND OF THE INVENTIONOne of the major contributors to current worldwide generation of renewable energy is the solar energy produced via a photovoltaic (PV) effect. PV-based renewable-energy sources generate energy, in the form of electricity, by harnessing electromagnetic radiation, such as sunlight. PV applications are not limited to any particular area of the world and/or any given sector of economy. In remote regions of the world, for example, an off-grid installation of the PV source provides the only available source of electricity. In highly populated and/or economically developed regions, the PV source may, for example, source electricity to an electrical grid to supplement and/or reduce the amount of conventional energy distributed from the electrical grid. A PV source is in general any electric system containing a PV device, such as a PV cell or a PV module.
PV devices are typically used outdoors, and are therefore exposed to the elements, including wind, water and sunlight. They are known to be susceptible to degradation of performance when exposed to extreme temperatures, rain or snow, atmospheric humidity, contaminant gases and atmospheric oxygen. In general, degradation depends on multiple factors, including PV cell design, module construction, material types and packaging. Accordingly, field-aged modules exhibit degradation of packaging materials, adhesion losses, degradation of interconnects, degradation due to moisture intrusion and semiconductor device degradation.
Thin film PV (TFPV) modules are deleteriously affected in particular by moisture that may permeate into the module, reaching the electrical connections or the semiconductor materials. For example, if the front and back substrates are moisture impermeable, the primary path for water to enter the module is through the edges of a module if they are permeable. Water penetration into solar modules has been a long-standing problem in the industry.
Different means have been used to reduce or completely eliminate this problem. For example, in some studies special water-impermeable polymers have been proposed to increase moisture diffusion time and thus increase module's lifetime. In addition, certain design features have been proposed that also achieve similar goals. For example, U.S. Pat. No. 4,578,526 to Nakano et al. teaches ways to improve the durability of TFPV devices based on CdTe by offsetting the active PV materials from the edge of the glass substrate to provide a border area for extra moisture protection. This however reduces the active area of a PV device and lowers its total output power.
SUMMARY OF THE INVENTIONIn accordance with the present invention, a degradation-resistant photovoltaic device is provided. The device includes an active area and at least one photovoltaic cell located in the active area. The photovoltaic cell has an elongated shape with a characteristic width and a characteristic length. The characteristic length is greater than the characteristic width and an average distance from the photovoltaic cell to any edge of the active area is greater than the characteristic width.
In accordance with another aspect of the invention, a degradation-resistant photovoltaic device is provided which includes an active area characterized by a degradation depth extending from any edge of the active area. The degradation depth is equal to a lateral extent of performance degradation arising from environmental factors over a period of time about equal to a projected lifetime of the photovoltaic device. The photovoltaic device also includes at least one photovoltaic cell having an elongated shape and which is located in the active area. An average distance from the photovoltaic cell to any edge of the active area is greater than the degradation depth.
In accordance with another aspect of the invention, a degradation-resistant photovoltaic device includes an active area and a plurality of photovoltaic cells and a plurality of electrical contacts located within the active area. The contacts are connected to at least one of the cells and have an elongated shape with a characteristic width and a characteristic length. The characteristic length is greater than the characteristic width and an average distance from any of the contacts to any edge of the active area is greater than its characteristic width.
In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of exemplary embodiments or other examples described herein. However, it will be understood that these embodiments and examples may be practiced without the specific details. In other instances, well-known methods, procedures, components and circuits have not been described in detail, so as not to obscure the following description. Further, the embodiments disclosed are for exemplary purposes only and other embodiments may be employed in lieu of, or in combination with, the embodiments disclosed.
A thin-film photovoltaic (TFPV) module 100 shown in
For monolithic interconnection, layers 220, 230, 240 and 250 may be divided into separate cells and interconnected in series using a series of mechanical and laser scribing steps to produce scribing lines 261, 262 and 263 between the deposition steps forming the back contact, absorber, window and top contact layers, respectively, as shown in
It should be emphasized that the present invention is not limited to individual cells that are formed in the manner described above. For instance, the individual cells do not need to be formed from a single large thin film as shown in
A major challenge for thin-film PV materials is that they degrade rapidly in the presence of minute concentrations of moisture or reactive gases, such as oxygen, typical for most applications. This results in a large reduction in efficiency and a large change in the optimum load impedance during the operational lifetime of a PV module. PV material degradation typically includes degradation of transparent conducting layers, such as AZO, degradation of absorber layers, such as a-Si or CIGS, adhesion loss between layers and junction degradation. Most of the material degradation occurs around the edges of the module, so that individual cells 110 closest to edge contacts 141 and 142 are degraded at a much faster rate as compared to that of the cells closer to the center of module 100. Since all cells 110 are connected in series and a failure in any one of them results in a failure of the whole module, the rate of module degradation is determined by the degradation rate of the weakest cells, i.e. those cells that are closer to the edges.
In accordance with the present invention,
The single PV cell 310 shown in
PV cell 310 may have edges or sides 311, 312, 313 and 314, the total length of which equals the perimeter of the cell. Generally, the edges of the cell delineate its boundary and may be correspond to either cutting or scribing lines; such lines may be straight or curved depending on the cell layout. Some of the cell's edges may be located close or substantially on the edge of the active area, as for example is the case for side 311 of cell 310. In this case, the length of side 311 is substantially smaller that the cell's perimeter. In order to increase degradation resistance of a module, it could be designed so that the length of any side of any cell adjacent to the edge of the active area in such a module is substantially less than the perimeter of a given cell, preferably less than one fourth of the perimeter and more preferably less than one tenth of the perimeter. As a result, only a small portion of any cell is subjected to the edge-related degradation.
Similarly,
In accordance with another aspect of invention,
Similarly, in another example,
In accordance with another aspect of invention,
The edge-related degradation, such as moisture degradation, may be characterized by the degradation depth Sd as shown in
Degradation-resistant module 1000 shown in
Typically, a solar module is expected to have an operational lifetime of at least 5-10 years. Manufacturers provide product warranties up to 20-25 years, which specify that solar modules will produce no less than 80% of its specified peak power output for the time of the warranty. Projected lifetime of a module therefore may vary from 5 to 25 years depending on its manufacturer. The lifetime of the module is primarily determined by the degradation of its performance, i.e. a gradual or sudden decrease in its output characteristics such as output power, voltage, current and efficiency when measured under the standard test conditions (STC). A substantial portion of such degradation occurs around the edges of a module. Edge-related degradation of the module and its magnitude, as expressed by the degradation depth Sd, can be evaluated in a number of ways. For example, a visual inspection of the active area of a module may reveal discoloration and delamination of PV materials around the edges, the size of which would provide a direct measurement of Sd. Also, testing the performance of a module in STC and measuring its peak output power or maximum conversion efficiency may also provide a quantitative measure of Sd. For example, 10% decrease in efficiency of module 1000 may indicate that approximately 10% of its active area is degraded, which for a 1 m×2 m module corresponds to Sd of about 3 cm. Thus, the degradation depth of a module at the end of its operational lifetime could be approximately evaluated by calculating Sd, at which the efficiency is degraded by a specified amount, e.g. by 20%. These projections and calculations can be verified in accelerated aging tests, which simulate the aging and degradation of a device during its multi-year life span in a much shorter time using excess heat and humidity.
In accordance with yet another aspect of invention, a failure-resistance module may include multiple layers of PV cells interposed on top of each other. The top layers may be partially transparent and allow a portion of the light to be transmitted to and absorbed by PV cells in the underlying layers. The operation of such a module may be similar to that of a multi junction solar cell or module. The shape and position of each cell in each layer of such a module are chosen so that the average distance between any cell and any of the module edges is greater and preferably much greater than the cell's characteristic width.
Example 1A failure-resistant TFPV module 800 may be produced as shown in
Another failure-resistant TFPV module may be produced in which PV cells are sandwiched between two substrates. The PV cells may be CIGS cells produced separately from each other on a flexible substrate, such as polyimide, stainless steel or aluminum foil. These PV cells may be elongated and laid out in this TFPV module similar to the way cells 710 are laid out in module 700, so that a minimal part of cell area is near any of the edges. The cells are interconnected either in parallel or in series using additional electrical contacts, e.g. metal tabs, solder or conducting ink. The top and bottom substrates are laminated together to completely enclose the PV cells. The top cover substrate may be made from glass, e.g. tempered glass. The bottom substrate may be made from metal foil, plastic such as tedlar or composite laminate materials.
Example 3Another failure-resistant TFPV module may be produced in which multi junction PV cells are sandwiched between two substrates. The PV cells may be based on CIGS or a-Si alloys and include two or more pn junctions. Top junctions are characterized by absorber semiconductors with larger bandgaps compared to that of the lower junctions. These multi-junction cells are monolithically interconnected in series by scribing. The scribing pattern may be similar to the pattern shown in
Another failure-resistant TFPV module 1100 may be produced as shown in
Claims
1. A degradation-resistant photovoltaic device comprising:
- an active area and at least one photovoltaic cell located in the active area, said photovoltaic cell having an elongated shape with a characteristic width and a characteristic length, wherein the characteristic length is greater than the characteristic width and an average distance from the photovoltaic cell to any edge of the active area is greater than the characteristic width.
2. The photovoltaic device of claim 1 wherein said at least one photovoltaic cell includes a plurality of photovoltaic cells that constitute all the photovoltaic cells in the active area.
3. (canceled)
4. The photovoltaic device of claim 1 wherein said at least one photovoltaic cell is a plurality of photovoltaic cells connected electrically in series.
5. The photovoltaic device of claim 4 wherein said photovoltaic cells are connected monolithically by scribing lines.
6. The photovoltaic device of claim 1 wherein said elongated shape is nonrectangular.
7. The photovoltaic device of claim 1 wherein said at least one photovoltaic cell is a plurality of photovoltaic cells connected electrically in parallel.
8. The photovoltaic device of claim 1 wherein said active area is substantially equal to the area of the device.
9. The photovoltaic device of claim 1 wherein said photovoltaic cell is a thin film photovoltaic cell.
10-11. (canceled)
12. The photovoltaic device of claim 1 wherein said at least one photovoltaic cell has a perimeter and further comprises a first side adjacent to at one of the edges of said active area and said first side has a length smaller than the perimeter of the cell.
13. A degradation-resistant photovoltaic device comprising:
- an active area characterized by a degradation depth extending from any edge of the active area, said degradation depth being equal to a lateral extent of performance degradation arising from environmental factors over a period of time about equal to a projected lifetime of the photovoltaic device; and
- at least one photovoltaic cell having an elongated shape and which is located in the active area, wherein an average distance from the photovoltaic cell to any edge of the active area is greater than the degradation depth.
14. The photovoltaic device of claim 13 wherein said degradation depth is determined by visual inspection of the device at the end of its operational lifetime.
15. The photovoltaic device of claim 13 wherein the value of said degradation depth corresponds to the degradation loss of at least 10% of the active area.
16. The photovoltaic device of claim 13 wherein said projected lifetime is at least 5 years.
17. The photovoltaic device of claim 13 wherein said at least one photovoltaic cell constitutes all the photovoltaic cells in the active area.
18. The photovoltaic device of claim 13 wherein said at least one photovoltaic cell comprises a plurality of photovoltaic cells.
19. The photovoltaic device of claim 13 further comprising a first substrate and a second substrate wherein said at least one photovoltaic cell is encapsulated between the first and second substrates.
20. A degradation-resistant photovoltaic device comprising:
- an active area; and
- a plurality of photovoltaic cells and a plurality of electrical contacts located within the active area, said contacts being connected to at least one of the cells and having an elongated shape with a characteristic width and a characteristic length, wherein the characteristic length is greater than the characteristic width and an average distance from any of the contacts to any edge of the active area is greater than its characteristic width.
21. The photovoltaic device of claim 20 wherein at least two of said photovoltaic cells are connected electrically in series.
22. (canceled)
23. The photovoltaic device of claim 20 further comprising a first substrate and a second substrate wherein said photovoltaic cells are encapsulated between the first and second substrates.
24-27. (canceled)
Type: Application
Filed: Oct 2, 2009
Publication Date: Nov 18, 2010
Applicant: SUNLIGHT PHOTONICS INC. (South Plainfield, NJ)
Inventors: Sergey Frolov (Murray Hill, NJ), Allan James Bruce (Scotch Plains, NJ), Michael Cyrus (Summit, NJ)
Application Number: 12/572,976
International Classification: H01L 31/042 (20060101); H01L 31/00 (20060101); H01L 31/048 (20060101); H01L 21/56 (20060101);